WO2014041706A1 - ニッケル微粒子の製造方法 - Google Patents
ニッケル微粒子の製造方法 Download PDFInfo
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- WO2014041706A1 WO2014041706A1 PCT/JP2012/075464 JP2012075464W WO2014041706A1 WO 2014041706 A1 WO2014041706 A1 WO 2014041706A1 JP 2012075464 W JP2012075464 W JP 2012075464W WO 2014041706 A1 WO2014041706 A1 WO 2014041706A1
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- fluid
- nickel
- nickel compound
- fine particles
- processing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F9/00—Making metallic powder or suspensions thereof
- B22F9/16—Making metallic powder or suspensions thereof using chemical processes
- B22F9/18—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds
- B22F9/24—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F1/00—Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
- B22F1/07—Metallic powder characterised by particles having a nanoscale microstructure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F9/00—Making metallic powder or suspensions thereof
- B22F9/02—Making metallic powder or suspensions thereof using physical processes
- B22F9/06—Making metallic powder or suspensions thereof using physical processes starting from liquid material
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B23/00—Obtaining nickel or cobalt
- C22B23/04—Obtaining nickel or cobalt by wet processes
Definitions
- the present invention relates to a method for producing nickel fine particles.
- Nickel fine particles are widely used materials such as conductive materials and electrode materials for multilayer ceramic capacitors and substrates, and those having controlled particle size and particle size distribution are used according to the purpose.
- the physical properties of the nickel fine particles also change depending on the crystallite diameter. For example, even if the nickel fine particles have the same particle diameter, the firing temperature can be lowered when the crystallite is small. When it is large, shrinkage after heat treatment can be reduced. Therefore, there is a need for a technique for controlling the crystallite diameter of the nickel fine particles, particularly for controlling the ratio of the crystallite diameter to the particle diameter of the nickel fine particles.
- a crystallite means the largest group that can be regarded as a single crystal, and the size of the crystallite is called a crystallite diameter.
- Crystallite diameter D K ⁇ ⁇ / ( ⁇ ⁇ cos ⁇ ) (Scherrer's formula)
- K is a Scherrer constant
- K 0.9.
- ⁇ is calculated using the wavelength of the X-ray tube used, ⁇ is the half width, and ⁇ is calculated using the diffraction angle.
- the method for producing nickel fine particles is mainly classified into a gas phase method and a liquid phase method.
- the number of particles having a particle diameter of 1.5 times or more of the average particle diameter (D50 value) measured by laser diffraction / scattering particle size distribution measurement is 20% or less of the total number of particles
- the average particle diameter ( A nickel powder in which the number of particles having a particle diameter of 0.5 times or less (D50 value) is 5% or less of the total number of particles and the average crystallite diameter in the nickel particles is 400 mm or more is described.
- the nickel powder is prepared by mixing nickel powder produced by a wet method or a dry method and a fine powder of an alkaline earth metal compound, or after coating the surface of each particle of the nickel powder with an alkaline earth metal compound. It is obtained by heat treatment in an inert gas or slightly reducing gas atmosphere at a temperature lower than the melting temperature of the alkaline earth metal compound, and the average particle size by SEM observation is 0.05 to 1 ⁇ m It is described that it is preferable.
- Patent Document 2 discloses a nickel fine powder obtained by evaporating and condensing nickel by thermal plasma, and has a number average particle diameter determined by observation with a scanning electron microscope of 0.05 to 0.2 ⁇ m.
- a nickel fine powder having a sulfur content of 0.1 to 0.5% by mass and a proportion of coarse particles of 0.6 ⁇ m or more contained in the nickel fine powder is 50 ppm or less on a number basis.
- the nickel fine powder preferably has a crystallite size determined by X-ray diffraction analysis of 66% or more with respect to the number average particle size.
- a reducing agent, a dispersant, and a nickel salt are added to a polyol solvent to produce a mixed solution. After the mixed solution is stirred and heated, the reaction temperature and time are adjusted to reduce the mixture. The nickel nanoparticles obtained by reaction are described. Further, it is described that nickel fine particles having a uniform particle size and excellent dispersibility can be obtained.
- Patent Document 4 metal fine particles are disposed so as to face each other so as to be able to approach and leave, and reduce metal compounds in a thin film fluid formed between processing surfaces in which at least one rotates relative to the other.
- the manufacturing method is described. According to the manufacturing method of Patent Document 4, it is described that a monodispersed metal colloid solution having an average particle size smaller than that of metal fine particles obtained by a normal reaction method can be obtained.
- the particle size distribution of nickel fine particles obtained by the vapor phase method is wide, and it is difficult not only to make the particle size and crystallite size of the nickel fine particles uniform, but also the energy cost in production increases.
- nickel fine particles having a narrow particle size distribution and a large crystallite diameter and as described in Patent Document 2, the ratio of coarse particles in the whole is small and the average particle diameter is reduced.
- the manufacturing process becomes complicated, and the energy during manufacturing increases.
- Patent Documents 3 and 4 describe the particle size of metal fine particles including nickel fine particles, but do not describe the crystallite size. Therefore, no disclosure has been made so far regarding a method for producing nickel fine particles in which the ratio of the crystallite diameter to the particle diameter of the nickel fine particles is controlled using the liquid phase method.
- an object of the present invention is to provide a method for producing nickel fine particles in which the ratio of the crystallite diameter to the particle diameter of the nickel fine particles is controlled.
- the present invention uses at least two kinds of fluids to be treated, and at least one kind of fluid to be treated is a nickel compound fluid in which a nickel compound is dissolved in a solvent.
- the nickel compound fluid contains sulfate ions
- at least one kind of fluid to be treated other than the above is a reducing agent fluid in which a reducing agent is dissolved in a solvent
- the nickel fluid The fluid to be treated of at least one of the compound fluid and the reducing agent fluid contains a polyol, and the fluid to be treated is disposed so as to be opposed to and separated from each other. At least one of them is mixed in a thin film fluid formed between at least two processing surfaces rotating relative to the other to deposit nickel fine particles.
- the particle size (D) of the nickel fine particles is controlled.
- a method for producing nickel fine particles characterized by controlling the ratio (d / D) of the crystallite diameter (d) of the nickel fine particles.
- the nickel compound fluid introduced between the at least two processing surfaces maintains the condition that the pH at room temperature is constant under acidic conditions, while maintaining the condition in the nickel compound fluid.
- the nickel compound fluid introduced between the at least two processing surfaces is controlled to increase the ratio (d / D) by increasing the molar ratio of sulfate ion to nickel.
- the molar ratio of sulfate ion to nickel in the nickel compound fluid is lowered so that the ratio (d / It can be implemented as a control to reduce D).
- this invention can be implemented as what obtains the nickel fine particle whose said ratio (d / D) is 0.30 or more by using the following as said nickel compound fluid.
- the nickel compound fluid has a pH of 4.1 or less under room temperature conditions of the nickel compound fluid, and a molar ratio of sulfate ion to nickel in the nickel compound fluid exceeds 1.0. .
- this invention can be implemented as what obtains the nickel fine particle whose said crystallite diameter (d) is 30 nm or more by using the following as said nickel compound fluid.
- the nickel compound fluid has a pH of 4.1 or less under room temperature conditions of the nickel compound fluid, and a molar ratio of sulfate ion to nickel in the nickel compound fluid exceeds 1.0. .
- this invention can be implemented as what obtains the nickel fine particle whose said crystallite diameter (d) is 30 nm or more by using the following as said nickel compound fluid.
- the pH of the nickel compound fluid at room temperature exceeds 4.1 and is 4.4 or less, and the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1. 1 or more.
- this invention can be implemented as what obtains the nickel fine particle whose said ratio (d / D) is 0.30 or more by using the following as said nickel compound fluid.
- the pH of the nickel compound fluid at room temperature exceeds 4.1 and is 4.4 or less, and the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1. More than two.
- the present invention can be carried out as the polyol is at least one selected from ethylene glycol, propylene glycol, trimethylene glycol, tetraethylene glycol, polyethylene glycol, diethylene glycol, glycerin, and polypropylene glycol. .
- the present invention uses at least two kinds of fluids to be treated, and at least one kind of fluid to be treated is a nickel compound fluid obtained by dissolving a nickel compound in a solvent. Includes at least one kind of fluid to be treated other than those described above, and is a reducing agent fluid in which a reducing agent is dissolved in a solvent, the nickel compound fluid, and the reducing fluid. At least one of the fluids to be treated with the agent fluid contains a polyol, and the fluid to be treated is disposed so as to face each other, at least one of which can be approached and separated.
- the at least two processing surfaces By controlling the concentration of polyol in at least one of the treated fluids of the nickel compound fluid and the reducing agent fluid and the molar ratio of sulfate ions to nickel in the nickel compound fluid introduced into There is provided a method for producing nickel fine particles, characterized in that the ratio (d / D) of the crystallite size (d) of the nickel fine particles to the particle size (D) of the nickel fine particles is controlled.
- the nickel compound fluid includes the polyol, the polyol is ethylene glycol and polyethylene glycol, and the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1.24.
- the ratio (d / D) is controlled to increase by increasing the concentration of the polyol in the nickel compound fluid.
- the ratio (d / D) can be controlled to be small by increasing the concentration of the polyol in the nickel compound fluid.
- the present invention can be carried out assuming that the nickel compound is a hydrate of nickel sulfate.
- the present invention includes a first processing surface and a second processing surface as the at least two processing surfaces, and the fluid to be processed is provided between the first processing surface and the second processing surface. And a force for moving the second processing surface away from the first processing surface by the pressure of the fluid to be processed is generated, and this force causes the second processing surface to move from the first processing surface. Between the first processing surface and the second processing surface, which are maintained at the minute interval, and the fluid to be processed that forms the thin film fluid. can do. Further, the present invention includes a separate introduction path that is independent of a flow path through which the nickel compound fluid passes between the at least two processing surfaces while forming the thin film fluid and through which the nickel compound fluid flows.
- At least one of the at least two processing surfaces is provided with at least one opening that leads to the separate introduction path, and the reducing agent fluid is passed between the opening and the at least two processing surfaces. It can be implemented as a mixture of the nickel compound fluid and the reducing agent fluid in the thin film fluid.
- a fluid pressure applying mechanism that applies pressure to the fluid to be processed, and a first processing portion that includes a first processing surface among the at least two processing surfaces. And a second processing part having a second processing surface among the at least two processing surfaces, and a rotation drive mechanism for relatively rotating these processing parts,
- the surface constitutes a part of a sealed flow path through which the fluid to be processed to which the pressure is applied flows, and at least a first of the first processing portion and the second processing portion.
- the processing portion includes a pressure receiving surface, and at least a part of the pressure receiving surface is constituted by the second processing surface, and the fluid pressure applying mechanism is formed on the pressure receiving surface by the fluid pressure applying mechanism.
- the fluid to be treated forms the thin film fluid, and can be implemented as a method for producing nickel fine particles in which nickel fine particles are precipitated in the thin film fluid.
- the present invention makes it possible to control the ratio of the crystallite diameter to the particle diameter of the nickel fine particles, which has been difficult with the conventional liquid phase manufacturing method, and to control the ratio of the crystallite diameter to the particle diameter. It can be manufactured continuously.
- the present invention can reduce the ratio of the crystallite diameter to the particle diameter of the nickel fine particles by simply changing the processing conditions of controlling the pH in the nickel compound fluid and the molar ratio of sulfate ions to nickel in the nickel compound fluid. Since it can be controlled, nickel fine particles according to the purpose can be separately produced at a lower cost and with lower energy, and nickel fine particles can be stably provided at a low cost.
- the present invention can impart desired physical properties to nickel fine particles having a desired particle diameter.
- FIG. 1 is a schematic cross-sectional view of a fluid processing apparatus according to an embodiment of the present invention.
- A is a schematic plan view of a first processing surface of the fluid processing apparatus shown in FIG. 1, and
- B) is an enlarged view of a main part of the processing surface of the apparatus.
- A) is sectional drawing of the 2nd introducing
- B) is the principal part enlarged view of the processing surface for demonstrating the 2nd introducing
- the nickel compound fluid according to the present invention is obtained by dissolving or molecularly dispersing a nickel compound in a solvent, and the nickel compound fluid contains sulfate ions.
- the reducing agent fluid according to the present invention is obtained by dissolving or molecularly dispersing the reducing agent in a solvent (hereinafter simply referred to as dissolution). Further, polyol is contained in at least one of the nickel compound fluid and the reducing agent fluid.
- nickel compound various nickel compounds such as nickel sulfate, nickel nitrate, nickel chloride, basic nickel carbonate and hydrates thereof can be used, and in particular, nickel sulfate which is a supply source of sulfate ions described later is used. It is desirable. These nickel compounds may be used independently and may use 2 or more types together.
- the reducing agent is not particularly limited, but hydrazine, hydrazine monohydrate, hydrazine sulfate, sodium formaldehydesulfoxylate, metal borohydride, metal borohydride, metal hydride aluminum, metal triethylborohydride, glucose, citric acid, Ascorbic acid, tannic acid, dimethylformamide, tetrabutylammonium borohydride, sodium hypophosphite (NaH 2 PO 2 ), or the like can be used. These reducing agents may be used alone or in combination of two or more.
- a pH adjusting substance may be used in combination with the reducing agent.
- pH-adjusting substances include hydrochloric acid, sulfuric acid, nitric acid, aqua regia, trichloroacetic acid, trifluoroacetic acid, phosphoric acid, citric acid, ascorbic acid, and other acidic substances, such as sodium hydroxide, Examples thereof include alkali substances such as potassium hydroxide, basic substances such as amines such as triethylamine and dimethylaminoethanol, and salts of the above acidic substances and basic substances.
- a pH adjusting substance may be used independently and may use 2 or more types together.
- the solvent is not particularly limited, but water such as ion exchange water, RO water, pure water or ultrapure water, alcohol-based organic solvents such as methanol or ethanol, ethylene glycol, propylene glycol, trimethylene glycol or tetraethylene.
- Polyol (polyhydric alcohol) organic solvent such as glycol or polyethylene glycol or glycerin, ketone organic solvent such as acetone or methyl ethyl ketone, ester organic solvent such as ethyl acetate or butyl acetate, ether such as dimethyl ether or dibutyl ether
- organic solvents aromatic organic solvents such as benzene, toluene and xylene, and aliphatic hydrocarbon organic solvents such as hexane and pentane.
- an alcohol-based organic solvent or a polyol (polyhydric alcohol) -based solvent is used as a solvent
- the solvent itself has an advantage of acting as a reducing substance, and is effective in producing nickel fine particles.
- These solvents may be used alone or in combination of two or more.
- a polyol is contained in at least one of the nickel compound fluid and the reducing agent fluid.
- the polyol is a divalent or higher alcohol, and examples thereof include ethylene glycol, propylene glycol, trimethylene glycol, tetraethylene glycol, diethylene glycol, glycerin, polyethylene glycol, and polypropylene glycol. These polyols may be used independently and may use 2 or more types together.
- nickel fine particles are obtained using a polyol reduction method in which nickel ions are reduced using a combination of the above-described reducing agent and polyol.
- the nickel compound fluid contains sulfate ions.
- sulfates such as sodium sulfate, potassium sulfate, and ammonium sulfate, or hydrates or organic solvates thereof can be used in addition to sulfuric acid.
- the hydrazine sulfate is also a reducing agent and acts as a source of sulfate ions.
- the source of sulfate ions excluding nickel sulfate is referred to as a sulfate compound.
- the molar ratio of sulfate ion to nickel in the nickel compound fluid can be changed by including sulfate ions in the nickel compound fluid and changing the concentration thereof.
- the pH of the nickel compound fluid can be changed, but the pH of the nickel compound fluid can be adjusted separately using the above-described pH adjusting substance.
- the nickel obtained by controlling the pH of the nickel compound fluid and the molar ratio of sulfate ions to nickel in the nickel compound fluid
- the ratio (d / D) of the crystallite diameter (d) to the particle diameter (D) of the fine particles can be controlled.
- the applicant of the present application has the effect that sulfate ions control the growth of particles of nickel fine particles and promote the growth of crystallites.
- the pH of the nickel compound fluid and the sulfuric acid relative to nickel in the nickel compound fluid It is considered that the ratio (d / D) of the crystallite diameter (d) to the particle diameter (D) of the obtained nickel fine particles can be controlled by controlling the molar ratio of ions.
- the nickel in the nickel compound fluid refers to all nickel contained in the nickel compound fluid regardless of the state of nickel ions or nickel complex ions.
- the molar ratio of sulfate ion to nickel in the nickel compound fluid is desirably more than 1.00 in order to satisfactorily control the ratio of the crystallite diameter to the particle diameter of the nickel fine particles.
- the nickel ion and sulfate ion in the nickel compound fluid will act. For example, precipitates such as nickel sulfate are generated.
- the balance between the molar ratio of sulfate ions to nickel in the nickel compound fluid and the solubility of the solvent in nickel compounds and sulfate compounds is important.
- the pH of the nickel compound fluid and the molar ratio of sulfate ion to nickel in the nickel compound fluid are set.
- the pH of the nickel compound fluid can be changed by changing the concentration of sulfate ions in the nickel compound fluid, for example, the concentration of nickel sulfate, which is the nickel compound in the nickel compound fluid, or the concentration of the sulfate compound.
- the pH of the fluid can be adjusted separately using the pH adjusting substance described above.
- the pH of the nickel compound fluid under the room temperature condition is acidic, and the pH of the nickel compound fluid under the room temperature condition is 4 in order to satisfactorily control the ratio of the crystallite diameter to the particle diameter of the nickel fine particles. .4 or less is desirable and 4.1 or less is more desirable.
- the operations such as preparation and mixing of the fluid to be controlled may be performed at room temperature, but the pH under the room temperature conditions is the above even if the operation is in an environment other than room temperature. It is sufficient that the conditions to be satisfied are satisfied.
- the pH of the reducing agent fluid is not particularly limited. What is necessary is just to select suitably by the kind, density
- the nickel compound fluid is maintained while maintaining the condition that the pH of the nickel compound fluid at room temperature is constant under acidic conditions.
- the nickel compound is controlled so that the ratio (d / D) of the crystallite diameter (d) to the particle diameter (D) of the nickel fine particles obtained by increasing the molar ratio of sulfate ions to nickel in the nickel compound is increased.
- the above ratio (d / D) is achieved by reducing the molar ratio of sulfate ion to nickel in the nickel compound fluid. It is desirable to control so that) becomes small.
- operations such as preparation and mixing of fluids for this control may be performed at room temperature, but the pH of the nickel compound fluid under room temperature conditions may be performed in an environment other than room temperature. As long as it is constant under acidic conditions. Further, when the nickel compound fluid and the reducing agent fluid are mixed by a method as described later, the nickel compound fluid has a pH of 4.1 or less under room temperature conditions as the nickel compound fluid, and the nickel compound fluid It is desirable to use one in which the molar ratio of sulfate ion to nickel in the mixture exceeds 1.0.
- the pH of the nickel compound fluid is more than 4.1 and not more than 4.4, and the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1. It is desirable to use more than two. It should be noted that the operations such as preparation and mixing of the fluid to be controlled may be performed at room temperature, but the pH under the room temperature conditions is the above even if the operation is in an environment other than room temperature. It is sufficient that the conditions to be satisfied are satisfied.
- Nickel fine particles having a ratio (d / D) of 0.30 or more and nickel fine particles having a crystallite diameter of 30 nm or more are particularly suitable for ceramic capacitor applications because they can suppress shrinkage after heat treatment.
- Dispersants and surfactants can be used according to the purpose and necessity. Although it does not specifically limit, As a surfactant and a dispersing agent, various commercially available products generally used, products, or newly synthesized products can be used. Although it does not specifically limit, Dispersants, such as anionic surfactant, a cationic surfactant, a nonionic surfactant, various polymers, etc. can be mentioned. These may be used alone or in combination of two or more. Further, when polyethylene glycol, polypropylene glycol or the like is used as a polyol, the polyol also acts as a dispersant.
- the nickel compound fluid and the reducing agent fluid When mixing the nickel compound fluid and the reducing agent fluid by a method as described later, it is included in the molar ratio of sulfate ions to nickel in the nickel compound fluid and at least one of the nickel compound fluid and the reducing agent fluid.
- the ratio (d / D) of the crystallite diameter (d) to the particle diameter (D) of the obtained nickel fine particles can also be controlled by controlling the concentration of the polyol that also acts as a dispersant.
- the polyol that also acts as a dispersant is desirably contained in the nickel compound fluid, and when the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1.24, it also acts as a dispersant in the nickel compound fluid.
- the ratio (d / D) is controlled to be high by increasing the concentration of the polyol to be used.
- the molar ratio of sulfate ion to nickel in the nickel compound fluid is 1.00, as a dispersant in the nickel compound fluid It is desirable to control the ratio (d / D) to be small by increasing the concentration of the polyol that also acts.
- the nickel compound fluid and the reducing agent fluid may contain solid or crystalline materials such as dispersions and slurries.
- the nickel compound fluid and the reducing agent fluid are disposed opposite to each other between at least two processing surfaces that are close to each other and at least one of which can rotate relative to the other. It is preferable to use a method of mixing in a thin film fluid that can be prepared. For example, it is preferable to deposit nickel fine particles by mixing using a device having the same principle as the device disclosed in Patent Document 4.
- the fluid processing apparatus shown in FIGS. 1 to 3 processes an object to be processed between processing surfaces in a processing unit in which at least one of approaching and separating can rotate relative to the other,
- the first fluid which is the first fluid to be treated
- the second fluid which is the second fluid to be treated, of the fluids to be treated is introduced between the processing surfaces from another flow path provided with the first fluid and the second fluid between the processing surfaces.
- U indicates the upper side
- S indicates the lower side.
- the upper, lower, front, rear, left and right only indicate a relative positional relationship, and do not specify an absolute position.
- R indicates the direction of rotation.
- C indicates the centrifugal force direction (radial direction).
- This apparatus uses at least two kinds of fluids as a fluid to be treated, and at least one kind of fluid includes at least one kind of an object to be treated and is opposed to each other so as to be able to approach and separate.
- a processing surface at least one of which rotates with respect to the other, and the above-mentioned fluids are merged between these processing surfaces to form a thin film fluid.
- An apparatus for processing an object to be processed As described above, this apparatus can process a plurality of fluids to be processed, but can also process a single fluid to be processed.
- This fluid processing apparatus includes first and second processing units 10 and 20 that face each other, and at least one of the processing units rotates.
- the opposing surfaces of both processing parts 10 and 20 are processing surfaces.
- the first processing unit 10 includes a first processing surface 1
- the second processing unit 20 includes a second processing surface 2.
- Both the processing surfaces 1 and 2 are connected to the flow path of the fluid to be processed and constitute a part of the flow path of the fluid to be processed.
- the distance between the processing surfaces 1 and 2 can be changed as appropriate, but is usually adjusted to 1 mm or less, for example, a minute distance of about 0.1 ⁇ m to 50 ⁇ m.
- the fluid to be processed that passes between the processing surfaces 1 and 2 becomes a forced thin film fluid forced by the processing surfaces 1 and 2.
- the apparatus When a plurality of fluids to be processed are processed using this apparatus, the apparatus is connected to the flow path of the first fluid to be processed and forms a part of the flow path of the first fluid to be processed. At the same time, a part of the flow path of the second fluid to be treated is formed separately from the first fluid to be treated. And this apparatus performs processing of fluid, such as making both flow paths merge and mixing both the to-be-processed fluids between the processing surfaces 1 and 2, and making it react.
- “treatment” is not limited to a form in which the object to be treated reacts, but also includes a form in which only mixing and dispersion are performed without any reaction.
- the first holder 11 that holds the first processing portion 10 the second holder 21 that holds the second processing portion 20, a contact pressure applying mechanism, a rotation drive mechanism, A first introduction part d1, a second introduction part d2, and a fluid pressure imparting mechanism p are provided.
- the first processing portion 10 is an annular body, more specifically, a ring-shaped disk.
- the second processing unit 20 is also a ring-shaped disk.
- the materials of the first and second processing parts 10 and 20 are metal, carbon, ceramic, sintered metal, wear-resistant steel, sapphire, other metals subjected to hardening treatment, hard material lining, Those with coating, plating, etc. can be used.
- at least a part of the first and second processing surfaces 1 and 2 facing each other is mirror-polished in the processing units 10 and 20.
- the surface roughness of this mirror polishing is not particularly limited, but is preferably Ra 0.01 to 1.0 ⁇ m, more preferably Ra 0.03 to 0.3 ⁇ m.
- At least one of the holders can be rotated relative to the other holder by a rotational drive mechanism (not shown) such as an electric motor.
- Reference numeral 50 in FIG. 1 denotes a rotation shaft of the rotation drive mechanism.
- the first holder 11 attached to the rotation shaft 50 rotates and is used for the first processing supported by the first holder 11.
- the unit 10 rotates with respect to the second processing unit 20.
- the second processing unit 20 may be rotated, or both may be rotated.
- the first and second holders 11 and 21 are fixed, and the first and second processing parts 10 and 20 are rotated with respect to the first and second holders 11 and 21. May be.
- At least one of the first processing unit 10 and the second processing unit 20 can be approached / separated from at least either one, and both processing surfaces 1 and 2 can be approached / separated. .
- the second processing unit 20 approaches and separates from the first processing unit 10, and the second processing unit 20 is disposed in the storage unit 41 provided in the second holder 21. It is housed in a hauntable manner.
- the first processing unit 10 may approach or separate from the second processing unit 20, and both the processing units 10 and 20 may approach or separate from each other. It may be a thing.
- the accommodating portion 41 is a recess that mainly accommodates a portion of the second processing portion 20 on the side opposite to the processing surface 2 side, and is a groove that has a circular shape, that is, is formed in an annular shape in plan view. .
- the accommodating portion 41 accommodates the second processing portion 20 with a sufficient clearance that allows the second processing portion 20 to rotate.
- the second processing unit 20 may be arranged so that only the parallel movement is possible in the axial direction, but by increasing the clearance, the second processing unit 20 is
- the center line of the processing part 20 may be tilted and displaced so as to break the relationship parallel to the axial direction of the storage part 41. Furthermore, the center line of the second processing part 20 and the storage part 41 may be displaced.
- the center line may be displaced so as to deviate in the radial direction. As described above, it is desirable to hold the second processing unit 20 by the floating mechanism that holds the three-dimensionally displaceably.
- the above-described fluid to be treated is subjected to both treatment surfaces from the first introduction part d1 and the second introduction part d2 in a state where pressure is applied by a fluid pressure application mechanism p configured by various pumps, potential energy, and the like. It is introduced between 1 and 2.
- the first introduction part d1 is a passage provided in the center of the annular second holder 21, and one end of the first introduction part d1 is formed on both processing surfaces from the inside of the annular processing parts 10, 20. It is introduced between 1 and 2.
- the second introduction part d2 supplies the second processing fluid to be reacted with the first processing fluid to the processing surfaces 1 and 2.
- the second introduction part d ⁇ b> 2 is a passage provided inside the second processing part 20, and one end thereof opens at the second processing surface 2.
- the first fluid to be processed that has been pressurized by the fluid pressure imparting mechanism p is introduced from the first introduction part d1 into the space inside the processing parts 10 and 20, and the first processing surface 1 and the second processing surface 2 are supplied. It passes between the processing surfaces 2 and tries to pass outside the processing portions 10 and 20. Between these processing surfaces 1 and 2, the second fluid to be treated pressurized by the fluid pressure applying mechanism p is supplied from the second introduction part d 2, merged with the first fluid to be treated, and mixed.
- the above-mentioned contact surface pressure applying mechanism applies a force that acts in a direction in which the first processing surface 1 and the second processing surface 2 approach each other to the processing portion.
- the contact pressure applying mechanism is provided in the second holder 21 and biases the second processing portion 20 toward the first processing portion 10.
- the contact surface pressure applying mechanism is a force that pushes in a direction in which the first processing surface 1 of the first processing unit 10 and the second processing surface 2 of the second processing unit 20 approach (hereinafter referred to as contact pressure). It is a mechanism for generating.
- a thin film fluid having a minute film thickness of nm to ⁇ m is generated by the balance between the contact pressure and the force for separating the processing surfaces 1 and 2 such as fluid pressure. In other words, the distance between the processing surfaces 1 and 2 is kept at a predetermined minute distance by the balance of the forces.
- the contact surface pressure applying mechanism is arranged between the accommodating portion 41 and the second processing portion 20.
- a spring 43 that biases the second processing portion 20 in a direction approaching the first processing portion 10 and a biasing fluid introduction portion 44 that introduces a biasing fluid such as air or oil.
- the contact surface pressure is applied by the spring 43 and the fluid pressure of the biasing fluid. Any one of the spring 43 and the fluid pressure of the urging fluid may be applied, and other force such as magnetic force or gravity may be used.
- the second processing unit 20 causes the first treatment by the separation force generated by the pressure or viscosity of the fluid to be treated which is pressurized by the fluid pressure imparting mechanism p against the bias of the contact surface pressure imparting mechanism.
- the first processing surface 1 and the second processing surface 2 are set with an accuracy of ⁇ m by the balance between the contact surface pressure and the separation force, and a minute amount between the processing surfaces 1 and 2 is set. An interval is set.
- the separation force includes the fluid pressure and viscosity of the fluid to be processed, the centrifugal force due to the rotation of the processing part, the negative pressure when the urging fluid introduction part 44 is negatively applied, and the spring 43 is pulled.
- the force of the spring when it is used as a spring can be mentioned.
- This contact surface pressure imparting mechanism may be provided not in the second processing unit 20 but in the first processing unit 10 or in both.
- the second processing unit 20 has the second processing surface 2 and the inside of the second processing surface 2 (that is, the first processing surface 1 and the second processing surface 2).
- a separation adjusting surface 23 is provided adjacent to the second processing surface 2 and located on the entrance side of the fluid to be processed between the processing surface 2 and the processing surface 2.
- the separation adjusting surface 23 is implemented as an inclined surface, but may be a horizontal surface.
- the pressure of the fluid to be processed acts on the separation adjusting surface 23 to generate a force in a direction in which the second processing unit 20 is separated from the first processing unit 10. Accordingly, the pressure receiving surfaces for generating the separation force are the second processing surface 2 and the separation adjusting surface 23.
- the proximity adjustment surface 24 is formed on the second processing portion 20.
- the proximity adjustment surface 24 is a surface opposite to the separation adjustment surface 23 in the axial direction (upper surface in FIG. 1), and the pressure of the fluid to be processed acts on the second processing portion 20. A force is generated in a direction that causes the first processing unit 10 to approach the first processing unit 10.
- the pressure of the fluid to be processed that acts on the second processing surface 2 and the separation adjusting surface 23, that is, the fluid pressure, is understood as a force constituting an opening force in the mechanical seal.
- the projected area A1 of the proximity adjustment surface 24 projected on a virtual plane orthogonal to the approaching / separating direction of the processing surfaces 1 and 2, that is, the protruding and protruding direction (axial direction in FIG. 1) of the second processing unit 20 The area ratio A1 / A2 of the total area A2 of the projected areas of the second processing surface 2 and the separation adjusting surface 23 of the second processing unit 20 projected onto the virtual plane is called a balance ratio K. This is important for the adjustment of the opening force.
- the opening force can be adjusted by the pressure of the fluid to be processed, that is, the fluid pressure, by changing the balance line, that is, the area A1 of the adjustment surface 24 for proximity.
- P1 represents the pressure of the fluid to be treated, that is, the fluid pressure
- K represents the balance ratio
- k represents the opening force coefficient
- Ps represents the spring and back pressure
- the proximity adjustment surface 24 may be implemented with a larger area than the separation adjustment surface 23.
- the fluid to be processed becomes a thin film fluid forced by the two processing surfaces 1 and 2 holding the minute gaps, and tends to move to the outside of the annular processing surfaces 1 and 2.
- the mixed fluid to be processed does not move linearly from the inside to the outside of the two processing surfaces 1 and 2, but instead has an annular radius.
- a combined vector of the movement vector in the direction and the movement vector in the circumferential direction acts on the fluid to be processed and moves in a substantially spiral shape from the inside to the outside.
- the rotating shaft 50 is not limited to a vertically arranged shaft, and may be arranged in the horizontal direction, or may be arranged in an inclined manner. This is because the fluid to be processed is processed at a fine interval between the processing surfaces 1 and 2 and the influence of gravity can be substantially eliminated. Further, this contact surface pressure applying mechanism also functions as a buffer mechanism for fine vibration and rotational alignment when used in combination with a floating mechanism that holds the second processing portion 20 in a displaceable manner.
- ⁇ ⁇ / ⁇ is the kinematic viscosity
- V the representative speed
- L the representative length
- ⁇ the density
- ⁇ the viscosity.
- the fluid flow has a critical Reynolds number as a boundary, laminar flow below the critical Reynolds number, and turbulent flow above the critical Reynolds number. Since the space between the processing surfaces 1 and 2 of the fluid processing apparatus is adjusted to a minute distance, the amount of fluid held between the processing surfaces 1 and 2 is extremely small.
- a acceleration
- m mass
- v velocity
- R represents a radius
- At least one of the first and second processing parts 10 and 20 may be cooled or heated to adjust the temperature.
- the first and second processing parts 10 and 10 are adjusted.
- 20 are provided with temperature control mechanisms (temperature control mechanisms) J1, J2.
- the temperature of the introduced fluid to be treated may be adjusted by cooling or heating. These temperatures can also be used for the deposition of the treated material, and also to generate Benard convection or Marangoni convection in the fluid to be treated between the first and second processing surfaces 1 and 2. May be set.
- a groove-like recess 13 extending from the center side of the first processing portion 10 to the outside, that is, in the radial direction is formed on the first processing surface 1 of the first processing portion 10. May be implemented.
- the planar shape of the recess 13 is curved or spirally extending on the first processing surface 1, or is not shown, but extends straight outward, L It may be bent or curved into a letter shape or the like, continuous, intermittent, or branched.
- the recess 13 can be implemented as one formed on the second processing surface 2, and can also be implemented as one formed on both the first and second processing surfaces 1, 2.
- the base end of the recess 13 reaches the inner periphery of the first processing unit 10.
- the tip of the recess 13 extends toward the outer peripheral surface of the first processing surface 1, and its depth (cross-sectional area) gradually decreases from the base end toward the tip.
- a flat surface 16 without the recess 13 is provided between the tip of the recess 13 and the outer peripheral surface of the first processing surface 1.
- the opening d20 of the second introduction part d2 is provided in the second processing surface 2, it is preferably provided at a position facing the flat surface 16 of the facing first processing surface 1.
- the opening d20 is desirably provided on the downstream side (outside in this example) from the concave portion 13 of the first processing surface 1.
- it is installed at a position facing the flat surface 16 on the outer diameter side from the point where the flow direction when introduced by the micropump effect is converted into a laminar flow direction in a spiral shape formed between the processing surfaces. It is desirable to do.
- the distance n in the radial direction from the outermost position of the recess 13 provided in the first processing surface 1 is preferably about 0.5 mm or more.
- the shape of the opening d20 may be circular as shown by a solid line in FIG. 2B or FIG. 3B, or may be a ring-shaped disc as shown by a dotted line in FIG. 2B.
- a concentric ring shape surrounding the central opening of the working surface 2 may be used.
- the annular opening d20 may not be provided concentrically around the central opening of the processing surface 2. Further, when the opening has an annular shape, the annular opening may be continuous or discontinuous.
- the second fluid introduced between the processing surfaces 1 and 2 can be introduced under the same condition, Fluid processing such as uniform diffusion, reaction, and precipitation can be performed. When mass-producing fine particles, it is preferable that the opening has an annular shape.
- the second introduction part d2 can have directionality.
- the introduction direction from the opening d20 of the second processing surface 2 is inclined with respect to the second processing surface 2 at a predetermined elevation angle ( ⁇ 1).
- the elevation angle ( ⁇ 1) is set to be more than 0 degrees and less than 90 degrees, and in the case of a reaction with a higher reaction rate, it is preferably set at 1 to 45 degrees.
- the introduction direction from the opening d ⁇ b> 20 of the second processing surface 2 has directionality in the plane along the second processing surface 2.
- the introduction direction of the second fluid is a component in the radial direction of the processing surface that is an outward direction away from the center and a component with respect to the rotation direction of the fluid between the rotating processing surfaces. Is forward.
- a line segment in the radial direction passing through the opening d20 and extending outward is defined as a reference line g and has a predetermined angle ( ⁇ 2) from the reference line g to the rotation direction R. This angle ( ⁇ 2) is also preferably set to more than 0 degree and less than 90 degrees.
- This angle ( ⁇ 2) can be changed and implemented in accordance with various conditions such as the type of fluid, reaction speed, viscosity, and rotational speed of the processing surface.
- the second introduction part d2 may not have any directionality.
- the number of fluids to be treated and the number of flow paths are two, but may be one, or may be three or more.
- the second fluid is introduced between the processing surfaces 1 and 2 from the second introduction part d2, but this introduction part may be provided in the first processing part 10 or provided in both. Good. Moreover, you may prepare several introduction parts with respect to one type of to-be-processed fluid.
- the shape, size, and number of the opening for introduction provided in each processing portion are not particularly limited, and can be appropriately changed. Further, an opening for introduction may be provided immediately before or between the first and second processing surfaces 1 and 2 or further upstream.
- the second fluid is introduced from the first introduction part d1 and the first fluid is introduced from the second introduction part d2 contrary to the above. May be introduced.
- the expressions “first” and “second” in each fluid have only an implication for identification that they are the nth of a plurality of fluids, and a third or higher fluid may exist.
- processes such as precipitation / precipitation or crystallization are arranged so as to face each other so as to be able to approach / separate, and at least one rotates for the other. Occurs with uniform mixing between surfaces 1 and 2 forcibly.
- the particle size and monodispersity of the processed material to be processed are the rotational speed and flow velocity of the processing parts 10 and 20, the distance between the processing surfaces 1 and 2, the raw material concentration of the processed fluid, or the processed fluid. It can be controlled by appropriately adjusting the solvent species and the like.
- the nickel compound fluid and the reducing agent fluid are mixed to precipitate nickel fine particles.
- the nickel compound fluid contains sulfate ions
- at least one of the nickel compound fluid and the reducing agent fluid contains the polyol and is introduced between the processing surfaces 1 and 2. And controlling the pH of the nickel compound fluid and the molar ratio of sulfate ion to nickel in the nickel compound fluid.
- the nickel compound fluid contains sulfate ions
- the fluid to be treated of at least one of the nickel compound fluid and the reducing agent fluid contains a polyol, and is introduced between the processing surfaces 1 and 2.
- concentration of the polyol in the fluid to be treated and at least one of the reducing agent fluid and the molar ratio of sulfate ion to nickel in the nickel compound fluid are controlled.
- Precipitation of nickel fine particles is forced in the thin film fluid between the processing surfaces 1 and 2 that are arranged so as to be able to approach and separate from each other and at least one of which rotates relative to the other of the apparatus shown in FIG. Occurs with uniform mixing.
- a nickel compound fluid as a first fluid is disposed to face each other so as to be able to approach and separate, and at least one of the processing surfaces rotates with respect to the other. , 2 to create a first fluid film that is a thin film fluid composed of the first fluid between the processing surfaces.
- a reducing agent fluid as a second fluid is directly introduced into the first fluid film formed between the processing surfaces 1 and 2 from the second introduction part d2 which is a separate flow path.
- the first fluid and the second fluid are disposed between the processing surfaces 1 and 2 whose distance is fixed by the pressure balance between the supply pressure of the fluid to be processed and the pressure applied between the rotating processing surfaces. And nickel fine particles can be deposited.
- a third introduction part d3 can be provided in the processing apparatus.
- the first fluid it is possible to introduce the second fluid and the third fluid separately into the processing apparatus. If it does so, the density
- the combination of fluids to be processed (first fluid to third fluid) to be introduced into each introduction portion can be arbitrarily set. The same applies to the case where the fourth or more introduction portions are provided, and the fluid to be introduced into the processing apparatus can be subdivided in this way.
- the temperature of the fluid to be processed such as the first and second fluids is controlled, and the temperature difference between the first fluid and the second fluid (that is, the temperature difference between the supplied fluids to be processed) is controlled.
- the temperature of each processed fluid processing device, more specifically, the temperature immediately before being introduced between the processing surfaces 1 and 2 is measured. It is also possible to add a mechanism for heating or cooling each fluid to be processed introduced between the processing surfaces 1 and 2.
- the temperature at which the nickel compound fluid and the reducing agent fluid are mixed is not particularly limited. It can be carried out at an appropriate temperature depending on the kind of nickel compound, the kind of reducing agent, the pH of the fluid, and the like.
- “from the center” means “from the first introduction part d1” of the processing apparatus shown in FIG. 1, and the first fluid is introduced from the first introduction part d1.
- the second fluid refers to the aforementioned second fluid to be treated introduced from the second introduction part d2 of the treatment apparatus shown in FIG.
- the opening d20 of the second introduction part d2 a concentric annular shape surrounding the central opening of the processing surface 2 was used as shown by a dotted line in FIG.
- At least one of the nickel compound fluid and the reducing agent fluid is disposed opposite to each other and has a processing surface that can approach and leave, and the other rotates relative to the other. It mixes in the thin film fluid formed between the processing surfaces 1 and 2, and nickel fine particles are deposited in the thin film fluid.
- the first fluid is fed into a sealed space (between the processing surfaces) between the processing surface 1 of the processing unit 10 and the processing surface 2 of the processing unit 20 of FIG.
- the rotational speed of the processing unit 10 is 3600 rpm.
- the first fluid forms a forced thin film fluid between the processing surfaces 1 and 2 and is discharged from the outer periphery of the processing portions 10 and 20.
- a reducing agent fluid is directly introduced into the thin film fluid formed between the processing surfaces 1 and 2 as the second fluid.
- a nickel compound fluid and a reducing agent fluid are mixed between the processing surfaces 1 and 2 prepared at a minute interval to precipitate nickel fine particles.
- a slurry containing nickel fine particles (nickel fine particle dispersion) is discharged between the processing surfaces 1 and 2.
- the following analyzes were performed on the pH of the first fluid and the second fluid, and the obtained dry powder of nickel fine particles.
- PH measurement A pH meter of model number D-51 manufactured by HORIBA was used for pH measurement. Before introducing each fluid to be treated into the fluid treatment apparatus, the pH of the fluid to be treated was measured at room temperature.
- SEM scanning electron microscope
- FE-SEM field emission scanning electron microscope
- JSM-7500F manufactured by JEOL Ltd.
- X-ray diffraction measurement For the X-ray diffraction (XRD) measurement, a powder X-ray diffraction measurement apparatus X'Pert PRO MPD (manufactured by XRD Spectris PANalytical Division) was used. The measurement conditions are a Cu cathode, a tube voltage of 45 kV, a tube current of 40 mA, 0.016 step / 10 sec, and a measurement range of 10 to 100 [° 2 Theta] (Cu). The crystallite diameter of the obtained nickel fine particles was calculated from XRD measurement.
- XRD X-ray diffraction
- ICPS-8100 manufactured by Shimadzu Corporation was used for quantification of elements contained in the dry powder of nickel fine particles by inductively coupled plasma emission spectroscopy (ICP).
- ICP inductively coupled plasma emission spectroscopy
- Examples 1 to 17 The nickel compound fluid having the formulation shown in Table 1 and the reducing agent fluid having the formulation shown in Table 2 were mixed under the treatment conditions shown in Table 3 using the fluid treatment apparatus shown in FIG. The obtained dry powder of nickel fine particles was analyzed. The results are shown in Table 4. The supply pressure of the first fluid and the rotational speed of the processing unit 10 are as described above. In addition, the nickel fine particle dispersion discharged from between the processing surfaces 1 and 2 showed basicity in all of Examples 1 to 17. In Examples 1 to 14, the nickel compound fluid was prepared by dissolving nickel sulfate hexahydrate in a mixed solvent obtained by mixing ethylene glycol, polyethylene glycol 600, and pure water, and changing pH and sulfate ion concentration.
- sulfuric acid, ammonium sulfate, and potassium sulfate were added as sulfuric acid compounds.
- NiSO 4 .6H 2 O is nickel sulfate hexahydrate
- EG ethylene glycol
- PEG 600 polyethylene glycol 600
- PW is pure water
- HMH is hydrazine monohydrate
- KOH is potassium hydroxide
- H 2 SO 4 is sulfuric acid
- (NH 4 ) 2 SO 4 is ammonium sulfate
- K 2 SO 4 is sulfuric acid Potassium
- HNO 3 is nitric acid
- KNO 3 is potassium nitrate
- CH 3 COOH is acetic acid
- CH 3 COOK is potassium acetate
- SO 4 2 ⁇ is a sulfate ion
- CH 3 COO ⁇ 3 is an acetate ion.
- the crystallite diameter is controlled while controlling the increase in the particle diameter of the precipitated nickel fine particles by controlling the molar ratio of sulfate ion to nickel (SO 4 2 ⁇ / Ni) in the first fluid. It has been confirmed that it helps to increase. It was also confirmed that the crystallite size was increased and the particle size was also prevented from increasing. Therefore, it was confirmed that the ratio (d / D) of the crystallite diameter to the particle diameter of the nickel fine particles can be controlled.
- the pH of the first fluid in Examples 1 to 17 is 4.1 or less. When the pH of the first fluid is 4.1 or less, the ratio (d) is controlled by controlling the molar ratio of sulfate ions to nickel (SO 4 2 ⁇ / Ni) in the first fluid to exceed 1.0.
- the ratio (d / D) is increased by increasing the molar ratio of sulfate ions to nickel (SO 4 2 ⁇ / Ni) in the first fluid.
- Example 18 to 23 Except that the formulation of the nickel compound fluid was set to Table 5 and the processing conditions were set to Table 6, the same procedure as in Examples 1 to 17 was performed to obtain a dry powder of nickel fine particles. The results are shown in Table 7. In all of Examples 15 to 23, the nickel fine particle dispersion discharged from between the processing surfaces 1 and 2 showed basicity.
- the crystallite diameter is suppressed while suppressing the particle diameter of the precipitated nickel fine particles from increasing. It has been confirmed that it helps to increase. It was also confirmed that the crystallite size was increased and the particle size was also prevented from increasing. Therefore, it was confirmed that the ratio (d / D) of the crystallite diameter to the particle diameter of the nickel fine particles can be controlled.
- the pH of the first fluid in Examples 18 to 23 is more than 4.1 and not more than 4.7.
- the pH of the first fluid exceeds 4.1 and is 4.4 or less, the molar ratio of sulfate ion to nickel (SO 4 2 ⁇ / Ni) in the first fluid is controlled to exceed 1.2. Thus, it was confirmed that nickel fine particles having a ratio (d / D) of 0.30 or more can be produced. Further, when the pH of the first fluid is more than 4.1 and not more than 4.4, the molar ratio of sulfate ions to nickel (SO 4 2 ⁇ / Ni) in the first fluid is more than 1.1. It was confirmed that nickel fine particles having a crystallite diameter (d) of 30 nm or more can be produced by controlling.
- the ratio (d / D) when the pH of the first fluid is the same, the ratio (d / D) can be increased by increasing the molar ratio of sulfate ion to nickel (SO 4 2 ⁇ / Ni) in the first fluid. ) Can be increased, and the ratio (d / D) can be reduced by lowering the molar ratio of sulfate ion to nickel (SO 4 2 ⁇ / Ni) in the first fluid. It was confirmed.
- Comparative Examples 1 to 7 Except that the formulation of the nickel compound fluid was set to Table 8 and the processing conditions were set to Table 9, the same procedure as in Examples 1 to 17 was performed to obtain a dry powder of nickel fine particles. The results are shown in Table 10. In all of Comparative Examples 1 to 7, the nickel fine particle dispersion discharged from between the processing surfaces 1 and 2 showed basicity.
- the nickel compound fluid is prepared by dissolving nickel sulfate hexahydrate in a mixed solvent of ethylene glycol, polyethylene glycol 600 and pure water, and adding nitric acid and / or potassium nitrate separately to change only the pH. did.
- the pH of the first fluid is 4.1 or less
- the liquid feeding temperature is 135 ° C. ⁇ 2 ° C.
- the molar ratio of sulfate ion to nickel in the first fluid SO 4 2 ⁇ / Ni
- the nickel fine particles obtained in Comparative Examples 1 and 2 with a constant value of 1.00 had a crystallite diameter (d) of 30 nm or more, but the particle diameter (D) also increased at the same time, and the ratio (d / D) was well below 0.30.
- the pH of the first fluid is 4.1 or less
- the liquid feeding temperature is 153 ° C.
- the nickel fine particles obtained in Comparative Examples 3 to 5 having a constant value of 0.000 had a crystallite diameter (d) of less than 30 nm and a ratio (d / D) of less than 0.30. Furthermore, the pH of the first fluid exceeds 4.1 and is 4.4 or less, and the liquid feeding temperature is 153 ° C.
- the nickel fine particles obtained in Comparative Examples 6 and 7 with-/ Ni) kept constant at 1.00 also had a crystallite diameter (d) of less than 30 nm and a ratio (d / D) of less than 0.30. . Further, even when the total molar ratio of sulfate ion and nitrate ion to nickel in the first fluid exceeded 1.20, the ratio (d / D) did not become 0.30 or more.
- the ratio (d / D) is controlled only by changing the pH of the first fluid while keeping the molar ratio (SO 4 2 ⁇ / Ni) of sulfate ion to nickel in the first fluid constant at 1.00. I confirmed that I could not.
- Comparative Examples 8-12 Except that the formulation of the nickel compound fluid was set to Table 11 and the processing conditions were set to Table 12, the same procedure as in Examples 1 to 17 was performed to obtain a dry powder of nickel fine particles. The results are shown in Table 13. In all of Comparative Examples 8 to 12, the nickel fine particle dispersion discharged from between the processing surfaces 1 and 2 showed basicity.
- the nickel compound fluid is prepared by dissolving nickel sulfate hexahydrate in a mixed solvent of ethylene glycol, polyethylene glycol 600 and pure water, and adding acetic acid and / or potassium acetate separately to change only the pH. Prepared.
- the pH of the first fluid is 4.1 or less
- the liquid feeding temperature is 153 ° C. ⁇ 2 ° C.
- the molar ratio of sulfate ion to nickel in the first fluid SO 4 2 ⁇ / Ni
- the nickel fine particles obtained in Comparative Examples 8, 9, and 10 having a constant value of 1.00 had a crystallite diameter (d) of 30 nm or more, but the particle diameter (D) was also increased at the same time. (D / D) was well below 0.30.
- the pH of the first fluid exceeds 4.1 and is 4.4 or less
- the liquid feeding temperature is 153 ° C.
- the nickel fine particles obtained in Comparative Examples 11 and 12 with a constant / Ni) of 1.00 had a crystallite diameter (d) of less than 30 nm and a ratio (d / D) of less than 0.30. .
- the ratio (d / D) did not become 0.3 or more.
- the ratio (d / D) is controlled only by changing the pH of the first fluid while keeping the molar ratio (SO 4 2 ⁇ / Ni) of sulfate ion to nickel in the first fluid constant at 1.00. I confirmed that I could not.
- Examples 24 to 31 A nickel compound fluid having a formulation shown in Table 14 and a reducing agent fluid having a formulation shown in Table 15 were mixed by the fluid processing apparatus shown in FIG. 1 under the processing conditions shown in Table 16 to precipitate nickel fine particles. The obtained dry powder of nickel fine particles was analyzed. The results are shown in Table 17. The supply pressure of the first fluid and the rotational speed of the processing unit 10 are as described above. In all of Examples 24 to 31, the nickel fine particle dispersion discharged from between the processing surfaces 1 and 2 showed basicity.
- the nickel compound fluid was prepared by dissolving nickel sulfate hexahydrate in a mixed solvent in which ethylene glycol, polyethylene glycol 600 and pure water were mixed. In Examples 24 to 28, the same amount of sulfuric acid was separately added. No. 31 was prepared without adding sulfuric acid. In each of Examples 24-28 and 29-31, the concentration of polyethylene glycol 600 in the nickel compound fluid was varied.
- nickel fine particles having a ratio (d / D) of 0.30 or more and a crystallite diameter (d) of 30 nm or more were obtained.
- the nickel fine particles are increased by increasing the concentration of polyethylene glycol 600.
- the crystallite size (d) and the particle size (D) thereof tend to be small. Therefore, it was confirmed that the ratio (d / D) tends to decrease by increasing the concentration of polyethylene glycol 600.
- nickel fine particles having a crystallite diameter (d) of 30 nm or more were obtained, but the ratio (d / D) was much lower than 0.30.
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Abstract
Description
結晶子径 D=K・λ/(β・cosθ) ・・・Scherrerの式
ここで、KはScherrer定数であり、K=0.9とする。λは使用したX線管球の波長、βは半値幅、θは回折角を用いて算出する。
特許文献1には、レーザ回折散乱式粒度分布測定による平均粒子径(D50値)の1.5倍以上の粒子径を持つ粒子個数が全粒子個数の20%以下であり、該平均粒子径(D50値)の0.5倍以下の粒子径を持つ粒子個数が全粒子個数の5%以下であり、且つニッケル粒子内の平均結晶子径が400Å以上であるニッケル粉について記載されている。そのニッケル粉は、湿式法または乾式法で製造されたニッケル粉とアルカリ土類金属化合物の微粉末とを混合した後、またはニッケル粉の各粒子表面にアルカリ土類金属化合物を被覆させた後、不活性ガス又は微還元性ガス雰囲気中で、アルカリ土類金属化合物の溶融温度未満の温度で熱処理して得られたものであることや、SEM観察による平均粒子径が0.05~1μmであることが好ましいことが記載されている。
特許文献2には、熱プラズマによってニッケルを蒸発させ、凝縮させて微粉化することによって得られたニッケル微粉であって、走査電子顕微鏡観察から求めた個数平均粒径が0.05~0.2μmであり、硫黄含有量が0.1~0.5質量%であり、かつ、0.6μm以上の粗大粒子のニッケル微粉中に含まれる割合が個数基準で50ppm以下であるニッケル微粉について記載されている。また、そのニッケル微粉は、X線回折分析によって求められる結晶子径が、上記個数平均粒径に対して66%以上であることが好ましいことが記載されている。
特許文献3には、ポリオール溶媒に、還元剤、分散剤、及びニッケル塩を添加して混合溶液を製造し、この混合溶液を撹拌して昇温した後、反応温度及び時間を調整して還元反応によって得られるニッケルナノ粒子について記載されている。また、粒度が均一であり、分散性に優れたニッケル微粒子が得られることが記載されている
また、本願発明は、上記ニッケル化合物流体として、下記のものを用いることによって、上記の比率(d/D)が0.30以上であるニッケル微粒子を得るものとして実施することができる。上記ニッケル化合物流体としては、上記ニッケル化合物流体の室温条件下でのpHが4.1以下を示し、かつ、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.0を超えるものである。
また、本願発明は、上記ニッケル化合物流体として、下記のものを用いることによって、上記結晶子径(d)が30nm以上であるニッケル微粒子を得るものとして実施することができる。上記ニッケル化合物流体としては、上記ニッケル化合物流体の室温条件下でのpHが4.1以下を示し、かつ、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.0を超えるものである。
また、本願発明は、上記ニッケル化合物流体として、下記のものを用いることによって、上記結晶子径(d)が30nm以上であるニッケル微粒子を得るものとして実施することができる。上記ニッケル化合物流体としては、上記ニッケル化合物流体の室温条件下でのpHが4.1を超えて4.4以下を示し、かつ、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.1を超えるものである。
また、本願発明は、上記ニッケル化合物流体として、下記のものを用いることによって、上記の比率(d/D)が0.30以上であるニッケル微粒子を得るものとして実施することができる。上記ニッケル化合物流体としては、上記ニッケル化合物流体の室温条件下でのpHが4.1を超えて4.4以下を示し、かつ、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.2を超えるものである。
また、本願発明は、上記ニッケル化合物流体は、上記ポリオールを含み、上記ポリオールが、エチレングリコールとポリエチレングリコールとであり、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.24では、上記ニッケル化合物流体中の上記ポリオールの濃度を高くすることで上記の比率(d/D)が大きくなるよう制御するものであり、上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.00では、上記ニッケル化合物流体中の上記ポリオールの濃度を高くすることで上記の比率(d/D)が小さくなるよう制御するものとして実施することができる。
また、本願発明は、上記ニッケル化合物流体が、上記薄膜流体を形成しながら上記少なくとも2つの処理用面間を通過し、上記ニッケル化合物流体が流される流路とは独立した別途の導入路を備えており、上記少なくとも2つの処理用面の少なくとも何れか一方に上記別途の導入路に通じる開口部を少なくとも一つ備え、上記還元剤流体を、上記開口部から上記少なくとも2つの処理用面間に導入して、上記ニッケル化合物流体と上記還元剤流体とを、上記薄膜流体中で混合するものとして実施することができる。
また、本願発明は、ニッケル化合物流体中のpHとニッケル化合物流体中のニッケルに対する硫酸イオンのモル比とを制御するという簡単な処理条件の変更によって、ニッケル微粒子の粒子径に対する結晶子径の比率を制御することができるため、これまで以上に低コスト、低エネルギーで目的に応じたニッケル微粒子を作り分けることができ、安価かつ安定的にニッケル微粒子を提供することができる。
さらに、本願発明は、所望する粒子径のニッケル微粒子に目的とする物性を付与させることができる。
本願発明に係る還元剤流体は、還元剤を溶媒に溶解または分子分散(以下、単に、溶解とする。)したものである。
また、ニッケル化合物流体と、還元剤流体との少なくとも何れか一方の流体には、ポリオールが含まれる。
また、ヒドラジンやヒドラジン一水和物など、還元作用において一定のpH領域の確保を必要とする還元剤を用いる場合には、還元剤と共にpH調整物質を併用してもよい。pH調整物質の一例としては、塩酸や硫酸、硝酸や王水、トリクロロ酢酸やトリフルオロ酢酸、リン酸やクエン酸、アスコルビン酸などの無機または有機の酸のような酸性物質や、水酸化ナトリウムや水酸化カリウムなどの水酸化アルカリや、トリエチルアミンやジメチルアミノエタノールなどのアミン類などの塩基性物質、上記の酸性物質や塩基性物質の塩などが挙げられる。pH調整物質は、単独で用いてもよく、2種以上を併用してもよい。
本願発明においては、上述の還元剤とポリオールとを併用してニッケルイオンを還元するポリオール還元法を用いてニッケル微粒子を得るものである。
本願発明においては、ニッケル化合物流体に硫酸イオンを含み、その濃度を変化させることによって、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比を変化させることができる。また、同時にニッケル化合物流体のpHを変化させることができるが、ニッケル化合物流体のpHについては、上述のpH調整物質を用いて別途調整することもできる。そして、ニッケル化合物流体と還元剤流体とを後述するような方法で混合する際に、ニッケル化合物流体のpHとニッケル化合物流体中のニッケルに対する硫酸イオンのモル比とを制御することによって、得られるニッケル微粒子の粒子径(D)に対する結晶子径(d)の比率(d/D)を制御することができる。本願の出願人は、硫酸イオンが、ニッケル微粒子の粒子の成長を制御して、結晶子の成長を助長する作用を有し、その結果、ニッケル化合物流体のpHとニッケル化合物流体中のニッケルに対する硫酸イオンのモル比とを制御することによって、得られるニッケル微粒子の粒子径(D)に対する結晶子径(d)の比率(d/D)を制御できたものと考えている。ここで、ニッケル化合物流体中のニッケルとは、ニッケルイオンやニッケルの錯イオンなどの状態を問わずにニッケル化合物流体中に含まれる全てのニッケルを言う。
ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比は、ニッケル微粒子の粒子径に対する結晶子径の比率を良好に制御するために、1.00を超えていることが望ましい。その点において、ニッケルイオンと硫酸イオンとを等しく含む硫酸ニッケルまたはその水和物をニッケル化合物として用いることが好適である。ニッケル化合物を溶解する際に用いる溶媒によっては、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比を高めるために硫酸化合物を添加しすぎると、ニッケル化合物流体中のニッケルイオンと硫酸イオンとが作用して、例えば硫酸ニッケルなどの析出物が生じる。ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比と溶媒のニッケル化合物並びに硫酸化合物に対する溶解度とのバランスが大切である。
本発明において、ニッケル化合物流体の室温条件下でのpHが酸性であり、ニッケル微粒子の粒子径に対する結晶子径の比率を良好に制御するために、ニッケル化合物流体の室温条件下でのpHは4.4以下が望ましく、4.1以下がより望ましい。なお、この制御を行なう流体の調製や混合等の操作は、室温にて行なうものであってもよいが、室温以外の環境での操作であっても、室温条件下でのpHが上記のものとなる条件が満たされておればよい。
本発明において、還元剤流体のpHは、特に限定されない。還元剤の種類や濃度などによって適宜選択すればよい。
また、還元剤流体に、上記硫酸化合物を添加しても良い。
また、ニッケル化合物流体と還元剤流体とを後述するような方法で混合する際に、ニッケル化合物流体として、ニッケル化合物流体の室温条件下でのpHが4.1以下を示し、かつ、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.0を超えるものを用いることが望ましい。比率(d/D)が0.30以上、好ましくは0.35以上、より好ましくは0.40以上で、結晶子径(d)が30nm以上、好ましくは35nm以上、より好ましくは40nm以上のニッケル微粒子を得る上で、好適である。
さらに、ニッケル化合物流体と還元剤流体とを後述するような方法で混合する際に、結晶子径(d)が30nm以上のニッケル微粒子を得る上では、ニッケル化合物流体として、ニッケル化合物流体のpHが4.1を超えて4.4以下を示し、かつ、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.1を超えるものを用いることが望ましく、比率(d/D)が0.30以上のニッケル微粒子を得る上では、ニッケル化合物流体として、ニッケル化合物流体のpHが4.1を超えて4.4以下を示し、かつ、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.2を超えるものを用いることが望ましい。なお、この制御を行なう流体の調製や混合等の操作は、室温にて行なうものであってもよいが、室温以外の環境での操作であっても、室温条件下でのpHが上記のものとなる条件が満たされておればよい。
比率(d/D)が0.30以上のニッケル微粒子や結晶子径が30nm以上のニッケル微粒子は、熱処理後の収縮を抑制することができることから、特に、セラミックコンデンサ用途に適している。
本願発明においては、目的や必要に応じて各種分散剤や界面活性剤を用いる事ができる。特に限定されないが、界面活性剤及び分散剤としては一般的に用いられる様々な市販品や、製品または新規に合成したものなどを使用できる。特に限定されないが、陰イオン性界面活性剤、陽イオン性界面活性剤、非イオン性界面活性剤や、各種ポリマーなどの分散剤などを挙げることができる。これらは単独で用いてもよく、2種以上を併用してもよい。また、ポリエチレングリコールやポリプロピレングリコールなどをポリオールとして用いた場合には、ポリオールが分散剤としても作用する。
ニッケル化合物流体と還元剤流体とを後述するような方法で混合する際に、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比と、ニッケル化合物流体と還元剤流体との少なくとも何れか一方に含まれ、分散剤としても作用するポリオールの濃度とを制御することによっても、得られるニッケル微粒子の粒子径(D)に対する結晶子径(d)の比率(d/D)を制御することができる。
その際、分散剤としても作用するポリオールは、ニッケル化合物流体に含まれることが望ましく、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.24では、ニッケル化合物流体中の分散剤としても作用するポリオールの濃度を高くすることで上記の比率(d/D)が高くなるよう制御し、ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.00では、ニッケル化合物流体中の分散剤としても作用するポリオールの濃度を高くすることで上記の比率(d/D)が小さくなるよう制御することが望ましい。
この鏡面研磨の面粗度は、特に限定されないが、好ましくはRa0.01~1.0μm、より好ましくはRa0.03~0.3μmとする。
このように、3次元的に変位可能に保持するフローティング機構によって、第2処理用部20を保持することが望ましい。
P=P1×(K-k)+Ps
なお、図示は省略するが、近接用調整面24を離反用調整面23よりも広い面積を持ったものとして実施することも可能である。
レイノルズ数Re=慣性力/粘性力=ρVL/μ=VL/ν
ここで、ν=μ/ρは動粘度、Vは代表速度、Lは代表長さ、ρは密度、μは粘度を示す。
そして、流体の流れは、臨界レイノルズ数を境界とし、臨界レイノルズ数以下では層流、臨界レイノルズ数以上では乱流となる。
上記流体処理装置の両処理用面1,2間は微小間隔に調整されるため、両処理用面1,2間に保有される流体の量は極めて少ない。そのため、代表長さLが非常に小さくなり、両処理用面1,2間を通過する薄膜流体の遠心力は小さく、薄膜流体中は粘性力の影響が大きくなる。従って、上記のレイノルズ数は小さくなり、薄膜流体は層流となる。
遠心力は、回転運動における慣性力の一種であり、中心から外側に向かう力である。遠心力は、以下の式で表される。
遠心力F=ma=mv2/R
ここで、aは加速度、mは質量、vは速度、Rは半径を示す。
上述の通り、両処理用面1,2間に保有される流体の量は少ないため、流体の質量に対する速度の割合が非常に大きくなり、その質量は無視できるようになる。従って、両処理用面1,2間にできる薄膜流体中においては重力の影響を無視できる。そのため、本来微粒子として析出させることが難しい比重差のある2種以上の金属元素を含む合金や複合金属化合物などの微粒子においても、両処理用面1,2間にできる薄膜流体中で析出させることができる。
この凹部13の先端と第1処理用面1の外周面との間には、凹部13のない平坦面16が設けられている。
円環形状の開口部d20を処理用面2の中央の開口を取り巻く同心円状に設けた場合、処理用面1,2間に導入する第2流体を同一条件で導入することができるため、より均一な拡散・反応・析出等の流体処理を行うことができる。微粒子を量産する場合には、開口部を円環形状とすることが好ましい。
さらに、第1、第2流体等の被処理流動体の温度を制御したり、第1流体と第2流体等との温度差(即ち、供給する各被処理流動体の温度差)を制御することもできる。供給する各被処理流動体の温度や温度差を制御するために、各被処理流動体の温度(処理装置、より詳しくは、処理用面1,2間に導入される直前の温度)を測定し、処理用面1,2間に導入される各被処理流動体の加熱又は冷却を行う機構を付加して実施することも可能である。
本発明において、ニッケル化合物流体と還元剤流体とを混合する際の温度は、特に限定されない。ニッケル化合物の種類や還元剤の種類、流体のpHなどによって適切な温度で実施することが可能である。
図1に示される流体処理装置を用いて、ニッケル化合物流体と還元剤流体とを、対向して配設された、接近・離反可能な処理用面をもつ、少なくとも一方が他方に対して回転する処理用面1,2間に形成される薄膜流体中で混合し、薄膜流体中でニッケル微粒子を析出させる。
具体的には、中央から第1流体としてニッケル化合物流体を供給圧力=0.50MPaGで送液する。第1流体は図1の処理用部10の処理用面1と処理用部20の処理用面2との間の密封された空間(処理用面間)に、送り込まれる。処理用部10の回転数は3600 rpmである。第1流体は処理用面1,2間において強制された薄膜流体を形成し、処理用部10,20の外周より吐出される。第2流体として還元剤流体を処理用面1,2間に形成された薄膜流体に直接導入する。微小間隔に調製された処理用面1,2間においてニッケル化合物流体と還元剤流体とを混合させ、ニッケル微粒子を析出させる。ニッケル微粒子を含むスラリー(ニッケル微粒子分散液)が、処理用面1,2間より吐出される。
処理用面1,2間より吐出されたニッケル微粒子分散液を磁石の上に置き、ニッケル微粒子を沈降させ、上澄み液を除去した後に、純水にて洗浄する作業を3回行い、得られたウェットケーキを25℃で大気圧にて乾燥し、ニッケル微粒子の乾燥粉体を作製した。
(pH測定)
pH測定には、HORIBA製の型番D-51のpHメーターを用いた。各被処理流動体を流体処理装置に導入する前に、その被処理流動体のpHを室温にて測定した。
(走査型電子顕微鏡観察)
走査型電子顕微鏡(SEM)観察には、電界放射型走査電子顕微鏡(FE-SEM):日本電子製のJSM-7500Fを使用した。観察条件としては、観察倍率を1万倍以上とし、粒子径については、SEM観察にて確認されたニッケル微粒子100個の一次粒子径の平均値を採用した。
(X線回折測定)
X線回折(XRD)測定には、粉末X線回折測定装置 X‘Pert PRO MPD(XRD スペクトリス PANalytical事業部製)を使用した。測定条件は,Cu対陰極,管電圧45kV,管電流40mA,0.016step/10sec、測定範囲は10~100[°2Theta](Cu)である。得られたニッケル微粒子の結晶子径をXRD測定より算出した。シリコン多結晶盤は、47.3℃に確認されるピークを使用し、得られたニッケル回折パターンの44.5°付近のピークにScherrerの式を当てはめた。
(ICP分析:不純物元素検出)
誘導結合プラズマ発光分光分析(ICP)によるニッケル微粒子の乾燥粉体中に含まれる元素の定量には、島津製作所製のICPS-8100を用いた。
ニッケル微粒子の乾燥粉体を硝酸に溶解させた溶液を測定した。実施例、比較例の全てにおいて、ニッケル元素以外の元素は全て検出範囲外であった。
表1に示す処方のニッケル化合物流体と、表2に示す処方の還元剤流体とを、図1に示す流体処理装置にて表3の処理条件にて混合し、ニッケル微粒子を析出させた。得られたニッケル微粒子の乾燥粉体を分析した。結果を表4に示す。なお、第1流体の供給圧力と処理用部10の回転数は、上述の通りである。また、処理用面1,2間より吐出されたニッケル微粒子分散液は、実施例1~17の全てにおいて、塩基性を示した。
ニッケル化合物流体は、実施例1~14においては、エチレングリコールとポリエチレングリコール600と純水とを混合した混合溶媒に硫酸ニッケル六水和物を溶解し、pH及び硫酸イオン濃度を変更するために、別途硫酸化合物として、硫酸、硫酸アンモニウム、硫酸カリウムを添加して調製し、実施例15~17においては、ポリエチレングリコール600に変えてポリビニルピロリドン(k=30)を用いた以外は、実施例1~14と同様に調製した。
また、表1から後述する表16までの表中における略記号は、NiSO4・6H2Oは硫酸ニッケル六水和物、EGはエチレングリコール、PEG600はポリエチレングリコール600、PVP(k=30)はポリビニルピロリドン(k=30)、PWは純水、HMHはヒドラジン一水和物、KOHは水酸化カリウム、H2SO4は硫酸、(NH4)2SO4は硫酸アンモニウム、K2SO4は硫酸カリウム、HNO3は硝酸、KNO3は硝酸カリウム、CH3COOHは酢酸、CH3COOKは酢酸カリウム、SO4 2-は硫酸イオン、CH3COO-3は酢酸イオンである。
実施例1~17の第1流体のpHは4.1以下である。第1流体のpHが4.1以下の場合は、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)が1.0を超えるように制御することによって、比率(d/D)が0.30以上であり、結晶子径(d)が30nm以上のニッケル微粒子を製造することができることを確認した。比率(d/D)が0.30以上のニッケル微粒子や結晶子径が30nm以上のニッケル微粒子は、熱処理後の収縮を抑制できることから、セラミックコンデンサ用途に適したニッケル微粒子を製造できることを確認できた。
また、実施例1~14で用いたポリエチレングリコール600をポリビニルピロリドン(k=30)に変更して実施した実施例15~18においても、実施例1~14と同様の結果が得られた。
また、実施例1~14において、第1流体のpHが同じ場合は、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を高くすることで、比率(d/D)を大きくすることが可能であり、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を低くすることで、 比率(d/D)を小さくすることが可能であることを確認した。
ニッケル化合物流体の処方を表5とし、処理条件を表6とした以外は、実施例1~17の場合と同様に実施して、ニッケル微粒子の乾燥粉体を得た。結果を表7に示す。また、実施例15~23の全てにおいて、処理用面1,2間より吐出されたニッケル微粒子分散液は、塩基性を示した。
実施例18~23の第1流体のpHは4.1を超えて4.7以下である。第1流体のpHが4.1を超えて4.4以下の場合は、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)が1.2を超えるように制御することによって、比率(d/D)が0.30以上のニッケル微粒子を製造することができることを確認した。また、第1流体のpHが4.1を超えて4.4以下の場合は、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)が1.1を超えるように制御することによって、結晶子径(d)が30nm以上のニッケル微粒子を製造することができることを確認した。
また、実施例18~23において、第1流体のpHが同じ場合は、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を高くすることで、 比率(d/D)を大きくすることが可能であり、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を低くすることで、 比率(d/D)を小さくすることが可能であることを確認した。
ニッケル化合物流体の処方を表8とし、処理条件を表9とした以外は、実施例1~17の場合と同様に実施して、ニッケル微粒子の乾燥粉体を得た。結果を表10に示す。また、比較例1~7の全てにおいて、処理用面1,2間より吐出されたニッケル微粒子分散液は、塩基性を示した。
ニッケル化合物流体は、エチレングリコールとポリエチレングリコール600と純水とを混合した混合溶媒に硫酸ニッケル六水和物を溶解し、pHのみを変更するために、別途硝酸及び/または硝酸カリウムを添加して調製した。
第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を1.00と一定とし、第1流体のpHを変化させただけでは、比率(d/D)を制御することができないことを確認した。
ニッケル化合物流体の処方を表11とし、処理条件を表12とした以外は、実施例1~17の場合と同様に実施して、ニッケル微粒子の乾燥粉体を得た。結果を表13に示す。また、比較例8~12の全てにおいて、処理用面1,2間より吐出されたニッケル微粒子分散液は、塩基性を示した。
ニッケル化合物流体は、エチレングリコールとポリエチレングリコール600と純水とを混合した混合溶媒に硫酸ニッケル六水和物を溶解し、pHのみを変更するために、別途酢酸及び/または酢酸カリウムを添加して調製した。
第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)を1.00と一定とし、第1流体のpHを変化させただけでは、比率(d/D)を制御することができないことを確認した。
表14に示す処方のニッケル化合物流体と、表15に示す処方の還元剤流体とを、図1に示す流体処理装置にて表16の処理条件にて混合し、ニッケル微粒子を析出させた。得られたニッケル微粒子の乾燥粉体を分析した。結果を表17に示す。なお、第1流体の供給圧力と処理用部10の回転数は、上述の通りである。また、実施例24~31の全てにおいて、処理用面1,2間より吐出されたニッケル微粒子分散液は、塩基性を示した。
ニッケル化合物流体は、エチレングリコールとポリエチレングリコール600と純水とを混合した混合溶媒に硫酸ニッケル六水和物を溶解し、実施例24~28においては別途硫酸を同量添加し、実施例29~31においては硫酸を添加せずに調製した。実施例24~28と実施例29~31のそれぞれにおいて、ニッケル化合物流体中のポリエチレングリコール600の濃度を変化させた。
また、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)が1.00である、実施例29~31においては、ポリエチレングリコール600の濃度を高くすることによって、ニッケル微粒子の結晶子径(d)とその粒子径(D)は小さくなる傾向を示した。よって、ポリエチレングリコール600の濃度を高くすることによって、比率(d/D)が小さくなる傾向を示すことを確認した。また、実施例29~30においては、結晶子径(d)は30nm以上のニッケル微粒子が得られたが、その比率(d/D)は0.30を大きく下回った。
よって、第1流体中のニッケルに対する硫酸イオンのモル比(SO4 2-/Ni)が1.00を超えたところでは、ポリエチレングリコール600の濃度を高くすることによって、比率(d/D)を大きくさせる可能性が示された。
2 第2処理用面
10 第1処理用部
11 第1ホルダ
20 第2処理用部
21 第2ホルダ
d1 第1導入部
d2 第2導入部
d20 開口部
Claims (12)
- 少なくとも2種類の被処理流動体を用いるものであり、
そのうちで少なくとも1種類の被処理流動体は、ニッケル化合物を溶媒に溶解させたニッケル化合物流体であり、
上記ニッケル化合物流体には、硫酸イオンを含むものであり、
上記以外の被処理流動体で少なくとも1種類の被処理流動体は、還元剤を溶媒に溶解した還元剤流体であり、
上記ニッケル化合物流体と、上記還元剤流体との、少なくともいずれか一方の被処理流動体には、ポリオールを含むものであり、
上記の被処理流動体を、対向して配設された、接近・離反可能な、少なくとも一方が他方に対して相対的に回転する少なくとも2つの処理用面の間にできる薄膜流体中で混合し、ニッケル微粒子を析出させるものであり、
上記少なくとも2つの処理用面間に導入される上記ニッケル化合物流体のpHと上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比とを制御することによって、上記ニッケル微粒子の粒子径(D)に対する上記ニッケル微粒子の結晶子径(d)の比率(d/D)を制御するものであることを特徴とする、ニッケル微粒子の製造方法。 - 上記少なくとも2つの処理用面間に導入される上記ニッケル化合物流体の室温条件下でのpHが、酸性条件下で一定となるとの条件を維持しつつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が高くなるようにすることで上記の比率(d/D)が大きくなるよう制御するものであり、
上記少なくとも2つの処理用面間に導入される上記ニッケル化合物流体の室温条件下でのpHが、酸性条件下で一定となるとの条件を維持しつつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が低くなるようにすることで上記の比率(d/D)が小さくなるよう制御するものであることを特徴とする、請求項1に記載のニッケル微粒子の製造方法。 - 上記ニッケル化合物流体として、下記のものを用いることによって、上記の比率(d/D)が0.30以上であるニッケル微粒子を得ることを特徴とする、請求項1または2に記載のニッケル微粒子の製造方法。
上記ニッケル化合物流体の室温条件下でのpHが4.1以下を示し、
かつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.0を超えるものである。 - 上記ニッケル化合物流体として、下記のものを用いることによって、上記結晶子径(d)が30nm以上であるニッケル微粒子を得ることを特徴とする、請求項1~3の何れかに記載のニッケル微粒子の製造方法。
上記ニッケル化合物流体の室温条件下でのpHが4.1以下を示し、
かつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.0を超えるものである。 - 上記ニッケル化合物流体として、下記のものを用いることによって、上記結晶子径(d)が30nm以上であるニッケル微粒子を得ることを特徴とする、請求項1または2に記載のニッケル微粒子の製造方法。
上記ニッケル化合物流体の室温条件下でのpHが4.1を超えて4.4以下を示し、
かつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.1を超えるものである。 - 上記ニッケル化合物流体として、下記のものを用いることによって、上記の比率(d/D)が0.30以上であるニッケル微粒子を得ることを特徴とする、請求項1、2、5の何れかに記載のニッケル微粒子の製造方法。
上記ニッケル化合物流体の室温条件下でのpHが4.1を超えて4.4以下を示し、
かつ、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.2を超えるものである。 - 上記ポリオールが、エチレングリコール、プロピレングリコール、トリメチレングリコール、テトラエチレングリコール、ポリエチレングリコール、ジエチレングリコール、グリセリン、ポリプロピレングリコールから選ばれる少なくとも何れか1種であることを特徴とする、請求項1~6の何れかに記載のニッケル微粒子の製造方法。
- 少なくとも2種類の被処理流動体を用いるものであり、
そのうちで少なくとも1種類の被処理流動体は、ニッケル化合物を溶媒に溶解させたニッケル化合物流体であり、
上記ニッケル化合物流体には、硫酸イオンを含むものであり、
上記以外の被処理流動体で少なくとも1種類の被処理流動体は、還元剤を溶媒に溶解した還元剤流体であり、
上記ニッケル化合物流体と、上記還元剤流体との、少なくともいずれか一方の被処理流動体には、ポリオールを含むものであり、
上記の被処理流動体を、対向して配設された、接近・離反可能な、少なくとも一方が他方に対して相対的に回転する少なくとも2つの処理用面の間に出来る薄膜流体中で混合し、ニッケル微粒子を析出させるものであり、
上記少なくとも2つの処理用面間に導入される、上記ニッケル化合物流体と上記還元剤流体との、少なくともいずれか一方の被処理流動体中のポリオールの濃度と上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比とを制御することによって、上記ニッケル微粒子の粒子径(D)に対する上記ニッケル微粒子の結晶子径(d)の比率(d/D)を制御することを特徴とする、ニッケル微粒子の製造方法。 - 上記ニッケル化合物流体は、上記ポリオールを含み、
上記ポリオールが、エチレングリコールとポリエチレングリコールとであり、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.24では、上記ニッケル化合物流体中の上記ポリオールの濃度を高くすることで上記の比率(d/D)が大きくなるよう制御するものであり、
上記ニッケル化合物流体中のニッケルに対する硫酸イオンのモル比が1.00では、上記ニッケル化合物流体中の上記ポリオールの濃度を高くすることで上記の比率(d/D)が小さくなるよう制御することを特徴とする、請求項8に記載のニッケル微粒子の製造方法。 - 上記ニッケル化合物が、硫酸ニッケルの水和物であることを特徴とする、請求項1~9の何れかに記載のニッケル微粒子の製造方法。
- 上記少なくとも2つの処理用面として、第1処理用面と第2処理用面とを備え、
第1処理用面と第2処理用面との間に上記被処理流動体を導入し、
この被処理流動体の圧力により第1処理用面から第2処理用面を離反させる方向に移動させる力を発生させ、この力によって、第1処理用面から第2処理用面との間が微小な間隔に保たれ、この微小間隔に保たれた第1処理用面と第2処理用面との間を通過する上記被処理流動体が上記薄膜流体を形成することを特徴とする、請求項1~10の何れかに記載のニッケル微粒子の製造方法。 - 上記ニッケル化合物流体が、上記薄膜流体を形成しながら上記少なくとも2つの処理用面間を通過し、
上記ニッケル化合物流体が流される流路とは独立した別途の導入路を備えており、
上記少なくとも2つの処理用面の少なくとも何れか一方に上記別途の導入路に通じる開口部を少なくとも一つ備え、
上記還元剤流体を、上記開口部から上記少なくとも2つの処理用面間に導入して、上記ニッケル化合物流体と上記還元剤流体とを、上記薄膜流体中で混合することを特徴とする、請求項1~11の何れかに記載のニッケル微粒子の製造方法。
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007197836A (ja) | 2007-03-06 | 2007-08-09 | Mitsui Mining & Smelting Co Ltd | ニッケル粉 |
WO2009008390A1 (ja) | 2007-07-06 | 2009-01-15 | M.Technique Co., Ltd. | 金属微粒子の製造方法及びその金属微粒子を含む金属コロイド溶液 |
JP2009024254A (ja) | 2007-07-23 | 2009-02-05 | Samsung Electro Mech Co Ltd | ニッケルナノ粒子の製造方法 |
JP2011195888A (ja) | 2010-03-19 | 2011-10-06 | Sumitomo Metal Mining Co Ltd | ニッケル微粉及びその製造方法 |
WO2012014530A1 (ja) * | 2010-07-28 | 2012-02-02 | エム・テクニック株式会社 | 粒子径を制御された微粒子の製造方法 |
WO2012124046A1 (ja) * | 2011-03-14 | 2012-09-20 | エム・テクニック株式会社 | 金属微粒子の製造方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7824466B2 (en) | 2005-01-14 | 2010-11-02 | Cabot Corporation | Production of metal nanoparticles |
EP2184110B1 (en) * | 2007-07-06 | 2016-03-23 | M Technique Co., Ltd. | Liquid treating apparatus, and treating method |
CN101784258B (zh) | 2007-07-06 | 2013-07-17 | M技术株式会社 | 生物摄取物微粒子及其制造方法、分散体、医药组成物 |
CN102516809B (zh) * | 2007-07-06 | 2015-04-01 | M技术株式会社 | 使用强制超薄膜旋转式处理法的微粒的制造方法 |
JP4363499B2 (ja) * | 2007-07-06 | 2009-11-11 | エム・テクニック株式会社 | セラミックスナノ粒子の製造方法 |
US9211510B2 (en) | 2007-07-06 | 2015-12-15 | M. Technique Co., Ltd. | Method for producing nanoparticles by forced ultrathin film rotary processing |
DE102007040366A1 (de) | 2007-08-17 | 2009-02-19 | Aha Kunststofftechnik Gmbh | Trockenpulver-Inhalator |
CN101868316B (zh) | 2007-09-27 | 2012-06-20 | M技术株式会社 | 磁性体微粒的制造方法、由此得到的磁性体微粒、及磁性流体、磁性体制品的制造方法 |
KR20140038467A (ko) * | 2011-07-13 | 2014-03-28 | 엠. 테크닉 가부시키가이샤 | 결정자 지름이 제어된 미립자의 제조 방법 |
KR102103711B1 (ko) * | 2012-09-12 | 2020-04-23 | 엠. 테크닉 가부시키가이샤 | 금속 미립자의 제조 방법 |
WO2014041706A1 (ja) * | 2012-09-12 | 2014-03-20 | エム・テクニック株式会社 | ニッケル微粒子の製造方法 |
EP2896474B1 (en) * | 2012-09-12 | 2019-01-16 | M Technique Co., Ltd. | Method for manufacturing metal microparticles |
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- 2012-10-02 CN CN201280074435.XA patent/CN104411428B/zh active Active
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007197836A (ja) | 2007-03-06 | 2007-08-09 | Mitsui Mining & Smelting Co Ltd | ニッケル粉 |
WO2009008390A1 (ja) | 2007-07-06 | 2009-01-15 | M.Technique Co., Ltd. | 金属微粒子の製造方法及びその金属微粒子を含む金属コロイド溶液 |
JP2009024254A (ja) | 2007-07-23 | 2009-02-05 | Samsung Electro Mech Co Ltd | ニッケルナノ粒子の製造方法 |
JP2011195888A (ja) | 2010-03-19 | 2011-10-06 | Sumitomo Metal Mining Co Ltd | ニッケル微粉及びその製造方法 |
WO2012014530A1 (ja) * | 2010-07-28 | 2012-02-02 | エム・テクニック株式会社 | 粒子径を制御された微粒子の製造方法 |
WO2012124046A1 (ja) * | 2011-03-14 | 2012-09-20 | エム・テクニック株式会社 | 金属微粒子の製造方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2896475A4 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107552808A (zh) * | 2017-08-24 | 2018-01-09 | 深圳市格络光电有限公司 | 一种纳米镍粉的规模化连续制备装置和方法 |
Also Published As
Publication number | Publication date |
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CN104411428A (zh) | 2015-03-11 |
CN104411428B (zh) | 2017-05-03 |
US20170320139A1 (en) | 2017-11-09 |
US20150174660A1 (en) | 2015-06-25 |
KR101988238B1 (ko) | 2019-06-12 |
EP2896475A4 (en) | 2016-04-06 |
EP2896475B1 (en) | 2017-11-22 |
EP2896475A1 (en) | 2015-07-22 |
KR20150054714A (ko) | 2015-05-20 |
US9744594B2 (en) | 2017-08-29 |
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