WO2013121596A1 - メモリコントローラ,データ記憶装置およびメモリの制御方法 - Google Patents
メモリコントローラ,データ記憶装置およびメモリの制御方法 Download PDFInfo
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- WO2013121596A1 WO2013121596A1 PCT/JP2012/058586 JP2012058586W WO2013121596A1 WO 2013121596 A1 WO2013121596 A1 WO 2013121596A1 JP 2012058586 W JP2012058586 W JP 2012058586W WO 2013121596 A1 WO2013121596 A1 WO 2013121596A1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/06—Addressing a physical block of locations, e.g. base addressing, module addressing, memory dedication
- G06F12/0638—Combination of memories, e.g. ROM and RAM such as to permit replacement or supplementing of words in one module by words in another module
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/005—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor comprising combined but independently operative RAM-ROM, RAM-PROM, RAM-EPROM cells
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0035—Evaluating degradation, retention or wearout, e.g. by counting writing cycles
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7201—Logical to physical mapping or translation of blocks or pages
Definitions
- the present invention relates to a memory controller, a data storage device, and a memory control method, and more particularly, after reading data stored in a storage area in units of pages composed of a plurality of sectors and rewriting the read data in units of sectors.
- a memory controller for controlling a first memory configured as a non-volatile memory capable of writing data by a writing operation for writing data in units of pages and a second memory configured as a random access memory, and such a memory controller are provided.
- the present invention relates to a data storage device and a memory control method for controlling such a first memory and a second memory.
- FeRAM Feroelectric Random Access Memory
- a ferroelectric random access memory or a device that controls an FeRAM or HDD so as to be stored in the HDD has been proposed (for example, see Non-Patent Document 1).
- this device it is not necessary to periodically save FeRAM data to the HDD in preparation for unexpected power shutdown, so the amount of data stored in FeRAM can be made relatively large, and the cache hit rate is improved. It is said that we can plan.
- SSD Solid State Drive
- Non-volatile memory such as NAND flash memory to which data is written by writing operation
- random access memory such as ReRAM (Resistance Random Access Memory) that can read and write data faster than this non-volatile memory
- ReRAM Resistance Random Access Memory
- non-volatile A memory controller that controls a random access memory and a random access memory has been proposed.
- a nonvolatile memory mounted on such an SSD if a write operation is frequently executed in a state where the number of sectors used for data storage in one page is small, an area that is not normally required for data storage is used. The data is read and written, and the nonvolatile memory is deteriorated.
- the main purpose of the memory controller, data storage device and memory control method of the present invention is to suppress the deterioration of the nonvolatile memory.
- the memory controller, data storage device, and memory control method of the present invention employ the following means in order to achieve the main object described above.
- the memory controller of the present invention It is configured as a non-volatile memory that can write data by a write operation that reads data stored in a storage area in units of pages composed of a plurality of sectors, rewrites the read data in units of sectors, and then writes data in units of pages
- a memory controller that controls the first memory configured and a second memory configured as a random access memory capable of writing data faster than the first memory, When write data and a write request signal for requesting writing of the write data are input, the write data is written to the first memory when the write data is written to the first memory with respect to the size of the area where data can be stored.
- the input memory and the first memory are written to the first memory by the write operation.
- a control unit that controls the second memory and controls the first memory and the second memory so that the inputted write data is stored in the second memory when the data utilization rate is less than the predetermined rate It is a summary to provide.
- the memory controller of the present invention when write data and a write request signal for requesting writing of the write data are input, data in a predetermined range of storage area can be stored when the write data is written to the first memory.
- the data utilization rate which is the ratio of the size of the sector used for storing the write data to the size of the area
- the input data is written to the first memory by the write operation.
- the first memory and the second memory are controlled so that the inputted write data is stored in the second memory when the data utilization rate is less than the predetermined rate.
- the data usage rate per page of the first memory can be set to a predetermined rate or more, and useless reading and writing to the storage area of the first memory that is not used for data storage is suppressed.
- the “predetermined range” includes a data range for one page or a plurality of pages corresponding to the logical address of the write data, or a predetermined size larger than the sector size in the page corresponding to the logical address of the write data. Includes data ranges.
- the memory controller of the present invention may further include a ratio setting unit that sets the predetermined ratio so as to decrease as the size of the storage area storing data in the second memory increases. By doing so, it is possible to facilitate storing the write data in the first memory when the storage area available for storing new data in the second memory becomes small.
- the control unit when the data utilization rate is equal to or higher than the predetermined rate, receives the input when the input write data is high-frequency write data having a high write frequency.
- the first memory and the second memory may be controlled so that write data is stored in the second memory. If data is written to the first memory when the input write data is high-frequency write data, the write operation is frequently executed, and the first memory deteriorates. Therefore, by controlling the second memory so that the input data is output to the second memory and the output data is stored in the second memory when the input write data is the high-frequency write data. Degradation of one memory can be suppressed.
- an address information storage unit that stores a first number of logical addresses of the input write data when the data usage rate is equal to or higher than the predetermined rate
- the control unit is configured to input the input
- the logical address of the write data is stored in the logical address information storage unit more than a second number smaller than the first number
- the input write data is assumed to be the high-frequency write data. Can do.
- the control unit is based on use sector information that is information as to whether or not each sector stores data and a sector that is used when storing input write data. It is also possible to calculate the page usage rate. In this case, when the page usage rate becomes a second rate larger than the predetermined rate, the control unit receives data from each sector after the page usage rate becomes the second rate. The information indicating whether or not the information is stored can be used sector information. When the page usage rate is less than the predetermined rate, the first memory and the second memory are controlled so that the inputted write data is stored in the second memory.
- the control unit when the control unit stores the input write data in the second memory, the data corresponding to the logical address of the input write data is already stored in the first memory.
- the data stored in the first memory is read in page units, and the second memory is read in page units after rewriting the sector to be written with the write data among the sectors of the read data. Can also be stored.
- the first memory can be a NAND flash memory. In this way, when the first memory is a NAND flash memory, the deterioration of the first memory can be suppressed.
- the second memory may be a resistance change type memory. In this way, when the second memory is a resistance change type memory, it is possible to suppress the deterioration of the first memory.
- the data storage device of the present invention comprises: The memory controller according to any one of the above-described aspects of the present invention, that is, basically, after reading data stored in the storage area in units of pages composed of a plurality of sectors and rewriting the read data in units of sectors
- a first memory configured as a nonvolatile memory capable of writing data by a writing operation for writing data in units of pages
- a second memory configured as a random access memory capable of writing data at a higher speed than the first memory
- a write request signal for requesting writing of the write data is input, a storage area within a predetermined range when the write data is written to the first memory.
- the first memory and the second memory so that the inputted write data is written to the first memory by the write operation when a data utilization rate, which is a ratio of the size of sectors used for storage, is equal to or greater than a predetermined rate.
- a control unit that controls the first memory and the second memory so that the inputted write data is stored in the second memory when the data utilization rate is less than the predetermined rate.
- the data storage device of the present invention includes the memory controller of the present invention in any one of the above-described aspects, the effects of such a memory controller, for example, the effects of suppressing the deterioration of the first memory, etc. The same effect is produced.
- It is configured as a non-volatile memory that can write data by a write operation that reads data stored in a storage area in units of pages composed of a plurality of sectors, rewrites the read data in units of sectors, and then writes data in units of pages
- a memory control method for controlling the first memory and the second memory configured as a random access memory capable of writing data faster than the first memory When write data and a write request signal for requesting writing of the write data are input, the write data is written to the first memory when the write data is written to the first memory with respect to the size of the area where data can be stored.
- the input memory and the first memory are written to the first memory by the write operation.
- the data in the storage area within a predetermined range is stored when the write data is written to the first memory.
- the first memory so that the input write data is written to the first memory by the write operation when the data utilization rate, which is the ratio of the size of the sector used for storing the write data to the size of the possible area, is equal to or higher than a predetermined rate.
- the second memory and when the data utilization rate is less than the predetermined rate, the first memory and the second memory are controlled so that the inputted write data is stored in the second memory.
- the data usage rate per page of the first memory can be set to a predetermined rate or more, and useless reading and writing to the storage area of the first memory that is not used for data storage is suppressed. Thereby, degradation of the first memory can be suppressed.
- the “predetermined range” includes a data range for one page or a plurality of pages corresponding to the logical address of the write data, or a predetermined size larger than the sector size in the page corresponding to the logical address of the write data. Includes data ranges.
- FIG. 4 is a flowchart showing an example of a write processing routine executed by a control processing circuit 32 of the memory controller 30. It is explanatory drawing which shows an example of utilization sector flag table USFT and page utilization rate R. It is explanatory drawing which shows the mode of the production
- FIG. 1 is an explanatory diagram showing an outline of the configuration of an SSD (Solid State Drive) 20 as an embodiment of the present invention that stores data from a host device 10 such as a personal computer.
- the SSD 20 is configured as a large-capacity data storage device for storing various application programs and various data.
- the SSD 20 includes a flash memory 22 configured as a NAND flash memory, and a resistance change random access memory (Resistance Random Access Memory, ReRAM). And a memory controller 30 that controls the flash memory 22 and the ReRAM 24.
- a flash memory 22 configured as a NAND flash memory
- ReRAM resistance change random access memory
- ReRAM Resistance Random Access Memory
- the flash memory 22 is configured as a NAND flash memory including a flash memory cell array (not shown) having a plurality of flash memory cells whose threshold voltage changes by electron injection into the floating gate or extraction of electrons from the floating gate.
- a row decoder, a column decoder, a sense amplifier, etc. are provided.
- data is written or read in a page unit (4K bytes in the embodiment) composed of 8 sectors (512 bytes in the embodiment), and a block unit (in the embodiment, The stored data is erased at 256 KB).
- the data stored in the flash memory 22 is read out, the sector data corresponding to the write data among the read data is rewritten to the write data in the sector unit, and the data rewritten in the page unit is then rewritten.
- Data is written by a write operation for writing to the flash memory 22.
- the writing speed when writing data to the flash memory 22 and the reading speed when reading data from the flash memory 22 are 212 MB / s.
- a metal oxide 44 is sandwiched between an upper electrode 40 formed of a metal such as titanium (Ti) or platinum (Pt) and a lower electrode 42 formed of a metal such as titanium (Ti) or platinum (Pt).
- a row decoder, a column decoder, a sense amplifier, etc. are provided.
- the ReRAM cell is set (low resistance) when the voltage V1 applied to the upper electrode 40 is higher than the voltage V2 applied to the lower electrode 42, and is reset (high resistance) when the voltage V1 is lower than the voltage V2. It is formed as an element that performs a bipolar operation. Since a ReRAM cell that performs such a bipolar operation is an element that generally has a relatively high operating speed and low power consumption, the ReRAM 24 is configured as a memory that has a relatively high operating speed and low power consumption.
- the metal oxide 44 a metal oxide such as titanium oxide (TiOx), nickel oxide (NiOx), copper oxide (CuOx), hafnium oxide (HfOx) or a plurality of these metal oxides are stacked.
- the ReRAM 24 configured in this way has a writing speed when writing data to the ReRAM 24 and a reading speed when reading data from the ReRAM 24 higher than the flash memory 22.
- the writing speed and reading speed are 1.25 GB / s.
- the memory controller 30 includes a control processing circuit 32 configured to execute various types of control and arithmetic processing as a logic circuit having a plurality of logic elements.
- Various control signals and data are input from the host device 10 to the control processing circuit 32.
- the control processing circuit 32 stores data in the flash memory 22 and the ReRAM 24 based on the input control signals.
- the flash memory 22 and the ReRAM 24 are controlled, the flash memory 22 and the ReRAM 24 are controlled so that data is read from the flash memory 22 and the ReRAM 24, and the read data is output to the host device 10.
- a logical address composed of a logical page address that virtually indicates a page that stores data and a logical sector address that virtually indicates a sector that stores data; Conversion to a physical address indicating the location of the actual flash memory 22 or ReRAM 24 is also performed.
- the memory controller 30 exchanges various control signals and data with the host device 10 at a relatively high speed (for example, at about 1.25 GB / s).
- FIG. 3 is a flowchart showing an example of a write processing routine executed by the control processing circuit 32 of the memory controller 30.
- a logical address composed of a write request signal for requesting writing of data from the host device 10 to the flash memory 22 or the ReRAM 24, a write data, a logical page address indicating a location for storing the write data, and a logical sector address is obtained. Executed when entered.
- the control processing circuit 32 of the memory controller 30 creates a use sector flag table USFT (step S100), and is used for storing data for each logical page address based on the use sector flag table USFT.
- the page utilization rate R which is the ratio of the sectors that are present, is calculated (step S110).
- FIG. 4 is an explanatory diagram showing an example of the used sector flag table USFT and the page usage rate R.
- the used sector flag table USFT as many flags as the number of sectors are prepared, a value of 0 is set for a flag that is not used for data storage, and a flag is set for a sector that is used for data storage. The value 1 is set. Since one page consists of eight sectors, eight flags are set for each page.
- the page usage rate R is calculated by dividing the number of flags with a value of 1 included in one page by a value of 8 which is the number of flags in one page.
- the use sector flag table USFT is generated (step S100).
- the write data sector flag table WSFT in which the value 1 is set in the flag and the other flags are set in the value 1 already exists. This is performed by calculating a logical sum (OR) of the stored sector flag table USFT. For example, as shown in FIG. 5, when the already-used stored sector flag table USFT is “01111100” and the write data sector flag table WSFT is “11000000”, a used sector flag table USFT of “11111100” is generated. In this case, the page usage rate R is 0.75.
- the threshold value Rth1 is set so as to decrease as the size of data stored in the ReRAM 24 increases. Whether or not the write data is high-frequency rewrite data is determined by storing the 1000 most recent logical addresses in the storage table when the page usage rate R is equal to or greater than the threshold value Rth1, and writing the logic of the write data. If there are more than a predetermined number (for example, 100) of addresses in the storage table, it is determined that the write data is high-frequency rewrite data.
- a predetermined number for example, 100
- the flash memory 22 is controlled so that the write data is stored in the flash memory 22 by the write operation described above. (Step S140). Through such processing, data can be stored in the flash memory 22.
- the page usage rate R is less than the threshold value Rth1, that is, when there are a relatively large number of unused sectors in the page (step S120), the page usage rate R is greater than or equal to the threshold value Rth1.
- the write data is high-frequency rewrite data (step S130)
- step S150 it is checked whether or not the data corresponding to the logical address of the write data is stored in the flash memory 22 (step S150).
- data at an address corresponding to the logical address of the write data is read from the flash memory 22 in units of pages, and data corresponding to the write data is read out from the flash memory 22 in units of sectors.
- Combined data overwritten with write data is created (step S160), and the ReRAM 24 is controlled so that such combined data is stored in the ReRAM 24 (step S170).
- step S170 When no data is stored in the flash memory 22, the write data is stored in the ReRAM 24.
- the ReRAM 24 is controlled so as to be stored (step S170).
- the write data is stored in the ReRAM 24. Deterioration of the flash memory 22 can be suppressed. Further, since the writing speed of the ReRAM 24 is higher than the writing speed of the flash memory 22, the writing operation can be executed at a higher speed by storing the writing data in the ReRAM 24 in this way.
- the page utilization rate R exceeds a predetermined threshold value Rth2 (for example, 0.85) as a value higher than the threshold value Rth1 (step 0.85).
- a flag reset operation is performed to set all the flags in the usage sector flag table USFT to 0 (step S190).
- the usage sector flag table This routine is terminated without changing the USFT. The flag reset operation is performed for the following reason.
- the already used sector flag table USFT is “01111111” (page usage rate R is 0.875) and the write data sector flag table WSFT is “11000000”, “11111111”
- the used sector flag table USFT is generated.
- the page usage rate R increases in this way, if the data is not high-frequency rewrite data, the data on this page is always stored in the flash memory 22 by the write operation, and deterioration of the flash memory 22 may be promoted.
- the page utilization rate R is higher than the threshold value Rth2, by executing a flag reset operation for setting all the flags in the utilization sector flag table USFT to 0 (step S190), as illustrated in FIG.
- the already-used stored sector flag table USFT is “00000000” (the page usage rate R is 0), and when the write data sector flag table WSFT is “11000000”, “11000000” A used sector flag table USFT is generated, and the used sector flag table USFT indicates information on sectors used for data storage after the page usage rate R becomes higher than the threshold value Rth2. Since the page usage rate R at this time is 0.25, the page usage rate R is written in the ReRAM 24 (steps S120, S150 to S170). By such processing, data writing operation to the flash memory 22 is suppressed, and deterioration of the flash memory 22 can be suppressed.
- the SSD 20 of the embodiment described above when the page usage rate R is less than the threshold value Rth1, or when the write data is high-frequency rewrite data even if the page usage rate R is equal to or greater than the threshold value Rth1,
- the threshold value Rth1 By storing the data in the ReRAM 24, the deterioration of the flash memory 22 can be suppressed. Further, since the writing speed of the ReRAM 24 is higher than the writing speed of the flash memory 22, the writing operation can be further speeded up by storing the writing data in the ReRAM 24 in this way. Further, by setting the threshold value Rth1 to be smaller as the size of the storage area in which data is stored in the ReRAM 24 becomes larger, the write data is stored in the ReRAM 24 when the free area in the ReRAM 24 becomes smaller.
- the write data is stored in the ReRAM 24 when the write data is high-frequency rewrite data even if the page usage rate R is equal to or greater than the threshold Rth1 (steps S120, S130, S150 to S170).
- the write data may be uniformly stored in the flash memory 22 when the page usage rate R is equal to or greater than the threshold value Rth1 without executing the process of step S130 (steps S120 to S140).
- the threshold value Rth1 is set to be smaller as the size of the storage area storing data in the ReRAM 24 increases.
- the threshold value Rth1 is set regardless of the size of the storage area storing data in the ReRAM 24. Instead, they may be set to the same value.
- the flag reset operation for setting all the flags in the used sector flag table USFT to 0 is executed (steps S180 and S190). It may not be executed.
- the page usage rate R is calculated as one page, and the number of flags with a value of 1 included in one page is divided by a value of 8, which is the number of flags in one page.
- the range for calculating the page usage rate R may be any size as long as it is larger than one sector.
- the page usage rate R is calculated in the range of two or more pages and is included in the range to be calculated. The calculation may be performed by dividing the number of flags having a value of 1 by the number of flags in the calculation range.
- the flash memory 22 is provided. However, instead of the flash memory 22, data stored in the storage area is read in units of pages including a plurality of sectors, and the read data is read from the sector.
- Another memory configured as a nonvolatile memory capable of writing data by a writing operation of writing data in units of pages after rewriting in units of units may be used.
- the ReRAM cell of the ReRAM 24 is formed as an element that performs a bipolar operation.
- the ReRAM cell is composed of a resistance change element 46 and a diode (not shown), and the voltage V1 is set to the voltage V1.
- Unipolar operation that is set (lower resistance) when a voltage higher than V2 is applied, and reset (higher resistance) when voltage higher than voltage V2 and lower than the voltage that sets the ReRAM cell is applied to voltage V1. It is good also as what forms as an element which performs.
- the ReRAM cell Since a ReRAM cell that performs such a unipolar operation generally has a smaller cell size and a simple cell configuration than a ReRAM cell that performs a bipolar operation, the ReRAM cell has a smaller cell size than an element that performs a bipolar operation. Although the operation is slightly slower, the area can be further reduced.
- the SSD 20 includes the ReRAM 24.
- a random access memory capable of writing data at a higher speed than the other flash memory 22, for example, a ferroelectric material with two electrodes
- a ferroelectric random access memory with a capacitor sandwiched between them a magnetoresistive random access memory with an MTJ (Magneto Tunnel Junction) element with a tunnel magnetoresistive film sandwiched between magnetic films, and a phase change material sandwiched between two electrodes
- MTJ Magnetic Tunnel Junction
- the memory controller 30 is not limited to the one mounted on the SSD 20 as one device, and the flash memory 22, the ReRAM 24, and the memory controller 30 may be mounted on different devices, or the flash memory 22, The ReRAM 24 may be mounted on the same device, and the memory controller 30 may be mounted on a different device from the flash memories 22 and 24.
- a memory control method for controlling the flash memory 22 and the ReRAM 24 may be used.
- the control processing circuit 32 corresponds to a “control unit”.
- the control processing circuit 32 corresponds to a “control unit”.
- the memory controller 30 corresponds to a “memory controller”
- the flash memory 22 corresponds to a “first memory”
- the ReRAM 24 corresponds to a “second memory”.
- the present invention is applicable to manufacturing industries such as memory controllers and data storage devices.
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Abstract
Description
複数のセクタからなるページ単位で記憶領域に記憶されているデータを読み出して該読み出したデータをセクタ単位で書き換えた後にページ単位でデータを書き込む書き込み動作によりデータの書き込みが可能な不揮発性メモリとして構成された第1メモリと、前記第1メモリより高速にデータの書き込みが可能なランダムアクセスメモリとして構成された第2メモリと、を制御するメモリコントローラであって、
書き込みデータと該書き込みデータの書き込みを要求する書き込み要求信号とが入力されたとき、前記書き込みデータを前記第1メモリに書き込んだときに所定範囲の記憶領域におけるデータを記憶可能な領域のサイズに対する前記書き込みデータの記憶に利用されるセクタのサイズの割合であるデータ利用率が所定率以上であるときには前記入力された書き込みデータが前記書き込み動作により前記第1メモリに書き込まれるよう前記第1メモリと前記第2メモリとを制御し、前記データ利用率が前記所定率未満であるときには前記入力された書き込みデータが第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する制御部、
を備えることを要旨とする。
上述したいずれかの態様の本発明のメモリコントローラ、即ち、基本的には、複数のセクタからなるページ単位で記憶領域に記憶されているデータを読み出して該読み出したデータをセクタ単位で書き換えた後にページ単位でデータを書き込む書き込み動作によりデータの書き込みが可能な不揮発性メモリとして構成された第1メモリと、前記第1メモリより高速にデータの書き込みが可能なランダムアクセスメモリとして構成された第2メモリと、を制御するメモリコントローラであって、書き込みデータと該書き込みデータの書き込みを要求する書き込み要求信号とが入力されたとき、前記書き込みデータを前記第1メモリに書き込んだときに所定範囲の記憶領域におけるデータを記憶可能な領域のサイズに対する前記書き込みデータの記憶に利用されるセクタのサイズの割合であるデータ利用率が所定率以上であるときには前記入力された書き込みデータが前記書き込み動作により前記第1メモリに書き込まれるよう前記第1メモリと前記第2メモリとを制御し、前記データ利用率が前記所定率未満であるときには前記入力された書き込みデータが第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する制御部、を備えるメモリコントローラと、
前記第1メモリと、
前記第2メモリと、
を備えることを要旨とする。
書き込みデータと該書き込みデータの書き込みを要求する書き込み要求信号とが入力されたとき、前記書き込みデータを前記第1メモリに書き込んだときに所定範囲の記憶領域におけるデータを記憶可能な領域のサイズに対する前記書き込みデータの記憶に利用されるセクタのサイズの割合であるデータ利用率が所定率以上であるときには前記入力された書き込みデータが前記書き込み動作により前記第1メモリに書き込まれるよう前記第1メモリと前記第2メモリとを制御し、前記データ利用率が前記所定率未満であるときには前記入力された書き込みデータが第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する、
ことを要旨とする。
Claims (12)
- 複数のセクタからなるページ単位で記憶領域に記憶されているデータを読み出して該読み出したデータをセクタ単位で書き換えた後にページ単位でデータを書き込む書き込み動作によりデータの書き込みが可能な不揮発性メモリとして構成された第1メモリと、前記第1メモリより高速にデータの書き込みが可能なランダムアクセスメモリとして構成された第2メモリと、を制御するメモリコントローラであって、
書き込みデータと該書き込みデータの書き込みを要求する書き込み要求信号とが入力されたとき、前記書き込みデータを前記第1メモリに書き込んだときに所定範囲の記憶領域におけるデータを記憶可能な領域のサイズに対する前記書き込みデータの記憶に利用されるセクタのサイズの割合であるデータ利用率が所定率以上であるときには前記入力された書き込みデータが前記書き込み動作により前記第1メモリに書き込まれるよう前記第1メモリと前記第2メモリとを制御し、前記データ利用率が前記所定率未満であるときには前記入力された書き込みデータが第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する制御部、
を備えるメモリコントローラ。 - 請求項1記載のメモリコントローラであって、
前記第2メモリにおいてデータが記憶されている記憶領域のサイズが大きくなるにつれて小さくなる傾向に前記所定率を設定する割合設定部
を備えるメモリコントローラ。 - 請求項1または2記載のメモリコントローラであって、
前記制御部は、前記データ利用率が前記所定率以上であるときに前記入力された書き込みデータが書き込み頻度が高い高頻度書き込みデータであるときには、前記入力された書き込みデータが前記第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する
メモリコントローラ。 - 請求項3記載のメモリコントローラであって、
前記データ利用率が前記所定率以上となったときの前記入力された書き込みデータの論理アドレスを第1の個数記憶するアドレス情報記憶部を備え、
前記制御部は、前記入力された書き込みデータの論理アドレスが前記論理アドレス情報記憶部に前記第1の個数より少ない第2の個数以上記憶されているときには前記入力された書き込みデータが前記高頻度書き込みデータであるとする
メモリコントローラ。 - 請求項1ないし4のいずれか一つの請求項に記載のメモリコントローラであって、
前記制御部は、前記各セクタがデータを記憶しているか否かの情報である利用セクタ情報と入力された書き込みデータを記憶する際に利用するセクタとに基づいて前記ページ利用率を演算する
メモリコントローラ。 - 請求項5記載のメモリコントローラであって、
前記制御部は、前記ページ利用率が前記所定率より大きい第2の割合となったときには、前記ページ利用率が前記第2の割合となったとき以降の前記各セクタがデータを記憶しているか否かの情報を前記利用セクタ情報とする
メモリコントローラ。 - 請求項1ないし6のいずれか一つの請求項に記載のメモリコントローラであって、
前記制御部は、前記入力された書き込みデータを前記第2メモリに記憶させるとき、前記入力された書き込みデータの論理アドレスに対応するデータが既に第1メモリの記憶領域に記憶されているときには、前記第1メモリに記憶されているデータをページ単位で読み出して該読み出したデータのセクタのうち書き込みデータで書き込む対象となるセクタを書き換えた後にページ単位で第2メモリに記憶させる
メモリコントローラ。 - 請求項1ないし7のいずれか一つの請求項に記載のメモリコントローラであって、
前記所定範囲は、前記書き込みデータの論理アドレスに対応する1ページ分のデータの範囲である
メモリコントローラ。 - 請求項1ないし8のいずれか一つの請求項に記載のメモリコントローラであって、
前記第1メモリは、NAND型フラッシュメモリである、
メモリコントローラ。 - 請求項1ないし9のいずれか一つの請求項に記載のメモリコントローラであって、
前記第2メモリは、抵抗変化型メモリである、
メモリコントローラ。 - 請求項1ないし10のいずれか一つの請求項に記載のメモリコントローラと、
前記第1メモリと、
前記第2メモリと、
を備えるデータ記憶装置。 - 複数のセクタからなるページ単位で記憶領域に記憶されているデータを読み出して該読み出したデータをセクタ単位で書き換えた後にページ単位でデータを書き込む書き込み動作によりデータの書き込みが可能な不揮発性メモリとして構成された第1メモリと、前記第1メモリより高速にデータの書き込みが可能なランダムアクセスメモリとして構成された第2メモリと、を制御するメモリの制御方法であって、
書き込みデータと該書き込みデータの書き込みを要求する書き込み要求信号とが入力されたとき、前記書き込みデータを前記第1メモリに書き込んだときに所定範囲の記憶領域におけるデータを記憶可能な領域のサイズに対する前記書き込みデータの記憶に利用されるセクタのサイズの割合であるデータ利用率が所定率以上であるときには前記入力された書き込みデータが前記書き込み動作により前記第1メモリに書き込まれるよう前記第1メモリと前記第2メモリとを制御し、前記データ利用率が前記所定率未満であるときには前記入力された書き込みデータが第2メモリに記憶されるよう前記第1メモリと前記第2メモリとを制御する、
メモリの制御方法。
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