WO2013107702A1 - Vorrichtung zum kalibrieren eines streulichtmessgerätes - Google Patents

Vorrichtung zum kalibrieren eines streulichtmessgerätes Download PDF

Info

Publication number
WO2013107702A1
WO2013107702A1 PCT/EP2013/050531 EP2013050531W WO2013107702A1 WO 2013107702 A1 WO2013107702 A1 WO 2013107702A1 EP 2013050531 W EP2013050531 W EP 2013050531W WO 2013107702 A1 WO2013107702 A1 WO 2013107702A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
calibration device
opening
pin
scattering body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2013/050531
Other languages
German (de)
English (en)
French (fr)
Inventor
Karl Stengel
Andrea Matteucci
Gerhard Haaga
Michael Neuendorf
Reinhard Hoss
Daniel Strack
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Priority to US14/372,175 priority Critical patent/US9360424B2/en
Priority to CN201380005961.5A priority patent/CN104053981B/zh
Priority to BR112014017761-9A priority patent/BR112014017761B1/pt
Priority to EP13700678.9A priority patent/EP2805147B1/de
Publication of WO2013107702A1 publication Critical patent/WO2013107702A1/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/075—Investigating concentration of particle suspensions by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

Definitions

  • the carrier is designed in the form of a pin which can be inserted into an opening of a housing of the scattered light measuring device, so that the scattered body received in the pin is within the measuring chamber in a beam path of the light beam.
  • Figure 5 is a perspective view of the invention
  • the calibration device 30 is reproducibly positioned by the guide section 40 in the housing 10 of the scattered light meter.
  • a receptacle 33 for receiving a scattering body 34 is further formed on the support 31.
  • the carrier 31 protrudes into the measuring chamber 11 with the scattering body 34 and is exposed within the measuring chamber 11 to the beam path 17b of the light beam 17a.
  • the beam path 17b is shown as a beam emerging from the plane of the drawing.
  • the diffuser 34 is made of a
  • an additional diffusing screen 39 can also be arranged between the hollow cylindrical pin 51 and the light sensors 15a, 15b. It is also conceivable within the cavity 53 of the hollow cylinder pin 51, i.
  • the scattering body 34 is not placed in a cavity 53 as shown in FIG.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PCT/EP2013/050531 2012-01-19 2013-01-14 Vorrichtung zum kalibrieren eines streulichtmessgerätes Ceased WO2013107702A1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US14/372,175 US9360424B2 (en) 2012-01-19 2013-01-14 Device for calibrating a scatterometer
CN201380005961.5A CN104053981B (zh) 2012-01-19 2013-01-14 用于对散射光测量仪进行校准的装置
BR112014017761-9A BR112014017761B1 (pt) 2012-01-19 2013-01-14 dispositivo de calibração para a calibração de um equipamento de medição de luz de dispersão
EP13700678.9A EP2805147B1 (de) 2012-01-19 2013-01-14 Vorrichtung zum kalibrieren eines streulichtmessgerätes

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102012200739A DE102012200739A1 (de) 2012-01-19 2012-01-19 Vorrichtung zum Kalibrieren eines Streulichtmessgerätes
DE102012200739.3 2012-01-19

Publications (1)

Publication Number Publication Date
WO2013107702A1 true WO2013107702A1 (de) 2013-07-25

Family

ID=47594693

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2013/050531 Ceased WO2013107702A1 (de) 2012-01-19 2013-01-14 Vorrichtung zum kalibrieren eines streulichtmessgerätes

Country Status (6)

Country Link
US (1) US9360424B2 (https=)
EP (1) EP2805147B1 (https=)
CN (1) CN104053981B (https=)
BR (1) BR112014017761B1 (https=)
DE (1) DE102012200739A1 (https=)
WO (1) WO2013107702A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014212015A1 (de) * 2014-06-23 2015-12-24 Robert Bosch Gmbh Vorrichtung und Verfahren zum Kalibrieren eines Streulichtmessgerätes
CN104251809B (zh) * 2014-09-15 2016-06-29 天津开发区合普工贸有限公司 微小固体颗粒气溶胶高精度稳恒标定装置
CN112345497B (zh) * 2020-11-24 2024-03-15 河南省计量测试科学研究院 大气能见度仪校准系统及其校准方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4761552A (en) * 1986-09-16 1988-08-02 Trebor Industries, Inc. Standard for near-infrared reflectance measurement and method of making the same
FR2858851A1 (fr) * 2003-08-11 2005-02-18 Eastman Kodak Co Etalon de densite optique et procede d'etalonnage d'un densitometre optique par reflexion
US7659980B1 (en) * 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
DE102010002423A1 (de) 2010-02-26 2011-09-01 Robert Bosch Gmbh Vorrichtung und Verfahren zum Kalibrieren eines Streulichtmessgerätes

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3944834A (en) * 1974-10-04 1976-03-16 Celesco Industries Inc. Pollution monitor with self-contained calibration and cell-block therefor
US4266220A (en) * 1979-07-27 1981-05-05 Malinowski William J Self-calibrating smoke detector and method
US4557599A (en) * 1984-03-06 1985-12-10 General Signal Corporation Calibration and alignment target plate
US4980557A (en) * 1988-06-06 1990-12-25 Extrel Corporation Method and apparatus surface ionization particulate detectors
US5497144A (en) * 1993-07-07 1996-03-05 Cerberus Ag Testing and adjustment of scattered-light smoke detectors
US6989896B2 (en) * 2001-10-16 2006-01-24 Therma-Wave, Inc. Standardized sample for characterizing the performance of a scatterometer
US20030090666A1 (en) * 2001-11-13 2003-05-15 Sick Ag Gas permeable probe for use in an optical analyzer for an exhaust gas stream flowing through a duct or chimney
US7142299B2 (en) * 2004-11-18 2006-11-28 Apprise Technologies, Inc. Turbidity sensor
CN2824019Y (zh) * 2005-06-28 2006-10-04 洛阳卓航测控设备有限责任公司 一种前向散射能见度仪校准板
GB0522312D0 (en) * 2005-11-01 2005-12-07 Cormon Ltd Monitoring particles in a fluid stream

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4761552A (en) * 1986-09-16 1988-08-02 Trebor Industries, Inc. Standard for near-infrared reflectance measurement and method of making the same
FR2858851A1 (fr) * 2003-08-11 2005-02-18 Eastman Kodak Co Etalon de densite optique et procede d'etalonnage d'un densitometre optique par reflexion
US7659980B1 (en) * 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
DE102010002423A1 (de) 2010-02-26 2011-09-01 Robert Bosch Gmbh Vorrichtung und Verfahren zum Kalibrieren eines Streulichtmessgerätes

Also Published As

Publication number Publication date
BR112014017761A2 (https=) 2017-06-20
BR112014017761B1 (pt) 2021-01-19
EP2805147A1 (de) 2014-11-26
DE102012200739A1 (de) 2013-07-25
EP2805147B1 (de) 2018-05-16
CN104053981A (zh) 2014-09-17
US20150077749A1 (en) 2015-03-19
CN104053981B (zh) 2016-08-24
BR112014017761A8 (pt) 2017-07-11
US9360424B2 (en) 2016-06-07

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