WO2013057803A1 - Dispositif de détection d'ions et de rayonnement équipé d'un dispositif de correction et dispositif d'affichage d'analyse et procédé d'affichage d'analyse - Google Patents

Dispositif de détection d'ions et de rayonnement équipé d'un dispositif de correction et dispositif d'affichage d'analyse et procédé d'affichage d'analyse Download PDF

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Publication number
WO2013057803A1
WO2013057803A1 PCT/JP2011/074036 JP2011074036W WO2013057803A1 WO 2013057803 A1 WO2013057803 A1 WO 2013057803A1 JP 2011074036 W JP2011074036 W JP 2011074036W WO 2013057803 A1 WO2013057803 A1 WO 2013057803A1
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WO
WIPO (PCT)
Prior art keywords
radiation
counter
value
voltage
ionized
Prior art date
Application number
PCT/JP2011/074036
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English (en)
Japanese (ja)
Inventor
長門 大矢
Original Assignee
Oya Nagato
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Filing date
Publication date
Application filed by Oya Nagato filed Critical Oya Nagato
Priority to PCT/JP2011/074036 priority Critical patent/WO2013057803A1/fr
Publication of WO2013057803A1 publication Critical patent/WO2013057803A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/18—Measuring radiation intensity with counting-tube arrangements, e.g. with Geiger counters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/08—Geiger-Müller counter tubes

Definitions

  • radiation is detected even in an ion recombination region whose voltage is lower than the voltage of a counter tube normally used in a radiation detector, and even when the radiation is in a substance that does not reach the outside, it is applied to the surface of the ionized substance.
  • Dielectric detection of the charged ionic substance can be performed by charging the dielectric thin film, and according to the present invention, peripheral ionized matter and radiation can be detected quickly and safely and easily without destroying the test substance.
  • Non-Patent Document 1 As a technique of such a radiation detection method, as shown in Non-Patent Document 1, the Geiger counter detects the number of radiations, the proportional counter shown in Patent Document 1 detects the energy of radiation,
  • the semiconductor detector shown applies a technology such as a CCD, and a high voltage is used, and the tube used for the detector must be filled with gas or requires high technical skills.
  • the Geiger-Muller counters and semiconductor detectors described above have been widely used to specify the number of radiations, and the proportional counters to identify substances. However, since high voltage is used, it is necessary to be careful, and it requires technical skill and cost in the manufacturing process. This method will be adopted to simplify the process and allow anyone to make it.
  • the present inventor considered the voltage detected by the counter and the graph of radiation in FIG. 6 and used the voltage portion of the recombination region which is not normally used to amplify and detect a weak voltage change.
  • the present inventor has completed what detects the dielectric by detecting what is ionized by radiation or the like using low voltage and normal air which are not normally used.
  • the dielectric thin film is a dielectric thin film (plastic [polyethylene], etc.) where the radiation entrance window is dielectric. Therefore, dielectric detection from externally charged substances in the ionized state that is covered, and the atmosphere and substances that have been ionized through radiation passing through the electric field region where a low voltage is applied inside the counter tube.
  • the internal gas uses normal air or an inert gas
  • the operating voltage is a low voltage in the recombination region
  • the amplifier is supplied to the amplifier.
  • the correction device can supplement the influence of temperature and the like, and the analysis display device can calculate the energy value by radiation. It is obtained by measuring the voltage and measured using a voltmeter, oscilloscope, PC, etc. By analyzing the result, it is characterized in that it is possible to specify the intensity of radiation and the line type and substance.
  • the invention described in claim 2 uses the low voltage region of the recombination region which is not normally used in the Geiger-Muller counter tube and the proportional counter tube in the counter tube described in claim 1, and is used for the detector. It is possible to do this.
  • the invention described in claim 3 is a counter tube according to claim 1, in which the electricity inside the counter tube is applied to the cathode anode in the opposite direction as compared with a normal counter tube, thereby increasing the dielectric property and measuring. It is characterized by being able to.
  • the gas in the counter tube can be detected using normal air or an inert gas.
  • the invention according to claim 5 is the counter tube according to claim 1, in which the caliber is covered with a thin film of dielectric (plastic [polyethylene, etc.), and the ionization state of the substance is examined, so that the inside of food, the body, etc. It is also possible to measure the location where the radiation does not reach from the radiation source incorporated in the material, and to understand the abnormal ionization situation occurring in the substance.
  • dielectric plastic [polyethylene, etc.
  • the conductive electromagnetic shield (mesh, foil) is applied to the aperture for detecting radiation, thereby removing ions existing outside the counter tube. It is also possible to detect only radiation such as ⁇ rays, ⁇ rays, ⁇ rays, and X rays that jump into the chamber.
  • the invention according to claim 7 changes in the correction device according to claim 1 due to processing of a regular minute change seen due to a low voltage when amplification is performed, characteristics of a semiconductor, and the like. It is possible to measure the radiation energy value more accurately by attaching a correction device that adjusts the temperature to an appropriate value so that the obtained value can be corrected to a more accurate value. To do.
  • the analysis display device by adding one by one for each voltage value that changes as an output value according to time, the distribution of energy values respectively obtained by the particles is obtained. It is possible to determine the type of radiation and the radioactive substance.
  • the analysis display method when the correction device and the analysis display device according to the first aspect are not used, the analysis can be performed using a personal computer, and a low voltage is used for data input. Therefore, whether to use an AD converter that inputs voice directly to a personal computer or to read data from an oscilloscope into a personal computer, removes periodic minute changes in voltage based on that data, and displays an energy distribution diagram. It is possible to analyze and specify a substance from a specific pattern of energy.
  • the invention according to claim 10 is the detection device according to claim 1, wherein the ionization state of the cell is examined when radiotherapy is performed for medical use, that is, the burn, inflammation, tumor in the body in the ionization state Can be detected at a lower dose, and can be more active in inflammation, cancer cells, etc. by touching the counter very close or touching the body surface.
  • the ionized part of the cell can be dielectricized, the ionized state of the part can be removed, the function of the cell can be calmed down, and the proliferation can be suppressed.
  • the said detection apparatus is an electromagnetic shield, a counter, an amplifier, a correction
  • the electromagnetic shield can be covered with a net-like or foil-like electromagnetic shield to specify the type of static electricity and radiation from the surrounding area and the contact portion of the incident window.
  • an insulator paint, paper, rubber, etc.
  • the counter tube is similar to the structure of a normal GM tube or proportional counter tube.
  • the dielectric thin film is different from the internal gas in operating voltage
  • the dielectric thin film is a thin film made of a dielectric material (plastic [polyethylene], etc.) for which the radiation enters.
  • Dielectric detection is performed on dielectrics from charged substances that are covered by the ionization in the outside, and the atmosphere and substances that have been ionized by passing through the electric field region where a low voltage is applied inside the counter tube.
  • the internal gas uses normal air or an inert gas
  • the operating voltage uses a low voltage in a recombination region
  • the amplifier In order to obtain a more accurate energy value in an auxiliary manner, the correction device can also add an effect of correcting the temperature and the like. Is obtained by measuring the voltage, and is measured using a voltmeter or an instrument such as an oscilloscope or PC, and by analyzing the result, Intensity of rays, and can provide a device that can perform a specific line type and material.
  • the low voltage region of the recombination region that is not normally used in the Geiger-Muller counter tube and the proportional counter tube is used.
  • An apparatus that can be used can be provided.
  • the diameter of the substance is covered with a thin film of dielectric (plastic [polyethylene, etc.), and the ionization state of the substance is examined. For example, it is possible to measure an area where radiation does not reach from a radiation source incorporated therein, and to provide an apparatus that can understand an abnormal ionization state occurring in a substance.
  • dielectric plastic [polyethylene, etc.
  • the correction device due to the processing of the regular minute change seen because of the low voltage when amplification is performed, the characteristics of the semiconductor, etc.
  • the analysis display method when the correction device and the analysis display device according to claim 1 are not used, the analysis can be performed using a personal computer, Since it is a low voltage, use an AD converter that inputs voice directly to the personal computer or read data from the oscilloscope into the personal computer. It is possible to provide a method capable of creating a distribution map and analyzing and identifying a substance from a specific pattern of energy.
  • the ionization state of the cell is examined, that is, detection of a burn, inflammation, tumor, etc. in the body in the ionization state. That allows treatment at lower doses.
  • the ionized part of cells that are actively active due to inflammation, cancer cells, etc. can be dielectricized, and the ionized state of that part can be removed, It can calm down the function of cells and suppress proliferation.
  • FIG. 16 is a graph shown in FIGS. It is a graph showing the absolute value of FIG. It is a collection ion energy distribution graph.
  • the ⁇ ray is 45 to 100 mm, the ⁇ ray is 1 to 15 m, and the ⁇ ray is ⁇ .
  • about alpha rays need one sheet of paper, beta ray aluminum board 3mm, gamma ray concrete 50cm, or lead 10cm.
  • the radioactive material taken into the body or organic matter can hardly be detected unless it is gamma rays.
  • the total amount of energy emitted can be determined.
  • the charge is conversely induced, and the voltage value may be low or zero.
  • the dielectric material in the surrounding area is removed, and it waits until the voltage value in the counter returns to its original state. If it is not detected again, the exact amount of radiation energy cannot be determined.
  • the background may be measured in advance, and the difference obtained by subtracting the background may be considered as the radiation energy value.
  • the dielectric counter tube 1 is conductive so that it does not affect the detector even if it is touched with an electrostatically charged hand, etc., by covering the surroundings with an insulator except the entrance, and the amplifier 2 does not interfere with it. It shall be further wrapped with
  • the amplifier 2 uses a differential amplifier to accurately amplify a weak signal.
  • a Japanese tea tea can with a polyethylene inner lid can be used as the counter tube portion and the thin film dielectric material.
  • the electric field E (r) is given as follows.
  • the voltage may be increased to prevent ion recombination, there are two reasons for the low voltage.
  • the voltage can be expressed in direct proportion to the radiation energy value and the origin, so if the voltage change simply becomes N times, the radiation dose also becomes N times. I can think that it became.
  • the upper limit of the input voltage must be kept below 7V so that the sound source board of the personal computer is not damaged.
  • V 9 [V]
  • a 0.3mm
  • b 30mm in the recombination region, which is a low voltage
  • dielectric detection can be performed not only in the ion recombination region in the vicinity of 100 V but also in the proportional counter region, etc., from the graph of FIG. 6 showing the applied voltage and the number of collected ions.
  • the amplifying apparatus 2 uses a differential amplifier usually used in medical care to amplify and detect a voltage in order to capture a weak voltage change stably and accurately.
  • FIG. 14 shows a regular minute change process that is seen because the voltage is low when amplification is performed in the correction apparatus 3 by integrating or adding all values in one period to remove the periodic change.
  • FIG. 15 shows the average of the minute surroundings ⁇ without performing Fourier transform, and the ionization value can be easily obtained by subtracting from the original data.
  • the most important correction is the temperature correction of the semiconductor, so it changes due to the influence of temperature etc. so that the value obtained by changing according to the characteristics of the semiconductor can be corrected to a more accurate value
  • a correction device for making the value to be an appropriate value it becomes possible to measure the radiation energy value more accurately.
  • the electrical resistance increases as the temperature decreases, and the electrical resistance decreases as the temperature increases. Both can be measured and calculated to obtain an accurate ionization energy value.
  • ⁇ V ⁇ log
  • the correction by temperature can be obtained by Equation 2, and the constant parts T 0 , ⁇ , and ⁇ change depending on the size of the counter and the properties of the semiconductor.
  • the measurement voltage is not changed due to temperature in combination with a linear resistor, thermistor, platinum resistance thermometer, etc. having the reverse functions.
  • the temperature resistance characteristic of the thermistor can be described in this way according to the Steinhart equation approximately.
  • the energy value by radiation is obtained by measuring a voltage, and a device such as a voltmeter, an oscilloscope, a PC, or a dedicated circuit is used.
  • Ion flow rate is proportional to electric field, inversely proportional to pressure, approximately 1 (atm cm 2 / sV)
  • the proportionality constant ⁇ is called the recombination coefficient, and varies depending on the type of gas, temperature, and pressure.
  • Flow is a movement of charged particles in the electric field direction while repeating low-energy collisions with gas molecules.
  • the flow velocity v is proportional to the electric field strength E at a low electric field, and the mobility ⁇ is a proportionality constant, and is described as follows.
  • Electronic case For ion The flow rate of ions is about 3 orders of magnitude smaller than the flow rate of electrons.
  • the dielectric counter tube 1 is separated from the measurement location and closes after several seconds, it can be said that there is a small amount that generates ions.
  • it can be measured as a normal counter tube by providing an electromagnetic shield at the measurement port of the dielectric counter tube 1 or by reversing the polarity state of the electric field of the counter tube as shown in FIG.
  • the voltmeter can identify the energy intensity per unit time of radiation, an energy distribution map using an oscilloscope and a PC, and specify line types and substances.
  • Voltage change data is input from the oscilloscope to the correction analysis display device 5.
  • a distribution map is created from the graph 12 of voltage change over time.
  • the other part of only + or-only has ion recombination, and only one charge is detected.
  • the number of values that react up and down a, the number that reacts in the + direction: b, the number that reacts in the-direction: c, Number disappeared by coupling: d, voltage average value V + in the + direction, voltage average value V- in the ⁇ direction, V ⁇ , ion recombination correction coefficient k S , where k S is a specific value determined by the applied voltage and the counter It is a constant.
  • FIG. 16A If the absolute value of FIG. 16A is taken to be
  • the threshold value is set to 0.0065 and a noise portion equal to or lower than the threshold value is deleted, the pulse height of the voltage with respect to time as shown in the graph of FIG. 17B is obtained.
  • the pulse height of the voltage becomes the collected ion energy, and when the value as shown in FIG. 16 is measured for a longer time, and the voltage difference value is divided and counted for each ⁇ (V (t) ⁇ (t)), it is as shown in FIG.
  • the radiation particles can be identified by the wave height.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)

Abstract

La présente invention vise à proposer, bien qu'il soit généralement difficile de détecter des matières radioactives présentes dans une matière, une technique pour détecter les matières radioactives. A cet effet, selon l'invention, lorsqu'un rayonnement se propage à l'intérieur d'une matière, la matière est ionisée, dans laquelle matière une partie de la partie ionisée est recombinée et la matière ionisée restante est polarisée sur la surface de la matière. Ainsi, il est possible de connaître un état ionisé dans la matière à l'aide d'un dispositif d'affichage d'analyse (4) ou d'un dispositif d'affichage d'analyse de correction (5) d'une façon telle que : une tension est appliquée à un contre-tube diélectrique (1) comprenant une matière diélectrique en film mince utilisée dans une partie de détection du contre-tube diélectrique pour induire électriquement plus fortement une matière ionisée qui est présente et pour détecter une petite différence de potentiel résultante ; et la différence de potentiel est amplifiée par un amplificateur (2) et corrigée selon la température par un dispositif de correction (3) ou un thermomètre (6). De plus, bien qu'il soit faible, chaque type de rayonnement peut également être détecté de manière directe. On ne peut pas déterminer que le fait d'être dans un état ionisé est toujours produit par des rayonnements, mais dans une matière qui ne peut pas être normalement ionisée, on peut dire qu'une anomalie se produit. Etant donné qu'un état ionisé dans une matière est connu, il devient possible de déterminer la présence ou l'absence de tumeur, de douleur dans une zone affectée d'un être humain et similaire.
PCT/JP2011/074036 2011-10-19 2011-10-19 Dispositif de détection d'ions et de rayonnement équipé d'un dispositif de correction et dispositif d'affichage d'analyse et procédé d'affichage d'analyse WO2013057803A1 (fr)

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PCT/JP2011/074036 WO2013057803A1 (fr) 2011-10-19 2011-10-19 Dispositif de détection d'ions et de rayonnement équipé d'un dispositif de correction et dispositif d'affichage d'analyse et procédé d'affichage d'analyse

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018511809A (ja) * 2015-04-07 2018-04-26 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器
JP2018512596A (ja) * 2015-04-07 2018-05-17 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器

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JPS55101070A (en) * 1979-01-29 1980-08-01 Toshiba Corp Radiation detector
JPH0640974Y2 (ja) * 1988-09-26 1994-10-26 工業技術院長 セラミックス製の頭部を持つボルト
JPH10332834A (ja) * 1997-06-02 1998-12-18 Jeol Ltd Ｘ線計測装置
JP2001289802A (ja) * 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2001289955A (ja) * 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2008027795A (ja) * 2006-07-24 2008-02-07 Toshiba Corp 比例計数管
JP2009079969A (ja) * 2007-09-26 2009-04-16 Toshiba Corp 放射線スペクトル計測システム
JP2010133879A (ja) * 2008-12-05 2010-06-17 Akita Univ 放射線測定装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55101070A (en) * 1979-01-29 1980-08-01 Toshiba Corp Radiation detector
JPH0640974Y2 (ja) * 1988-09-26 1994-10-26 工業技術院長 セラミックス製の頭部を持つボルト
JPH10332834A (ja) * 1997-06-02 1998-12-18 Jeol Ltd Ｘ線計測装置
JP2001289802A (ja) * 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2001289955A (ja) * 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2008027795A (ja) * 2006-07-24 2008-02-07 Toshiba Corp 比例計数管
JP2009079969A (ja) * 2007-09-26 2009-04-16 Toshiba Corp 放射線スペクトル計測システム
JP2010133879A (ja) * 2008-12-05 2010-06-17 Akita Univ 放射線測定装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018511809A (ja) * 2015-04-07 2018-04-26 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器
JP2018512596A (ja) * 2015-04-07 2018-05-17 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器
US10007009B2 (en) 2015-04-07 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
US10502843B2 (en) 2015-04-07 2019-12-10 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
US10514472B2 (en) 2015-04-07 2019-12-24 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector

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