WO2013013428A1 - 液晶面板的电压测试装置和系统 - Google Patents

液晶面板的电压测试装置和系统 Download PDF

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Publication number
WO2013013428A1
WO2013013428A1 PCT/CN2011/078314 CN2011078314W WO2013013428A1 WO 2013013428 A1 WO2013013428 A1 WO 2013013428A1 CN 2011078314 W CN2011078314 W CN 2011078314W WO 2013013428 A1 WO2013013428 A1 WO 2013013428A1
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WIPO (PCT)
Prior art keywords
test line
liquid crystal
crystal panel
signal input
partial
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Ceased
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PCT/CN2011/078314
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English (en)
French (fr)
Inventor
王金杰
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to US13/318,349 priority Critical patent/US8836364B2/en
Publication of WO2013013428A1 publication Critical patent/WO2013013428A1/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards
    • G01R31/71—Testing of solder joints
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present invention relates to the field of liquid crystal display technology, and in particular to a voltage testing device and system for a liquid crystal panel.
  • TFT Thin Film Transistor
  • LCD Liquid Crystal Display
  • electrostatic discharge Electro-Static
  • ESD Discharge, ESD
  • the test points 3 to 8 can basically pass the ESD voltage test, but when the voltage test is performed on the test points No. 1 and No. 2, if the voltage is too large, there will always be horizontal or vertical bright lines. When it is generated, it is found that the switching circuit under the driving chip 11 (FIG. 1B) of the liquid crystal panel is damaged, and the signal transmission is abnormal.
  • FIG. 1B is a diagram showing the internal connection structure of FIG. 1A.
  • the main reason for causing the switch circuit to be injured is that the test solder joint 12 is placed near the test points No. 1 and No. 2 (FIG. 1A), resulting in When the ESD test is performed, the current enters the inside of the liquid crystal panel along the test line 13 connected to the test solder joint 12, thereby causing damage to the internal circuit of the liquid crystal panel.
  • the present invention constructs a voltage testing device for a liquid crystal panel, including a test solder joint and a test line, the test solder joint is connected to the liquid crystal panel through the test line, and the test line includes a switch test line and a signal. Enter the test line,
  • the device further includes a first connector, the switch test line includes a first partial switch test line and a second partial switch test line, the first partial switch test line and the second partial switch test line pass the first a connector connection; the first connector is for limiting a current intensity entering the liquid crystal panel;
  • the signal input test line includes a first partial signal input test line and a second partial signal input test line;
  • the device further includes a second connecting member, wherein the first partial signal input test line and the second partial signal input test line are connected by the second connecting member;
  • the first connector disconnects a connection between the first partial switch test line and the second partial switch test line to limit entry into the liquid crystal when a current passing through the switch test line exceeds a preset current threshold Current intensity of the panel;
  • the second connector disconnects a connection between the first partial signal input test line and the second partial signal input test line when a current input through the signal to the test line exceeds a preset current threshold.
  • the second connecting member includes a second fixing member and a second conductor; the second conductor is fixedly connected to the signal input test line through the second fixing member;
  • the resistance value of the second conductor is greater than the resistance value of the signal input test line.
  • the first connecting member includes at least two branch connecting members, and the at least two branch connecting members are disposed in parallel to the first partial switch test line and The second part switches between the test leads.
  • the switch test line is provided with a third connecting member and a first transistor
  • the signal input test line is provided with a second transistor, and the device further includes a fourth connecting member;
  • the source of the first transistor is connected to the test pad corresponding to the switch test line through the third connector, and the drain of the first transistor is connected to the second transistor through the fourth connector Gate
  • the source of the second transistor is connected to a test pad corresponding to the signal input test line, and the drain of the second transistor is connected to a source of the internal switch of the liquid crystal panel.
  • the first connecting member, the third connecting member and the fourth connecting member each include a fixing member and a conductor
  • the conductor in any one of the above connectors is fixedly connected to the corresponding test line of the connecting member through the fixing member of the connecting member;
  • the resistance value of the conductor in any of the above connectors is greater than the resistance value of the corresponding test line.
  • Another object of the present invention is to provide a voltage testing device for a liquid crystal panel, which solves the technical problem that the internal circuit of the liquid crystal panel is damaged due to excessive current when the liquid crystal panel is subjected to voltage testing in the prior art.
  • the present invention constructs a voltage testing device for a liquid crystal panel, including a test solder joint and a test line, the test solder joint is connected to the liquid crystal panel through the test line, and the test line includes a switch test line and a signal. Enter the test line,
  • the device further includes a first connector, the switch test line includes a first partial switch test line and a second partial switch test line, the first partial switch test line and the second partial switch test line pass the first Connecting piece connection;
  • the first connector is for limiting the intensity of current entering the liquid crystal panel.
  • the first connector disconnects the first partial switch test line and the second partial switch test when the current passing through the switch test line exceeds a preset current threshold A connection between the wires to limit the intensity of the current entering the liquid crystal panel.
  • the signal input test line includes a first partial signal input test line and a second partial signal input test line;
  • the apparatus also includes a second connector, the first partial signal input test line and the second partial signal input test line being connected by the second connector.
  • the second connector disconnects the first portion of the signal input test line and the second portion The signal is connected to the connection between the test leads.
  • the second connecting member includes a second fixing member and a second conductor; the second conductor is fixedly connected to the signal input test line through the second fixing member;
  • the resistance value of the second conductor is greater than the resistance value of the signal input test line.
  • the first connecting member includes at least two branch connecting members, and the at least two branch connecting members are disposed in parallel to the first partial switch test line and The second part switches between the test leads.
  • the first partial switch test line is provided with a third connecting member and a first transistor
  • the signal input test line is provided with a second transistor, and the device further includes a fourth connecting member;
  • the source of the first transistor is connected to the test pad corresponding to the switch test line through the third connector, and the drain of the first transistor is connected to the second transistor through the fourth connector Gate
  • the source of the second transistor is connected to a test pad corresponding to the signal input test line, and the drain of the second transistor is connected to a source of the internal switch of the liquid crystal panel.
  • the first connecting member, the third connecting member and the fourth connecting member each include a fixing member and a conductor
  • the conductor in any one of the above connectors is fixedly connected to the corresponding test line of the connecting member through the fixing member of the connecting member;
  • the resistance value of the conductor in any of the above connectors is greater than the resistance value of the corresponding test line.
  • the present invention constructs a voltage test system for a liquid crystal panel, including a liquid crystal panel, and further includes a voltage test device for a liquid crystal panel, the device including a test solder joint and a test line, and the test solder joint passes through
  • the test line is connected to the liquid crystal panel, and the test line includes a switch test line and a signal input test line.
  • the device further includes a first connector, the switch test line includes a first partial switch test line and a second partial switch test line, the first partial switch test line and the second partial switch test line pass the first The connectors are connected.
  • the first connector disconnects the first partial switch test line and the second partial switch test A connection between the wires to limit the intensity of the current entering the liquid crystal panel.
  • the second connecting member includes a second fixing member and a second conductor; and the second conductor is fixedly connected to the signal input test line through the second fixing member;
  • the resistance value of the second conductor is greater than the resistance value of the signal input test line.
  • the signal input test line includes a first partial signal input test line and a second partial signal input test line;
  • the device further includes a second connecting member, wherein the first partial signal input test line and the second partial signal input test line are connected by the second connecting member;
  • the second connector is for limiting the intensity of current entering the liquid crystal panel.
  • the second connector disconnects the first portion of the signal input test line and the second portion The signal is input to the connection between the test lines to limit the intensity of the current entering the liquid crystal panel.
  • the first connector includes at least two branch connectors, and the at least two branch connectors are disposed in parallel to the first portion of the switch test line and The second part switches between the test leads.
  • the first partial switch test line is provided with a third connecting member and a first transistor
  • the signal input test line is provided with a second transistor, and the device further includes a fourth connecting member;
  • the source of the first transistor is connected to the test pad corresponding to the switch test line through the third connector, and the drain of the first transistor is connected to the second transistor through the fourth connector Gate
  • the source of the second transistor is connected to a test pad corresponding to the signal input test line, and the drain of the second transistor is connected to a source of the internal switch of the liquid crystal panel.
  • the first connecting member, the third connecting member and the fourth connecting member each comprise a fixing member and a conductor
  • the conductor in any one of the above connectors is fixedly connected to the corresponding test line of the connecting member through the fixing member of the connecting member;
  • the resistance value of the conductor in any of the above connectors is greater than the resistance value of the corresponding test line.
  • the voltage testing device for a liquid crystal panel includes a test solder joint and a test line, and the test solder joint is connected to the liquid crystal panel through the test line, and the test line includes a switch test line and a signal input.
  • a test line the device further comprising a first connector, the switch test line comprising a first partial switch test line and a second partial switch test line, the first partial switch test line and the second partial switch test line pass The first connector is connected; the first connector is for limiting the intensity of current entering the liquid crystal panel.
  • the invention protects the circuit inside the liquid crystal panel, and solves the technical problem that the internal circuit of the liquid crystal panel is damaged due to excessive current when the voltage is tested on the liquid crystal panel in the prior art, and the test efficiency is improved.
  • the invention protects the circuit inside the liquid crystal panel, and solves the technical problem that the internal circuit of the liquid crystal panel is damaged due to excessive current when the voltage is tested on the liquid crystal panel in the prior art, and the test efficiency is improved.
  • FIGS. 1A-1B are schematic diagrams showing voltage testing of a liquid crystal panel in the prior art
  • FIG. 2 is a structural view showing a first preferred embodiment of a voltage testing device for a liquid crystal panel according to the present invention
  • FIG. 3 is a structural view showing a second preferred embodiment of a voltage testing device for a liquid crystal panel according to the present invention.
  • FIG. 4 is a structural view showing a third preferred embodiment of a voltage testing device for a liquid crystal panel according to the present invention.
  • FIG. 2 is a structural view showing a first preferred embodiment of a voltage testing device for a liquid crystal panel of the present invention.
  • the voltage testing device includes a switch test line 21 and a signal input test line 22.
  • the first test pad 23 corresponds to the switch test line 21, and the second test pad 24 corresponds to the signal input test line 22.
  • the device also includes a first connector 25 and a second connector 26.
  • the switch test line 21 is divided into a first partial switch test line 211 and a second partial switch test line 212.
  • the first portion of the switch test line 211 and the second portion of the switch test line 212 are connected by the first connector 25.
  • the signal input test line 22 is divided into a first partial signal input test line 221 and a second partial signal input test line 222.
  • the first portion of the signal input test line 221 and the second portion of the signal input test line 222 are connected by a second connector 26.
  • the first connecting member 25 includes a first fixing member 251 and a first conductor 252 .
  • the first conductor 252 is connected to the switch test line 21 through a first fixing member 251.
  • the resistance values of the first fixing member 251 and the first conductor 252 are both greater than the resistance values of the switch test line 21.
  • the second connecting member 26 includes a second fixing member 261 and a second conductor 262 .
  • the second conductor 262 is connected to the signal input test line 22 via the second fixing member 261.
  • the resistance values of the second fixing member 261 and the second conductor 262 are both greater than the resistance value of the signal input test line 22.
  • the first conductor 252 and the second conductor 262 are indium tin oxide (Indium Tin) Oxides, ITO), of course, may also be other conductive materials having a higher resistance value, such as a metal material, as long as the resistance value of the first conductor 252 is greater than the resistance value of the switch test line 21, and the resistance value of the second conductor 262 is greater than the signal.
  • the resistance value of the test line 22 can be input.
  • the material of the first fixing member 251 and the second fixing member 261 is a metal material having a high resistance value. Not listed here.
  • the liquid crystal panel 27 When the liquid crystal panel 27 is subjected to a voltage test, a high voltage is applied to the first test pad 23, and a switch (not shown) inside the liquid crystal panel 27 is opened. Thereafter, the test signal of the first test pad 23 is input to the inside of the liquid crystal panel 27 through the switch test line 21, and the test signal of the second test pad 24 is input to the inside of the liquid crystal panel 27 through the signal input test line 22, for the liquid crystal panel 27 Conduct a voltage test.
  • the resistance of the first conductor 252 is greater than the resistance value of the switch test line 21, the resistance of the second conductor 262 The value is greater than the resistance value of the signal input test line 22, at which time the heat generated by the large current first burns the first conductor 252 and the second conductor 262, thereby disconnecting the switch test line 21 and the signal input test line 22, thereby making the connection
  • the large current does not enter the inside of the liquid crystal panel 27, thereby functioning to protect the internal circuit of the liquid crystal panel 27.
  • the embodiment shown in FIG. 2 can effectively prevent the problem that the internal circuit of the liquid crystal panel 27 is damaged due to excessive current when the voltage test is performed, and the circuit inside the liquid crystal panel 27 is effectively protected.
  • Fig. 3 is a view showing the configuration of a second preferred embodiment of the voltage detecting device of the liquid crystal panel of the present invention.
  • the first connector 35 of the second preferred embodiment of the present invention includes at least two branch connectors.
  • 3 shows three branch connectors, which in turn are a top connector 351, an intermediate connector 352, and a bottom connector 353.
  • the top connector 351, the intermediate connector 352 and the bottom connector 353 are disposed in parallel between the first partial switch test line 211 and the second partial switch test line 212, and the first connector 35 is provided in parallel.
  • the width is much smaller than the width of the switch test line 21, and even if the same material is used, the resistance value of the first connecting member 35 can be ensured to be smaller than the resistance value of the switch test line 21.
  • only two branch connectors may be used in parallel, or other multiple branch connectors may be connected in parallel, for example, only the top connector 351 and the intermediate connector 352 are connected in parallel, as long as the first The width of a connecting member 35 is smaller than the width of the switch test line 21, which is not enumerated here.
  • the top connector 351, the intermediate connector 352 and the bottom connector 353 each include a fixing member and a conductor (not shown).
  • the top end connector 351 includes a top end fixing member 3511 and a top end conductor 3512, and the top end conductor 3512 is connected to the switch test line 21 through a top end fixing member 3511.
  • the resistance values of the top end fastener 3511 and the top end conductor 3512 are both greater than the resistance values of the switch test line 21.
  • the conductor material in the top connector 351, the intermediate connector 352 and the bottom connector 353 is indium tin oxide, and of course, other conductive materials having a higher resistance value, such as a metal material, as long as the connector is The resistance value of the middle conductor is greater than the resistance value of the switch test line 21.
  • the material of the fixing members in the top connector 351, the intermediate connector 352 and the bottom connector 353 is a metal material having a high resistance value, which is not enumerated here.
  • the working principle of the second preferred embodiment shown in FIG. 3 is:
  • the liquid crystal panel 27 When the liquid crystal panel 27 is subjected to a voltage test, a high voltage is applied to the first test pad 23, and a switch (not shown) inside the liquid crystal panel 27 is opened. Thereafter, the test signal of the first test pad 23 is input to the inside of the liquid crystal panel 27 through the switch test line 21, and the test signal of the second test pad 24 is input to the inside of the liquid crystal panel 27 through the signal input test line 22, for the liquid crystal panel 27 Conduct a voltage test.
  • the first connector 35 is caused by the parallel connection of the three connectors in the first connector 35 on the switch test line 21.
  • the resistance value is much larger than the resistance value of the switch test line 21, so that the current intensity entering the liquid crystal panel 27 is greatly reduced, thereby effectively protecting the circuit inside the liquid crystal panel 27.
  • Fig. 4 is a view showing the configuration of a third preferred embodiment of the voltage detecting device of the liquid crystal panel of the present invention.
  • the switch test line 21 is provided with a first transistor in addition to the first connecting member 45. 41 and the third connecting member 43, the signal input test line 22 is provided with a second transistor 42, and the device further includes a fourth connecting member 44.
  • the first transistor 41 and the third connecting member 43 are disposed on the first partial switch test line 211, and the source of the first transistor 41 is connected to the first test pad 23 through the third connecting member 43, first The drain of the transistor 41 is connected to the gate of the second transistor 42 through the fourth connection member 44.
  • the third connecting member 43 includes a third fixing member 431 and a third conductor 432, and the source of the first transistor 41 is connected to the first test pad 23 through the third conductor 432.
  • the resistance values of the third fixing member 431 and the third conductor 432 are both greater than the resistance values of the switch test line 21.
  • the source of the second transistor 42 is connected to the second test pad 24, and the drain of the second transistor 42 is connected to the source of the internal switch of the liquid crystal panel 27.
  • the fourth connecting member 44 includes a fourth fixing member 441 and a fourth conductor 442, and the drain of the first transistor 41 is connected to the gate of the second transistor 42 through the fourth conductor 442.
  • the first connecting member 45 includes a first fixing member 451 and a first conductor 452.
  • the resistance values of the first fixing member 451 and the first conductor 452 are both greater than the resistance value of the switch test line 21.
  • the working principle of the third preferred embodiment shown in FIG. 4 is:
  • the first test pad 23 When the liquid crystal panel 27 is subjected to a voltage test, the first test pad 23 is given a high voltage, so that the first transistor 41 is turned on, and the first transistor 41 opens the second transistor 42 through its drain while opening the switch inside the liquid crystal panel 27. . Thereafter, the test signal of the first test pad 23 is input to the inside of the liquid crystal panel 27 through the switch test line 21, and the test signal of the second test pad 24 is input to the inside of the liquid crystal panel 27 through the signal input test line 22, for the liquid crystal panel 27 Conduct a voltage test.
  • the embodiment shown in FIG. 4 will limit the current intensity entering the liquid crystal panel 27 by two measures:
  • the heat generated by the large current first burns the first conductor 452 of the first connecting member 45, thereby disconnecting the switch test line 21, so that a large current does not enter the inside of the liquid crystal panel 27, thereby protecting The function of the internal circuit of the liquid crystal panel 27.
  • the instantaneous generated heat will burn the third conductor 432 because the source of the first transistor 41 passes through the third The conductor 432 is connected to the first test pad 23, and after the third conductor 432 is burned, the source of the first transistor 41 loses the conduction path of the signal, causing the first transistor 41 to fail to operate normally, since the second transistor 42 requires A transistor 41 provides a high voltage to turn on, and when the first transistor 41 is not functioning properly, the second transistor 42 also fails. Thereby, a large current cannot enter the inside of the liquid crystal panel 27, and the circuit inside the liquid crystal panel 27 is well protected.
  • the invention also provides a voltage testing system for a liquid crystal panel, the system comprising a liquid crystal panel, and a voltage testing device for the liquid crystal panel provided by the invention, which is not described here in detail Narration.

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Abstract

一种液晶面板（27）的电压测试装置，包括测试焊点（23，24）和测试线（21，22），所述测试焊点（23，24）通过所述测试线（21，22）连接液晶面板（27），所述测试线包括开关测试线（21）和信号输入测试线（22），所述装置还包括第一连接件（25），所述开关测试线（21）包括第一部分开关测试线（211）和第二部分开关测试线（212），所述第一部分开关测试线（211）和所述第二部分开关测试线（212）通过所述第一连接件（25）连接；所述第一连接件（25）用于限制进入所述液晶面板（27）的电流强度。

Description

液晶面板的电压测试装置和系统 技术领域
本发明涉及液晶显示技术领域，特别是涉及一种液晶面板的电压测试装置和系统。
 背景技术
薄膜晶体管（Thin Film Transistor，TFT）-液晶显示器（Liquid Crystal Display ，LCD）面板在进行可靠度测试时，通常会用电压进行空气或者接触放电。请参阅图1A，对图1A中1至8号测试点进行电压为0~4KV的静电释放（Electro-Static Discharge，ESD）电压测试。
在实际的测试过程中，3至8号测试点基本都可以通过ESD电压测试，但在对1号和2号测试点进行电压测试时，如果电压过大，经常会有水平或者垂直的亮线产生，通过解析发现是液晶面板的驱动芯片11（图1B）下方的开关电路被击伤，造成信号的传输异常。
请参阅图1B，图1B为图1A的内部连接结构图，其中，造成开关电路被击伤的主要原因是由于测试焊点12放置在1号和2号测试点（图1A）附近，导致在进行ESD测试时，电流会沿着连接测试焊点12的测试线13进入到液晶面板的内部，进而造成液晶面板内部电路的击伤。
综上，如何解决现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的问题，是液晶显示技术领域需要解决的技术问题之一。
 技术问题
本发明的目的在于提供一种液晶面板的电压测试装置，以解决现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的技术问题。。
 技术解决方案
为解决上述问题，本发明构造了一种液晶面板的电压测试装置，包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，
所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；所述第一连接件用于限制进入所述液晶面板的电流强度；
所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接；
在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度；
在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接。
在本发明的液晶面板的电压测试装置中，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
在本发明的液晶面板的电压测试装置中，所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
在本发明的液晶面板的电压测试装置中，所述开关测试线设置有第三连接件和第一晶体管；
所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
在本发明的液晶面板的电压测试装置中，所述第一连接件，第三连接件以及第四连接件均包括有固定件和导体；
上述任一连接件中的导体通过该连接件的固定件固定连接该连接件对应的测试线；
其中，上述任一连接件中导体的电阻值均大于对应的测试线的电阻值。
本发明的另一个目的在于提供一种液晶面板的电压测试装置，以解决现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的技术问题。
为解决上述问题，本发明构造了一种液晶面板的电压测试装置，包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，
所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；
所述第一连接件用于限制进入所述液晶面板的电流强度。
在本发明的液晶面板的电压测试装置中，在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度。
在本发明的液晶面板的电压测试装置中，所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接。
在本发明的液晶面板的电压测试装置中，在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接。
在本发明的液晶面板的电压测试装置中，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
在本发明的液晶面板的电压测试装置中，所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
在本发明的液晶面板的电压测试装置中，所述第一部分开关测试线设置有第三连接件和第一晶体管；
所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
在本发明的液晶面板的电压测试装置中，所述第一连接件，第三连接件以及第四连接件均包括有固定件和导体；
上述任一连接件中的导体通过该连接件的固定件固定连接该连接件对应的测试线；
其中，上述任一连接件中导体的电阻值均大于对应的测试线的电阻值。
本发明的还一个目的在于提供一种液晶面板的电压测试系统，以解决现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的技术问题。
为解决上述问题，本发明构造了一种液晶面板的电压测试系统，包括液晶面板，还包括一液晶面板的电压测试装置，所述装置包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，
所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接。
在本发明的液晶面板的电压测试系统中，在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度。
在本发明的液晶面板的电压测试系统中，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
在本发明的液晶面板的电压测试系统中，所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接；
所述第二连接件用于限制进入所述液晶面板的电流强度。
在本发明的液晶面板的电压测试系统中，在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接，以限制进入所述液晶面板的电流强度。
在本发明的液晶面板的电压测试系统中，所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
在本发明的液晶面板的电压测试系统中，所述第一部分开关测试线设置有第三连接件和第一晶体管；
所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
在本发明的液晶面板的电压测试系统中，所述第一连接件，第三连接件以及第四连接件均包括有固定件和导体；
上述任一连接件中的导体通过该连接件的固定件固定连接该连接件对应的测试线；
其中，上述任一连接件中导体的电阻值均大于对应的测试线的电阻值。
相对于现有技术，本发明提供的液晶面板的电压测试装置，包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；所述第一连接件用于限制进入所述液晶面板的电流强度。本发明保护了液晶面板内部的电路，解决了现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的技术问题，提高了测试效率。
 有益效果
本发明保护了液晶面板内部的电路，解决了现有技术中在对液晶面板进行电压测试时，由于电流过大，导致液晶面板内部电路被击伤的技术问题，提高了测试效率。
 附图说明
图1A-1B为现有技术中对液晶面板进行电压测试的示意图；
图2为本发明中液晶面板的电压测试装置的第一较佳实施例的结构图；
图3为本发明中液晶面板的电压测试装置的第二较佳实施例的结构图；
图4为本发明中液晶面板的电压测试装置的第三较佳实施例的结构图。
 本发明的最佳实施方式
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。
图2为本发明液晶面板的电压测试装置第一较佳实施例的结构图。
在图2所示的实施例中，所述电压测试装置包括开关测试线21和信号输入测试线22。第一测试焊点23对应开关测试线21，第二测试焊点24对应信号输入测试线22。装置还包括第一连接件25和第二连接件26。
在图2所示的实施例中，开关测试线21分为第一部分开关测试线211和第二部分开关测试线212。第一部分开关测试线211和第二部分开关测试线212通过第一连接件25连接。
在图2所示的实施例中，信号输入测试线22分为第一部分信号输入测试线221和第二部分信号输入测试线222。第一部分信号输入测试线221和第二部分信号输入测试线222通过第二连接件26连接。
请继续参阅图2，第一连接件25包括第一固定件251以及第一导体252。第一导体252通过第一固定件251连接所述开关测试线21。第一固定件251以及第一导体252的电阻值均大于开关测试线21的电阻值。
请继续参阅图2，第二连接件26包括第二固定件261以及第二导体262。第二导体262通过第二固定件261连接信号输入测试线22。第二固定件261以及第二导体262的电阻值均大于信号输入测试线22的电阻值。
优选的，第一导体252和第二导体262为氧化铟锡（Indium Tin Oxides，ITO），当然也可以是其它的电阻值较高的导电材料，譬如金属材料，只要使得第一导体252的电阻值大于开关测试线21的电阻值，第二导体262的电阻值大于信号输入测试线22的电阻值即可。第一固定件251和第二固定件261的材料为电阻值较高的金属材料。此处不一一列举。
图2所示的第一较佳实施例的工作原理为：
在对液晶面板27进行电压测试时，给第一测试焊点23一高电压，打开液晶面板27内部的开关（图未示）。之后，第一测试焊点23的测试信号通过开关测试线21输入至液晶面板27的内部，第二测试焊点24的测试信号通过信号输入测试线22输入到液晶面板27的内部，对液晶面板27进行电压测试。
一旦通过开关测试线21和信号输入测试线22的电流超过预先设定的电流阈值，譬如超过10A时，由于第一导体252的电阻值大于开关测试线21的电阻值，第二导体262的电阻值大于信号输入测试线22的电阻值，此时由于大电流产生的热量首先会将第一导体252和第二导体262烧毁，进而断开开关测试线21以及信号输入测试线22的连接，使得大电流不会进入到液晶面板27的内部，从而起到了保护液晶面板27内部电路的作用。
显然，图2所示的实施例能够有效地防止在进行电压测试时，由于电流过大造成液晶面板27内部电路被击伤的问题，有效地保护了液晶面板27内部的电路。
图3为本发明液晶面板的电压检测装置的第二较佳实施例的结构。
与图2所示的第一较佳实施例不同之处在于，本发明第二较佳实施例的第一连接件35包括至少两个的分支连接件。图3所示为三个分支连接件，依次为顶端连接件351，中间连接件352以及底端连接件353。顶端连接件351，中间连接件352以及底端连接件353以并联的方式设置于第一部分开关测试线211和第二部分开关测试线212之间，由于采用并联的方式，使得第一连接件35的宽度远小于开关测试线21的宽度，即便是使用相同的材料，也能保证第一连接件35的电阻值小于开关测试线21的电阻值。
在具体实施过程中，也可以仅使用两个分支连接件并联的方式，或者其它多个分支连接件并联的方式，譬如仅使用顶端连接件351和中间连接件352并联的方式，只要能够使得第一连接件35的宽度小于开关测试线21的宽度即可，此处不一一列举。
请参阅图3，顶端连接件351，中间连接件352以及底端连接件353均包括固定件和导体（图未标）。以顶端连接件351为例，顶端连接件351包括顶端固定件3511和顶端导体3512，顶端导体3512通过顶端固定件3511连接所述开关测试线21。顶端固定件3511和顶端导体3512的电阻值均大于开关测试线21的电阻值。
优选的，顶端连接件351，中间连接件352以及底端连接件353中的导体材料为氧化铟锡，当然也可以是其它的电阻值较高的导电材料，譬如金属材料，只要使得上述连接件中导体的电阻值大于开关测试线21的电阻值即可。顶端连接件351，中间连接件352以及底端连接件353中的固定件的材料为电阻值较高的金属材料，此处不一一列举。
图3所示的第二较佳实施例的工作原理为：
在对液晶面板27进行电压测试时，给第一测试焊点23一高电压，打开液晶面板27内部的开关（图未示）。之后，第一测试焊点23的测试信号通过开关测试线21输入至液晶面板27的内部，第二测试焊点24的测试信号通过信号输入测试线22输入到液晶面板27的内部，对液晶面板27进行电压测试。
一旦通过开关测试线21的电流超过预先设定的电流阈值，譬如超过10A，由于位于开关测试线21上的第一连接件35中的三个连接件采用并联的方式，使得第一连接件35的电阻值远大于开关测试线21的电阻值，因此将大幅度的降低进入液晶面板27的电流强度，从而有效地保护了液晶面板27内部的电路。
图4为本发明液晶面板的电压检测装置的第三较佳实施例的结构。
与图2和图3所示的实施例的不同之处在于，图4所示的液晶面板的电压检测装置中，开关测试线21除了设置第一连接件45之外，还设置有第一晶体管41和第三连接件43，信号输入测试线22上设置有第二晶体管42，所述装置还包括有第四连接件44。
请参阅图4，第一晶体管41和第三连接件43设置在所述第一部分开关测试线211上，第一晶体管41的源极通过第三连接件43连接第一测试焊点23，第一晶体管41的漏极通过所述第四连接件44连接第二晶体管42的栅极。
第三连接件43包括第三固定件431和第三导体432，第一晶体管41的源极通过第三导体432连接第一测试焊点23。第三固定件431以及第三导体432的电阻值均大于开关测试线21的电阻值。
第二晶体管42的源极连接第二测试焊点24，第二晶体管42的漏极连接液晶面板27内部开关的源极。
第四连接件44包括第四固定件441和第四导体442，第一晶体管41的漏极通过第四导体442连接第二晶体管42的栅极。
第一连接件45包括第一固定件451和第一导体452，第一固定件451和第一导体452的电阻值均大于开关测试线21的电阻值。
图4所示的第三较佳实施例的工作原理为：
在对液晶面板27进行电压测试时，给第一测试焊点23一个高电压，使得第一晶体管41打开，第一晶体管41通过其漏极打开第二晶体管42，同时打开液晶面板27内部的开关。之后，第一测试焊点23的测试信号通过开关测试线21输入至液晶面板27的内部，第二测试焊点24的测试信号通过信号输入测试线22输入到液晶面板27的内部，对液晶面板27进行电压测试。
一旦通过所述开关测试线21的电流超过预先设定的电流阈值，譬如超过10A时，图4所示的实施例将通过以下两种措施限制进入液晶面板27的电流强度：
第一，大电流产生的热量首先会将第一连接件45的第一导体452烧毁，进而断开开关测试线21的连接，使得大电流不会进入到液晶面板27的内部，从而起到了保护液晶面板27内部电路的作用。
第二，由于第三连接件43的第三导体432的电阻值大于开关测试线21的电阻值，因此瞬间产生的热量会将第三导体432烧毁，由于第一晶体管41的源极通过第三导体432连接第一测试焊点23，第三导体432被烧毁后，第一晶体管41的源极就失去了信号的导通路径，导致第一晶体管41无法正常工作，由于第二晶体管42需要第一晶体管41提供一高电压才能打开，在第一晶体管41不能正常工作时，第二晶体管42也失效。由此，大电流无法进入液晶面板27的内部，很好的保护了液晶面板27内部的电路。
本发明还提供了一种液晶面板的电压测试系统，所述系统包括液晶面板，还包括本发明提供的液晶面板的电压测试装置，鉴于该装置在上文已有详细的描述，此处不再赘述。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。
 本发明的实施方式
工业实用性
序列表自由内容

Claims (20)

  1. 一种液晶面板的电压测试装置，包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，其特征在于，
    所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；所述第一连接件用于限制进入所述液晶面板的电流强度；
    所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
    所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接；
    在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度；
    在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接。
  2. 根据权利要求1所述的液晶面板的电压测试装置，其特征在于，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
    其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
  3. 根据权利要求1所述的液晶面板的电压测试装置，其特征在于，
    所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
  4. 根据权利要求1所述的液晶面板的电压测试装置，其特征在于，
    所述开关测试线设置有第三连接件和第一晶体管；
    所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
    其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
    所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
  5. 根据权利要求4所述的液晶面板的电压测试装置，其特征在于，所述第一连接件，第三连接件以及第四连接件均包括有固定件和导体；
    上述任一连接件中的导体通过该连接件的固定件固定连接该连接件对应的测试线；
    其中，上述任一连接件中导体的电阻值均大于对应的测试线的电阻值。
  6. 一种液晶面板的电压测试装置，包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，其特征在于，
    所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；
    所述第一连接件用于限制进入所述液晶面板的电流强度。
  7. 根据权利要求6所述的液晶面板的电压测试装置，其特征在于，在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度。
  8. 根据权利要求6所述的液晶面板的电压测试装置，其特征在于，
    所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
    所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接。
  9. 根据权利要求8所述的液晶面板的电压测试装置，其特征在于，
    在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接。
  10. 根据权利要求9所述的液晶面板的电压测试装置，其特征在于，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
    其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
  11. 根据权利要求6所述的液晶面板的电压测试装置，其特征在于，
    所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
  12. 根据权利要求6所述的液晶面板的电压测试装置，其特征在于，
    所述开关测试线设置有第三连接件和第一晶体管；
    所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
    其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
    所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
  13. 根据权利要求12所述的液晶面板的电压测试装置，其特征在于，所述第一连接件，第三连接件以及第四连接件均包括有固定件和导体；
    上述任一连接件中的导体通过该连接件的固定件固定连接该连接件对应的测试线；
    其中，上述任一连接件中导体的电阻值均大于对应的测试线的电阻值。
  14. 一种液晶面板的电压测试系统，包括液晶面板，其特征在于，还包括一液晶面板的电压测试装置，所述装置包括测试焊点和测试线，所述测试焊点通过所述测试线连接液晶面板，所述测试线包括开关测试线和信号输入测试线，
    所述装置还包括第一连接件，所述开关测试线包括第一部分开关测试线和第二部分开关测试线，所述第一部分开关测试线和所述第二部分开关测试线通过所述第一连接件连接；
    所述第一连接件用于限制进入所述液晶面板的电流强度。
  15. 根据权利要求14所述的液晶面板的电压测试系统，其特征在于，在通过所述开关测试线的电流超过预先设置的电流阈值时，所述第一连接件断开所述第一部分开关测试线和第二部分开关测试线之间的连接，以限制进入所述液晶面板的电流强度。
  16. 根据权利要求15所述的液晶面板的电压测试系统，其特征在于，
    所述信号输入测试线包括第一部分信号输入测试线和第二部分信号输入测试线；
    所述装置还包括第二连接件，所述第一部分信号输入测试线和第二部分信号输入测试线通过所述第二连接件连接。
  17. 根据权利要求16所述的液晶面板的电压测试系统，其特征在于，
    在通过所述信号输入测试线的电流超过预先设置的电流阈值时，所述第二连接件断开所述第一部分信号输入测试线和第二部分信号输入测试线之间的连接。
  18. 根据权利要求17所述的液晶面板的电压测试系统，其特征在于，所述第二连接件包括有第二固定件和第二导体；所述第二导体通过所述第二固定件固定连接所述信号输入测试线；
    其中，所述第二导体的电阻值大于所述信号输入测试线的电阻值。
  19. 根据权利要求14所述的液晶面板的电压测试系统，其特征在于，
    所述第一连接件包括至少两个的分支连接件，所述至少两个的分支连接件通过并联的方式设置在所述第一部分开关测试线和第二部分开关测试线之间。
  20. 根据权利要求14所述的液晶面板的电压测试系统，其特征在于，
    所述第一部分开关测试线设置有第三连接件和第一晶体管；
    所述信号输入测试线设置有第二晶体管，所述装置还包括第四连接件；
    其中，所述第一晶体管的源极通过所述第三连接件连接所述开关测试线对应的测试焊点，所述第一晶体管的漏极通过所述第四连接件连接所述第二晶体管的栅极；
    所述第二晶体管的源极连接所述信号输入测试线对应的测试焊点，所述第二晶体管的漏极连接所述液晶面板内部开关的源极。
PCT/CN2011/078314 2011-07-26 2011-08-12 液晶面板的电压测试装置和系统 Ceased WO2013013428A1 (zh)

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