WO2012162915A1 - 一种面板可靠度测试方法及装置 - Google Patents

一种面板可靠度测试方法及装置 Download PDF

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Publication number
WO2012162915A1
WO2012162915A1 PCT/CN2011/075908 CN2011075908W WO2012162915A1 WO 2012162915 A1 WO2012162915 A1 WO 2012162915A1 CN 2011075908 W CN2011075908 W CN 2011075908W WO 2012162915 A1 WO2012162915 A1 WO 2012162915A1
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WIPO (PCT)
Prior art keywords
module
probe
aging
panel
test pad
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Ceased
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PCT/CN2011/075908
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English (en)
French (fr)
Inventor
廖学士
蔡荣茂
张小新
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to US13/376,941 priority Critical patent/US8717050B2/en
Publication of WO2012162915A1 publication Critical patent/WO2012162915A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers

Definitions

  • the invention relates to a panel testing device, in particular to a panel reliability testing device;
  • the invention also relates to a panel testing method, in particular to a panel reliability testing method.
  • Liquid crystal panels generally require a reliability test.
  • the so-called reliability is defined as the probability that an item will perform a specific performance or function within a given time and under a specific use environment/condition, and successfully complete the task. Aging test is an important item in reliability testing.
  • the reliability test of the liquid crystal panel needs to be performed after the liquid crystal panel is assembled into the rear-end module, which takes a long time, and needs to prepare a large number of components for the liquid crystal panel to be tested for reliability (such as Drive circuits, backlight modules, etc.) increase production costs.
  • the general reliability test method is to contact the probe with the liquid crystal cell (Cell) and input signals to the liquid crystal cell, and then pass the backlight for inspection, but the test machine is bulky and expensive, and is not suitable for placing general items into the test room. (Chamber).
  • An object of the present invention is to provide a method and a device for testing panel reliability, which solve the problem of high cost and low efficiency of liquid crystal panel testing.
  • the present invention provides a panel reliability testing device, the device comprising: a connection module for connecting the panel and the aging module; and a reliability test room control module for transmitting a voltage adjustment command to the bias module and/or Sending a switch control command to the aging module; the bias module is configured to adjust the voltage, and send the voltage adjustment result to the aging module; the aging module is configured to perform the switch control command and the bias voltage according to the reliability test room control module
  • the voltage adjustment result of the module performs an aging operation of the panel;
  • the connection module specifically includes: a probe for connecting with a test pad of the panel; and a calibration module for calibrating the probe and the test pad a switching module, configured to transfer an aging signal of the aging module to the probe; a multiplexing module, configured to collect a power-on condition of the probe and multiplex the power-on condition Sending to the feedback module; the feedback module is configured to demultiplex the signal sent by the multiplexer and parse the result of the demultiplexing to determine the
  • the feedback module is electrically connected to the calibration module. If the probe is successfully connected to the test pad, the feedback module sends a feedback signal to the aging module to notify the aging module to start the aging test. If the probe is not successfully connected to the test pad, the feedback module calculates an adjustment amount and a direction of adjustment of a relative position of the probe and the test pad, and controls the calibration module to the probe and the test The pad is calibrated.
  • the calibration module includes a first calibration module and a second calibration module, and the first calibration module and the second calibration module are disposed in an arrangement direction of the probe.
  • the first calibration module and the second calibration module are disposed at both ends of the queue of the probe.
  • the present invention also provides a panel reliability testing device, the device comprising: a connection module for connecting the panel and the aging module; and a reliability test room control module for transmitting a voltage adjustment command to the bias module and/or Or sending a switch control command to the aging module; a bias module for adjusting the voltage and transmitting the voltage adjustment result to the aging module; and an aging module for controlling the switch control command and the bias according to the reliability test room control module
  • the voltage adjustment result of the pressure module performs an aging operation of the panel.
  • the connection module specifically includes: a probe for connecting to the test pad of the panel; a calibration module for calibrating the position of the probe and the test pad; a method for transferring an aging signal of the aging module to the probe; a multiplexing module, configured to collect a power-on condition of the probe, and multiplex and transmit the power-on condition to a feedback module; And a module, configured to determine a connection between the probe and the test pad.
  • the feedback module is electrically connected to the calibration module, and when the feedback module knows that the probe and the test pad are not successfully connected, the feedback module calculates the probe and the Adjusting the relative position of the test pad and adjusting the direction and controlling the calibration module to calibrate the probe and the test pad.
  • connection module further includes: an alarm module, configured to generate an alarm signal when the calibration module is unable to calibrate the probe and the test pad.
  • the reliability test room control module includes: a storage module for storing the program of the panel reliability test; a clock signal generation module for generating a clock signal; and a main control module Reading a program from the storage module, generating a control instruction, and transmitting the control instruction to the aging module and/or the bias module according to the clock signal.
  • the invention also provides a panel reliability testing method, the method comprising a reliability testing room control module, a biasing module, an aging module and a connecting module, the method comprising the following steps: (A) connecting the module to the panel And the aging module; (B) the reliability test room control module sends a voltage adjustment command to the bias module and/or sends a switch control command to the aging module; (C) the bias module adjusts the voltage and outputs a voltage adjustment result to the aging module; D) the aging module performs the aging operation of the panel according to the switch control command of the reliability test room control module and the voltage adjustment result of the bias module.
  • the connection module includes a probe, a transition module, a feedback module, a calibration module, and a multiplexing module
  • the step (A) specifically includes the following steps: (a1) the probe and the The test pads of the panel are connected; (a2) the calibration module calibrates the position of the probe and the test pad; (a3) the switching module transfers the aging signal of the aging module to the probe; (a4) multiplexed The multiplexing module collects the power-on condition of the probe and multiplexes and transmits the power-on condition to the feedback module; (a5) the feedback module determines the connection of the probe to the test pad.
  • the feedback module is electrically connected to the calibration module, and the method further includes the following steps: (a6) when the feedback module knows that the probe and the test pad are not successfully connected
  • the feedback module calculates an adjustment amount and a direction of adjustment of a relative position of the probe and the test pad, and controls the calibration module to calibrate the probe and the test pad.
  • connection module further includes an alarm module
  • the method further includes the following steps: (a7) generating an alarm signal when the calibration module is unable to calibrate the probe and the test pad .
  • the reliability test room control module includes a storage module, a clock signal generation module, and a main control module
  • the step (B) specifically includes the following steps: (b1) the storage module stores the panel a program for reliability testing; (b2) a clock signal generating module generates a clock signal; (b3) the main control module reads a program from the memory module, generates a control command, and sends the control command to the device according to the clock signal The aging module and/or the biasing module.
  • the invention can perform the aging test when the panel is not packaged, which saves the production time of the panel and improves the production efficiency.
  • FIG. 1 is a block diagram of a panel reliability testing apparatus according to an embodiment of the present invention.
  • Figure 2 is a block diagram of the reliability test room control module of Figure 1;
  • connection module is a schematic view showing a first embodiment of a connection relationship between a connection module and a panel according to the present invention
  • connection module 4 is a schematic view showing a second embodiment of a connection relationship between a connection module and a panel according to the present invention
  • FIG. 5 is a circuit diagram of a bias module in a panel reliability testing device according to an embodiment of the present invention.
  • FIG. 6 is a flowchart of a method for testing panel reliability according to an embodiment of the present invention.
  • FIG. 7 is a flow chart showing the steps of connecting the aging module and the liquid crystal cell of the connection module in FIG. 6.
  • the panel reliability testing apparatus of the present invention includes a reliability test chamber control module 101, a biasing module 102, an aging module 103, and a connection module 104.
  • the reliability test room control module 101 includes a main control module 203, a storage module 202, and a clock signal generation module 201.
  • the storage module 202 is configured to store a panel reliability test program
  • the clock signal generation module 201 is configured to generate The clock signal
  • the main control module 203 reads the corresponding program from the storage module 202 according to the clock signal generated by the clock signal generation module 201, and generates a corresponding control instruction.
  • the reliability test room control module 101 is electrically connected to the aging module 103.
  • the reliability test room control module 101 outputs a switch control signal to the aging module 103.
  • the aging module 103 drives the liquid crystal cell to arrive at a predetermined time according to the switch control signal.
  • the (Pattern) function (Function) automatically runs the mode or the fixed pattern (Pattern) mode to activate the LCD panel.
  • the reliability test room control module 101 is electrically connected to the bias module 102, and the reliability test room control module 101 outputs a voltage adjustment command to the bias module 102.
  • the bias module 102 receives a voltage adjustment command, and automatically adjusts the voltage according to the command signal.
  • Vi1- and Vi2+ are reference voltages
  • R1 is a first resistor
  • R2 is a second resistor
  • R3 is a third resistor
  • R4 is a fourth resistor
  • R0 is a fifth resistor
  • first resistor R1 is first.
  • the transistor 502 and the third resistor R3 are electrically connected to the first operational amplifier 501. Specifically, the first resistor R1, the first transistor 502 and the third resistor R3 are connected in series in sequence, and the output of the first operational amplifier 501 is connected.
  • the first resistor R1 is electrically connected to the base of the first transistor 502, and the emitter of the first transistor 502 is electrically connected to the output of the first op amp 501, the first three
  • the collector of the pole tube 502 is electrically connected to the third resistor R3, and the third resistor R3 is connected to the output end of the bias module 102.
  • the second resistor R2, the second transistor 504, the fourth resistor R4 and the second op amp 503 are electrically connected.
  • the second resistor R2, the second transistor 504 and the fourth resistor R4 are connected in series in sequence.
  • the output end of the second operational amplifier 503 is electrically connected to the second resistor R2, and the second resistor R2 is electrically connected.
  • the base of the second transistor 504, the emitter of the second transistor 504 is electrically connected to the output of the second operational amplifier 503, and the set of the second transistor 504 Electrically connected to a fourth resistor R4, a fourth resistor R4 connected to an output terminal of the bias module 102.
  • Vcc is the supply voltage and the voltage at the Gnd terminal is zero.
  • the bias module 102 adjusts the voltage according to the following procedure:
  • the biasing module 102 is electrically connected to the aging module 103, and the biasing module 102 sends the voltage adjustment result to the aging module 103.
  • the aging module 103 is electrically connected to the connecting module 104.
  • the connection module 104 is provided with a probe 302, as shown in FIG. 3, the probe 302 of the connection module 104 and the test pad of the liquid crystal cell (Test Pad) 303 is connected.
  • the aging module 103 ages the panel based on the switch control signal of the reliability test chamber control module 101 and the voltage adjustment signal sent by the bias module 102.
  • the reliability test room control module 101 can separately control the aging module 103 or the bias module 102, and can also jointly control the aging module 103 and the bias module 102.
  • the solution to the above problem is to provide a multiplexing module 304, a feedback module 306, a calibration module 305, an alarm module 307, and a switching module 301 in the connection module 104.
  • the switching module 301 transfers the aging signal of the aging module 103 to each of the probes 302.
  • the multiplexing module 304 is electrically connected to each of the probes 302 for collecting the power-on signal of each of the probes 302, and then all The power-on signal is multiplexed into a signal, which is sent to the feedback module 306.
  • the feedback module 306 demultiplexes the one-way signal and parses the demultiplexed result, thereby determining whether all the probes 302 are in contact with the test pad 303. If yes, the feedback module 306 sends a feedback signal to the aging module 103 to inform the aging module 103 that the probe 302 of the connection module 104 is successfully connected to the test pad 302 of the liquid crystal cell, and can start the aging test.
  • the feedback module 306 sends The control command is sent to the calibration module 305 to command the calibration module 305 to recalibrate the positional relationship between the probe 302 and the test pad 303 until all the probes 302 are successfully connected to the test pad 303. If the connection module 104 is still present within a preset time. If the connection between the probe 302 and the test pad 303 is unsuccessful, the feedback module 306 sends a control command to the alarm module 307, and the alarm module 3 07 sends an alarm signal to inform the operator that the probe 302 of the connection module 104 and the test pad 303 of the liquid crystal cell are not successfully connected.
  • the multiplexing module 304 collects a power-on condition signal for each probe 302 connected to the test pad 303, and the power-on condition signal indicates to the operator through the feedback module 306 and the alarm module 306 how to prepare for the reliability test at one time. Work well, and the aging test will not start again because of poor contact.
  • connection module 104 in the panel reliability testing apparatus of the present invention can multiplex the power-on condition signals of the respective channels without using the multiplexing module 304, and replace the multiplexing module 304 with a current collecting module.
  • the current collecting module collects the power-on condition signal of each of the probes 302, and then sends the power-on condition signals of the respective probes 302 to the feedback module 306 one by one, and the feedback module 306 determines the power-on condition of each of the probes 302 one by one.
  • the feedback module 306 determines that there is a failure in the connection between the probe 302 of the connection module 104 and the test pad 303 of the panel, the feedback module 306 is from the multiplexing module 304 or the current collecting module.
  • the adjustment amount and the adjustment direction of the relative position of the connection module 104 and the panel are calculated in the sent power-on condition signal, and then the adjustment amount and the adjustment direction are sent to the calibration module 305, and the calibration module 305 adjusts the position of the connection module 104 and the panel accordingly.
  • An optimization scheme is to provide more than one calibration module 305 in the direction of the arrangement of the probes 302 of the connection module 104.
  • the first calibration module 401 and the second calibration module 402 are respectively disposed at two ends of the probe 302 queue, as shown in FIG. .
  • the probe 302 of the connection module 104 is first brought into contact with the test pad 303 of the panel in an artificial manner to ensure that the probe 302 of the connection module 104 and the test pad 303 of the panel do not deviate in direction two.
  • the feedback module 306 controls the calibration module 305 to calibrate the connection module 104 to the direction one (or the opposite direction of the direction one) in a minimum calibration unit, and the calibration amount (ie, the adjustment amount) is smaller than the spacing between the two probes 302.
  • the multiplexing module 304 or the current collecting module collects the power-on condition signal of the probe 302. If the feedback module 306 finds that one probe 302 in the queue of the probe 302 is close to the first calibration module 401 and the probe 302 is not successfully connected, the feedback module 306 controls the calibration.
  • the module 305 is calibrated in the opposite direction of the direction of the minimum calibration unit or the distance between the two probes 302.
  • the feedback module 306 finds one side of the queue of the probe 302 (such as the side close to the first calibration module 401), there are several probes 302 that are not associated with The test pad 303 is successfully connected, then the feedback module 306 controls the second calibration module 402 to be stationary, and the first calibration module 401 is calibrated in the reverse direction of the second direction or the second direction in the minimum calibration unit.
  • FIG. 6 is a flowchart of a method for testing panel reliability according to an embodiment of the present invention.
  • the aging module 103 and the liquid crystal cell are connected through the connection module 104.
  • the connection module 104 is electrically connected to the aging module 103, and the connection module 104 is physically connected and electrically connected to the liquid crystal cell.
  • the connection module 104 transfers the aging signal of the aging module 103 to the liquid crystal cell; in step 602, the reliability test room control module 101 sends a command signal for adjusting the voltage to the bias module 102; at step 603, the reliability test room The control module 101 sends a switch control signal to the aging module 103 to activate the aging module 103; at step 604, the bias module 102 outputs a voltage adjustment result to the aging module 103; at step 605, the aging module 103 drives the liquid crystal cell to start for reliability. test.
  • step 701 the probe 302 of the connection module 104 is in contact with the test pad 303 of the panel; in step 702, the calibration module 305 calibrates the position of the probe 302 and the test pad 303; in step 703, the adapter module 301 energizes the probe 302; Step 704, the multiplexing module 304 collects the power-on condition signal from each of the probes 302; in step 705, the multiplexing module 304 multiplexes the power-on condition signals of each of the probes 302 into one signal and transmits To the feedback module 306, in this step, a current collecting module can be used instead of the multiplexing module 304.
  • the current collecting module collects the power-on condition signal of each of the probes 302, and then sends the power-on status signals of the respective probes 302 to the feedback one by one.
  • Module 306 in step 707, the feedback module 306 demultiplexes the power-on condition signal received from the multiplexing module 304 and determines from the demultiplexed results whether all of the probes 302 are successfully connected to the test pad 303, or the feedback module 306 analyzes the energization condition of each probe 302 one by one to determine whether all the probes 302 are successfully connected to the test pad 303, and if yes, proceeds to step 709, The module 306 notifies the aging module 103 to start aging the panel. If no, the process proceeds to step 708.
  • the feedback module 306 determines whether the predetermined time has elapsed. If the predetermined time has elapsed, the process proceeds to step 710, and the feedback module 306 commands the aging module 103 to perform an alarm. If the predetermined time has not passed, proceeding to step 706, the feedback module 306 instructs the calibration module 305 to calibrate the position of the probe 302 and the test pad 303 again until all the probes 302 of the connection module 104 are successfully connected to the test pad 303.
  • the panel reliability testing method of the present invention further includes the following steps. If the feedback module 306 determines that the probe 302 of the connection module 104 is not successfully connected to the test pad 303 of the panel, the feedback module 306 is from the multiplexing module 304 or The adjustment quantity and the adjustment direction of the relative position of the connection module 104 and the panel are calculated in the power-on condition signal sent by the current collection module, and then the adjustment quantity and the adjustment direction are sent to the calibration module 305, and the calibration module 305 adjusts the connection module 104 accordingly. The location of the panel.
  • an optimization scheme is to integrate the aging module 103 with the connection module 104.
  • the burn-in module 103 integrates the functions of the signal.

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  • Computer Hardware Design (AREA)
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Abstract

提供一种面板可靠度测试方法及装置。该装置包括：连接模块（104），用于连接所述面板和老化模块（103）；可靠度测试室控制模块（101），用于向偏压模块（102）发送电压调节指令和/或向老化模块（103）发送开关控制指令；偏压模块（102），用于调节电压，并将电压调节结果发送给老化模块（103）；老化模块（103），用于根据所述可靠度测试室控制模块（101）的开关控制指令和所述偏压模块（102）的所述电压调节结果执行所述面板的老化操作。该装置和方法在面板未封装即可进行老化测试，节约了面板的生产时间，提高了生产效率。

Description

一种面板可靠度测试方法及装置 技术领域
本发明涉及一种面板测试装置，特别是涉及一种面板可靠度测试装置；
本发明还涉及一种面板测试方法，特别是涉及一种面板可靠度测试方法。
 背景技术
液晶面板一般都需要进行可靠度（Reliability）测试。所谓可靠度的定义为物品于既定的时间内，在特定的使用环境/条件下，执行特定性能或功能，圆满成功达成任务的机率。老化测试是可靠度测试中的一个重要项目。
目前，对液晶面板的可靠度测试需要在液晶面板组装成后段模组才能进行，这种方式需要耗费冗长的时间，同时还需要为要进行可靠度测试的液晶面板准备好众多的部件（如驱动电路、背光模块等），增加了生产成本。
一般的可靠度测试方法是将探头跟液晶盒（Cell）接触并向液晶盒输入信号，然后透过背光进行检验，但是测试机台体积庞大价格昂贵，且不适用于将一般物品置入测试室（Chamber）内。
故，有必要提供一种面板测试方法及装置，以解决现有技术所存在的问题。
 技术问题
本发明的目的在于提供一种面板可靠度测试方法及装置，以解决液晶面板测试成本高、效率低的问题。
 技术解决方案
本发明提供了一种面板可靠度测试装置，所述装置包括：连接模块，用于连接所述面板和老化模块；可靠度测试室控制模块，用于向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；偏压模块，用于调节电压，并将电压调节结果发送给老化模块；老化模块，用于根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作；所述连接模块具体包括：探头，用于与所述面板的测试垫相连接；校准模块，用于校准所述探头与所述测试垫的位置；转接模块，用于将所述老化模块的老化信号转接给所述探头；多路复用模块，用于采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；反馈模块，用于解复用多路复用器发送的信号并对解复用的结果进行解析，以判断所述探头与所述测试垫的连接情况；所述反馈模块与所述校准模块电性连接，若所述探头与所述测试垫连接成功，所述反馈模块向老化模块发送反馈信号，用以通知老化模块开始老化测试，若所述探头与所述测试垫未连接成功，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
在本发明的一实施例中，所述校准模块包括第一校准模块和第二校准模块，所述第一校准模块和所述第二校准模块设置在所述探头的排列方向上。
在本发明的一实施例中，所述第一校准模块和所述第二校准模块设置在所述探头的队列的两端。
本发明还提供了一种面板可靠度测试装置，所述装置包括：连接模块，用于连接所述面板和老化模块；可靠度测试室控制模块，用于向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；偏压模块，用于调节电压，并将电压调节结果发送给老化模块；老化模块，用于根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作。
在本发明的一实施例中，所述连接模块具体包括：探头，用于与所述面板的测试垫相连接；校准模块，用于校准所述探头与所述测试垫的位置；转接模块，用于将所述老化模块的老化信号转接给所述探头；多路复用模块，用于采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；反馈模块，用于判断所述探头与所述测试垫的连接情况。
在本发明的一实施例中，所述反馈模块与所述校准模块电性连接，当所述反馈模块获知存在探头与测试垫未连接成功的情况时，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
在本发明的一实施例中，所述连接模块还包括：告警模块，用于在所述校准模块无法对所述探头与所述测试垫进行校准时产生告警信号。
在本发明的一实施例中，所述可靠度测试室控制模块包括：存储模块，用于存储所述面板可靠度测试的程序；时钟信号产生模块，用于产生时钟信号；主控模块，用于从所述存储模块读取程序，生成控制指令，并根据所述时钟信号将所述控制指令发送给所述老化模块和/或所述偏压模块。
本发明还提供了一种面板可靠度测试方法，所述方法包括可靠度测试室控制模块、偏压模块、老化模块和连接模块，所述方法包括以下步骤：（A）连接模块连接所述面板与老化模块；（B）可靠度测试室控制模块向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；（C）偏压模块调节电压并向老化模块输出电压调节结果；（D）老化模块根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作。
在本发明的一实施例中，所述连接模块包括探头、转接模块、反馈模块、校准模块和多路复用模块，所述步骤（A）具体包括以下步骤：（a1）探头与所述面板的测试垫相连接；（a2）校准模块校准所述探头与所述测试垫的位置；（a3）转接模块将所述老化模块的老化信号转接给所述探头；（a4）多路复用模块采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；（a5）反馈模块判断所述探头与所述测试垫的连接情况。
在本发明的一实施例中，所述反馈模块与所述校准模块电性连接，所述方法还包括以下步骤：（a6）当所述反馈模块获知存在探头与测试垫未连接成功的情况时，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
在本发明的一实施例中，所述连接模块还包括告警模块，所述方法还包括以下步骤：（a7）当所述校准模块无法对所述探头与所述测试垫进行校准时产生告警信号。
在本发明的一实施例中，所述可靠度测试室控制模块包括存储模块、时钟信号产生模块和主控模块，所述步骤（B）具体包括以下步骤：（b1）存储模块存储所述面板可靠度测试的程序；（b2）时钟信号产生模块产生时钟信号；（b3）主控模块从所述存储模块读取程序，生成控制指令，并根据所述时钟信号将所述控制指令发送给所述老化模块和/或所述偏压模块。
 有益效果
本发明相对于现有技术，在面板未封装即可进行老化测试，节约了面板的生产时间，提高了生产效率。
附图说明
图1为本发明实施例的面板可靠度测试装置的框图；
图2为图1中可靠度测试室控制模块的框图；
图3为本发明连接模块与面板连接关系第一个实施例的示意图；
图4为本发明连接模块与面板连接关系第二个实施例的示意图；
图5为本发明实施例的面板可靠度测试装置中偏压模块的电路图；
图6为本发明实施例的面板可靠度测试方法的流程图；
图7为图6中连接模块连接老化模块与液晶盒步骤的流程图。
 本发明的最佳实施方式
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。
在图中，结构相似的单元是以相同标号表示。
参照图1，本发明的面板可靠度测试装置包括可靠度（Reliability）测试室（Chamber）控制模块101、偏压模块102、老化（Aging）模块103和连接模块104。如图2所示，可靠度测试室控制模块101包含有主控模块203、存储模块202和时钟信号产生模块201，存储模块202用于存储面板可靠度测试程序，时钟信号产生模块201用于产生时钟信号，主控模块203根据时钟信号产生模块201产生的时钟信号从存储模块202中读取相应的程序，生成相应的控制指令。可靠度测试室控制模块101与老化模块103电性连接，可靠度测试室控制模块101向老化模块103输出开关控制信号，老化模块103根据该开关控制信号在预定时间到达时驱动液晶盒，以图案（Pattern）功能（Function）自动运行的方式或固定图案（Pattern）的方式启动液晶面板。可靠度测试室控制模块101与偏压模块102电性连接，可靠度测试室控制模块101向偏压模块102输出电压调节指令。
偏压模块102接收电压调节指令，根据该指令信号自动调节电压。参考图5，其中Vi1-和Vi2+为参考电压，R1为第一电阻，R2为第二电阻，R3为第三电阻，R4为第四电阻，R0为第五电阻，第一电阻R1、第一三极管502、第三电阻R3与第一运放501电性连接，具体是第一电阻R1、第一三极管502和第三电阻R3按先后顺序串联连接，第一运放501的输出端电性连接第一电阻R1，第一电阻R1电性连接第一三极管502的基极，第一三极管502的发射极电性连接第一运放501的输出端，第一三极管502的集电极电性连接第三电阻R3，第三电阻R3接偏压模块102的输出端；第二电阻R2、第二三极管504、第四电阻R4与第二运放503电性连接，具体是第二电阻R2、第二三极管504和第四电阻R4按先后顺序串联连接，第二运放503的输出端电性连接第二电阻R2，第二电阻R2电性连接第二三极管504的基极，第二三极管504的发射极电性连接第二运放503的输出端，第二三极管504的集电极电性连接第四电阻R4，第四电阻R4接偏压模块102的输出端。Vcc为供应电压，Gnd端电压为0。偏压模块102按照以下程序调节电压：
当输入的电压大于3.6V时，即INPUT> Vi1-，INPUT> Vi2+，第一运放501输出的V0=Vcc=15V，第一三极管502导通，第二运放503输出的V0=Gnd=0V，第二三极管504不导通，因此OUTPUT=15V*R0/(R3+R0)=12.8V，当输入的电压小于3.3V时，即INPUT< Vi1-，INPUT< Vi2+，第一运放501输出的V0=Gnd=0V，第一三极管502不导通，第二运放503输出V0=Vcc=15V，第二三极管504导通，因此OUTPUT=15V*R0/(R4+R0)=11.8V。偏压模块102与老化模块103电性连接，偏压模块102将电压调节结果发送给老化模块103，老化模块103与连接模块104电性连接。连接模块104设有探头（Probe）302，如图3所示，连接模块104的探头302跟液晶盒的测试垫（Test Pad）303相连接。老化模块103根据可靠度测试室控制模块101的开关控制信号和偏压模块102发送的电压调节信号对面板进行老化。可靠度测试室控制模块101可以单独控制老化模块103或偏压模块102，也可以同时联合控制老化模块103与偏压模块102。
在进行可靠度测试的过程中，可能会出现的情况是连接模块104与液晶盒的测试垫303接触不良，导致测试人员需要重新调整连接模块104与液晶盒的连接，这会耗费许多时间，不利于产能的提高。参考图3，上述问题的解决方法是在连接模块104中设置多路复用模块304、反馈模块306、校准模块305、告警模块307和转接模块301。转接模块301将老化模块103的老化信号转接到每一个探头302中，多路复用模块304与每一个探头302电性连接，用于采集每一个探头302的通电情况信号，然后将所有通电信号多路复用，成为一路信号，发送给反馈模块306，反馈模块306解复用该一路信号并对解复用的结果进行解析，据此判断所有的探头302是否均与测试垫303接触良好，若是，则反馈模块306向老化模块103发送反馈信号，用以告知老化模块103连接模块104的探头302与液晶盒的测试垫302连接成功，可以开始老化测试，若否，反馈模块306发送控制指令给校准模块305以命令校准模块305再次校准探头302与测试垫303的位置关系，直到所有的探头302均与测试垫303连接成功为止，若在一个预设的时间内还存在连接模块104的探头302与测试垫303连接不成功的情况，那么反馈模块306发送控制指令给告警模块307，告警模块307发送告警信号，用以告知操作人员连接模块104的探头302与液晶盒的测试垫303未成功连接。多路复用模块304对每一个与测试垫303连接的探头302采集通电情况信号，该通电情况信号通过反馈模块306和告警模块306给操作人员指示如何一次性就把可靠度测试所需的准备工作做好，而不会因为接触不良导致老化测试需要重新开始。
当然，本发明的面板可靠度测试装置中的连接模块104可以不使用多路复用模块304多路复用各路的通电情况信号，而用一个电流采集模块来代替多路复用模块304，该电流采集模块采集每一个探头302的通电情况信号，然后逐一将各个探头302的通电情况信号发送给反馈模块306，反馈模块306逐一判断每一个探头302的通电情况。在本发明的面板可靠度测试装置中，若反馈模块306判断出存在连接模块104的探头302与面板的测试垫303连接不成功的情况，反馈模块306从多路复用模块304或电流采集模块发送的通电情况信号中计算出连接模块104与面板的相对位置的调整量以及调整方向，然后将该调整量和调整方向发送给校准模块305，校准模块305据此调整连接模块104与面板的位置。
一种优化方案是在连接模块104的探头302排列方向上设置一个以上的校准模块305，如在探头302队列的两端分别设置第一校准模块401和第二校准模块402，如图4所示。首先以人为的方式将连接模块104的探头302与面板的测试垫303相接触，以保证连接模块104的探头302与面板的测试垫303在方向二上没有偏离。然后在反馈模块306中设定校准模块305的最小校准单位、探头302在方向一上的宽度及两个探头302之间的间距，若反馈模块306从所接收的通电情况信号中识别出所有的探头302均未与测试垫303连接成功，那么由此可知探头302与测试垫303在方向一或方向一的反方向上存在偏离。接着反馈模块306控制校准模块305按最小校准单位将连接模块104往方向一（也可以往方向一的反方向）校准，校准量（即调整量）小于两个探头302之间的间距。此时多路复用模块304或电流采集模块采集探头302的通电情况信号，若反馈模块306发现探头302队列中靠近第一校准模块401一端有一个探头302没连接成功，那么反馈模块306控制校准模块305按最小校准单位或两探头302的间距往方向一的反方向校准，若反馈模块306发现探头302队列的一侧（如靠近第一校准模块401的一侧）有若干个探头302未与测试垫303连接成功，那么反馈模块306控制第二校准模块402不动，第一校准模块401按最小校准单位往第二方向或第二方向的反方向校准。
参考图6，为本发明实施例的面板可靠度测试方法的流程图。在本发明的面板可靠度测试方法中，在步骤601，通过连接模块104连接老化模块103和液晶盒，具体是连接模块104与老化模块103电性连接，连接模块104与液晶盒物理连接和电性连接，连接模块104将老化模块103的老化信号转接给液晶盒；在步骤602，可靠度测试室控制模块101向偏压模块102发送调节电压的指令信号；在步骤603，可靠度测试室控制模块101向老化模块103发送开关控制信号，以启动老化模块103；在步骤604，偏压模块102向老化模块103输出电压调节结果；在步骤605，老化模块103驱动液晶盒启动以进行可靠度测试。
参考图7，为图6中连接模块104连接老化模块103与液晶盒的流程图。在步骤701，连接模块104的探头302与面板的测试垫303相接触；在步骤702，校准模块305校准探头302与测试垫303的位置；在步骤703，转接模块301向探头302通电；在步骤704，多路复用模块304从每个探头302处采集通电情况信号；在步骤705，多路复用模块304将每个探头302的通电情况信号多路复用，成为一路信号，并发送给反馈模块306，在这个步骤中，可以使用电流采集模块来代替多路复用模块304，电流采集模块采集每一个探头302的通电情况信号，然后逐一将各个探头302的通电情况信号发送给反馈模块306；在步骤707，反馈模块306对从多路复用模块304接收的通电情况信号解复用并从解复用结果中判断是否所有的探头302均与测试垫303连接成功，或者反馈模块306逐一解析每一个探头302的通电情况以判断是否所有的探头302均与测试垫303连接成功，若是，则进入步骤709，反馈模块306通知老化模块103开始对面板进行老化，若否，则进入步骤708，反馈模块306判断预定时间是否已过，若预定时间已过，则进入步骤710，反馈模块306命令老化模块103进行告警，若预定时间未过，则进入步骤706，反馈模块306命令校准模块305再次对探头302与测试垫303的位置进行校准，直到连接模块104的所有探头302均与测试垫303连接成功为止。
在本发明的面板可靠度测试方法还包括以下步骤，若反馈模块306判断出存在连接模块104的探头302与面板的测试垫303连接不成功的情况，反馈模块306从多路复用模块304或电流采集模块发送的通电情况信号中计算出连接模块104与面板的相对位置的调整量以及调整方向，然后将该调整量和调整方向发送给校准模块305，校准模块305据此调整连接模块104与面板的位置。
在对面板进行可靠度测试的整个过程中，为了降低带给操作人员的操作复杂度，一种优化方案是将老化模块103与连接模块104集成在一起。在本发明的面板可靠度测试装置中，老化模块103集成信号机的功能。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。
 本发明的实施方式
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Claims (13)

  1. 一种面板可靠度测试装置，其特征在于，所述装置包括：
    连接模块，用于连接所述面板和老化模块；
    可靠度测试室控制模块，用于向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；
    偏压模块，用于调节电压，并将电压调节结果发送给老化模块；以及
    老化模块，用于根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作；
    其中所述连接模块具体包括：
    探头，用于与所述面板的测试垫相连接；
    校准模块，用于校准所述探头与所述测试垫的位置；
    转接模块，用于将所述老化模块的老化信号转接给所述探头；
    多路复用模块，用于采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；
    反馈模块，用于解复用多路复用器发送的信号并对解复用的结果进行解析，以判断所述探头与所述测试垫的连接情况；
    所述反馈模块与所述校准模块电性连接，若所述探头与所述测试垫连接成功，所述反馈模块向老化模块发送反馈信号，用以通知老化模块开始老化测试，若所述探头与所述测试垫未连接成功，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
  2. 根据权利要求1所述的面板可靠度测试装置，其特征在于，所述校准模块包括第一校准模块和第二校准模块，所述第一校准模块和所述第二校准模块设置在所述探头的排列方向上。
  3. 根据权利要求2所述的面板可靠度测试装置，其特征在于，所述第一校准模块和所述第二校准模块设置在所述探头的队列的两端。
  4. 一种面板可靠度测试装置，其特征在于，所述装置包括：
    连接模块，用于连接所述面板和老化模块；
    可靠度测试室控制模块，用于向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；
    偏压模块，用于调节电压，并将电压调节结果发送给老化模块；以及
    老化模块，用于根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作。
  5. 根据权利要求4所述的面板可靠度测试装置，其特征在于，所述连接模块具体包括：
    探头，用于与所述面板的测试垫相连接；
    校准模块，用于校准所述探头与所述测试垫的位置；
    转接模块，用于将所述老化模块的老化信号转接给所述探头；
    多路复用模块，用于采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；以及
    反馈模块，用于判断所述探头与所述测试垫的连接情况。
  6. 根据权利要求5所述的面板可靠度测试装置，其特征在于，所述反馈模块与所述校准模块电性连接，当所述反馈模块获知存在探头与测试垫未连接成功的情况时，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
  7. 根据权利要求6所述的面板可靠度测试装置，其特征在于，所述连接模块还包括：
    告警模块，用于在所述校准模块无法对所述探头与所述测试垫进行校准时产生告警信号。
  8. 根据权利要求4所述的面板可靠度测试装置，其特征在于，所述可靠度测试室控制模块包括：
    存储模块，用于存储所述面板可靠度测试的程序；
    时钟信号产生模块，用于产生时钟信号；以及
    主控模块，用于从所述存储模块读取程序，生成控制指令，并根据所述时钟信号将所述控制指令发送给所述老化模块和/或所述偏压模块。
  9. 一种面板可靠度测试方法，其特征在于，所述方法包括可靠度测试室控制模块、偏压模块、老化模块和连接模块，所述方法包括以下步骤：
    （A）连接模块连接所述面板与老化模块；
    （B）可靠度测试室控制模块向偏压模块发送电压调节指令和/或向老化模块发送开关控制指令；
    （C）偏压模块调节电压并向老化模块输出电压调节结果；以及
    （D）老化模块根据所述可靠度测试室控制模块的开关控制指令和所述偏压模块的所述电压调节结果执行所述面板的老化操作。
  10. 根据权利要求9所述的面板可靠度测试方法，其特征在于，所述连接模块包括探头、转接模块、反馈模块、校准模块和多路复用模块，所述步骤（A）具体包括以下步骤：
    （a1）探头与所述面板的测试垫相连接；
    （a2）校准模块校准所述探头与所述测试垫的位置；
    （a3）转接模块将所述老化模块的老化信号转接给所述探头；
    （a4）多路复用模块采集所述探头的通电情况并将所述通电情况多路复用并发送给反馈模块；以及
    （a5）反馈模块判断所述探头与所述测试垫的连接情况。
  11. 根据权利要求10所述的面板可靠度测试方法，其特征在于，所述反馈模块与所述校准模块电性连接，所述方法还包括以下步骤：
    （a6）当所述反馈模块获知存在探头与测试垫未连接成功的情况时，所述反馈模块计算所述探头与所述测试垫的相对位置的调整量与调整方向并控制所述校准模块对所述探头与所述测试垫进行校准。
  12. 根据权利要求11所述的面板可靠度测试方法，其特征在于，所述连接模块还包括告警模块，所述方法还包括以下步骤：
    （a7）当所述校准模块无法对所述探头与所述测试垫进行校准时产生告警信号。
  13. 根据权利要求9所述的面板可靠度测试方法，其特征在于，所述可靠度测试室控制模块包括存储模块、时钟信号产生模块和主控模块，所述步骤（B）具体包括以下步骤：
    （b1）存储模块存储所述面板可靠度测试的程序；
    （b2）时钟信号产生模块产生时钟信号；以及
    （b3）主控模块从所述存储模块读取程序，生成控制指令，并根据所述时钟信号将所述控制指令发送给所述老化模块和/或所述偏压模块。
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