WO2012091045A1 - 光化学反応デバイス - Google Patents
光化学反応デバイス Download PDFInfo
- Publication number
- WO2012091045A1 WO2012091045A1 PCT/JP2011/080282 JP2011080282W WO2012091045A1 WO 2012091045 A1 WO2012091045 A1 WO 2012091045A1 JP 2011080282 W JP2011080282 W JP 2011080282W WO 2012091045 A1 WO2012091045 A1 WO 2012091045A1
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- WIPO (PCT)
- Prior art keywords
- electrode
- carbon dioxide
- reaction device
- photochemical reaction
- semiconductor
- Prior art date
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- 238000006552 photochemical reaction Methods 0.000 title claims description 41
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims abstract description 300
- 239000001569 carbon dioxide Substances 0.000 claims abstract description 150
- 229910002092 carbon dioxide Inorganic materials 0.000 claims abstract description 150
- 238000006722 reduction reaction Methods 0.000 claims abstract description 135
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 94
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 87
- 230000001603 reducing effect Effects 0.000 claims abstract description 30
- 150000001722 carbon compounds Chemical class 0.000 claims abstract description 17
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 13
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 13
- 239000001301 oxygen Substances 0.000 claims abstract description 13
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- 239000004065 semiconductor Substances 0.000 claims description 93
- 239000003054 catalyst Substances 0.000 claims description 50
- 238000000034 method Methods 0.000 claims description 44
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 40
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 33
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- 150000004696 coordination complex Chemical group 0.000 claims description 30
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- 125000005647 linker group Chemical group 0.000 description 9
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- 238000004519 manufacturing process Methods 0.000 description 8
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- 239000002245 particle Substances 0.000 description 6
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- 238000004611 spectroscopical analysis Methods 0.000 description 6
- 239000011593 sulfur Substances 0.000 description 6
- 229910052724 xenon Inorganic materials 0.000 description 6
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 6
- 239000005083 Zinc sulfide Substances 0.000 description 5
- 238000006555 catalytic reaction Methods 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
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- 230000009257 reactivity Effects 0.000 description 5
- 229910052702 rhenium Inorganic materials 0.000 description 5
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 5
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- 238000005406 washing Methods 0.000 description 5
- 229910052984 zinc sulfide Inorganic materials 0.000 description 5
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 5
- HNSDLXPSAYFUHK-UHFFFAOYSA-N 1,4-bis(2-ethylhexyl) sulfosuccinate Chemical compound CCCCC(CC)COC(=O)CC(S(O)(=O)=O)C(=O)OCC(CC)CCCC HNSDLXPSAYFUHK-UHFFFAOYSA-N 0.000 description 4
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- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 4
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- 239000003011 anion exchange membrane Substances 0.000 description 1
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- RFRXIWQYSOIBDI-UHFFFAOYSA-N benzarone Chemical compound CCC=1OC2=CC=CC=C2C=1C(=O)C1=CC=C(O)C=C1 RFRXIWQYSOIBDI-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- UBAZGMLMVVQSCD-UHFFFAOYSA-N carbon dioxide;molecular oxygen Chemical compound O=O.O=C=O UBAZGMLMVVQSCD-UHFFFAOYSA-N 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000005341 cation exchange Methods 0.000 description 1
- 239000007806 chemical reaction intermediate Substances 0.000 description 1
- 239000007810 chemical reaction solvent Substances 0.000 description 1
- NEHMKBQYUWJMIP-UHFFFAOYSA-N chloromethane Chemical compound ClC NEHMKBQYUWJMIP-UHFFFAOYSA-N 0.000 description 1
- OTAFHZMPRISVEM-UHFFFAOYSA-N chromone Chemical compound C1=CC=C2C(=O)C=COC2=C1 OTAFHZMPRISVEM-UHFFFAOYSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- TVZPLCNGKSPOJA-UHFFFAOYSA-N copper zinc Chemical compound [Cu].[Zn] TVZPLCNGKSPOJA-UHFFFAOYSA-N 0.000 description 1
- BERDEBHAJNAUOM-UHFFFAOYSA-N copper(I) oxide Inorganic materials [Cu]O[Cu] BERDEBHAJNAUOM-UHFFFAOYSA-N 0.000 description 1
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- OPQARKPSCNTWTJ-UHFFFAOYSA-L copper(ii) acetate Chemical compound [Cu+2].CC([O-])=O.CC([O-])=O OPQARKPSCNTWTJ-UHFFFAOYSA-L 0.000 description 1
- YRNNKGFMTBWUGL-UHFFFAOYSA-L copper(ii) perchlorate Chemical compound [Cu+2].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O YRNNKGFMTBWUGL-UHFFFAOYSA-L 0.000 description 1
- KRFJLUBVMFXRPN-UHFFFAOYSA-N cuprous oxide Chemical compound [O-2].[Cu+].[Cu+] KRFJLUBVMFXRPN-UHFFFAOYSA-N 0.000 description 1
- 229940112669 cuprous oxide Drugs 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- XNFVGEUMTFIVHQ-UHFFFAOYSA-N disodium;sulfide;hydrate Chemical compound O.[Na+].[Na+].[S-2] XNFVGEUMTFIVHQ-UHFFFAOYSA-N 0.000 description 1
- 238000003487 electrochemical reaction Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000003411 electrode reaction Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- PZOUSPYUWWUPPK-UHFFFAOYSA-N indole Natural products CC1=CC=CC2=C1C=CN2 PZOUSPYUWWUPPK-UHFFFAOYSA-N 0.000 description 1
- RKJUIXBNRJVNHR-UHFFFAOYSA-N indolenine Natural products C1=CC=C2CC=NC2=C1 RKJUIXBNRJVNHR-UHFFFAOYSA-N 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 description 1
- NQXWGWZJXJUMQB-UHFFFAOYSA-K iron trichloride hexahydrate Chemical compound O.O.O.O.O.O.[Cl-].Cl[Fe+]Cl NQXWGWZJXJUMQB-UHFFFAOYSA-K 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 230000004298 light response Effects 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical group 0.000 description 1
- 238000002715 modification method Methods 0.000 description 1
- 229940078494 nickel acetate Drugs 0.000 description 1
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- AOPCKOPZYFFEDA-UHFFFAOYSA-N nickel(2+);dinitrate;hexahydrate Chemical compound O.O.O.O.O.O.[Ni+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O AOPCKOPZYFFEDA-UHFFFAOYSA-N 0.000 description 1
- ZLQBNKOPBDZKDP-UHFFFAOYSA-L nickel(2+);diperchlorate Chemical compound [Ni+2].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O ZLQBNKOPBDZKDP-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- OYJSZRRJQJAOFK-UHFFFAOYSA-N palladium ruthenium Chemical compound [Ru].[Pd] OYJSZRRJQJAOFK-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 125000002467 phosphate group Chemical group [H]OP(=O)(O[H])O[*] 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 238000006303 photolysis reaction Methods 0.000 description 1
- 230000015843 photosynthesis, light reaction Effects 0.000 description 1
- LFSXCDWNBUNEEM-UHFFFAOYSA-N phthalazine Chemical compound C1=NN=CC2=CC=CC=C21 LFSXCDWNBUNEEM-UHFFFAOYSA-N 0.000 description 1
- 239000004323 potassium nitrate Substances 0.000 description 1
- 235000010333 potassium nitrate Nutrition 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- JWVCLYRUEFBMGU-UHFFFAOYSA-N quinazoline Chemical compound N1=CN=CC2=CC=CC=C21 JWVCLYRUEFBMGU-UHFFFAOYSA-N 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000006479 redox reaction Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 150000003303 ruthenium Chemical class 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 125000005372 silanol group Chemical group 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 235000011121 sodium hydroxide Nutrition 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- OEIMLTQPLAGXMX-UHFFFAOYSA-I tantalum(v) chloride Chemical compound Cl[Ta](Cl)(Cl)(Cl)Cl OEIMLTQPLAGXMX-UHFFFAOYSA-I 0.000 description 1
- 150000003498 tellurium compounds Chemical class 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- 150000003606 tin compounds Chemical class 0.000 description 1
- RMUKCGUDVKEQPL-UHFFFAOYSA-K triiodoindigane Chemical compound I[In](I)I RMUKCGUDVKEQPL-UHFFFAOYSA-K 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- ZNOKGRXACCSDPY-UHFFFAOYSA-N tungsten trioxide Chemical compound O=[W](=O)=O ZNOKGRXACCSDPY-UHFFFAOYSA-N 0.000 description 1
- FOSPKRPCLFRZTR-UHFFFAOYSA-N zinc;dinitrate;hydrate Chemical compound O.[Zn+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O FOSPKRPCLFRZTR-UHFFFAOYSA-N 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J31/00—Catalysts comprising hydrides, coordination complexes or organic compounds
- B01J31/16—Catalysts comprising hydrides, coordination complexes or organic compounds containing coordination complexes
- B01J31/18—Catalysts comprising hydrides, coordination complexes or organic compounds containing coordination complexes containing nitrogen, phosphorus, arsenic or antimony as complexing atoms, e.g. in pyridine ligands, or in resonance therewith, e.g. in isocyanide ligands C=N-R or as complexed central atoms
- B01J31/1805—Catalysts comprising hydrides, coordination complexes or organic compounds containing coordination complexes containing nitrogen, phosphorus, arsenic or antimony as complexing atoms, e.g. in pyridine ligands, or in resonance therewith, e.g. in isocyanide ligands C=N-R or as complexed central atoms the ligands containing nitrogen
- B01J31/181—Cyclic ligands, including e.g. non-condensed polycyclic ligands, comprising at least one complexing nitrogen atom as ring member, e.g. pyridine
- B01J31/1815—Cyclic ligands, including e.g. non-condensed polycyclic ligands, comprising at least one complexing nitrogen atom as ring member, e.g. pyridine with more than one complexing nitrogen atom, e.g. bipyridyl, 2-aminopyridine
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B1/00—Electrolytic production of inorganic compounds or non-metals
- C25B1/01—Products
- C25B1/02—Hydrogen or oxygen
- C25B1/04—Hydrogen or oxygen by electrolysis of water
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B1/00—Electrolytic production of inorganic compounds or non-metals
- C25B1/50—Processes
- C25B1/55—Photoelectrolysis
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B11/00—Electrodes; Manufacture thereof not otherwise provided for
- C25B11/04—Electrodes; Manufacture thereof not otherwise provided for characterised by the material
- C25B11/051—Electrodes formed of electrocatalysts on a substrate or carrier
- C25B11/055—Electrodes formed of electrocatalysts on a substrate or carrier characterised by the substrate or carrier material
- C25B11/057—Electrodes formed of electrocatalysts on a substrate or carrier characterised by the substrate or carrier material consisting of a single element or compound
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B3/00—Electrolytic production of organic compounds
- C25B3/20—Processes
- C25B3/25—Reduction
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2231/00—Catalytic reactions performed with catalysts classified in B01J31/00
- B01J2231/70—Oxidation reactions, e.g. epoxidation, (di)hydroxylation, dehydrogenation and analogues
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2531/00—Additional information regarding catalytic systems classified in B01J31/00
- B01J2531/80—Complexes comprising metals of Group VIII as the central metal
- B01J2531/82—Metals of the platinum group
- B01J2531/821—Ruthenium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2540/00—Compositional aspects of coordination complexes or ligands in catalyst systems
- B01J2540/40—Non-coordinating groups comprising nitrogen
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/30—Catalysts, in general, characterised by their form or physical properties characterised by their physical properties
- B01J35/39—Photocatalytic properties
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/36—Hydrogen production from non-carbon containing sources, e.g. by water electrolysis
Definitions
- the present invention relates to a composite photoelectrode, a photochemical reaction device, and a light energy storage device that synthesize carbon compounds by reducing carbon dioxide using water as an electron source.
- Non-Patent Document 1 is known as an example of using a photoelectrode in a two-electrode system in an oxidation-reduction reaction using water as an electron donor.
- Non-Patent Document 1 a p-GaInP 2 electrode is used as a reduction reaction photoelectrode, a WO 3 electrode is used as an oxidation reaction photoelectrode, and a tungsten-halogen lamp light is irradiated in a 0.5 M potassium nitrate solution.
- a technique for decomposing water is disclosed.
- Non-Patent Document 2 as a photocatalyst for reduction reaction that exhibits a reduction reaction of carbon dioxide, a powder of a semiconductor catalyst such as TiO 2 is suspended in water and passed through carbon dioxide, such as a xenon lamp or a high-pressure mercury lamp.
- a technique is disclosed in which formaldehyde, formic acid, methane, methanol, and the like are generated when light is irradiated from an artificial light source.
- Patent Document 1 also discloses a method for efficiently producing hydrogen and oxygen from water using light energy by irradiating a zirconium oxide semiconductor in water, and a catalyst for photolysis catalyst of water from water and carbon dioxide. Discloses a technique relating to a method capable of producing carbon monoxide simultaneously with hydrogen and oxygen using light energy in the presence of hydrogen.
- Patent Document 2 a semiconductor electrode such as TiO 2 in a hydroxide solution and a gas diffusion electrode carrying a Pd—Ru alloy catalyst in a hydrogen carbonate solution are short-circuited, and light is irradiated to the semiconductor electrode side.
- a technique for reducing carbon dioxide to formic acid on the gas diffusion electrode side is disclosed.
- Patent Document 3 discloses that in the presence of cuprous oxide, which is a visible light responsive photocatalyst, and triethanolamine, which is an electron donor, light is irradiated with methanol in a reaction in acetonitrile. Discloses a technique for selectively producing formic acid.
- Non-Patent Document 3 discloses that carbon monoxide is 89% by applying a constant current of 50 mA by irradiating light to a p-InP photoelectrode in a methanol solvent in which carbon dioxide is dissolved at a high pressure (40 atm). A technique for generating with a current efficiency of is disclosed.
- Non-Patent Document 4 discloses that formic acid is converted to silver with p-InP with a Faraday efficiency of 29.9% by irradiating a lead-modified p-InP photoelectrode in a methanol solvent in which carbon dioxide is dissolved. A technique is disclosed in which carbon monoxide is generated with a Faraday efficiency of 80.4% by irradiating a photoelectrode with light.
- Patent Document 4 discloses an organic solvent in which a photocatalyst selected from a metal complex having a metal-ligand charge absorption band from the ultraviolet region to the visible region and an electron donor selected from organic amines are dissolved.
- a technique is disclosed in which carbon dioxide is introduced at a high pressure of 0.2 to 7.5 MPa and light is irradiated under the pressure to selectively reduce carbon dioxide to carbon monoxide.
- Non-Patent Document 5 describes a condition in which an electrochemical bias is applied at ⁇ 0.8 V (vs. Ag / AgCl) using a catalyst obtained by electrochemically polymerizing a Ru complex on a carbon or platinum electrode. Discloses a technique for producing formic acid with a Faraday efficiency of 85%.
- Non-Patent Document 6 discloses a technique related to hydrogen generation using Cu 2 ZnSnS 4 (CZTS).
- the reduction of carbon dioxide requires a photoelectrode material with a high energy level in the conduction band, and a visible light responsive photoelectrode with a short band gap.
- the energy level of the valence band is inevitably increased, making it difficult to use water as an electron donor. For this reason, it is considered that a two-electrode reaction cell in which two types of photoelectrodes are combined is effective for efficient use of sunlight over a wide wavelength.
- Non-Patent Document 1 reports a hydrogen / oxygen production reaction by decomposition of water.
- this Non-Patent Document 1 does not describe any reduction reaction of carbon dioxide.
- Carbon dioxide reduction for example, a standard electrode potential of the reaction in which formic acid from carbon dioxide generated for energetically higher than the potential (0V) for generating hydrogen from -0.196V and protons, as p-GaInP 2 electrode
- the surface of a simple semiconductor electrode is likely to cause a low energy hydrogen generation reaction, it is difficult to cause a carbon dioxide reduction reaction, and the selectivity of the reduction reaction is low.
- Non-Patent Document 2 is an example of a photoelectrode for reduction reaction that exhibits a reduction reaction of carbon dioxide.
- This Non-Patent Document 2 discloses the simultaneous generation of formaldehyde, formic acid, methane, methanol and the like.
- Patent Document 1 discloses an example in which carbon monoxide is generated only with hydrogen or simultaneously with hydrogen.
- Patent Document 2 It is a feature of inorganic semiconductor photocatalyst to generate hydrogen by photoirradiation or to simultaneously generate two or more carbon dioxide reduction products, but the product can be obtained with high selectivity when considering industrial use. That is important.
- Patent Document 2 32% of the photocurrent generated by light irradiation to titanium oxide is converted to formic acid, and the selectivity is low.
- Patent Document 3 uses a visible light responsive photocatalyst, but requires an expensive organic electron donor in order to promote an oxidation reaction paired with a reduction reaction of carbon dioxide.
- Non-Patent Document 3 carbon dioxide is reduced using a visible light responsive photoelectrode, but it is necessary to dissolve carbon dioxide at a high pressure in order to increase the reactivity. Also in Non-Patent Document 4, carbon dioxide is reduced using a visible light responsive photoelectrode to produce formic acid and carbon monoxide with high Faraday efficiency, but methanol must be used as a reaction solvent. In addition, a high bias voltage of ⁇ 2.5 V (vs Ag / AgCl) is applied, and the merit of reducing the reaction voltage by using a photoelectrode material is not utilized.
- Patent Document 4 only an example using a rhenium complex is shown, and when a rhenium complex is used, a characteristic that carbon monoxide is easily generated selectively has been reported in academic papers. . It is also known that when a rhenium complex is used, only a light having a relatively short wavelength of 450 nm or less of visible light is used to realize a photocatalytic reduction of carbon dioxide. Moreover, although the patent document 4 also describes the complex using another metal, it is not implement
- the reason why the selectivity of the reaction product on the semiconductor photoelectrode is low is presumed as follows.
- the surface of the semiconductor film or powder is not uniform, and there are many defects and structural steps at the atomic level. Therefore, the local surface energy differs depending on the site on the surface, and as a result, the adsorption performance of carbon dioxide, protons, solvents, gases, and reaction intermediates that are reactants is different. Accordingly, it is considered that various reaction products are generated because processes such as a probability and a speed of passing electrons to these substances are not constant.
- a reduction reaction of carbon dioxide requires a semiconductor photocatalyst with a high conduction band energy level.
- a visible light responsive semiconductor catalyst with a narrow band gap is used, the energy level of the valence band is inevitably required.
- the oxidation reaction of water becomes difficult.
- Non-Patent Document 5 cannot function as a photocatalyst in the first place.
- Patent Document 6 uses CZTS, which is an inexpensive electrode material that does not use a rare element as compared with p-type indium phosphide (p-InP) or the like, but completely describes the reduction reaction of carbon dioxide. Absent. When CZTS is used in an aqueous solution, a hydrogen generation reaction occurs preferentially, making it difficult to selectively reduce carbon dioxide.
- the present invention includes an oxidation reaction electrode that oxidizes water to generate oxygen and a reduction reaction electrode that synthesizes a carbon compound by reducing carbon dioxide, and is configured by electrically connecting them.
- the reduction reaction electrode is a photochemical reaction device that synthesizes a carbon compound by reducing carbon dioxide in a liquid containing water using irradiated light energy.
- the energy level of the conduction band of the oxidation reaction electrode is located at a negative potential from the energy level of the valence band of the reduction reaction electrode.
- the electrode for reduction reaction has a structure in which a semiconductor electrode and a catalyst exhibiting a reducing action of carbon dioxide are joined, and excited electrons generated by irradiating light to the semiconductor electrode move to the catalyst. It is preferable to exhibit the reducing action.
- the reduction reaction electrode has a structure in which a semiconductor electrode and a catalyst exhibiting a reduction action of carbon dioxide are joined by a chemical polymerization method, and carbon dioxide is absorbed in a liquid containing water by using irradiated light energy. It is preferable to reduce and synthesize a carbon compound.
- the oxidation reaction electrode and the reduction reaction electrode are arranged in a two-chamber cell partitioned by a proton exchange membrane, and the oxidation reaction electrode and the reduction reaction electrode are electrically connected, It is preferable that the electrode for reduction reaction synthesizes a carbon compound by reducing carbon dioxide in a liquid containing water by using irradiated light energy.
- the oxidation reaction electrode and the reduction reaction electrode are electrically connected, and the oxidation reaction electrode is a semiconductor electrode, which oxidizes water by using irradiated light energy. It is preferable to synthesize electrons and reduce the carbon dioxide in a liquid containing water using the light energy irradiated to synthesize the carbon compound.
- the catalyst is preferably a metal complex or a polymer thereof.
- the catalyst is a mixture of a first metal complex having an anchor site linked to the semiconductor electrode and a second metal complex having a CO 2 reduction catalyst function that is polymerized with the first metal complex. Is preferred.
- the second metal complex has a pyrrole moiety.
- the oxidation reaction electrode and the reduction reaction electrode are directly connected in a state where no bias voltage is applied, and that water is operated as an electron donor by irradiating both electrodes with light.
- the oxidation reaction electrode and the reduction reaction electrode are connected in a state where a bias power source is applied, and that both electrodes are irradiated with light to operate water as an electron donor.
- the oxidation reaction electrode is preferably composed of titanium oxide.
- the oxidation reaction electrode preferably contains anatase type titanium oxide.
- liquid containing water is preferably water or an aqueous solution containing an electrolyte.
- ion exchange membrane cation exchange membrane / anion exchange membrane
- a three-electrode system configuration having a reference electrode in addition to the oxidation reaction electrode and the reduction reaction electrode.
- Another aspect of the present invention includes a catalyst exhibiting a carbon dioxide reducing action and a semiconductor electrode joined to the catalyst, and excited electrons generated by irradiating the semiconductor electrode with light are applied to the catalyst. It is a composite photoelectrode characterized by exhibiting an action of reducing carbon dioxide by moving.
- the catalyst is preferably a metal complex or a polymer thereof.
- the semiconductor electrode is preferably a sulfide semiconductor or a phosphide semiconductor.
- Another aspect of the present invention is a light energy storage device comprising the composite photoelectrode and an oxidation reaction electrode that oxidizes water to generate oxygen.
- useful carbon compounds can be synthesized by reducing carbon dioxide using light energy.
- FIG. 1 shows a configuration of a photochemical reaction device according to the embodiment.
- a reduction reaction electrode 10 which is a semiconductor electrode and an oxidation reaction electrode 12 which is a counter electrode and which is a semiconductor electrode are electrically connected.
- a bias power source 14 is arranged between the reduction reaction electrode 10 and the oxidation reaction electrode 12, and the reduction reaction electrode 10 is connected to the oxidation reaction electrode 12 with a voltage (0). It is also preferable to arrange the bias power supply 14 so that a negative electrical bias is applied by ⁇ 1.4V).
- the catalyst of the base material 16 is in contact with the reduction reaction electrode 10 in a state where electrons e ⁇ can be exchanged.
- a metal complex ruthenium complex
- the photoexcited electrons e ⁇ generated inside the reduction reaction electrode 10 by light irradiation move to the reaction site of the base material 16 exhibiting the reduction action of carbon dioxide, thereby reducing the carbon dioxide.
- carbon dioxide can be reduced without applying a bias voltage, and useful organic compounds can be synthesized with high efficiency and high reaction product selectivity.
- the oxidation of water can be performed using holes generated by irradiating the electrode 12 for oxidation reaction with light. The generated electrons are efficiently combined with the holes generated in the reduction reaction electrode 10. For this reason, even if there is no bias power supply 14, the reduction reaction of carbon dioxide can proceed using water as an electron donor. The reaction can be more efficiently advanced by arranging the bias power source 14 and applying a bias voltage between both electrodes.
- the two-electrode system in which the reduction reaction electrode 10 and the oxidation reaction electrode 12 are provided separately, it becomes possible to reduce carbon dioxide using water as an electron donor, and the oxidation reaction and water dioxide of water. Since the energy required for the carbon reduction reaction can be divided into two, it is possible to use a visible light responsive semiconductor material having a narrow light wavelength region that can be absorbed.
- the semiconductor used for the reduction reaction electrode 10 has the lowest energy level among the molecular orbitals not occupied by the electrons of the base material, which will be described later, from the value of the lowest energy level of the conduction band.
- the value obtained by subtracting the value is 0.2 eV or less.
- nitride semiconductors such as tantalum oxide, tantalum nitride, nitrogen-doped tantalum oxide, tantalum oxynitride, sulfide semiconductors such as nickel-containing zinc sulfide, copper-containing zinc sulfide, zinc sulfide, and selenide semiconductors such as cadmium selenide, tellurium Compounds, chalcogenite semiconductors including other complex compounds, phosphide semiconductors (phosphorus compounds) such as indium phosphide, gallium phosphide, indium gallium phosphide, arsenides such as iron oxide, silicon carbide, copper oxide, gallium arsenide It can be a semiconductor, rhodium-doped strontium titanate, or the like.
- the semiconductor used for the reduction reaction electrode 10 may be a sulfide semiconductor containing copper, zinc, tin, and sulfur, such as Cu 2 ZnSnS 4 (CZTS) and Cu 2 ZnSn (S, Se) 4 (CZTSSe).
- CZTS Cu 2 ZnSnS 4
- S, Se Cu 2 ZnSn (S, Se) 4
- the tin compound semiconductor suitable as a semiconductor to be used in the reduction reaction for the electrode 10 when expressed as A x B y C z D 4 zinc copper, silver, as B as A, cadmium, as C, germanium, gallium Aluminum, D as sulfur, oxygen, selenium and the like are suitable.
- Composition conditions are 1.4 ⁇ x / y ⁇ 2, 1.4 ⁇ x / z ⁇ 2, 70% or more of A is copper, 90% or more of B is zinc, and 90% of C Are tin and germanium, and 70% or more of D is preferably sulfur and selenium.
- the zinc-doped indium phosphide and the sulfide semiconductor containing copper, zinc, tin, and sulfur (for example, CZTS, CZTSSe, etc.) used in Examples described later are particularly suitable for the reduction reaction electrode 10.
- the zinc-doped indium phosphide one synthesized by, for example, Vapor controlled Czochralski (VCZ) method, LEC method, HB method or the like is used.
- Tantalum nitride and tantalum oxynitride can be produced by heat-treating tantalum oxide in an atmosphere containing ammonia gas.
- Ammonia is preferably diluted with a non-oxidizing gas (argon, nitrogen, etc.).
- a non-oxidizing gas argon, nitrogen, etc.
- the heating temperature is preferably 500 ° C. or higher and 900 ° C. or lower, and more preferably 550 ° C. or higher and 850 ° C. or lower.
- the treatment time is preferably 1 hour or more and 15 hours or less.
- commercially available tantalum oxide or amorphous one obtained by subjecting a tantalum-containing compound solution such as tantalum chloride to a hydrolysis treatment or the like can be used.
- nickel-containing zinc sulfide dissolves nickel-containing hydrate and zinc-containing hydrate, and an aqueous solution in which sodium sulfide hydrate is dissolved is added and stirred, and then centrifuged and redispersed. It can be obtained by drying after removing the supernatant.
- the nickel-containing hydrate can be, for example, nickel (II) nitrate hexahydrate.
- the zinc-containing hydrate can be, for example, zinc (II) nitrate hexahydrate.
- nickel chloride, nickel acetate, nickel perchlorate, nickel sulfate, etc. can be used as the nickel source.
- zinc chloride, zinc acetate, zinc perchlorate, zinc sulfate, etc. can be used as the zinc source.
- copper-containing zinc sulfide dissolves copper-containing hydrate and zinc nitrate hydrate, and then stirs sodium hydrate into it, which is then centrifuged and redispersed to remove the supernatant. And drying it.
- the copper-containing hydrate can be, for example, copper (II) nitrate di ⁇ 5- (2.5) hydrate.
- the zinc-containing hydrate can be, for example, zinc (II) nitrate hexahydrate.
- copper chloride, copper acetate, copper perchlorate, copper sulfate, etc. can be used as the copper source.
- zinc chloride, zinc acetate, zinc perchlorate, zinc sulfate, etc. can be used as the zinc source.
- Base material 16 subtracts the value of the lowest energy level among the molecular orbitals not occupied by the electrons of the base material 16 from the value of the lowest energy level of the semiconductor conduction band of the electrode for reduction reaction 10. The value is 0.2 eV or less.
- a rhenium complex having a carboxybipyridine ligand ((Re (dcbpy) (CO) 3 P (OEt) 3 )), ((Re (dcbpy ) (CO) 3 Cl)), Re (dcbpy) (CO) 3
- a ruthenium (Ru) complex or a polymer thereof used in the examples is preferable, and [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2 shown in FIG. , 2′-bipyridine ⁇ (CO) 2 Cl 2 ] is polymerized as shown in FIG. 3B [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2 ′ It is particularly preferable to form ⁇ bipyridine ⁇ (CO) 2 ] n on the reduction reaction electrode 10. It is also preferable to use [Ru ⁇ 4,4′-di (1-H-1-pyropropyl carbonate) -2,2′-bipyridine] (CO) (CH 3 CN) Cl 2 ].
- the method for synthesizing the complex polymer is not particularly limited as long as it includes a metal complex exhibiting carbon dioxide reduction activity.
- a chemical polymerization method for polymerizing by a chemical reaction (2) an electrolytic polymerization method for polymerizing by an electrochemical reaction, (3) a photochemical polymerization method using light for the above reaction, a photoelectrochemical polymerization method, etc.
- the method for modifying the complex polymer on the electrode for reduction reaction is not particularly limited, and examples thereof include (1) spin coating method, (2) dip coating method, (3) spray method, and (4) dropping method. .
- the reduction reaction electrode 10 and the base material 16 are allowed to coexist so that electrons can be exchanged.
- the base material 16 may be suspended in the electrolytic solution or may be joined.
- the base material 16 is mixed with a solvent.
- This solvent is dropped on the electrode 10 for reduction reaction here, and the base material 16 is made to adhere to the surface.
- a photoelectrode can be obtained by the method of joining the base material 16 on the surface of the electrode 10 for reduction reaction by drying this.
- the solvent can be an organic solvent, and for example, acetonitrile, methanol, ethanol, acetone and the like can be applied.
- the base material 16 is not particularly limited as long as it is a compound that exhibits carbon dioxide reduction activity by utilizing electrons.
- a metal complex a complex of at least one metal selected from Group VII metal and Group VIII metal of the periodic table can be mentioned, for example, ruthenium, rhenium, manganese, iron, copper, osmium, cobalt, rhodium, iridium. And a complex of a ligand such as nickel, palladium, or platinum with a ligand.
- the ligand is not particularly limited, but typical main ligands include nitrogen-containing heterocyclic compounds, oxygen-containing heterocyclic compounds, sulfur-containing heterocyclic compounds and the like.
- typical main ligands include nitrogen-containing heterocyclic compounds, oxygen-containing heterocyclic compounds, sulfur-containing heterocyclic compounds and the like.
- auxiliary ligand Preferably, CO, a halogen, and phosphines can be mentioned.
- solvent molecules such as acetonitrile, DMF, and water, can also be mentioned.
- These auxiliary ligands may be converted during the reaction process.
- These ligands can be used alone or in combination of two or more.
- nitrogen-containing heterocyclic compounds examples include pyridine, bipyridine, phenanthroline, terpyridine, pyrrole, indole, carbazole, imidazole, pyrazole, quinoline, isoquinoline, acridine, pyridazine, pyrimidine, pyrazine, phthalazine, quinazoline, quinoxaline, and the like.
- heterocyclic compound include furan, benzofuran, oxazole, pyran, pyrone, coumarin, and benzopyrone.
- sulfur-containing heterocyclic compound examples include thiophene, thionaphthene, and thiazole. Such ligands can be used alone or in combination of two or more.
- the reduction reaction electrode 10 and the base material 16 are chemically bonded by a linking group.
- the linking group is not particularly limited as long as it is chemically bonded, and examples thereof include a carboxyl group, a phosphoric acid group, a sulfonic acid group, a silanol group, a thiol group, and derivatives thereof.
- the linking group may have a structure in which protons are eliminated or a structure in which a metal and an oxygen atom are coordinated in a state where the linking group is connected to the reduction reaction electrode 10.
- These linking groups may be used alone or in combination of two or more. A plurality of uses may be used.
- the method for connecting the reduction reaction electrode 10 and the substrate 16 is not particularly limited as long as the semiconductor of the reduction reaction electrode 10 and the substrate are chemically bonded.
- a metal complex in which a linking group is introduced into a ligand is adsorbed on a semiconductor
- a ligand into which a linking group is introduced is adsorbed on a semiconductor
- a complex is formed directly.
- a metal complex is bonded to a semiconductor into which a group is introduced.
- the coverage of the substrate 16 is preferably 1% or more and 100% or less with respect to the surface area of the reduction reaction electrode 10.
- the coverage of the base material 16 is less than 1%, the amount of the base material is too small and sufficient carbon dioxide reduction activity is not exhibited.
- Particularly preferred combinations include a linking group such as a phosphate group when the semiconductor is a metal oxide, and a linking group such as a phosphate ester when the semiconductor is a compound semiconductor such as GaP or InP.
- the Ru complex it is preferable to electrochemically deposit the Ru complex on the reduction reaction electrode 10.
- the reduction reaction electrode 10 and the counter electrode are immersed, and the Ru complex can be bonded onto the reduction reaction electrode 10 by electrodeposition.
- a metal complex having an anchor ligand examples include [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine] (CO) 2 Cl 2 )] and [Ru ( ⁇ 4,4′-dicboxylic acid]. -2,2'-bipyridine ⁇ (CO) 2 Cl 2 ) and the like.
- the catalytic performance of the carbon dioxide reduction reaction can be enhanced by polymerizing a metal complex containing a pyrrole ligand and connecting it to the reduction reaction electrode 10.
- the selectivity of the reduction reaction can be increased.
- the oxidation reaction electrode 12 utilizes an electrode that exhibits a photocatalytic function by light irradiation and causes an oxidation reaction of water.
- titanium oxide (TiO 2 ) nitrogen-doped titanium oxide (N—TiO 2 ), rutile type titanium oxide, tungsten oxide (WO 3 ), strontium titanate, tantalum oxynitride (TaON), bismuth vanadate compound, etc. are used. Is done. These are produced by a sputtering method, a hydrolysis method, a direct synthesis method of a polymerization method, a method of fixing powder with a binder, or the like. These are used alone or in a form formed on a conductive substrate. Note that commercially available titanium oxide particles (TiO 2 (P25)) and TiO 2-x obtained by reducing titanium oxide with hydrogen are particularly suitable.
- the reduction reaction electrode 10 and the oxidation reaction electrode 12 are immersed in water in which carbon dioxide is dissolved, and both electrodes 10 and 12 are irradiated with light.
- formic acid is generated from carbon dioxide in the water by the reduction catalytic reaction in the base material 16, and water is oxidized to oxygen gas using the photocatalytic reaction in the oxidation reaction electrode 12.
- useful organic substances such as alcohol, can be synthesized from carbon dioxide by selecting the substrate 16 and causing a catalytic reaction in an appropriate environment.
- the bias voltage operates at a lower bias voltage (0 to 1.4 V) than a two-electrode system using a non-photoelectrode material. It is possible. This is because the reduction reaction electrode 10 and the oxidation reaction electrode 12 utilize light excitation by light energy.
- light energy can be used to convert carbon dioxide into a useful carbon compound, and the light energy can be stored in the carbon compound.
- carbon dioxide can be reduced using water as an electron donor, there is an advantage that the cost of the entire system can be reduced.
- a carbon compound can be synthesized with high reaction product selectivity by using a complex catalyst that exhibits a reducing action of carbon dioxide.
- An ion chromatograph (DIONEX, with ICS-2000 autosampler AS) was used for evaluation of the product accompanying the photoelectrochemical measurement.
- IonPac AS15 was used for the column of this ion chromatograph, KOH eluent was used as the eluent, and an electrical conductivity detector was used as the detector.
- Example 1 In an acetonitrile solution containing about 1 mg of a ruthenium complex [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) 2 Cl 2 ] (FIG. 3A).
- Zinc-doped indium phosphide (p-InP) carrier concentration 4 ⁇ 10 18 to 6 ⁇ 10 18 / cm 3 ) synthesized by the VCZ method as a working electrode, platinum as a counter electrode, and I ⁇ // as a reference electrode using I 3- electrode, with respect to the reference electrode to the argon gas was bubbled for 10 minutes.
- a carbon dioxide reduction reaction was performed using zinc-doped indium phosphide (p-InP-Zn (Ru-polymer)) on which the ruthenium complex polymer was deposited as a working electrode (reduction reaction electrode 10).
- the counter electrode oxidation reaction electrode 12
- oxidation reaction electrode 12 was a rutile single crystal titanium oxide electrode (TiO 2 ⁇ x ) reduced with hydrogen. 8 ml of distilled water was used as the electrolytic solution. After argon gas was bubbled into the solution for about 20 minutes to remove dissolved gas, carbon dioxide gas was bubbled into the solution for about 10 minutes, and then current-voltage measurement was performed in a carbon dioxide gas atmosphere. Finally, current-time measurement was performed in a carbon dioxide gas atmosphere with a bias voltage of ⁇ 0.8 V applied to the reduction reaction electrode 10 and the oxidation reaction electrode 12.
- Example 2 In Example 1, current-time measurement was performed with a bias voltage of ⁇ 0.4 V applied to the reduction reaction electrode 10 and the oxidation reaction electrode 12.
- Example 3 In Example 1, a tungsten oxide electrode (WO 3 ) is used as the oxidation reaction electrode 12, and a cut-off filter with ⁇ > 422 nm is used as the light source, and only the visible light is irradiated. Current-time measurement was performed with a bias voltage of ⁇ 0.8 V applied to the oxidation reaction electrode 12.
- WO 3 tungsten oxide electrode
- Example 1 Current-time measurement was performed in an argon gas atmosphere without bubbling carbon dioxide gas.
- Example 2 Current-time measurement was performed in an argon gas atmosphere without bubbling carbon dioxide gas.
- Example 3 Current-time measurement was performed in a carbon dioxide gas atmosphere using a zinc-doped indium phosphide (p-InP-Zn) wafer (8 mm ⁇ 20 mm) on which no Ru complex polymer was electrodeposited. It was.
- p-InP-Zn zinc-doped indium phosphide
- Example 2 in which current-time measurement was performed with a bias voltage of ⁇ 0.4 V, 4 ⁇ M formic acid was detected in a carbon dioxide gas atmosphere in 20 hours, whereas in an argon gas atmosphere in Comparative Example 2, the measurement was performed in 20 hours. Only 1 ⁇ M formic acid was detected.
- Example 3 in which the counter electrode was changed from a TiO 2-x photoelectrode to a WO 3 photoelectrode and current-time measurement was performed with a bias voltage of ⁇ 0.8 V under irradiation of visible light with ⁇ > 422 nm, in Example 3, 20 19 ⁇ M formic acid was detected over time, suggesting that carbon dioxide was reduced to formic acid even when irradiated with only visible light.
- Example 4 0.25 mg of ruthenium complex [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (CH 3 CN) Cl 2 ] in 0.25 ml of acetonitrile solution After dissolving and mixing 5 ⁇ l of pyrrole solution (molar ratio of pyrrole to ruthenium complex is 1.1%), 5 ⁇ l of 0.2M iron (III) chloride solution (molar ratio of iron chloride to ruthenium complex is 3.1 times) ) Added. The pyrrole solution was prepared by diluting 50 ⁇ l of pyrrole with 1 ml of acetonitrile.
- the iron (III) chloride solution was prepared by dissolving 1.08 g of iron (III) chloride hexahydrate in 20 ml of ethanol. 50 ⁇ l of the above mixed solution was applied onto the p-InP—Zn photoelectrode and dried in an oven at 45 ° C. Such application and drying of the solution were repeated 5 times to prepare a Ru-polymer (CP) / p-InP-Zn photoelectrode. The Ru-polymer (CP) / p-InP-Zn photoelectrode thus produced was used as a working electrode (reduction reaction electrode 10).
- TiO 2 (P25) commercially available titanium oxide particles
- acetylacetone 30 ⁇ l of acetylacetone, 400 ⁇ l of water, and 1 drop of surfactant (Triton X-100) to prepare a paste.
- Triton X-100 1 drop of surfactant (Triton X-100)
- the TiO 2 (P25) photoelectrode thus produced was used as a counter electrode (oxidation reaction electrode 12).
- the Ru-polymer (CP) / p-InP-Zn photoelectrode (reduction reaction electrode 10) and the TiO 2 (P25) photoelectrode (oxidation reaction electrode 12) are separated by a proton exchange membrane (Nafion117). Arranged in each chamber of the chamber cell. Pure water was used as the electrolyte.
- Such a photochemical reaction device was subjected to current-time measurement in a carbon dioxide gas atmosphere while irradiating light without applying a bias voltage to the reduction reaction electrode 10 and the oxidation reaction electrode 12.
- Example 4 when light equivalent to 1.4 SUN was irradiated for 20 hours, a charge of 0.26 C was observed, and 115 ⁇ M formic acid was detected. The ratio of the formic acid generated (Faraday efficiency) to the observed charge amount was calculated to be 35.8%. Compared with Example 1, although the bias voltage was not applied, both the amount of formic acid produced and the Faraday efficiency were greatly improved.
- Example 5" [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor. 2,2'-bipyridine ⁇ (CO) ( MeCN) Cl 2] ( see FIG. 6 (a)) ⁇ FeCl MeCN solution was applied containing 3 ⁇ pyrrol, dried, and used after washed with water . This was the working electrode. In this example, as shown in FIG.
- a three-electrode system was adopted, and a glassy carbon electrode (GC) was used as the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used as the reference electrode.
- a glassy carbon electrode GC
- a silver / silver chloride electrode Ag / AgCl
- the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 6 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor. 2,2′-bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ethyl-2,2′-bipyridine) (CO) 2 Cl 2 ]] (See FIG.
- Example 7 [Ru ⁇ 4,4'-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped gallium phosphide (p-GaP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor 2,2'-bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6 (a)).
- p-GaP-Zn zinc-doped gallium phosphide
- CO 2,2'-bipyridine ⁇
- MeCN 2,2'-bipyridine ⁇
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 8 [Ru ⁇ 4,4'-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped gallium phosphide (p-GaP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor 2,2′-bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ethyl-2,2′-bipyridine) (CO) 2 Cl 2 ]] (See FIG.
- Example 9 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (CO) (CO) (CO) (P-Si) wafer (8 mm ⁇ 20 mm) MeCN) Cl 2 ] (see FIG. 6A).
- a MeCN solution containing FeCl 3 ⁇ pyrrol was applied, dried, and then washed with water before use. This was the working electrode.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 10 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (CO) (CO) (CO) (P-Si) wafer (8 mm ⁇ 20 mm) MeCN) Cl 2 ] (see FIG. 6 (a)) and [Ru ( ⁇ 4,4′-diphosphate ethyl-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)).
- a MeCN solution containing FeCl 3 ⁇ pyrol mixed in 1: 1 was applied, dried, and then washed with water before use. This was the working electrode.
- FIG. 10 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (CO) (CO) (P-Si) wafer (8 mm ⁇ 20 mm) MeCN) Cl 2 ] (see FIG. 6 (a))
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 11 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2 is formed on a sputtered film (20 mm ⁇ 20 mm) of nitrogen-doped tantalum oxide (N—Ta 2 O 5 ) which is a p-type semiconductor.
- '-Bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6 (a)) ⁇ MeCl solution containing FeCl 3 ⁇ pyrrol was applied, dried and then used after washing with water. This was the working electrode.
- FIG. 6 (a) MeCl solution containing FeCl 3 ⁇ pyrrol was applied, dried and then used after washing with water. This was the working electrode.
- FIG. 6 (a) MeCl solution containing FeCl 3 ⁇ pyrrol was applied, dried and then used after washing with water. This was the working electrode.
- FIG. 1 As shown in FIG.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 12 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2 is formed on a sputtered film (20 mm ⁇ 20 mm) of nitrogen-doped tantalum oxide (N—Ta 2 O 5 ) which is a p-type semiconductor.
- '-Bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ethyl-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] ( 6B) was applied with a MeCN solution containing FeCl 3 ⁇ pyrol mixed in 1: 1, dried, washed with water, and then used.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of distilled water was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 13 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor. 2,2'-bipyridine ⁇ (CO) ( MeCN) Cl 2] ( see FIG. 6 (a)) ⁇ FeCl MeCN solution was applied containing 3 ⁇ pyrrol, dried, and used after washed with water . This was the working electrode. In this example, as shown in FIG.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of 10 mM NaHCO 3 aqueous solution was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 14 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor. 2,2'-bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6 (a)). A MeCN solution containing FeCl 3 ⁇ pyrrol was applied, dried and then used after washing with water. . This was the working electrode. In this example, as shown in FIG.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- the electrolytic solution used was 5 ml of 10 mM Na 3 PO 4 aqueous solution. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 15 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate)-] on a wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn: manufactured by Sumitomo Electric), which is a p-type semiconductor. 2,2'-bipyridine ⁇ (CO) (MeCN) Cl 2 ] (see FIG. 6 (a)). A MeCN solution containing FeCl 3 ⁇ pyrrol was applied, dried and then used after washing with water. . This was the working electrode. In this example, as shown in FIG.
- a three-electrode system was adopted, a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of a 10 mM Na 2 SO 4 aqueous solution was used. After bubbling argon gas into the solution for about 20 minutes to remove the dissolved gas, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with light in a carbon dioxide gas atmosphere to measure the reduction / oxidation reaction Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 16 In Example 6, [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine] (CO) 2 Cl 2 )] (see FIG. 6 (b)) was applied in a 1: 4 mixture and the catalytic activity was measured. Went.
- Example 17 In Example 6, [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine] (CO) 2 Cl 2 )] (see FIG. 6 (b)) was mixed and applied at a ratio of 4: 1 to measure the catalytic activity. Went.
- Example 18 In Example 6, [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine] (CO) 2 Cl 2 )] (see FIG. 6 (b)) was mixed and applied at 9: 1 to measure the catalytic activity. Went.
- Example 5 Comparative Example 4 In Example 5, the catalytic activity was measured using only the semiconductor without applying the complex catalyst.
- Example 7 Comparative Example 5 In Example 7, the catalytic activity was measured using only the semiconductor without applying the complex catalyst.
- Example 9 Comparative Example 6 In Example 9, the catalytic activity was measured using only the semiconductor without applying the complex catalyst.
- Example 7 Comparative Example 7 In Example 11, the catalytic activity was measured using only the semiconductor without applying the complex catalyst.
- Example 8 In Example 5, the catalytic electrode was measured by changing the working electrode to a glassy carbon electrode.
- Example 9 [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) The catalyst activity was measured by applying only [Ru ( ⁇ 4,4′-diphosphate ethyl-2,2′-bipyridine] (CO) 2 Cl 2 )] (see FIG. 6 (b)). .
- Example 13 the catalytic activity was measured not in a carbon dioxide gas atmosphere but in an argon gas atmosphere.
- Example 5 0.155 mM formic acid was detected in one hour in a carbon dioxide gas atmosphere, whereas when measurement was performed using only the semiconductor of Comparative Example 4, only 0.01 mM formic acid was detected in three hours. Was not. That is, it was suggested that carbon dioxide was reduced to formic acid in an aqueous solution simply by applying a complex catalyst onto the indium phosphide electrode.
- Example 6 0.197 mM formic acid was detected in 1 hour by combining a complex catalyst having an anchor ligand and a complex catalyst having a pyrrole ligand, and the amount of production increased compared to Example 5. . This is presumably because the use of an anchor ligand can improve the electron transfer rate between the semiconductor and the complex catalyst, thereby improving the reactivity.
- Example 7 only 0.001 mM formic acid is detected in one hour in a carbon dioxide gas atmosphere, and when measurement is performed only with the semiconductor of Comparative Example 5, only 0.001 mM formic acid is detected in one hour. There wasn't.
- Example 8 0.109 mM formic acid was detected in 1 hour by combining a complex catalyst having an anchor ligand and a complex catalyst having a pyrrole ligand, and produced more than in Example 7 and Comparative Example 5. The amount increased. This is also because the use of the anchor ligand can facilitate the electron transfer between the semiconductor and the complex catalyst, which improves the reactivity. Moreover, it was suggested that the reduction reaction of carbon dioxide to formic acid occurs in an aqueous solution only by applying a complex catalyst on the gallium phosphide electrode.
- Example 9 0.006 mM formic acid was detected in one hour in a carbon dioxide gas atmosphere, whereas only 0.002 mM formic acid was detected in one hour when measurement was performed using the semiconductor of Comparative Example 6 alone. Was not. That is, it was suggested that carbon dioxide was reduced to formic acid in an aqueous solution only by applying a complex catalyst on the p-type silicon electrode.
- Example 10 0.018 mM formic acid was detected in 1 hour by combining a complex catalyst having an anchor ligand and a complex catalyst having a pyrrole ligand, and the amount produced was higher than that in Example 9. . This is also because the use of the anchor ligand can improve the electron transfer rate between the semiconductor and the complex catalyst, which improves the reactivity.
- Example 11 0.022 mM formic acid was detected in 1 hour in a carbon dioxide gas atmosphere, whereas in the case where only the semiconductor of Comparative Example 7 was measured, only 0.01 mM formic acid was detected in 1 hour. Was not. That is, it was suggested that carbon dioxide was reduced to formic acid in an aqueous solution only by applying a complex catalyst onto the N—Ta 2 O 5 electrode.
- Example 12 by combining a complex catalyst having an anchor ligand and a complex catalyst having a pyrrole ligand, 0.029 mM formic acid was detected in 1 hour, and the amount produced was higher than that in Example 11. . This is also because the use of the anchor ligand can facilitate the electron transfer between the semiconductor and the complex catalyst, which improves the reactivity.
- a ruthenium complex [Ru (dpeppy) having a 4,4′-diphosphatyl ethyl-2,2′-bipyridine moiety (dpeppy) in zinc-doped gallium phosphide (p-GaP—Zn, manufactured by Sumitomo Electric Industries, Ltd.) bpy) (CO) 2 ] 2+ (FIGS. 7 and 8) was adsorbed by the following method to analyze whether or not the ligand was adsorbed to the semiconductor substrate.
- FIG. 9 shows the results of analyzing this sample by time-of-flight secondary ion mass spectrometry (TOF-SIMS).
- a ruthenium complex [Ru (dpeppy) having a 4,4′-diphosphate ester-2,2′-bipyridine moiety (dpeppy) in zinc-doped indium phosphide (p-InP—Zn, manufactured by Sumitomo Electric) bpy) (CO) 2 ] 2+ (FIGS. 7 and 8) was adsorbed by the following method to analyze whether or not the ligand was adsorbed to the semiconductor substrate.
- FIG. 10 shows the results of analyzing this sample by time-of-flight secondary ion mass spectrometry (TOF-SIMS).
- Example 16 the bias voltage applied to the two electrodes is 0V. The value of the photocurrent in the case of the above was investigated.
- Example 19 A wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP-Zn, manufactured by Sumitomo Electric), which is a p-type semiconductor, is used as the reduction reaction electrode 10, and a commercially available titanium oxide is used as the oxidation reaction electrode 12.
- p-InP-Zn zinc-doped indium phosphide
- TiO 2 (P25) electrode prepared on conductive glass (FTO, manufactured by Asahi Glass) by using a squeegee method using (TiO 2 ) particles (P25, manufactured by Degussa) was used.
- the TiO 2 (P25) electrode contains about 80% anatase titanium oxide.
- an electrochemical analyzer (BAS) was used, and measurement was performed by a two-electrode method using a working electrode and a counter electrode.
- a reduction reaction electrode 10 was used as the working electrode, and an oxidation reaction electrode 12 was used as the counter electrode.
- the two electrodes were arranged in parallel.
- the cell used was a square quartz glass cell, and the electrolyte used was 25 ml of 0.2 M K 2 SO 4 .
- a 300 W xenon lamp (Asahi Spectroscopy, MAX-302) was used as the light source, the applied voltage was 0 V, and all light was applied from the oxidation reaction solution electrode side.
- Comparative Example 11 A wafer (8 mm ⁇ 20 mm) of zinc-doped indium phosphide (p-InP—Zn, manufactured by Sumitomo Electric), which is a p-type semiconductor, is used for the reduction reaction electrode 10, and a rutile type titanium oxide is used for the oxidation reaction electrode 12. A TiO 2-X electrode obtained by reducing a single crystal of the above with hydrogen was used. Except for these, the conditions were the same as in Example 19 above.
- Example 19 by using a TiO 2 (P25) electrode mainly containing anatase-type titanium oxide, a photocurrent of 21 ⁇ A was observed under the condition of an applied voltage of 0V.
- Comparative Example 11 using the TiO 2-X electrode that is rutile titanium oxide, the photocurrent at an applied voltage of 0 V is 4.4 ⁇ A, and the photocurrent is quadrupled by using anatase type titanium oxide. More than that.
- the energy level of the conduction band of anatase-type titanium oxide is located on the negative side of the energy level of the conduction band of rutile-type titanium oxide.
- phosphorous level is higher than when using rutile-type titanium oxide.
- the difference with respect to the energy level of the valence band of indium iodide is large. That is, by using anatase type titanium oxide, the potential gradient generated between the two electrodes is increased, the movement of electrons between the electrodes is promoted, and the photocurrent is increased even when the applied voltage is 0V. Inferred.
- Examples 20 and 21 were confirmed as Examples 20 and 21 by combining the reduction reaction electrode 10 and the oxidation reaction electrode 12.
- an electrochemical analyzer (BAS) was used, and measurement was performed by a two-electrode method using a working electrode and a counter electrode.
- a two-chamber cell partitioned by a proton exchange membrane (Nafion 117, manufactured by DuPont) was used as the cell.
- ion chromatograph DIONEX, ICS-2000, with autosampler AS
- IonPac AS15 was used for the column.
- KOH eluent was used as the eluent, and an electrical conductivity detector was used as the detector.
- the reduction reaction electrode 10 is made of [Ru ⁇ 4,4′-di (1- H-1-pyrrolopropyl carbonate) -2,2′-bipyridine (CO) (MeCN) Cl 2 ] ⁇ FeCl 3 ⁇ pyrol-containing MeCN solution was applied, dried and then used after washing with water .
- a TiO 2 (P25) electrode prepared on conductive glass (FTO, manufactured by Asahi Glass) by a squeegee method using commercially available titanium oxide (TiO 2 ) particles (P25, manufactured by Degussa) is used. did.
- As the electrolytic solution 5 ml of distilled water was used.
- Example 21 The reduction reaction electrode 10 is made of [Ru ⁇ 4,4′-di (1- H-1-pyropropyl carbonate) -2,2′-bipyridine ⁇ (CO) (MeCN) Cl 2 ] and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] Was mixed with 1: 1, and a MeCN solution containing FeCl 3 ⁇ pyrrol was applied, dried, washed with water, and then used.
- TiO 2 ) particle P25, manufactured by Degussa
- FTO conductive glass
- supported was used.
- As the electrolytic solution 5 ml of 10 mM NaHCO 3 aqueous solution was used. After argon gas was bubbled into the solution for about 20 minutes to remove the dissolved gas, carbon dioxide gas was bubbled into the solution for about 10 minutes, and then measurement was performed in a carbon dioxide gas atmosphere. The bias voltage between the two electrodes was 0 V, and the light from a solar simulator equivalent to 1 SUN was irradiated.
- Table 5 shows the results of photoelectrochemical measurements for Examples 20 and 21.
- 0.115 mM formic acid was detected in a carbon dioxide gas atmosphere in 20 hours, and the ratio (EFF) of charge consumed for the production of formic acid to the total amount of charge observed was calculated to be 35.8. %Met.
- 0.190 mM formic acid was detected in 3 hours in a carbon dioxide gas atmosphere, and the ratio (EFF) of charge consumed for the production of formic acid to the total amount of charge observed was calculated as 67.2. %Met.
- the TiO 2 (P25) electrode contains anatase-type titanium oxide, which has a high energy level in the conduction band and an energy difference from the valence band of indium phosphide (p-InP-Zn). Therefore, it is considered that electrons moved efficiently between the two electrodes even under a zero bias condition, and a large photocurrent was generated. Moreover, it is thought that the formic acid produced
- the reduction reaction of carbon dioxide using water as an electron donor is possible by combining the electrode for reduction reaction 10 for reducing carbon dioxide and the photoelectrode for generating oxygen by oxidizing water. Become.
- a photoelectrochemical measurement for Examples 22 to 24 and Comparative Examples 12 to 14 uses an electrochemical analyzer (BAS), and has a configuration as shown in FIG. 7 and uses a working electrode, a counter electrode, and a reference electrode. Measurement was carried out by the method.
- a cylindrical Pyrex (registered trademark) glass cell was used as the cell.
- a 300 W xenon lamp (Asahi Spectroscopy: MAX-302) was used, and only a visible light was irradiated using a cut-off filter having a wavelength of 422 nm.
- IonPacAS15 was used for the column
- KOH eluent was used for the eluent
- an electrical conductivity detector was used for the detector.
- Example 22 As the working electrode, an electrode obtained by modifying a p-type semiconductor gallium-doped Cu 2 ZnSnS 4 (Ga—CZTS) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with a 1: 1 solution of FeCN 3 ⁇ pyrrol in CZTS.
- a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of purified water was used. After removing dissolved gas by bubbling argon gas into the solution for about 20 minutes, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with 70 SUN light in a carbon dioxide gas atmosphere for reduction / oxidation reaction was measured. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 23 As the working electrode, an electrode obtained by modifying a p-type semiconductor Cu 2 ZnSn (S, Se) 4 (CZTSSe) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with 1: 1 a MeCN solution containing FeCl 3 ⁇ pyrol as CZTSSe.
- a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of purified water was used. After removing dissolved gas by bubbling argon gas into the solution for about 20 minutes, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with 70 SUN light in a carbon dioxide gas atmosphere for reduction / oxidation reaction was measured. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 24 As the working electrode, an electrode obtained by modifying a p-type semiconductor Cu 2 ZnSnS 4 (CZTS) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with a 1: 1 solution of FeCN 3 ⁇ pyrrol in CZTS.
- CZTS ruthenium complex polymer
- a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of purified water was used. After removing dissolved gas by bubbling argon gas into the solution for about 20 minutes, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with 70 SUN light in a carbon dioxide gas atmosphere for reduction / oxidation reaction was measured. A potential of ⁇ 0.4 V was applied to the reference electrode.
- “Comparative Example 12” As the working electrode, gallium-doped Cu 2 ZnSnS 4 (Ga—CZTS), which is a p-type semiconductor, was used. A glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode. As the electrolytic solution, 5 ml of purified water was used. After removing dissolved gas by bubbling argon gas into the solution for about 20 minutes, bubbling carbon dioxide gas into the solution for about 10 minutes, and then irradiating with 70 SUN light in a carbon dioxide gas atmosphere for reduction / oxidation reaction was measured. A potential of ⁇ 0.4 V was applied to the reference electrode.
- “Comparative Example 13” As the working electrode, an electrode obtained by modifying a p-type semiconductor gallium-doped Cu 2 ZnSnS 4 (Ga—CZTS) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with a 1: 1 solution of FeCN 3 ⁇ pyrrol in CZTS.
- a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of purified water was used. After the argon gas was bubbled into the solution for about 20 minutes to remove the dissolved gas, the reduction / oxidation reaction was measured by irradiation with 70 SUN light in an argon gas atmosphere. A potential of ⁇ 0.4 V was applied to the reference electrode.
- “Comparative Example 14” As the working electrode, an electrode obtained by modifying a p-type semiconductor gallium-doped Cu 2 ZnSnS 4 (Ga—CZTS) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with a 1: 1 solution of FeCN 3 ⁇ pyrrol in CZTS.
- a glassy carbon electrode was used for the counter electrode, and a silver / silver chloride electrode (Ag / AgCl) was used for the reference electrode.
- As the electrolytic solution 5 ml of purified water was used. After removing dissolved gas by bubbling argon gas into the solution for about 20 minutes, bubbling carbon dioxide gas into the solution for about 10 minutes, and then measuring the reduction / oxidation reaction without irradiating light in a carbon dioxide gas atmosphere Went. A potential of ⁇ 0.4 V was applied to the reference electrode.
- Example 22 when irradiated with light for 3 hours in a carbon dioxide gas atmosphere, 0.246 mM formic acid was detected, and the ratio of the charge consumed for the production of formic acid to the total amount of charge measured was 74.1. %Met.
- Comparative Example 12 when only the semiconductor of Comparative Example 12 was irradiated with light in a carbon dioxide gas atmosphere, only 0.006 mM formic acid was detected in 3 hours.
- Comparative Example 13 when light was irradiated in the argon gas atmosphere of Comparative Example 13, only 0.008 mM formic acid was detected in 3 hours, and formic acid was detected when no light was irradiated in the carbon dioxide gas atmosphere of Comparative Example 14. There wasn't. From the above results, it was suggested that the Ga—CZTS electrode modified with a ruthenium complex polymer selectively photoreduces carbon dioxide to formic acid in an aqueous solution.
- Example 23 when irradiated with light for 3 hours in a carbon dioxide gas atmosphere, 0.382 mM formic acid was detected, and the ratio of the charge consumed for the production of formic acid to the total amount of the measured charge was 71.2. %Met. Even when the CZTSSe electrode was used, the effect of being able to be selectively photoreduced to formic acid was obtained as in the CZTS electrode.
- Example 24 when irradiated with light for 3 hours in a carbon dioxide gas atmosphere, 0.285 mM formic acid was detected, and the ratio of the charge consumed for the production of formic acid to the total amount of charge measured was 81.8. %Met. From the measurement results of the current-voltage characteristics, it is estimated that the energy level at the top end of the valence band of CZTS is at a potential of about 0.2 V with respect to the reference electrode (Ag / AgCl), and the band gap is 1.5 eV. In consideration, the energy level at the lowest end of the conduction band is more negative than the potential ⁇ 0.6 V necessary for reducing carbon dioxide on the ruthenium complex polymer. Therefore, the electrons excited in the conduction band can move to the complex, and it is assumed that the reduction reaction of carbon dioxide has proceeded on the complex. In CZTSSe, it is presumed that the reaction proceeded by the same mechanism.
- IonPacAS15 was used for the column
- KOH eluent was used for the eluent
- an electrical conductivity detector was used for the detector.
- Example 25 As the working electrode, an electrode obtained by modifying a p-type semiconductor Cu 2 ZnSn (S, Se) 4 (CZTSSe) with a ruthenium complex polymer was used. Ruthenium complex polymer [Ru ⁇ 4,4′-di (1-H-1-pyrrolopropyl carbonate) -2,2′-bipyridine] (CO) (MeCN) Cl 2 ] (see FIG. 6A) and [Ru ( ⁇ 4,4′-diphosphate ester-2,2′-bipyridine ⁇ (CO) 2 Cl 2 )] (see FIG. 6 (b)) is mixed with 1: 1 a MeCN solution containing FeCl 3 ⁇ pyrol as CZTSSe.
- titanium oxide (TiO 2 ) particles P25: manufactured by Degussa
- FTO conductive glass
- platinum is supported on the titanium oxide (TiO 2 ) electrode. What was let to use was used.
- As the electrolytic solution 4 ml of 10 mM NaHCO 3 aqueous solution was used in each cell. After the argon gas was bubbled into the solution for about 20 minutes to remove the dissolved gas, carbon dioxide gas was bubbled into the solution for about 10 minutes, and then the reduction / oxidation reaction was measured in a carbon dioxide gas atmosphere. No bias voltage was applied (0 V), and light from a solar simulator equivalent to 1 SUN was irradiated.
- Example 25 0.1 mM formic acid was detected when irradiated with light in a carbon dioxide gas atmosphere for 3 hours, and the ratio of the charge consumed for the production of formic acid to the total amount of charge measured was 51.7. %Met.
- the titanium oxide (TiO 2 ) electrode (P25) contains anatase-type titanium oxide, and the anatase-type titanium oxide has a high energy level in the conduction band and has a large energy difference from the valence band of the CZTSSe electrode. It is considered that even when the bias voltage is not applied (0 V), electrons efficiently move between the two electrodes and a photocurrent is generated.
- Electrode for reduction reaction 12 Electrode for oxidation reaction, 14 Bias power supply, 16 Substrate.
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Abstract
Description
ここで、還元反応用電極10に用いる半導体は、その伝導帯の最下端のエネルギー準位の値から、後に記載される基材の電子によって占有されていない分子軌道のうち最もエネルギーの低い準位の値を引いた値が0.2電子ボルト以下である材料とする。例えば、酸化タンタル、窒化タンタル、窒素ドープ酸化タンタル等の窒化物半導体、酸窒化タンタル、ニッケル含有硫化亜鉛、銅含有硫化亜鉛、硫化亜鉛等の硫化物半導体、セレン化カドミウム等のセレン化物半導体、テルル化合物、その他の複合化合物を含むカルコゲナイト半導体、リン化インジウム、リン化ガリウム、リン化インジウムガリウム等のリン化物半導体(リン化合物)、酸化鉄、炭化ケイ素、銅の酸化物、ガリウム砒素等のヒ化物半導体、ロジウムドープチタン酸ストロンチウム等とすることができる。
基材16は、還元反応用電極10の半導体の伝導帯の最下端のエネルギー準位の値から、基材16の電子によって占有されていない分子軌道のうち最もエネルギーの低い準位の値を引いた値が0.2電子ボルト以下である材料とする。基材16は、金属錯体又はそのポリマーとすることができ、例えば、カルボキシビピリジン配位子を有するレニウム錯体((Re(dcbpy)(CO)3P(OEt)3)),((Re(dcbpy)(CO)3Cl)),Re(dcbpy)(CO)3MeCN,Re(dcbqi)(CO)3MeCNや、ルテニウム(Ru)錯体[Ru(dcbpy)(bpy)(CO)2]2+(bpy=2,2’-bipyridine,dcbpy=4,4’-dicarboxy-2,2’-bipyridine)が利用される。
酸化反応用電極12は、光の照射によって、光触媒機能を発揮し、水の酸化反応を生起するものを利用する。例えば、酸化チタン(TiO2)、窒素ドープ酸化チタン(N-TiO2)、ルチル型酸化チタン、酸化タングステン(WO3)、チタン酸ストロンチウム、酸窒化タンタル(TaON)、バナジン酸ビスマス化合物等が利用される。これらは、スパッタ法、加水分解法、重合法の直接合成法や、粉体をバインダで固定する方法などで作製される。また、これらは単体で、あるいは導電性基板上に形成された様態で使用される。なお、実施例において使用した、市販の酸化チタン粒子(TiO2(P25))や酸化チタンを水素で還元したTiO2-xが特に好適である。
ルテニウム錯体[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)2Cl2](図3(a))を約1mg含むアセトニトリル溶液に、作用極としてVCZ法で合成された亜鉛ドープ-リン化インジウム(p-InP)(キャリア濃度4×1018~6×1018/cm3を、対電極に白金を、参照電極にI-/I3-電極を用いて、アルゴンガスを10分間通気させた。電位を参照極に対して、-1.2V印加して、蛍光灯照射下で1時間電析を行い、作用極表面に、ルテニウム錯体ポリマー[Ru[4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine](CO)2]n(図3(b))を析出させた。
実施例1において、還元反応用電極10、酸化反応用電極12に対して-0.4Vのバイアス電圧を印加した状態で電流-時間測定を行った。
実施例1において、酸化反応用電極12に酸化タングステン電極(WO3)を使用し、光源にはλ>422nmのカットオフフィルターを使用して可視光のみを照射しながら、還元反応用電極10、酸化反応用電極12に対して-0.8Vのバイアス電圧を印加した状態で電流-時間測定を行った。
実施例1において、二酸化炭素ガスをバブリングせずに、アルゴンガス雰囲気下で電流-時間測定を行った。
実施例2において、二酸化炭素ガスをバブリングせずに、アルゴンガス雰囲気下で電流-時間測定を行った。
実施例1において、Ru錯体ポリマーを電析していない亜鉛ドープ-リン化インジウム(p-InP-Zn)のウェハー(8mm×20mm)を用いて、二酸化炭素ガス雰囲気下で電流-時間測定を行った。
表1には、実施例1~3、比較例1~3の条件結果をまとめて示す。
アセトニトリル溶液0.25mlにルテニウム錯体[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine](CO)(CH3CN)Cl2]を0.25mg溶解させ、ピロール溶液5μl(ルテニウム錯体に対するピロールのモル比は1.1%)を混合した後に、0.2M塩化鉄(III)溶液を5μl(ルテニウム錯体に対する塩化鉄のモル比は3.1倍)添加した。ピロール溶液は、ピロール50μlをアセトニトリル1mlで希釈して調製した。塩化鉄(III)溶液は、塩化鉄(III)六水和物1.08gをエタノール20mlに溶解して調製した。上述の混合溶液50μlをp-InP-Zn光電極上に塗布し、45℃のオーブンで乾燥させた。このような溶液の塗布及び乾燥を5回繰り返し、Ru-polymer(CP)/p-InP-Zn光電極を作製した。このように作製したRu-polymer(CP)/p-InP-Zn光電極を作用極(還元反応用電極10)として用いた。
実施例4では、1.4SUN相当の光を20時間照射したところ、0.26Cの電荷が観測され、115μMの蟻酸が検出された。観測された電荷量に対して生成された蟻酸の割合(ファラデー効率)を計算すると35.8%であった。実施例1と比較しても、バイアス電圧を印加していないにも関わらず、蟻酸の生成量及びファラデー効率共に大幅に特性が向上した。
p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極(GC)、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化ガリウム(p-GaP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化ガリウム(p-GaP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体であるシリコン(p-Si)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体であるシリコン(p-Si)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である窒素ドープの酸化タンタル(N-Ta2O5)のスパッタ膜(20mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である窒素ドープの酸化タンタル(N-Ta2O5)のスパッタ膜(20mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、10mMのNaHCO3水溶液5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、10mMのNa3PO4水溶液5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn:住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。これを作用極とした。本実施例では、図7に示すように、三電極方式を採用し、対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、10mMのNa2SO4水溶液5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光照射を行い、還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
実施例6において、[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:4に混合して塗布して、触媒活性測定を行った。
実施例6において、[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を4:1に混合して塗布して、触媒活性測定を行った。
実施例6において、[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を9:1に混合して塗布して、触媒活性測定を行った。
実施例5において、錯体触媒を塗布させずに、半導体のみで触媒活性測定を行った。
実施例7において、錯体触媒を塗布させずに、半導体のみで触媒活性測定を行った。
実施例9において、錯体触媒を塗布させずに、半導体のみで触媒活性測定を行った。
実施例11において、錯体触媒を塗布させずに、半導体のみで触媒活性測定を行った。
実施例5において、作用極をグラッシーカーボン電極に変更して触媒活性測定を行った。
実施例6において、[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)を用いず、[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)のみを塗布して、触媒活性測定を行った。
実施例13において、二酸化炭素ガス雰囲気下ではなく、アルゴンガス雰囲気下で触媒活性測定を行った。
表2及び表3は、上記実施例5~18及び比較例4~10の触媒活性測定結果を示す。
還元反応用電極10にはp型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn,住友電工製)のウェハー(8mm×20mm)を用い、酸化反応用電極12には市販の酸化チタン(TiO2)粒子(P25,デグサ製)を用いてスキージ法で導電性ガラス(FTO,旭硝子製)上に作成したTiO2(P25)電極を使用した。TiO2(P25)電極は、約80%のアナタース型酸化チタンを含む。
還元反応用電極10にはp型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn,住友電工製)のウェハー(8mm×20mm)を用い、酸化反応用電極12にはルチル型酸化チタンの単結晶を水素で還元処理したTiO2-X電極を使用した。これら以外では、上記実施例19と同じ条件とした。
表4に、実施例19及び比較例11に対して光電気化学測定を行った結果を示す。実施例19では、アナタース型酸化チタンを主に含むTiO2(P25)電極を用いることで、印加電圧0Vの条件において21μAの光電流が観測された。これに対して、ルチル型酸化チタンであるTiO2-X電極を使用した比較例11では、印加電圧0Vにおける光電流は4.4μAであり、アナタース型酸化チタンを用いることで光電流は4倍以上に増加した。
還元反応用電極10には、p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn,住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2]・FeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。酸化反応用電極12には、市販の酸化チタン(TiO2)粒子(P25,デグサ製)を用いてスキージ法で導電性ガラス(FTO,旭硝子製)上に作成したTiO2(P25)電極を使用した。電解液は、蒸留水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で測定を行った。2つの電極間のバイアス電圧は0Vとし、1.4SUN相当のキセノン光を照射した。
還元反応用電極10には、p型半導体である亜鉛ドープのリン化インジウム(p-InP-Zn,住友電工製)のウェハー(8mm×20mm)に[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2]及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)]を1:1に混合したFeCl3・pyrrolを含むMeCN溶液を塗布し、乾燥させた後、水で洗浄してから用いた。酸化反応用電極12には、市販の酸化チタン(TiO2)粒子(P25,デグサ製)を用いてスキージ法で導電性ガラス(FTO,旭硝子製)上に作成したTiO2(P25)電極に白金を担持したものを使用した。電解液は、10mMのNaHCO3水溶液5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で測定を行った。2つの電極間のバイアス電圧は0Vとし、1SUN相当のソーラーシミュレータの光を照射した。
表5は、実施例20及び21に対する光電気化学測定の結果を示す。実施例20では、二酸化炭素ガス雰囲気において20時間で0.115mMのギ酸が検出され、観測された電荷の総量に対してギ酸の生成に消費された電荷の割合(EFF)を算出すると35.8%であった。実施例21では、二酸化炭素ガス雰囲気において3時間で0.190mMのギ酸が検出され、観測された電荷の総量に対してギ酸の生成に消費された電荷の割合(EFF)を算出すると67.2%であった。
作用極には、p型半導体であるガリウムドープCu2ZnSnS4(Ga-CZTS)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTS基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で70SUNの光を照射して還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
作用極には、p型半導体であるCu2ZnSn(S,Se)4(CZTSSe)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTSSe基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で70SUNの光を照射して還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
作用極には、p型半導体であるCu2ZnSnS4(CZTS)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTS基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で70SUNの光を照射して還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
作用極には、p型半導体であるガリウムドープCu2ZnSnS4(Ga-CZTS)を用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で70SUNの光を照射して還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
作用極には、p型半導体であるガリウムドープCu2ZnSnS4(Ga-CZTS)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTS基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、アルゴンガス雰囲気下で70SUNの光を照射して還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
作用極には、p型半導体であるガリウムドープCu2ZnSnS4(Ga-CZTS)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTS基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、グラッシーカーボン電極、参照極には銀/塩化銀電極(Ag/AgCl)を使用した。電解液は、精製水5mlを使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で光を照射せず還元・酸化反応の測定を行った。電位は、参照極に対して-0.4V印加した。
表6は、実施例22~24及び比較例12~14に対する光電気化学測定の結果を示す。
作用極には、p型半導体であるCu2ZnSn(S,Se)4(CZTSSe)をルテニウム錯体ポリマーで修飾した電極を用いた。ルテニウム錯体ポリマー[Ru{4,4’-di(1-H-1-pyrrolypropyl carbonate)-2,2’-bipyridine}(CO)(MeCN)Cl2](図6(a)参照)及び[Ru({4,4’-diphosphate ethyl-2,2’-bipyridine}(CO)2Cl2)](図6(b)参照)を1:1に混合したFeCl3・pyrrolを含むMeCN溶液をCZTSSe基板上に塗布し、乾燥させた後、水で洗浄してから用いた。対極には、酸化チタン(TiO2)粒子(P25:デグサ製)を用いて、スキージ法で導電性ガラス(FTO:旭硝子製)上に塗布し、さらに酸化チタン(TiO2)電極に白金を担持させたものを使用した。電解液は、10mMのNaHCO3水溶液を各セルに4mlずつ使用した。20分ほどアルゴンガスを溶液中にバブリングして溶存ガスを除去した後、10分ほど二酸化炭素ガスを溶液中にバブリングしてから二酸化炭素ガス雰囲気下で還元・酸化反応の測定を行った。バイアス電圧は印加せず(0V)、1SUN相当のソーラーシミュレータの光を照射した。
表7は、実施例25及び比較例12~14に対する光電気化学測定の結果を示す。
Claims (21)
- 水を酸化して酸素を発生する酸化反応用電極と、
二酸化炭素を還元して炭素化合物を合成する還元反応用電極と、
を含み、これらを電気的に接続して構成され、
前記還元反応用電極は、照射される光エネルギーを利用して水を含む液中で二酸化炭素を還元し、炭素化合物を合成することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極の伝導帯のエネルギー準位は、前記還元反応用電極の価電子帯のエネルギー準位より負側の電位に位置することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記還元反応用電極が、半導体電極と二酸化炭素の還元作用を呈する触媒が接合した構造を有し、前記半導体電極に光照射して生じた励起電子が触媒に移動することにより、二酸化炭素の還元作用を呈することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記還元反応用電極は、化学重合法によって半導体電極と二酸化炭素の還元作用を呈する触媒が接合した構造を有し、照射される光エネルギーを利用して水を含む液中で二酸化炭素を還元し、炭素化合物を合成することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
プロトン交換膜で仕切られた二室に前記酸化反応用電極及び前記還元反応用電極を配置し、前記酸化反応用電極及び前記還元反応用電極を電気的に接続して構成され、
前記還元反応用電極は、照射される光エネルギーを利用して水を含む液中で二酸化炭素を還元し、炭素化合物を合成することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極と前記還元反応用電極とを電気的に接続して構成され、
前記酸化反応用電極は、半導体電極であり、照射される光エネルギーを利用して水を酸化して電子を奪い、
前記還元反応用電極は、照射される光エネルギーを利用して水を含む液中で二酸化炭素を還元し、炭素化合物を合成することを特徴とする光化学反応デバイス。 - 請求項3に記載の光化学反応デバイスであって、
前記触媒が、金属錯体又はそのポリマーである光化学反応デバイス。 - 請求項7に記載の光化学反応デバイスであって、
前記触媒は、前記半導体電極と連結するアンカー部位を有する第1金属錯体と、前記第1金属錯体と重合する触媒機能を有する第2金属錯体と、を混合したものであることを特徴とする光化学反応デバイス。 - 請求項8に記載の光化学反応デバイスであって、
前記第2金属錯体は、ピロール部位を有することを特徴とする光化学反応デバイス。 - 請求項8に記載の光化学反応デバイスであって、
前記第1金属錯体と前記第2金属錯体との化学重合膜を前記半導体電極表面に形成することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極と前記還元反応用電極とをバイアス電圧を印加されない状態で直結すると共に、両電極に光を照射することで、水を電子供与剤として動作することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極と前記還元反応用電極とをバイアス電源を印加した状態で接続すると共に、両電極に光を照射することで、水を電子供与剤として動作することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極は、酸化チタンで構成されることを特徴とする光化学反応デバイス。 - 請求項13に記載の光化学反応デバイスであって、
前記酸化反応用電極は、アナタース型酸化チタンを含むことを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記水を含む液は、水、または電解質を含む水溶液であることを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極と前記還元反応用電極との間をイオン交換膜で分離することを特徴とする光化学反応デバイス。 - 請求項1に記載の光化学反応デバイスであって、
前記酸化反応用電極と前記還元反応用電極に加えて参照電極を有する三電極方式の構成を有することを特徴とする光化学反応デバイス。 - 二酸化炭素の還元作用を呈する触媒と、前記触媒と接合された半導体電極と、を備え、
前記半導体電極に光照射することにより生じた励起電子が前記触媒に移動することにより二酸化炭素の還元作用を呈することを特徴とする複合光電極。 - 請求項18に記載の複合光電極であって、
前記触媒は、金属錯体又はそのポリマーであることを特徴とする複合光電極。 - 請求項18に記載の複合光電極であって、
前記半導体電極は、硫化物半導体又はリン化物半導体であることを特徴とする複合光電極。 - 請求項18に記載の複合光電極と、
水を酸化して酸素を発生する酸化反応用電極と、
を接続して構成されることを特徴とする光エネルギー貯蔵デバイス。
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