WO2011145828A2 - 언더-필용 댐을 포함하는 인쇄 회로 기판 및 이의 제조 방법 - Google Patents
언더-필용 댐을 포함하는 인쇄 회로 기판 및 이의 제조 방법 Download PDFInfo
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- WO2011145828A2 WO2011145828A2 PCT/KR2011/003466 KR2011003466W WO2011145828A2 WO 2011145828 A2 WO2011145828 A2 WO 2011145828A2 KR 2011003466 W KR2011003466 W KR 2011003466W WO 2011145828 A2 WO2011145828 A2 WO 2011145828A2
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Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3452—Solder masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/09909—Special local insulating pattern, e.g. as dam around component
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/013—Manufacture or treatment of die-attach connectors
- H10W72/01308—Manufacture or treatment of die-attach connectors using permanent auxiliary members, e.g. using alignment marks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07302—Connecting or disconnecting of die-attach connectors using an auxiliary member
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- Printed circuit board including under-fill dam and method for manufacturing same
- the present invention relates to a printed circuit board including an under-fill dam and a manufacturing method thereof, and more particularly to a printed circuit board including an under-fill dam using a dry film type solder resist. .
- the IC mounting method is a direct IC such as surface mount.
- substrate and packaging using a liquid resin is mainly used (under-fill process).
- This underfill process is a method for solving the thermal mechanical fatigue problem. Specifically, the inorganic particles are laminated to a polymer material having excellent adhesion such as epoxy resin to have a value close to the thermal expansion coefficient of the solder, and then the chip and the printed circuit. It means the process of filling in the gap between the substrates : The polymer composite material in which the inorganic particles are used at this time is called under-fill.
- the underfill material generally known is in liquid form, there is a problem that the underfill with high flowability protrudes into an unwanted portion, causing unnecessary contamination or product volume, or making high density mounting difficult.
- a method of forming a dam called a dam around the device has been used.
- Previously known dams are mainly formed by a method using a flaky material or a liquid solder resist (for example, Japanese Patent Application Laid-Open No. 1996-325476, etc.) formed by punching, but conventional dam formation by liquid solder resist The method has a large thickness variation to meet the high-density mounting of the IC, There is a problem that the adhesive (liquid encapsulant) leaks, and the dam cannot be formed uniformly when the thickness of the dam becomes minute.
- a liquid solder resist for example, Japanese Patent Application Laid-Open No. 1996-325476, etc.
- the present invention is to provide a printed circuit board comprising an under-fill dam having excellent mechanical properties and having a fine and uniform thickness. Moreover, this invention is providing the manufacturing method of the said printed circuit board.
- the present invention includes an under-fill dam formed along an outer edge of a substrate, wherein the under-fill dam comprises: an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Thermosetting binder resins; And it provides a printed circuit board comprising a dry film solder resist comprising a dried or cured product of the photosensitive resin composition comprising a pigment.
- the under-fill dam comprises: an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Thermosetting binder resins; And it provides a printed circuit board comprising a dry film solder resist comprising a dried or cured product of the photosensitive resin composition comprising a pigment.
- the present invention also provides an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Photoinitiators; Thermosetting binder resins; Stacking a dry film comprising a dried or cured product of the photosensitive resin composition comprising an organic solvent and a pigment on a substrate; Exposing a dry film on an outer edge portion of the substrate; And cleaning the exposed dry film.
- the under-fill dam formed along the outer edge of the substrate, the under-fill dam, acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Thermosetting binder resins; And a dry film solder resist comprising a dried or cured product of the photosensitive resin composition comprising a pigment.
- an under-fill dam having a very thin and uniform thickness can be formed.
- the under-fill dam exhibits excellent mechanical properties, it is possible to achieve a certain level of height and strength even with a thin thickness, thereby preventing the leakage of the under-fill material injected or layered on the printed circuit board.
- the under-fill dam which is formed at the outer edge of the printed circuit board, refers to a structure or a portion of the structure that prevents the leakage of material injected between the substrate and the semiconductor chip in the under-fill process.
- the printed circuit board may include a substrate, and the under-fill dam may be formed along an outer edge of the substrate.
- the printed circuit board may include an electrode pad formed on the substrate; A solder bump formed on the electrode pad; And a semiconductor chip flip-chip coupled through the solder bumps. Details of the electrode pad, the solder bumps, and the semiconductor chip are not particularly limited, and a configuration commonly known to be applicable to a printed circuit board may be applied.
- the under-fill dam is for preventing the leakage of the under-fill material filled between the substrate and the semiconductor chip, and is specifically positioned between the outer edge of the substrate and the outer edge of the semiconductor chip. It serves to prevent the under-fill material from spilling out of the substrate.
- the under-fill dam may have a height greater than or equal to the distance between the substrate and the semiconductor chip, for example, the under-fill dam formed on the substrate
- the semiconductor chip may be formed to have the same height as the outermost surface of the semiconductor chip (the surface farthest from the substrate).
- the under-fill dam may be a variety of colors depending on the color of the pigment or other materials used, for example, may be white, yellow, green, black or red.
- the detection power is superior to other colors in AOI (Automated Optical Inspection) equipment, which is an optical device, compared to other colors because of the property of reflecting light.
- AOI Automatic Optical Inspection
- the under-fill dam may have a different color from the substrate, a solder resist that may be selectively formed on the substrate, or another structure in the printed circuit board. In this way, as the under-fill dam has a different color from the substrate or other solder resist, it is easy to detect and determine the appearance defect.
- the under-fill dam is formed using a dry film solder resist prepared from a photosensitive resin composition of a specific component, the under-fill dam may have a thickness and uniformity which are not easy to implement by a previously known method. Specifically, the under-fill dam is 10 to 20 ⁇ , preferably 10 to
- It can have a thickness of 15 ⁇ and the thickness error (difference between the mean value and the maximum / minimum value) can be within 3 / t.
- the dry film soldering resist manufactured can exhibit the outstanding developability, especially alkali developability, and can easily form a dam with a fine pattern formation or a thin thickness.
- the cured product of the photosensitive resin composition is a photocured product of the acid-modified oligomer and photopolymerizable monomer; Thermosetting of the acid-modified oligomer and thermosetting binder resin; And pigments.
- the non-exposed part was developed with an alkaline developer, and the remaining part was thermally cured.
- a portion of the acid-modified oligomer (eg, carboxyl group (-COOH), etc.) may react to form a crosslinked structure. Accordingly, in the dry film solder resist obtained by using the photosensitive resin composition, each component can form a network structure by crosslinking in the thermosetting or photocuring process, thereby achieving a higher degree of crosslinking. Accordingly, the under-fill formed using the dry film solder resist may have excellent dimensional stability, heat resistance, strength or other mechanical properties.
- the photosensitive resin composition may include an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Thermosetting binder resins; And a pigment, and may further include a photoinitiator and an organic solvent.
- the photosensitive resin composition may optionally further include additives such as a thermosetting binder resin curing agent, a thermosetting binder catalyst, a filler, a leveling agent, and the like.
- additives such as a thermosetting binder resin curing agent, a thermosetting binder catalyst, a filler, a leveling agent, and the like.
- the photosensitive resin composition includes a carboxyl group (-COOH) and an acid-modified oligomer having a photocurable functional group.
- acid-modified oligomers can form crosslinks with other components of the resin composition, such as photopolymerizable monomers and / or thermosetting binder resins, by photocuring, and make the resin compositions, including carboxyl groups, have alkali developability. .
- Such acid-modified oligomers are oligomers having a carboxyl group and a photocurable functional group, for example, a curable functional group having an acrylate group or an unsaturated double bond in the molecule, and all components previously known to be usable in the photocurable resin composition are different.
- the main chain of the acid-modified ligomer may be a novolac epoxy or polyurethane, and may be used as the acid-modified oligomer having a carboxyl group and an acrylate group introduced into the main chain.
- the photocurable functional group may preferably be an acrylate group, wherein the acid denaturation
- An oligomer can be obtained as an oligomer form by copolymerizing the polymerizable monomer which has a carboxyl group, and the monomer containing an acrylate type compound etc. More specifically, specific examples of the acid-modified oligomer usable in the resin composition include the following components.
- ethylenically unsaturated groups such as vinyl groups, allyl groups, (meth) acryloyl groups, epoxy groups, acid chlorides, and the like, as part of the copolymer of the unsaturated carboxylic acid (a) and the compound (b) having a unsaturated double bond
- Carboxyl group-containing photosensitive resin obtained by reacting the compound which has a semi-asymmetric group of, for example, glycidyl (meth) acrylate and adding an ethylenically unsaturated group as a pendant;
- Carboxyl group-containing photosensitive resin obtained by reacting unsaturated carboxylic acid (a) and reacting saturated or unsaturated polybasic anhydride (d), such as phthalic anhydride, tetrahydrophthalic anhydride, and nuxahydrophthalic anhydride, with the produced
- diisocyanates (j) such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates, and aromatic diisocyanates; carboxyl group-containing dialcohol compounds (k) such as dimethylolpropionic acid and dimethylolbutanoic acid, and polycarboxes; Diol compounds such as carbonate polyols, polyether polyols, polyester polys, polyolefin polyols, acrylic polyols, bisphenol A alkylene oxide adducts, diols, phenolic hydroxyl groups and compounds having alcoholic hydroxyl groups ( carboxyl group-containing urethane resin obtained by addition reaction of m);
- diisocyanate (j) bisphenol A type epoxy resin, hydrogenated bisphenol A type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bixylenol type epoxy resin, Obtained by the polyaddition reaction of the (meth) acrylate of bifunctional epoxy resins, such as a biphenol type epoxy resin, or its partial acid anhydride modified substance (II), a carboxyl group-containing dialcohol compound (k), and a diol compound (m) Photosensitive carboxyl group-containing urethane resins;
- One isocyanate group or one or more isocyanate groups in a molecule such as an equimolar semi-flour of isophorone diisocyanate and pentaerythritol triacrylate during the synthesis of the resin (7) or (8).
- Carboxyl group-containing urethane resin which added the compound which has a (meth) acryloyl group, and was terminal (meth) acrylated;
- Carboxyl group-containing photosensitive resin obtained by introducing an unsaturated double bond into the reaction product of a bisepoxy compound and bisphenols, and then reacting saturated or unsaturated polybasic anhydride (d);
- Novolak-type phenol resins alkylene oxides such as ethylene oxide, propylene oxide, butylene oxide, trimethylene oxide, tetrahydrofuran, tetrahydropyran and / or ethylene carbonate, propylene carbon Saturated or unsaturated polybasic acid in the reaction product obtained by reacting unsaturated monocarboxylic acid (h) with reaction product with cyclic carbonates, such as carbonate, butylene carbonate, and 2,3-carbonate propyl methacrylate Carboxyl group-containing photosensitive resin obtained by reacting anhydride (d);
- the isocyanate group-containing compound used for the resin synthesis is a diisocyanate containing no benzene ring
- the polyfunctional and bifunctional epoxy resins used for the synthesis of the resins are linear compounds having bisphenol A skeleton, bisphenol F skeleton, biphenyl skeleton or bixylenol skeleton, or hydrogenated compounds thereof, the flexibility of DFSR, etc.
- the acid-modified oligomer components usable preferably can be obtained.
- the modified product of the resins of the above (7) to (10) is preferable for the bending including the urethane bond in the main chain.
- the photosensitive resin composition comprises an acid-modified oligomer, 10 to 80 parts by weight 0 /., Preferably 15 to 75 parts by weight 0/0, more preferably from 25 to 65% by weight It may include. If the content of the acid-modified oligomer is too small, developability is lowered, the strength of the film is lowered, if too large, the composition is excessively developed
- the acid value of the acid-modified oligomer may be 40 to 120 mgKOH / g. If the acid value of the acid-modified oligomer is less than 40 mgKOH / g, alkali development may not be easy. If the acid value is more than 120 mgKOH / g, the exposed portion may be dissolved by a developer, so that the line becomes thinner than necessary. In some cases, it is not preferable because it dissolves and peels off with a developer without distinguishing between the exposed portion and the unexposed portion, which makes it difficult to form a normal resist pattern. Photopolymerizable monomer
- the photosensitive resin composition may include a photopolymerizable monomer.
- a photopolymerizable monomer By including such a photopolymerizable monomer, it is possible to form a constant cured product or a crosslinked structure during light irradiation.
- Such a photopolymerizable monomer may not only impart photocurability to the composition, but may also serve to adjust the viscosity to be suitable for various coating methods or to impart proper solubility in aqueous alkali solution.
- photopolymerizable monomers include 2-hydroxyethyl acrylate, 2-hydroxypropyl acrylate, pentaerythritol triacrylate, or dipentaerythritol pentaacrylate ⁇ :
- Water-soluble acrylate compounds such as polyethylene glycol diacrylate and polypropylene glycol diacrylate;
- Polyfunctional polyester acrylate compounds of polyhydric alcohols such as trimethylolpropane triacrylate, pentaerythritol tetraacrylate or dipentaerythrate;
- Polyfunctional or monofunctional polyurethane acrylate which is an isocyanate modified product of the hydroxy group-containing acrylate compound;
- Bisphenol A diglycidyl ether, hydrogenated bisphenol Epoxy acrylate compounds which are (meth) acrylic acid adducts of A diglycidyl ether or phenol novolac epoxy resins;
- the polyfunctional (meth) acrylate type compound which has two or more (meth) acryloyl groups in 1 molecule is preferable, Pentaerythritol triacrylate- trimethylol propane triacrylate, and dipentaerythrite is especially preferable. Hexaacrylate, caprolactone modified ditrimethylol propane tetraacrylate, etc. are preferable. Moreover, DPEA-12 etc. of Nippon Chemical Co., Ltd. can be used as what is marketed.
- the photosensitive resin composition may include 1 to 30% by weight of the photopolymerizable monomer described above. When the content of the photopolymerizable monomer is less than 1 weight 0 /., The photocuring may not be divided. If the content exceeds 30 weight 0 /., The film drying property or the physical properties of the film may be reduced. Photoinitiator
- the photosensitive resin composition may include a photoinitiator.
- photoinitiators serve to initiate radical photocuring, for example, in the exposed portion of the resin composition.
- benzoin such as benzoin, benzoin methyl ether, and benzoin ethyl ether, and its alkyl ether
- Acetophenones such as acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 1,1'dichloroacetophenone, and 4- (lt-butyldioxy-1-methylethyl) acetophenone
- Anthraquinones such as 2-methylanthraquinone, 2-amyl anthraquinone, 2-t-butyl anthraquinone, and 1-chloroanthraquinone
- Thioxanthones such as 2, 4- dimethyl thioxanthone, 2, 4- diisopropyl thioxanthone, and 2-chloro thioxanthone
- Ketals such as acetophenone dimethyl ketal and benzyl dimethyl
- Irugacure registered trademark
- acyl phosphine oxides such as Rucillin (trademark) TPO by BASF Corporation and Irgacure 819 by Chivas Specialty Chemical Co., Ltd. can be mentioned as a preferable photoinitiator.
- oxime ester is mentioned as a preferable photoinitiator.
- Specific examples of oxime esters include 2- (acetyloxyiminomethyl) thioxanthene-9-one, (1,2-octanedione, 1- [4- (phenylthio) phenyl]-, 2- (0-benzoyloxime ), And (ethanone, 1- [9-ethyl-6- (2-methylbenzoyl) -9H-carbazol-3-yl]-, 1- (7-acetyloxime)).
- the photosensitive resin composition may include 0.1 to 10% by weight of the photoinitiator, preferably 1 to 5% by weight. When the content of the photoinitiator is too small, the photopolymerization reaction may not occur. If the content is too large, the resolution of the resin composition may be lowered or the reliability of the dry film produced may not be improved.
- the photosensitive resin composition may also be selected from thermosetting functional groups such as epoxy groups, oxetanyl groups, cyclic ether groups and cyclic thio ether groups. It may include a thermosetting binder resin having at least one functional group. Such thermosetting binders may crosslink with acid-modified oligomers and / or photopolymerizable monomers by thermosetting to secure the heat resistance or mechanical properties of a dry film solder resist or an under-fill dam.
- thermosetting functional groups such as epoxy groups, oxetanyl groups, cyclic ether groups and cyclic thio ether groups.
- It may include a thermosetting binder resin having at least one functional group.
- Such thermosetting binders may crosslink with acid-modified oligomers and / or photopolymerizable monomers by thermosetting to secure the heat resistance or mechanical properties of a dry film solder resist or an under-fill dam.
- the thermosetting binder resin may have a softening point of about 70 to 100 ° C, thereby reducing the unevenness during lamination. Low softening points increase the tackiness of the DFSR and high flow rates can deteriorate.
- a resin having two or more cyclic ether groups and / or cyclic thioether groups hereinafter referred to as cyclic (thio) ether groups
- a bifunctional epoxy resin may be used.
- Other diisocyanates or their bifunctional block isocyanates can also be used.
- thermosetting binder having two or more cyclic (thio) ether groups in the molecule may be a compound having a 3, 4 or 5 membered cyclic ether group, or a cyclic thioether group either or two or more groups of two or more cyclic thioether groups.
- the thermosetting binder may be a polyfunctional epoxy compound having at least two or more epoxy groups in a molecule, a polyfunctional oxetane compound having at least two or more oxetanyl groups in molecular weight, or episulf having two or more thioether groups in molecular weight. Feed resin and the like.
- the said polyfunctional epoxy compound it is bisphenol, for example
- a type epoxy resin hydrogenated bisphenol A type epoxy resin, brominated bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, novolak type epoxy resin, phenol novolak type epoxy resin, cresol novolac type epoxy resin Resin, N-glycidyl type epoxy resin, bisphenol A novolak type epoxy resin, bixylenol type epoxy resin, biphenol type epoxy resin, chelate type epoxy resin, glyoxal type epoxy resin, amino group containing epoxy resin, rubber modified epoxy Resins, dicyclopentadiene phenolic epoxy resins, diglycidyl phthalate resins, heterocyclic epoxy resins, tetraglycidyl xylenoylethane resins, silicone-modified epoxy resins, epsilon -caprolactone-modified epoxy resins, and the like.
- those in which atoms such as phosphorus are introduced into the structure may be used. have.
- thermosetting these epoxy resins the adhesiveness of a cured film, the solder heat resistance, and the electroless-plating resistance round improve the characteristic.
- polyfunctional oxetane compound examples include bis [(3-methyl-3-oxetanylmethoxy) methyl] ether, bis [(3-ethyl-3-oxoxtanylmethoxy) methyl] ether, 1,4-bis [( 3-methyl-3-oxetanyl -dihydroxy-20) methyl] benzene, 1, 4-bis-ethyl-3-oxetanyl meteuk City) methyl] benzene, (3-methyl-3-oxetanyl) methyl acrylate, ( 3-ethyl-3-oxetanyl) methylacrylate, (3-methyl-3-oxetanyl) methylmethacrylate, (3-ethyl-3-oxetanyl) methylmethacrylate or oligomers thereof
- oxetane alcohol and novolak resin poly (P-hydroxy styrene
- YDCN-500-80P etc. of Kukdo Chemical Co., Ltd. can be used.
- the photosensitive resin composition may include 1 to 30% by weight 0 /. Of the thermosetting binder resin. When the content of the thermosetting binder resin is less than 1% by weight, the mechanical properties of the dry film are lowered, and when it exceeds 30% by weight 0 /. Organic solvent
- the photosensitive resin composition may be commonly used one or more organic solvents to dissolve each component or impart an appropriate viscosity.
- organic solvents include ketones such as methyl ethyl ketone and cyclonucleanone; Aromatic hydrocarbons such as toluene, xylene and tetramethylbenzene; Ethylene glycol monoethyl ether, ethylene glycol monomethyl ether, Ethylene glycol monobutyl ether, diethylene glycol monoethyl ether, diethylene glycol monomethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, dipropylene glycol diethyl ether, triethylene glycol mono Glycol ethers such as ethyl ether (cellosolve); Ethyl acetate, butyl acetate, ethylene glycol monoethyl ether acetate,
- Acetate esters such as dipropylene glycol monomethyl ether acetate; Alcohols such as ethanol, propanol, ethylene glycol, propylene glycol and carbyl; Aliphatic hydrocarbons such as octane and decane; Petroleum solvents such as petroleum ether, petroleum naphtha, hydrogenated petroleum naphtha and solvent naphtha; Amides such as dimethylacetamide and dimethylformamide (DMF). These solvents can be used alone or as a mixture of two or more thereof.
- the photosensitive resin composition may include about 5 to 50 wt% of the organic solvent.
- the viscosity of the composition may be too large to reduce the coating property, and when the content is too large, the drying may not be good, resulting in deterioration or stickiness of the dry film solder resist sheet. .
- pigment white 6 phosphorus titanium oxide may be used as a pigment.
- Titanium oxide used as a white pigment is of rutile type and anatase type. In the case of the anatase type, the whiteness is superior to the rutile type, but since yellowing due to light may occur due to the optical activity, it is preferable to use the rutile type which has a low whiteness but does not have optical activity.
- pigments include anthraquinone, isoindolinone, condensed azo, and benzimidazolone, for example pigment yellow 108.
- Pigment Yellow 147, Pigment Yellow 151, Pigment Yellow 166, Pigment Yellow 181, Pigment Yellow 193 and the like can be used.
- Pigment Green 7, Pigment Green 36, Solvent Green 3, Solvent Green 5 : Solvent Green 20, Solvent Green 28, etc. may be used as the pigment when the color of the under-fill dam is represented as Green. have. However, in the case of a green pigment, since halogen is a problem, a combination of yellow and blue pigments is sometimes used to realize green.
- carbon black When the color of the under-fill dam is to be expressed in black, carbon black, titanium black, creme oxide, iron oxide, aniline black, and perylene pigments may be used as the pigment.
- Pigment Red 13 Pigment Red 32, Pigment Red 122, Pigment Red 177 Pigment Red 185, Pigment Red 226, Pigment Red. 246 and the like can be used.
- the photosensitive resin composition is preferably 0/0, the pigment 0.01-10 increase may comprise from 1 to 5 parts by weight 0/0. If the content of the pigment is too small, visibility, hiding power may be lowered, and if the content is too large, mechanical properties such as heat resistance may be inferior.
- the photosensitive resin composition may optionally further include the following components in addition to the above-described components.
- the photosensitive resin composition may optionally further include a thermosetting binder resin curing agent that can increase the degree of curing of the thermosetting binder resin.
- thermosetting binder resin curing agents include amine compounds, acid anhydride compounds, amide compounds, phenol compounds, and the like.
- amine compound diaminodiphenylmethane, diethylenetriamine, triethylenetetraamine, diaminodiphenylsulfone, isophoronediamine and the like can be used.
- Examples of the acid anhydride compound include phthalic anhydride, trimellitic anhydride, pyromellitic anhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylnadic acid, nuxahydrophthalic anhydride, and methyl nucleohydrophthalic anhydride.
- Examples of the amide compound include dicyandiamide, a diamide of linolenic acid, and a polyamide resin synthesized from ethylenediamine.
- phenol type compound Polyhydric phenols, such as bisphenol A, bisphenol F, bisphenol S, fluorene bisphenol, a terpene diphenol; Phenol resins obtained by condensation of phenols with aldehydes, ketones or dienes; Phenol resins obtained by polycondensation of phenols, substituted biphenyls, substituted phenyls, and the like; Modified products of phenols and / or phenol resins; Halogenated phenols such as tetrabromobisphenol A and a brominated phenol resin; Other imidazoles, BF3-amine complexes, guanidine derivatives and the like can be used.
- the photosensitive resin composition may further include 0.01 to 15% by weight of the thermosetting binder resin curing agent. If the content of the thermosetting binder resin curing agent is too small, the effect of increasing the degree of curing of the epoxy resin may be insignificant. If the content is too large, the physical properties of the dry film may be reduced.
- thermosetting binder resin catalyst can improve the curing rate of the thermosetting binder resin.
- thermosetting binder catalyst for example, imidazole, 2-methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 4-phenylimidazole Imidazole derivatives such as 1-cyanoethyl-2-phenylimidazole and 1- (2-cyanoethyl) -2-ethyl-4-methylimidazole; Amines such as dicyandiamide, benzyldimethylamine, 4- (dimethylamino) - ⁇ , ⁇ -dimethylbenzylamine, 4-methoxy- ⁇ , ⁇ -dimethylbenzylamine, 4-methyl- ⁇ , ⁇ -dimethylbenzylamine compound; Hydrazine compounds such as adipic dihydrazide and sebacic acid dihydrazide; Phosphorus compounds such as triphenylphosphine, etc.
- thermosetting catalyst of an epoxy resin or an oxetane compound may promote reaction of an epoxy group and / or an oxetanyl group, and a carboxyl group, and may be used individually or in mixture of 2 or more types.
- the compound which also functions as these adhesive imparting agents can be used together with the said thermosetting binder catalyst.
- the content of the thermosetting binder catalyst may be about 0.3 to 15 weight 0 / .about the total weight of the photosensitive resin composition, in terms of suitable thermosetting.
- the filler plays a role of improving heat stability, dimensional stability by heat, and resin adhesion. In addition, it also serves as a constitution pigment by reinforcing the color.
- Inorganic or organic layer fillers may be used as the filler, for example barium sulfate, barium titanate, amorphous silica, crystalline silica, fused silica, spherical silica, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide (alumina ), Aluminum hydroxide, mica and the like can be used.
- the content of the filler is preferably from about 5 to 50 parts by weight 0/0 relative to the total weight of the photosensitive resin composition. When used in excess of 50 parts by weight 0/0, it is undesirable high and the viscosity of the composition coating property may be degraded, or the falling down of the degree of cure.
- the leveling agent serves to remove the popping or craters from the surface when the film is coated.
- leveling agent examples include silicone, fluorine, and polymer.
- leveling agent examples include BYK-380N, BYK-307, BYK-378, and BYK-350 of BYK-Chemie GmbH.
- the content of the leveling agent is 0.05-10 weight 0 /. With respect to the whole increase of the said photosensitive resin composition.
- the leveling agent is used in less than 0.05 weight 0 / ° , it is unsatisfactory to remove the popping or craters, there is a problem that a lot of bubbles occur when used in excess of 10 weight 0 /.
- Dispersants serve to improve dispersion stability of fillers and pigments.
- Dispersing agent Disperbyk-110, Disperbyk-162, Disperbyk-168, etc. of BYK-Chemie GmbH can be used, for example.
- the content of the dispersant is preferably based on the total amount of photosensitive resin composition is 0.01 to 10 parts by weight 0/0. If the case where the dispersant is 0.01 0/0 is less than two minutes, without being dispersed layer, exceeding 10% by weight, it will affect the heat resistance and reliability.
- an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable functional group having a carboxyl group (-COOH) and a photocurable functional group; Photopolymerizable monomers; Photoinitiators; Thermosetting binder resins; Stacking a dry film comprising a dried or cured product of the photosensitive resin composition comprising an organic solvent and a pigment on a substrate; Exposing a dry film on an outer edge portion of the substrate; And cleaning the exposed dry film.
- a method of providing a printed circuit board may be provided.
- an under-fill dam having a very thin and uniform thickness can be formed.
- the under-fill dam exhibits excellent mechanical properties, it is possible to achieve a certain level of height and strength even with a thin thickness, and is thus injected or layered on a printed circuit board. Outflow of the under-fill material can be prevented, and damage to the under-fill dam or degradation of properties that can be issued on the under-fill process or the semiconductor manufacturing process can be minimized.
- FIG. 1 is a schematic of a conventional underfill process, where the previously known underfill process includes an alignment and flux dispensing step, a solder bump reflow step, a flux cleaning ( Flux Cleaning step, and the Underfilling step.
- the under-fill process aligns the chip element 1 on which the solder bumps 2 are formed and the substrate 4 on which the electrode pads 3 are formed, distributes the flux, and then reflows the solder bumps 2. And the flux is cleaned, and then the underfill 5 is filled between the chip element 1 and the substrate 4.
- FIG. 2 schematically illustrates an under-fill process using an under-fill dam formed by using a dry film including a dried product or a cured product of the photosensitive resin composition described above.
- the under-fill dam is formed at the outer edge portion of the chip element 1, it is possible to prevent leakage of the under-fill material 5 to be injected.
- the under-fill dam may be formed by laminating a dry film obtained from the photosensitive resin composition of the specific component described above on a substrate and then undergoing exposure, development and cleaning steps.
- the under-fill dam the step of preparing a dry film using the photosensitive resin composition; Laminating a dry film between the substrate and the chip element; Exposing the photo mask on the dry film to the desired dam pattern; Developing the dry film after exposure to remove unnecessary portions to form a desired dam pattern; And heat-curing after development to form a dam made of a dry film type solder resist.
- the specific content about each component contained in the said photosensitive resin composition is as above-mentioned.
- the coating or coating of the photosensitive resin composition a commonly known coating method such as a comma coater, blade coater, lip coater, rod coater, squeeze coater, reverse coater, transfer coater, gravure coater or spray coater may be used.
- the drying temperature in the Aubon is preferably about 70 to 110 ° C.
- the thickness of the photosensitive film formed of the photosensitive resin composition is preferably about 10 to 35 urn.
- the dry film (the state in which the release film was removed) obtained as mentioned above is laminated
- a vacuum laminator In the step of laminating the dry film from which the release film is removed, a vacuum laminator, a hot roll laminator, a vacuum press, or the like may be used.
- Light sources that can be used in the exposing step include ultraviolet (UV) light, electron beams, X-rays, and the like, and the substrate is exposed to light (UV light) having a predetermined wavelength band.
- the exposure may be selectively exposed with a photo mask, or may be directly pattern exposed with a laser direct exposure machine.
- the carrier film peels off after exposure. Although exposure amount changes with coating film thickness, 0-1,000 mJ / cuf is preferable.
- photocuring may occur to form a crosslinking bond between an acid-modified oligomer and a photopolymerizable monomer, and as a result, may not be removed by a subsequent phenomenon.
- the non-exposed part can maintain the carboxy group as it is, and can be in an alkali developable state.
- the dry film is developed to remove unnecessary portions to form a desired dam pattern.
- immersion or spraying is usually used to immerse the developer.
- an aqueous alkali solution such as potassium hydroxide, sodium hydroxide, sodium carbonate, potassium carbonate, sodium phosphate, sodium silicate, ammonia and amines is used. After developing with an aqueous alkali solution, the solution is washed with water. By this phenomenon, only the film of the exposed portion may remain.
- the residue may further be subjected to a post curing step.
- the heat curing temperature is more than 100 ° C.
- the cured product of such a photosensitive resin composition includes a photocured product of the acid-modified oligomer and the photopolymerizable monomer; Thermosetting of the acid-modified oligomer and thermosetting binder resin; And pigments.
- the printed circuit board obtained by the manufacturing method may include an under-fill dam having a thickness of 10 to 20 an, preferably 10 to 15. The thickness error (difference between the average value and the maximum / minimum value) of such an under-fill dam may be within 3 degrees.
- the method of manufacturing a printed circuit board forming an electrode pad on the substrate; Positioning solder bumps on the electrode pads; And flip chip bonding the semiconductor chip through the solder bumps.
- the solder bumps may be positioned on the electrode pads while being bonded to the semiconductor chip, or may be firstly installed on the electrode pads and then coupled to the semiconductor chip.
- the printed circuit board may include an electrode pad formed on the substrate; A solder bump formed on the electrode pad; And a semiconductor chip flip-chip coupled through the solder bumps.
- the method of manufacturing the printed circuit board may further include injecting an underfill material between the substrate and the semiconductor chip to provide a printed circuit board filled with an under-fill material.
- a printed circuit board including an under-fill dam having excellent mechanical properties and having a fine and uniform thickness can be provided.
- FIG. 1 schematically illustrates a conventional underfill process.
- FIG. 2 schematically shows the underfill process when an under-fill dam is formed on the substrate.
- Example 3 A dry film and a printed circuit board were manufactured in the same manner as in Example 1, except that the prepared photosensitive resin composition was used.
- Example 3 A dry film and a printed circuit board were manufactured in the same manner as in Example 1, except that the prepared photosensitive resin composition was used.
- CCR-1235 of Nippon Gunpowder as an acid-modified oligomer 35 weight 0 /.
- DPEA-12 of Kayarad as a photopolymerizable monomer
- TPO as a photoinitiator
- EPON- of Nippon Gunpowder as an epoxy resin 1020 to 13 wt. 0/0
- the epoxy curing agent as dicyandiamide to 0.5 0/0
- a 0.5 zero filler 2MI as epoxy catalyst by weight of pigment yellow 151.
- a yellow photosensitive resin composition was prepared using a weight of 0 A and 15% by weight of DMF as a solvent.
- a dry film and a printed circuit board were manufactured in the same manner as in Example 1, except that the prepared photosensitive resin composition was used.
- a printed circuit board having the same structure as in Example 1 was manufactured except that an under-fill dam was formed using the liquid solder resist disclosed in Japanese Patent Laid-Open No. 1996-325476.
- the color of the comparative example is green, whereas in the case of the embodiment may have a variety of colors, such as white.
- the comparative example is not only thick to form a thickness of about 1 mm and non-uniform due to the thickness variation, in the case of the embodiment can form a dam having a uniform thickness, even very thin dam of 10 to 15 m thickness is uniform It can be formed in thickness.
- it is difficult to apply the flip chip due to the non-uniform thickness whereas in the embodiment, the thickness is uniform and thin so that the flip chip application is difficult. It is possible.
- the detection power is lower, while in the embodiment, the detection power is excellent in AOI equipment.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Materials For Photolithography (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013511100A JP2013534714A (ja) | 2010-05-20 | 2011-05-11 | アンダーフィル用ダムを含む印刷回路基板およびその製造方法 |
| CN201180025037.4A CN102906867B (zh) | 2010-05-20 | 2011-05-11 | 包括底部填充用围堰的印刷电路板及其制造方法 |
| US13/699,275 US9865480B2 (en) | 2010-05-20 | 2011-05-11 | Printed circuit board including under-fill dam and fabrication method thereof |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2010-0047318 | 2010-05-20 | ||
| KR20100047318 | 2010-05-20 | ||
| KR1020110044011A KR101450727B1 (ko) | 2010-05-20 | 2011-05-11 | 언더-필용 댐을 포함하는 인쇄 회로 기판 및 이의 제조 방법 |
| KR10-2011-0044011 | 2011-05-11 |
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| WO2011145828A2 true WO2011145828A2 (ko) | 2011-11-24 |
| WO2011145828A3 WO2011145828A3 (ko) | 2012-04-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/KR2011/003466 Ceased WO2011145828A2 (ko) | 2010-05-20 | 2011-05-11 | 언더-필용 댐을 포함하는 인쇄 회로 기판 및 이의 제조 방법 |
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| JP3013135B2 (ja) * | 1993-11-16 | 2000-02-28 | 株式会社三井ハイテック | 半導体装置用リードフレームの製造方法 |
| JP2001159815A (ja) * | 1999-12-03 | 2001-06-12 | Nippon Kayaku Co Ltd | 感光性樹脂組成物及びこれを用いた感光性フイルム |
| JP2004325980A (ja) * | 2003-04-28 | 2004-11-18 | Kanegafuchi Chem Ind Co Ltd | 貯蔵安定性の良い感光性樹脂組成物及び感光性ドライフィルムレジスト、並びにその利用 |
| KR101022942B1 (ko) * | 2008-11-12 | 2011-03-16 | 삼성전기주식회사 | 흐름 방지용 댐을 구비한 인쇄회로기판 및 그 제조방법 |
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| WO2011145828A3 (ko) | 2012-04-19 |
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