WO2011099708A3 - 회전 및 승강 모션의 동시 조절을 위한 단일 구동부를 구비한 회전장치 - Google Patents

회전 및 승강 모션의 동시 조절을 위한 단일 구동부를 구비한 회전장치 Download PDF

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Publication number
WO2011099708A3
WO2011099708A3 PCT/KR2011/000559 KR2011000559W WO2011099708A3 WO 2011099708 A3 WO2011099708 A3 WO 2011099708A3 KR 2011000559 W KR2011000559 W KR 2011000559W WO 2011099708 A3 WO2011099708 A3 WO 2011099708A3
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WO
WIPO (PCT)
Prior art keywords
driving unit
rotation
rotary device
device including
controlling
Prior art date
Application number
PCT/KR2011/000559
Other languages
English (en)
French (fr)
Other versions
WO2011099708A2 (ko
Inventor
유병소
이병식
장현삼
김범중
Original Assignee
(주)큐엠씨
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)큐엠씨 filed Critical (주)큐엠씨
Priority to CN201180009126XA priority Critical patent/CN102844667A/zh
Publication of WO2011099708A2 publication Critical patent/WO2011099708A2/ko
Publication of WO2011099708A3 publication Critical patent/WO2011099708A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Of Balance (AREA)
  • Accommodation For Nursing Or Treatment Tables (AREA)

Abstract

본 발명은 회전 및 승강 모션의 동시 조절을 위한 단일 구동부를 구비한 회전장치에 관한 것으로, 회전 중심으로부터 외측으로 연장된 지지 프레임과, 지지프레임의 끝단에서 피검사체를 안착시키는 안착부재를 포함하는 검사테이블과, 전기적 신호를 인가 받아 회전력을 생성하는 구동부와, 검사테이블의 회전 중심 하부에 연결되어, 구동부로부터 회전력을 도입 받아 검사테이블의 단속적인 회전 및 승강 모션으로 변환하는 전동부재를 포함한다.
PCT/KR2011/000559 2010-02-12 2011-01-27 회전 및 승강 모션의 동시 조절을 위한 단일 구동부를 구비한 회전장치 WO2011099708A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201180009126XA CN102844667A (zh) 2010-02-12 2011-01-27 具备用于同时调节旋转及升降运动的单一驱动部的旋转装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2010-0013254 2010-02-12
KR1020100013254A KR101083273B1 (ko) 2010-02-12 2010-02-12 회전장치, 회전구동방법, 및 회전시스템

Publications (2)

Publication Number Publication Date
WO2011099708A2 WO2011099708A2 (ko) 2011-08-18
WO2011099708A3 true WO2011099708A3 (ko) 2011-10-27

Family

ID=44368250

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/000559 WO2011099708A2 (ko) 2010-02-12 2011-01-27 회전 및 승강 모션의 동시 조절을 위한 단일 구동부를 구비한 회전장치

Country Status (4)

Country Link
KR (1) KR101083273B1 (ko)
CN (1) CN102844667A (ko)
TW (1) TWI405285B (ko)
WO (1) WO2011099708A2 (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454458B (zh) * 2013-09-10 2016-04-27 嘉兴景焱智能装备技术有限公司 芯片角度翻转装置
CN103630333A (zh) * 2013-11-27 2014-03-12 正屋(厦门)电子有限公司 一种快速检测led灯具的设备
CN105834584A (zh) * 2016-05-06 2016-08-10 南京航空航天大学 具有运动解耦机构的二自由度定位平台
CN108627762B (zh) * 2018-06-08 2024-03-26 深圳瑞波光电子有限公司 一种测试系统
TWI767556B (zh) * 2021-02-08 2022-06-11 鴻勁精密股份有限公司 載具機構及其應用之作業設備
CN114952332A (zh) * 2021-02-24 2022-08-30 鸿劲精密股份有限公司 载具机构及其应用的作业设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007019237A (ja) * 2005-07-07 2007-01-25 Tokyo Seimitsu Co Ltd 両面発光素子用プロービング装置
KR20080029444A (ko) * 2006-09-29 2008-04-03 미래산업 주식회사 전자부품 테스트용 핸들러
KR100935706B1 (ko) * 2009-06-29 2010-01-08 (주)큐엠씨 엘이디 칩 테스트장치 및 그 전달부재

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5640100A (en) 1994-10-22 1997-06-17 Tokyo Electron Limited Probe apparatus having probe card exchanging mechanism
CN2436606Y (zh) * 2000-08-04 2001-06-27 徐邱丽宝 具升降旋转功能的舞台
CN100410026C (zh) * 2006-10-17 2008-08-13 大连理工大学 一种净化机器人
CN101391376B (zh) * 2008-07-23 2010-06-02 云南昆船设计研究院 单驱动控制工作台旋转和升降的装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007019237A (ja) * 2005-07-07 2007-01-25 Tokyo Seimitsu Co Ltd 両面発光素子用プロービング装置
KR20080029444A (ko) * 2006-09-29 2008-04-03 미래산업 주식회사 전자부품 테스트용 핸들러
KR100935706B1 (ko) * 2009-06-29 2010-01-08 (주)큐엠씨 엘이디 칩 테스트장치 및 그 전달부재

Also Published As

Publication number Publication date
CN102844667A (zh) 2012-12-26
WO2011099708A2 (ko) 2011-08-18
KR20110093301A (ko) 2011-08-18
KR101083273B1 (ko) 2011-11-14
TW201128722A (en) 2011-08-16
TWI405285B (zh) 2013-08-11

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