WO2011065534A1 - 窒化アルミニウム単結晶の製造方法 - Google Patents
窒化アルミニウム単結晶の製造方法 Download PDFInfo
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- WO2011065534A1 WO2011065534A1 PCT/JP2010/071259 JP2010071259W WO2011065534A1 WO 2011065534 A1 WO2011065534 A1 WO 2011065534A1 JP 2010071259 W JP2010071259 W JP 2010071259W WO 2011065534 A1 WO2011065534 A1 WO 2011065534A1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/38—Nitrides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/007—Growth of whiskers or needles
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
- C30B29/62—Whiskers or needles
Definitions
- the present invention relates to a novel method for producing an aluminum nitride single crystal having good crystallinity.
- Aluminum nitride is used as a filler, a substrate for electronic / electrical parts, and a heat dissipation member because it is a material with high mechanical strength and excellent heat dissipation performance.
- an AlN single crystal constitutes a light emitting device such as a light emitting diode (LED) or a laser diode (LD) that emits short-wavelength light in the blue visible region to the ultraviolet region from the viewpoint of lattice matching and ultraviolet light transmission. It is attracting attention as a substrate material.
- metal organic vapor phase epitaxy MOVPE
- HVPE hydride vapor phase epitaxy
- chemical transport flux, sublimation recrystallization, etc.
- Single crystals and bulk single crystals are manufactured.
- the chemical transport method and the sublimation recrystallization method have yielded various investigations because single crystals having different shapes such as plate crystals and needle crystals can be obtained.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2005-132699: Patent Document 1
- Patent Document 1 Japanese Patent Application Laid-Open No. 2005-132699: Patent Document 1
- Patent Document 1 since a metal oxide other than alumina is used in combination, there is room for improvement in that the resulting aluminum nitride single crystal may contain impurities.
- a raw material such as alumina is housed in a carbon crucible and heated in a nitrogen atmosphere with the lid covered. Since the flow of nitrogen is hindered by the lid, the production efficiency of aluminum nitride is considered insufficient.
- the present invention has been made in view of the prior art as described above, and an object thereof is to provide a method for efficiently and simply producing an aluminum nitride single crystal having good crystallinity.
- the aluminum nitride polycrystal powder that is currently widely used as aluminum nitride is obtained by heating alumina powder and carbon powder in a nitrogen atmosphere.
- the source gas generated from alumina is immediately reduced and nitrided by the adjacent carbon source, it is considered that a single crystal cannot be obtained and a polycrystalline powder is generated.
- the present inventors do not immediately reduce and nitride the source gas generated from alumina or the like, but may maintain the floating state to some extent, and then precipitate it, thereby effectively obtaining an aluminum nitride single crystal.
- the present invention completed based on such an idea includes the following matters as a gist.
- a source gas generating source for generating aluminum gas or aluminum oxide gas
- the raw material gas generation source and the carbon molding are arranged in such a manner that a space having an interval of 0.01 to 50 mm exists between the raw material gas generation source that does not contact the carbon molded body and the carbon molded body that does not contact the raw material gas generation source.
- the heating temperature and the nitrogen gas flow rate are set so as to satisfy the conditions under which aluminum nitride precipitates in the space between the source gas generating source that does not contact the carbon molded body and the carbon molded body that does not contact the source gas generating source.
- a method for producing an aluminum nitride single crystal is set so as to satisfy the conditions under which aluminum nitride precipitates in the space between the source gas generating source that does not contact the carbon molded body and the carbon molded body that does not contact the source gas generating source.
- a raw material gas generation source 5 for generating aluminum gas or aluminum oxide gas and a carbon molded body 6 are provided in a predetermined positional relationship in the single crystal production apparatus 1. Arrange to meet.
- FIG. 1 shows an example of a schematic cross-sectional view of a single crystal production apparatus that can be suitably used in the method for producing an aluminum nitride single crystal of the present invention.
- the present invention will be described in detail with reference to FIG. 1, but the present invention is not limited to the following embodiments.
- the single crystal production apparatus 1 includes a reaction vessel 4 having a nitrogen gas supply port 2 for supplying nitrogen gas on the upstream side and a discharge port 3 for discharging gas in the system on the downstream side.
- the source gas generation source 5 and the carbon molded body 6 are arranged so as to satisfy a predetermined positional relationship.
- the reaction vessel 4 can be heated by the heater 8.
- each member for example, the reaction vessel 4, the nitrogen gas supply port 2, and the discharge port 3 can naturally withstand the temperature at which the aluminum nitride single crystal is grown. It shall be composed of materials.
- an aluminum nitride single crystal can be grown using the single crystal manufacturing apparatus as described above, and the method will be described in more detail below.
- the reaction vessel 4 used is composed of a material that can sufficiently withstand the temperature at which an aluminum nitride single crystal is grown, specifically, a temperature of 1500 ° C. or higher and 2400 ° C. or lower.
- the material include aluminum nitride, boron nitride sintered body, and carbon.
- the reaction vessel 4 is preferably made of an aluminum nitride sintered body.
- the shape and size of the reaction vessel 4 are not particularly limited as long as they can be industrially manufactured. Among these, the columnar shape is preferable because the reaction vessel 4 is easy to manufacture and the nitrogen gas supplied when growing the aluminum nitride single crystal is easily supplied uniformly into the reaction vessel 4.
- the source gas generation source 5 is made of a material that generates source aluminum gas that reacts with nitrogen to generate aluminum nitride.
- the raw material aluminum gas in the present invention is an aluminum gas or an aluminum oxide gas.
- Metal aluminum is used to generate the aluminum gas, or aluminum oxide (alumina, sapphire) is used to generate the aluminum oxide gas. ) Is used.
- the aluminum oxide is not particularly limited as long as aluminum is oxidized, and commercially available aluminum oxide, sapphire, and aluminum nitride oxidized can be used. About what oxidized aluminum nitride, what was oxidized beforehand outside the reaction container can be used, and what oxidized aluminum nitride inside the reaction container can be used.
- the aluminum nitride is not oxidized, but normal aluminum oxide or sapphire (hereinafter referred to as nitride) It is preferable to use this normal aluminum oxide, or sapphire may be Al 2 O 3 ) instead of oxidized aluminum.
- aluminum oxide (Al 2 O 3 ) when used, it is not particularly limited, but in view of the purity of the obtained aluminum nitride single crystal, it is preferable to use a high-purity one. . However it is not intended to exclude impurities inevitably mixed in the production of commercially available aluminum oxide (Al 2 O 3), as the purity of the aluminum oxide (Al 2 O 3), is 99% or more It is preferable that it is 99.9% or more.
- the shape of the source gas generation source is not particularly limited, and may be on a plate, granular, or powder. However, in the present invention, it is particularly preferable to use an aluminum oxide molded body, specifically, an alumina plate. When a granular or powdery raw material gas generation source is used, the raw material gas is rapidly generated, so that a good single crystal may not be obtained.
- Aluminum oxides satisfying such conditions are commercially available.
- aluminum oxide Wako special grades manufactured by Wako Pure Chemical Industries, Ltd. aluminum oxides ALO01PB, ALO02PB manufactured by Kojundo Chemical Laboratory Co., Ltd. , ALO03PB, ALO16PB, ALO13PB, ALO14PB, ALO11PB, ALO12PB can be used.
- alumina A-479, A-480, A601 manufactured by Kyocera Corporation, and single crystal sapphire manufactured by Kyocera can also be used.
- metal aluminum for example, a commercially available product having a purity of 99% or more in the form of powder, granule, rod, tablet, chip, plate, or foil of AlE series manufactured by Kojundo Chemical Laboratory Co., Ltd. is used. be able to.
- the carbon molded body 6 is used as a reducing agent when reducing and nitriding the source gas.
- the form of the carbon molded body 6 is not particularly limited as long as it is tangible, but is preferably block-shaped. Accordingly, preferable carbon molded bodies include, for example, blocks formed by molding carbon powder such as carbon black with a small amount of binder resin, blocks formed by cutting out graphite and the like.
- carbon gasification is limited to the surface of the molded body, so that rapid gasification of carbon is suppressed.
- the amount of reducing gas (carbon monoxide gas or the like) generated from the carbon molded body becomes appropriate, the reductive nitridation reaction is moderately suppressed, and a good single crystal is obtained.
- carbon molded body used in the present invention preferably has effective surface area per its weight is less than 0.5 m 2 / g, further 0.25 m 2 / g or less is preferable, and 0.025 m 2 / g or less is particularly preferable.
- the effective surface area is a surface area that does not consider pores and the like, and in the case of a rectangular parallelepiped, for example, it means the total area of the upper and lower surfaces and the four side surfaces.
- the carbon molded body 6 is not in direct contact with the raw material gas generation source 5, and at least a part of the raw material gas generation source 5 is not in direct contact with the carbon molded body 6. 0.01 to 50 mm, preferably 0.05 to 40 mm, more preferably 0.08 to 30 mm, further between the source gas generating source 5 not in contact with the carbon molded body 6 not in contact with the source gas generating source 5.
- the raw material gas generation source 5 and the carbon molded body 6 are arranged in such an arrangement that there is a space having an interval of 0.1 to 25 mm, particularly preferably 0.3 to 20 mm, and most preferably 0.8 to 15 mm. .
- the “interval” is the length of a straight line connecting an arbitrary “raw material gas generation source 5 not in contact with the carbon forming body 6” and the closest “carbon forming body 6 not in contact with the raw material gas generation source 5”. Say it.
- “there is space” means a state in which the other source gas generation source 5 and the carbon molded body 6 do not exist on the straight line.
- the lengths of all straight lines connecting “the raw material gas generation source 5 not in contact with the carbon forming body 6” and “the carbon forming body 6 not in contact with the raw material gas generation source 5” must be in the above range. There is no. That is, it is only necessary that a part of the source gas generation source 5 and a part of the carbon molded body 6 satisfy the above relationship. Therefore, the source gas generation source 5 and the carbon molded body 6 may be in partial contact. In the contact portion, the distance between them is 0 (zero). Further, a part of the source gas generation source 5 and a part of the carbon molded body 6 may be present with an interval exceeding 50 mm.
- the “source gas generation source 5 not in contact with the carbon molded body 6” can be realized by using a carbon molded body smaller than the source gas generation source 5, for example.
- alumina plate having a larger area than the area of the lower surface of the carbon molded body 6 is used, or alumina powder is put in the reaction vessel so as to have a larger area than the area of the lower surface of the carbon molded body 6. This can be realized by laying and placing a carbon molded body on the alumina plate or alumina powder.
- FIG. 1 shows a more specific example of the positional relationship between the source gas generation source 5 and the carbon molded body 6.
- FIG. 1 shows a state in which a carbon molded body 6 (for example, a carbon block) having a smaller bottom area is disposed on a source gas generation source 5 (for example, an alumina plate).
- a source gas generation source 5 for example, an alumina plate.
- a part of the upper surface of the alumina plate is in contact with the bottom surface of the carbon block.
- the alumina plate does not contact the carbon block except on the contact surface with the carbon block. Therefore, “the source gas generation source 5 that does not come into contact with the carbon molded body 6” exists.
- the carbon block is not in contact with the alumina plate except at the bottom surface.
- the carbon molded body 6 that does not come into contact with the source gas generation source 5 exists.
- the size of the carbon block is small.
- the carbon block needs to have a certain size or more, and granular or powdery carbon is not used in the present invention.
- FIG. 2 shows a state in which the alumina plate and the carbon block are arranged in parallel at a predetermined interval.
- the arrangement defined in the present invention can be realized by arranging the alumina plate so that the distance between the side surface of the alumina plate and the side surface of the carbon block is 0.01 to 50 mm.
- the heating temperature and the nitrogen gas flow rate are satisfied so as to satisfy the conditions for precipitation of aluminum nitride in the space between the source gas generating source that does not contact the carbon molded body and the carbon molded body that does not contact the source gas generating source.
- the deposition conditions of aluminum nitride may be satisfied in a space other than the above space, and this is more preferable. That is, in the present invention, it is necessary that the predetermined space defined above satisfies the aluminum nitride deposition conditions, and it is preferable that the other conditions satisfy the aluminum nitride deposition conditions.
- the aluminum nitride single crystal growth substrate 7 is disposed in another space other than the predetermined space defined above, the aluminum nitride single crystal growth substrate 7 is disposed in the other space. It is preferable to grow an aluminum nitride single crystal thereon. By growing an aluminum nitride single crystal on an aluminum nitride single crystal growth substrate, a high-purity aluminum nitride single crystal can be produced.
- the substrate for growing an aluminum nitride single crystal is used.
- the shape of the substrate should be easy to handle depending on the capacity of the reaction vessel, the aluminum oxide used, and the amount of the obtained aluminum nitride single crystal. Good.
- the aluminum nitride single crystal growth substrate is not particularly limited as long as it is a material suitable for aluminum nitride growth, but is preferably a substrate made of aluminum nitride.
- a substrate made of an aluminum nitride single crystal or an aluminum nitride sintered body can be used.
- it is preferable to use a substrate made of an aluminum nitride sintered body hereinafter referred to as an aluminum nitride sintered substrate).
- the aluminum nitride sintered body substrate can be manufactured by a known method, and a commercially available one can also be used. By using the aluminum nitride sintered body substrate, the yield of the aluminum nitride single crystal can be increased. The reason for this is not clear, but the aluminum nitride sintered body is a polycrystalline body, and grains of various shapes and crystal planes exist on the surface. Therefore, when the grains grow an aluminum nitride single crystal, It may be because it is easy to become a nucleus.
- a substrate having a particle diameter in the range of 1 to 30 ⁇ m when observed with an electron microscope is preferably used.
- the above-mentioned aluminum nitride sintered substrate having a sintering aid content of less than 40000 ppm in consideration of the purity of the obtained aluminum nitride single crystal, and particularly preferably a sintering aid. It is good to use the thing which does not contain an agent.
- the aluminum nitride sintered body substrate one containing oxygen can be suitably used. Specifically, oxygen containing 100 to 25000 ppm, preferably 500 to 7000 ppm can be used. The reason for this is not clear, but it is thought that the growth of the aluminum nitride single crystal is promoted by using the aluminum nitride sintered body substrate containing oxygen to some extent.
- Such an aluminum nitride sintered body substrate can also be manufactured by a known method, and commercially available products such as SH-50 and SH-15 manufactured by Tokuyama Corporation can be used.
- the arrangement of the aluminum nitride single crystal growth substrate 7 is not particularly limited, and may be any arrangement as long as the conditions for depositing aluminum nitride on the substrate 7 are satisfied.
- the aluminum nitride deposition conditions are reliably satisfied in the space between the source gas generating source that does not contact the carbon molded body and the carbon molded body that does not contact the source gas generating source. Therefore, as shown in FIG. 3, the substrate 7 is placed so that at least a part of the aluminum nitride single crystal growth substrate 7 exists in the vicinity of the space, specifically, within 0.01 mm from the space. It is preferable to arrange.
- the raw material gas generation source 5, the carbon molded body 6, and the aluminum nitride single crystal growth substrate 7 that is used as necessary are arranged from the nitrogen gas supply port 2 in a state where they are arranged to satisfy a specific positional relationship. Nitrogen gas is circulated to grow an aluminum nitride single crystal in a heating environment.
- Nitrogen gas may be pure nitrogen, or may be diluted with an inert gas other than nitrogen and distributed.
- an inert gas other than nitrogen for example, an inert gas such as argon, helium, neon, krypton, or xenon is used.
- the flow rate of the nitrogen gas is not particularly limited as long as aluminum nitride is generated, and varies depending on various thermodynamic conditions such as the heat treatment temperature.
- the space between the raw material gas generation source that does not contact the carbon molded body and the carbon molded body that does not contact the raw material gas generation source is preferably 0.1 in terms of 23 ° C.
- Nitrogen gas is circulated in an amount of 1 cc / min to 100 L / min, more preferably 1 cc / min to 50 L / min, further preferably 30 cc / min to 30 L / min, particularly preferably 50 cc / min to 20 L / min. It is desirable.
- the yield of the obtained aluminum nitride single crystal increases as the flow rate increases.
- the temperature in the reaction vessel is not particularly limited as long as it is a temperature at which the source gas is generated from the source gas generation source and the source gas is reduced and nitrided to produce aluminum nitride, and is present in the reaction system. Varies depending on various thermodynamic conditions such as nitrogen partial pressure.
- the source gas generation source 5, the carbon molded body 6, and the aluminum nitride single crystal growth substrate 7 used as necessary are close to each other, and there is substantially no temperature difference between them.
- the temperature in the reaction vessel is preferably 1500 ° C. or higher and 2400 ° C. or lower.
- the temperature in the reaction vessel is preferably 1700 ° C. or higher and 2200 ° C. or lower, more preferably 1750 ° C. or higher and lower than 2150 ° C., particularly preferably 1750 ° C. or higher and 2100 ° C. or lower. .
- the crystallinity of the resulting aluminum nitride single crystal is improved as the temperature rises. Moreover, the expansion of crystal grains is observed. Furthermore, the yield is increased.
- an aluminum nitride single crystal can be produced by growing the aluminum nitride single crystal on the aluminum nitride single crystal growth substrate under the above conditions.
- the reaction time (time for growing the aluminum nitride single crystal) is not particularly limited, and may be appropriately determined according to the desired shape and yield of the aluminum nitride single crystal. As the reaction time becomes longer, a columnar aluminum nitride single crystal having a larger outer diameter and a longer length can be obtained. However, considering industrial production, the reaction time is preferably 1 hour or more and 200 hours or less.
- this reaction time is measured from the time when all the conditions are met. That is, it is the time after all the conditions of the temperature in the reaction vessel and the partial pressure of the nitrogen gas satisfy the set conditions. Therefore, when the temperature in the reaction vessel is set to the set temperature while supplying nitrogen gas into the reaction vessel, the time after reaching the set temperature is the reaction time. In addition, when the nitrogen gas is supplied to the reaction vessel after the inside of the reaction vessel is set to the set temperature, the time after the nitrogen gas is supplied becomes the reaction time.
- the temperature of the reaction vessel is lowered to near room temperature, and the produced aluminum nitride single crystal is taken out of the reaction vessel to produce the aluminum nitride single crystal. it can.
- an aluminum nitride single crystal is generated in a space between a raw material gas generation source that does not contact the carbon compact and a carbon compact that does not contact the raw material gas generation source. Since aluminum nitride is generated by the reductive nitridation of the source gas, the aluminum nitride single crystal grows mainly in the vicinity of the carbon molded body. That is, as shown in FIG. 4, an aluminum nitride single crystal is formed in a needle shape or a plate shape so as to surround the carbon molded body 6.
- the present inventors consider this production reaction as follows. That is, in the region where the carbon molded body and the source gas generation source are close to each other, the generated source gas is immediately reduced and nitrided, and an aluminum nitride polycrystal is generated in the vicinity of the carbon molded body. Next, a source gas generation source that does not contact the carbon molded body, a source gas that floats in a space between the carbon molded body that does not contact the source gas generation source, and a reducing gas (carbon monoxide gas) generated from the carbon molded body Etc.) react with the polycrystal as a nucleus, and an aluminum nitride single crystal is considered to grow.
- the size of the aluminum nitride single crystal can be adjusted by the reaction time.
- an aluminum nitride single crystal having an outermost diameter of 8 mm and a length of 100 mm can be obtained. can do.
- an unprecedented large aluminum nitride single crystal can be produced.
- the obtained aluminum nitride single crystal can be used in various applications, for example, as a base substrate of a light emitting device.
- upstream side and downstream side indicate relative positions with respect to the nitrogen supply port 2
- upstream side is a side closer to the nitrogen supply port 2 and far from the “downstream side” nitrogen supply port 2.
- Example 1 An experiment was conducted using the single crystal manufacturing apparatus 1 having the configuration shown in FIG.
- the reaction vessel 4 was a cylindrical one.
- An alumina plate (Al 2 O 3 ) (A479, purity 99%) 50 mm ⁇ 50 mm ⁇ 1 mm (t) manufactured by Kyocera Corporation was charged as the raw material upstream of the reaction vessel 4 (aluminum oxide 5).
- the charging position was directly below the nitrogen supply port 2.
- the carbon molded body 6 cut into 5 mm ⁇ 5 mm ⁇ 30 mm is placed on the upper portion of the aluminum oxide 5 (20 mm from the downstream end of the aluminum oxide) so that the long axis of the molded body is perpendicular to the nitrogen gas flow. installed.
- the temperature of the aluminum oxide 5 and the carbon molded body 6 was 1950 ° C.
- Nitrogen gas was supplied from the nitrogen supply port 2 in an amount of 1 L / min.
- the retention time was set to 30 hours to deposit aluminum nitride single crystals. After the reaction, as shown in FIG. 4, precipitation (growth) of aluminum nitride crystals was confirmed on the aluminum oxide 5 so as to surround the carbon molded body 6. The precipitated aluminum nitride crystal grew from a place approximately 0.6 mm away from the carbon molded body set before the reaction. The outermost diameter of the aluminum nitride crystal that was the largest among the precipitates was 5 to 6 mm, and the length was 30 mm. The weight of the precipitated aluminum nitride crystal was measured and found to be 0.7 g.
- the obtained aluminum nitride crystal was evaluated with an X-ray diffractometer (manufactured by Bruker AXS).
- the full width at half maximum of the AlN (002) peak was 40 arcsec, and it was confirmed to be an aluminum nitride single crystal.
- Example 2 In Example 1, the reaction was performed in the same manner as in Example 1 except that the shape of the carbon molded body 6 was changed to 1 mm ⁇ 1 mm ⁇ 30 mm.
- the precipitated aluminum nitride crystal grew from a place approximately 0.6 mm away from the carbon molded body set before the reaction.
- the outermost diameter of the aluminum nitride crystal that was the largest among the precipitates was 3 to 5 mm, and the length was 25 mm.
- the full width at half maximum of the AlN (002) peak was 43 arcsec, confirming the aluminum nitride single crystal.
- Example 3 In Example 1, the reaction was performed in the same manner as in Example 1 except that the shape of the carbon molded body 6 was changed to 10 mm ⁇ 10 mm ⁇ 30 mm.
- Example 4 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the place where the carbon molded body 6 was installed was not the upper part of the aluminum oxide 5 but a place 1 mm away from the downstream end of the aluminum oxide without contact. did.
- Example 5 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the place where the carbon molded body 6 was installed was not the upper part of the aluminum oxide 5 but a place 10 mm away from the downstream end of the aluminum oxide without contact. did.
- Example 6 In Example 1, an aluminum nitride single crystal growth substrate 7 (material is an aluminum nitride sintered body) was placed at a location 1 mm away from the downstream end of the aluminum oxide 5 (21 mm away from the carbon molded body). The reaction was carried out in the same manner as in Example 1 except that.
- material is an aluminum nitride sintered body
- the aluminum nitride crystal on the aluminum oxide grew from a place approximately 0.5 mm away from the carbon molded body set before the reaction. Also, the aluminum nitride crystal on the aluminum nitride single crystal growth substrate was deposited at the end on the side facing the aluminum oxide. The outermost diameter of the aluminum nitride crystal that was the largest among the precipitates was 7 to 9 mm, and the length was 55 mm. The full width at half maximum of the AlN (002) peak was 35 arcsec, which was confirmed to be an aluminum nitride single crystal.
- Example 7 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the flow rate of nitrogen supplied from the nitrogen supply port was 10 L / min.
- Example 8 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the flow rate of nitrogen supplied from the nitrogen supply port was 10 cc / min.
- Example 9 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the temperatures of the aluminum oxide 5 and the carbon molded body 6 were 2050 ° C.
- Example 10 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the temperatures of the aluminum oxide 5 and the carbon molded body 6 were 1850 ° C.
- Example 1 Comparative Example 1 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the place where the carbon molded body 6 was installed was not the upper part of the aluminum oxide 5 but a place 100 mm away from the downstream end of the aluminum oxide without contact. did.
- Example 2 Comparative Example 2 In Example 1, the reaction was performed in the same manner as in Example 1 except that the carbon molded body 6 was a carbon powder having an average particle diameter of 2 microns. The surface area per unit weight of the carbon molded body is 0.6 m 2 / g.
- Example 3 Comparative Example 3 In Example 1, the reaction was carried out in the same manner as in Example 1 except that the flow rate of nitrogen supplied from the nitrogen supply port was 0 cc / min.
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Abstract
Description
炭素成形体との存在下に窒素ガスを流通して、加熱環境下で窒化アルミニウム単結晶を成長させる窒化アルミニウム単結晶の製造方法であって、
炭素成形体の少なくとも一部が原料ガス発生源と直接接触せず、
原料ガス発生源の少なくとも一部が炭素成形体と直接接触せず、
当該炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間に0.01~50mmの間隔がある空間が存在する配置で、原料ガス発生源と炭素成形体を配置し、
当該炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間の空間で、窒化アルミニウムが析出する条件を満足するように加熱温度、窒素ガス流量を設定する窒化アルミニウム単結晶の製造方法。
図1に、本発明の窒化アルミニウム単結晶の製造方法に好適に使用できる単結晶製造装置の概略断面図の一例を示す。以下、この図1を用いて本発明を詳細に説明するが、本発明は以下の実施形態に限定されるものではない。
本発明において、使用する反応容器4は、上記の通り、窒化アルミニウム単結晶を成長させる際の温度、具体的には、1500℃以上2400℃以下の温度において、十分に耐えうる材質で構成される。具体的な材質としては、窒化アルミニウム、窒化硼素の焼結体、カーボンなどが挙げられる。中でも、製造する窒化アルミニウム単結晶の純度を考慮すると、反応容器4は、窒化アルミニウム焼結体よりなることが好ましい。また、窒化アルミニウム焼結体の中でも、焼結助剤を含まないものを使用することが好ましい。
原料ガス発生源5は、窒素と反応して窒化アルミニウムを生成する原料アルミニウムガスを発生させる物質からなる。本発明における原料アルミニウムガスは、アルミニウムガスまたはアルミニウム酸化物ガスであり、アルミニウムガスを発生させるためには金属アルミニウムが用いられ、またはアルミニウム酸化物ガスを発生させる場合には、酸化アルミニウム(アルミナ、サファイヤ)が用いられる。
本発明では、原料ガスを還元窒化する際の還元剤として炭素成形体6を使用する。炭素成形体6は、有形である限りその形態は特に限定はされないが、好ましくはブロック状である。したがって、好ましい炭素成形体としては、たとえばカーボンブラック等の炭素粉末を少量のバインダー樹脂で成形したブロック、またグラファイト等を削り出して成形したブロックなどが挙げられる。
本発明では、原料ガス発生源5と炭素成形体6とを所定の位置関係を満たすように配置した状態で窒化アルミニウムの生成を行う。
上記で規定した所定の空間以外の他の空間でも窒化アルミニウムの析出条件を満足する場合には、当該他の空間に窒化アルミニウム単結晶成長用基板7を配置し、窒化アルミニウム単結晶成長用基板7上に窒化アルミニウム単結晶を成長させることが好ましい。窒化アルミニウム単結晶成長基板用上に窒化アルミニウム単結晶を成長させることにより、純度の高い窒化アルミニウム単結晶を製造することができる。なお、ここでは窒化アルミニウム単結晶成長用基板としたが、その形状は、反応容器の容量、使用する酸化アルミニウム、得られる窒化アルミニウム単結晶の量に応じて、取り扱い易い大きさのものとすればよい。
本発明では、原料ガス発生源5と炭素成形体6と、必要に応じ用いられる窒化アルミニウム単結晶成長用基板7とが特定の位置関係を満たすように配置した状態で、窒素ガス供給口2から窒素ガスを流通して、加熱環境下で窒化アルミニウム単結晶を成長させる。
本発明において、上記の流量範囲で反応容器内に窒素ガスを流通させると、流通流量の増加とともに、得られる窒化アルミニウム単結晶の収量が増す。
本発明において、反応容器内の温度を上記温度範囲に制御することで、温度の上昇とともに、得られる窒化アルミニウム単結晶の結晶性が向上する。また、結晶粒の拡大が見られる。さらに、収量が増大する。
本発明においては、以上の条件で窒化アルミニウム単結晶成長用基板上に窒化アルミニウム単結晶を成長させることにより、窒化アルミニウム単結晶を製造することができる。
本発明においては、炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間の空間で窒化アルミニウム単結晶が生成する。原料ガスの還元窒化により窒化アルミニウムが生成するため、窒化アルミニウム単結晶は主として炭素成形体の近傍で成長する。すなわち、図4に示したように、炭素成形体6を取り囲むように窒化アルミニウム単結晶が針状あるいは板状で生成する。
<結晶性の評価>
X線回折装置(BrukerAXS製)にてロッキングカーブの半値幅を算出した。
図1に示した構成の単結晶製造装置1にて実験を行った。反応容器4は、円柱状のものを使用した。反応容器4内の上流側に原料として株式会社京セラ製 アルミナ板(Al2O3)(A479、純度99%)50mm×50mm×1mm(t)を投入した(酸化アルミニウム5)。投入位置は、窒素供給口2の直下とした。この酸化アルミニウム5の上部(酸化アルミニウムの下流側端部から20mmの場所)に、5mm×5mm×30mmに切断した炭素成形体6を、成形体の長軸が窒素ガス流と直角になるように設置した。
実施例1において、炭素成形体6の形状を1mm×1mm×30mmとした以外は実施例1と同様に反応を行なった。
実施例1において、炭素成形体6の形状を10mm×10mm×30mmとした以外は実施例1と同様に反応を行なった。
実施例1において、炭素成形体6の設置場所を酸化アルミニウム5の上部でなく、接触させずに酸化アルミニウムの下流側端部から1mm離れた場所とした以外は実施例1と同様に反応を実施した。
実施例1において、炭素成形体6の設置場所を酸化アルミニウム5の上部でなく、接触させずに酸化アルミニウムの下流側端部から10mm離れた場所とした以外は実施例1と同様に反応を実施した。
実施例1において、酸化アルミニウム5の下流側端部から1mm離れた場所(炭素成形体からは21mm離れた場所)に窒化アルミニウム単結晶成長用基板7(材質は窒化アルミニウム焼結体)を設置した以外は実施例1と同様に反応を実施した。
実施例1において、窒素供給口より供給する窒素流量を10L/分とした以外は実施例1と同様に反応を実施した。
実施例1において、窒素供給口より供給する窒素流量を10cc/分とした以外は実施例1と同様に反応を実施した。
実施例1において、酸化アルミニウム5及び炭素成形体6の温度を2050℃とする以外は実施例1と同様に反応を実施した。
AlN(002)ピークの半値全幅は38arcsecであり、窒化アルミニウム単結晶であることが確認された。
実施例1において、酸化アルミニウム5及び炭素成形体6の温度を1850℃とする以外は実施例1と同様に反応を実施した。
実施例1において、炭素成形体6の設置場所を酸化アルミニウム5の上部でなく、接触させずに酸化アルミニウムの下流側端部から100mm離れた場所とした以外は実施例1と同様に反応を実施した。
実施例1において、炭素成形体6を平均粒径2ミクロンの炭素粉末とする以外は実施例1と同様に反応を実施した。炭素成形体の単位重さあたりの表面積は0.6m2/gである。
実施例1において、窒素供給口より供給する窒素流量を0cc/分とした以外は実施例1と同様に反応を実施した。
2 窒素供給口
3 排出口
4 反応容器
5 原料ガス発生源(酸化アルミニウム)
6 炭素成形体
7 窒化アルミニウム単結晶成長用基板板
8 ヒーター
Claims (6)
- アルミニウムガスまたはアルミニウム酸化物ガスを発生する原料ガス発生源と、
炭素成形体との存在下に窒素ガスを流通して、加熱環境下で窒化アルミニウム単結晶を成長させる窒化アルミニウム単結晶の製造方法であって、
炭素成形体の少なくとも一部が原料ガス発生源と直接接触せず、
原料ガス発生源の少なくとも一部が炭素成形体と直接接触せず、
当該炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間に0.01~50mmの間隔がある空間が存在する配置で、原料ガス発生源と炭素成形体を配置し、
当該炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間の空間で、窒化アルミニウムが析出する条件を満足するように加熱温度、窒素ガス流量を設定する窒化アルミニウム単結晶の製造方法。 - 原料ガス発生源が酸化アルミニウム成形体である、請求項1に記載の窒化アルミニウム単結晶の製造方法。
- 酸化アルミニウム成形体上に、該酸化アルミニウム成形体よりも小さな炭素成形体を配置する、請求項2に記載の窒化アルミニウム単結晶の製造方法。
- 酸化アルミニウム成形体と炭素成形体とを、0.05~40mmの間隔を開けて配置する、請求項2に記載の窒化アルミニウム単結晶の製造方法。
- 酸化アルミニウム成形体と炭素成形体との近傍に、窒化アルミニウム単結晶成長用基板として、窒化アルミニウム成形体を配置する、請求項3または4に記載の窒化アルミニウム単結晶の製造方法。
- 前記炭素成形体と接触しない原料ガス発生源と、原料ガス発生源と接触しない炭素成形体との間の空間に、23℃換算で0.1cc/分~100L/分の量で窒素ガスを流通させる請求項1~5の何れかに記載の窒化アルミニウム単結晶の製造方法。
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