WO2011052161A1

WO2011052161A1 - Curable resin composition for optical semiconductor encapsulation, and cured product of same

Info

Publication number: WO2011052161A1
Application number: PCT/JP2010/006217
Authority: WO
Inventors: 義浩川田; 正人鎗田
Original assignee: 日本化薬株式会社
Priority date: 2009-10-29
Filing date: 2010-10-20
Publication date: 2011-05-05
Also published as: KR20120095879A; CN102597042A; TW201125887A; JPWO2011052161A1

Abstract

Disclosed is a curable resin composition for optical semiconductor encapsulation which contains: a multi-functional biphenyl novolac epoxy resin component (A); a bisphenol epoxy resin (B) having an epoxy equivalent weight of 500-800g/eq; a bisphenol epoxy resin (C) having an epoxy equivalent weight of 850-1500g/eq; a multi-functional anhydride curing component (D); a phenol curing component (E) having a biphenyl skeleton or an alicyclic skeleton; and a (meth)acrylate component (F) having a phosphoric acid group. During transfer molding the resin composition exhibits excellent reactivity, has a short gel time, and does not include voids; under the high temperatures during mold removal, the resin composition exhibits excellent hardness, and has excellent gate-break properties. Additionally the encapsulated optical semiconductor element which can be obtained using the composition exhibits excellent re-flow properties.

Description

Curable resin composition for optical semiconductor encapsulation, and cured product thereof

The present invention relates to a curable resin composition for optical semiconductor encapsulation. More specifically, it can be manufactured only by the kneading process, suitable for transfer molding, reactivity and hardness at heat, mold release from mold, prevention of void entrainment, and removal of lead frame from runner resin after mold release (Hereinafter referred to as a gate break process) excellent in curable resin composition for encapsulating an optical semiconductor excellent in lead-free solder resistance after moisture absorption, when there is no resin leakage from the mold and when it is molded and cured, and its The present invention relates to an optical semiconductor element sealed with a cured product.

Conventionally, a low-pressure transfer molding method (hereinafter referred to as transfer molding method) has been adopted as a method for sealing an optical semiconductor element from the viewpoint of mass productivity. As a sealing material used in the molding method, an epoxy resin has been adopted in terms of a balance of heat resistance, transparency, mechanical properties, and economy. In particular, the combination of a bisphenol A type epoxy resin and an acid anhydride curing agent is excellent in terms of demoldability from a mold, which is an important item for transfer molding workability, and high heat hardness. Furthermore, from the viewpoint of transparency, compositions using hexahydrophthalic anhydride, tetrahydrophthalic anhydride and the like as acid anhydride curing agents have been widely used.
However, when the acid anhydride is used, only a resin composition having a very long gelation time can be obtained only by a simple adjustment operation such as kneading or mixing. For this reason, the composition is not suitable for transfer molding because resin leakage from the mold and void entrainment occur. Therefore, in Patent Document 1 (Japanese Patent Laid-Open No. 3-3258), there is currently provided a metamorphic process (or B-stage) by ripening or the like, and a means for adjusting to mass productivity is provided separately. The modification process is regarded as a problem that the economic efficiency is low in the production process of the resin composition. From the viewpoint of the production process of the resin composition, it is desired to obtain a composition suitable for mass productivity at the time of transfer molding only by kneading or mixing process.

In terms of reactivity, generally speaking, it is advantageous to use polyfunctional acid anhydrides. However, polyfunctional acid anhydrides available on the market are crystalline compounds, and their melting points are usually higher than the temperature range (around 150 °) in which transfer molding is usually performed. Specific examples include TMEG100 (melting point: 178 ° C.) and Nippon Benikane tetracarboxylic acid anhydride (melting point: 190 ° C.). For this reason, when used as a curing agent, the crystals cannot be melted by heat at the transfer molding temperature (around 150 ° C.), and the curing agent that has not melted causes foreign matter. Therefore, the present condition is that examination which uses polyfunctional acid anhydride as a component for sealing materials for optical semiconductors is not fully carried out.
There is also a gate break process in which the lead frame is removed from the runner after the transfer molding. The polyfunctional acid anhydride curing agent has high adhesion. Therefore, there is a problem that the lead frame frame is difficult to come off from the runner portion. If removed by hand, the lead frame frame will be deformed. At present, the gate breakability in the case of using a polyfunctional acid anhydride has not been sufficiently studied.
In consideration of workability in the sealing material for optical semiconductors, it is also important to prevent resin leakage and void entrainment during transfer molding.
The examination of the resin composition that can satisfy all of the above problems and workability at the time of transfer molding is still insufficient.

Fixing a large number of electronic components (including semiconductor elements) on a printed board or the like with solder is called a solder mounting process. Specifically, a semiconductor element sealed with an epoxy resin or the like is mounted on a printed circuit board pre-applied with a solder paste, and a lead-free solder melting furnace (usually called a solder reflow furnace) (The temperature reaches 220 ° C. to 270 ° C. above the melting point of the solder), and the semiconductor element is mounted on a printed circuit board or the like. Lead-free solder means solder that does not use lead from the viewpoint of environmental conservation in recent years. Lead-free solder has a high melting temperature, and it is necessary to heat the reflow furnace to 240 ° C. or higher. It is known that a semiconductor element usually sealed with an epoxy resin or the like absorbs moisture (water) in the air. When the lead-free solder mounting process described above is performed with the moisture absorbed, the temperature in the reflow furnace is higher than when using lead solder (about 240 ° C to 270 ° C). Is known to cause rapid volume expansion in the resin and cause peeling at the interface with the lead frame in the sealing resin. Since such peeling reduces the reliability of the semiconductor element, such as damage to the gold wire, it is necessary to suppress the peeling that occurs in the lead-free solder process as much as possible.
When sealing a semiconductor element such as an IC, flash memory, or LSI (hereinafter referred to as “usually a semiconductor element” to distinguish it from an optical semiconductor element), peeling in the previous lead-free solder mounting process In order to minimize the amount of water, a filler such as silica is contained in an amount of 80% by weight (wt) or more, and means for reducing the moisture absorption amount is taken. On the other hand, when sealing an optical semiconductor element (showing a case where light needs to pass through a sealing resin such as a photodiode or LED), it is necessary to ensure light transmittance in terms of characteristics. The above-described means of charging the filler cannot be used because dust is generated in the sealing resin. The sealing material for optical semiconductor elements is more frequently peeled off in the lead-free solder mounting process performed in a moisture-absorbing state than the sealing material for semiconductor elements, and lead-free solder resistance (solder reflow, solder resistance, etc.) It has a very important problem of lowering. In other words, a sealing material for a semiconductor element usually has a large property obtained by blending a silica filler. In other words, it is difficult to apply a sealing material for an optical semiconductor element by simply removing the filler from the sealing material for a semiconductor element, and it is possible to optimize the sealing resin without the filler. It is essential.

As described in Patent Document 2 (Japanese Patent Laid-Open No. 2001-2758) and Patent Document 3 (International Publication No. WO2004 / 031257), a terpene skeleton phenol curing agent or biphenyl skeleton epoxy resin is used to improve solder resistance after moisture absorption. There is an example of an optical semiconductor encapsulating material containing. However, although these patent documents describe that they are excellent in solder resistance, there is no description about workability at the time of transfer molding, which is a part of the object of the present invention, and demoldability from a mold. No mention is made of such things. In recent years, it has been pointed out that when the terpene skeleton phenol curing agent described in these patent documents is used, the releasability from the mold during transfer molding is extremely inferior. The sealing materials described in these patent documents do not satisfy the requirements as sealing materials for optical semiconductor elements. Further, Patent Document 4 (Japanese Patent Laid-Open No. 4-318023) and Patent Document 5 (Japanese Patent Laid-Open No. 4-318056) describe a solder for a composition for encapsulating a semiconductor element by using a terpene skeleton phenol curing agent and silica as essential components. It describes that heat resistance is improved. However, in this patent document, silica is an essential component, and it is obvious that the cited composition cannot be simply applied to the sealing material for optical semiconductors for the reason mentioned above. These patent documents do not describe that they can be used as a sealing material for optical semiconductor elements. In addition to the effect of reducing moisture absorption as described above, the effect of filling with silica increases the elastic modulus of the sealing resin by high filling with silica, so that it can be removed from the mold. It is well known that it also works.
In consideration of demoldability, the epoxy resin composition described in Patent Documents 4 and 5 is for optical semiconductor elements as in Patent Documents 2 and 3 under the restriction that silica cannot be filled with a sealing material for optical semiconductor elements. As a sealing material, it does not satisfy market requirements.

As is apparent from the above, as a sealing material for an optical semiconductor element, it can be manufactured only by a kneading process, is suitable for transfer molding, and has a mold workability such as mold release from a mold or after moisture absorption. There is no known resin composition for a sealing material that also has lead-free solder resistance.

JP-A-3-3258 Japanese Patent Laid-Open No. 2001-2758 WO2004 / 031257 pamphlet JP-A-4-318023 JP-A-4-318056

The present invention can be manufactured only by kneading or mixing process, is suitable for mass production at the time of transfer molding, does not cause resin leakage at the time of molding, suppresses entrainment of voids, has high heat hardness, and is released from the mold. An object of the present invention is to provide a curable resin composition for encapsulating an optical semiconductor which is excellent in workability during transfer molding, such as the property of a resin and gate break, and also excellent in lead-free solder resistance after moisture absorption.

The present inventors have found that an epoxy resin composition for optical semiconductors satisfying the above problems can be obtained as a result of intensive studies to solve the above-mentioned problems. That is, the present invention relates to the following (1) to (11).

(1) A curable resin composition for sealing an optical semiconductor comprising the following components (A) to (F):
(A) General formula (1)

(Wherein R _{1 s} may be the same or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom. N is 0 to 10) Epoxy resin represented by the following formula:
(B) General formula (2)

(Wherein R _{2 s} may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom. R ₃ represents Which may be the same or different from each other, each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom, and m is an average value of the number of repetitions of 0 to 10. .)
An epoxy resin having an epoxy equivalent of 500 to 800 g / eq,
(C) an epoxy resin represented by the general formula (2) and having an epoxy equivalent of 850 to 1500 g / eq,
(D) A polyfunctional acid anhydride curing agent having two or more carboxyl groups and acid anhydride groups in one molecule, or two or more acid anhydride groups alone,

(E) At least one selected from the group consisting of compounds represented by the following formulas (15), (18) and (19) as a phenolic curing agent,
Formula (15)

{In the formula, o is an average value of the number of repetitions of 0 to 10, R ₈ is the following formula (16)

(Wherein R ₉ may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom) or the following formula ( 17)

(Wherein R _{10 s} may be the same as or different from each other and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom). },

Formula (18)

(Wherein R _{11 s} may be the same or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom).
Formula (19)

(Wherein R _{12 s} may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom), and (F ) A (meth) acrylate having a phosphate group.

(2) The curable resin composition for optical semiconductor encapsulation according to (1), further comprising (G) a curing accelerator.
(3) Component (F) is represented by the following formula (24)

Wherein n is an integer from 0 to 3, a is a positive number from 1 to 2, and b is a positive number from 1 to 2, provided that a + b = 3. The curable resin composition for optical semiconductor sealing as described in 1) or (2).
(4) The above (1) to (1), wherein the total amount of the epoxy resin is 100 wt%, the component (A) is 10 to 35 wt%, the component (B) is 20 to 55 wt%, and the component (C) is 20 to 55 wt%. The curable resin composition for optical semiconductor encapsulation according to any one of (3).

(5) In the above (1) to (4), the component (D) is at least one selected from the group consisting of compounds represented by the following formulas (3), (6) and (7) The curable resin composition for optical semiconductor encapsulation according to any one of the above,

(Wherein R ₄ represents formula (4)

Or formula (5)

The coupling position is not particularly limited. ),

Formula (6)

(Wherein R ₅ represents a linear or branched alkylene chain having 1 to 5 carbon atoms which may have a substituent, a cyclohexane skeleton or a benzene skeleton which may have a substituent),
Formula (7)

(Wherein R ₆ represents a linear or branched alkylene group having 1 to 5 carbon atoms which may have a substituent, a cyclohexane skeleton or a benzene skeleton which may have a substituent).

(6) The curable resin composition for optical semiconductor encapsulation according to any one of (1) to (5), wherein the component (D) is a compound represented by the following formula (8):
Incidentally, _{R 7} in the formula (8) exhibits the following formula (9) or (10).
Formula (8)

Formula (9)

Formula (10)

(7) In any one of the above (1) to (6), the component (D) is a compound represented by the following formula (11), formula (12), formula (13) or formula (14) The curable resin composition for optical semiconductor sealing of description.
Formula (11)

Formula (12)

Formula (13)

Formula (14)

(8) The compounding equivalent value of the curing agent component (D) is 0.30 to 0.80 and the compounding equivalent value of the component (E) is 0.20 to 0 with respect to 1 equivalent of epoxy group in the total amount of epoxy resin. Any one of (1) to (7) above, wherein the sum of the blending equivalent value of component (D) and the blending equivalent value of component (E) is in the range of 0.70 to 1.20. The curable resin composition for optical semiconductor sealing of description.
(9) The curable resin composition for optical semiconductor encapsulation according to any one of (3) to (7), further comprising (G) a curing accelerator.
(10) The optical semiconductor package according to (9), wherein the content ratio of the component (F) and the component (G) is a weight ratio, and the component (F) / component (G) = 0.2 to 3.0. Curable resin composition for stopping.
(11) An optical semiconductor element sealed with a cured product obtained by heating the curable resin composition according to any one of (1) to (10).

The resin composition for encapsulating an optical semiconductor of the present invention can be produced only by kneading or mixing steps, and is excellent in mass productivity in transfer molding. The optical semiconductor element sealed with the resin composition is excellent in lead-free solder resistance.
That is, the composition has a high reactivity during transfer molding, a short gel time, no resin leakage from the mold, suppresses the entrainment of voids, and has a high hot hardness after molding, so that it can be removed from the mold. It is suitable for mass production because of its excellent moldability and gate breakability, and excellent workability during transfer molding. Moreover, the optical semiconductor element sealed with the resin composition is excellent in lead-free solder resistance after moisture absorption even though the filler is not blended in the resin composition.
Therefore, the curable resin composition of the present invention is extremely useful as a sealing material for optical semiconductors.

The component (A) will be described in detail.
The component (A) used in the present invention is a biphenol type epoxy resin represented by the general formula (1).
In the general formula (1), R ₁ is a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, or a straight or branched carbon number of 1 -8 alkyl groups, or halogen atoms such as chlorine, bromine and iodine. In the general formula (1), a plurality of the functional groups of R ₁ may be the same or different from each other, but all of them are particularly preferably hydrogen atoms. In the general formula (1), n is an average value of the number of repetitions of 0 to 10.

In the present invention, in order to satisfy mass productivity (tact performance) at the time of transfer molding, the reactivity of the resin composition is high, and further, resin deformation of the eject pin (extrusion rod) used at the time of demolding is prevented. Therefore, it is required to develop a high hot hardness. In that respect, the softening point of the biphenol type epoxy resin of the component (A) is preferably 50 ° C. or higher. If the softening point is too low, the heat hardness and reactivity are lowered. Moreover, the viscosity at the time of melting of the composition also decreases, and resin leakage or void entrainment occurs during transfer molding. In order to reduce the above problems at the time of transfer molding, the softening point of the component (A) is more preferably 60 ° C. or higher. Although there is no particular upper limit, it is usually 150 ° C. or lower, preferably 120 ° C. or lower.
As such an epoxy resin, for example, NC-3000, NC-3000H manufactured by Nippon Kayaku Co., Ltd., in which R _{1 in the} general formula (1) is a hydrogen atom, are commercially available.
As a method for producing the compound represented by the general formula (1), 4,4′-bisalkoxymethylbiphenyl or 4,4′-which may have the alkyl group or halogen atom on the benzene ring. A phenol resin is synthesized by condensing a substituted methylene biphenyl compound such as bishalogenomethylbiphenyl and a phenol under acidic conditions. Furthermore, the compound of General formula (1) can be obtained by making this phenol resin and epihalohydrins react in presence of an alkali metal hydroxide. Examples of phenols used in the above reaction include phenol, orthocresol, paracresol, and metacresol. These are preferable examples, but are not limited thereto.

Next, components (B) and (C) will be described in detail.
Both the component (B) and the component (C) used in the present invention are bisphenol type epoxy resins represented by the general formula (2), and the epoxy equivalent of the component (B) is 500 to 800 g / eq, The epoxy equivalent of component (C) is 850 to 1500 g / eq. In the present invention, it is important to use the component (B) and the component (C) together with the component (A).
R ₂ in the general formula (2) is a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, or a straight or branched carbon number of 1 -8 alkyl groups, or halogen atoms such as chlorine, bromine and iodine. A plurality of R ₂ functional groups present in the general formula (2) may be the same or different from each other, but those in which all are hydrogen atoms are particularly preferred.
R ₃ in the general formula (2) is a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, or a straight or branched carbon number of 1 -8 alkyl groups, or halogen atoms such as chlorine, bromine and iodine. A plurality of R ₃ present in the general formula (2) may be the same or different from each other, but all of them are particularly preferably methyl groups. M in the general formula (2) is an average value of the number of repetitions of 0 to 10.
For example, such epoxy resins include bisphenol A type epoxy resin, bisphenol F type epoxy resin, tetramethyl bisphenol A type epoxy resin, dimethyl bisphenol A type epoxy resin, tetramethyl bisphenol F type epoxy resin, dimethyl bisphenol F type epoxy resin. Resins and the like are listed, and all are available from the market.

Further, in the present invention, in order to prevent the resin from being deformed by the eject pin used at the time of transfer molding demolding, it is required to exhibit a high heat hardness. In order to satisfy this requirement, it is preferable to use a bisphenol type epoxy resin of formula (2) having an epoxy equivalent in the range of 500 to 800 g / eq as component (B). In particular, the epoxy equivalent is preferably in the range of 600 to 700 g / eq. If the epoxy equivalent is too low, even when high heat hardness can be exhibited, the viscosity at the time of melting of the composition tends to decrease, and resin leakage or void entrainment tends to occur during transfer molding. Moreover, since the softening point of resin becomes low, handling workability may be inferior.
As an epoxy resin having an epoxy equivalent in the range of 500 to 800 g / eq, for example, E1001 and E1002 manufactured by JER (Japan Epoxy Resin) in which R _{2 in the} general formula (2) is a hydrogen atom and R ₃ is a methyl group, Toto Kasei Examples thereof include YD-012 and YD-902 manufactured by KK.

In the present invention, at the time of transfer molding, it is very important as a transparent sealing resin to suppress void entrainment. When many voids are generated, the light is scattered when the light is transmitted. As a result, the product characteristics as an optical semiconductor deteriorate. When the epoxy equivalent of the component (C) bisphenol-type epoxy resin is in the range of 850 to 1500 g / eq, it is preferable because void entrainment is suppressed and other properties are not adversely affected. If the epoxy equivalent is too high, there is no problem in suppressing void entrainment, but it is not preferable because the hot hardness is significantly reduced. Furthermore, the softening point is too high and the handling workability tends to be inferior. When the above epoxy equivalent is 850 to 1200 g / eq, it is more preferable from the viewpoint of balance between hardness upon heating and suppression of voids. Examples of the epoxy resin having an epoxy equivalent in the range of 850 to 1500 g / eq include Toto Kasei Co., Ltd. such as E1004 manufactured by JER (Japan Epoxy Resin) in which R _{2 in the} general formula (2) is a hydrogen atom and R ₃ is a methyl group. Examples thereof include YD-904, YD-907, YD-014, YD-017 and the like manufactured by KK.

In the curable resin composition of the present invention, as described above, requirements in workability for increasing mass productivity at the time of transfer molding, for example, increasing the reactivity of the composition, high heat at the time of demolding An optical semiconductor element sealed with a cured product of the resin composition, which satisfies all the requirements of expressing hardness, further suppressing the occurrence of resin leakage and void entrainment during transfer molding, and the cured product It is important to simultaneously satisfy the requirement of having excellent lead-free solder resistance after moisture absorption. In order to overcome these requirements, it is preferable to control the blending ratio of the components (A), (B), and (C). That is, the total amount of the epoxy resin used in the composition is 100 wt%, and it is necessary to adjust and blend so that the content ratio of each component (A), component (B), and component (C) satisfies the following conditions. is there.
Component (A): 10 to 35 wt%
Component (B): 20 to 55 wt%
Component (C): 20 to 55 wt%
In the above, the total content of the component (B) and the component (C) is preferably 65 to 90 wt%, more preferably 70 to 90 wt%, still more preferably with respect to the total of the components (A) to (C). Is about 80 to 90 wt%. The balance is component (A).

At this time, if the amount of the component (A) is too small, the reactivity of the composition is lowered, and further, the hot hardness is lowered, so that the above-mentioned requirements tend not to be satisfied. Moreover, when there are too many components (A), the viscosity at the time of fusion | melting of this composition will fall rapidly, and resin leakage or void entrainment may generate | occur | produce.
If the amount of the component (B) is too small, the hardness at the time of heating is lowered, and if it is too large, the viscosity at the time of melting of the composition is lowered, and resin leakage or void entrainment may occur.
If the component (C) is too small, void entrainment occurs. On the other hand, when the amount is too large, the hot hardness may be lowered.
When each component (A), (B), (C) is adjusted within the above range, it is combined with the components (D) to (F) described later, so that reactivity, heat hardness, resin leakage, void entrainment, moisture absorption Since the resin composition of this invention which satisfy | fills all the requirements regarding subsequent lead-free solder tolerance simultaneously can be prepared easily, it is preferable.
In the present invention, the total amount of epoxy resin is usually the sum of components (A), (B), and (C). However, if necessary, when other epoxy resins to be described later are added, the total amount may be added. In addition, the ratio of the total amount of the epoxy resin to the total amount of the curable resin composition of the present invention is about 40 to 90 wt%, preferably 50 to 85 wt%, and more preferably 60 to 85 wt%. It is more preferable when the content of these epoxy resins is the total amount of components (A), (B) and (C).

In the present invention, in addition to the components (A), (B), and (C), other resins can be added as long as the workability during the transfer molding is not adversely affected.
For example, diglycidyl etherified products other than the above general formula (1) and general formula (2), specifically, polyfunctional epoxy resins, alicyclic epoxy resins, aliphatic epoxy resins, heterocyclic epoxy resins, glycidyl Examples thereof include ester-based epoxy resins, glycidylamine-based epoxy resins, and epoxy resins obtained by glycidylation of halogenated phenols.
Examples of the polyfunctional epoxy resin include glycidyl etherified products of polyphenol compounds and glycidyl etherified products of various novolak resins. Examples of glycidyl etherified products of polyphenol compounds include bisphenol S, 4,4′-biphenylphenol, tetramethylbisphenol S, dimethylbisphenol S, tetramethyl-4,4′-biphenol, dimethyl-4,4′-biphenylphenol, 1 -(4-Hydroxyphenyl) -2- [4- (1,1-bis- (4-hydroxyphenyl) ethyl) phenyl] propane, 2,2'-methylene-bis (4-methyl-6-tert-butylphenol ), 4,4′-butylidene-bis (3-methyl-6-tert-butylphenol), trishydroxyphenylmethane, resorcinol, hydroquinone, pyrogallol, phenols having a diisopropylidene skeleton, 1,1-di-4- Full of hydroxyphenylfluorene Phenols having skeleton include glycidyl ethers of polyphenol compounds phenol polybutadiene or the like. Examples of glycidyl etherified products of various novolak resins include novolak resins made from various phenols such as phenol, cresols, ethylphenols, butylphenols, octylphenols, bisphenol A, bisphenol F, bisphenol S, naphthols, and xylylene skeletons Examples thereof include glycidyl etherified products of various novolak resins such as phenol novolac resin, dicyclopentadiene skeleton-containing phenol novolak resin, and fluorene skeleton-containing phenol novolak resin.

Examples of the alicyclic epoxy resin include alicyclic epoxy resins having an aliphatic skeleton such as cyclohexane such as 3,4-epoxycyclohexylmethyl 3 ′, 4′-cyclohexylcarboxylate.
Examples of the aliphatic epoxy resin include glycidyl ethers of polyhydric alcohols such as 1,4-butanediol, 1,6-hexanediol, polyethylene glycol, polypropylene glycol, pentaerythritol, and xylylene glycol derivatives.
Examples of the heterocyclic epoxy resin include heterocyclic epoxy resins having a heterocyclic ring such as an isocyanuric ring and a hydantoin ring.
Examples of the glycidyl ester epoxy resin include epoxy resins obtained by glycidylation of carboxylic acids such as hexahydrophthalic acid diglycidyl ester and tetrahydrophthalic acid diglycidyl ester.
Examples of the glycidylamine-based epoxy resins include epoxy resins obtained by glycidylating amines such as aniline, toluidine, p-phenylenediamine, m-phenylenediamine, diaminodiphenylmethane derivatives, and diaminomethylbenzene derivatives.
Halogenated phenols such as brominated bisphenol A, brominated bisphenol F, brominated bisphenol S, brominated phenol novolak, brominated cresol novolac, chlorinated bisphenol S, and chlorinated bisphenol A are used as epoxy resins obtained by glycidylation of halogenated phenols. Examples thereof include epoxy resins obtained by glycidylation of phenols.

There are no particular restrictions on the use of these epoxy resins, but those with less colorability are more preferred from the viewpoint of transparency. Usually, bisphenol S, 4,4′-biphenylphenol, tetramethyl-4,4′-biphenol, 1- (4-hydroxyphenyl) -2- [4- (1,1-bis- (4-hydroxyphenyl) Ethyl) phenyl] propane, trishydroxyphenylmethane, resorcinol, 2,6-ditert-butylhydroquinone, phenols having a diisopropylidene skeleton, phenols having a fluorene skeleton such as 1,1-di-4-hydroxyphenylfluorene Glycidylated polyfunctional epoxy resins; phenols, cresols, bisphenol A, bisphenol S, novolak resins made from various phenols such as naphthols, dicyclopentadiene skeleton-containing phenol novolac resins, biphenyl skeleton-containing phenols Glycidyl etherified products of various novolak resins such as a rack resin and a fluorene skeleton-containing phenol novolak resin; an alicyclic epoxy resin having a cyclohexane skeleton such as 3,4-epoxycyclohexylmethyl 3 ′, 4′-cyclohexylcarboxylate; -Glycidyl ethers of hexanediol, polyethylene glycol, polypropylene glycol; triglycidyl isocyanurate, hexahydrophthalic acid diglycidyl ester is used, and a biphenyl skeleton-containing phenol novolac resin is preferred. Furthermore, these epoxy resins can be used in combination as one or a mixture of two or more as required. Those epoxy resins having an epoxy equivalent of 100 to 1700 g / eq, preferably 200 to 1000 g / eq can be used. Furthermore, the softening point of these epoxy resins is preferably 130 ° C. or lower in consideration of workability during production. These epoxy resins can be appropriately added within the range of 0 to 20 wt% with respect to the total amount of components (A) to (C), if necessary.

Next, the components (D) and (E) will be described in detail.
In the present invention, a high reactivity suitable for transfer molding only through a kneading or mixing production process without passing through an aging process, or high heat hardness, prevention of resin leakage and void entrainment, mold release from a mold, In order to satisfy all of the subsequent gate breakability and to satisfy lead-free solder resistance after moisture absorption, two or more carboxyl groups and acid anhydride groups are combined in one molecule as component (D), or acid anhydride. It is important to use a polyfunctional acid anhydride curing agent having only two or more physical groups and a phenolic curing agent in combination as the component (E).

In the present invention, a polyfunctional acid anhydride is used as the component (D) in order to satisfy high reactivity suitable for transfer molding and high heat hardness. If it is a polyfunctional acid anhydride, there will be no restriction | limiting in particular. As a reactive group, it is important to have two or more carboxyl groups and acid anhydride groups in one molecule, or two or more acid anhydride groups alone. Examples of the polycyclic acid anhydride used in the present invention include the above formula (3), formula (6), formula (7), formula (8), formula (11), formula (12), formula (13). The polyfunctional acid anhydride represented by Formula (14) is preferable.
Examples of R ₄ in the compound of the formula (3) include a trivalent group of a cyclohexane ring of the formula (4) or a benzene ring of the formula (5). The coupling position is not particularly limited. When R ₄ is a cyclohexane ring of the formula (4), for example, 1,2,4 cyclohexane tricarboxylic acid-1,2 anhydride (manufactured by Mitsubishi Gas Chemical Co., Inc., H-TMA), R ₄ is a formula (5) In the case of the benzene ring, for example, trimellitic anhydride (manufactured by Mitsubishi Gas Chemical Co., Inc.) can be obtained from the market.
As R ₅ in formula (6) and R ₆ in formula (7), a linear or branched alkylene chain having 1 to 8 carbon atoms, a divalent group of a cyclohexane skeleton having a substituent, or And a divalent group of a benzene skeleton. Examples of the substituent include a linear or branched alkyl group having 1 to 8 carbon atoms such as methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, and octyl group, or chlorine, bromine And halogen atoms such as iodine. Usually, as R ₅ in formula (6) and R ₆ in formula (7), a linear alkylene chain having 1 to 5 carbon atoms is preferable in consideration of workability. Examples of such a compound include ethylene glycol bis (anhydro trimellitate) (including trimellitic anhydride in part), such as Licacid TMEG-S (hereinafter simply referred to as TMEG-S) or Licacid. TMEG-600 (hereinafter simply referred to as TMEG-600) and the like are available on the market as the Ricacid TMEG series (manufactured by Shin Nippon Rika Co., Ltd.).
Usually, at least one selected from the group consisting of formula (3), formula (6) and formula (7) is preferred.

Next, examples of R ₇ in the formula (8) include a tetravalent group of the cyclohexane ring in the formula (9) or a tetravalent group of the benzene ring in the formula (10). For example, in the case of the cyclohexane ring of the formula (9), pyromellitic anhydride nuclear hydrogenated product, and in the case of the benzene ring of the formula (10), pyromellitic anhydride is obtained from the market. It is available.
In addition, as the polyfunctional acid anhydride curing agent (D), compounds represented by the above formulas (11) to (14) can be used. For example, the compound of the formula (11) is a benzophenone tetracarboxylic acid anhydride, the compound of the formula (12) is Rikacide TMTA-C (manufactured by Shin Nippon Chemical Co., Ltd.), and the compound of the formula (13) is Rikacide The compound of DSDA (manufactured by Shin Nippon Rika Co., Ltd.) and the compound of formula (14) can be obtained from the market as Ricacid TDA-100 (manufactured by Shin Nippon Rika Co., Ltd.).

As a component (E), the phenol type hardening | curing agent as shown to Formula (15), Formula (18), and Formula (19) is essential in the point of the gate-break property after demolding.
R ₈ in the formula (15) represents a biphenylene group which may have a substituent of the formula (16) or a phenylene group which may have a substituent of the formula (17). In the formula (15), o is an average value of the number of repetitions of 0 to 10.
_{R 9} in the formula (16), _{R 10} in the formula (17), _{R 11} in the formula (18), as _{R 12} in formula (19) is a hydrogen atom, a methyl group, an ethyl group, a propyl group, A linear or branched alkyl group having 1 to 8 carbon atoms such as a butyl group, a pentyl group, a hexyl group, a heptyl group or an octyl group, or a halogen atom such as chlorine, bromine or iodine. When there are a plurality, they may be the same as or different from each other. Usually, these substituents are preferably hydrogen atoms.

In view of workability during transfer molding, the component (E) preferably has a softening point of 50 ° C. or higher and 130 ° C. or lower. Examples of such a curing agent include GPH-65 and GPH-103 (made by Nippon Kayaku Co., Ltd.) represented by the following formula (20), XYLOCK XEL-3L (produced by Mitsui Chemicals) represented by the following formula (21), YP90 (manufactured by Yasuhara Chemical Co., Ltd.), which is a mixture of the formula (22) and the following formula (23), is available from the market.
Formula (20) (specific structures of GPH-65 and GPH-103)

(Wherein p represents an average value of the number of repetitions of 0 to 10)

Formula (21) (Concrete structure of XYLOCK XEL-3L)

(In the formula, q represents an average value of the number of repetitions of 0 to 10)

Formula (22)

Formula (23)

Since the curable resin composition of the present invention is used as an encapsulant for optical semiconductors, it is preferable to avoid hindering transparency. Component (D) often has a melting point of 150 ° C. or higher. Therefore, when the composition is kneaded or mixed and used with the melting point of the component (D) being 150 ° C. or higher, the cured product is uneven due to the undissolved material of the component (D) or foreign matter remains. become. In order to avoid this problem, it is preferable to use the component (D) in a state where crystals are melted in advance. The means is not particularly limited, and examples thereof include a method in which two or more kinds of compounds that can be used as the component (D) are once dissolved and mixed, and the melting point is lowered using the phenomenon of melting point lowering. Here, it is important to adjust the melting point after mixing to be lower than the molding temperature of the transfer. As another method, compounds that can be used as component (D) by dissolving component (E) in advance in an organic solvent (for example, methyl ethyl ketone (MEK)) that can dissolve component (E). Mix. Thereafter, the solvent is removed at a temperature close to the melting point of the component (D) with a vacuum heating device, and the melting point of the mixture can be adjusted to be equal to or lower than the transfer molding temperature. In addition, when the component (D) is produced, it is also possible to use a compound in which the compound has two or more kinds so that its melting point is lower than the transfer molding temperature due to the phenomenon of melting point drop.

In the present invention, it is an object to provide the resin composition excellent also in the gate break process.
The gate break process will be described in detail.
In transfer molding, there is a gate break process in which the lead frame frame is manually removed from the runner portion after demolding. At this time, it is important that the lead frame does not bend and can be removed easily by hand, and if it is good, the gate breakability is excellent.
Conversely, if it cannot be removed unless a considerable force is applied and the lead frame is bent as a result, the gate breakability is inferior. If the lead frame is bent, it cannot proceed to the next process.
In transfer molding, to achieve both reactivity, heat hardness, gate breakability, and lead-free solder resistance after moisture absorption, polyfunctional acid anhydride curing agent of component (D), phenolic curing of component (E) The above requirements may not be achieved by simply containing an agent. Therefore, with respect to 1 equivalent of epoxy group in the total amount of epoxy resin, the blending equivalent of polyfunctional acid anhydride curing agent (D) (equivalent of acid anhydride group and carboxyl group) and the blending equivalent of phenolic curing agent (E) ( It is more preferable to control (hydroxyl equivalent) under the following conditions.
Compounding equivalent value of curing agent component (D): 0.30 to 0.80 equivalent Compounding equivalent value of curing agent component (E): 0.20 to 0.60 equivalent [However, (compounding equivalent value of component (D) ) + (Blending equivalent value of component (E)) = 0.70 to 1.20 equivalent. ]

If the compounding equivalent value of component (D) is too small, the reactivity at the time of transfer molding is inferior, and further, the hardness at the time of heating is also reduced. Moreover, when the compounding equivalent value of a component (D) is too large, gate break property will be extremely inferior. If the blending equivalent value of component (E) is too large, it will cause a decrease in hardness during heating and a decrease in solder resistance after moisture absorption. Moreover, when the total of the compounding equivalent value of a component (D) and the compounding equivalent value of a component (E) is too small, a glass transition point (henceforth Tg) may become low. On the other hand, if the total is too large, Tg is increased and cracks are likely to occur in the solder mounting process.

In the present invention, as the curing agent component, it is preferable to use the curing agent components (D) and (E) together so that the amount becomes 100 wt%. Other curing agents can be used as long as they do not cause harmful effects. For example, bisphenol A, bisphenol F, bisphenol S, 4,4′-biphenylphenol, tetramethyl bisphenol A, dimethyl bisphenol A, tetramethyl bisphenol F, dimethyl bisphenol F, tetramethyl bisphenol S, dimethyl bisphenol S, tetramethyl-4 , 4′-biphenol, dimethyl-4,4′-biphenylphenol, 1- (4-hydroxyphenyl) -2- [4- (1,1-bis- (4-hydroxyphenyl) ethyl) phenyl] propane, 2 , 2'-methylene-bis (4-methyl-6-tert-butylphenol), 4,4'-butylidene-bis (3-methyl-6-tert-butylphenol), trishydroxyphenylmethane, resorcinol, hydroquinone, pyrogallo Phenols having a fluorene skeleton such as 1,1-di-4-hydroxyphenylfluorene; phenolized polybutadienes; phenols, cresols, ethylphenols, butylphenols, octylphenols, bisphenol A, bisphenol F, bisphenol S, Various novolak resins such as novolak resins made from various phenols such as naphthols; xylylene skeleton-containing phenol novolak resins; dicyclopentadiene skeleton-containing phenol novolac resins; fluorene skeleton-containing phenol novolak resins;
In addition to the above, other curing agents can be used in combination as long as physical properties are not hindered. For example, acid anhydride curing agents include aromatic carboxylic anhydrides such as phthalic anhydride, aliphatic carboxylic anhydrides such as azelaic acid, sebacic acid, dodecanedioic acid, tetrahydrophthalic anhydride, hexahydro Examples thereof include alicyclic carboxylic acid anhydrides such as phthalic acid anhydride, nadic acid anhydride, het acid anhydride, and hymic acid anhydride. When these curing agents are used in combination, the blending amount of curing agents other than the curing agent components (D) and (E) is about 0 to 0.3 equivalents relative to 1 equivalent of epoxy groups in the total amount of epoxy resin. The blending amount of all curing agent components including (D) and (E) is preferably in the range of 0.7 to 1.5 equivalents with respect to 1 equivalent of epoxy groups in the total amount of epoxy resin.

Next, the details of the (meth) acrylate component (F) having a phosphate group will be described.
The purpose of the present invention is for optical semiconductor encapsulation, which is compatible with workability during transfer molding such as reactivity, mold release from mold, gate breakability, etc., and also has excellent lead-free solder resistance after moisture absorption It is to provide a curable resin composition.
The component (F) can be used by appropriately changing the amount of the composition constituted according to the present invention. The object of the present invention can be better achieved by adding preferably within a certain range. The content of the component (F) with respect to the total amount of the resin composition of the present invention is preferably in the range of 0.01 wt% to 5.0 wt%. If the amount is too small, the adhesiveness may decrease and solder resistance after moisture absorption may be inferior. If the amount is too large, the adhesiveness may be improved, but the resin composition may have a negative effect on the curing acceleration, and curing after heat curing. A thing becomes fragile and the runner resin part breaks at the time of demolding by transfer molding, and the malfunction that it cannot finally demold may arise. From the viewpoint of the balance between the lead-free solder resistance and the mold release property, it is particularly preferably 0.1 wt% to 2.0 wt%, more preferably 0.1 wt% to 1.0 wt%, based on the total amount of the resin composition. It is good to contain a component (F).
Since the component (F) may affect the acceleration of curing, the combined use of the component (G) described later is preferable. When the component (G) is used in combination, a better effect can be obtained by controlling the use ratio with the component (F). Specifically, when the component (F) / component (G) is added in the range of 0.2 to 3.0, preferably 0.2 to 2.0, the balance between adhesion and curability is good. As for component (F), for example, PM-2 manufactured by Nippon Kayaku Co., Ltd. (in the following formula (24), n = 0, a is 1.5 on average, b is 1.5 on average), PM -21 (in formula (24) below, n = 1, a is 1.5 on average and b is 1.5 on average) is available from the market.
Formula (24)

(In the formula, n represents an integer of 0 to 3, a represents a positive number of 1 to 2, and b represents a positive number of 1 to 2, provided that a + b = 3.)

In the present invention, a component (G) curing accelerator can be further used.
The resin composition of the present invention containing the component (G) is one of the preferred embodiments of the present invention.
The component (G) is not particularly limited as long as it has a function of promoting the reaction between the epoxy resin and the curing agent. For example, 2-methylimidazole, 2-phenylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-phenylimidazole, 1-benzyl-2-methylimidazole 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazole, 2,4-diamino-6 (2′-methylimidazole (1 ′)) ethyl-s -Triazine, 2,4-diamino-6 (2'-undecylimidazole (1 ')) ethyl-s-triazine, 2,4-diamino-6 (2'-ethyl, 4-methylimidazole (1')) Ethyl-s-triazine, 2,4-diamino-6 (2′-methylimidazole (1 ′)) Cyl-s-triazine / isocyanuric acid adduct, 2-methylimidazole / isocyanuric acid 2: 3 adduct, 2-phenylimidazole / isocyanuric acid adduct, 2-phenyl-3,5-dihydroxymethylimidazole, 2-phenyl Various imidazoles such as -4-hydroxymethyl-5-methylimidazole and 1-cyanoethyl-2-phenyl-3,5-dicyanoethoxymethylimidazole; and these imidazoles and phthalic acid, isophthalic acid, terephthalic acid, trimellitic acid , Salts with polyvalent carboxylic acids such as pyromellitic acid, naphthalene dicarboxylic acid, maleic acid and succinic acid; amides such as dicyandiamide; diaza compounds such as 1,8-diaza-bicyclo (5.4.0) undecene-7 And those, phenols, and the above polyvalent carboxylic acids Or salts with phosphinic acids; ammonium salts such as tetrabutylammonium bromide, cetyltrimethylammonium bromide, trioctylmethylammonium bromide; phosphines such as triphenylphosphine and tetraphenylphosphonium tetraphenylborate; 2,4,6- Phenols such as trisaminomethylphenol; amine adducts; and microcapsule-type curing accelerators in which these curing agents are microcapsules; Among these accelerators, phosphines are preferable from the viewpoint of adhesion to the lead frame. Further, triphenylphosphine is more preferable in terms of suppressing reaction between epoxy resins.

In the present invention, the gel time at 150 ° C. needs to be 60 seconds or less from the viewpoint of reactivity. As a method of controlling the reactivity of the resin composition for encapsulating an optical semiconductor, the reactivity is adjusted by providing a modification period by means of heating after the composition is adjusted, or adjusted by the amount of the curing accelerator (G). The method of doing etc. is mentioned. The method of adjusting the reactivity by heating requires a certain amount of time. Furthermore, it is not preferable in terms of economics and technical difficulty, such as difficulty in determining the timing of metamorphosis. On the other hand, the adjustment by the amount of the curing accelerator (G) is excellent in terms of economy and simplicity compared to the above-mentioned modification means because the reactivity can be adjusted only by the control by the addition amount. . As an adjustment method based on the amount of the curing accelerator (G), for example, a gel time measuring machine can be used. Specifically, the gel time at 150 ° C. is preferably adjusted to 60 seconds or less, and preferably 50 seconds or less. At this time, if the gel time at 150 ° C. is long, the demoldability and tactability at the time of demolding are inferior, and furthermore, the hot hardness cannot be maintained high. These accelerators are preferably added so that the gel time is within the range to be adjusted. Specifically, it is in the range of 0.01 to 5.0 wt% with respect to the total amount of the composition, preferably 0.05 to 3.0 wt%, more preferably 0.1 to 2.0 wt%. is there. Moreover, it is as having mentioned above that it is preferable to control the use ratio with a component (F).
The total amount of the above components (D) to (G) is preferably 10 to 60% by weight, more preferably 15 to 50% by weight, and still more preferably 15 to 40% by weight with respect to the total amount of the resin composition.

A colorant, a leveling agent, a coupling agent, a lubricant, an adhesion-imparting agent, and the like can be appropriately added to the epoxy resin composition of the present invention depending on the purpose.
There are no particular restrictions on the colorant, and phthalocyanine, azo, disazo, quinacridone, anthraquinone, flavantron, perinone, perylene, dioxazine, condensed azo, azomethine series, infrared absorbers, ultraviolet absorbers, and other organic dyes, titanium oxide Inorganic pigments such as lead sulfate, chrome yellow, zinc yellow, chrome vermilion, valve shell, cobalt purple, bitumen, ultramarine, carbon black, chrome green, chromium oxide, cobalt green and the like.

Leveling agents include oligomers having a molecular weight of 4000 to 12000 made of acrylates such as ethyl acrylate, butyl acrylate, and 2-ethylhexyl acrylate, epoxidized soybean fatty acid, epoxidized abiethyl alcohol, hydrogenated castor oil, and titanium-based coupling agents. Can be mentioned. Lubricants include hydrocarbon lubricants such as paraffin wax, micro wax, polyethylene wax, higher fatty acid lubricants such as lauric acid, myristic acid, palmitic acid, stearic acid, arachidic acid, and behenic acid, stearylamide, palmitylamide, oleyl Higher fatty acid amide type lubricants such as amide, methylene bisstearamide, ethylene bisstearamide, hydrogenated castor oil, butyl stearate, ethylene glycol monostearate, pentaerythritol (mono-, di-, tri-, or tetra-) Higher fatty acid ester lubricants such as stearate, alcohol lubricants such as cetyl alcohol, stearyl alcohol, polyethylene glycol, polyglycerol, lauric acid, myristic acid, palmitic acid, stearic acid, arachidic acid, behe Acid, ricinoleic acid, such as magnesium naphthenate, calcium, cadmium, barium, zinc, metallic soaps are metal salts such as lead, carnauba wax, candelilla wax, beeswax, and natural waxes such as montan wax.

As coupling agents, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane N- (2-aminoethyl) 3-aminopropylmethyldimethoxysilane, N- (2-aminoethyl) 3-aminopropylmethyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-mercaptopropyltrimethoxysilane, Vinyltrimethoxysilane, N- (2- (vinylbenzylamino) ethyl) 3-aminopropyltrimethoxysilane hydrochloride, 3-methacryloxypropyltrimethoxysilane, 3-chloropropylmethyldimethoxysilane, 3-chloropropyltrime Silane coupling agents such as toxisilane; isopropyl (N-ethylaminoethylamino) titanate, isopropyl triisostearoyl titanate, titanium di (dioctyl pyrophosphate) oxyacetate, tetraisopropyl di (dioctyl phosphite) titanate, neoalkoxy tri Titanium coupling agents such as (pN- (β-aminoethyl) aminophenyl) titanate; Zr-acetylacetonate, Zr-methacrylate, Zr-propionate, neoalkoxy zirconate, neoalkoxy tris neodecanoyl zirconate Neoalkoxytris (dodecanoyl) benzenesulfonyl zirconate, Neoalkoxytris (ethylenediaminoethyl) zirconate, Neoalkoxytris (m-aminophenyl) zircoate Over DOO, zirconium coupling agents such as ammonium zirconium carbonate; Al- acetylacetonate, Al- methacrylate, aluminum coupling agents such as Al- propionate and the like. A silicon coupling agent is preferred. By using a coupling agent, moisture-reliability is excellent, and a cured product with little decrease in adhesive strength after moisture absorption can be obtained.

As the adhesion-imparting agent, besides the component (F), a phosphite compound and / or a phosphate compound and / or a compound containing an S element can be added.
Specific examples of phosphite compounds and / or phosphate compounds include di-2-ethylhexyl hydrogen phosphite, dilauryl hydrogen phosphite, dioleyl hydrogen phosphite, methyl acid phosphate, ethyl acid phosphate, isopropyl Acid phosphate, butyl acid phosphate, 2-ethylhexyl acid phosphate, isodecyl acid phosphate, lauryl acid phosphate, tridecyl acid phosphate and the like.
These may be used alone or in combination of two or more, but are not limited thereto. And the addition amount of the said phosphite compound and / or a phosphate compound will not be specifically limited if it is a range which does not impair the characteristic of this invention.

The addition amount of the phosphite compound and / or phosphite compound is preferably set to 0.01 to 5 wt% in the composition from the viewpoint of adhesiveness, and more preferably in the range of 0.1 to 3 wt%. It is. If the addition amount is small, it is difficult to obtain an adhesive effect, and if the addition amount exceeds the above range, Tg (glass transition point) or the like may be lowered.
Specific examples of the compound containing S element include n-dodecanethiol, n-nonanethiol, n-pentanethiol, ethylene glycol-bis-3-mercaptopropionate, diethylene glycol-bis-3-mercaptopropionate. Pionate, triethylene glycol-bis-3-mercaptopropionate, tetraethylene glycol-bis-3-mercaptopropionate, propylene glycol-bis-3-mercaptopropionate, dipropylene glycol-bis-3-mercapto Propionate, tripropylene glycol-bis-3-mercaptopropionate, trimethylolpropane-tris-3-mercaptopropionate, tris- (ethyl-3-mercaptopropionate) isocyanurate, pentaerythris Tall-tetrakis-3-mercaptopropionate, dipentaerythritol-hex-3-mercaptopropionate, tris (3-mercaptopropioamino) -1,3,5-triazine, 3,3′-thiodipropion Examples include acids, dithiodipropionic acid, lauryl thiopropionic acid, thioglycolic acid, ammonium thioglycolate, thioglycolic acid monoethanolamine, and diammonium dithiodiglycolate.

These may be used alone or in combination of two or more. Among them, tetraethylene glycol-bis-3-mercaptopropionate, trimethylolpropane-tris-3-mercaptopropionate, tris- (ethyl-3-mercaptopropionate) isocyanurate, pentaerythritol-tetrakis-3 -Mercaptopropionate and dipentaerythritol-hexa-3-mercaptopropionate, 3,3'-thiodipropionic acid, dithiodipropionic acid, laurylthiopropionic acid, thioglycolic acid, ammonium thioglycolate, thioglycol It is preferable to use acid monoethanolamine, diammonium dithiodiglycolate or the like alone or in combination. Further, from the viewpoint of adhesiveness, those having two or more S elements in one molecule are particularly preferable.
And the addition amount of the said specific thiol compound will not be specifically limited if it is a range which does not impair the characteristic of this invention. From the viewpoint of adhesiveness, it is preferably set to 0.01 to 10 wt% in the composition, and more preferably in the range of 0.1 to 5 wt%. If the addition amount is small, it is difficult to obtain an adhesive effect. If the addition amount exceeds the above range, Tg (glass point transfer) or the like may be lowered. These adhesion-imparting agents can be used alone or in combination of two or more.

Preferred embodiments of the curable resin composition of the present invention are as follows.
1. Component (A) is an epoxy resin in which R ₁ is a hydrogen atom in the general formula (1), and n is an average value of the number of repetitions of 0 to 10,
In component (B), in formula (2), R ₂ is a hydrogen atom, R ₃ is a methyl group, m is an average value of the number of repetitions of 0 to 10, and an epoxy equivalent is 500 to 800 g / eq. Epoxy resin,
In component (C), in formula (2), R ₂ is a hydrogen atom, R ₃ is a methyl group, m is an average value of the number of repetitions of 0 to 10, and an epoxy equivalent is 850 to 1500 g / eq. Epoxy resin,
The polyfunctional anhydride curing agent of component (D) is the above formula (3), formula (6), formula (7), formula (8), formula (11), formula (12), formula (13) and formula ( 14) at least one acid anhydride selected from the group consisting of polyfunctional acid anhydrides,
The phenolic curing agent of component (E) has at least one selected from the group consisting of the compounds represented by formulas (15), (18) and (19), and component (F) a phosphate group (Meth) acrylate,
A curable resin composition for sealing an optical semiconductor.
2. 2. The curable resin composition for optical semiconductor encapsulation according to 1 above, wherein the polyfunctional anhydride curing agent of component (D) is a polyfunctional acid anhydride represented by the formula (3) or formula (6).
3. 3. The compound of formula (3) is trimellitic anhydride, and the compound of formula (6) is ethylene glycol esterified trimellitic anhydride (R _{5 in} formula (6) is ethylene). Curable resin composition for optical semiconductor encapsulation.

4). Any of the above 1 to 3, wherein the phenolic curing agent of component (E) is at least one selected from the group consisting of compounds represented by the formulas (21), (22), (23) and (24) A curable resin composition for sealing an optical semiconductor according to claim 1.
5. The curable resin composition for optical semiconductor encapsulation according to any one of 1 to 4 above, wherein the component (F) is a phosphoric acid methacrylate represented by the formula (24).
6). 6. The curable resin composition for optical semiconductor encapsulation according to any one of 1 to 5, further comprising a component (G) a curing accelerator.
7). 7. The optical semiconductor encapsulation according to any one of 1 to 6 above, wherein the ratio of the total amount of the component (A), the component (B) and the component (C) is 40 to 90 wt% with respect to the total amount of the resin composition. Curable resin composition for stopping.
8). Containing 10 to 35 wt% of component (A), 20 to 55 wt% of component (B) and 20 to 55 wt% of component (C) with respect to the total amount of epoxy resin, the total of the three being 100 wt% 8. The curable resin composition for optical semiconductor encapsulation according to the above 7, which is contained so as to be (total amount of epoxy resin).
9. 8. The curable resin composition for optical semiconductor encapsulation according to 7 above, wherein the total amount of components (D) to (G) is 10 to 60 wt% with respect to the total amount of the resin composition.
10. For 1 equivalent of epoxy groups in the total amount of epoxy resin,
Compounding equivalent value of curing agent component (D): 0.30 to 0.80 equivalent Compounding equivalent value of curing agent component (E): 0.20 to 0.60 equivalent, 10. The curable resin composition for an optical semiconductor sealing body according to any one of 1 to 9 above, wherein the total blending equivalent value of the component (E) is in the range of 0.70 to 1.20 equivalents.

11. 11. The curable resin composition for optical semiconductor encapsulation according to any one of 1 to 10 above, wherein the content of the component (F) is 0.1 to 2 wt% with respect to the total amount of the resin composition.
12 12. The curable resin composition for sealing an optical semiconductor according to any one of 6 to 11 above, wherein the content of the component (G) is 0.01 to 5 wt% with respect to the total amount of the resin composition.
13. The light according to any one of the above 6 to 12, wherein the content ratio of the component (F) to the component (G) is a weight ratio, and the component (F) / component (G) is 0.2 to 3.0. A curable resin composition for semiconductor encapsulation.
14 14. The curable resin composition for sealing an optical semiconductor according to any one of 6 to 13, wherein the component (G) is a phosphine (preferably triphenylphosphine).

To prepare the curable resin composition of the present invention, the components (A), (B), (C), (D), (E), (F), and (G) if necessary, and other Epoxy resins, other curing agents, other curing accelerators, and, if necessary, additive components such as coupling agents, coloring agents and leveling agents can be blended. If the compounding component is solid, after mixing using a compounding machine such as a Henschel mixer or Nauter mixer, knead at 80-130 ° C using a kneader, extruder, or heating roll, cool, pulverize, and form a powder. The curable resin composition of the invention is obtained. On the other hand, when the compounding component is liquid, it is uniformly dispersed using a planetary mixer or the like to obtain the curable resin composition of the present invention. When the curable resin composition of the present invention thus obtained is solid, it is molded by a molding machine such as a transfer molding machine so as to seal the optical semiconductor element, and when it is liquid, the optical semiconductor element is sealed. As described above, after casting or dispensing into a mold, it is heated to 100 to 200 ° C. and cured for 20 seconds to 5 hours, and sealed with a cured product of the curable resin composition of the present invention. An optical semiconductor element can be obtained. *

The optical semiconductor element of the present invention is an optical semiconductor element such as a light receiving element or a light emitting element sealed with the curable resin composition of the present invention. As a semiconductor device including the optical semiconductor element, for example, DIP (dual Inline package), QFP (quad flat package), BGA (ball grid array), CSP (chip size package), SOP (small outline package), TSOP (thin small outline package), TQFP (think quad flat package), etc. It is done.

Hereinafter, the present invention will be described in more detail with reference to examples. The present invention is not limited to these examples. In addition, each measurement result and physical-property value in an Example were measured with the following method.
(Geltime test)
The curable resin compositions obtained in Examples and Comparative Examples were pulverized, and the curability at 150 ° C. was measured with a gel timer tester.
Gel timer testing machine: Model 2238-001, manufactured by Iyo Technical Co., Ltd.
Judgment standard gel time is 60 seconds or less: ○
Gel time is longer than 60 seconds: ×

(Heat hardness test: Shore A measurement)
The curable resin compositions obtained in the examples and comparative examples were molded by transfer molding, and the hardness during heating was measured under the following conditions.
Hardness measurement conditions during heating Mold preheating temperature: 150 ° C Setting mold type: φ50mm, thickness 5mm, retention time after injection of 4-chip disk mold: 180 seconds Hardness meter: Shore A rubber hardness meter measurement timing : After a holding time of 180 seconds, immediately after opening the upper mold, a Shore A measuring instrument was inserted into the surface of the φ50 mm disk resin, and the maximum value was taken as the Shore A value.
Shore A judgment criteria Shore A is less than 55: ×
Shore A is 55 or more and less than 65: △
Shore A 65 or more: ○
(Tg measurement)
The curable resin compositions obtained in Examples and Comparative Examples were molded by transfer molding, post-cured under the following conditions, and Tg (glass transition point) was measured.
Sample preparation conditions for Tg Mold preheating temperature: 150 ° C. Set mold type: φ50 mm, thickness 5 mm, retention time after injection of four-disc disk mold: 180 seconds Post-curing: 150 ° C. × 4 hours Sample cutting: Tg measurement conditions using a sample molded into a bottom surface of 5 mm × 5 mm and a length of about 10 mm: Measurement was performed in a compression mode using a temperature rising condition of 2 ° C./min using a TII apparatus manufactured by SII (Seiko Instruments). The change point of the linear expansion coefficient was defined as Tg.

Demoldability test from mold / gate breakability test / leak test from mold / foreign substance observation test / void observation test The curable resin compositions obtained in Examples and Comparative Examples were coated with Ag matte on the surface. An evaluation sample was obtained under the following conditions using the simulated copper lead frame.
Molding conditions Mold preheating temperature: 150 ° C Setting mold type: Simulated lead frame mold Holding time after mold injection: 180 seconds After curing condition: 150 ° C, 4 hours (demoldability test from mold)
At the time of transfer mold removal, the degree of resin removal from the lower mold runner portion was observed.
Judgment criteria for mold release from molds If the resin does not come out of the runner part, it is not suitable for mass production: ×
If the resin is removed from the runner, it is appropriate for mass production: ○
(Gate breakability test)
After the transfer molding, the degree of difficulty of removal was evaluated when the simulated lead frame attached to the resin runner was manually removed.
Lead frame bent because it is difficult to deviate from the criteria for gate breakability: ×
Easy to remove and lead frame not bent: ○

(Leak test from mold)
Furthermore, after the gate break, it was confirmed whether or not the resin had leaked to the place where the resin should not leak.
There is a leakage standard for resin leakage: ×
No leakage: ○
(Foreign substance observation test)
Furthermore, the resin part of the simulated lead frame after post-curing was observed with an actual optical microscope (magnification 50 times) to observe whether there was a foreign substance.
(Void observation test)
Furthermore, the resin part of the simulated lead frame after post-curing was observed with an actual optical microscope (50 times magnification) to observe whether there was a void.

(Reflow test = lead-free solder resistance)
A 20-pin lead frame type simulated semiconductor element (lead frame material is made of copper, surface silver plated) is set in a transfer mold, and molding is performed so that unfilling does not occur in each sample. After demolding, it was post-cured at 150 ° C. for 4 hours to prepare a sample for a lead-free solder reflow test (hereinafter referred to as “reflow”).
The reflow test was performed by leaving the sample under high humidity conditions (the following moisture absorption conditions) and then immersing the sample in a lead-free solder melting furnace under the following conditions.
In the evaluation, the number of lead pins peeled from the lead frame was counted with a microscope after the reflow test, and the result was described as the number of lead pins peeled / the total number of lead pins (20). Based on the result, the determination was made according to the following criteria.
Moisture absorption conditions before reflow: Leave at 30 ° C 70% (relative humidity) for 48 hours Reflow temperature conditions: Hold for 10 seconds at maximum temperature of 240 ° C Reflow criteria 0-5 / 20: Peel resistance As: ○
5-10 / 20: Assuming that there is some peeling resistance:
10-20 / 20: Given that the peel resistance is low: ×

The raw materials used in Examples and Comparative Examples of the present invention will be described in detail.
* A-1 (epoxy resin): biphenyl novolac type epoxy resin, epoxy equivalent 290 g / eq, manufactured by Nippon Kayaku Co., Ltd., NC-3000H
* B-1 (epoxy resin): bisphenol A type epoxy resin, epoxy equivalent 670 g / eq, manufactured by Tohto Kasei Co., Ltd., YD-012
* C-1 (epoxy resin): bisphenol A type epoxy resin, epoxy equivalent 932 g / eq, manufactured by Toto Kasei Co., Ltd., YD-904
* D-1 (curing agent): Multifunctional acid anhydride curing agent, TMEG-S (purity of trimellitic anhydride, 50% purity of trimellitic anhydride, ethylene glycol ester) 20%), melting point 60 ° C., acid anhydride equivalent 235 g / eq
* D-2 (curing agent): polyfunctional acid anhydride curing agent TMEG-600 (purity of ethylene glycol ester of trimellitic acid anhydride is 90%) manufactured by Shin Nippon Rika Co., Ltd., melting point 160 ° C., acid anhydride Product equivalent 207 g / eq
* SD (curing agent): monofunctional acid anhydride curing agent, manufactured by Shin Nippon Rika Co., Ltd., TH (tetrahydrophthalic acid anhydride), acid anhydride equivalent 150 g / eq
* E-1 (curing agent): biphenyl novolac type phenolic resin, phenol equivalent 198 g / eq, Nippon Kayaku Co., Ltd., GPH-65, compound of formula (20) * E-2 (curing agent): terpene diphenol Resin, phenol equivalent 194 g / eq, manufactured by Yasuhara Chemical Co., Ltd., YP-90: mixture of formula (22) and formula (23) * F-1: phosphate methacrylate: PM2, Nippon Kayaku Co., Ltd., formula (24) (N = 0, a is 1.5 on average, b is 1.5 on average)
* G-1 (curing accelerator): TPP (triphenylphosphine)
* G-2 (curing accelerator): 2P4MZ (2-phenyl-4-methylimidazole)

Comparative Examples 1 to 3
In order to confirm the reactivity in each resin using tetrahydrophthalic anhydride, which is a monofunctional acid anhydride used in the examples of Patent Document 1, a composition having the composition shown in Table 1 below was prepared. did. The kneading was melt-kneaded using an S1 kneader manufactured by Kurimoto Steel Co., Ltd., and the obtained kneaded product was cooled and pulverized. The gel time of 150 degreeC was measured with this ground material. Further, the pulverized product was formed into a necessary amount of tablets using a tablet machine, and then molded using a transfer molder with a disk mold preheated at 150 ° C. The results are also shown in Table 1.

Table 1
Comparative Example 1 Comparative Example 2 Comparative Example 3
A-1 100 parts--
B-1-100 parts-
C-1--100 parts D-1---
D-2---
S D 51.7 parts 22.3 parts 16.0 parts E-1---
E-2---
F-1
G-1 1.0 part--
G-2-0.5 part 0.5 part
Gel time 1 minute 49 seconds 3 minutes 00 seconds 4 minutes 54 seconds
(Judgment) (×) (×) (×)
Tablet workability Not createable Sticky Sticky
(Judgment) (×) (×) (×)
Leakage Leaky Leaky Leaky Leaky (Judgment) (×) (×) (×)
Shore A Unmeasurable Uncured Uncured
(Judgment) (×) (×) (×)
Overall evaluation (×) (×) (×)

From the results shown in Table 1, the resin compositions using the monofunctional acid anhydrides described in Document 1 (Comparative Examples 1 to 3) were difficult to produce tablets in a state where the stickiness was severe. In addition, the reactivity at 150 ° C. was very slow, and it was revealed that the gel time at 150 ° C. was less than 1 minute. From the above results, it was confirmed that a system using a monofunctional acid anhydride that has been used conventionally needs to be subjected to a process such as aging separately, and the viscosity and gel time of the resin need to be adjusted separately.

Comparative Examples 4 and 5
Using the polyfunctional acid anhydride which is a component (D), it mix | blended in the ratio shown in following Table 2, and knead | mixed. Evaluation was carried out in the same manner as in Comparative Examples 1 to 3, and the results are also shown in Table 2.

Table 2
Comparative Example 4 Comparative Example 5
A-1--
B-1 100 parts-
C-1-100 parts D-1 30.9 parts 22.2 parts
D-2--
SD--
E-1--
E-2--
G-1 0.52 part 0.37 part
G-2--
Gel time 54 seconds 48 seconds
(Judgment) (○) (○)
Tablet workability Good Good (judgment) (○) (○)
Leakage No leak No leak
(Judgment) (○) (○)
Shore A 82 76
(Judgment) (○) (○)
Gate breakability Deformation Deformation (judgment) (×) (×)
Overall evaluation (×) (×)

From the results of Table 2, when polyfunctional acid anhydrides are used (Comparative Examples 4 and 5), the gel time at 150 ° C. can be easily set to the target value of 60 seconds or less, and 180 seconds. There were also more than 70 Shore As later, and it was confirmed that they were excellent in reactivity, heat hardness, and ability to escape from the runner part as compared with conventionally used monofunctional acid anhydrides. However, in terms of gate breakability, the peelability between the runner hardened portion and the lead frame was inferior, and the lead frame was severely deformed when removed. In terms of gate breakability, it has been found that it cannot be applied as a sealing resin composition for optical semiconductors.

Examples 1 to 4, Comparative Examples 6 and 7
Next, the present invention will be specifically described with reference to examples.
The compositions of the examples and comparative examples are the compositions shown in the respective tables, and are melt kneaded according to the melting temperature of the resin using a biaxial kneader, and the obtained kneaded material is pulverized and then transferred. It was set as the tablet for molding machines. Using the obtained tablet, a test optical semiconductor element was prepared under the above-described conditions using a transfer molding machine, and used as an evaluation sample.
Examples 1, 2 and Comparative Example 6 are shown in Table 4, Examples 3, 4 and Comparative Example 7 are shown in Table 5, Example 5 is shown in Table 6, and Comparative Examples 8 and 9 are shown in Table 7, respectively.
It should be noted that foreign matters and voids in the cured product not described in the table were not observed in any of Examples 1 to 5 and Comparative Examples 4 to 9 of the present invention.

Example of master batch preparation When using a component having a melting point of 150 ° C. or higher as component (D), it is necessary to dissolve and mix component (D) and component (E) in advance to lower the melting point below the transfer molding temperature. is there.
TMEG-600 (melting point 165 ° C.) (D-2) as multifunctional curing agent component (D) and Kajayard GPH-65 (softening point 65 ° C.) (E-1) or YP- as phenolic curing agent component (E) 90 was blended according to Table 3 below.
Further, the solution was subjected to a vacuum solvent removing step at an oil bath temperature of 150 ° C. for 2 hours, and finally cooled to room temperature to obtain a resinous solid (master batch 1 / MB1 or master batch 2 / MB2). . As a result of observation with a microscope, no undissolved residue of TMEG-600 was observed.

Table 3
MB1 preparation example
D-2 TMEG600: 143 parts
E-2 GPH-65: 100 parts
Solvent MEK: 200 parts
MB2 preparation example
D-2 TMEG600: 143 parts
E-1 YP-90: 100 parts
Solvent MEK: 200 parts
* (Note) 1. State after removal of solvent: TMEG-600 remains undissolved MEK represents methyl ethyl ketone.

Table 4
Example 1 Example 2 Comparative Example 6
A-1 Part 15.0 Part 15.0 Part 15.0 Part B-1 Part 42.5 Part 42.5 Part 42.5 Part C-1 Part 42.5 Part 42.5 Part 42.5 Part D-1---
D-2 15 parts * 1) 15 parts * 1) 15 parts * 1)
(D2 equivalent) 0.45 0.45 0.45
SD---
E-1 14.3 parts 14.3 parts 14.3 parts (E1 compounding equivalent) 0.45 0.45 0.45
E-2---
F-1 0.13 parts 0.65 parts 0 parts F content (0.1 wt%) (0.5 wt%) (0 wt%)
G-1 0.65 parts 0.58 parts 0.65 parts G content (0.5 wt%) (0.45 wt%) (0.5 wt%)
F / G component ratio 0.2 1.11 0
Gel time 56 seconds 57 seconds 57 seconds Shore A 67 67 69
(Judgment) (○) (○) (○)
Gate breakability No deformation No deformation No deformation

(Judgment) (○) (○) (○)
Peeling rate during reflow 5/20 4/20 16/20
(Judgment) (○) (○) (×)
Overall evaluation (○) (○) (×)
* 1) is formulated in the form of MB1 for component D-2 (and part of component E-2), and the deficiency of E-2 is added together with other components so that the amount shown in Table 4 is obtained. Blended.

Table 5
Example 3 Example 4 Comparative Example 7
A-1 15.0 parts 15.0 parts 15.0 parts
B-1 42.5 parts 42.5 parts 42.5 parts
C-1 42.5 parts 42.5 parts 42.5 parts
D-1---
D-2 15 parts * 1) 15 parts * 1) 15 parts * 1)
(D2 equivalent) 0.45 0.45 0.45
SD---
E-1---
E-2 12.6 parts 12.6 parts 12.6 parts
(E2 blending equivalent) 0.4 0.4 0.4
F-1 0.12 part 0.64 part-
Content (0.1 wt%) (0.5 wt%) (0 wt%)
G-1 0.51 part 0.51 part 0.51 part G content (0.4 wt%) (0.4 wt%) (0.4 wt%)
F / G component ratio 0.2 1.11 0
Gel time 60 seconds 58 seconds 50 seconds
Shore A 65 65 68
(Judgment) (○) (○) ( ○ )
Gate breakability No deformation No deformation No deformation (judgment) (○) (○) (○)
Peeling rate during reflow 4/20 1/20 19/20
(Judgment) (○) (○) (×)
Overall evaluation (○) (○) (×)
* 1) was formulated in the form of MB2 for component D-2 (and a part of component E-2), and E-1 was added and blended together with other components so as to have the amounts shown in Table 5.

Table 6
Example 5
A-1 15.0 parts
B-1 42.5 parts
C-1 42.5 parts
D-1 16.6 parts
(D1 equivalent) 0.44
D-2-
SD-
E-1 12.7 parts
(E1 compounding equivalent) 0.4
E-2-
F-1 0.96 parts
F content (0.75wt%)
G-1 0.7 parts
G content (0.55 wt%)
F / G component ratio 1.37
Gel time 45 seconds
Shore A 68
(Judgment) (○)
Gate breakability No deformation
(Judgment) (○)
Reflow peeling rate 4/20
(Judgment) (○)
Overall evaluation (○)

From the results of Tables 4, 5, and 6, Examples 1, 2, 3, 4, and 5 containing the component (F) compared with Comparative Examples 6 and 7 were not absorbed in the transfer workability without affecting the workability of the transfer. In the reflow test, it was found that the probability of the resin peeling off from the lead frame was remarkably low.

Comparative Examples 8 and 9
Then, as Comparative Examples 8 and 9, a test sample was prepared using a resin composition obtained by adding the component (F) to the composition in which the combination of the epoxy resin and the curing agent was outside the scope of the present invention. The results are shown in Table 7 together with the composition.

Table 7
Comparative Example 8 Comparative Example 9
A-1--
B-1 20.0 parts 100 parts
C-1 80.0 parts-
D-1-30.9 parts
(D1 blending equivalent)-1.0
D-2 14.4 parts-
(D2 compounding equivalent) 0.6 −
SD--
E-1 9.2 parts-
(D2 blending equivalent) 0.4 −
E-2--
E-3--
F-1 0.93 part 0.98 part
G-1 0.50 part 0.52 part
Ratio of component F / G component 2.1 1.9
Gel time 44 seconds 52 seconds
(Judgment) (○) (○)
Tablet workability Good Good Good Good
(Judgment) (○) (○)
Leakage No leak No leak
(Judgment) (○) (○)
Shore A 68 78
(Judgment) (○) (○)
Foreign object None None
(Judgment) (○) (○)
Void None None
(Judgment) (○) (○)
Runner part demolding Exiting Exiting (judgment) (○) (○)
Gate breakability No deformation With deformation
(Judgment) (○) (×)
Reflow peeling rate 16/20 20/20
(Judgment) (×) (×)
Overall evaluation (×) (×)

From the results of Table 7, even when the component (F) having an effect of improving the adhesive force is introduced in the same usage amount form with respect to the resin composition in which the epoxy resin and the curing agent are outside the scope of the present invention, moisture absorption is achieved. It has been found that the later reflowability does not reach the resin composition of the present invention. That is, even if the component (F) is simply added to the epoxy resin composition having no combination of the epoxy resin and the curing agent of the present invention, remarkably excellent reflow properties that can be achieved in the resin composition of the present invention. Was found not to be obtained.

Claims

A curable resin composition for encapsulating an optical semiconductor comprising the following components (A) to (F):
(A) General formula (1)

(Wherein R 1 s may be the same or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom. N is 0 to 10) Epoxy resin represented by the following formula:
(B) General formula (2)

(Wherein R 2 s may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom. R 3 represents Which may be the same or different from each other, each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom, and m is an average value of the number of repetitions of 0 to 10. .)
An epoxy resin having an epoxy equivalent of 500 to 800 g / eq,
(C) an epoxy resin represented by the general formula (2) and having an epoxy equivalent of 850 to 1500 g / eq,
(D) A polyfunctional acid anhydride curing agent having two or more carboxyl groups and acid anhydride groups in one molecule, or two or more acid anhydride groups alone,
(E) At least one selected from the group consisting of compounds represented by the following formulas (15), (18) and (19) as a phenolic curing agent,
Formula (15)

{In the formula, o is an average value of the number of repetitions of 0 to 10, R 8 is the following formula (16)

(Wherein R 9 may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom) or the following formula ( 17)

(Wherein R 10 s may be the same as or different from each other and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom). },
Formula (18)

(Wherein R 11 s may be the same as or different from each other, and each represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom) and the formula (19 )

(Wherein R 12 may be the same as or different from each other, and represents a hydrogen atom, a linear or branched alkyl group having 1 to 8 carbon atoms, or a halogen atom), and (F ) A (meth) acrylate having a phosphate group.
The curable resin composition for optical semiconductor encapsulation according to claim 1, further comprising (G) a curing accelerator.
The component (F) is represented by the following formula (24)

(Wherein n represents an integer of 0 to 3, a represents a positive number of 1 to 2, and b represents a positive number of 1 to 2, provided that a + b = 3). The curable resin composition for optical semiconductor encapsulation according to 1.
2. The optical semiconductor according to claim 1, wherein the total amount of the epoxy resin is 100 wt%, and the content ratio is 10 to 35 wt% for component (A), 20 to 55 wt% for component (B), and 20 to 55 wt% for component (C). A curable resin composition for sealing.
The curing for optical semiconductor encapsulation according to claim 1, wherein the component (D) is at least one selected from the group consisting of compounds represented by the following formulas (3), (6) and (7). Functional resin composition,
Formula (3)

(Wherein R 4 is
Formula (4)

Or
Formula (5)

The coupling position is not particularly limited. ),
Formula (6)

(Wherein R 5 represents a linear or branched alkylene chain having 1 to 5 carbon atoms which may have a substituent, a cyclohexane skeleton or a benzene skeleton which may have a substituent),
Formula (7)

(Wherein R 6 represents a linear or branched alkylene group having 1 to 5 carbon atoms which may have a substituent, a cyclohexane skeleton or a benzene skeleton which may have a substituent).
The component (D) is a compound represented by the following formula (8): The curable resin composition for optical semiconductor encapsulation according to claim 1, wherein R 7 is represented by the following formula (9): ) Or formula (10).
Formula (8)

Formula (9)

Formula (10)
The curable resin composition for optical semiconductor encapsulation according to claim 1, wherein the component (D) is a compound represented by the following formula (11), formula (12), formula (13), or formula (14).
Formula (11)

Formula (12)

Formula (13)

Formula (14)
The compounding equivalent value of the curing agent component (D) is 0.30 to 0.80 and the compounding equivalent value of the component (E) is 0.20 to 0.60 with respect to 1 equivalent of epoxy group in the total amount of epoxy resin. The curable resin composition for optical semiconductor encapsulation according to claim 1, wherein the sum of the blending equivalent value of component (D) and the blending equivalent value of component (E) is in the range of 0.70 to 1.20.
The curable resin composition for optical semiconductor encapsulation according to any one of claims 3 to 7, further comprising (G) a curing accelerator.
10. The curable composition for optical semiconductor encapsulation according to claim 9, wherein the content ratio of the component (F) to the component (G) is a weight ratio, and the component (F) / component (G) is 0.2 to 3.0. Resin composition.
An optical semiconductor element sealed with a cured product obtained by heating the curable resin composition according to claim 1.