WO2011031117A3 - 파우치형 전지 내의 이물질 검출장치 및 방법 - Google Patents

파우치형 전지 내의 이물질 검출장치 및 방법 Download PDF

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Publication number
WO2011031117A3
WO2011031117A3 PCT/KR2010/006256 KR2010006256W WO2011031117A3 WO 2011031117 A3 WO2011031117 A3 WO 2011031117A3 KR 2010006256 W KR2010006256 W KR 2010006256W WO 2011031117 A3 WO2011031117 A3 WO 2011031117A3
Authority
WO
WIPO (PCT)
Prior art keywords
impurities
battery
pouch type
type battery
light
Prior art date
Application number
PCT/KR2010/006256
Other languages
English (en)
French (fr)
Other versions
WO2011031117A2 (ko
Inventor
박승엽
정호섭
박진영
신영준
이은주
Original Assignee
주식회사 엘지화학
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 엘지화학 filed Critical 주식회사 엘지화학
Priority to JP2012529667A priority Critical patent/JP5768298B2/ja
Priority to EP10815662.1A priority patent/EP2479556B1/en
Priority to PL10815662T priority patent/PL2479556T3/pl
Priority to US12/945,313 priority patent/US8441647B2/en
Publication of WO2011031117A2 publication Critical patent/WO2011031117A2/ko
Publication of WO2011031117A3 publication Critical patent/WO2011031117A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Secondary Cells (AREA)

Abstract

본 발명은 파우치형 전지 내의 이물질 검출 장치 및 방법에 관한 것으로서, 전지케이스 표면을 광산란법을 이용하여 전지 내의 이물질 여부를 판별하는 검출장치 및 방법에 관한 것이다. 본 발명은, 전지케이스 표면으로 기설정된 입사각도로 직선광을 조사하는 광원; 상기 전지케이스에서 반사되는 반사광을 감지하는 센서부; 및 상기 센서부를 통해 감지된 반사광을 통해 전지 내의 이물질 존부 및 위치를 감지하는 이물감지부를 포함하는 것을 특징으로 한다. 본 발명은 전지 내의 이물질 여부를 빠르고 정확하게 측정할 수 있는 효과가 있다.
PCT/KR2010/006256 2009-09-14 2010-09-14 파우치형 전지 내의 이물질 검출장치 및 방법 WO2011031117A2 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012529667A JP5768298B2 (ja) 2009-09-14 2010-09-14 パウチ型電池内の異物検出装置
EP10815662.1A EP2479556B1 (en) 2009-09-14 2010-09-14 Apparatus and method for detecting foreign material in pouch type battery
PL10815662T PL2479556T3 (pl) 2009-09-14 2010-09-14 Urządzenie i sposób wykrywania obcego materiału w akumulatorach typu woreczkowego
US12/945,313 US8441647B2 (en) 2009-09-14 2010-11-12 Apparatus for detecting foreign material in pouch type battery

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2009-0086679 2009-09-14
KR1020090086679A KR20110029011A (ko) 2009-09-14 2009-09-14 파우치형 전지 내의 이물질 검출장치

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/945,313 Continuation-In-Part US8441647B2 (en) 2009-09-14 2010-11-12 Apparatus for detecting foreign material in pouch type battery

Publications (2)

Publication Number Publication Date
WO2011031117A2 WO2011031117A2 (ko) 2011-03-17
WO2011031117A3 true WO2011031117A3 (ko) 2011-09-01

Family

ID=43732985

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/006256 WO2011031117A2 (ko) 2009-09-14 2010-09-14 파우치형 전지 내의 이물질 검출장치 및 방법

Country Status (6)

Country Link
US (1) US8441647B2 (ko)
EP (1) EP2479556B1 (ko)
JP (1) JP5768298B2 (ko)
KR (1) KR20110029011A (ko)
PL (1) PL2479556T3 (ko)
WO (1) WO2011031117A2 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015065178A (ja) * 2014-12-02 2015-04-09 日本電気株式会社 フィルム外装電池の製造方法
TWI705244B (zh) * 2018-07-31 2020-09-21 由田新技股份有限公司 半導體瑕疵檢測設備
KR20220015635A (ko) 2020-07-31 2022-02-08 주식회사 엘지에너지솔루션 이물 검출 장치 및 검출 방법
DE102022116388A1 (de) 2022-06-30 2024-01-04 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Überprüfen von Energiespeichereinheiten auf Fremdkörper

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06265477A (ja) * 1993-03-12 1994-09-22 Sony Corp 物品表面の検査方法
KR100267665B1 (ko) * 1997-08-28 2001-01-15 하나와 요시카즈 표면검사장치
KR100484812B1 (ko) * 2002-09-03 2005-04-22 엘지전자 주식회사 이미지 센서를 이용한 표면 검사방법 및 검사장치
JP2007078404A (ja) * 2005-09-12 2007-03-29 Mitsubishi Electric Corp 太陽電池パネル検査装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63218847A (ja) * 1987-03-09 1988-09-12 Nok Corp 表面欠陥検査方法
JPS6469023A (en) * 1987-09-10 1989-03-15 Fujitsu Ltd Inspection device for surface of wafer
JP2997034B2 (ja) * 1990-11-27 2000-01-11 日立電子エンジニアリング株式会社 カラーフィルタの埋没異物検出方法および異物検査装置
JP2560599B2 (ja) * 1992-12-28 1996-12-04 東洋製罐株式会社 積層板の凹凸検査方法及び検査装置
JPH09178450A (ja) * 1995-12-26 1997-07-11 Ntn Corp カラーフィルタの欠陥検出装置
US6042966A (en) * 1998-01-20 2000-03-28 Valence Technology, Inc. Battery terminal insulation
JP2000098621A (ja) * 1998-09-25 2000-04-07 Dainippon Printing Co Ltd 露光装置
KR101182956B1 (ko) * 2004-09-22 2012-09-18 삼성에스디아이 주식회사 전극 집전체의 검사장치 및 이를 이용한 검사방법
US7424902B2 (en) * 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
US7564544B2 (en) * 2006-03-22 2009-07-21 3i Systems Corporation Method and system for inspecting surfaces with improved light efficiency

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06265477A (ja) * 1993-03-12 1994-09-22 Sony Corp 物品表面の検査方法
KR100267665B1 (ko) * 1997-08-28 2001-01-15 하나와 요시카즈 표면검사장치
KR100484812B1 (ko) * 2002-09-03 2005-04-22 엘지전자 주식회사 이미지 센서를 이용한 표면 검사방법 및 검사장치
JP2007078404A (ja) * 2005-09-12 2007-03-29 Mitsubishi Electric Corp 太陽電池パネル検査装置

Also Published As

Publication number Publication date
EP2479556B1 (en) 2021-09-08
US8441647B2 (en) 2013-05-14
EP2479556A2 (en) 2012-07-25
WO2011031117A2 (ko) 2011-03-17
KR20110029011A (ko) 2011-03-22
US20110090507A1 (en) 2011-04-21
JP5768298B2 (ja) 2015-08-26
PL2479556T3 (pl) 2021-12-27
EP2479556A4 (en) 2017-03-22
JP2013504768A (ja) 2013-02-07

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