WO2010058107A1 - Dispositif d'echantillonnage de gaz - Google Patents

Dispositif d'echantillonnage de gaz Download PDF

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Publication number
WO2010058107A1
WO2010058107A1 PCT/FR2009/001333 FR2009001333W WO2010058107A1 WO 2010058107 A1 WO2010058107 A1 WO 2010058107A1 FR 2009001333 W FR2009001333 W FR 2009001333W WO 2010058107 A1 WO2010058107 A1 WO 2010058107A1
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WO
WIPO (PCT)
Prior art keywords
gases
pipe
pressure
taken
gas
Prior art date
Application number
PCT/FR2009/001333
Other languages
English (en)
French (fr)
Inventor
Lucien Lonigro
Pierre Cholat
Original Assignee
Ap2E
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ap2E filed Critical Ap2E
Priority to CN200980146797.3A priority Critical patent/CN102224405B/zh
Priority to ES09768111T priority patent/ES2743652T3/es
Priority to JP2011536921A priority patent/JP5607642B2/ja
Priority to EP09768111.8A priority patent/EP2350606B1/fr
Publication of WO2010058107A1 publication Critical patent/WO2010058107A1/fr
Priority to US13/114,093 priority patent/US8467064B2/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N1/2247Sampling from a flowing stream of gas
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N1/2247Sampling from a flowing stream of gas
    • G01N1/2258Sampling from a flowing stream of gas in a stack or chimney
    • G01N2001/2261Sampling from a flowing stream of gas in a stack or chimney preventing condensation (heating lines)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N2001/2285Details of probe structures

Definitions

  • the present invention relates to the sampling of gases, and in particular of industrial gases, in particular with a view to performing an analysis of their composition.
  • the present invention is particularly applicable to the analysis of hot and humid gases, in particular in chemical or petrochemical plants, cement plants, steel mills, incinerators, or processing or gas production facilities.
  • a sampling device generally includes a gas sampling probe and a pipe for transmitting the sampled gas samples to the sample operating system, such as a gas analyzer.
  • the sampling of gases for the analysis of their composition is a key step, especially when the gases to be sampled are hot and have a high proportion of water in the form of steam.
  • the sampling of hot and humid gases raises a problem of condensation.
  • the dew point also called “condensation temperature” of water contained in hot gases with high water vapor content
  • the dew point also called “condensation temperature” of water contained in hot gases with high water vapor content
  • the water vapor contained in these gases may condense into droplets that settle on the walls in contact with the gas. If the gases sampled contain molecules that are soluble in water, these molecules tend to to be captured and to dissolve in the droplets.
  • the composition of the gases that are transmitted to the operating device does not correspond to the composition of the gases taken.
  • the gas sampling device can therefore influence the composition of the gases sampled and therefore the quality of the measurements taken if the system that exploits the gas samples taken is a gas analyzer.
  • the droplets formed on walls can cause corrosion phenomena, especially since the droplets can be acidic because of the gas molecules dissolved therein.
  • the gas sampling device can therefore also affect the costs and operating conditions of the system in which it is integrated.
  • Certain gas sampling devices are designed to maintain the gases taken at a temperature above the dew point of the water vapor contained in the gases sampled, both in the probe and in the pipe. Thus some of these devices are designed to keep the sample of gases taken at a temperature that can reach one or two hundred degrees Celsius. Such devices therefore have a high manufacturing cost, particularly because of the complexity of the pipeline that must be heated and the necessary presence of temperature regulators, operating and maintenance costs also high due in particular to the energy required to maintain the device at a relatively high temperature. In addition, these devices imply that the operating system is also designed to operate at the same temperature.
  • sampling devices include a heated probe and a device for dewatering the withdrawn gas sample.
  • a device dewatering implements membranes, or cooling means.
  • These devices also have high manufacturing and maintenance costs because of the presence of the drying device which may require frequent maintenance operations with certain gases to be taken.
  • these devices denature the sample taken, since they modify the composition.
  • sampling devices provide for diluting the sample taken in another gas, such as air dusted.
  • these devices comprise a probe which is not necessarily heated, a Venturi system ensuring the aspiration of the gas samples and their dilution, an unheated pipe and a system supplying the dilution gas under pressure with a flow rate Student.
  • These devices also have the disadvantage of denaturing the sample taken since its composition is also modified because of its dilution in another gas, and especially as the dilution gas can further contribute impurities.
  • the sampling device is connected to an analysis device, it must be very sensitive to detect gaseous components in small amounts due to dilution.
  • a gas sampling method comprising gas sampling steps by a probe and transmission of gases taken to the operating device gases taken through a pipe.
  • the method comprises a step of lowering the pressure of the gases taken from the pipe, in order to lower the dew point, the lowering of the pressure of the gases taken off being carried out by withdrawing the gases through an expansion nozzle disposed in the probe, and sucking the gases taken from the pipe through the operating device.
  • the lowering of the pressure is carried out in order to maintain the pressure of the gases flowing in the lower pipe to a value such that the temperature of the gases in the pipeline remains greater than the dew point of the gases in the pipe, considering the temperature of the pipe.
  • the method comprises a step of adjusting the suction power of the gases taken through the sonic-type calibrated expansion nozzle to a value such that the pressure of the collected gases flowing from the pipe remains less than one third of the pressure of the gases taken upstream of the expansion nozzle, taking into account variations in the suction power in the absence of regulation.
  • the method comprises a step of regulating the suction power of the gases taken to maintain substantially constant the pressure in the pipe.
  • the method comprises a step of filtering the gases taken to extract solid particles that may be present in the gases removed, before lowering the pressure.
  • the method comprises a step of heating the pipe to maintain the temperature of the pipe above the dew point of the gases taken.
  • a gas sampling device comprising a gas sampling probe, a device for operating the collected gases and a pipe for transmitting the gases taken by the probe to the operating device.
  • the sampling device comprises means for lowering the pressure of the gases taken from the pipe, for lowering the dew point of the gases sampled, the pressure-reducing means comprising an expansion nozzle disposed in the probe and communicating with the pipe, and a suction device for gases taken from the pipe through the operating device.
  • the means for lowering the pressure of the gases taken off are configured in order to maintain the pressure of the gases in the lower duct at a value such that the temperature of the gases in the duct remains greater than the dew point of the gases. in the pipeline, considering the temperature of the pipeline.
  • the expansion nozzle is a sonic nozzle.
  • the suction device has a suction power greater than a value such that the pressure of the collected gases flowing from the pipe remains less than one third of the pressure of the gases taken upstream of the expansion nozzle, taking into account variations of the suction power in the absence of regulation of the suction device.
  • the device comprises means for regulating the suction power of the suction device for the gases removed. to maintain substantially constant pressure in the pipeline.
  • the probe comprises a filter for extracting solid particles that may be present in the gases taken.
  • the device comprises heating means for increasing the temperature of the pipe above the dew point of the gases taken.
  • the suction device comprises a pump connected to the operating device by a pipe, so as to suck the gas in the pipe.
  • a gas analysis system comprising a sampling device as defined above, the operating device comprising a low pressure gas analyzer of the type based on detection by spectrometry at measurement of energy decrease in a resonant cavity.
  • Figure 1 shows schematically a gas sampling device according to one embodiment, coupled to a device operating gas samples
  • Figure 2 schematically shows a gas sampling device according to another embodiment, coupled to a device for operating gas samples.
  • FIG. 1 represents a gas sampling device comprising a probe 1 and a pipe 2 connecting the probe to a device operating EXD gas samples.
  • the device EXD is connected to a suction device 3 such as a pump, through a pipe 4 in communication with the pipe 2 through the device EXD.
  • the suction device draws gas taken by the probe 1.
  • the suction device 3 is connected to a treatment device and / or PRCS evacuation of the gases taken.
  • the probe 1 comprises a gas inlet 10, a filter 11 for removing solid particles possibly present in the gases entering the probe through the inlet 10, and an expansion nozzle 12 such as a section of capillary tube, receiving the gas treated by the filter 11 and whose output is connected to the pipe 2.
  • the combination of the suction device 3 and the expansion nozzle 12 provides in the pipes 2, 4 and in the device EXD a pressure, less than the pressure of the gases at the inlet 10 of the probe 1.
  • the suction device may be associated with regulating means for maintaining at a set point the pressure in the pipe 2 and in the operating device EXD .
  • the characteristics of the nozzle 12 and the suction device 3 are chosen to lower the pressure of the gases in the pipes 2, 4 and in the device EXD, so as to lower the dew point of the gases removed. by the probe 1.
  • the pressure in the pipes 2, 4 and in the device EXD is kept below a value such that the temperature of the pipes 2, 4 and the device EXD remains higher than the highest dew point of the pipes.
  • gas in lines 2, 4 and in the EXD device In the targeted applications, the gases sampled comprise usually water vapor and therefore the highest dew point of the gases sampled and that of the water.
  • the gases in the pipes 2, 4 and in the EXD device can not condense. It is thus not necessary to heat the pipes 2, 4 and the device EXD, or to dilute the gases, or to dry them.
  • the gases sampled are therefore not denatured.
  • the gases taken can circulate rapidly in the pipes 2, 4.
  • the probe 1 and the device for transporting the collected gases consisting of the pipes 2, 4 and the suction device also have the advantage of being considerably simpler than those of the prior art. As a result, the sampling device has significantly lower manufacturing, operating and maintenance costs than the prior art sampling devices.
  • the nozzle 12 is for example a calibrated nozzle of sonic type which ensures a constant flow of gas when the following condition is fulfilled:
  • the condition (1) is realized, the flow velocity of the gases at the minimum passage section of the gases in the nozzle reaches the speed of sound in these gases.
  • the condition (1) is realized when the pressure in the pipe 2 is less than one third of the pressure upstream of the nozzle 12. Therefore, as long as the pressure in the pipe 2 satisfies the condition (1 ), she is independent of the suction power of the device 3.
  • the suction power of the suction device 3 can be adjusted to always meet the condition (1) even if it undergoes variations related to the technology used to achieve the suction device, in the absence of regulation. In this way, the gas flow in the pipes 2, 4 is constant and can be accurately determined, without the need to regulate the suction power.
  • the nozzle 12 also has the advantage of not requiring maintenance operations if it is performed in materials that are inert with respect to the gases that can be taken by the probe 1.
  • the expansion of gas generally causes a cooling of the gases taken. If the temperature of the gases to be taken, that is to say of the probe 1 is greater than the ambient temperature of the pipe 2 and the EXD operating device, the gases cooled by expansion are heated by the probe. Thus, the lowering of the temperature resulting from the expansion of the gases is at least partly compensated by the ambient temperature of the probe. If the gases to be sampled are at the ambient temperature of Line 2 and the EXD operating device, the dew point is below room temperature. The lowering of the pressure to be produced is therefore small, so that the lowering of the temperature resulting from the expansion of the gases is also low.
  • Figure 2 shows a sampling device which differs from that of Figure 1 in that the pipes 2 and 4 are equipped with heating means 22, and in that the EXD operating device comprises a heated chamber 21 in which the collected gases circulate.
  • the heating means 22 remain without comparison with the heating means which are necessary in the devices of the prior art transmitting the gases taken at atmospheric pressure, since the dew point of the gases sampled has been lowered and this in a way that may be important, by the nozzle 12 combined with the suction device 3.
  • the heating means required in the prior art must be able to carry the pipe to a temperature that can reach two hundred degrees Celsius, while the heating means 22 that may be required in the sampling device of Figure 2 must be able to carry the pipes 2, 4 at a maximum temperature of one or two tens of degrees Celsius.
  • the EXD operating device comprises for example a gas analysis device, and / or a device for making mixtures with other gases.
  • the EXD operating device comprises a low-pressure gas analyzer based on energy-decreasing measurement spectrometry detection in a Cavite Ring-Down Spectroscopy (CRDS) cavity.
  • CRDS Cavite Ring-Down Spectroscopy
  • Such an analyzer is for example described in the patent applications WO9957542 (also published under the number US 6,504,145), and WO 2003/031949 (also published under the number US 7,450,240).
  • Such an analyzer comprises a resonant optical cavity in which the collected gases circulate, a laser source such as a laser diode, providing a laser beam whose wavelength is adjustable, which is sent into the resonant cavity.
  • the light emerging from the resonant cavity is received by a photodetector, the signal supplied by the photodetector being analyzed by a signal analysis circuit.
  • the laser beam is applied to the cavity during periods of adjustable duration, so that between the emission periods of the laser beam, the photons trapped in the cavity undergo an exponential decay as a function of time. If the cavity is empty, or if the wavelength of the photons is outside a line of absorption of a gas in the cavity, the decay of the photons trapped in the cavity has a certain time constant. essentially dependent on losses introduced by the mirrors forming the resonant cavity. This time constant is reduced if the absorption spectrum of a gas present in the cavity has an absorption line at the wavelength of the photons trapped in the cavity.
  • the present invention is susceptible of various embodiments.
  • the invention is not limited to a pressure lowering device comprising an expansion nozzle and a suction pump.
  • the pump can be replaced by a vacuum source, such as the space vacuum if the sampling device is intended to equip a spacecraft, or a source of depression, for example if the gases to be taken by the probe are at a minimum. pressure above atmospheric pressure.

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PCT/FR2009/001333 2008-11-24 2009-11-20 Dispositif d'echantillonnage de gaz WO2010058107A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN200980146797.3A CN102224405B (zh) 2008-11-24 2009-11-20 气体取样装置
ES09768111T ES2743652T3 (es) 2008-11-24 2009-11-20 Dispositivo de muestreo de gas
JP2011536921A JP5607642B2 (ja) 2008-11-24 2009-11-20 ガスサンプリング装置
EP09768111.8A EP2350606B1 (fr) 2008-11-24 2009-11-20 Dispositif d'echantillonnage de gaz
US13/114,093 US8467064B2 (en) 2008-11-24 2011-05-24 Gas sampling device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0806593 2008-11-24
FR0806593A FR2938916B1 (fr) 2008-11-24 2008-11-24 Dispositif d'echantillonnage de gaz.

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US13/114,093 Continuation US8467064B2 (en) 2008-11-24 2011-05-24 Gas sampling device

Publications (1)

Publication Number Publication Date
WO2010058107A1 true WO2010058107A1 (fr) 2010-05-27

Family

ID=40839531

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2009/001333 WO2010058107A1 (fr) 2008-11-24 2009-11-20 Dispositif d'echantillonnage de gaz

Country Status (7)

Country Link
US (1) US8467064B2 (zh)
EP (1) EP2350606B1 (zh)
JP (1) JP5607642B2 (zh)
CN (1) CN102224405B (zh)
ES (1) ES2743652T3 (zh)
FR (1) FR2938916B1 (zh)
WO (1) WO2010058107A1 (zh)

Families Citing this family (12)

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Publication number Priority date Publication date Assignee Title
JP5364957B2 (ja) * 2009-08-21 2013-12-11 独立行政法人産業技術総合研究所 微量水分発生装置および標準ガス生成装置
CN103197341B (zh) * 2013-03-26 2015-05-20 哈尔滨工程大学 适用于高压蒸汽管路环境下的甲基碘气体采样系统
DE112015001047T5 (de) * 2014-02-27 2016-12-01 Elemental Scientific, Inc. System zum Nehmen von Flüssigkeitsproben aus einer Entfernung
US9535045B2 (en) * 2014-06-16 2017-01-03 Mustang Sampling Llc Low pressure biogas sample takeoff and conditioning system
AT518184B1 (de) * 2016-01-21 2017-08-15 Avl List Gmbh Messgas Entnahmeeinrichtung
WO2019117730A1 (en) 2017-12-15 2019-06-20 Neo Monitors As Hydrogen gas sensor and method for measurement of hydrogen under ambient and elevated pressure
US11402303B2 (en) 2019-01-21 2022-08-02 CEMTEK Systems Inc System and method for low pressure low flow dilution extraction gas sampling
CN111239062B (zh) * 2020-02-04 2021-01-01 中国计量科学研究院 气体定量检测设备及方法
CN111521448A (zh) * 2020-04-30 2020-08-11 浙江华源通冶金科技有限公司上海分公司 一种中间包内气体在线取样检测装置及其检测方法
JP7397428B2 (ja) * 2020-05-25 2023-12-13 慶應義塾 多連サンプラー装置
CN112665926B (zh) * 2020-12-22 2022-08-23 安徽配隆天环保科技有限公司 一种超纯水恒温采样总管
CN112881393B (zh) * 2021-01-22 2022-08-05 四川沃文特生物技术有限公司 样本检测过程中的吸液方法

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EP0194955A1 (fr) * 1985-03-04 1986-09-17 Institut De Recherches De La Siderurgie Francaise (Irsid) Ligne de prélèvement et de conditionnement de gaz en vue de son analyse
DD277378A3 (de) * 1987-07-01 1990-04-04 Freiberg Brennstoffinst Verfahren und Vorrichtung zur Entspannung von Dampf-Gas-Gemischen für Analysenzwecke
WO1999057542A1 (fr) 1998-04-30 1999-11-11 Universite Joseph Fourier Procede d'excitation d'une cavite optique pour la detection de gaz a l'etat de traces
US6284547B1 (en) * 1997-08-06 2001-09-04 Axiva Gmbh On-line analysis of process gas during the production of ketene
WO2003031949A1 (fr) 2001-10-10 2003-04-17 Universite Joseph Fourier Dispositif a laser couple a une cavite par retroaction optique pour la detection de traces de gaz

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Publication number Priority date Publication date Assignee Title
EP0194955A1 (fr) * 1985-03-04 1986-09-17 Institut De Recherches De La Siderurgie Francaise (Irsid) Ligne de prélèvement et de conditionnement de gaz en vue de son analyse
DD277378A3 (de) * 1987-07-01 1990-04-04 Freiberg Brennstoffinst Verfahren und Vorrichtung zur Entspannung von Dampf-Gas-Gemischen für Analysenzwecke
US6284547B1 (en) * 1997-08-06 2001-09-04 Axiva Gmbh On-line analysis of process gas during the production of ketene
WO1999057542A1 (fr) 1998-04-30 1999-11-11 Universite Joseph Fourier Procede d'excitation d'une cavite optique pour la detection de gaz a l'etat de traces
US6504145B1 (en) 1998-04-30 2003-01-07 Universite Joseph Fourier Method of excitation of an optical cavity for detecting gas traces
WO2003031949A1 (fr) 2001-10-10 2003-04-17 Universite Joseph Fourier Dispositif a laser couple a une cavite par retroaction optique pour la detection de traces de gaz
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US7450240B2 (en) 2001-10-10 2008-11-11 Universite Joseph Fourier Laser device coupled to a cavity by optical feedback for detecting gas traces

Also Published As

Publication number Publication date
US8467064B2 (en) 2013-06-18
JP2012510048A (ja) 2012-04-26
FR2938916B1 (fr) 2012-10-19
US20120133942A1 (en) 2012-05-31
ES2743652T3 (es) 2020-02-20
EP2350606B1 (fr) 2019-06-05
CN102224405A (zh) 2011-10-19
CN102224405B (zh) 2014-04-16
JP5607642B2 (ja) 2014-10-15
EP2350606A1 (fr) 2011-08-03
FR2938916A1 (fr) 2010-05-28

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