WO2010038799A1 - インダクタンス素子の直流重畳特性の解析方法及び電磁界シミュレータ - Google Patents
インダクタンス素子の直流重畳特性の解析方法及び電磁界シミュレータ Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2611—Measuring inductance
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
- G06F30/23—Design optimisation, verification or simulation using finite element methods [FEM] or finite difference methods [FDM]
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- G—PHYSICS
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- G06F2111/10—Numerical modelling
Definitions
- the present invention relates to a method for obtaining a DC superposition characteristic of an inductance element used in, for example, a DC-DC converter, and an electromagnetic field simulator.
- the inductance element has a core made of a magnetic material and a coil winding that supplies an excitation current to the core.
- the excited core has a non-linear history due to a magnetic hysteresis curve (also called a BH curve or a magnetization curve). Trace and work.
- a magnetic hysteresis curve also called a BH curve or a magnetization curve.
- Japanese Patent Application Laid-Open No. 05-099963 discloses an apparatus for calculating the inductance of a magnetic member excited by an alternating current superimposed with a direct current and is made of the same material as the magnetic member.
- the material constant is determined by evaluating the DC superimposition characteristics using a ring-shaped sample, so the inductance can be calculated with high accuracy without trial manufacture of magnetic parts. it can.
- it is complicated because it is necessary to evaluate the DC superimposition characteristics, and the operating point (magnetic field strength and magnetic flux density) obtained from the DC superimposition characteristics and the initial magnetization characteristics does not consider minor loops due to AC current. There is room for further improvement in the accuracy of analysis.
- the magnetic characteristics of the inductance element may change depending on the operating temperature, stress, DC current, etc., but nothing is taken into account in Japanese Patent Laid-Open No. 05-099963. If these factors are not taken into consideration, the method for analyzing the magnetic characteristics of the inductance element is insufficient.
- an object of the present invention is to provide a method for analyzing the DC superposition characteristics of an inductance element using a magnetic field analysis simulator in a simpler and more accurate manner than before and an electromagnetic field simulator used therefor, taking into consideration the use environment. It is.
- the DC superposition characteristics when magnetized can be analyzed.
- the electromagnetic field simulator of the present invention for analyzing the DC superposition characteristics of the inductance element is Data of initial magnetization curve from initial magnetization state to saturation magnetization obtained for toroidal core made of the same magnetic material as the inductance element, and magnetic flux density or magnetic field obtained for a plurality of minor loops having different operating points on the initial magnetization curve Means for storing point sequence data indicating the relationship between strength and incremental permeability; Means for inputting an analytical model of the inductance element; For each mesh-divided element of the analysis model, an operating point for a predetermined DC applied current is obtained based on the initial magnetization curve of the toroidal core, and an incremental permeability is assigned from the point sequence data based on the operating point. And calculating means for integrating the inductance value obtained by the incremental magnetic permeability in each element to obtain the inductance value of the inductance element.
- the direct current superimposition of the inductance element is simpler and more accurate than before.
- the characteristics can be analyzed.
- the influence of temperature and stress can be added to the analysis. Therefore, it is possible to reduce the process of trial manufacture and evaluation of a product that requires a lot of time and cost, and thus it is possible to design an inductance element at a low cost.
- First step In the first step, the major loop of the initial magnetization curve from the initial magnetization state to the saturation magnetization for the toroidal core made of the same magnetic material as the inductance element, and the operating point on the initial magnetization curve Measure with different minor loops. Further, by measuring the stress dependence and temperature dependence, it is possible to analyze the stress distribution in the inductance element and the DC superposition characteristics of the inductance element according to the surrounding environmental temperature or self-heating.
- the BH analyzer power supply voltage (proportional to the magnetic field) is gradually increased from the initial magnetization state to the saturation magnetic flux density (Bmax), then gradually returned to zero, and the polarity is reversed until the magnetic flux density is saturated again. Then, when it is gradually returned to zero, an initial magnetization curve (major loop) is obtained.
- FIG. 1 shows a major loop in the first quadrant.
- FIG. 3 shows an apparatus for measuring stress dependence.
- This apparatus includes a surface plate 25 on which a core 10 made of a magnetic material is placed, and a pressure jig 30 that applies stress to the core 10, and the pressure jig 30 is attached to a tension meter 20 at its lower end. And a fixed plate member 15.
- the surface plate 25 and the plate member 15 may be provided with arc-shaped concave portions.
- the temperature dependence of the initial magnetization curve and the minor loop can be measured.
- the core is set to a temperature of + 85 ° C. by holding the core in a constant temperature bath at + 85 ° C., and the above measurement is performed.
- an alternating current of about 50 to 100 mA is usually applied.
- an alternating current having a total amplitude ⁇ I for example, a high-frequency triangular wave
- a minor loop for a magnetic field intensity ⁇ H obtained by multiplying ⁇ I by the number N of coil turns is obtained.
- a current in which the triangular wave is superimposed on the direct current flows through the inductance element during the operation of the DC-DC converter. If the alternating current amplitude is too large, the minor loop will be distorted and the linearity of the minor loop cannot be obtained. In that case, the applied magnetic field may be reduced.
- the magnetic flux density changes at a high-frequency switching frequency around the magnetic flux density B ′ corresponding to the DC magnetic field strength H.
- the initial magnetization curve measured in advance for the toroidal core made of the same magnetic material as the inductance element, and the point sequence data indicating the relationship between the magnetic flux density or magnetic field strength and the incremental permeability are stored in a digital data table in the computer memory.
- the simulation accuracy increases according to the amount of data stored. The more measurement points of temperature and stress at the time of measurement, initial magnetization state and magnetic field strength are, the better to improve the calculation accuracy, but some of them are the initial magnetization curve, magnetic flux density or magnetic field strength and incremental permeability. It may be obtained by interpolation based on point sequence data indicating the relationship between
- the initial magnetization curve used for the analysis of the magnetic flux density due to the direct current and the magnetic flux density or magnetic field strength used for the analysis of the change in the magnetic flux density from the operating point due to the alternating current and the incremental magnetic permeability Point sequence data indicating the relationship is created.
- point sequence data indicating the relationship between the magnetic flux density or magnetic field strength obtained from a minor loop measured with a predetermined stress applied and the incremental permeability is used. If the stress acting on the magnetic material is not uniform, point sequence data indicating the relationship between the magnetic flux density or magnetic field strength and the incremental permeability is used for each element mapped by the stress.
- FIG. 7 shows a multilayer inductor 100 having a length of 2.0 mm ⁇ width of 1.25 mm ⁇ height of 1.0 mm provided with a magnetic gap, as another example of an analysis model of an inductance element used in the DC superposition characteristic analysis method of the present invention.
- FIG. 8 is a longitudinal sectional view showing the internal structure of the multilayer inductor 100.
- the multilayer inductor 100 is manufactured by laminating a plurality of ferrite sheets on which a silver paste forming the coil pattern 75 is printed, and firing them integrally. For this reason, the thermal stress by the difference of a thermal expansion coefficient generate
- FIG. 3 by the device shown in Fig. 3 with respect to the direction parallel to the magnetic path of the square toroidal ferrite core with outer dimensions of 8 mm x 8 mm, inner dimensions of 4 mm x 4 mm, and thickness of 2 mm.
- the initial magnetization curve and incremental permeability were obtained by applying stresses of MPa, 20 MPa, and 30 MPa.
- FIG. 9 shows the initial magnetization curve with and without the addition of 30 ⁇ MPa stress.
- FIG. 10 shows the incremental magnetic permeability with and without stress. As the initial magnetization curve and minor loop change with increasing stress, the incremental permeability and operating point also change.
- the stress distribution in the multilayer inductor varies depending on the silver occupancy (volume%) in the multilayer inductor and the shape of the conductor pattern that becomes the coil. Therefore, the stress distribution is calculated using the finite element method and related to the magnetic field analysis.
- the DC superimposition characteristics were analyzed by a magnetic field analysis simulator with and without the stress of 30 ⁇ ⁇ MPa.
- FIG. 11 shows the relationship between the DC applied current Idc and the inductance L.
- the inductance L measured at 25 ° C. for the multilayer inductor is also shown.
- the solid line 1 shows the analytical value for a multilayer inductor having 10.5 turns of the coil and one layer of 3.5 ⁇ m magnetic gap, and the ⁇ mark shows the measured value.
- Solid line 2 shows the analytical value for a multilayer inductor having 9.5 turns of the coil and three layers of 8 ⁇ m magnetic gaps, and ⁇ shows the measured value.
- the solid line 3 shows the analytical value for a multilayer inductor having 5.5 turns of the coil and six layers of 3.5 .mu.m magnetic gaps, and .DELTA. From FIG. 11, it can be seen that the analysis value agrees well with the actual measurement value.
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Abstract
Description
インダクタンス素子と同じ磁性材からなるトロイドダルコアについて初磁化状態から飽和磁化までの初磁化曲線求めるとともに、前記初磁化曲線上の動作点の異なる複数のマイナーループを求め、各動作点とそれに対応する前記マイナーループの勾配として定義される増分透磁率から、磁束密度又は磁界強度と増分透磁率との関係を示す点列データを得る第一の工程と、
前記インダクタンス素子をメッシュ分割してなる解析モデルの各要素について、磁界解析シミュレータにより前記トロイドダルコアの初磁化曲線に基づいて所定の直流印加電流に対する動作点を求め、前記動作点に基づいて前記点列データから増分透磁率を割り付け、各要素における増分透磁率により得られたインダクタンス値を積分して前記インダクタンス素子全体のインダクタンス値を求める第二の工程と、
異なる直流印加電流で前記第二の工程を繰り返すことにより直流重畳特性を得る第三の工程とを
有することを特徴とする。
インダクタンス素子と同じ磁性材からなるトロイドダルコアについて得た初磁化状態から飽和磁化までの初磁化曲線のデータと、前記初磁化曲線上の動作点の異なる複数のマイナーループについて得た磁束密度又は磁界強度と増分透磁率との関係を示す点列データとを格納する手段と、
前記インダクタンス素子の解析モデルを入力する手段と、
前記解析モデルのメッシュ分割された各要素について、前記トロイドダルコアの初磁化曲線に基づいて所定の直流印加電流に対する動作点を求め、前記動作点に基づいて前記点列データから増分透磁率を割り付け、各要素における増分透磁率により得られたインダクタンス値を積分して前記インダクタンス素子のインダクタンス値を得る計算手段とを
有することを特徴とする。
第一の工程では、インダクタンス素子と同じ磁性材からなるトロイドダルコアについて初磁化状態から飽和磁化までの初磁化曲線のメジャーループと、前記初磁化曲線上の動作点の異なる複数のマイナーループと測定する。更にそれらの応力依存性及び温度依存性を測定しておくと、インダクタンス素子内の応力分布や、周辺の環境温度又は自己発熱に応じたインダクタンス素子の直流重畳特性を解析できる。
H’=(Hn1+Hn2)/2
B’=(Bn1+Bn2)/2
Δμ=ΔB/ΔH
第二の工程では電磁界シミュレータを用いてインダクタンスを算出する。本発明では、電磁界シミュレータとして例えば株式会社日本総研ソリューションズが提供する電磁界解析ソフトウェアJMAG(登録商標)を用いて、過渡応答解析を行う。電磁界シミュレータの個々の機能についての説明は省略するが、増分透磁率Δμは、電磁界シミュレータに付属する、要素ごとに磁化特性を定義するユーザーサブルーチンmagusr.fを用いて、磁束密度とΔμとの点列データをDLLファイル(ダイナミックリンクライブラリファイル)に変換し、読み込むことで割り当てることができる。
直流印加電流Idc(磁界強度)を変化させて第二の工程を繰り返すことにより、インダクタンス素子の直流重畳特性を高精度かつ高速に求めることができる。全ての演算はコンピュータで行う。
外径30 mm×内径20 mm×厚さ7.5 mmのトロイドダルフェライトコアに一次巻線と二次巻線をそれぞれ80ターン巻回し、初磁化曲線とマイナーループを計測した。図4に第1象限における初磁化曲線とメジャーループを示す。マイナーループは磁界強度を100 A/mステップで増加させ、ΔHを20 A/mとして求めた。なお磁界強度を計測するステップは一定でなくても良く、ΔBの変化が大きな領域では狭く、小さな領域では広くしても良い。初磁化曲線から初磁化特性を求め、とマイナーループから磁束密度と増分透磁率との点列データを求めた。
図7は本発明の直流重畳特性の解析方法に用いるインダクタンス素子の解析モデルの他の例として、磁気ギャップを備えた長さ2.0 mm×幅1.25 mm×高さ1.0 mmの積層インダクタ100を示す。図8は積層インダクタ100の内部構造を示す縦断面図である。積層インダクタ100は、コイルパターン75を形成する銀ペーストを印刷したフェライトシートを複数枚積層し、一体焼成することにより製造される。このため、銀層とフェライトシートとの界面に熱膨張係数の差による熱応力が発生する。フェライトの初磁化曲線、増分透磁率等の磁気特性は応力の影響を受けやすい。
Claims (5)
- 磁界解析シミュレータを用いたインダクタンス素子の直流重畳特性の解析方法であって、
インダクタンス素子と同じ磁性材からなるトロイドダルコアについて初磁化状態から飽和磁化までの初磁化曲線を求めるとともに、前記初磁化曲線上の動作点の異なる複数のマイナーループを求め、各動作点とそれに対応する前記マイナーループの勾配として定義される増分透磁率から、磁束密度又は磁界強度と増分透磁率との関係を示す点列データを得る第一の工程と、
前記インダクタンス素子をメッシュ分割してなる解析モデルの各要素について、磁界解析シミュレータにより前記トロイドダルコアの初磁化曲線に基づいて所定の直流印加電流に対する動作点を求め、前記動作点に基づいて前記点列データから増分透磁率を割り付け、各要素における増分透磁率により得られたインダクタンス値を積分して前記インダクタンス素子全体のインダクタンス値を求める第二の工程と、
異なる直流印加電流で前記第二の工程を繰り返すことにより直流重畳特性を得る第三の工程とを
有することを特徴とする方法。 - 請求項1に記載のインダクタンス素子の直流重畳特性の解析方法において、前記トロイドダルコアを予め磁化しておくことにより、磁化された場合の直流重畳特性を得ることを特徴とする方法。
- 請求項1又は2に記載のインダクタンス素子の直流重畳特性の解析方法において、前記解析モデルについて予め求めた応力解析結果に基づいて、第一の工程で前記トロイドダルコアに応力を加えた状態での点列データを求め、第二の工程で前記解析モデルの各要素における応力状態に応じた点列データを用いることを特徴とする方法。
- 請求項1~3のいずれかに記載のインダクタンス素子の直流重畳特性の解析方法において、前記解析モデルについて予め求めた熱解析結果に基づいて、第一の工程で前記トロイドダルコアの所定の温度での点列データを求め、第二の工程で前記解析モデルの各要素における温度状態に応じた点列データを用いることを特徴とする方法。
- インダクタンス素子の直流重畳特性を解析する磁界解析シミュレータであって、
インダクタンス素子と同じ磁性材からなるトロイドダルコアについて得た初磁化状態から飽和磁化までの初磁化曲線のデータと、前記初磁化曲線上の動作点の異なる複数のマイナーループについて得た磁束密度又は磁界強度と増分透磁率との関係を示す点列データとを格納する手段と、
前記インダクタンス素子の解析モデルを入力する手段と、
前記解析モデルのメッシュ分割された各要素について、前記トロイドダルコアの初磁化曲線に基づいて所定の直流印加電流に対する動作点を求め、前記動作点に基づいて前記点列データから増分透磁率を割り付け、各要素における増分透磁率により得られたインダクタンス値を積分して前記インダクタンス素子のインダクタンス値を得る計算手段とを
有することを特徴とする電磁界シミュレータ。
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EP09817831.2A EP2336921A4 (en) | 2008-09-30 | 2009-09-30 | METHOD FOR ANALYZING CONTINUOUS SUPERPOSITION CHARACTERISTICS OF AN INDUCTANCE ELEMENT AND ELECTROMAGNETIC FIELD SIMULATOR |
CN2009801359659A CN102150165B (zh) | 2008-09-30 | 2009-09-30 | 电感元件的直流叠加特性的分析方法及电磁场模拟装置 |
JP2010504366A JP4587005B2 (ja) | 2008-09-30 | 2009-09-30 | インダクタンス素子の直流重畳特性の解析方法及び電磁界シミュレータ |
US13/121,488 US8723508B2 (en) | 2008-09-30 | 2009-09-30 | Method for analyzing DC superposition characteristics of inductance device, and electromagnetic field simulator |
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JP2004294123A (ja) * | 2003-03-25 | 2004-10-21 | Kyocera Corp | インダクタンス算出法及び直流重畳特性算出法 |
WO2008018187A1 (en) * | 2006-08-08 | 2008-02-14 | Murata Manufacturing Co., Ltd. | Laminated coil component and method of manufacturing the same |
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JP2984108B2 (ja) | 1991-10-07 | 1999-11-29 | 新日本製鐵株式会社 | 直流重畳のインダクタンス計算装置 |
JP2941516B2 (ja) * | 1991-10-07 | 1999-08-25 | 新日本製鐵株式会社 | 直流重畳の鉄損計算装置 |
JP3621300B2 (ja) * | 1999-08-03 | 2005-02-16 | 太陽誘電株式会社 | 電源回路用積層インダクタ |
US6960911B2 (en) * | 2002-01-29 | 2005-11-01 | Kabushiki Kaisha Toshiba | Strain sensor |
JP2004184232A (ja) | 2002-12-03 | 2004-07-02 | Matsushita Electric Ind Co Ltd | 磁気検出素子及びその製造方法、並びにその磁気検出素子を用いた磁気検出装置及び方位センサ |
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KR100744535B1 (ko) * | 2006-09-05 | 2007-08-01 | 포항공과대학교 산학협력단 | 누화 간섭을 감소시키는 가드 트레이스 패턴 및 상기 가드트레이스 패턴을 구비하는 인쇄회로기판 |
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JP2004294123A (ja) * | 2003-03-25 | 2004-10-21 | Kyocera Corp | インダクタンス算出法及び直流重畳特性算出法 |
WO2008018187A1 (en) * | 2006-08-08 | 2008-02-14 | Murata Manufacturing Co., Ltd. | Laminated coil component and method of manufacturing the same |
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Cited By (6)
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US9506995B2 (en) | 2011-07-19 | 2016-11-29 | Hitachi, Ltd. | Magnetic field analysis programs and magnetic field analysis methods |
US10521533B2 (en) | 2013-05-14 | 2019-12-31 | Murata Manufacturing Co., Ltd. | Inductor simulation method and inductor nonlinear equivalent circuit model |
WO2015097735A1 (ja) * | 2013-12-24 | 2015-07-02 | 株式会社日立製作所 | インダクタンス計算プログラム、及びそれを用いて設計した電気機器 |
JP2016143244A (ja) * | 2015-02-02 | 2016-08-08 | 株式会社村田製作所 | パワーインダクタの評価装置、及び、パワーインダクタの評価プログラム |
EP3757862A1 (en) | 2019-06-28 | 2020-12-30 | Fujitsu Limited | Magnetic field simulator method, magnetic field simulator program and corresponding information processing apparatus |
CN114814675A (zh) * | 2022-03-09 | 2022-07-29 | 北京微纳星空科技有限公司 | 标定磁力矩器磁矩的方法、系统、存储介质和电子设备 |
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US8723508B2 (en) | 2014-05-13 |
EP2336921A4 (en) | 2016-05-04 |
CN102150165B (zh) | 2013-07-17 |
EP2336921A1 (en) | 2011-06-22 |
KR20110081943A (ko) | 2011-07-15 |
KR101587902B1 (ko) | 2016-01-22 |
CN102150165A (zh) | 2011-08-10 |
JP4587005B2 (ja) | 2010-11-24 |
US20110181274A1 (en) | 2011-07-28 |
JPWO2010038799A1 (ja) | 2012-03-01 |
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