WO2010015459A3 - Optischer sensor und verfahren zum vermessen von profilen - Google Patents

Optischer sensor und verfahren zum vermessen von profilen Download PDF

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Publication number
WO2010015459A3
WO2010015459A3 PCT/EP2009/057991 EP2009057991W WO2010015459A3 WO 2010015459 A3 WO2010015459 A3 WO 2010015459A3 EP 2009057991 W EP2009057991 W EP 2009057991W WO 2010015459 A3 WO2010015459 A3 WO 2010015459A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical sensor
image recording
measuring profiles
sensor
recording element
Prior art date
Application number
PCT/EP2009/057991
Other languages
English (en)
French (fr)
Other versions
WO2010015459A2 (de
Inventor
Albert Sedlmaier
Stefan Freitag
Bernard Poks
Thomas Dietl
Andreas Bachthaler
Original Assignee
Data M Sheet Metal Solutions Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Data M Sheet Metal Solutions Gmbh filed Critical Data M Sheet Metal Solutions Gmbh
Publication of WO2010015459A2 publication Critical patent/WO2010015459A2/de
Publication of WO2010015459A3 publication Critical patent/WO2010015459A3/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Die Erfindung betrifft einen optischer Sensor (5) zum Vermessen von Profilen nach dem Prinzip des Lichtschnittverfahrens, der folgendes umfasst: mindestens einen Linienprojektor (6), der eine Lichtlinie (9) auf ein Messobjekt (8) ausstrahlt, dessen Profil zu vermessen ist; mindestens ein Bildaufnahmeelement (7) mit einem Sensorelement (2) und einer Objektivanordnung (19) zur Erfassung des reflektierten Strahls des Messobjekts (8), wobei das Sensorelement (2) nicht parallel zur Ebene der Objektivanordnung (19) angebracht ist, und wobei das Sensorelement (2) in Bezug auf die optische Achse (3) des Bildaufnahmeelements (7) in einer Ebene (A'-B') verschiebbar gelagert ist, so dass der Tiefenbereich des Bildaufnahmeelements (7) justierbar ist. Darüber hinaus betrifft die Erfindung eine Messanordnung mit dem optischen Sensor (5), sowie ein entsprechendes Verfahren zum Vermessen von Profilen.
PCT/EP2009/057991 2008-08-04 2009-06-25 Optischer sensor und verfahren zum vermessen von profilen WO2010015459A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102008036264.6 2008-08-04
DE200810036264 DE102008036264A1 (de) 2008-08-04 2008-08-04 Optischer Sensor und Verfahren zum Vermessen von Profilen

Publications (2)

Publication Number Publication Date
WO2010015459A2 WO2010015459A2 (de) 2010-02-11
WO2010015459A3 true WO2010015459A3 (de) 2010-05-06

Family

ID=41527884

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2009/057991 WO2010015459A2 (de) 2008-08-04 2009-06-25 Optischer sensor und verfahren zum vermessen von profilen

Country Status (2)

Country Link
DE (1) DE102008036264A1 (de)
WO (1) WO2010015459A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011000304B4 (de) * 2011-01-25 2016-08-04 Data M Sheet Metal Solutions Gmbh Kalibrierung von Laser-Lichtschnittsensoren bei gleichzeitiger Messung
DE102013103897A1 (de) * 2012-04-25 2013-10-31 Chromasens Gmbh Kameramodul, Produktüberwachungsvorrichtung mit einem solchen Kameramodul und Verfahren zum Abtasten eines Objektes
FR3035207B1 (fr) * 2015-04-14 2021-01-29 Mesure Systems3D Dispositif modulaire de mesure sans contact et systeme de mesure et de controle correspondant
JP6493811B2 (ja) * 2016-11-19 2019-04-03 スミックス株式会社 パターンの高さ検査装置、検査方法
CN109870151B (zh) * 2019-04-15 2023-06-23 湖南科技大学 曲率可调型曲线投线仪及用法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4269512A (en) * 1979-02-21 1981-05-26 Nosler John C Electro-optical position-monitoring apparatus with tracking detector
US4963017A (en) * 1989-05-01 1990-10-16 General Electric Company Variable depth range camera
US5010241A (en) * 1989-01-12 1991-04-23 Hewlett-Packard Company Sensor array and illumination system for a large depth-of-field bar code scanner
US5113080A (en) * 1990-07-10 1992-05-12 New Jersey Institute Of Technology Non-linear displacement sensor based on optical triangulation principle
DE4439307A1 (de) * 1994-11-03 1996-05-09 Albert Dr Mehl 3D - Oberflächenmeßgerät mit hoher Genauigkeit

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4269512A (en) * 1979-02-21 1981-05-26 Nosler John C Electro-optical position-monitoring apparatus with tracking detector
US5010241A (en) * 1989-01-12 1991-04-23 Hewlett-Packard Company Sensor array and illumination system for a large depth-of-field bar code scanner
US4963017A (en) * 1989-05-01 1990-10-16 General Electric Company Variable depth range camera
US5113080A (en) * 1990-07-10 1992-05-12 New Jersey Institute Of Technology Non-linear displacement sensor based on optical triangulation principle
DE4439307A1 (de) * 1994-11-03 1996-05-09 Albert Dr Mehl 3D - Oberflächenmeßgerät mit hoher Genauigkeit

Also Published As

Publication number Publication date
WO2010015459A2 (de) 2010-02-11
DE102008036264A1 (de) 2010-02-18

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