WO2010013333A1 - Vacuum device and vacuum treatment method - Google Patents

Vacuum device and vacuum treatment method Download PDF

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Publication number
WO2010013333A1
WO2010013333A1 PCT/JP2008/063730 JP2008063730W WO2010013333A1 WO 2010013333 A1 WO2010013333 A1 WO 2010013333A1 JP 2008063730 W JP2008063730 W JP 2008063730W WO 2010013333 A1 WO2010013333 A1 WO 2010013333A1
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WO
WIPO (PCT)
Prior art keywords
chamber
tray
workpiece
processing chamber
load
Prior art date
Application number
PCT/JP2008/063730
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French (fr)
Japanese (ja)
Inventor
澄人 坂口
芳夫 高見
英樹 岡本
大 北原
Original Assignee
株式会社島津製作所
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Priority to PCT/JP2008/063730 priority Critical patent/WO2010013333A1/en
Publication of WO2010013333A1 publication Critical patent/WO2010013333A1/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
    • C23C16/345Silicon nitride
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67196Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67201Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67751Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece

Definitions

  • the present invention relates to a vacuum apparatus and a vacuum processing method used for thin film formation such as vapor deposition, sputtering, chemical vapor deposition (CVD), etc., or thin film processing such as etching.
  • Vacuum devices used for semiconductor, insulator, metal thin film formation and thin film processing are configured in an appropriate form in accordance with necessary characteristics. For example, as a typical form, “batch type” shown in FIG. 1A, “inline type” shown in FIG. 1B, “cluster” shown in FIG. 1C and FIG. Type "vacuum device (for example, see Patent Documents 1 and 2).
  • the processing time may be long.
  • the “in-line type” vacuum apparatus as shown in FIG. 1B is intermittently loaded because new workpieces are loaded and unloaded after the processing in each chamber is completed.
  • a waiting time until the processing in each room is completed occurs, the processing time becomes long, and the production efficiency may deteriorate.
  • a transport mechanism for individually transporting between the chambers is also required.
  • an object of the present invention is to provide a vacuum apparatus and a vacuum processing method that can simultaneously transfer workpieces to a plurality of chambers and have high production efficiency with a simple configuration.
  • an aspect of the present invention includes: (a) a chamber capable of being evacuated; (b) a processing chamber provided in a part above the chamber; A load chamber that is provided in another part of the upper side, and (d) is disposed inside the chamber, faces the processing chamber and the loading chamber, and conveys the workpiece below the processing chamber or the loading chamber. And (e) a first tray that moves up and down between the load chamber and the transfer mechanism to transfer workpieces between the load chamber and the transfer mechanism, and partitions the load chamber so that it can be evacuated.
  • the vacuum apparatus includes a second tray that moves up and down between the processing chamber and the transport mechanism and transports the workpiece between the processing chamber and the transport mechanism.
  • a chamber capable of being evacuated (b) a first processing chamber provided in a part above the chamber and processing a workpiece, and (c) a first processing chamber above the chamber.
  • a load chamber for loading and unloading the workpiece (d) a second processing chamber for processing the workpiece, facing the processing chamber across the load chamber above the chamber, and (e) disposed inside the chamber, A transport mechanism that simultaneously faces at least two chambers, the first processing chamber, the second processing chamber, and the load chamber;
  • the first tray that partitions the load chamber so that it can be evacuated, and (g) the workpiece is transported between the first processing chamber and the transport mechanism by moving up and down between the first processing chamber and the transport mechanism.
  • the vacuum apparatus includes a second tray.
  • aspects of the present invention include (a) a chamber capable of being evacuated, (b) a processing chamber provided in a part above the chamber, and (iii) adjacent to the processing chamber above the chamber, A first load chamber for loading and unloading a workpiece; (d) a second load chamber for processing the workpiece facing the first load across the processing chamber above the chamber; and (e) a processing chamber disposed inside the chamber.
  • a transport mechanism that simultaneously faces at least two of the first load chamber and the second load chamber; and (f) between the first load chamber and the transport mechanism by moving up and down between the first load chamber and the transport mechanism. Conveys workpieces and moves the first load chamber between the processing chamber and the transport mechanism by moving up and down between the first tray and the processing chamber and the transport mechanism.
  • the gist of the present invention is that the vacuum device includes a second tray.
  • a chamber capable of being evacuated, a processing chamber provided in a part above the chamber, and a workpiece processing chamber, provided in another part above the chamber, A load chamber to be taken in and out;
  • a transfer mechanism that is disposed inside the chamber, faces the processing chamber and the load chamber, and transfers workpieces below the processing chamber or the load chamber;
  • a load chamber and a transfer mechanism The first tray that partitions the load chamber so that the load chamber can be evacuated, and (d) the vertical movement between the processing chamber and the transport mechanism.
  • the gist of the present invention is a vacuum processing method including a step of forming a solar cell antireflection film on the surface of the solar cell while heating the solar cell.
  • FIG. 1A is a schematic diagram illustrating an example of the configuration of a batch type vacuum apparatus
  • FIG. 1B is a schematic diagram illustrating an example of the configuration of an inline type vacuum apparatus
  • FIG. 1D is a schematic diagram showing an example of the configuration of a cluster type vacuum apparatus.
  • FIG. 2 is a schematic diagram showing an example of the configuration of the vacuum apparatus according to the first embodiment of the present invention.
  • FIG. 3 is a schematic view showing an example when the vacuum apparatus according to the first embodiment of the present invention is viewed from above.
  • FIG. 4 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention.
  • FIG. 5 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention.
  • FIG. 1A is a schematic diagram illustrating an example of the configuration of a batch type vacuum apparatus
  • FIG. 1B is a schematic diagram illustrating an example of the configuration of an inline type vacuum apparatus
  • FIG. 1D is a
  • FIG. 6 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention.
  • FIG. 7 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first modification of the first embodiment of the present invention.
  • FIG. 8 is a schematic diagram showing an example of the configuration of a vacuum device according to a second modification of the first embodiment of the present invention.
  • FIG. 9 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the second embodiment of the present invention.
  • FIG. 10 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention.
  • FIG. 11 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention.
  • FIG. 12 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention.
  • FIG. 13 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention.
  • FIG. 14 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the third embodiment of the present invention.
  • FIG. 15 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the third embodiment of the present invention.
  • FIG. 16 is a schematic diagram illustrating an example of the operation of the vacuum apparatus according to the third embodiment of the present invention.
  • FIG. 17 is a schematic diagram illustrating an example of a configuration of a vacuum apparatus according to a modification of the third embodiment of the present invention.
  • FIG. 18 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the fourth embodiment of the present invention.
  • FIG. 19 is a schematic view showing an example of a vacuum apparatus according to the fourth embodiment of the present invention as viewed from above.
  • the vacuum apparatus includes a chamber 30 that can be evacuated, and a processing chamber that is provided in a part of the chamber 30 and processes workpieces 1a and 1b. 20 and a load chamber 10 provided in another part above the chamber 30 for taking in and out the workpieces 1a and 1b, and a control device 40.
  • a vacuum pump 35 for evacuating the inside of the chamber 30 is connected via a valve 34.
  • a transport mechanism 36 that faces the processing chamber 20 and the load chamber 10 is disposed inside the chamber 30, a transport mechanism 36 that faces the processing chamber 20 and the load chamber 10 is disposed.
  • the transport mechanism 36 includes a flat plate-like rotation mechanism 31 having a surface facing the load chamber 10 and the processing chamber 20 as a rotation surface, and a rotation shaft 32 connected to the rotation mechanism 31.
  • the rod rotating shaft 32 is connected to the center of the rotating mechanism 31 as shown in FIG.
  • the rotation mechanism 31 rotates 180 degrees about the rotation shaft 32, thereby moving the workpiece 1a under the load chamber 10 below the processing chamber 20 and simultaneously moving the workpiece 1b below the processing chamber 20 into the load chamber. Move it below 10. That is, the workpieces 1a and 1b can be exchanged simultaneously between the load chamber 10 and the processing chamber 20 only by rotating the rotation mechanism 31 by 180 degrees.
  • the rotation mechanism 31 has a quadrangular shape, but may have another shape such as a disk shape.
  • the load chamber 10 is defined by a first tray 11 and a lid 12 facing the first tray 11 in the upper portion of the chamber 30.
  • the 1st tray 11 is provided with the function as a gate valve which partitions off between chamber 30 and load room 10 so that vacuum is possible.
  • the shapes of the first tray 11 and the lid portion 12 may be the same.
  • the first tray 11 and the lid portion 12 are in close contact with the wall surface of the chamber 30 via an O-ring, a bellows, etc. (not shown).
  • the load chamber 10 is provided with a valve 13 connected to a vent line for introducing vent gas and air and a valve 14 connected to a vacuum pump 15. Air gas or vent gas is supplied from a vent line connected to the tip of the valve 13, and the inside of the load chamber 10 can be changed to an air atmosphere or a vent gas atmosphere. Alternatively, the inside of the load chamber 10 can be evacuated by the vacuum pump 15 to reduce the inside of the load chamber 10 to a predetermined pressure.
  • the workpieces 1a and 1b are taken in and out by removing the lid 12 (or moving the lid 12 up and down) in a state where the opening of the chamber 30 is closed by the first tray 11 and the chamber 30 is not opened to the atmosphere. Done.
  • the first tray 11 moves up and down between the load chamber 10 and the transport mechanism 36 (the rotation mechanism 31) and transports the workpiece 1 a between the load chamber 10 and the transport mechanism 36.
  • a pulling mechanism (not shown) is connected to the first tray 11.
  • details of the structure of the tension mechanism are not particularly limited here, for example, an air cylinder, a tension spring, a tension wire, a vacuum motor, or the like can be used.
  • the processing chamber 20 is defined by a second tray 21 in a part above the chamber 30.
  • a vacuum pump 25 is connected to the processing chamber 20 via a valve 24.
  • the processing chamber 20 is a chemical vapor deposition (CVD) apparatus
  • an electrode (not shown) for plasma discharge is disposed inside the processing chamber 20.
  • the processing chamber 20 is a vacuum deposition apparatus
  • an electron beam (EB) apparatus or the like is disposed inside the processing chamber 20.
  • EB electron beam
  • a discharge electrode is disposed inside the processing chamber 20.
  • the processing chamber 20 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the processing chamber 20.
  • MBE molecular beam epitaxial
  • the second tray 21 has a function as a gate valve or a shutter for partitioning the chamber 30 and the processing chamber 20 in a vacuumable manner.
  • the entire interior of the load chamber 10 is covered by the second tray 21, but the shape of the second tray 21 is not limited to this.
  • a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, and the work 1b is transported from the second tray 21 to the inside of the chamber 30. Any structure can be used as long as it does not fall.
  • the second tray 21 moves up and down between the processing chamber 20 and the transport mechanism 36 (the rotation mechanism 31) and transports the workpiece 1 b between the processing chamber 20 and the transport mechanism 36.
  • a pulling mechanism (not shown) is connected to the second tray 21.
  • the tension mechanism are not particularly limited here, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
  • the second tray 21 and the first tray 11 preferably have the same shape. Thereby, as shown in FIG. 5, when the workpieces 1a and 1b are exchanged, the entire first tray 11 and the second tray 21 can be placed on the rotating mechanism 31 and exchanged. The work 1a, 1b can be carried in or out efficiently.
  • the control device 40 controls various operations of the vacuum device. For example, as shown in FIG. 2, while the workpiece 1 b is being processed in the processing chamber 20, a new workpiece 1 a is carried into the load chamber 10 and evacuated to a predetermined pressure, or the transfer mechanism 36. It is also possible to arrange the workpiece 1a on the top.
  • the workpieces 1a and 1b are, for example, a semiconductor substrate (semiconductor wafer) in the manufacture of a semiconductor device, a liquid crystal substrate in the manufacture of a liquid crystal device, a resin substrate in the manufacture of a magnetic recording medium or an optical recording medium, a magnetic material substrate in the manufacture of a thin film magnetic head,
  • a semiconductor substrate semiconductor wafer
  • liquid crystal substrate in the manufacture of a liquid crystal device
  • resin substrate in the manufacture of a magnetic recording medium or an optical recording medium
  • a magnetic material substrate in the manufacture of a thin film magnetic head
  • the workpieces 1a and 1b various organic materials such as synthetic resins, semiconductors, metals, ceramics, and glasses are selected according to the type of the intended product (industrial product). Is possible.
  • workpieces 1a and 1b are plate-like processing intermediates such as semiconductor wafers, which are called “manufacturing substrates”. It can be used according to the type of product (industrial product). In the case of a semiconductor wafer or the like, an intermediate product or the like in a state where a thin film is stacked on a semiconductor wafer in a narrow sense as a base material is also included in the “work”.
  • the lid 12 of the load chamber 10 is moved, and the work 1 a is carried onto the first tray 11. Thereafter, the lid 12 is closed to seal the load chamber 10, the valve 14 is opened, and the inside of the load chamber 10 is evacuated by the vacuum pump 15.
  • the processing chamber 20 performs a predetermined process on the workpiece 1b held on the second tray 21. After the processing of the workpiece 1b in the processing chamber 20, as shown in FIG. 5, the first tray 11 and the second tray 21 are moved up and down, and the first tray 11 and the second tray 21 are rotated by the rotation mechanism 31. Place on the surface.
  • the rotation mechanism 31 rotates 180 ° about the rotation shaft 32, the positions of the first tray 11 and the second tray 21 are simultaneously exchanged as shown in FIG. Thereafter, the first tray 11 and the second tray 21 are again pulled up to the top of the chamber 30 by a pulling mechanism (not shown).
  • the processed workpiece 1 b held on the second tray 21 is introduced into the load chamber 10 by the second tray 21.
  • the valve 13 is opened, and vent gas or air is introduced into the load chamber 10 so that the atmosphere around the work 1b is bent gas atmosphere, Or it returns to atmospheric pressure atmosphere.
  • the lid 12 is opened to take out the work 1b, and the next work is placed on the second tray 21.
  • the first tray 11 is pulled up to the top of the chamber 30 by a pulling mechanism (not shown).
  • the processing chamber 20 is defined in the upper part of the chamber 30.
  • a predetermined process is performed after being adjusted to a predetermined pressure by the vacuum pump 25 as necessary.
  • the vertical movement of the first tray 11 and the second tray 21 may be moved simultaneously or separately.
  • the first tray 11 and the second tray 21 convey the workpieces 1a and 1b to the processing chamber 20 or the load chamber 10 and the chamber 30.
  • the function as a gate valve for partitioning the load chamber 10 and the processing chamber 20 is also provided. Therefore, unlike the conventional apparatus, it is not necessary to separately provide a transport mechanism and a valve, and the number of apparatuses can be reduced and simplified. As a result, the load chamber 10 and the processing chamber 20 can be reduced to a size close to the workpiece size, and the size of the entire vacuum apparatus can be reduced. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
  • the rotating mechanism 31 as the transport mechanism 36 provided in the chamber 30, the workpieces 1a and 1b to be introduced next can be obtained simply by rotating the rotating mechanism 31 by 180 °. Since the two chambers can be simultaneously opposed to each other, the transfer from the load chamber 10 to the processing chamber 20 and from the processing chamber 20 to the load chamber 10 can be performed simultaneously, and the production efficiency is increased. Further, the waiting time can be reduced as compared with the conventional transport mechanism. By using the rotation mechanism 31, the mechanism becomes simpler than the case where a plurality of transport mechanisms are provided, and maintenance is also facilitated.
  • FIG. 7 shows a vacuum apparatus according to a first modification of the first embodiment.
  • openings 33 and 37 for passing the first tray 11 and the second tray 21 below the rotation mechanism 31 are provided in the rotation mechanism 31. Then, by moving the first tray 11 and the second tray 21 to the lower part of the rotation mechanism 31 from the openings 33 and 37, the workpieces 1a and 1b are placed directly on the rotation surface of the rotation mechanism 31.
  • the degree of freedom in selecting the apparatus is increased. Get higher.
  • a heating source or the like for heating the workpieces 1a and 1b may be disposed on the rotation surface of the rotation mechanism 31.
  • FIG. 8 shows a vacuum apparatus according to a second modification of the first embodiment.
  • the vacuum apparatus shown in FIG. 8 is a vacuum apparatus in which the load chambers 10a and 10b and the processing chambers 20a and 20b are alternately arranged in the rotation direction of the rotation mechanism 31 (0 °, 90 °, 180 ° 270 ° direction).
  • the rotation mechanism 31 can convey the workpieces 1a, 1b, 1c, and 1d by rotating 90 degrees about the rotation shaft 32 as an axis.
  • the processing efficiency is further improved.
  • the vacuum apparatus according to the second embodiment is different from the vacuum apparatus according to the first embodiment in that it has two processing chambers (first processing chamber 50 and second processing chamber 60). That is, as shown in FIG. 9, the vacuum apparatus includes a chamber 30 that can be evacuated, a first processing chamber 50 that is provided in a part above the chamber 30, and processes the workpieces 1 a and 1 b, and an upper portion of the chamber 30.
  • the first processing chamber 50 is adjacent to the load chamber 10 into and out of the workpieces 1a and 1b, and the first processing chamber 50 is opposed to the first processing chamber 50 across the load chamber 10 above the chamber 30 to process the workpieces 1a and 1b. 2 processing chambers 60.
  • the transport mechanism 360 includes a transport base 310 that transports the workpieces 1 a and 1 b and a moving mechanism (not shown) connected to the transport base 310.
  • the transport mechanism 360 can be moved in the horizontal direction of the paper surface of FIG. 9 inside the chamber 30 by a moving mechanism.
  • the moving mechanism is not particularly limited, and various means such as a roller can be used.
  • the transport mechanism 360 has openings 330 and 370 for passing the first tray 11 and the second tray 51 and the third tray 61 (described later) below the transport mechanism 360.
  • the transport mechanism 360 By moving the first tray 11, the second tray 51, and the third tray 61 to the lower part of the transport mechanism 360 through the openings 330 and 370, as shown in FIG. 11.
  • the workpieces 1a and 1b conveyed by the second tray 51 or the third tray 61 are directly placed.
  • the load chamber 10 is disposed in the center above the chamber 30.
  • the configuration of the load chamber 10 is substantially the same as that in FIG.
  • the first processing chamber 50 is defined by a second tray 51 in the upper part of the chamber 30.
  • a valve 53 connected to a vent line and a valve 54 connected to a vacuum pump 55 are connected to the first processing chamber 50.
  • an electrode (not shown) for plasma discharge is disposed inside the first processing chamber 50.
  • an electron beam (EB) apparatus or the like is disposed inside the first processing chamber 50.
  • EB electron beam
  • a discharge electrode is disposed inside the first processing chamber 50.
  • the first processing chamber 50 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the first processing chamber 50.
  • MBE molecular beam epitaxial
  • the second tray 51 has a function as a gate valve or a shutter for partitioning the chamber 30 and the first processing chamber 50 in a vacuumable manner.
  • the entire inside of the load chamber 10 is covered by the second tray 51, but the shape of the second tray 51 is not limited to this.
  • a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, so that the work 1b does not fall from the second tray 51 into the chamber 30. Any structure can be used.
  • the second tray 51 moves up and down in the chamber 30 and transports the workpiece 1b between the first processing chamber 50 and the transport mechanism 360.
  • a pulling mechanism (not shown) is connected to the second tray 51.
  • the tension mechanism are not particularly limited, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
  • the second processing chamber 60 is defined by a third tray 61 in the upper part of the chamber 30.
  • the second processing chamber 60 is connected to a valve 63 connected to the vent line, a valve 64 connected to the vacuum pump 65, and a power source.
  • a valve 63 connected to the vent line
  • a valve 64 connected to the vacuum pump 65
  • a power source for example, when the second processing chamber 60 is a chemical vapor deposition (CVD) apparatus, an electrode (not shown) for plasma discharge is disposed inside the second processing chamber 60. If the second processing chamber 60 is a vacuum deposition apparatus, an electron beam (EB) apparatus or the like is disposed inside the second processing chamber 60. If the second processing chamber 60 is a sputtering apparatus, a discharge electrode is disposed inside the second processing chamber 60. If the second processing chamber 60 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the second processing chamber 60.
  • MBE molecular beam epitaxial
  • the third tray 61 has a function as a gate valve or a shutter for partitioning the chamber 30 and the second processing chamber 60 in a vacuumable manner.
  • the entire load chamber 10 is covered with the third tray 61, but the shape of the third tray 61 is not limited to this.
  • a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, so that the work 1b does not fall from the third tray 61 into the chamber 30. Any structure can be used.
  • the third tray 61 moves up and down in the chamber 30 and transports the workpiece between the second processing chamber 60 and the transport mechanism 360.
  • a pulling mechanism (not shown) is connected to the third tray 61.
  • the tension mechanism are not particularly limited, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
  • the control device 40 controls various operations of the vacuum device. For example, as shown in FIG. 11, while a workpiece 1 b is being processed in the first processing chamber 50, a new workpiece 1 a is loaded into the load chamber 10 or another workpiece is loaded into the second processing chamber 60. It is possible to For example, if one of the first processing chamber 50 and the second processing chamber is defined as a workpiece cleaning chamber and the other functions as a workpiece deposition chamber, a vacuum apparatus with higher production efficiency can be obtained.
  • the lid 12 of the load chamber 10 is moved and the work 1 a is placed on the first tray 11. Thereafter, the lid 12 is closed to seal the load chamber 10, the valve 14 is opened, and the inside of the load chamber 10 is evacuated by the vacuum pump 15.
  • the first processing chamber 50 for example, an AC power source or a DC power source is driven to form a film on the work 1b held on the second tray 51.
  • the valve 53 is opened and the cleaning gas is supplied into the first processing chamber 50 to perform the cleaning process.
  • the first tray 11, the second tray 51, and the third tray 61 are lowered by a pulling mechanism (not shown).
  • the second tray 51 holding the workpiece 1 b moves to the lower portion of the conveyance table 310 through the opening 330 after placing the workpiece 1 b on the conveyance table 310.
  • the first tray 11 holding the workpiece 1 a moves to the lower portion of the conveyance table 310 through the opening 370 after placing the workpiece 1 b on the conveyance table 310.
  • the third tray 61 that does not hold the workpiece moves to the lower part of the transport table 310 as it is.
  • the transfer table 310 is moved in the direction of the arrow (horizontal direction) in FIG. 12, and the workpiece 1b on the transfer table 310 is opposed to the load chamber 10 as shown in FIG. Make them face each other. Thereafter, the first tray 11, the second tray 51, and the third tray 61 at the lower part of the transport table 310 are raised by a pulling mechanism that is not shown.
  • the work 1 b is introduced into the load chamber 10 by the first tray 11.
  • the valve 13 is opened and vent gas or air is introduced into the load chamber 10, whereby the atmosphere around the work 1 b is returned to the vent gas atmosphere or the atmospheric pressure atmosphere.
  • the lid 12 is opened to take out the work 1b, and the next work is placed on the first tray 11.
  • the first tray 11, the second tray 51, and the third tray 61 are configured to transfer the workpieces 1a and 1b, as well as the load chamber 10 and the first tray. It also functions as a gate valve that partitions the first processing chamber 50, the second processing chamber 60, and the chamber 30. For this reason, it is not necessary to separately provide a transport mechanism and a valve, and the number of devices can be reduced and simplified. As a result, the load chamber 10, the first processing chamber 50, and the second processing chamber 60 can be downsized to near the work size, and the entire vacuum apparatus can be downsized. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
  • the workpieces 1a and 1b can be simultaneously opposed to the two chambers to be introduced next.
  • the production efficiency is higher than when the workpieces 1a and 1b are conveyed one by one by the conventional conveyance mechanism.
  • the second processing chamber 60 can be cleaned using a cleaning gas by using the time during which the film is formed in the first processing chamber 50, so that the waiting time until a specific processing is completed. Can be reduced.
  • the cleaning rate is several to several tens of times the film formation rate. Therefore, the cleaning rate of the vacuum apparatus according to the second embodiment is equal to or higher than the film formation rate. In some cases, 100% availability can be achieved.
  • the usage frequency of each processing chamber is 1 ⁇ 2 that of the load chamber 10.
  • the regular maintenance interval of the processing chamber becomes longer and the production efficiency can be improved.
  • the vacuum apparatus according to the third embodiment is different from the above-described embodiment in that it has two load chambers. That is, as shown in FIG. 14, the vacuum apparatus is provided in a chamber 30 that can be evacuated, a processing chamber 20 that processes the workpieces 1 a and 1 b, and a processing that is performed above the chamber 30.
  • the first load chamber 10 and the second load chamber 70 that are adjacent to the chamber 20 and are opposed to each other with the processing chamber 20 sandwiched above the chamber 30 are provided for loading and unloading the workpieces 1a and 1b.
  • the conveyance mechanism 361 includes a conveyance table 311 that conveys the workpieces 1 a and 1 b and a moving mechanism (not shown) connected to the conveyance table 311.
  • the moving mechanism is not particularly limited, and various means such as a roller can be used.
  • the transport mechanism 361 can move inside the chamber 30 in the horizontal direction of the paper surface of FIG. 14 by a moving mechanism.
  • the load chamber 10 is defined above the chamber 30.
  • the configuration of the load chamber 10 is substantially the same as that in FIG.
  • the processing chamber 20 is disposed in the central portion above the chamber 30.
  • the configuration of the processing chamber 20 is substantially the same as that shown in FIG.
  • the second load chamber 70 is provided in the upper part of the chamber 30 and has a lid 72 that can be opened and closed. As shown in FIG. 16, the second tray 21 is moved below the second load chamber 70 by the transport mechanism 360 to partition the chamber 30 and the first load chamber 10, so that the second load chamber 70 is separated. Is sealed so that it can be evacuated. The second tray 21 and the lid 72 are in close contact with the wall surface of the chamber 30 via an O-ring or bellows (not shown).
  • the second load chamber 70 is provided with a valve 73 connected to a vent line for introducing vent gas and air and a valve 74 connected to a vacuum pump 75. Atmospheric gas or vent gas is supplied from a vent line connected to the tip of the valve 73, and the inside of the second load chamber 70 is changed to an atmospheric atmosphere or a vent gas atmosphere. Alternatively, the inside of the second load chamber 70 is evacuated by the vacuum pump 75, and the inside of the second load chamber 70 is reduced to a predetermined pressure. The work is taken in and out by removing the lid 72 (or moving the lid 72 up and down) in a state where the opening of the chamber 30 is closed by the second tray 21 so that the chamber 30 is not opened to the atmosphere. In the vacuum apparatus shown in FIG. 14, since the second tray 21 is used as a mechanism for partitioning the second load chamber 70, the number of parts can be reduced and the cost can be reduced.
  • the lid 12 of the first load chamber 10 is moved, and the work 1 a is placed on the first tray 11. Thereafter, the lid 12 is closed to seal the first load chamber 10, the valve 14 is opened, and the inside of the first load chamber 10 is evacuated by the vacuum pump 15.
  • the first tray 11 and the second tray 21 are lowered by a pulling mechanism (not shown), and the first tray and the second tray are placed on the transport table 311 as shown in FIG. Place the tray 21.
  • the transfer table 310 is moved in the direction of the arrow (horizontal direction) in FIG. 15, and the work 1b on the transfer table 310 is opposed to the second load chamber 70 as shown in FIG. Make them face each other.
  • the 1st tray 11 and the 2nd tray 21 are raised by the tension
  • the workpiece 1a held on the first tray 11 is carried into the processing chamber 20 and subjected to a predetermined process.
  • the processed workpiece 1 b held on the second tray 21 is carried into the second load chamber 70.
  • the valve 73 is opened, and vent gas or air is introduced into the second load chamber 70, so that the area around the work 1b is returned to atmospheric pressure. Thereafter, the lid 72 is opened to take out the work 1b, and the next work is placed on the first tray 11.
  • the first tray 11 and the second tray 21 transfer the workpieces 1a and 1b, in addition to the first load chamber 10 and the second tray 21. It also functions as a gate valve that partitions the load chamber / processing chamber 20 and the chamber 30. For this reason, it is not necessary to separately provide a transport mechanism and a valve, and the number of devices can be reduced and simplified. Further, since the second tray 21 performs the role of partitioning the second load chamber 70, it is not necessary to provide a tray dedicated to the second load chamber 70. As a result, the first load chamber 10, the second load chamber 70, and the processing chamber 20 can be downsized to near the work size, and the entire vacuum apparatus can be downsized. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
  • the workpieces 1a and 1b can be simultaneously opposed to the two chambers to be introduced next.
  • the production efficiency is also higher than when one piece is conveyed at a time.
  • the use frequency of the load chambers 10 and 70 is 1 ⁇ 2 that of the processing chamber 20.
  • the production efficiency can be improved.
  • FIG. 17 shows a vacuum apparatus according to a modification of the third embodiment.
  • openings 331 and 371 for allowing the first tray 11 and the second tray 21 to pass below the rotation mechanism 31 are provided in the transport table 311. Then, by moving the first tray 11 and the second tray 21 from the openings 331 and 371 to the lower part of the transport table 311, the workpieces 1 a and 1 b are placed directly on the rotation surface of the transport table 311.
  • the vacuum apparatus shown in FIG. 17 even if the first tray 11 and the second tray 21 have different shapes, the workpieces 1a and 1b can be conveyed, so that the degree of freedom in selecting the apparatus is increased. Get higher.
  • a heating source or the like for heating the workpieces 1a and 1b may be arranged on the transport table 311.
  • a fourth tray 71 that partitions the processing chamber 30 and the second load chamber 70 may be further arranged. According to the vacuum device shown in FIG. 17, even if the first tray 11, the second tray 21, and the fourth tray 71 have different shapes, the workpieces 1 a and 1 b are conveyed and the first load chamber 10 Since the two-load chamber 70, the processing chamber 20, and the chamber 30 can be partitioned, the degree of freedom in device selection is increased.
  • the vacuum apparatus according to the fourth embodiment is provided with heating mechanisms 81 and 91 on the bottom surfaces of the first tray 11 and the second tray 21 on which the workpieces 1a and 1b are mounted, respectively. This is different from the vacuum apparatus according to the first embodiment.
  • the heating mechanisms 81 and 91 a heater or a member provided with a hot plate that receives heat from the heater on the heater can be used.
  • a heat ray transmitting member such as glass that transmits heat radiation from the lamp heater and the lamp heater may be used as the heating mechanisms 81 and 91.
  • the heating mechanism 81 may be integrated with the bottom surfaces of the first tray 11 and the second tray, or may be separately disposed. When arrange
  • the first tray 11 or the second tray 21 is provided regardless of the process of the apparatus or the work of conveying the workpieces 1 a and 1 b.
  • a heating plate or the like equipped with a heater is used as the heating mechanisms 81 and 91
  • the first tray 11 or the second tray before the workpieces 1a and 1b are mounted.
  • the temperature of the mounting surface 21 can be set to a target temperature. Thereby, the temperature of the workpieces 1a and 1b can be increased in a short time. Even when a lamp heater or the like is used, heating is performed immediately after the workpieces 1a and 1b are placed.
  • the temperature can be raised at In any case, by directly heating only the workpieces 1a and 1b by the heating mechanisms 81 and 91, the workpieces 1a and 1b can be quickly heated to a target temperature, the control response can be improved, and the waiting time can be increased. The production efficiency is also improved.
  • the first tray 11 and the second tray 21 including the heating mechanisms 81 and 91 are brought into the vacuum while the workpieces 1a and 1b are heated, Since vacuum unloading, vacuum transfer, and vacuum processing can be performed, the temperature can be quickly raised, the temperature control response is high, and a higher-quality solar cell antireflection film can be formed with high efficiency in a short time. .
  • a heating mechanism similar to the heating mechanisms 81 and 91 according to the fourth embodiment may be introduced into the vacuum devices according to the second and third embodiments.
  • the SiNx film is exemplified as the solar cell antireflection film, it is needless to say that other films such as a titanium oxide film and a silicon nitride film can be formed.
  • the present invention can be applied to a vacuum apparatus used for thin film formation such as vapor deposition, sputtering, chemical vapor deposition (CVD) or the like, or thin film processing such as etching.
  • a vacuum apparatus used for thin film formation such as vapor deposition, sputtering, chemical vapor deposition (CVD) or the like, or thin film processing such as etching.

Abstract

A vacuum device has an evacuatable chamber (30), a treatment chamber (20) provided at a part of the upper portion of the evacuatable chamber (30), a load chamber (10) provided at another part of the upper portion of the evacuatable chamber (30), a conveyance mechanism (36) facing both the treatment chamber (20) and the load chamber (10) and conveying work (la, lb) to a portion below the treatment chamber (20) or the load chamber (10), a first tray (11) vertically moving between the load chamber (10) and the conveyance mechanism (36) to convey the work (la, lb) between the load chamber (10) and the conveyance mechanism (36) and partitioning the load chamber (10) so that the load chamber (10) can be evacuated to vacuum, and a second tray (21) vertically moving between the treatment chamber (20) and the conveyance mechanism (36) to convey the work (la, lb) between the treatment chamber (20) and the conveyance mechanism (36).

Description

真空装置及び真空処理方法Vacuum apparatus and vacuum processing method
 本発明は、蒸着、スパッタ、化学気相成長(CVD)等の薄膜形成、またはエッチングなどの薄膜加工に利用される真空装置及び真空処理方法に関する。 The present invention relates to a vacuum apparatus and a vacuum processing method used for thin film formation such as vapor deposition, sputtering, chemical vapor deposition (CVD), etc., or thin film processing such as etching.
 半導体、絶縁体、金属の薄膜形成や薄膜加工などに用いられる真空装置は、必要な特性に合わせて適正な形態に構成されている。例えば、代表的な形態として、図1(a)に示される「バッチ型」、図1(b)に示される「インライン型」、図1(c)及び図1(d)に示される「クラスタ型」の真空装置などがあげられる(例えば、特許文献1及び2参照)。 Vacuum devices used for semiconductor, insulator, metal thin film formation and thin film processing are configured in an appropriate form in accordance with necessary characteristics. For example, as a typical form, “batch type” shown in FIG. 1A, “inline type” shown in FIG. 1B, “cluster” shown in FIG. 1C and FIG. Type "vacuum device (for example, see Patent Documents 1 and 2).
 しかしながら、図1(a)に示す「バッチ型」の真空装置は、装置へのワーク(基板)の投入を連続的に行えないため、処理時間が長くなる場合がある。図1(b)に示すような「インライン型」の真空装置は、各室での処理がそれぞれ終わった後に新たなワークを搬入・搬出させるため、断続的な搬入になる。また、各室での処理が完了するまでの待ち時間が発生するため、処理時間が長くなり、生産効率が悪くなる場合もある。また、各室間の搬送を個別に行うための搬送機構も必要となる。 However, since the “batch type” vacuum apparatus shown in FIG. 1A cannot continuously load the workpiece (substrate) into the apparatus, the processing time may be long. The “in-line type” vacuum apparatus as shown in FIG. 1B is intermittently loaded because new workpieces are loaded and unloaded after the processing in each chamber is completed. In addition, since a waiting time until the processing in each room is completed occurs, the processing time becomes long, and the production efficiency may deteriorate. In addition, a transport mechanism for individually transporting between the chambers is also required.
 一方、図1(c)及び図1(d)に示すような「クラスタ型」の真空装置は、各室への搬入・搬出を2室以上同時に行うことができない。なお、構成によっては、搬送室の搬送機構を複数設置することで、複数の室への搬入を同時に搬送することも可能であるが、複雑な機構が必要となるため、メンテナンスが困難でコストも高くなる。
特開平5-295551号公報 特開2001-239144号公報
On the other hand, the “cluster type” vacuum apparatus as shown in FIG. 1C and FIG. Depending on the configuration, it is possible to simultaneously carry in the loading into a plurality of chambers by installing a plurality of transfer mechanisms in the transfer chamber, but a complicated mechanism is required, which makes maintenance difficult and costly. Get higher.
Japanese Patent Laid-Open No. 5-295551 JP 2001-239144 A
 上記問題点を鑑み、本発明は、複数の室へのワークの搬送を同時に行うことができ、簡易な構成で生産効率の高い真空装置及び真空処理方法を提供することを目的とする。 In view of the above-described problems, an object of the present invention is to provide a vacuum apparatus and a vacuum processing method that can simultaneously transfer workpieces to a plurality of chambers and have high production efficiency with a simple configuration.
 上記目的を達成するために、本発明の態様は、(イ)真空排気可能なチャンバと、(ロ)チャンバの上方の一部に設けられ、ワークを処理する処理室と、(ハ)チャンバの上方の他の一部に設けられ、ワークを出し入れするロード室と、(ニ)チャンバの内部に配置され、処理室及びロード室に対向し、ワークを処理室又はロード室の下方に搬送する搬送機構と、(ホ)ロード室と搬送機構との間を上下してロード室と搬送機構との間でワークを搬送するとともに、ロード室を真空排気可能に間仕切りする第1トレイと、(ヘ)処理室と搬送機構との間を上下して処理室と搬送機構との間でワークを搬送する第2トレイとを備える真空装置であることを要旨とする。 In order to achieve the above object, an aspect of the present invention includes: (a) a chamber capable of being evacuated; (b) a processing chamber provided in a part above the chamber; A load chamber that is provided in another part of the upper side, and (d) is disposed inside the chamber, faces the processing chamber and the loading chamber, and conveys the workpiece below the processing chamber or the loading chamber. And (e) a first tray that moves up and down between the load chamber and the transfer mechanism to transfer workpieces between the load chamber and the transfer mechanism, and partitions the load chamber so that it can be evacuated. The gist of the invention is that the vacuum apparatus includes a second tray that moves up and down between the processing chamber and the transport mechanism and transports the workpiece between the processing chamber and the transport mechanism.
 本発明の他の態様は、(イ)真空排気可能なチャンバと、(ロ)チャンバ上方の一部に設けられ、ワークを処理する第1処理室と、(ハ)チャンバ上方で第1処理室と隣接し、ワークを出し入れするロード室と、(ニ)チャンバ上方でロード室を挟んで処理室と対向し、ワークを処理する第2処理室と、(ホ)チャンバの内部に配置され、第1処理室、第2処理室及びロード室の少なくとも2室に同時に対向する搬送機構と、(ヘ)ロード室と搬送機構との間を上下してロード室と搬送機構との間でワークを搬送するとともに、ロード室を真空排気可能に間仕切りする第1トレイと、(ト)第1処理室と搬送機構との間を上下して、第1処理室と搬送機構との間でワークを搬送する第2トレイとを備える真空装置であることを要旨とする。 Other aspects of the present invention are: (a) a chamber capable of being evacuated, (b) a first processing chamber provided in a part above the chamber and processing a workpiece, and (c) a first processing chamber above the chamber. A load chamber for loading and unloading the workpiece, (d) a second processing chamber for processing the workpiece, facing the processing chamber across the load chamber above the chamber, and (e) disposed inside the chamber, A transport mechanism that simultaneously faces at least two chambers, the first processing chamber, the second processing chamber, and the load chamber; In addition, the first tray that partitions the load chamber so that it can be evacuated, and (g) the workpiece is transported between the first processing chamber and the transport mechanism by moving up and down between the first processing chamber and the transport mechanism. The gist of the present invention is that the vacuum apparatus includes a second tray.
 本発明の他の態様は、(イ)真空排気可能なチャンバと、(ロ)チャンバ上方の一部に設けられ、ワークを処理する処理室と、(ハ)チャンバ上方で処理室と隣接し、ワークを出し入れする第1ロード室と、(ニ)チャンバ上方で処理室を挟んで第1ロードと対向し、ワークを処理する第2ロード室と、(ホ)チャンバの内部に配置され、処理室、第1ロード室及び第2ロード室の少なくとも2室に同時に対向する搬送機構と、(ヘ)第1ロード室と搬送機構との間を上下して第1ロード室と搬送機構との間でワークを搬送するとともに、第1ロード室を真空排気可能に間仕切りする第1トレイと、(ト)処理室と搬送機構との間を上下して、処理室と搬送機構との間でワークを搬送する第2トレイとを備える真空装置であることを要旨とする。 Other aspects of the present invention include (a) a chamber capable of being evacuated, (b) a processing chamber provided in a part above the chamber, and (iii) adjacent to the processing chamber above the chamber, A first load chamber for loading and unloading a workpiece; (d) a second load chamber for processing the workpiece facing the first load across the processing chamber above the chamber; and (e) a processing chamber disposed inside the chamber. A transport mechanism that simultaneously faces at least two of the first load chamber and the second load chamber; and (f) between the first load chamber and the transport mechanism by moving up and down between the first load chamber and the transport mechanism. Conveys workpieces and moves the first load chamber between the processing chamber and the transport mechanism by moving up and down between the first tray and the processing chamber and the transport mechanism. The gist of the present invention is that the vacuum device includes a second tray.
 本発明の他の態様は、(イ)真空排気可能なチャンバと、チャンバの上方の一部に設けられ、ワークを処理する処理室と、チャンバの上方の他の一部に設けられ、ワークを出し入れするロード室と、(ロ)チャンバの内部に配置され、処理室及びロード室に対向し、ワークを処理室又はロード室の下方に搬送する搬送機構と、(ハ)ロード室と搬送機構との間を上下してロード室と搬送機構との間でワークを搬送するとともに、ロード室を真空排気可能に間仕切りする第1トレイと、(ニ)処理室と搬送機構との間を上下して処理室と搬送機構との間でワークを搬送する第2トレイとを備える真空装置を用いた真空処理方法において、(ホ)ワークが太陽電池セルであり、第1トレイ及び第2トレイのワークの搭載面に設けた加熱機構によって太陽電池セルを加熱しながら太陽電池セルの表面に太陽電池反射防止膜を成膜する工程を有する真空処理方法であることを要旨とする。 In another aspect of the present invention, (a) a chamber capable of being evacuated, a processing chamber provided in a part above the chamber, and a workpiece processing chamber, provided in another part above the chamber, A load chamber to be taken in and out; (b) a transfer mechanism that is disposed inside the chamber, faces the processing chamber and the load chamber, and transfers workpieces below the processing chamber or the load chamber; (c) a load chamber and a transfer mechanism The first tray that partitions the load chamber so that the load chamber can be evacuated, and (d) the vertical movement between the processing chamber and the transport mechanism. In a vacuum processing method using a vacuum apparatus including a second tray that transports a workpiece between a processing chamber and a transport mechanism, (e) the workpiece is a solar cell, and the workpieces of the first tray and the second tray The heating mechanism provided on the mounting surface The gist of the present invention is a vacuum processing method including a step of forming a solar cell antireflection film on the surface of the solar cell while heating the solar cell.
図1(a)は、バッチ型真空装置の構成の一例を示す概略図であり、図1(b)は、インライン型真空装置の構成の一例を示す概略図であり、図1(c)及び図1(d)は、クラスタ型真空装置の構成の一例を示す概略図である。FIG. 1A is a schematic diagram illustrating an example of the configuration of a batch type vacuum apparatus, and FIG. 1B is a schematic diagram illustrating an example of the configuration of an inline type vacuum apparatus, and FIG. FIG. 1D is a schematic diagram showing an example of the configuration of a cluster type vacuum apparatus. 図2は、本発明の第1の実施の形態に係る真空装置の構成の一例を示す概略図である。FIG. 2 is a schematic diagram showing an example of the configuration of the vacuum apparatus according to the first embodiment of the present invention. 図3は、本発明の第1の実施の形態に係る真空装置を上面からみた場合の一例を示す概略図である。FIG. 3 is a schematic view showing an example when the vacuum apparatus according to the first embodiment of the present invention is viewed from above. 図4は、本発明の第1の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 4 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention. 図5は、本発明の第1の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 5 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention. 図6は、本発明の第1の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 6 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first embodiment of the present invention. 図7は、本発明の第1の実施の形態の第1変形例に係る真空装置の動作の一例を示す概略図である。FIG. 7 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the first modification of the first embodiment of the present invention. 図8は、本発明の第1の実施の形態の第2変形例に係る真空装置の構成の一例を示す概略図である。FIG. 8 is a schematic diagram showing an example of the configuration of a vacuum device according to a second modification of the first embodiment of the present invention. 図9は、本発明の第2の実施の形態に係る真空装置の構成の一例を示す概略図である。FIG. 9 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the second embodiment of the present invention. 図10は、本発明の第2の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 10 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention. 図11は、本発明の第2の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 11 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention. 図12は、本発明の第2の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 12 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention. 図13は、本発明の第2の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 13 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the second embodiment of the present invention. 図14は、本発明の第3の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 14 is a schematic diagram showing an example of the operation of the vacuum apparatus according to the third embodiment of the present invention. 図15は、本発明の第3の実施の形態に係る真空装置の構成の一例を示す概略図である。FIG. 15 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the third embodiment of the present invention. 図16は、本発明の第3の実施の形態に係る真空装置の動作の一例を示す概略図である。FIG. 16 is a schematic diagram illustrating an example of the operation of the vacuum apparatus according to the third embodiment of the present invention.
ある。
図17は、本発明の第3の実施の形態の変形例に係る真空装置の構成の一例を示す概略図である。 図18は、本発明の第4の実施の形態に係る真空装置の構成の一例を示す概略図である。 図19は、本発明の第4の実施の形態に係る真空装置を上面からみた場合の一例を示す概略図である。
is there.
FIG. 17 is a schematic diagram illustrating an example of a configuration of a vacuum apparatus according to a modification of the third embodiment of the present invention. FIG. 18 is a schematic diagram showing an example of the configuration of a vacuum apparatus according to the fourth embodiment of the present invention. FIG. 19 is a schematic view showing an example of a vacuum apparatus according to the fourth embodiment of the present invention as viewed from above.
 以下図面を参照して、本発明の実施の形態について説明する。以下の図面の記載において、同一または類似の部分には同一または類似の符号が付してある。但し、図面は模式的なものであり、装置やシステムの構成等は現実のものとは異なることに留意すべきである。したがって、具体的な構成は、以下の説明を参酌して判断すべきものである。また図面相互間においても互いの構成等が異なる部分が含まれていることは勿論である。 Embodiments of the present invention will be described below with reference to the drawings. In the following description of the drawings, the same or similar parts are denoted by the same or similar reference numerals. However, it should be noted that the drawings are schematic and the configuration of the apparatus and system is different from the actual one. Therefore, the specific configuration should be determined in consideration of the following description. Moreover, it is a matter of course that portions having different structures and the like are included between the drawings.
 又、以下に示す本発明の実施の形態は、本発明の技術的思想を具体化するための装置や方法を例示するものであって、本発明の技術的思想は、構成部品の材質、形状、構造、配置等を下記のものに特定するものでない。本発明の技術的思想は、特許請求の範囲に記載された技術的範囲内において種々の変更を加えることができる。 The following embodiments of the present invention exemplify apparatuses and methods for embodying the technical idea of the present invention. The technical idea of the present invention is based on the material and shape of component parts. The structure, arrangement, etc. are not specified below. The technical idea of the present invention can be variously modified within the technical scope described in the claims.
(第1の実施の形態)
 本発明の第1の実施の形態に係る真空装置は、図2に示すように、真空排気可能なチャンバ30と、チャンバ30の上方の一部に設けられ、ワーク1a、1bを処理する処理室20と、チャンバ30の上方の他の一部に設けられ、ワーク1a、1bを出し入れするロード室10と、制御装置40とを備える。
(First embodiment)
As shown in FIG. 2, the vacuum apparatus according to the first embodiment of the present invention includes a chamber 30 that can be evacuated, and a processing chamber that is provided in a part of the chamber 30 and processes workpieces 1a and 1b. 20 and a load chamber 10 provided in another part above the chamber 30 for taking in and out the workpieces 1a and 1b, and a control device 40.
 チャンバ30には、内部を真空排気するための真空ポンプ35が、弁34を介して接続されている。チャンバ30の内部には、処理室20及びロード室10に対向する搬送機構36が配置されている。搬送機構36は、ロード室10及び処理室20に対向する面を回転面とする平板状の回転機構31と、回転機構31に連結された回転軸32とを含む。 A vacuum pump 35 for evacuating the inside of the chamber 30 is connected via a valve 34. Inside the chamber 30, a transport mechanism 36 that faces the processing chamber 20 and the load chamber 10 is disposed. The transport mechanism 36 includes a flat plate-like rotation mechanism 31 having a surface facing the load chamber 10 and the processing chamber 20 as a rotation surface, and a rotation shaft 32 connected to the rotation mechanism 31.
 回転軸32は、図3に示すように、回転機構31の中心部に接続されている。回転機構31が回転軸32を軸として180度回転することにより、ロード室10の下にあるワーク1aを処理室20の下に移動させると同時に、処理室20の下にあるワーク1bをロード室10の下に移動させる。即ち、回転機構31を180度回転させるだけで、ロード室10と処理室20との間でワーク1a、1bを同時に交換可能な機構になっている。なお、図3において回転機構31は四角形状を有しているが、円盤状等、他の形状であっても構わない。 The rod rotating shaft 32 is connected to the center of the rotating mechanism 31 as shown in FIG. The rotation mechanism 31 rotates 180 degrees about the rotation shaft 32, thereby moving the workpiece 1a under the load chamber 10 below the processing chamber 20 and simultaneously moving the workpiece 1b below the processing chamber 20 into the load chamber. Move it below 10. That is, the workpieces 1a and 1b can be exchanged simultaneously between the load chamber 10 and the processing chamber 20 only by rotating the rotation mechanism 31 by 180 degrees. In FIG. 3, the rotation mechanism 31 has a quadrangular shape, but may have another shape such as a disk shape.
 ロード室10は、チャンバ30の上部において、第1トレイ11及び第1トレイ11と対向する蓋部12によって区画定義されている。第1トレイ11は、チャンバ30とロード室10との間を真空可能に間仕切りする仕切弁としての機能を備えている。第1トレイ11及び蓋部12の形状は同一であっても構わない。 The load chamber 10 is defined by a first tray 11 and a lid 12 facing the first tray 11 in the upper portion of the chamber 30. The 1st tray 11 is provided with the function as a gate valve which partitions off between chamber 30 and load room 10 so that vacuum is possible. The shapes of the first tray 11 and the lid portion 12 may be the same.
 第1トレイ11及び蓋部12は、図示を省略したOリングや、ベローズ等を介して、チャンバ30の壁面に密着する。ロード室10には、ベントガスや大気を導入するためのベントラインに接続された弁13と真空ポンプ15に接続された弁14が設けられている。弁13の先に接続されたベントラインから、大気ガスやベントガスが供給され、ロード室10内を大気雰囲気、或いはベントガス雰囲気にすることができる。または、真空ポンプ15によりロード室10内を真空排気し、ロード室10の内部を所定の圧力に減圧することができる。ワーク1a、1bの出し入れは、チャンバ30の開口部を第1トレイ11で閉じ、チャンバ30を大気に開放しないようにした状態で、蓋部12を取り外す(又は蓋部12を上下させる)ことにより行われる。 The first tray 11 and the lid portion 12 are in close contact with the wall surface of the chamber 30 via an O-ring, a bellows, etc. (not shown). The load chamber 10 is provided with a valve 13 connected to a vent line for introducing vent gas and air and a valve 14 connected to a vacuum pump 15. Air gas or vent gas is supplied from a vent line connected to the tip of the valve 13, and the inside of the load chamber 10 can be changed to an air atmosphere or a vent gas atmosphere. Alternatively, the inside of the load chamber 10 can be evacuated by the vacuum pump 15 to reduce the inside of the load chamber 10 to a predetermined pressure. The workpieces 1a and 1b are taken in and out by removing the lid 12 (or moving the lid 12 up and down) in a state where the opening of the chamber 30 is closed by the first tray 11 and the chamber 30 is not opened to the atmosphere. Done.
 図5に示すように、第1トレイ11は、ロード室10と搬送機構36(回転機構31)との間を上下して、ロード室10と搬送機構36との間でワーク1aを搬送する。第1トレイ11を上下に動かすために、第1トレイ11には、図示を省略した引張機構が接続されている。引張機構の構造の詳細はここでは特に限定しないが、例えば、エアシリンダ、引張バネ、引張ワイヤ、真空モータ等が利用可能である。 As shown in FIG. 5, the first tray 11 moves up and down between the load chamber 10 and the transport mechanism 36 (the rotation mechanism 31) and transports the workpiece 1 a between the load chamber 10 and the transport mechanism 36. In order to move the first tray 11 up and down, a pulling mechanism (not shown) is connected to the first tray 11. Although details of the structure of the tension mechanism are not particularly limited here, for example, an air cylinder, a tension spring, a tension wire, a vacuum motor, or the like can be used.
 図2に示すように、処理室20は、チャンバ30の上方の一部に、第2トレイ21によって区画定義されている。処理室20は、弁24を介して真空ポンプ25が接続されている。例えば、処理室20が化学気相成長(CVD)装置である場合、処理室20の内部には、プラズマ放電のための電極(図示省略)が配置される。処理室20が真空蒸着装置ならば、処理室20の内部には電子ビーム(EB)装置などが配置される。処理室20がスパッタリング装置ならば、処理室20の内部には放電電極が配置される。処理室20が分子線エピタキシャル(MBE)装置ならば、処理室20の内部にはクヌーセンセル等が配置される。 As shown in FIG. 2, the processing chamber 20 is defined by a second tray 21 in a part above the chamber 30. A vacuum pump 25 is connected to the processing chamber 20 via a valve 24. For example, when the processing chamber 20 is a chemical vapor deposition (CVD) apparatus, an electrode (not shown) for plasma discharge is disposed inside the processing chamber 20. If the processing chamber 20 is a vacuum deposition apparatus, an electron beam (EB) apparatus or the like is disposed inside the processing chamber 20. If the processing chamber 20 is a sputtering apparatus, a discharge electrode is disposed inside the processing chamber 20. If the processing chamber 20 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the processing chamber 20.
 第2トレイ21は、チャンバ30と処理室20との間を真空可能に間仕切りする仕切弁、或いはシャッタとしての機能を備える。図2においては、第2トレイ21によりロード室10全体内を覆うように構成されているが、第2トレイ21の形状はこれに限られない。例えば、第2トレイ21の形状としては、ワーク1bの周端部を囲うように、周端部分に凸部等を形成する等して、ワーク1bが搬送中に第2トレイ21からチャンバ30内に落ちないような構造であればよい。 The second tray 21 has a function as a gate valve or a shutter for partitioning the chamber 30 and the processing chamber 20 in a vacuumable manner. In FIG. 2, the entire interior of the load chamber 10 is covered by the second tray 21, but the shape of the second tray 21 is not limited to this. For example, as the shape of the second tray 21, a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, and the work 1b is transported from the second tray 21 to the inside of the chamber 30. Any structure can be used as long as it does not fall.
 図5に示すように、第2トレイ21は、処理室20と搬送機構36(回転機構31)との間を上下して、処理室20と搬送機構36との間でワーク1bを搬送する。第2トレイ21を上下に動かすために、第2トレイ21には図示を省略した引張機構が接続されている。引張機構の詳細はここでは特に限定しないが、例えば、エアシリンダ、バネ、引張ワイヤ、真空モータ等が利用可能である。 As shown in FIG. 5, the second tray 21 moves up and down between the processing chamber 20 and the transport mechanism 36 (the rotation mechanism 31) and transports the workpiece 1 b between the processing chamber 20 and the transport mechanism 36. In order to move the second tray 21 up and down, a pulling mechanism (not shown) is connected to the second tray 21. Although details of the tension mechanism are not particularly limited here, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
 第2トレイ21及び第1トレイ11は、同一形状を有することが好ましい。これにより、図5に示すように、ワーク1a、1bを交換する際には、第1トレイ11と第2トレイ21を丸ごと回転機構31上に載置して交換できるため、簡単な構成で、効率良くワーク1a、1bの搬入又は搬出が行える。 The second tray 21 and the first tray 11 preferably have the same shape. Thereby, as shown in FIG. 5, when the workpieces 1a and 1b are exchanged, the entire first tray 11 and the second tray 21 can be placed on the rotating mechanism 31 and exchanged. The work 1a, 1b can be carried in or out efficiently.
 制御装置40は、真空装置の各種動作を制御する。例えば、図2に示すように、処理室20においてワーク1bを処理している間に、ロード室10に新たなワーク1aを搬入し、所定の圧力まで真空排気しておく、または、搬送機構36上にワーク1aを配置しておくこと等も可能である。 The control device 40 controls various operations of the vacuum device. For example, as shown in FIG. 2, while the workpiece 1 b is being processed in the processing chamber 20, a new workpiece 1 a is carried into the load chamber 10 and evacuated to a predetermined pressure, or the transfer mechanism 36. It is also possible to arrange the workpiece 1a on the top.
 ワーク1a、1bは、例えば半導体装置の製造では半導体基板(半導体ウエハ)、液晶装置の製造では液晶基板、磁気記録媒体や光記録媒体の製造では樹脂基板、薄膜磁気ヘッドの製造では磁性材料基板、超音波素子の製造方法では圧電材料基板、超伝導素子の製造方法では超伝導材料基板等の製造工程の途中段階における中間生成物を意味する。このため、ワーク1a、1bとしては、有機系の種々な合成樹脂、半導体、金属、セラミック、ガラス等の種々の無機系材料が、その目的とする製造物(工業製品)の種類に応じて選択可能である。ワーク1a、1bの多くは「製造基板」と称される、半導体ウエハ等のような板状の処理中間体であるが、板状に限定される必要はなく、種々の形状がその目的とする製造物(工業製品)の種類に応じて採用可能である。半導体ウエハ等の場合は、母材としての狭義の半導体ウエハ上に薄膜が積層した状態の中間生成物等も「ワーク」に含まれることとする。 The workpieces 1a and 1b are, for example, a semiconductor substrate (semiconductor wafer) in the manufacture of a semiconductor device, a liquid crystal substrate in the manufacture of a liquid crystal device, a resin substrate in the manufacture of a magnetic recording medium or an optical recording medium, a magnetic material substrate in the manufacture of a thin film magnetic head, In the manufacturing method of the ultrasonic element, it means an intermediate product in the middle of the manufacturing process of the piezoelectric material substrate and in the manufacturing method of the superconducting element, the superconducting material substrate. For this reason, as the workpieces 1a and 1b, various organic materials such as synthetic resins, semiconductors, metals, ceramics, and glasses are selected according to the type of the intended product (industrial product). Is possible. Many of the workpieces 1a and 1b are plate-like processing intermediates such as semiconductor wafers, which are called “manufacturing substrates”. It can be used according to the type of product (industrial product). In the case of a semiconductor wafer or the like, an intermediate product or the like in a state where a thin film is stacked on a semiconductor wafer in a narrow sense as a base material is also included in the “work”.
 次に、第1の実施の形態に係る真空装置の動作方法を図4~図6の断面図を用いて説明する。以下に示す動作方法は一例であり、他にも種々の動作方法があることは勿論である。 Next, the operation method of the vacuum apparatus according to the first embodiment will be described with reference to the cross-sectional views of FIGS. The following operation method is an example, and there are of course various other operation methods.
 まず、図4に示すように、ロード室10の蓋部12を動かし、ワーク1aを第1トレイ11の上に搬入する。その後、蓋部12を閉じてロード室10を密閉し、弁14を開いて、真空ポンプ15によりロード室10内を真空排気する。 First, as shown in FIG. 4, the lid 12 of the load chamber 10 is moved, and the work 1 a is carried onto the first tray 11. Thereafter, the lid 12 is closed to seal the load chamber 10, the valve 14 is opened, and the inside of the load chamber 10 is evacuated by the vacuum pump 15.
 ロード室10内を真空排気している間、処理室20では、第2トレイ21上に保持されたワーク1bに対して所定の処理が施される。処理室20でのワーク1bの処理終了後、図5に示すように、第1トレイ11と第2トレイ21とを上下に移動させ、第1トレイ11および第2トレイ21を回転機構31の回転面上に載置させる。 While the load chamber 10 is being evacuated, the processing chamber 20 performs a predetermined process on the workpiece 1b held on the second tray 21. After the processing of the workpiece 1b in the processing chamber 20, as shown in FIG. 5, the first tray 11 and the second tray 21 are moved up and down, and the first tray 11 and the second tray 21 are rotated by the rotation mechanism 31. Place on the surface.
 回転機構31が回転軸32を軸として180°回転することにより、図6に示すように、第1トレイ11と第2トレイ21との位置が同時に交換される。その後、第1トレイ11と第2トレイ21は、再び、図示を省略した引張機構によってチャンバ30の上部へ引き上げられる。 As the rotation mechanism 31 rotates 180 ° about the rotation shaft 32, the positions of the first tray 11 and the second tray 21 are simultaneously exchanged as shown in FIG. Thereafter, the first tray 11 and the second tray 21 are again pulled up to the top of the chamber 30 by a pulling mechanism (not shown).
 第2トレイ21上に保持された処理後のワーク1bは、第2トレイ21によってロード室10内へ導入される。第2トレイ21によってチャンバ30とロード室10との間が仕切られた後、弁13を開き、ベントガス、或いは大気をロード室10の内部に導入することにより、ワーク1b周辺の雰囲気がベントガス雰囲気、或いは大気圧雰囲気に戻される。その後、蓋部12を開けてワーク1bを取り出し、次のワークを第2トレイ21の上へ載置する。 The processed workpiece 1 b held on the second tray 21 is introduced into the load chamber 10 by the second tray 21. After the chamber 30 and the load chamber 10 are partitioned by the second tray 21, the valve 13 is opened, and vent gas or air is introduced into the load chamber 10 so that the atmosphere around the work 1b is bent gas atmosphere, Or it returns to atmospheric pressure atmosphere. Thereafter, the lid 12 is opened to take out the work 1b, and the next work is placed on the second tray 21.
 一方、第1トレイ11は、図示を省略した引張機構によってチャンバ30の上部に引き上げられる。これにより、チャンバ30の上部に処理室20が定義される。処理室20では、必要に応じて、真空ポンプ25によって所定の圧力に調整された後に、所定の処理が施される。第1トレイ11と第2トレイ21の上下移動は同時に動かしても良いし、別々に行ってもよい。 On the other hand, the first tray 11 is pulled up to the top of the chamber 30 by a pulling mechanism (not shown). Thereby, the processing chamber 20 is defined in the upper part of the chamber 30. In the processing chamber 20, a predetermined process is performed after being adjusted to a predetermined pressure by the vacuum pump 25 as necessary. The vertical movement of the first tray 11 and the second tray 21 may be moved simultaneously or separately.
 以上説明したように、第1の実施の形態に係る真空装置によれば、第1トレイ11及び第2トレイ21が、ワーク1a、1bを処理室20又はロード室10へ搬送するとともに、チャンバ30の内部にロード室10及び処理室20を間仕切りする仕切弁としての機能を兼ね備える。このため、従来の装置のように、搬送機構と弁とをそれぞれ別途に設ける必要がなく、装置点数の削減・簡略化が図れる。その結果、ロード室10、処理室20は、ワークサイズ近くまで小型化でき、真空装置全体の装置の小型化も図れる。同時に、各室内部のデッドスペースが削減されることにより、排気・ベント時間の短縮、ベントガスや動力などのランニングコストの削減も可能である。 As described above, according to the vacuum apparatus according to the first embodiment, the first tray 11 and the second tray 21 convey the workpieces 1a and 1b to the processing chamber 20 or the load chamber 10 and the chamber 30. The function as a gate valve for partitioning the load chamber 10 and the processing chamber 20 is also provided. Therefore, unlike the conventional apparatus, it is not necessary to separately provide a transport mechanism and a valve, and the number of apparatuses can be reduced and simplified. As a result, the load chamber 10 and the processing chamber 20 can be reduced to a size close to the workpiece size, and the size of the entire vacuum apparatus can be reduced. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
 また、図2に示すように、チャンバ30内に設けられた搬送機構36として、回転機構31を利用することにより、回転機構31を180°回転させるだけで、次に導入すべきワーク1a、1bを2つの室に同時に対向させることができるので、ロード室10から処理室20、処理室20からロード室10への搬送を同時に行うことができ、生産効率も高くなる。また、従来の搬送機構に比べて待ち時間も少なくできる。回転機構31を利用することにより、搬送機構を複数個設ける場合よりも簡易な機構となり、メンテナンスも容易になる。 Further, as shown in FIG. 2, by using the rotating mechanism 31 as the transport mechanism 36 provided in the chamber 30, the workpieces 1a and 1b to be introduced next can be obtained simply by rotating the rotating mechanism 31 by 180 °. Since the two chambers can be simultaneously opposed to each other, the transfer from the load chamber 10 to the processing chamber 20 and from the processing chamber 20 to the load chamber 10 can be performed simultaneously, and the production efficiency is increased. Further, the waiting time can be reduced as compared with the conventional transport mechanism. By using the rotation mechanism 31, the mechanism becomes simpler than the case where a plurality of transport mechanisms are provided, and maintenance is also facilitated.
 第1の実施の形態の第1の変形例に係る真空装置を図7に示す。図7に示す真空装置は、第1トレイ11、第2トレイ21を回転機構31の下方へ通すための開口部33、37が、回転機構31に設けられている。そして、開口部33、37から第1トレイ11及び第2トレイ21を回転機構31の下部に移動させることによって、回転機構31の回転面上に直接ワーク1a、1bを載置するものである。図7に示す真空装置の場合、第1トレイ11と第2トレイ21とがそれぞれ別の形状を有していても、ワーク1a、1bの搬送を行うことができるので、装置選択の自由度が高くなる。この場合、回転機構31の回転面には、ワーク1a、1bを加熱するための加熱源などが配置されていてもよい。 FIG. 7 shows a vacuum apparatus according to a first modification of the first embodiment. In the vacuum apparatus shown in FIG. 7, openings 33 and 37 for passing the first tray 11 and the second tray 21 below the rotation mechanism 31 are provided in the rotation mechanism 31. Then, by moving the first tray 11 and the second tray 21 to the lower part of the rotation mechanism 31 from the openings 33 and 37, the workpieces 1a and 1b are placed directly on the rotation surface of the rotation mechanism 31. In the case of the vacuum apparatus shown in FIG. 7, since the workpieces 1a and 1b can be conveyed even if the first tray 11 and the second tray 21 have different shapes, the degree of freedom in selecting the apparatus is increased. Get higher. In this case, a heating source or the like for heating the workpieces 1a and 1b may be disposed on the rotation surface of the rotation mechanism 31.
 第1の実施の形態の第2の変形例に係る真空装置を図8に示す。図8に示す真空装置は、ロード室10a、10bと処理室20a、20bとを回転機構31の回転方向(0°、90°、180°270°方向)に交互に並べた真空装置である。回転機構31は、回転軸32を軸として90°ずつ回転することにより、ワーク1a、1b、1c、1dの搬送を行うことができる。図8に示す真空装置によれば、図2の真空装置に比べて室数が多いので、処理効率が更に向上する。 FIG. 8 shows a vacuum apparatus according to a second modification of the first embodiment. The vacuum apparatus shown in FIG. 8 is a vacuum apparatus in which the load chambers 10a and 10b and the processing chambers 20a and 20b are alternately arranged in the rotation direction of the rotation mechanism 31 (0 °, 90 °, 180 ° 270 ° direction). The rotation mechanism 31 can convey the workpieces 1a, 1b, 1c, and 1d by rotating 90 degrees about the rotation shaft 32 as an axis. According to the vacuum apparatus shown in FIG. 8, since the number of chambers is larger than that in the vacuum apparatus of FIG. 2, the processing efficiency is further improved.
(第2の実施の形態)
 第2の実施の形態に係る真空装置は、処理室(第1処理室50、第2処理室60)を2つ有している点が、第1の実施の形態に係る真空装置と異なる。即ち、図9に示すように、真空装置は、真空排気可能なチャンバ30と、チャンバ30の上方の一部に設けられ、ワーク1a、1bを処理する第1処理室50と、チャンバ30の上方で第1処理室50と隣接し、ワーク1a、1bを出し入れするロード室10と、チャンバ30の上方でロード室10を挟んで第1処理室50と対向し、ワーク1a、1bを処理する第2処理室60とを備える。
(Second Embodiment)
The vacuum apparatus according to the second embodiment is different from the vacuum apparatus according to the first embodiment in that it has two processing chambers (first processing chamber 50 and second processing chamber 60). That is, as shown in FIG. 9, the vacuum apparatus includes a chamber 30 that can be evacuated, a first processing chamber 50 that is provided in a part above the chamber 30, and processes the workpieces 1 a and 1 b, and an upper portion of the chamber 30. The first processing chamber 50 is adjacent to the load chamber 10 into and out of the workpieces 1a and 1b, and the first processing chamber 50 is opposed to the first processing chamber 50 across the load chamber 10 above the chamber 30 to process the workpieces 1a and 1b. 2 processing chambers 60.
 チャンバ30の内部には、第1処理室50、第2処理室60及びロード室10の少なくとも2室に同時に対向する搬送機構360が配置されている。搬送機構360は、ワーク1a、1bを搬送する搬送台310と、搬送台310に接続された移動機構(図示省略)を有している。搬送機構360は、移動機構によりチャンバ30の内部を図9の紙面の水平方向に移動可能になっている。移動機構は特に限定されず、ローラ等の様々な手段を用いることができる。 Inside the chamber 30, a transfer mechanism 360 that is simultaneously opposed to at least two of the first processing chamber 50, the second processing chamber 60, and the load chamber 10 is disposed. The transport mechanism 360 includes a transport base 310 that transports the workpieces 1 a and 1 b and a moving mechanism (not shown) connected to the transport base 310. The transport mechanism 360 can be moved in the horizontal direction of the paper surface of FIG. 9 inside the chamber 30 by a moving mechanism. The moving mechanism is not particularly limited, and various means such as a roller can be used.
 搬送機構360には、第1トレイ11及び後述する第2トレイ51及び第3トレイ61を搬送機構360の下方へ通すための開口部330、370を有している。開口部330、370を介して第1トレイ11、第2トレイ51及び第3トレイ61を搬送機構360の下部へ移動させることにより、図12に示すように、搬送台310上に、第1トレイ11、第2トレイ51又は第3トレイ61が搬送したワーク1a、1bが直接載置される。 The transport mechanism 360 has openings 330 and 370 for passing the first tray 11 and the second tray 51 and the third tray 61 (described later) below the transport mechanism 360. By moving the first tray 11, the second tray 51, and the third tray 61 to the lower part of the transport mechanism 360 through the openings 330 and 370, as shown in FIG. 11. The workpieces 1a and 1b conveyed by the second tray 51 or the third tray 61 are directly placed.
 ロード室10は、チャンバ30の上方の中心部に配置されている。ロード室10の構成は、図2と実質的に同様であるので、重複した記載を省略する。 The load chamber 10 is disposed in the center above the chamber 30. The configuration of the load chamber 10 is substantially the same as that in FIG.
 第1処理室50は、チャンバ30の上部において、第2トレイ51によって区画定義されている。第1処理室50には、ベントラインに接続された弁53と、真空ポンプ55に接続された弁54が接続されている。例えば、第1処理室50が化学気相成長(CVD)装置である場合、第1処理室50の内部には、プラズマ放電のための電極(図示省略)が配置される。第1処理室50が真空蒸着装置ならば、第1処理室50の内部には電子ビーム(EB)装置などが配置される。第1処理室50がスパッタリング装置ならば、第1処理室50の内部には放電電極が配置される。第1処理室50が分子線エピタキシャル(MBE)装置ならば、第1処理室50の内部にはクヌーセンセル等が配置される。 The first processing chamber 50 is defined by a second tray 51 in the upper part of the chamber 30. A valve 53 connected to a vent line and a valve 54 connected to a vacuum pump 55 are connected to the first processing chamber 50. For example, when the first processing chamber 50 is a chemical vapor deposition (CVD) apparatus, an electrode (not shown) for plasma discharge is disposed inside the first processing chamber 50. If the first processing chamber 50 is a vacuum deposition apparatus, an electron beam (EB) apparatus or the like is disposed inside the first processing chamber 50. If the first processing chamber 50 is a sputtering apparatus, a discharge electrode is disposed inside the first processing chamber 50. If the first processing chamber 50 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the first processing chamber 50.
 第2トレイ51は、チャンバ30と第1処理室50との間を真空可能に間仕切りする仕切弁、或いはシャッタとしての機能を備える。図9においては、第2トレイ51によりロード室10全体内を覆うように構成されているが、第2トレイ51の形状はこれに限られない。例えば、第2トレイ51の形状としては、ワーク1bの周端部を囲うように、周端部分に凸部等が形成され、ワーク1bが第2トレイ51上からチャンバ30の内部に落ちないような構造であればよい。 The second tray 51 has a function as a gate valve or a shutter for partitioning the chamber 30 and the first processing chamber 50 in a vacuumable manner. In FIG. 9, the entire inside of the load chamber 10 is covered by the second tray 51, but the shape of the second tray 51 is not limited to this. For example, as the shape of the second tray 51, a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, so that the work 1b does not fall from the second tray 51 into the chamber 30. Any structure can be used.
 図11に示すように、第2トレイ51は、チャンバ30内で上下して、第1処理室50と搬送機構360との間でワーク1bを搬送する。第2トレイ51を上下に動かすために、第2トレイ51には、図示を省略した引張機構が接続されている。引張機構の詳細は特に限定されないが、例えば、エアシリンダ、バネ、引張ワイヤ、真空モータ等が利用可能である。 As shown in FIG. 11, the second tray 51 moves up and down in the chamber 30 and transports the workpiece 1b between the first processing chamber 50 and the transport mechanism 360. In order to move the second tray 51 up and down, a pulling mechanism (not shown) is connected to the second tray 51. Although details of the tension mechanism are not particularly limited, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
 第2処理室60は、チャンバ30の上部において、第3トレイ61によって区画定義されている。第2処理室60には、ベントラインに接続された弁63と、真空ポンプ65に接続された弁64と電源が接続されている。例えば、第2処理室60が化学気相成長(CVD)装置である場合、第2処理室60の内部には、プラズマ放電のための電極(図示省略)が配置される。第2処理室60が真空蒸着装置ならば、第2処理室60の内部には電子ビーム(EB)装置などが配置される。第2処理室60がスパッタリング装置ならば、第2処理室60の内部には放電電極が配置される。第2処理室60が分子線エピタキシャル(MBE)装置ならば、第2処理室60の内部にはクヌーセンセル等が配置される。 The second processing chamber 60 is defined by a third tray 61 in the upper part of the chamber 30. The second processing chamber 60 is connected to a valve 63 connected to the vent line, a valve 64 connected to the vacuum pump 65, and a power source. For example, when the second processing chamber 60 is a chemical vapor deposition (CVD) apparatus, an electrode (not shown) for plasma discharge is disposed inside the second processing chamber 60. If the second processing chamber 60 is a vacuum deposition apparatus, an electron beam (EB) apparatus or the like is disposed inside the second processing chamber 60. If the second processing chamber 60 is a sputtering apparatus, a discharge electrode is disposed inside the second processing chamber 60. If the second processing chamber 60 is a molecular beam epitaxial (MBE) apparatus, a Knudsen cell or the like is disposed inside the second processing chamber 60.
 第3トレイ61は、チャンバ30と第2処理室60との間を真空可能に間仕切りする仕切弁、或いはシャッタとしての機能を備える。図9においては、第3トレイ61によりロード室10全体内を覆うように構成されているが、第3トレイ61の形状はこれに限られない。例えば、第3トレイ61の形状としては、ワーク1bの周端部を囲うように、周端部分に凸部等が形成され、ワーク1bが第3トレイ61上からチャンバ30の内部に落ちないような構造であればよい。 The third tray 61 has a function as a gate valve or a shutter for partitioning the chamber 30 and the second processing chamber 60 in a vacuumable manner. In FIG. 9, the entire load chamber 10 is covered with the third tray 61, but the shape of the third tray 61 is not limited to this. For example, as the shape of the third tray 61, a convex portion or the like is formed at the peripheral end portion so as to surround the peripheral end portion of the work 1b, so that the work 1b does not fall from the third tray 61 into the chamber 30. Any structure can be used.
 図11に示すように、第3トレイ61は、チャンバ30内を上下して、第2処理室60と搬送機構360との間でワークを搬送する。第3トレイ61を上下に動かすために、第3トレイ61には、図示を省略した引張機構が接続されている。引張機構の詳細は特に限定されないが、例えば、エアシリンダ、バネ、引張ワイヤ、真空モータ等が利用可能である。 As shown in FIG. 11, the third tray 61 moves up and down in the chamber 30 and transports the workpiece between the second processing chamber 60 and the transport mechanism 360. In order to move the third tray 61 up and down, a pulling mechanism (not shown) is connected to the third tray 61. Although details of the tension mechanism are not particularly limited, for example, an air cylinder, a spring, a tension wire, a vacuum motor, or the like can be used.
 制御装置40は、真空装置の各種動作を制御する。例えば、図11に示すように、第1処理室50においてワーク1bを処理している間に、ロード室10に新たなワーク1aを搬入したり、第2処理室60に別のワークを搬入したりすることが可能である。例えば、第1処理室50及び第2処理室のいずれか一方をワークのクリーニング室と定義し、他方をワークの成膜室として機能させることにより、より生産効率の高い真空装置が得られる。 The control device 40 controls various operations of the vacuum device. For example, as shown in FIG. 11, while a workpiece 1 b is being processed in the first processing chamber 50, a new workpiece 1 a is loaded into the load chamber 10 or another workpiece is loaded into the second processing chamber 60. It is possible to For example, if one of the first processing chamber 50 and the second processing chamber is defined as a workpiece cleaning chamber and the other functions as a workpiece deposition chamber, a vacuum apparatus with higher production efficiency can be obtained.
 次に、第2の実施の形態に係る真空装置の動作方法を図10~図13の断面図を用いて説明する。以下に示す動作方法は一例であり、他にも種々の動作方法があることは勿論である。 Next, an operation method of the vacuum apparatus according to the second embodiment will be described with reference to the cross-sectional views of FIGS. The following operation method is an example, and there are of course various other operation methods.
 まず、図10に示すように、ロード室10の蓋部12を動かし、ワーク1aを第1トレイ11の上に載せる。その後、蓋部12を閉じてロード室10を密閉し、弁14を開いて真空ポンプ15によりロード室10内を真空排気する。 First, as shown in FIG. 10, the lid 12 of the load chamber 10 is moved and the work 1 a is placed on the first tray 11. Thereafter, the lid 12 is closed to seal the load chamber 10, the valve 14 is opened, and the inside of the load chamber 10 is evacuated by the vacuum pump 15.
 ロード室10内を真空排気している間、第1処理室50では、第2トレイ51上に保持されたワーク1bに対して、例えば、交流電源又は直流電源を駆動させて成膜が行う、又は、弁53を開いてクリーニングガスを第1処理室50内に供給してクリーニング処理を行う。 While the load chamber 10 is being evacuated, in the first processing chamber 50, for example, an AC power source or a DC power source is driven to form a film on the work 1b held on the second tray 51. Alternatively, the valve 53 is opened and the cleaning gas is supplied into the first processing chamber 50 to perform the cleaning process.
 第1処理室50での処理が終了したら、図11に示すように、第1トレイ11、第2トレイ51、及び第3トレイ61を、引張機構(図示省略)により降下させる。その結果、図12に示すように、ワーク1bを保持した第2トレイ51は、ワーク1bを搬送台310上に載置した後、開口部330を介して搬送台310の下部へ移動する。ワーク1aを保持した第1トレイ11は、ワーク1bを搬送台310上に載置した後、開口部370を介して搬送台310の下部へ移動する。ワークを保持しない第3トレイ61はそのまま搬送台310の下部へ移動する。 When the processing in the first processing chamber 50 is completed, as shown in FIG. 11, the first tray 11, the second tray 51, and the third tray 61 are lowered by a pulling mechanism (not shown). As a result, as shown in FIG. 12, the second tray 51 holding the workpiece 1 b moves to the lower portion of the conveyance table 310 through the opening 330 after placing the workpiece 1 b on the conveyance table 310. The first tray 11 holding the workpiece 1 a moves to the lower portion of the conveyance table 310 through the opening 370 after placing the workpiece 1 b on the conveyance table 310. The third tray 61 that does not hold the workpiece moves to the lower part of the transport table 310 as it is.
 搬送台310を、図12の矢印方向(水平方向)に移動させ、図13に示すように、搬送台310上のワーク1bをロード室10に対向させると同時にワーク1bを第2処理室60へ対向させる。その後、搬送台310の下部にある第1トレイ11、第2トレイ51、及び第3トレイ61を、図示を省略した引張機構によって上昇させる。ワーク1bは、第1トレイ11によって、ロード室10へ導入される。ロード室10では、弁13を開き、ベントガス、或いは大気をロード室10の内部に導入することにより、ワーク1b周辺の雰囲気がベントガス雰囲気、或いは大気圧雰囲気に戻す。その後、蓋部12を開けてワーク1bを取り出し、次のワークを第1トレイ11の上へ載置する。 The transfer table 310 is moved in the direction of the arrow (horizontal direction) in FIG. 12, and the workpiece 1b on the transfer table 310 is opposed to the load chamber 10 as shown in FIG. Make them face each other. Thereafter, the first tray 11, the second tray 51, and the third tray 61 at the lower part of the transport table 310 are raised by a pulling mechanism that is not shown. The work 1 b is introduced into the load chamber 10 by the first tray 11. In the load chamber 10, the valve 13 is opened and vent gas or air is introduced into the load chamber 10, whereby the atmosphere around the work 1 b is returned to the vent gas atmosphere or the atmospheric pressure atmosphere. Thereafter, the lid 12 is opened to take out the work 1b, and the next work is placed on the first tray 11.
 以上説明したように、第2の実施の形態に係る真空装置によれば、第1トレイ11、第2トレイ51及び第3トレイ61が、ワーク1a、1bを搬送する他にロード室10、第1処理室50、第2処理室60とチャンバ30との間を仕切る仕切弁として機能を兼ね備える。このため、搬送機構と弁をそれぞれ別途に設ける必要がなく、装置点数の削減・簡略化が図れる。その結果、ロード室10、第1処理室50、第2処理室60は、ワークサイズ近くまで小型化でき、真空装置全体の小型化も図れる。同時に、各室内部のデッドスペースが削減されることにより、排気・ベント時間の短縮、ベントガスや動力などのランニングコストの削減も可能である。 As described above, according to the vacuum apparatus according to the second embodiment, the first tray 11, the second tray 51, and the third tray 61 are configured to transfer the workpieces 1a and 1b, as well as the load chamber 10 and the first tray. It also functions as a gate valve that partitions the first processing chamber 50, the second processing chamber 60, and the chamber 30. For this reason, it is not necessary to separately provide a transport mechanism and a valve, and the number of devices can be reduced and simplified. As a result, the load chamber 10, the first processing chamber 50, and the second processing chamber 60 can be downsized to near the work size, and the entire vacuum apparatus can be downsized. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
 また、搬送機構360として、チャンバ30内に備えられ、2以上の室に対向する搬送台310を設けることにより、次に導入すべき2つの室に同時にワーク1a、1bを対向させることができるので、従来の搬送機構によりワーク1a、1bを1つずつ搬送する場合にくらべて生産効率も高くなる。更に、例えば、第1処理室50で成膜を行っている時間を利用して、第2処理室60ではクリーニングガスを用いたクリーニングを行うことも出来るので、特定の処理が済むまでの待ち時間を少なくできる。例えば、一般的なプロセスでは、クリーニングレートは、成膜レートの数倍から数十倍あることが知られているから、第2の実施の形態に係る真空装置のクリーニングレートが成膜レート以上である場合には、稼働率は100%が実現できる。 In addition, by providing the transport mechanism 310 provided in the chamber 30 as the transport mechanism 360 and facing two or more chambers, the workpieces 1a and 1b can be simultaneously opposed to the two chambers to be introduced next. The production efficiency is higher than when the workpieces 1a and 1b are conveyed one by one by the conventional conveyance mechanism. Further, for example, the second processing chamber 60 can be cleaned using a cleaning gas by using the time during which the film is formed in the first processing chamber 50, so that the waiting time until a specific processing is completed. Can be reduced. For example, in a general process, it is known that the cleaning rate is several to several tens of times the film formation rate. Therefore, the cleaning rate of the vacuum apparatus according to the second embodiment is equal to or higher than the film formation rate. In some cases, 100% availability can be achieved.
 また、ロード室10に対して2つの処理室(第1処理室50、第2処理室60)を備えることにより、各処理室の使用頻度がロード室10に比べて1/2となるため、処理室の定期メンテナンス間隔が長くなり、生産効率の向上も図れる。 In addition, by providing two processing chambers (the first processing chamber 50 and the second processing chamber 60) with respect to the load chamber 10, the usage frequency of each processing chamber is ½ that of the load chamber 10. The regular maintenance interval of the processing chamber becomes longer and the production efficiency can be improved.
(第3の実施の形態)
 第3の実施の形態に係る真空装置は、ロード室を2つ有している点が、上述の実施の形態と異なる。即ち、図14に示すように、真空装置は、真空排気可能なチャンバ30と、チャンバ30の上方の一部に設けられ、ワーク1a、1bを処理する処理室20と、チャンバ30の上方で処理室20と隣接し、チャンバ30の上方で処理室20を挟んで互いに対向し、ワーク1a、1bを出し入れする第1ロード室10及び第2ロード室70とを備える。
(Third embodiment)
The vacuum apparatus according to the third embodiment is different from the above-described embodiment in that it has two load chambers. That is, as shown in FIG. 14, the vacuum apparatus is provided in a chamber 30 that can be evacuated, a processing chamber 20 that processes the workpieces 1 a and 1 b, and a processing that is performed above the chamber 30. The first load chamber 10 and the second load chamber 70 that are adjacent to the chamber 20 and are opposed to each other with the processing chamber 20 sandwiched above the chamber 30 are provided for loading and unloading the workpieces 1a and 1b.
 チャンバ30の内部には、第1ロード室10、第2ロード室70及び処理室20の少なくとも2室に同時に対向する搬送機構361が配置されている。搬送機構361は、ワーク1a、1bを搬送する搬送台311と、搬送台311に接続された移動機構(図示省略)を有している。移動機構は特に限定されず、ローラ等の様々な手段を用いることができる。搬送機構361は、移動機構によりチャンバ30の内部を図14の紙面の水平方向に移動可能になっている。 Inside the chamber 30, a transfer mechanism 361 that is simultaneously opposed to at least two chambers of the first load chamber 10, the second load chamber 70, and the processing chamber 20 is disposed. The conveyance mechanism 361 includes a conveyance table 311 that conveys the workpieces 1 a and 1 b and a moving mechanism (not shown) connected to the conveyance table 311. The moving mechanism is not particularly limited, and various means such as a roller can be used. The transport mechanism 361 can move inside the chamber 30 in the horizontal direction of the paper surface of FIG. 14 by a moving mechanism.
 ロード室10は、チャンバ30の上方に定義されている。ロード室10の構成は、図2と実質的に同様であるので、重複した記載を省略する。処理室20は、チャンバ30の上方の中央部に配置されている。処理室20の構成は、図2と実質的に同様であるので、重複した記載を省略する。 The load chamber 10 is defined above the chamber 30. The configuration of the load chamber 10 is substantially the same as that in FIG. The processing chamber 20 is disposed in the central portion above the chamber 30. The configuration of the processing chamber 20 is substantially the same as that shown in FIG.
 第2ロード室70は、チャンバ30の上部に設けられており、開閉可能な蓋部72を有している。図16に示すように、第2トレイ21が、搬送機構360により第2ロード室70の下方に移動して、チャンバ30と第1ロード室10との間を仕切ることにより、第2ロード室70の内部が、真空排気可能に密閉される。第2トレイ21及び蓋部72は、図示を省略したOリング又はベローズ等を介してチャンバ30の壁面に密着する。 The second load chamber 70 is provided in the upper part of the chamber 30 and has a lid 72 that can be opened and closed. As shown in FIG. 16, the second tray 21 is moved below the second load chamber 70 by the transport mechanism 360 to partition the chamber 30 and the first load chamber 10, so that the second load chamber 70 is separated. Is sealed so that it can be evacuated. The second tray 21 and the lid 72 are in close contact with the wall surface of the chamber 30 via an O-ring or bellows (not shown).
 第2ロード室70には、ベントガスや大気を導入するためのベントラインに接続された弁73と真空ポンプ75に接続された弁74が設けられている。弁73の先に接続されたベントラインから、大気ガスやベントガスが供給され、第2ロード室70の内部を大気雰囲気、或いはベントガス雰囲気にする。または、真空ポンプ75により第2ロード室70内を真空排気し、第2ロード室70の内部を所定の圧力に減圧する。ワークの出し入れは、チャンバ30の開口部を第2トレイ21で閉じてチャンバ30を大気に開放しないようにした状態で、蓋部72を取り外す(又は蓋部72を上下させる)ことにより行われる。図14に示す真空装置においては、第2ロード室70を仕切るための機構として、第2トレイ21を利用しているため、部品点数を削減でき、低コスト化が実現できる。 The second load chamber 70 is provided with a valve 73 connected to a vent line for introducing vent gas and air and a valve 74 connected to a vacuum pump 75. Atmospheric gas or vent gas is supplied from a vent line connected to the tip of the valve 73, and the inside of the second load chamber 70 is changed to an atmospheric atmosphere or a vent gas atmosphere. Alternatively, the inside of the second load chamber 70 is evacuated by the vacuum pump 75, and the inside of the second load chamber 70 is reduced to a predetermined pressure. The work is taken in and out by removing the lid 72 (or moving the lid 72 up and down) in a state where the opening of the chamber 30 is closed by the second tray 21 so that the chamber 30 is not opened to the atmosphere. In the vacuum apparatus shown in FIG. 14, since the second tray 21 is used as a mechanism for partitioning the second load chamber 70, the number of parts can be reduced and the cost can be reduced.
 次に、第3の実施の形態に係る真空装置の動作方法を図14~図16の断面図を用いて説明する。以下に示す動作方法は一例であり、他にも種々の動作方法があることは勿論である。 Next, an operation method of the vacuum apparatus according to the third embodiment will be described with reference to cross-sectional views of FIGS. The following operation method is an example, and there are of course various other operation methods.
 まず、第1ロード室10の蓋部12を動かし、ワーク1aを第1トレイ11の上に載せる。その後、蓋部12を閉じて第1ロード室10を密閉し、弁14を開いて真空ポンプ15により第1ロード室10内を真空排気する。 First, the lid 12 of the first load chamber 10 is moved, and the work 1 a is placed on the first tray 11. Thereafter, the lid 12 is closed to seal the first load chamber 10, the valve 14 is opened, and the inside of the first load chamber 10 is evacuated by the vacuum pump 15.
 第1ロード室10内を真空排気している間、図14に示すように、処理室20では、第2トレイ21上に保持されたワーク1bに対して所定の処理が行われる。 While the inside of the first load chamber 10 is evacuated, as shown in FIG. 14, in the processing chamber 20, a predetermined process is performed on the work 1 b held on the second tray 21.
 処理室20での処理が終了したら、第1トレイ11及び第2トレイ21を、図示を省略した引張機構により降下させ、図15に示すように、搬送台311の上に第1トレイ及び第2トレイ21を載せる。搬送台310を、図15の矢印方向(水平方向)に移動させ、図16に示すように、搬送台310上のワーク1bを第2ロード室70に対向させると同時にワーク1bを処理室20へ対向させる。そして、第1トレイ11及び第2トレイ21を、図示を省略した引張機構によって上昇させる。第1トレイ11上に保持されたワーク1aは、処理室20に搬入され、所定の処理が施される。第2トレイ21上に保持された処理後のワーク1bは、第2ロード室70内に搬入される。 When the processing in the processing chamber 20 is finished, the first tray 11 and the second tray 21 are lowered by a pulling mechanism (not shown), and the first tray and the second tray are placed on the transport table 311 as shown in FIG. Place the tray 21. The transfer table 310 is moved in the direction of the arrow (horizontal direction) in FIG. 15, and the work 1b on the transfer table 310 is opposed to the second load chamber 70 as shown in FIG. Make them face each other. And the 1st tray 11 and the 2nd tray 21 are raised by the tension | pulling mechanism which abbreviate | omitted illustration. The workpiece 1a held on the first tray 11 is carried into the processing chamber 20 and subjected to a predetermined process. The processed workpiece 1 b held on the second tray 21 is carried into the second load chamber 70.
 第2ロード室70においては、弁73を開き、ベントガス、或いは大気を第2ロード室70の内部に導入することにより、ワーク1b周辺が大気圧に戻される。その後、蓋部72を開けてワーク1bを取り出し、次のワークを第1トレイ11の上へ載置する。 In the second load chamber 70, the valve 73 is opened, and vent gas or air is introduced into the second load chamber 70, so that the area around the work 1b is returned to atmospheric pressure. Thereafter, the lid 72 is opened to take out the work 1b, and the next work is placed on the first tray 11.
 以上説明したように、第3の実施の形態に係る真空装置によれば、第1トレイ11及び第2トレイ21が、ワーク1a、1bを搬送する他にも、第1ロード室10、第2ロード室及び処理室20と、チャンバ30との間を仕切る仕切弁として機能を兼ね備える。このため、搬送機構と弁をそれぞれ別途に設ける必要がなく、装置点数の削減・簡略化が図れる。また、第2ロード室70を仕切る役割を第2トレイ21が行うことにより、第2ロード室70専用のトレイを設ける必要がない。その結果、第1ロード室10、第2ロード室70、処理室20をワークサイズ近くまで小型化でき、真空装置全体の小型化も図れる。同時に、各室内部のデッドスペースが削減されることにより、排気・ベント時間の短縮、ベントガスや動力などのランニングコストの削減も可能である。 As described above, according to the vacuum apparatus according to the third embodiment, the first tray 11 and the second tray 21 transfer the workpieces 1a and 1b, in addition to the first load chamber 10 and the second tray 21. It also functions as a gate valve that partitions the load chamber / processing chamber 20 and the chamber 30. For this reason, it is not necessary to separately provide a transport mechanism and a valve, and the number of devices can be reduced and simplified. Further, since the second tray 21 performs the role of partitioning the second load chamber 70, it is not necessary to provide a tray dedicated to the second load chamber 70. As a result, the first load chamber 10, the second load chamber 70, and the processing chamber 20 can be downsized to near the work size, and the entire vacuum apparatus can be downsized. At the same time, by reducing the dead space in each room, it is possible to shorten exhaust / vent time and reduce running costs such as vent gas and power.
 また、チャンバ30内に備えられ、2以上の室に対向する搬送台311を備えることにより、次に導入すべき2つの室に同時にワーク1a、1bを対向させることができるので、ワーク1a、1bを1つずつ搬送する場合にくらべて生産効率も高くなる。 Further, by providing the carriage 311 provided in the chamber 30 and facing two or more chambers, the workpieces 1a and 1b can be simultaneously opposed to the two chambers to be introduced next. The production efficiency is also higher than when one piece is conveyed at a time.
 また、処理室20に対して2つのロード室10、70を備えることにより、ロード室10、70の使用頻度が処理室20に比べて1/2となるため、ロード室の定期メンテナンス間隔が長くなり、生産効率の向上も図れる。 Further, by providing the two load chambers 10 and 70 with respect to the processing chamber 20, the use frequency of the load chambers 10 and 70 is ½ that of the processing chamber 20. Thus, the production efficiency can be improved.
 第3の実施の形態の変形例に係る真空装置を図17に示す。図17に示す真空装置は、第1トレイ11、第2トレイ21を回転機構31の下方へ通すための開口部331、371が、搬送台311に設けられている。そして、開口部331、371から第1トレイ11及び第2トレイ21を搬送台311の下部に移動させることによって、搬送台311の回転面上に直接ワーク1a、1bを載置するものである。図17に示す真空装置の場合、第1トレイ11と第2トレイ21とがそれぞれ別の形状を有していても、ワーク1a、1bの搬送を行うことができるので、装置選択の自由度が高くなる。この場合、搬送台311には、ワーク1a、1bを加熱するための加熱源などが配置されていてもよい。また、処理室30と第2ロード室70を仕切る第4トレイ71を更に配置してもよい。図17に示す真空装置によれば、第1トレイ11、第2トレイ21、第4トレイ71がそれぞれ別の形状を有していても、ワーク1a、1bの搬送及び第1ロード室10、第2ロード室70、処理室20とチャンバ30との仕切りを行うことが出来るので、装置選択の自由度が高くなる。 FIG. 17 shows a vacuum apparatus according to a modification of the third embodiment. In the vacuum apparatus shown in FIG. 17, openings 331 and 371 for allowing the first tray 11 and the second tray 21 to pass below the rotation mechanism 31 are provided in the transport table 311. Then, by moving the first tray 11 and the second tray 21 from the openings 331 and 371 to the lower part of the transport table 311, the workpieces 1 a and 1 b are placed directly on the rotation surface of the transport table 311. In the case of the vacuum apparatus shown in FIG. 17, even if the first tray 11 and the second tray 21 have different shapes, the workpieces 1a and 1b can be conveyed, so that the degree of freedom in selecting the apparatus is increased. Get higher. In this case, a heating source or the like for heating the workpieces 1a and 1b may be arranged on the transport table 311. Further, a fourth tray 71 that partitions the processing chamber 30 and the second load chamber 70 may be further arranged. According to the vacuum device shown in FIG. 17, even if the first tray 11, the second tray 21, and the fourth tray 71 have different shapes, the workpieces 1 a and 1 b are conveyed and the first load chamber 10 Since the two-load chamber 70, the processing chamber 20, and the chamber 30 can be partitioned, the degree of freedom in device selection is increased.
(第4の実施の形態)
 第4の実施の形態に係る真空装置は、図18及び図19に示すように、第1トレイ11及び第2トレイ21のワーク1a、1bが搭載される底面にそれぞれ加熱機構81、91が設けられている点が、第1の実施の形態に係る真空装置と異なる。
(Fourth embodiment)
As shown in FIGS. 18 and 19, the vacuum apparatus according to the fourth embodiment is provided with heating mechanisms 81 and 91 on the bottom surfaces of the first tray 11 and the second tray 21 on which the workpieces 1a and 1b are mounted, respectively. This is different from the vacuum apparatus according to the first embodiment.
 加熱機構81、91としては、ヒータ、或いは、ヒータの上にヒータからの熱を受ける熱板を設けた部材等が利用可能である。ランプヒータ等を用いる場合は、ランプヒータ及びランプヒータからの熱放射を透過させるガラス等の熱線透過部材を加熱機構81、91として利用してもよい。加熱機構81は、第1トレイ11及び第2トレイの底面に一体化させて配置させてもよいし、別個に配置してもよい。別個に配置する場合は、加熱機構81、91を真空シールして配置するのが好ましい。他は、第1の実施の形態に係る真空装置と実質的に同様であるので、記載を省略する。 As the heating mechanisms 81 and 91, a heater or a member provided with a hot plate that receives heat from the heater on the heater can be used. When a lamp heater or the like is used, a heat ray transmitting member such as glass that transmits heat radiation from the lamp heater and the lamp heater may be used as the heating mechanisms 81 and 91. The heating mechanism 81 may be integrated with the bottom surfaces of the first tray 11 and the second tray, or may be separately disposed. When arrange | positioning separately, it is preferable to arrange | position the heating mechanisms 81 and 91 by vacuum-sealing. Others are substantially the same as those of the vacuum apparatus according to the first embodiment, and the description is omitted.
 第4の実施の形態に係る真空装置によれば、加熱機構81、91を具備することにより、装置の工程やワーク1a、1bの搬送作業に関係なく、第1トレイ11又は第2トレイ21上を連続して加熱することができるため、例えば、加熱機構81、91として、ヒータを具備した熱板等を用いた場合には、ワーク1a、1bの搭載前に第1トレイ11又は第2トレイ21の搭載面の温度を目的な温度にしておくことができる。これにより、ワーク1a、1bの昇温が短時間で行える。ランプヒータ等を用いた場合でも、ワーク1a、1bを載置した直後に加熱を行うことにより、例えば、ワークの熱容量が加熱機構81、91の熱容量と比較して十分に小さい場合には、一瞬で昇温することができる。いずれにしても、加熱機構81、91によってワーク1a、1bだけを直接加熱することにより、ワーク1a、1bを目的の温度に素早く昇温でき、制御応答性も高くすることができるうえ、待ち時間も少なくなり、生産効率も向上する。 According to the vacuum apparatus according to the fourth embodiment, by providing the heating mechanisms 81 and 91, the first tray 11 or the second tray 21 is provided regardless of the process of the apparatus or the work of conveying the workpieces 1 a and 1 b. For example, when a heating plate or the like equipped with a heater is used as the heating mechanisms 81 and 91, the first tray 11 or the second tray before the workpieces 1a and 1b are mounted. The temperature of the mounting surface 21 can be set to a target temperature. Thereby, the temperature of the workpieces 1a and 1b can be increased in a short time. Even when a lamp heater or the like is used, heating is performed immediately after the workpieces 1a and 1b are placed. For example, when the heat capacity of the workpiece is sufficiently smaller than the heat capacity of the heating mechanisms 81 and 91, The temperature can be raised at In any case, by directly heating only the workpieces 1a and 1b by the heating mechanisms 81 and 91, the workpieces 1a and 1b can be quickly heated to a target temperature, the control response can be improved, and the waiting time can be increased. The production efficiency is also improved.
 図1に示した従来の真空装置に示すような「バッチ型」、「インライン型」、「クラスタ型」の真空装置では、ワークを処理室やロード室に搬入し終わった後にワークの加熱を始める。ワークの種類によっては、例えば、太陽電池セルのウエハのように、薄く脆い性質のものもあるため、搬送カート等を用いてワークを搬送する場合が多い。 In the “batch type”, “in-line type”, and “cluster type” vacuum apparatus as shown in the conventional vacuum apparatus shown in FIG. 1, heating of the work is started after the work has been carried into the processing chamber or the load chamber. . Depending on the type of workpiece, for example, there are thin and brittle properties such as solar cell wafers, so the workpiece is often transferred using a transfer cart or the like.
 搬送カート等を利用する場合は、ワークのみではなく、搬送カートの搬送時に失われる熱容量等を考慮して搬送後のワークを再加熱することになるため、加熱完了までの待ち時間がさらに増大し、処理時間も長くなる。特に、太陽電池セル等に用いられる薄くて脆いウエハ上に太陽電池反射防止膜(SiNx)膜を成膜する場合、成膜温度を350-450度で成膜することにより、良質な膜が得られることが知られており(Aberle, Armin G. : Crystalline silicon solar cells: advanced surface passivation and analysis. -Sydney : Centre for Photovoltaic Enginering, Univ. of NSW, 1999. - chapter V, 148 S.参照)、かかる膜を成膜するためには、短時間で高温に昇温可能な真空装置の開発が望まれている。 When using a transport cart, etc., not only the work but also the work after transport is reheated in consideration of the heat capacity lost when transporting the transport cart, etc., so the waiting time until the heating is completed further increases. , Processing time also becomes longer. In particular, when a solar cell antireflection film (SiNx) film is formed on a thin and fragile wafer used for solar cells or the like, a high-quality film can be obtained by forming the film formation temperature at 350 to 450 degrees. (See Aberle, Armin G.: Crystalline silicon solar cells: advanced surface passivation and analysis. -Sydney: Centre for Photovoltaic Enginering, Univ. Of NSW, 1999.-chapter V, 148S) In order to form such a film, it is desired to develop a vacuum apparatus capable of raising the temperature to a high temperature in a short time.
 これに対し、第4の実施の形態に係る真空装置によれば、加熱機構81、91を備える第1トレイ11、及び第2トレイ21により、ワーク1a、1bを加温しながら、真空搬入、真空搬出、真空搬送、真空処理を行うことができるため、素早く昇温でき、温度の制御応答性も高く、より品質の高い太陽電池反射防止膜を、高効率で短時間に形成することができる。 On the other hand, according to the vacuum device according to the fourth embodiment, the first tray 11 and the second tray 21 including the heating mechanisms 81 and 91 are brought into the vacuum while the workpieces 1a and 1b are heated, Since vacuum unloading, vacuum transfer, and vacuum processing can be performed, the temperature can be quickly raised, the temperature control response is high, and a higher-quality solar cell antireflection film can be formed with high efficiency in a short time. .
 第4の実施の形態に係る加熱機構81、91と同様な加熱機構は、第2及び第3の実施の形態に係る真空装置に導入してもよいことは勿論である。太陽電池反射防止膜としてSiNx膜の成膜を例示したが、チタン酸化膜、窒化珪素膜等の他の膜を成膜可能であることは勿論である。 Of course, a heating mechanism similar to the heating mechanisms 81 and 91 according to the fourth embodiment may be introduced into the vacuum devices according to the second and third embodiments. Although the SiNx film is exemplified as the solar cell antireflection film, it is needless to say that other films such as a titanium oxide film and a silicon nitride film can be formed.
 (その他の実施の形態)
 上記のように、本発明は本発明の実施の形態によって記載したが、この開示の一部をなす論述及び図面は本発明を限定するものであると理解すべきではない。
(Other embodiments)
As mentioned above, although this invention was described by embodiment of this invention, it should not be understood that the statement and drawing which make a part of this indication limit this invention.
 例えば、第1~第3の実施の形態においては、各真空ポンプ、ベントライン、トレイ等を複数個有する例を示しているが、処理内容等に問題のない場合は一括して共通のものを使用し、部品点数の削減を図るようにしてもよい。 For example, in the first to third embodiments, an example is shown in which a plurality of vacuum pumps, vent lines, trays, etc. are provided. It may be used to reduce the number of parts.
 このように、この開示から当業者には様々な代替実施の形態、実施例及び運用技術が明らかとなろう。したがって、本発明の技術的範囲は上記の説明から妥当な特許請求の範囲に係る発明特定事項によってのみ定められるものである。 Thus, various alternative embodiments, examples and operational techniques will be apparent to those skilled in the art from this disclosure. Accordingly, the technical scope of the present invention is defined only by the invention specifying matters according to the scope of claims reasonable from the above description.
 本発明は、蒸着、スパッタ、化学気相成長(CVD)等の薄膜形成、またはエッチングなどの薄膜加工に利用される真空装置に適用できる。 The present invention can be applied to a vacuum apparatus used for thin film formation such as vapor deposition, sputtering, chemical vapor deposition (CVD) or the like, or thin film processing such as etching.

Claims (20)

  1.  真空排気可能なチャンバと、
     前記チャンバの上方の一部に設けられ、ワークを処理する処理室と、
     前記チャンバの上方の他の一部に設けられ、前記ワークを出し入れするロード室と、
     前記チャンバの内部に配置され、前記処理室及び前記ロード室に対向し、前記ワークを前記処理室又は前記ロード室の下方に搬送する搬送機構と、
     前記ロード室と前記搬送機構との間を上下して前記ロード室と前記搬送機構との間で前記ワークを搬送するとともに、前記ロード室を真空排気可能に間仕切りする第1トレイと、
     前記処理室と前記搬送機構との間を上下して、前記処理室と前記搬送機構との間で前記ワークを搬送する第2トレイと
     を備えることを特徴とする真空装置。
    A evacuable chamber;
    A processing chamber provided in a part above the chamber for processing a workpiece;
    A load chamber provided in the other part above the chamber for taking in and out the workpiece;
    A transport mechanism disposed inside the chamber, facing the processing chamber and the load chamber, and transporting the work below the processing chamber or the load chamber;
    A first tray that moves up and down between the load chamber and the transport mechanism to transport the workpiece between the load chamber and the transport mechanism, and partitions the load chamber so that it can be evacuated;
    A vacuum apparatus comprising: a second tray that moves up and down between the processing chamber and the transport mechanism and transports the workpiece between the processing chamber and the transport mechanism.
  2.  前記第2トレイが、前記処理室と前記搬送機構との間を間仕切りする仕切弁又はシャッタとしての機能を備えることを特徴とする請求項1に記載の真空装置。 The vacuum apparatus according to claim 1, wherein the second tray has a function as a gate valve or a shutter that partitions the space between the processing chamber and the transport mechanism.
  3.  前記搬送機構が、
     前記ロード室及び前記処理室と対向し、前記ワークを載置する一面を回転面とする回転機構と、
     前記回転機構に連結された回転軸と
    を有し、
     前記回転機構が、前記回転軸を軸として180°回転することにより、前記ロード室及び前記処理室の下方にある前記ワークを、前記処理室及び前記ロード室の下方に同時に交換することを特徴とする請求項1に記載の真空装置。
    The transport mechanism is
    A rotation mechanism facing the load chamber and the processing chamber and having one surface on which the workpiece is placed as a rotation surface;
    A rotating shaft coupled to the rotating mechanism;
    The rotating mechanism rotates 180 degrees about the rotating shaft, thereby simultaneously exchanging the work below the load chamber and the processing chamber to below the processing chamber and the load chamber. The vacuum apparatus according to claim 1.
  4.  前記第1トレイと前記第2トレイが同一形状を有し、
     前記搬送機構が、前記ロード室と前記処理室との間で、前記ワークを保持した前記第1トレイ及び前記第2トレイごと、交換することを特徴する請求項3に記載の真空装置。
    The first tray and the second tray have the same shape;
    The vacuum apparatus according to claim 3, wherein the transfer mechanism exchanges the first tray and the second tray holding the workpiece between the load chamber and the processing chamber.
  5.  前記第1トレイと前記第2トレイを前記回転機構の下方へ移動させるための開口部を前記回転機構に備え、
     前記第1トレイ及び前記第2トレイが前記回転機構の下方へ移動することにより、前記ワークを前記回転面上に直接配置して、前記ロード室と前記処理室の下方で前記ワークを交換することを特徴とする請求項3に記載の真空装置。
    The rotating mechanism includes an opening for moving the first tray and the second tray below the rotating mechanism,
    By moving the first tray and the second tray below the rotation mechanism, the workpiece is directly arranged on the rotation surface, and the workpiece is exchanged below the load chamber and the processing chamber. The vacuum apparatus according to claim 3.
  6.  前記第1トレイ及び前記第2トレイの前記ワークが搭載される面に加熱機構が設けられており、前記加熱機構により前記ワークを加熱した状態で前記ワークに太陽電池反射防止膜を成膜することを特徴とする請求項1に記載の真空装置。 A heating mechanism is provided on the surface of the first tray and the second tray on which the work is mounted, and a solar cell antireflection film is formed on the work while the work is heated by the heating mechanism. The vacuum apparatus according to claim 1.
  7.  真空排気可能なチャンバと、
     前記チャンバ上方の一部に設けられ、ワークを処理する第1処理室と、
     前記チャンバ上方で前記第1処理室と隣接し、前記ワークを出し入れするロード室と、
     前記チャンバ上方で前記ロード室を挟んで前記処理室と対向し、前記ワークを処理する第2処理室と、
     前記チャンバの内部に配置され、前記第1処理室、前記第2処理室及び前記ロード室の少なくとも2室に同時に対向する搬送機構と、
     前記ロード室と前記搬送機構との間を上下して前記ロード室と前記搬送機構との間で前記ワークを搬送するとともに、前記ロード室を真空排気可能に間仕切りする第1トレイと、
     前記第1処理室と前記搬送機構との間を上下して、前記第1処理室と前記搬送機構との間で前記ワークを搬送する第2トレイと
     を備えることを特徴とする真空装置。
    A evacuable chamber;
    A first processing chamber provided in a part above the chamber for processing a workpiece;
    Above the chamber, adjacent to the first processing chamber, a load chamber for taking in and out the workpiece,
    A second processing chamber for processing the workpiece, facing the processing chamber across the load chamber above the chamber;
    A transfer mechanism disposed inside the chamber and simultaneously facing at least two of the first processing chamber, the second processing chamber, and the load chamber;
    A first tray that moves up and down between the load chamber and the transport mechanism to transport the workpiece between the load chamber and the transport mechanism, and partitions the load chamber so that it can be evacuated;
    A vacuum apparatus comprising: a second tray that moves up and down between the first processing chamber and the transport mechanism and transports the workpiece between the first processing chamber and the transport mechanism.
  8.  前記第2トレイが、前記チャンバと前記第1処理室との間を間仕切りする仕切弁又はシャッタとしての機能を備えることを特徴とする請求項7に記載の真空装置。 The vacuum apparatus according to claim 7, wherein the second tray has a function as a gate valve or a shutter for partitioning the chamber and the first processing chamber.
  9.  前記搬送機構が、
     前記ロード室、前記第1処理室及び前記第2処理室の下方で少なくとも2室に同時に対向しながら前記チャンバ内を水平方向に移動する搬送台を含むことを特徴とする請求項7に記載の真空装置。
    The transport mechanism is
    8. The apparatus according to claim 7, further comprising a transfer table that moves horizontally in the chamber while simultaneously facing at least two chambers below the load chamber, the first processing chamber, and the second processing chamber. 9. Vacuum device.
  10.  前記第1トレイと前記第2トレイが同一形状を有し、
     前記搬送機構が、前記第1トレイ及び前記第2トレイを前記チャンバ内において水平方向に搬送することを特徴する請求項9に記載の真空装置。
    The first tray and the second tray have the same shape;
    The vacuum apparatus according to claim 9, wherein the transport mechanism transports the first tray and the second tray in a horizontal direction in the chamber.
  11.  前記第1処理室及び前記第2処理室が、前記ワークを成膜する成膜室であり、
     前記第2処理室内において第1のワークに対して所定の成膜処理を行う間に、前記第1トレイ、前記第2トレイ及び前記搬送機構により、第2のワークを前記ロード室から前記第1処理室内へ搬送させ、前記第1処理室内において前記第2のワークを洗浄することを特徴とする請求項7に記載の真空装置。
    The first processing chamber and the second processing chamber are film forming chambers for forming the workpiece;
    While a predetermined film forming process is performed on the first workpiece in the second processing chamber, the first workpiece, the second tray, and the transfer mechanism are used to move the second workpiece from the load chamber to the first workpiece. The vacuum apparatus according to claim 7, wherein the vacuum workpiece is transferred into a processing chamber and the second workpiece is cleaned in the first processing chamber.
  12.  前記第1トレイ及び前記第2トレイの前記ワークが搭載される面に加熱機構が設けられており、前記加熱機構により前記ワークを加熱した状態で前記ワークに太陽電池反射防止膜を成膜することを特徴とする請求項7に記載の真空装置。 A heating mechanism is provided on the surface of the first tray and the second tray on which the work is mounted, and a solar cell antireflection film is formed on the work while the work is heated by the heating mechanism. The vacuum apparatus according to claim 7.
  13.  真空排気可能なチャンバと、
     前記チャンバ上方の一部に設けられ、ワークを処理する処理室と、
     前記チャンバ上方で前記処理室と隣接し、前記ワークを出し入れする第1ロード室と、
     前記チャンバ上方で前記処理室を挟んで前記第1ロードと対向し、前記ワークを処理する第2ロード室と、
     前記チャンバの内部に配置され、前記処理室、前記第1ロード室及び前記第2ロード室の少なくとも2室に同時に対向する搬送機構と、
     前記第1ロード室と前記搬送機構との間を上下して前記第1ロード室と前記搬送機構との間で前記ワークを搬送するとともに、前記第1ロード室を真空排気可能に間仕切りする第1トレイと、
     前記処理室と前記搬送機構との間を上下して、前記処理室と前記搬送機構との間で前記ワークを搬送する第2トレイと
     を備えることを特徴とする真空装置。
    A evacuable chamber;
    A processing chamber provided in a part above the chamber, for processing a workpiece;
    A first load chamber which is adjacent to the processing chamber above the chamber and takes the workpiece in and out;
    A second load chamber for processing the workpiece, facing the first load across the processing chamber above the chamber;
    A transfer mechanism disposed inside the chamber and simultaneously facing at least two of the processing chamber, the first load chamber, and the second load chamber;
    First, the workpiece is transferred between the first load chamber and the transfer mechanism by moving up and down between the first load chamber and the transfer mechanism, and the first load chamber is partitioned so as to be evacuated. A tray,
    A vacuum apparatus comprising: a second tray that moves up and down between the processing chamber and the transport mechanism and transports the workpiece between the processing chamber and the transport mechanism.
  14.  前記第2トレイが、前記チャンバと前記処理室との間を間仕切りする仕切弁又はシャッタとしての機能を備えることを特徴とする請求項13に記載の真空装置。 The vacuum apparatus according to claim 13, wherein the second tray has a function as a gate valve or a shutter for partitioning the chamber and the processing chamber.
  15.  前記搬送機構が、
     前記処理室、前記第1ロード室及び前記第2ロード室の下方で少なくとも2室に同時に対向しながら前記チャンバ内を水平方向に移動する搬送台を含むことを特徴とする請求項13に記載の真空装置。
    The transport mechanism is
    14. The apparatus according to claim 13, further comprising a transfer table that moves horizontally in the chamber while simultaneously facing at least two chambers below the processing chamber, the first load chamber, and the second load chamber. Vacuum device.
  16.  前記第1トレイと前記第2トレイが同一形状を有し、
     前記搬送機構が、前記第1トレイ及び前記第2トレイを水平方向に移動させることを特徴する請求項15に記載の真空装置。
    The first tray and the second tray have the same shape;
    The vacuum apparatus according to claim 15, wherein the transport mechanism moves the first tray and the second tray in a horizontal direction.
  17.  前記第1トレイと前記第2トレイを前記搬送機構の下方へ移動させるための開口部を前記搬送機構に備え、
     前記搬送機構が、前記処理室、前記第1ロード室及び前記第2ロード室に対向する面上に前記ワークを直接配置して、前記チャンバ内を水平方向に移動することを特徴とする請求項15に記載の真空装置。
    The transport mechanism has an opening for moving the first tray and the second tray below the transport mechanism,
    The transport mechanism moves the inside of the chamber in a horizontal direction by directly placing the workpiece on a surface facing the processing chamber, the first load chamber, and the second load chamber. 15. A vacuum apparatus according to 15.
  18.  前記第1トレイ及び前記第2トレイの前記ワークが搭載される面に加熱機構が設けられており、前記加熱機構により前記ワークを加熱した状態で前記ワークに太陽電池反射防止膜を成膜することを特徴とする請求項13に記載の真空装置。 A heating mechanism is provided on the surface of the first tray and the second tray on which the work is mounted, and a solar cell antireflection film is formed on the work while the work is heated by the heating mechanism. The vacuum apparatus according to claim 13.
  19.  真空排気可能なチャンバと、
     前記チャンバの上方の一部に設けられ、ワークを処理する処理室と、
     前記チャンバの上方の他の一部に設けられ、前記ワークを出し入れするロード室と、
     前記チャンバの内部に配置され、前記処理室及び前記ロード室に対向し、前記ワークを前記処理室又は前記ロード室の下方に搬送する搬送機構と、
     前記ロード室と前記搬送機構との間を上下して前記ロード室と前記搬送機構との間で前記ワークを搬送するとともに、前記ロード室を真空排気可能に間仕切りする第1トレイと、
     前記処理室と前記搬送機構との間を上下して、前記処理室と前記搬送機構との間で前記ワークを搬送する第2トレイと
     を備える真空装置を用いた真空処理方法において、
      前記ワークが太陽電池セルであり、前記第1トレイ及び前記第2トレイの前記ワークの搭載面に設けた加熱機構によって前記太陽電池セルを加熱しながら前記太陽電池セルの表面に太陽電池反射防止膜を成膜する工程
     を有することを特徴とする真空処理方法。
    A evacuable chamber;
    A processing chamber provided in a part above the chamber for processing a workpiece;
    A load chamber provided in the other part above the chamber for taking in and out the workpiece;
    A transport mechanism disposed inside the chamber, facing the processing chamber and the load chamber, and transporting the work below the processing chamber or the load chamber;
    A first tray that moves up and down between the load chamber and the transport mechanism to transport the workpiece between the load chamber and the transport mechanism, and partitions the load chamber so that it can be evacuated;
    In a vacuum processing method using a vacuum apparatus comprising: a second tray that moves up and down between the processing chamber and the transport mechanism and transports the workpiece between the processing chamber and the transport mechanism;
    The work is a solar battery cell, and a solar battery antireflection film is formed on the surface of the solar battery cell while heating the solar battery cell with a heating mechanism provided on the work mounting surface of the first tray and the second tray. The vacuum processing method characterized by including the process of forming into a film.
  20.  前記第1トレイ及び前記第2トレイが前記処理室、前記ロード室、前記処理室のいずれかに前記ワークを搬送する場合に、前記加熱機構が前記ワークを加熱する工程を更に有することを特徴とする請求項19に記載の真空処理方法。 The heating mechanism further includes a step of heating the workpiece when the first tray and the second tray convey the workpiece to any of the processing chamber, the load chamber, and the processing chamber. The vacuum processing method according to claim 19.
PCT/JP2008/063730 2008-07-31 2008-07-31 Vacuum device and vacuum treatment method WO2010013333A1 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016196680A (en) * 2015-04-03 2016-11-24 トヨタ自動車株式会社 Film deposition method, and film deposition apparatus
JP2018190776A (en) * 2017-04-28 2018-11-29 トヨタ自動車株式会社 Wafer vacuum processing device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59116372A (en) * 1982-12-23 1984-07-05 Hitachi Ltd Continuous vacuum treatment apparatus
JPH0390569A (en) * 1989-09-02 1991-04-16 Fujitsu Ltd Sputtering device
JPH0822791A (en) * 1994-07-06 1996-01-23 Shimadzu Corp Vacuum processor
JPH10209481A (en) * 1997-01-27 1998-08-07 Sanyo Electric Co Ltd Photoelectric conversion device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59116372A (en) * 1982-12-23 1984-07-05 Hitachi Ltd Continuous vacuum treatment apparatus
JPH0390569A (en) * 1989-09-02 1991-04-16 Fujitsu Ltd Sputtering device
JPH0822791A (en) * 1994-07-06 1996-01-23 Shimadzu Corp Vacuum processor
JPH10209481A (en) * 1997-01-27 1998-08-07 Sanyo Electric Co Ltd Photoelectric conversion device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016196680A (en) * 2015-04-03 2016-11-24 トヨタ自動車株式会社 Film deposition method, and film deposition apparatus
JP2018190776A (en) * 2017-04-28 2018-11-29 トヨタ自動車株式会社 Wafer vacuum processing device

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