WO2009087772A1 - Dispositif d'inspection de ligne de haut-parleur - Google Patents

Dispositif d'inspection de ligne de haut-parleur Download PDF

Info

Publication number
WO2009087772A1
WO2009087772A1 PCT/JP2008/050198 JP2008050198W WO2009087772A1 WO 2009087772 A1 WO2009087772 A1 WO 2009087772A1 JP 2008050198 W JP2008050198 W JP 2008050198W WO 2009087772 A1 WO2009087772 A1 WO 2009087772A1
Authority
WO
WIPO (PCT)
Prior art keywords
impedance
signal
speaker line
speaker
amplifier
Prior art date
Application number
PCT/JP2008/050198
Other languages
English (en)
Japanese (ja)
Inventor
Kazuma Asada
Hirotomo Andoh
Tsuyoshi Ogawa
Original Assignee
Toa Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=40852897&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2009087772(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Toa Corporation filed Critical Toa Corporation
Priority to EP08703062.3A priority Critical patent/EP2229006B2/fr
Priority to PCT/JP2008/050198 priority patent/WO2009087772A1/fr
Priority to JP2009548841A priority patent/JP5123319B2/ja
Priority to EP13151672.6A priority patent/EP2584792B2/fr
Publication of WO2009087772A1 publication Critical patent/WO2009087772A1/fr

Links

Images

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/001—Monitoring arrangements; Testing arrangements for loudspeakers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/007—Monitoring arrangements; Testing arrangements for public address systems

Definitions

  • the present invention relates to a speaker line inspection device for inspecting whether or not a problem such as disconnection or short circuit has occurred in a speaker line in a public address system constructed in a building or the like.
  • Patent Document 1 in a public address system, a plurality of speakers are connected in parallel to a speaker line, and a power amplifier is connected to the speaker line.
  • the audio signal and the test signal are synthesized before the power amplifier, and the power amplifier amplifies the synthesized signal and supplies it to the speaker line.
  • the test signal has a constant voltage.
  • a detection circuit is provided on the output side of the power amplifier.
  • the detection circuit includes a filter that extracts a current of a test signal flowing through each speaker via the speaker line.
  • the output signal from this filter represents the combined impedance of the speaker line and each speaker because the voltage of the test signal is constant.
  • the speaker line inspection device disclosed in the above document compares the value of the output signal from this filter with the disconnection detection threshold and the short detection threshold to determine whether the speaker line is disconnected or short-circuited. . Further, the inspection apparatus uses a filter output signal value when the speaker line is in a normal state as a reference value, and a value obtained by adding a predetermined first value thereto as a disconnection detection threshold value. A value obtained by subtracting the determined second value is used as a short-circuit detection threshold.
  • the two threshold values are determined using the output signal value from the filter in a normal state of the speaker line as a reference value.
  • the output signal value obtained by measuring the above-mentioned inspection apparatus to determine these threshold values, and then the output signal value obtained by measuring in a normal state in which no disconnection or short circuit occurs in the speaker line may vary greatly. For example, measurement is performed with the output signal value obtained by measuring only the test signal being supplied to the speaker line, and the audio signal having various frequencies and the test signal being supplied to the speaker line during public system operation. The value may differ from the output signal value obtained as described above.
  • the difference in value is significant. Therefore, in the conventional inspection apparatus, by setting the first and second values strictly, there is a possibility of erroneous determination that the wire is disconnected or short-circuited despite being normal.
  • the inspection apparatus is provided in a public address system.
  • This public address system includes a signal source for audio signals.
  • This audio signal is amplified by an amplifier and supplied to a speaker line.
  • a plurality of speakers are connected in parallel to the speaker line.
  • the inspection apparatus includes a signal source of a test signal including a frequency near the lowest frequency and / or a frequency near the highest frequency in a human audible frequency band (generally 20 Hz to 20 KHz).
  • a test signal an analog signal can be used, or a digital signal converted into an analog signal by a D / A converter can be used.
  • the test signal is combined with the audio signal by a synthesizer and supplied to the amplifier.
  • the impedance specifying means extracts the component of the test signal included in the output signal of the amplifier, and specifies the impedance when the speaker side is viewed from the output side of the amplifier based on the extracted component of the test signal.
  • the impedance specifying unit can specify one or a plurality of impedances by extracting the voltage and current of the test signal included in the output signal of the amplifier.
  • the impedance specifying means can specify one or a plurality of impedances corresponding to the frequency of the test signal by analyzing the frequency of the output signal of the amplifier and extracting the frequency component of the test signal, as will be described later. .
  • the determination means determines at least one of disconnection and impedance reduction of each speaker line by comparing the impedance specified by the impedance specifying means with a predetermined threshold. For example, when a threshold value for disconnection is used, if the measured impedance is larger than the threshold value for disconnection, it is determined that the speaker line is disconnected or one of the speakers is poorly connected. Or when the threshold value for impedance reduction is used, when the specified impedance is smaller than the threshold value for impedance reduction, it is determined that the impedance reduction has occurred in the speaker line. It is also possible to prepare a threshold value for disconnection detection and a threshold value for impedance reduction, and determine both.
  • the threshold value correcting means changes the threshold value in a direction that lowers the determination accuracy of the determination means.
  • the threshold value is set based on, for example, the impedance measured with only the test signal supplied from the amplifier to the speaker line.
  • the ratio of the synthesized signal to the test signal is large, the ratio of the audio signal to the synthesized signal is large, and the speaker line and the impedance of the speaker are affected by the audio signal. Therefore, if the current threshold value is used as it is, there is a possibility of erroneous determination, so the threshold value is changed.
  • the threshold value correcting means can increase the determination accuracy, which is lowered when the composite signal is increasing, when the composite signal is changed from the increasing state to the decreasing state. In this case, the change rate in the direction of decreasing the determination accuracy is large, and the change rate in the direction of increasing the determination accuracy is small.
  • the impedance of the speaker line and the speaker changes due to the increase in the level of the audio signal
  • the impedance changes from the changed state to the original state. May take some time.
  • the rate of change in the direction of increasing the determination accuracy is reduced.
  • the speaker line inspection apparatus is also provided in the same public addressing system as that described above.
  • a test signal source is also provided, and this test signal includes both a frequency near the lowest frequency and a frequency near the highest frequency in the human audible frequency band.
  • the test signal is combined with the audio signal by a synthesizer and supplied to the amplifier.
  • Impedance specifying means extracts two frequency components of the test signal included in the output signal from the amplifier, and based on the extracted frequency components, the impedance when the speaker side is viewed from the output side of the amplifier is obtained. Identify.
  • This impedance characteristic means is also the same as the impedance characteristic means of the above-described embodiment.
  • the determined impedance is compared with a predetermined threshold by the determination means to determine at least one of the opening of each speaker line and speaker and the impedance drop.
  • the impedance is specified in these two frequency components, and these impedances are compared with the threshold value. Therefore, at least one of the opening of each speaker line and the speaker and the impedance reduction is required. Can be determined with higher accuracy.
  • the impedance specifying means can specify the impedance during a time period when the signal source of the audio signal is stopped.
  • the threshold setting unit sets the threshold based on the identified impedance.
  • the second determination means determines whether the specified impedance is within a predetermined allowable range.
  • the impedance specifying unit may include a current detecting unit that detects a current flowing through the speaker line and a voltage detecting unit that detects a voltage applied to the speaker line.
  • the frequency component of the test signal included in the current detected by the current detector and the voltage detected by the voltage detector is detected by the frequency component detector.
  • the frequency component can be detected by, for example, cross spectrum analysis of the detected current and voltage.
  • the calculating means calculates the impedance from the detected frequency components of the test signal.
  • the impedance of the speaker line and the speaker is measured based on the test signal component, the impedance of the speaker line and the speaker can be measured without being affected by the audio signal.
  • FIG. 1 is a block diagram of a public address system in which a speaker inspection apparatus according to an embodiment of the present invention is implemented.
  • FIG. 2 is a flowchart of frequency analysis processing performed by the DSP of the inspection apparatus of FIG.
  • FIG. 3 is a flowchart of an effective value measurement process performed by the DSP of the inspection apparatus of FIG.
  • FIG. 4 is a flowchart of a short circuit, disconnection, impedance increase determination process performed by the DSP of the inspection apparatus of FIG.
  • FIG. 5 is a flowchart of threshold correction processing performed by the DSP of the inspection apparatus in FIG.
  • FIG. 6 is a detailed flowchart of the Zopen and Zinc correction processing in the threshold value correction processing of FIG. FIG.
  • FIG. 7 is a diagram showing a change state of the measurement accuracy Ra corrected by the process of FIG.
  • FIG. 8 is a detailed flowchart of the Z1open and Z1inc calculation processing in the Zopen and Zinc correction processing of FIG.
  • FIG. 9 is a flowchart of the aged deterioration determination process performed by the DSP of the inspection apparatus of FIG.
  • the inspection apparatus is implemented in a public address system as shown in FIG. Public address systems, for example, amplify voices at various locations in large-scale stores.
  • This public address system has a signal source 2 for audio signals.
  • the signal source 2 may be, for example, a sound source for playing background music in a store, or a microphone for performing store guidance or emergency broadcasting.
  • the audio signal from the signal source 2 is amplified by an amplifier, for example, a power amplifier 4 through a notch filter 3 and supplied to a plurality of speakers 8 through a speaker line 6 connected to the output side of the power amplifier 4. ing.
  • the notch filter 3 is intended to prevent interference with the test signal by attenuating the same frequency component as that of the test signal described later, among the frequency components of the audio signal. Therefore, the audio signal is input to the amplifier through the notch filter 3 only when the test signal is output, and is input to the amplifier without passing through the notch filter 3 when the test signal is not output.
  • a circuit configuration may be used.
  • a low pass filter, a high pass filter, or both may be used.
  • Each speaker is arranged at various positions in the store. Although only one speaker line 6 is shown in FIG. 1, it is actually a pair of lines. Each speaker 8 is also actually connected in parallel between the pair of speaker lines.
  • the inspection apparatus has a DSP (digital signal processing apparatus) 10 that functions as a signal source of a test signal of an inaudible frequency.
  • the DSP 10 outputs a digital test signal as a test signal.
  • This digital test signal is converted into an analog test signal by the D / A converter 12.
  • the analog test signal and the audio signal from the signal source 2 are synthesized by the synthesizer 13.
  • a combined signal from the combiner 13 is supplied to the power amplifier 4.
  • This analog test signal is a signal including two frequency components of 40 Hz and 20 KHz, for example, and has a constant voltage.
  • the human audible frequency band is generally 20 Hz to 20 KHz.
  • Each speaker 8 is designed to output an optimum sound in this human audible frequency band.
  • the frequency of the test signal is preferably a frequency within the audible frequency band.
  • the test signal component reaches the human ear as noise. Therefore, it is desirable to use the frequency near the lowest frequency of the audible frequency band, the frequency near the highest frequency, or both of the audible frequency bands of the human audible frequency band as the frequency of the test signal.
  • a sound signal and a test signal are amplified by the power amplifier 4 and supplied to each speaker 8.
  • the test signal is continuously supplied from the D / A converter 12 to the synthesizer 13.
  • the audio signal is not supplied to the synthesizer 13 when it is unnecessary.
  • the audio signal from the signal source 2 may be combined with a digital test signal after A / D conversion. In this case, the combined signal is supplied to the D / A converter 12.
  • a current detection circuit 14 is provided in series on the output side of the power amplifier 4.
  • the current detection circuit 14 detects the output current supplied from the power amplifier 4 to the speaker line 6.
  • a voltage detection circuit 16 is provided in parallel on the output side of the power amplifier 4. The voltage detection circuit 16 detects the output voltage supplied from the power amplifier 4 to the speaker line 6.
  • the output signal of the current detection circuit 14 and the output signal of the voltage detection circuit 16 are digitized by the A / D converters 18 and 20 and supplied to the DSP 10.
  • the digitized output signal of the current detection circuit 14 is referred to as a digital current detection signal
  • the digitized output signal of the voltage detection circuit 16 is referred to as a digital voltage detection signal.
  • the DSP 10 processes the digital current detection signal, the digital voltage detection signal, and the digital test signal to determine whether each speaker 8 and speaker line 6 is not disconnected or short-circuited, or each speaker 8 and speaker line 6. It is determined whether the impedance of the battery is greatly reduced.
  • the determination result is notified by the notification device 28 attached to the DSP 10.
  • a display device can be used, and a determination result is displayed.
  • the frequency analysis processing shown in FIG. 2 is performed each time the sequentially supplied digital current detection signal and digital voltage detection signal are input to the DSP 10.
  • a noise frequency component is removed from the digital current detection signal and the digital voltage detection signal by a bandpass filter (step S2).
  • the digital current detection signal and digital voltage detection signal from which the noise frequency component has been removed are averaged (step S4). That is, the same number of memories as the digital current detection signal and digital voltage detection signal for one cycle of the test signal are prepared in the DSP 10, and each time the digital current detection signal and digital voltage detection signal are supplied from the bandpass filter. , Storing in the corresponding memory is performed over a plurality of cycles, and the stored value of each memory is divided by the number of the plurality of cycles.
  • step S6 Cross spectrum analysis of the digital current detection signal and digital voltage detection signal thus averaged is performed, and the correlation between the test signal included in the digital current detection signal and the digital voltage detection signal is obtained and included in the test signal.
  • the impedance Z1 at a frequency of 20 kHz, the impedance Z2 at a frequency of 40 Hz, and the coherence of the digital current detection signal and the digital voltage detection signal are calculated (step S6). If the processing capacity of the DSP 10 is high, only the cross spectrum analysis process of step S6 may be performed without performing the processes of step S2 and step S4.
  • the DSP 10 increases the voltage of the test signal having a constant voltage.
  • the effective values Vrms and Irms of the digital voltage detection signal and the digital current detection signal are calculated as shown in FIG. 3 (step S8).
  • the speaker line 6 and the speaker 8 are short-circuited. It is determined whether any of a drop in impedance (an increase in the output current of the power amplifier 4) or an open circuit has occurred.
  • the effective value Irms of the digital current detection signal is larger than a predetermined threshold value, for example, the short-circuit current value Isl of the speaker line, or the measured impedance Z1 is a predetermined threshold value, for example, of the speaker line 6 and the speaker 8. It is determined whether the short-circuit impedance Z1sl at 20 KHz is smaller and the measured impedance Z2 is smaller than a predetermined threshold, for example, the short-circuit impedance Z2sl at 40 Hz of the speaker line 6 and the speaker 8 (step S14). The short-circuit current Isl and the short-circuit impedances Z1sl and Z2sl are determined in advance from the viewpoint of protecting the speaker line 6 and the speaker 8. If the answer to the determination in step S14 is yes, it can be determined that the speaker line 8 or the like is in a short circuit state, so a short circuit is displayed (step S16), and this determination process is terminated.
  • a predetermined threshold value for example, the short-cir
  • step S14 If the answer to the determination in step S14 is no, it is determined whether the measured impedance Z1 is smaller than the lower limit value Z1inc for 20 KHz or whether the impedance Z2 is smaller than the lower limit value Z2inc for 40 Hz (step S18). .
  • the lower limit values Z1inc and Z2inc will be described later. If the answer to this determination is yes, the speaker line current has not increased until the short-circuit state, but since the output current from the power amplifier 4 has increased to some extent and is in a state of caution, an increase display is performed. (Step S20), the determination process is terminated.
  • step S18 If the answer to the determination in step S18 is no, it is determined whether the measured impedance Z1 is greater than an upper limit value Z1open for 20 KHz or whether the impedance Z2 is greater than an upper limit value Z2open for 40 Hz (step S22). .
  • the upper limit values Z1open and Z2open will be described later. If the answer to this determination is yes, it can be determined that the speaker line 6 and the speaker 8 are open, so that an open display is made (step S24), and the processing of this determination ends.
  • the upper limit values Z1open and Z2open and the lower limit values Z1inc and Z2inc are used. These are determined based on the reference impedance Z1ave at 20 KHz and the reference impedance Z2ave at 40 Hz of the speaker line 6 and the speaker 8, respectively.
  • the reference impedances Z1ave and Z2ave are set by the worker at the time of initialization when the public address system is installed and used for the first time. Alternatively, it is set by the worker when the public address system is reinitialized for some reason.
  • the reference impedances Z1ave and Z2ave may be greatly different from the impedances Z1 and Z2 measured in a normal state in which the speaker line 6 and the speaker 8 are not disconnected or short-circuited thereafter.
  • the impedance Z1 is the reference impedance Z1ave.
  • the impedance Z2 may be different from the reference impedance Z2ave.
  • the correction processing is performed after the above-described determination is performed on the upper limit values Z1open and Z2open and the lower limit values Z1inc and Z2inc based on the reference impedances Z1ave and Z2ave.
  • step S26 it is determined whether or not the effective value Vrms of the digital voltage detection signal is larger than the effective voltage value Vtest of the digital test signal by a predetermined rate, for example, 1.2 times (step S26). If the answer to this determination is yes, it is determined that many of the same frequency components other than the test signal are included in the audio signal, so that correction processing of the upper limit values Z1open, Z2open, lower limit values Z1inc, Z2inc is performed ( Step S28).
  • the predetermined rate is not limited to 1.2.
  • the measurement accuracy Ra of the measured impedances Z1 and Z2 is used.
  • the measurement accuracy Ra is a unit, and the smaller the value, the higher the measurement accuracy of the measurement impedances Z1, Z2, and the higher the value, the lower the measurement accuracy of the measurement impedances Z1, Z2. .
  • the measurement accuracy Ra is set to the smallest value, for example, 5% when Vrms is equal to Vtest.
  • Ra ⁇ Ra + ⁇ f (Vrms / Vtest) Is performed.
  • f (Vrms / Vtest) is a function having Vrms / Vtest as an argument, and its value increases when the value of Vrms / Vtest increases, and when the value of Vrms / Vtest decreases. Get smaller.
  • step S36 Z1open, Z2open, Z1inc, Z2inc are calculated using the measurement accuracy Ra thus corrected.
  • step S38 Vrms is stored as ⁇ Vrms for use in the next execution of step S30 (step S38).
  • step S40 it is determined whether the measurement accuracy Ra is larger than the impedance open ratio initial value Rul (step S40).
  • the impedance open ratio initial value R1ul is expressed as a unit, and is an upper limit value that is an impedance that the speaker line 6 is considered to be open when the measurement accuracy Ra is the highest accuracy, that is, when the smallest value is the smallest. It is an increment with respect to the reference impedance (Zave1, Zave2).
  • This impedance open ratio initial value Rul is set by the worker at the time of initialization or re-initialization, and is commonly used for Z1open and Z2open. If the answer to the determination in step S40 is no, it is not necessary to make the measurement accuracy Ra larger than the impedance open ratio initial value Rul.
  • Z1open Z1ave (1 + Rul / 100) (Step S42).
  • step S40 If the answer to the determination in step S40 is yes, it is necessary to correct Z1open according to the measurement accuracy Ra.
  • Z1open Z1ave (1 + Ra / 100) (Step S44).
  • step S46 it is determined whether Z1open is larger than the upper limit value Z1ul of impedance at 20 KHz.
  • the upper limit value Z1ul of impedance is an upper limit value of impedance that is predicted to actually occur at 20 KHz when the speaker line 6 or the like is opened.
  • the upper limit value Z1ul is manually set by an operator at the time of initialization or reinitialization. Alternatively, Z1ave measured at the time of initialization or reinitialization by the DSP 10 is multiplied by a coefficient larger than 1, and the multiplication value is set as the upper limit value Z1ul.
  • step S46 Since the Z1open value corrected based on the measurement accuracy Ra may be an impedance value that does not actually occur, the determination in step S46 is performed. If the answer to the determination in step S46 is yes, Z1open cannot be larger than Z1ul, so Z1open is set to Z1ul (step S48).
  • step S50 it is determined whether the measurement accuracy Ra is greater than the impedance increase rate initial value Rll (step S50).
  • the impedance increase rate initial value Rll is obtained from the reciprocal of the ratio of the reference impedance (Zave1 or Zave2) to the impedance at which the impedance of the speaker line 6 and the speaker 8 can be considered to be lowered when the measurement accuracy Ra is the highest accuracy.
  • the value obtained by subtracting 1 is expressed as a percentage.
  • step S56 it is determined whether Z1inc is smaller than the lower limit value Z1ll at 20 KHz of impedance Z1 (step S56).
  • the lower limit value Z1ll of the impedance is a lower limit value of the impedance at 20 KHz that is predicted to actually occur as a drop in impedance although the speaker line 6 or the speaker 8 is not short-circuited.
  • the lower limit value Z1ll is manually set by an operator at the time of initialization or reinitialization. Alternatively, Z1ave measured by the DSP 10 at the time of initialization or reinitialization is multiplied by a coefficient smaller than 1, and the multiplied value is set as the lower limit value Z1ll.
  • step S56 is executed. If the answer to the determination in step S56 is yes, Z1inc cannot be smaller than Z1ll, so Z1inc is set to Z1ll (step S58). If step S58 ends or if the answer to the determination in step S56 is no, this Z1open, Z2inc calculation processing ends.
  • Z2open and Z2inc are impedance open ratio initial value Rul, impedance increase ratio initial value Rll, upper limit value Z2ul of impedance Z2 at 40 Hz, lower limit value Z2ll of impedance Z2 at 40 Hz, impedance Z2 at 40 Hz. Is calculated using the reference impedance Z2ave. A description of this process is omitted.
  • Z2ave is 1000 ⁇
  • Z2ul 2000 ⁇
  • Z2ll 500 ⁇
  • Z2sl is 20 ⁇
  • Z1ave is 1500 ⁇
  • Z1ul is 3000 ⁇
  • Z1ll 750 ⁇
  • Z1sl is 30 ⁇
  • Isl is 5A
  • Rul 10%
  • Rll 10%
  • Ra 5% %
  • Vtest is assumed to be 5V. Note that Ra is 5% as the highest accuracy.
  • the measured impedance Z2 is 1000 ⁇ and Z1 is 1500 ⁇ , it is determined to be normal by the processing shown in FIG. Similarly, when the measurement impedance Z2 is 1100 ⁇ and Z1 is 1500 ⁇ , it is determined to be open by the process shown in FIG. If the measurement impedance Z2 is 1100 ⁇ and Z1 is 1600 ⁇ , it is determined to be open by the process shown in FIG. If the measurement impedance Z2 is 1000 ⁇ and the measurement impedance Z1 is 1400 ⁇ , it is determined to increase by the processing shown in FIG. If the measurement impedance Z2 is 15 ⁇ and the measurement impedance Z1 is 10 ⁇ , it is determined as a short circuit by the process shown in FIG.
  • Ra is quickly increased by the process of FIG.
  • the measured impedance Z2 is 1100 ⁇ and the measured impedance Z1 is 1600 ⁇ , it is determined to be normal by the process shown in FIG. If the measurement impedance Z2 is 2300 ⁇ and the measurement impedance Z1 is 1000 ⁇ , it is determined to be open by the process shown in FIG. If the measured impedance Z2 is 1400 ⁇ and the measured impedance Z1 is 600 ⁇ , it is determined that the measured impedance Z2 is increased by the process shown in FIG. If the measurement impedance Z2 is 15 ⁇ and the measurement impedance Z1 is 10 ⁇ , it is determined as a short circuit by the process shown in FIG.
  • Ra rapidly increases as a result of the processing of FIG. For example, suppose that it became 300%.
  • the measured impedance Z2 when the measured impedance Z2 is 1000 ⁇ and Z1 is 1600 ⁇ , it is determined to be normal by the process shown in FIG. If the measurement impedance Z2 is 2500 ⁇ and Z1 is 2800 ⁇ , it is determined to be open by the process shown in FIG. If the measured impedance Z2 is 400 ⁇ and the impedance Z1 is 1000 ⁇ , it is determined to increase by the processing shown in FIG. If the measurement impedance Z2 is 15 ⁇ and the measurement impedance Z1 is 10 ⁇ , it is determined as a short circuit by the process shown in FIG.
  • the reference impedances Z1ave and Z2ave at 20 KHz and 40 Hz of the speaker line 6 and each speaker 8 are measured in a state where no audio signal is supplied, and the aged deterioration tolerance for 20 KHz for which the reference impedance Z1ave is determined in advance is measured.
  • the upper limit value Z1UL is between the aging deterioration allowable lower limit value Z1LL or the reference impedance Z2ave is between the aging deterioration allowable upper limit value Z2UL for 40 Hz and the aging deterioration allowable lower limit value Z2LL for 40 Hz. Is judged.
  • the reference impedances Z1ave and Z2ave also change.
  • the reference impedance Z1ave is within the allowable range defined by the allowable upper limit value Z1UL and the allowable lower limit value Z1LL of 20 KHz, which is a limit that requires replacement of each speaker, or the reference impedance Z2ave allows replacement of each speaker.
  • the notification device 28 is displayed to prompt the user to replace the speaker. This determination is performed every day when the public address system is not used, for example, in the case where the public address system is installed, every time a certain time in the time zone from the store closing time to the opening time is reached.
  • step S60 it is determined whether or not it is the inspection time (step S60). If the answer to this determination is no, this process ends. If the answer to the determination in step S60 is yes, the DSP 10 generates a test signal (step S62). Then, the reference impedances Z1ave and Z2ave are measured as described with reference to FIG. 2 (step S64). It is determined whether Z1ave is within the allowable range defined by Z1UL and Z1LL described above, and whether Z2ave is within the allowable range defined by Z2UL and Z2LL described above (step S66). If the answer to this determination is no, an error is displayed on the notification device 28 (step S68), and the speaker is urged to be replaced.
  • step S70 the measured Z1ave and Z2ave are stored (step S70).
  • Z1ave and Z2ave when calculating Z1open, Z2open, Z1inc, and Z2inc in the process shown in FIG. 8 are updated. As a result, it is possible to prevent erroneous determination due to the influence of impedance change due to aging.
  • the impedances Z1, Z2, Z1ave, and Z2ave are measured by cross spectrum analysis. For example, the current and voltage of the test signal are extracted using a narrow-band bandpass filter that can extract the test signal. The impedance can be measured from these extracted values.
  • test signals having frequencies of 40 Hz and 20 KHz are used. However, for example, a test signal having a frequency of only 40 Hz or 20 KHz may be used.
  • the digital test signal from the DSP 10 is D / A converted and supplied to the synthesizer 13. Instead, an analog test signal source is provided separately, and the test from the analog test signal source is provided. The signal may be supplied to the synthesizer 13.
  • the analog test signal is converted into a digital test signal by the A / D converter and supplied to the DSP 10.

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Circuit For Audible Band Transducer (AREA)

Abstract

Selon l'invention, un signal audio provenant d'une source de signal audio (2) est amplifié par un amplificateur (4) et fourni à une pluralité de haut-parleurs (8) agencés en parallèle entre eux par l'intermédiaire d'une ligne de haut-parleur (6). Un synthétiseur (13) synthétise un signal de test contenant une fréquence proche de la fréquence la plus basse ou une fréquence proche de la fréquence la plus haute, ou les deux, parmi des bandes de fréquence audibles par un être humain à partir d'un processeur de signal numérique (DSP) (10) et transmet le signal synthétisé à la ligne de haut-parleur (6). Des signaux de sortie d'un circuit de détection de courant (14) et d'un circuit de détection de tension (16) agencés du côté de sortie de l'amplificateur (4) sont appliqués au DSP (10) pour analyser la composante de fréquence du signal de test. Selon l'analyse, une impédance synthétisée des haut-parleurs respectifs (8) et de la ligne de haut-parleur (6) est calculée. L'impédance synthétisée est comparée à une valeur seuil afin de détecter une déconnexion de la ligne de haut-parleur ou une réduction de l'impédance.
PCT/JP2008/050198 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur WO2009087772A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08703062.3A EP2229006B2 (fr) 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur
PCT/JP2008/050198 WO2009087772A1 (fr) 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur
JP2009548841A JP5123319B2 (ja) 2008-01-10 2008-01-10 スピーカラインの検査装置
EP13151672.6A EP2584792B2 (fr) 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2008/050198 WO2009087772A1 (fr) 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur

Publications (1)

Publication Number Publication Date
WO2009087772A1 true WO2009087772A1 (fr) 2009-07-16

Family

ID=40852897

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/050198 WO2009087772A1 (fr) 2008-01-10 2008-01-10 Dispositif d'inspection de ligne de haut-parleur

Country Status (3)

Country Link
EP (2) EP2229006B2 (fr)
JP (1) JP5123319B2 (fr)
WO (1) WO2009087772A1 (fr)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013190632A1 (fr) * 2012-06-19 2013-12-27 Toa株式会社 Dispositif de haut-parleur
WO2014006893A1 (fr) * 2012-07-04 2014-01-09 パナソニック株式会社 Dispositif d'alarme de proximité, système d'alarme de proximité, dispositif mobile et procédé permettant d'identifier une panne dans un système d'alarme de proximité
JP2015519787A (ja) * 2012-04-10 2015-07-09 コーニンクレッカ フィリップス エヌ ヴェ 音響トランスデューサを確認する方法及びシステム
US9352499B2 (en) 2011-04-12 2016-05-31 Valinge Innovation Ab Method of manufacturing a layer
US9538303B2 (en) 2010-02-10 2017-01-03 Nxp B.V. System and method for adapting a loudspeaker signal
US9860638B2 (en) 2013-09-20 2018-01-02 Panasonic Intellectual Property Management Co., Ltd. Acoustic device, acoustic system, moving body device, and malfunction diagnosis method for acoustic system
CN108419173A (zh) * 2017-02-09 2018-08-17 钰太芯微电子科技（上海）有限公司 一种扬声器自适应调节系统及方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102420711B (zh) * 2010-09-28 2014-04-30 鸿富锦精密工业（深圳）有限公司 网络通信设备及其侦测负载异常的方法
JP5924116B2 (ja) * 2012-05-17 2016-05-25 ヤマハ株式会社 半導体集積回路及び信号増幅装置
JP5772721B2 (ja) 2012-05-24 2015-09-02 アンデン株式会社 車両接近通報装置
DE102012220137A1 (de) * 2012-11-06 2014-05-08 Robert Bosch Gmbh Schaltungsanordnung und Verfahren zum Prüfen eines Mikrofons sowie System zum Betreiben eines Mikrofons mit einer derartigen Schaltungsanordnung
ES2545824T3 (es) * 2012-11-20 2015-09-16 Bombardier Transportation Gmbh Reproducción de audio segura en interfaz hombre-máquina
US9119005B2 (en) * 2013-04-11 2015-08-25 Bose Corporation Connection diagnostics for parallel speakers
US9332343B2 (en) 2014-04-14 2016-05-03 Apple Inc. Multi-channel audio system having a shared current sense element for estimating individual speaker impedances using test signals
US9247345B2 (en) 2014-04-14 2016-01-26 Apple Inc. Multi-channel audio system having a shared current sense element for estimating individual speaker impedances
US11263895B2 (en) 2017-04-05 2022-03-01 Carrier Corporation Audio riser active electrical supervision
EP3503591B1 (fr) 2017-12-19 2021-02-03 Honeywell International Inc. Dispositif permettant de connecter et de déconnecter électriquement des portions d'une ligne électrique, système d'adresse publique, procédé de détection d'une défaillance dans une ligne électrique
JP7409122B2 (ja) * 2020-01-31 2024-01-09 ヤマハ株式会社 管理サーバー、音響管理方法、プログラム、音響クライアントおよび音響管理システム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09218233A (ja) * 1996-02-08 1997-08-19 Harness Sogo Gijutsu Kenkyusho:Kk 車両における負荷の断線検出装置
JP2005241349A (ja) * 2004-02-25 2005-09-08 Matsushita Electric Ind Co Ltd 制御装置
JP2007033288A (ja) * 2005-07-28 2007-02-08 Toa Corp スピーカライン検査装置及びスピーカライン検査装置用端末装置
JP2007037024A (ja) * 2005-07-29 2007-02-08 Toa Corp スピーカラインの検査装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2507711Y2 (ja) * 1988-03-09 1996-08-21 日本無線株式会社 スピ―カ回線監視回路
JP2001036995A (ja) * 1999-07-21 2001-02-09 Toa Corp スピーカ回線の異常検知装置
JP2003274491A (ja) * 2002-03-18 2003-09-26 Mitsubishi Electric Corp スピーカ断線検出装置
KR100619055B1 (ko) * 2004-11-16 2006-08-31 삼성전자주식회사 오디오/비디오 시스템의 스피커 모드 자동 설정 방법 및장치

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09218233A (ja) * 1996-02-08 1997-08-19 Harness Sogo Gijutsu Kenkyusho:Kk 車両における負荷の断線検出装置
JP2005241349A (ja) * 2004-02-25 2005-09-08 Matsushita Electric Ind Co Ltd 制御装置
JP2007033288A (ja) * 2005-07-28 2007-02-08 Toa Corp スピーカライン検査装置及びスピーカライン検査装置用端末装置
JP2007037024A (ja) * 2005-07-29 2007-02-08 Toa Corp スピーカラインの検査装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2229006A4 *

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9538303B2 (en) 2010-02-10 2017-01-03 Nxp B.V. System and method for adapting a loudspeaker signal
US9352499B2 (en) 2011-04-12 2016-05-31 Valinge Innovation Ab Method of manufacturing a layer
JP2015519787A (ja) * 2012-04-10 2015-07-09 コーニンクレッカ フィリップス エヌ ヴェ 音響トランスデューサを確認する方法及びシステム
WO2013190632A1 (fr) * 2012-06-19 2013-12-27 Toa株式会社 Dispositif de haut-parleur
JPWO2013190632A1 (ja) * 2012-06-19 2016-02-08 Toa株式会社 スピーカー装置
WO2014006893A1 (fr) * 2012-07-04 2014-01-09 パナソニック株式会社 Dispositif d'alarme de proximité, système d'alarme de proximité, dispositif mobile et procédé permettant d'identifier une panne dans un système d'alarme de proximité
JPWO2014006893A1 (ja) * 2012-07-04 2016-06-02 パナソニックＩｐマネジメント株式会社 接近警報装置、接近警報システム、移動体装置と、接近警報システムの故障診断方法
US9779625B2 (en) 2012-07-04 2017-10-03 Panasonic Intellectual Property Management Co., Ltd. Proximity alarm device, proximity alarm system, mobile device, and method for diagnosing failure of proximity alarm system
US9860638B2 (en) 2013-09-20 2018-01-02 Panasonic Intellectual Property Management Co., Ltd. Acoustic device, acoustic system, moving body device, and malfunction diagnosis method for acoustic system
CN108419173A (zh) * 2017-02-09 2018-08-17 钰太芯微电子科技（上海）有限公司 一种扬声器自适应调节系统及方法

Also Published As

Publication number Publication date
EP2229006B2 (fr) 2019-02-27
EP2584792A1 (fr) 2013-04-24
EP2229006B1 (fr) 2013-11-20
EP2229006A4 (fr) 2012-08-08
JPWO2009087772A1 (ja) 2011-05-26
EP2584792B2 (fr) 2018-09-12
EP2584792B1 (fr) 2014-04-16
EP2229006A1 (fr) 2010-09-15
JP5123319B2 (ja) 2013-01-23

Similar Documents

Publication Publication Date Title
JP5123319B2 (ja) スピーカラインの検査装置
CN101621730B (zh) 用于检测声反馈的装置和方法
CN1951147B (zh) 啸声检测设备和方法
WO2017164380A1 (fr) Dispositif et procédé de confirmation du fonctionnement de haut-parleur
EP2465112B1 (fr) Procédé, produit de programme d'ordinateur et système pour la détermination d'une qualité perçue d'un système audio
JP2019533953A (ja) ヘッドフォンオフイヤー検知
JP4745916B2 (ja) 雑音抑圧音声品質推定装置、方法およびプログラム
CN108430026B (zh) 音频设备故障检测方法和点唱设备
JPH03500583A (ja) オーディオ信号処理システムを点検する装置
JP5542206B2 (ja) オーディオ・システムの知覚品質を判定する方法およびシステム
EP2595153A1 (fr) Appareil d'évaluation de la qualité sonore et procédé associé
JP2009229184A (ja) 高調波探査方法および高調波探査装置
EP1868414B1 (fr) Procédé et système pour vérifier une liaison audio
JP5286407B2 (ja) スピーカ極性判定装置
CN112037816A (zh) 语音信号频域频率的校正、啸叫检测、抑制方法及装置
CA2891453A1 (fr) Procede et appareil pour l'evaluation de l'intelligibilite d'un signal vocal degrade
JP5664431B2 (ja) スピーカの自己診断装置
US8243953B2 (en) Method and apparatus for identifying a feedback frequency in a signal
US20040240690A1 (en) Oscillation detection
JP4186307B2 (ja) ハウリング防止装置
US11722822B2 (en) Audio feedback detection and suppression
JP2008224816A (ja) カラオケ装置
Shindoi et al. Plant equipment diagnosis by sound processing
JP5370194B2 (ja) 増幅装置
JP2006304244A (ja) 特定音声信号の検出法及びスピーカ距離測定法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08703062

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009548841

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 2008703062

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: DE