WO2009069225A1 - 飛行時間測定装置 - Google Patents

飛行時間測定装置 Download PDF

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Publication number
WO2009069225A1
WO2009069225A1 PCT/JP2007/073179 JP2007073179W WO2009069225A1 WO 2009069225 A1 WO2009069225 A1 WO 2009069225A1 JP 2007073179 W JP2007073179 W JP 2007073179W WO 2009069225 A1 WO2009069225 A1 WO 2009069225A1
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WO
WIPO (PCT)
Prior art keywords
time
series digital
data
bit string
length encoding
Prior art date
Application number
PCT/JP2007/073179
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English (en)
French (fr)
Inventor
Eizo Kawato
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to JP2009543628A priority Critical patent/JP4930600B2/ja
Priority to US12/745,468 priority patent/US8004432B2/en
Priority to PCT/JP2007/073179 priority patent/WO2009069225A1/ja
Priority to DE112007003726.1T priority patent/DE112007003726B4/de
Priority to CN2007801017328A priority patent/CN101878423B/zh
Publication of WO2009069225A1 publication Critical patent/WO2009069225A1/ja

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Measurement Of Unknown Time Intervals (AREA)

Abstract

【課題】信号記録器からコンピュータなどのデータ処理装置へデータを転送する前に、情報を失わずにデータ量を減らす可逆圧縮処理を行う飛行時間測定装置を提供する。 【解決手段】信号記録器で記録した時系列デジタル信号を、ベースライン情報を含むビット列と含まないビット列とに分割して複数の時系列デジタル信号に変換する。まず、ベースライン情報を含まないビット列からなる前記時系列デジタル信号に対しては、ゼロレングス符号化やスイッチ連長符号化などの連長方式の符号化により圧縮を施す。その後、それぞれの時系列デジタル信号に対して個別に静的ハフマン符号化を行い、データ量を圧縮する。
PCT/JP2007/073179 2007-11-30 2007-11-30 飛行時間測定装置 WO2009069225A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2009543628A JP4930600B2 (ja) 2007-11-30 2007-11-30 飛行時間測定装置
US12/745,468 US8004432B2 (en) 2007-11-30 2007-11-30 Time-of-flight measuring device
PCT/JP2007/073179 WO2009069225A1 (ja) 2007-11-30 2007-11-30 飛行時間測定装置
DE112007003726.1T DE112007003726B4 (de) 2007-11-30 2007-11-30 Flugzeitmessvorrichtung
CN2007801017328A CN101878423B (zh) 2007-11-30 2007-11-30 飞行时间测定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/073179 WO2009069225A1 (ja) 2007-11-30 2007-11-30 飛行時間測定装置

Publications (1)

Publication Number Publication Date
WO2009069225A1 true WO2009069225A1 (ja) 2009-06-04

Family

ID=40678141

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/073179 WO2009069225A1 (ja) 2007-11-30 2007-11-30 飛行時間測定装置

Country Status (5)

Country Link
US (1) US8004432B2 (ja)
JP (1) JP4930600B2 (ja)
CN (1) CN101878423B (ja)
DE (1) DE112007003726B4 (ja)
WO (1) WO2009069225A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012038459A (ja) * 2010-08-04 2012-02-23 Shimadzu Corp 質量分析装置
JP2012169979A (ja) * 2011-02-16 2012-09-06 Shimadzu Corp 質量分析データ処理方法及び該方法を用いた質量分析装置
WO2019229998A1 (ja) * 2018-06-01 2019-12-05 株式会社島津製作所 機器分析用データ処理方法及び装置
JP7468430B2 (ja) 2021-03-29 2024-04-16 株式会社島津製作所 質量分析装置及び質量分析方法

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US9606228B1 (en) 2014-02-20 2017-03-28 Banner Engineering Corporation High-precision digital time-of-flight measurement with coarse delay elements
US9640376B1 (en) 2014-06-16 2017-05-02 Protein Metrics Inc. Interactive analysis of mass spectrometry data
US9385751B2 (en) 2014-10-07 2016-07-05 Protein Metrics Inc. Enhanced data compression for sparse multidimensional ordered series data
US10354421B2 (en) 2015-03-10 2019-07-16 Protein Metrics Inc. Apparatuses and methods for annotated peptide mapping
US9614546B2 (en) * 2015-08-09 2017-04-04 Armoya Yuksek Teknoloji Arastirmalari Elektronik Sanayi Ve Ticaret Anonim Sirketi Data compression and decompression method
US10319573B2 (en) 2017-01-26 2019-06-11 Protein Metrics Inc. Methods and apparatuses for determining the intact mass of large molecules from mass spectrographic data
US10452665B2 (en) * 2017-06-20 2019-10-22 Vmware, Inc. Methods and systems to reduce time series data and detect outliers
US10546736B2 (en) 2017-08-01 2020-01-28 Protein Metrics Inc. Interactive analysis of mass spectrometry data including peak selection and dynamic labeling
US11626274B2 (en) 2017-08-01 2023-04-11 Protein Metrics, Llc Interactive analysis of mass spectrometry data including peak selection and dynamic labeling
CN107592117B (zh) * 2017-08-15 2019-09-24 深圳前海信息技术有限公司 基于Deflate的压缩数据块输出方法及装置
US10510521B2 (en) 2017-09-29 2019-12-17 Protein Metrics Inc. Interactive analysis of mass spectrometry data
US11640901B2 (en) 2018-09-05 2023-05-02 Protein Metrics, Llc Methods and apparatuses for deconvolution of mass spectrometry data
US11346844B2 (en) 2019-04-26 2022-05-31 Protein Metrics Inc. Intact mass reconstruction from peptide level data and facilitated comparison with experimental intact observation
US11276204B1 (en) 2020-08-31 2022-03-15 Protein Metrics Inc. Data compression for multidimensional time series data
CN116320501A (zh) * 2023-05-23 2023-06-23 浙江双视科技股份有限公司 红外数据压缩方法及可读存储介质

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012038459A (ja) * 2010-08-04 2012-02-23 Shimadzu Corp 質量分析装置
JP2012169979A (ja) * 2011-02-16 2012-09-06 Shimadzu Corp 質量分析データ処理方法及び該方法を用いた質量分析装置
US8498989B2 (en) 2011-02-16 2013-07-30 Shimadzu Corporation Mass analysis data processing method and mass spectrometer using the same
WO2019229998A1 (ja) * 2018-06-01 2019-12-05 株式会社島津製作所 機器分析用データ処理方法及び装置
JPWO2019229998A1 (ja) * 2018-06-01 2021-05-13 株式会社島津製作所 機器分析用データ処理方法及び装置
JP7024866B2 (ja) 2018-06-01 2022-02-24 株式会社島津製作所 機器分析用データ処理方法及び装置
JP7468430B2 (ja) 2021-03-29 2024-04-16 株式会社島津製作所 質量分析装置及び質量分析方法

Also Published As

Publication number Publication date
DE112007003726B4 (de) 2017-12-28
CN101878423A (zh) 2010-11-03
US8004432B2 (en) 2011-08-23
CN101878423B (zh) 2013-08-21
DE112007003726T5 (de) 2010-10-14
JP4930600B2 (ja) 2012-05-16
JPWO2009069225A1 (ja) 2011-04-07
US20100309031A1 (en) 2010-12-09

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