WO2009069190A1 - Insert, plateau et appareil d'essai de composant électronique - Google Patents

Insert, plateau et appareil d'essai de composant électronique Download PDF

Info

Publication number
WO2009069190A1
WO2009069190A1 PCT/JP2007/072789 JP2007072789W WO2009069190A1 WO 2009069190 A1 WO2009069190 A1 WO 2009069190A1 JP 2007072789 W JP2007072789 W JP 2007072789W WO 2009069190 A1 WO2009069190 A1 WO 2009069190A1
Authority
WO
WIPO (PCT)
Prior art keywords
insert
tray
electronic component
testing apparatus
component testing
Prior art date
Application number
PCT/JP2007/072789
Other languages
English (en)
Japanese (ja)
Inventor
Akihiro Osakabe
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to CN200780101442.3A priority Critical patent/CN101842712B/zh
Priority to JP2009543597A priority patent/JPWO2009069190A1/ja
Priority to PCT/JP2007/072789 priority patent/WO2009069190A1/fr
Priority to KR1020107008080A priority patent/KR101149747B1/ko
Priority to PT104140A priority patent/PT104140A/pt
Priority to TW097145327A priority patent/TWI396847B/zh
Publication of WO2009069190A1 publication Critical patent/WO2009069190A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

L'invention porte sur un insert (710) qui comporte un corps principal d'insert (720) ayant un trou de stockage de dispositif (721) pour stocker un dispositif à CI ; et un support de dispositif (760) pour supporter le dispositif à CI stocké dans le trou de stockage de dispositif (721). Le support de dispositif (760) peut être finement déplacé par rapport au corps principal d'insert (720).
PCT/JP2007/072789 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique WO2009069190A1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CN200780101442.3A CN101842712B (zh) 2007-11-26 2007-11-26 插入件、托盘及电子元件测试装置
JP2009543597A JPWO2009069190A1 (ja) 2007-11-26 2007-11-26 インサート、トレイ及び電子部品試験装置
PCT/JP2007/072789 WO2009069190A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique
KR1020107008080A KR101149747B1 (ko) 2007-11-26 2007-11-26 인서트, 트레이 및 전자부품 시험장치
PT104140A PT104140A (pt) 2007-11-26 2008-07-25 Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos
TW097145327A TWI396847B (zh) 2007-11-26 2008-11-24 Embedded devices, trays and electronic parts test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072789 WO2009069190A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique

Publications (1)

Publication Number Publication Date
WO2009069190A1 true WO2009069190A1 (fr) 2009-06-04

Family

ID=40678108

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/072789 WO2009069190A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique

Country Status (6)

Country Link
JP (1) JPWO2009069190A1 (fr)
KR (1) KR101149747B1 (fr)
CN (1) CN101842712B (fr)
PT (1) PT104140A (fr)
TW (1) TWI396847B (fr)
WO (1) WO2009069190A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116643065A (zh) * 2023-07-26 2023-08-25 中国电子科技集团公司第十研究所 一种模拟类模块用柔性装夹装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101488488B1 (ko) * 2013-07-09 2015-02-02 주식회사 오킨스전자 엘이디모듈 테스트장치
TW201610444A (zh) * 2014-09-11 2016-03-16 Motech Taiwan Automatic Corp 電子元件測試模組之啓閉裝置（三）
KR101887071B1 (ko) * 2016-09-01 2018-09-10 리노공업주식회사 검사장치의 슬라이더 조작기구

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001033518A (ja) * 1999-07-16 2001-02-09 Advantest Corp 電子部品試験装置用インサート
JP2001033519A (ja) * 1999-07-16 2001-02-09 Advantest Corp 電子部品試験装置用インサート
WO2003075024A1 (fr) * 2002-03-06 2003-09-12 Advantest Corporation Piece rapportee et distributeur de composants electroniques la comprenant

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
TW530159B (en) * 1999-07-16 2003-05-01 Advantest Corp Insert for electric devices testing apparatus
WO2004095038A1 (fr) * 2003-04-23 2004-11-04 Advantest Corporation Insert et plateau destines a un dispositif de manipulation de composants electroniques et dispositif de manipulation de composants electroniques

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001033518A (ja) * 1999-07-16 2001-02-09 Advantest Corp 電子部品試験装置用インサート
JP2001033519A (ja) * 1999-07-16 2001-02-09 Advantest Corp 電子部品試験装置用インサート
WO2003075024A1 (fr) * 2002-03-06 2003-09-12 Advantest Corporation Piece rapportee et distributeur de composants electroniques la comprenant

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116643065A (zh) * 2023-07-26 2023-08-25 中国电子科技集团公司第十研究所 一种模拟类模块用柔性装夹装置
CN116643065B (zh) * 2023-07-26 2023-11-07 中国电子科技集团公司第十研究所 一种模拟类模块用柔性装夹装置

Also Published As

Publication number Publication date
JPWO2009069190A1 (ja) 2011-04-07
CN101842712A (zh) 2010-09-22
CN101842712B (zh) 2013-01-30
TW200946917A (en) 2009-11-16
KR20100052564A (ko) 2010-05-19
KR101149747B1 (ko) 2012-06-01
PT104140A (pt) 2008-09-17
TWI396847B (zh) 2013-05-21

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