WO2009040990A1 - 減衰装置および試験装置 - Google Patents

減衰装置および試験装置 Download PDF

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Publication number
WO2009040990A1
WO2009040990A1 PCT/JP2008/002401 JP2008002401W WO2009040990A1 WO 2009040990 A1 WO2009040990 A1 WO 2009040990A1 JP 2008002401 W JP2008002401 W JP 2008002401W WO 2009040990 A1 WO2009040990 A1 WO 2009040990A1
Authority
WO
WIPO (PCT)
Prior art keywords
transmission path
terminal
attenuation
attenuation device
switching unit
Prior art date
Application number
PCT/JP2008/002401
Other languages
English (en)
French (fr)
Inventor
Hiroaki Takeuchi
Yoshiyuki Hata
Makoto Nakanishi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Publication of WO2009040990A1 publication Critical patent/WO2009040990A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/24—Frequency- independent attenuators

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)

Abstract

　第１端子から受け取った信号を減衰して第２端子から送出する減衰装置であって、信号の減衰量が異なる第１伝送線路および第２伝送線路と、第１端子および第２端子の間に第１伝送線路および第２伝送線路のいずれを接続するかを切り替える接続切替部と、第１端子および第２端子の間に第２伝送線路が電気的に接続される場合に、第１伝送線路の両端と、第１伝送線路の線路上に位置する接点とを基準電位に接続する第１接地切替部とを備える減衰装置を提供する。
PCT/JP2008/002401 2007-09-28 2008-09-02 減衰装置および試験装置 WO2009040990A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/864,894 US20090085579A1 (en) 2007-09-28 2007-09-28 Attenuation apparatus and test apparatus
US11/864,894 2007-09-28

Publications (1)

Publication Number Publication Date
WO2009040990A1 true WO2009040990A1 (ja) 2009-04-02

Family

ID=40507464

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/002401 WO2009040990A1 (ja) 2007-09-28 2008-09-02 減衰装置および試験装置

Country Status (2)

Country Link
US (1) US20090085579A1 (ja)
WO (1) WO2009040990A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7649430B2 (en) * 2007-09-28 2010-01-19 Advantest Corporation Switching device, and testing apparatus
JP2009130809A (ja) * 2007-11-27 2009-06-11 Nec Electronics Corp 通信装置
CN101488999A (zh) * 2008-01-15 2009-07-22 诚实科技股份有限公司 可降低噪声干扰的测试端口处理方法
US9160647B2 (en) * 2013-11-20 2015-10-13 Litepoint Corporation System and method for enabling testing a data link of a data packet signal transceiver
JP7374938B2 (ja) * 2021-02-08 2023-11-07 アンリツ株式会社 移動端末試験装置、及び移動端末試験方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5639732U (ja) * 1979-08-31 1981-04-14
JPH06331702A (ja) * 1993-05-18 1994-12-02 Toshiba Corp 集積回路の試験装置
JP2003346629A (ja) * 2002-04-30 2003-12-05 Agilent Technol Inc 液体金属マイクロスイッチを利用した高周波リレー

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4978932A (en) * 1988-07-07 1990-12-18 Communications Satellite Corporation Microwave digitally controlled solid-state attenuator having parallel switched paths
US6489856B1 (en) * 2001-09-17 2002-12-03 Tyco Electronics Corporation Digital attenuator with combined bits
US6737933B2 (en) * 2002-01-15 2004-05-18 Nokia Corporation Circuit topology for attenuator and switch circuits
US6900711B2 (en) * 2002-09-30 2005-05-31 Agilent Technologies, Inc. Switching system
JP4933733B2 (ja) * 2005-01-11 2012-05-16 株式会社アドバンテスト 信号伝送システム、信号出力回路基板、信号受信回路基板、信号出力方法、及び信号受信方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5639732U (ja) * 1979-08-31 1981-04-14
JPH06331702A (ja) * 1993-05-18 1994-12-02 Toshiba Corp 集積回路の試験装置
JP2003346629A (ja) * 2002-04-30 2003-12-05 Agilent Technol Inc 液体金属マイクロスイッチを利用した高周波リレー

Also Published As

Publication number Publication date
US20090085579A1 (en) 2009-04-02

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