WO2009040990A1 - 減衰装置および試験装置 - Google Patents
減衰装置および試験装置 Download PDFInfo
- Publication number
- WO2009040990A1 WO2009040990A1 PCT/JP2008/002401 JP2008002401W WO2009040990A1 WO 2009040990 A1 WO2009040990 A1 WO 2009040990A1 JP 2008002401 W JP2008002401 W JP 2008002401W WO 2009040990 A1 WO2009040990 A1 WO 2009040990A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- transmission path
- terminal
- attenuation
- attenuation device
- switching unit
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/24—Frequency- independent attenuators
Landscapes
- Tests Of Electronic Circuits (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
第1端子から受け取った信号を減衰して第2端子から送出する減衰装置であって、信号の減衰量が異なる第1伝送線路および第2伝送線路と、第1端子および第2端子の間に第1伝送線路および第2伝送線路のいずれを接続するかを切り替える接続切替部と、第1端子および第2端子の間に第2伝送線路が電気的に接続される場合に、第1伝送線路の両端と、第1伝送線路の線路上に位置する接点とを基準電位に接続する第1接地切替部とを備える減衰装置を提供する。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/864,894 | 2007-09-28 | ||
US11/864,894 US20090085579A1 (en) | 2007-09-28 | 2007-09-28 | Attenuation apparatus and test apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009040990A1 true WO2009040990A1 (ja) | 2009-04-02 |
Family
ID=40507464
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/002401 WO2009040990A1 (ja) | 2007-09-28 | 2008-09-02 | 減衰装置および試験装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20090085579A1 (ja) |
WO (1) | WO2009040990A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7649430B2 (en) * | 2007-09-28 | 2010-01-19 | Advantest Corporation | Switching device, and testing apparatus |
JP2009130809A (ja) | 2007-11-27 | 2009-06-11 | Nec Electronics Corp | 通信装置 |
CN101488999A (zh) * | 2008-01-15 | 2009-07-22 | 诚实科技股份有限公司 | 可降低噪声干扰的测试端口处理方法 |
US9160647B2 (en) * | 2013-11-20 | 2015-10-13 | Litepoint Corporation | System and method for enabling testing a data link of a data packet signal transceiver |
JP7374938B2 (ja) * | 2021-02-08 | 2023-11-07 | アンリツ株式会社 | 移動端末試験装置、及び移動端末試験方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5639732U (ja) * | 1979-08-31 | 1981-04-14 | ||
JPH06331702A (ja) * | 1993-05-18 | 1994-12-02 | Toshiba Corp | 集積回路の試験装置 |
JP2003346629A (ja) * | 2002-04-30 | 2003-12-05 | Agilent Technol Inc | 液体金属マイクロスイッチを利用した高周波リレー |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4978932A (en) * | 1988-07-07 | 1990-12-18 | Communications Satellite Corporation | Microwave digitally controlled solid-state attenuator having parallel switched paths |
US6489856B1 (en) * | 2001-09-17 | 2002-12-03 | Tyco Electronics Corporation | Digital attenuator with combined bits |
US6737933B2 (en) * | 2002-01-15 | 2004-05-18 | Nokia Corporation | Circuit topology for attenuator and switch circuits |
US6900711B2 (en) * | 2002-09-30 | 2005-05-31 | Agilent Technologies, Inc. | Switching system |
JP4933733B2 (ja) * | 2005-01-11 | 2012-05-16 | 株式会社アドバンテスト | 信号伝送システム、信号出力回路基板、信号受信回路基板、信号出力方法、及び信号受信方法 |
-
2007
- 2007-09-28 US US11/864,894 patent/US20090085579A1/en not_active Abandoned
-
2008
- 2008-09-02 WO PCT/JP2008/002401 patent/WO2009040990A1/ja active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5639732U (ja) * | 1979-08-31 | 1981-04-14 | ||
JPH06331702A (ja) * | 1993-05-18 | 1994-12-02 | Toshiba Corp | 集積回路の試験装置 |
JP2003346629A (ja) * | 2002-04-30 | 2003-12-05 | Agilent Technol Inc | 液体金属マイクロスイッチを利用した高周波リレー |
Also Published As
Publication number | Publication date |
---|---|
US20090085579A1 (en) | 2009-04-02 |
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