WO2009022427A1 - 取得装置、試験装置および製造方法 - Google Patents
取得装置、試験装置および製造方法 Download PDFInfo
- Publication number
- WO2009022427A1 WO2009022427A1 PCT/JP2007/065965 JP2007065965W WO2009022427A1 WO 2009022427 A1 WO2009022427 A1 WO 2009022427A1 JP 2007065965 W JP2007065965 W JP 2007065965W WO 2009022427 A1 WO2009022427 A1 WO 2009022427A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- strobe
- observed
- strobe signal
- flip
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Abstract
観測対象の信号を取り込むべきタイミングを示すストローブ信号を発生するストローブ発生部と、観測対象信号をストローブ信号のタイミングで取得するフリップフロップと、直前のストローブ信号に応じてフリップフロップにより取得された直前の観測対象信号の値に応じて、次の観測対象信号を取り込むための次のストローブ信号のタイミングを変更する変更部と、を備える取得装置を提供する。変更部は、ストローブ信号を、互いに異なる遅延量だけ遅延させる複数の遅延部と、複数の遅延部により互いに異なる遅延量だけ遅延された複数のストローブ信号の中から、直前の観測対象信号の値に応じて次のストローブ信号を選択する選択部と、を有し、フリップフロップは、選択部により選択された次のストローブ信号を入力してよい。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/065965 WO2009022427A1 (ja) | 2007-08-16 | 2007-08-16 | 取得装置、試験装置および製造方法 |
JP2009528015A JP5113846B2 (ja) | 2007-08-16 | 2007-08-16 | 取得装置、試験装置および製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/065965 WO2009022427A1 (ja) | 2007-08-16 | 2007-08-16 | 取得装置、試験装置および製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009022427A1 true WO2009022427A1 (ja) | 2009-02-19 |
Family
ID=40350491
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/065965 WO2009022427A1 (ja) | 2007-08-16 | 2007-08-16 | 取得装置、試験装置および製造方法 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5113846B2 (ja) |
WO (1) | WO2009022427A1 (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05327435A (ja) * | 1992-05-20 | 1993-12-10 | Matsushita Electron Corp | 半導体集積回路装置 |
JPH0836037A (ja) * | 1994-07-20 | 1996-02-06 | Advantest Corp | 伝送経路の伝播遅延時間測定回路 |
JP2001201532A (ja) * | 2000-01-18 | 2001-07-27 | Advantest Corp | 半導体デバイス試験方法・半導体デバイス試験装置 |
JP2005285160A (ja) * | 2004-03-26 | 2005-10-13 | Advantest Corp | 試験装置及び試験方法 |
-
2007
- 2007-08-16 WO PCT/JP2007/065965 patent/WO2009022427A1/ja active Application Filing
- 2007-08-16 JP JP2009528015A patent/JP5113846B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05327435A (ja) * | 1992-05-20 | 1993-12-10 | Matsushita Electron Corp | 半導体集積回路装置 |
JPH0836037A (ja) * | 1994-07-20 | 1996-02-06 | Advantest Corp | 伝送経路の伝播遅延時間測定回路 |
JP2001201532A (ja) * | 2000-01-18 | 2001-07-27 | Advantest Corp | 半導体デバイス試験方法・半導体デバイス試験装置 |
JP2005285160A (ja) * | 2004-03-26 | 2005-10-13 | Advantest Corp | 試験装置及び試験方法 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2009022427A1 (ja) | 2010-11-11 |
JP5113846B2 (ja) | 2013-01-09 |
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