WO2009011107A1 - 光刺激装置及び観察装置 - Google Patents

光刺激装置及び観察装置 Download PDF

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Publication number
WO2009011107A1
WO2009011107A1 PCT/JP2008/001830 JP2008001830W WO2009011107A1 WO 2009011107 A1 WO2009011107 A1 WO 2009011107A1 JP 2008001830 W JP2008001830 W JP 2008001830W WO 2009011107 A1 WO2009011107 A1 WO 2009011107A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
stimulus
observed
designated position
control means
Prior art date
Application number
PCT/JP2008/001830
Other languages
English (en)
French (fr)
Inventor
Atsushi Tsurumune
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to EP08790182A priority Critical patent/EP2166342A4/en
Priority to JP2009523532A priority patent/JP5035339B2/ja
Publication of WO2009011107A1 publication Critical patent/WO2009011107A1/ja
Priority to US12/588,541 priority patent/US8264769B2/en
Priority to US13/569,770 priority patent/US9019598B2/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Abstract

　本発明は、光刺激観察の待機時間を短縮することを目的とする。そのために本発明の光刺激装置は、観察物（１６）上の刺激用の光の照射位置を制御する光路制御手段（１１）と、表示手段に表示された前記観察物の画像上におけるポインティグデバイス（２３）による指定位置の確定動作に基づいて、その指定位置信号と、前記刺激用の光の前記観察物への照射の実行指示信号とを生成し、前記指定位置信号に基づいて前記光路制御手段を制御するとともに、前記実行指示信号に基づいて前記刺激用の光を出射する光源を制御する制御手段（２１、２００、２０５）とを備えたことを特徴とする。
PCT/JP2008/001830 2007-07-17 2008-07-09 光刺激装置及び観察装置 WO2009011107A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08790182A EP2166342A4 (en) 2007-07-17 2008-07-09 LIGHT TIMULAR DEVICE AND MONITORING DEVICE
JP2009523532A JP5035339B2 (ja) 2007-07-17 2008-07-09 光刺激装置及び観察装置
US12/588,541 US8264769B2 (en) 2007-07-17 2009-10-19 Light stimulus apparatus and observing apparatus with light controlling unit
US13/569,770 US9019598B2 (en) 2007-07-17 2012-08-08 Light stimulus apparatus and observing apparatus with light controlling unit

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007185584 2007-07-17
JP2007-185584 2007-07-17
JP2008162836 2008-06-23
JP2008-162836 2008-06-23

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/588,541 Continuation US8264769B2 (en) 2007-07-17 2009-10-19 Light stimulus apparatus and observing apparatus with light controlling unit

Publications (1)

Publication Number Publication Date
WO2009011107A1 true WO2009011107A1 (ja) 2009-01-22

Family

ID=40259455

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001830 WO2009011107A1 (ja) 2007-07-17 2008-07-09 光刺激装置及び観察装置

Country Status (4)

Country Link
US (2) US8264769B2 (ja)
EP (1) EP2166342A4 (ja)
JP (1) JP5035339B2 (ja)
WO (1) WO2009011107A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012014066A (ja) * 2010-07-02 2012-01-19 Olympus Corp 細胞観察方法および走査型顕微鏡装置
JP2017223859A (ja) * 2016-06-16 2017-12-21 オリンパス株式会社 走査型顕微鏡

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2422524A4 (en) * 2009-04-22 2014-05-07 Hewlett Packard Development Co SPACE VARIATION SPECTRAL RESPONSE CALIBRATION DATA
JP5555061B2 (ja) * 2010-06-09 2014-07-23 オリンパス株式会社 観察装置および観察方法
US9720218B2 (en) * 2013-08-06 2017-08-01 Howard Hughes Medical Institute Volume imaging
JP6583442B2 (ja) * 2016-02-19 2019-10-02 株式会社ニコン 試料作製方法および試料作製装置
US11265449B2 (en) 2017-06-20 2022-03-01 Academia Sinica Microscope-based system and method for image-guided microscopic illumination

Citations (5)

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JP2005308985A (ja) * 2004-04-20 2005-11-04 Olympus Corp 走査型レーザ顕微鏡
JP2005337730A (ja) * 2004-05-24 2005-12-08 Nara Institute Of Science & Technology 測定システム
JP2006106346A (ja) * 2004-10-05 2006-04-20 Olympus Corp 顕微鏡システム
JP2007093988A (ja) 2005-09-28 2007-04-12 Olympus Corp 走査型レーザ顕微鏡装置及び光量検出装置
JP2007148223A (ja) * 2005-11-30 2007-06-14 Olympus Corp 走査型レーザ顕微鏡の条件設定装置及び走査型レーザ顕微鏡システム

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US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
CH690384A5 (de) * 1995-03-24 2000-08-15 Zeiss Carl Fa Computerunterstütztes Video-Mikroskop.
US6396941B1 (en) * 1996-08-23 2002-05-28 Bacus Research Laboratories, Inc. Method and apparatus for internet, intranet, and local viewing of virtual microscope slides
DE10018253C2 (de) * 2000-04-13 2003-08-21 Leica Microsystems Laser-Mikro-Dissektionsgerät
DE10112798A1 (de) * 2001-03-16 2002-10-02 Elegene Gmbh Vorrichtung und Verfahren zur automatischen Erzeugung einer Wärmevermeidungsreaktion von Nematoden oder ähnlichen Lebewesen
DE10137158B4 (de) * 2001-07-30 2005-08-04 Leica Microsystems Heidelberg Gmbh Verfahren zur Scanmikroskopie und Scanmikroskop
DE10229407B4 (de) * 2002-06-29 2021-10-14 Leica Microsystems Cms Gmbh Verfahren zur Einstellung der Systemparameter eines Rastermikroskops und Rastermikroskop
JP5058444B2 (ja) * 2005-02-10 2012-10-24 オリンパス株式会社 顕微鏡写真装置および顕微鏡写真装置制御方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308985A (ja) * 2004-04-20 2005-11-04 Olympus Corp 走査型レーザ顕微鏡
JP2005337730A (ja) * 2004-05-24 2005-12-08 Nara Institute Of Science & Technology 測定システム
JP2006106346A (ja) * 2004-10-05 2006-04-20 Olympus Corp 顕微鏡システム
JP2007093988A (ja) 2005-09-28 2007-04-12 Olympus Corp 走査型レーザ顕微鏡装置及び光量検出装置
JP2007148223A (ja) * 2005-11-30 2007-06-14 Olympus Corp 走査型レーザ顕微鏡の条件設定装置及び走査型レーザ顕微鏡システム

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2166342A4 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012014066A (ja) * 2010-07-02 2012-01-19 Olympus Corp 細胞観察方法および走査型顕微鏡装置
JP2017223859A (ja) * 2016-06-16 2017-12-21 オリンパス株式会社 走査型顕微鏡

Also Published As

Publication number Publication date
JPWO2009011107A1 (ja) 2010-09-16
US8264769B2 (en) 2012-09-11
US20120300295A1 (en) 2012-11-29
US20100039701A1 (en) 2010-02-18
EP2166342A4 (en) 2012-05-09
EP2166342A1 (en) 2010-03-24
JP5035339B2 (ja) 2012-09-26
US9019598B2 (en) 2015-04-28

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