WO2008117499A1 - 電子機器用試験装置および電子機器用試験箱 - Google Patents

電子機器用試験装置および電子機器用試験箱 Download PDF

Info

Publication number
WO2008117499A1
WO2008117499A1 PCT/JP2007/073924 JP2007073924W WO2008117499A1 WO 2008117499 A1 WO2008117499 A1 WO 2008117499A1 JP 2007073924 W JP2007073924 W JP 2007073924W WO 2008117499 A1 WO2008117499 A1 WO 2008117499A1
Authority
WO
WIPO (PCT)
Prior art keywords
test box
electronic apparatus
radio wave
test
apparatus test
Prior art date
Application number
PCT/JP2007/073924
Other languages
English (en)
French (fr)
Inventor
Michio Nagashima
Katsuya Uchida
Katsushi Yamamoto
Original Assignee
Nippon Light Metal Company, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007075914A external-priority patent/JP4830938B2/ja
Priority claimed from JP2007266547A external-priority patent/JP5169124B2/ja
Application filed by Nippon Light Metal Company, Ltd. filed Critical Nippon Light Metal Company, Ltd.
Publication of WO2008117499A1 publication Critical patent/WO2008117499A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00—Screening of apparatus or components against electric or magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

　試験箱（試験室）の電波遮蔽性能を向上させた電子機器の試験を精密に行うことができる電子機器用試験装置を提供することを課題とし、さらに、ガラス板にＩＴＯ膜を膜厚に形成した場合や、ガラス板の両面にＩＴＯ膜を形成した場合であっても、試験箱本体の内部の電子機器を良好に視認することができる視認性の高い電子機器用試験箱を提供することを課題とする。試験箱（１０）と扉（２０）との当接部分である試験箱（１０）の開口縁部（１２）または扉（２０）の周縁部（２２）に取り付けられる金属製のフィンガー（３０，３２，３３）と、扉（２０）の周縁部（２２）または試験箱（１０）の開口縁部（１２）に取り付けられる電波の遮蔽性を有するパッキン（４０，４１，４２）とを備え、また、試験箱本体（５１０）の内周面に取り付けられた電波吸収体（５３０）と、その表面に固定された明色の絶縁層（５４０）とを備えた。
PCT/JP2007/073924 2007-03-23 2007-12-12 電子機器用試験装置および電子機器用試験箱 WO2008117499A1 (ja)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2007075914A JP4830938B2 (ja) 2007-03-23 2007-03-23 電子機器用試験装置
JP2007-075916 2007-03-23
JP2007075916 2007-03-23
JP2007-075914 2007-03-23
JP2007-266547 2007-10-12
JP2007266547A JP5169124B2 (ja) 2007-03-23 2007-10-12 電子機器用試験箱

Publications (1)

Publication Number Publication Date
WO2008117499A1 true WO2008117499A1 (ja) 2008-10-02

Family

ID=39788241

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/073924 WO2008117499A1 (ja) 2007-03-23 2007-12-12 電子機器用試験装置および電子機器用試験箱

Country Status (3)

Country Link
KR (1) KR101082733B1 (ja)
CN (1) CN104198837A (ja)
WO (1) WO2008117499A1 (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2466590B1 (en) * 2010-12-15 2016-09-21 Global Nuclear Fuel-Americas, LLC Flow tripping device for diverting the coolant flow inside a fuel channel
US20190042810A1 (en) * 2017-08-07 2019-02-07 Toshiba Tec Kabushiki Kaisha Merchandise reading apparatus and merchandise information processing apparatus
JPWO2021131420A1 (ja) * 2019-12-27 2021-07-01
CN113068386A (zh) * 2021-03-18 2021-07-02 中国船舶重工集团公司第七二五研究所 一种电化学测试环境噪声屏蔽装置
CN117665410A (zh) * 2024-01-29 2024-03-08 常州麦思恩电子科技有限公司 一种用于电磁兼容的电波暗室
JP7479086B1 (ja) 2023-02-20 2024-05-08 有限会社 エヌエー・メカニカル 電磁波シールドルームの扉構造
JP7479638B2 (ja) 2021-09-16 2024-05-09 有限会社 エヌエー・メカニカル 電磁波シールド構造を備えた大型シールド扉

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8791362B2 (en) * 2012-05-24 2014-07-29 General Electric Company Shutter door assembly for an electrical panel
KR101372890B1 (ko) 2013-01-11 2014-03-10 대한실드엔지니어링(주) 알에프 실드도어의 모서리용 핑거 가스켓
KR101470399B1 (ko) * 2013-12-30 2014-12-09 주식회사 이레테크 전자파 측정 시스템
KR101602040B1 (ko) * 2014-04-25 2016-03-09 주식회사 담스테크 전자파 및 전자기파 차폐실 구조
CN103913187B (zh) * 2014-04-26 2016-06-29 广西电网公司电力科学研究院 一体化测试仪器重载部件集成箱
KR101700875B1 (ko) 2014-12-05 2017-02-02 한국표준과학연구원 전자파 전력 감지 장치 및 그것을 포함한 시스템
KR101667392B1 (ko) * 2015-05-14 2016-10-28 윌 테크놀로지(주) 전자기 펄스 차폐 함체
CN105182120A (zh) * 2015-08-31 2015-12-23 武汉博富通试验设备有限公司 一种新型电子在线检测设备
CN106249011A (zh) * 2016-08-15 2016-12-21 珠海市博杰电子有限公司 一种性能测试屏蔽箱
CN106793737A (zh) * 2017-03-15 2017-05-31 中国科学院武汉岩土力学研究所 一种爆破环境下的电磁兼容设备外壳
CN109444578A (zh) * 2018-10-31 2019-03-08 郑州海威光电科技有限公司 一种电力故障检测方法及其设备
US11422097B1 (en) * 2020-03-05 2022-08-23 The United States Of America, As Represented By The Secretary Of The Navy RF test hat
US11415616B1 (en) * 2020-03-05 2022-08-16 The United States Of America, As Represented By The Secretary Of The Navy RF test hat
JP7026157B2 (ja) * 2020-03-27 2022-02-25 アンリツ株式会社 温度試験装置及び温度試験方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02174323A (ja) * 1988-12-26 1990-07-05 Nec Corp 無線選択呼出受信機感度測定方式
JPH1186618A (ja) * 1997-09-09 1999-03-30 Fujita Corp 電磁遮蔽室の照明装置
JP2000138493A (ja) * 1998-11-02 2000-05-16 Tdk Corp 電波暗室
JP2001228188A (ja) * 2000-02-21 2001-08-24 San Technos Kk 電波暗室
JP2005252015A (ja) * 2004-03-04 2005-09-15 Japan Radio Co Ltd シールドボックス及び計測システム
WO2006049017A1 (ja) * 2004-11-05 2006-05-11 Nippon Light Metal Company, Ltd. 電子機器用試験箱

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200301964Y1 (ko) * 2002-09-10 2003-01-29 윌 테크놀로지(주) 쉴드 박스

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02174323A (ja) * 1988-12-26 1990-07-05 Nec Corp 無線選択呼出受信機感度測定方式
JPH1186618A (ja) * 1997-09-09 1999-03-30 Fujita Corp 電磁遮蔽室の照明装置
JP2000138493A (ja) * 1998-11-02 2000-05-16 Tdk Corp 電波暗室
JP2001228188A (ja) * 2000-02-21 2001-08-24 San Technos Kk 電波暗室
JP2005252015A (ja) * 2004-03-04 2005-09-15 Japan Radio Co Ltd シールドボックス及び計測システム
WO2006049017A1 (ja) * 2004-11-05 2006-05-11 Nippon Light Metal Company, Ltd. 電子機器用試験箱

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2466590B1 (en) * 2010-12-15 2016-09-21 Global Nuclear Fuel-Americas, LLC Flow tripping device for diverting the coolant flow inside a fuel channel
US20190042810A1 (en) * 2017-08-07 2019-02-07 Toshiba Tec Kabushiki Kaisha Merchandise reading apparatus and merchandise information processing apparatus
US10657336B2 (en) * 2017-08-07 2020-05-19 Toshiba Tec Kabushiki Kaisha Merchandise reading apparatus and merchandise information processing apparatus
US11194977B2 (en) 2017-08-07 2021-12-07 Toshiba Tec Kabushiki Kaisha Merchandise reading apparatus and merchandise information processing apparatus
US11551015B2 (en) 2017-08-07 2023-01-10 Toshiba Tec Kabushiki Kaisha Merchandise reading apparatus and merchandise information processing apparatus
JPWO2021131420A1 (ja) * 2019-12-27 2021-07-01
JP7141546B2 (ja) 2019-12-27 2022-09-22 マクセル株式会社 測定システム、および電波遮蔽部
CN113068386A (zh) * 2021-03-18 2021-07-02 中国船舶重工集团公司第七二五研究所 一种电化学测试环境噪声屏蔽装置
JP7479638B2 (ja) 2021-09-16 2024-05-09 有限会社 エヌエー・メカニカル 電磁波シールド構造を備えた大型シールド扉
JP7479086B1 (ja) 2023-02-20 2024-05-08 有限会社 エヌエー・メカニカル 電磁波シールドルームの扉構造
CN117665410A (zh) * 2024-01-29 2024-03-08 常州麦思恩电子科技有限公司 一种用于电磁兼容的电波暗室
CN117665410B (zh) * 2024-01-29 2024-05-14 常州麦思恩电子科技有限公司 一种用于电磁兼容的电波暗室

Also Published As

Publication number Publication date
KR101082733B1 (ko) 2011-11-10
KR20090057024A (ko) 2009-06-03
CN104198837A (zh) 2014-12-10

Similar Documents

Publication Publication Date Title
WO2008117499A1 (ja) 電子機器用試験装置および電子機器用試験箱
WO2008005816A3 (en) Electromagnetic wave shielding gasket having elasticity and adhesiveness
WO2010028024A3 (en) Electromagnetic interference suppressing hybrid sheet
WO2011163416A3 (en) Protective films for dry application to protected surfaces
WO2010077447A3 (en) Electromagnetic shielding article
TW200730973A (en) Flexible display apparatus and method for producing the same
TW200724640A (en) Heat-transferring adhesive tape with improved functionality
WO2011097069A3 (en) Moveable housing of a mobile communications device
EP1983411A4 (en) ELECTRONIC DEVICE WITH PROTECTIVE PLATE
WO2007130790A3 (en) Process condition measuring device with shielding
WO2011053742A3 (en) Methods and apparatus for providing touch sensitive displays
EP1905094A4 (en) ELECTRONIC ELECTRONIC DEVICE STRUCTURES HAVING HIGH ELECTRON MOBILITY COMPRISING NATIVE SUBSTRATES, AND METHODS OF MAKING THE SAME
TW200711564A (en) Apparatus for minimizing electromagnetic interference and manufacturing method thereof
WO2010120522A3 (en) Device and method for mitigating radio frequency interference
DE602006008908D1 (de) Prüfvorrichtung mit terahertz-wellen
TW200729436A (en) Integrated circuit device
WO2012019822A3 (de) Elektrische vorrichtung und verfahren zum einkapseln
WO2008130201A3 (en) Laminate sheet for electromagnetic radiation shielding and grounding
WO2007053582A3 (en) Improved vacuum insulated dewar flask
WO2011005952A3 (en) Methods for forming fritted cover sheets with masks and glass packages comprising the same
GB0823663D0 (en) Radio wave shielding partitioning plane material and method for manufacturing
WO2013002994A3 (en) Noise dampening energy efficient tape and gasket material
WO2005103825A3 (de) Vorrichtung zum drehbelacken von substraten
TWI257274B (en) Frosting-resistant panel structure
WO2007110653A3 (en) Improvements in and relating to isolation

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200780007660.0

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 07850475

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 1020097005587

Country of ref document: KR

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 07850475

Country of ref document: EP

Kind code of ref document: A1