WO2008105096A1 - 眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム - Google Patents

眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム Download PDF

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Publication number
WO2008105096A1
WO2008105096A1 PCT/JP2007/053828 JP2007053828W WO2008105096A1 WO 2008105096 A1 WO2008105096 A1 WO 2008105096A1 JP 2007053828 W JP2007053828 W JP 2007053828W WO 2008105096 A1 WO2008105096 A1 WO 2008105096A1
Authority
WO
WIPO (PCT)
Prior art keywords
shape measuring
calibrating
eyeglass frame
measuring apparatus
frame shape
Prior art date
Application number
PCT/JP2007/053828
Other languages
English (en)
French (fr)
Inventor
Takashi Igarashi
Masahiro Jinbo
Ryousuke Satoh
Original Assignee
Hoya Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corporation filed Critical Hoya Corporation
Priority to JP2009501097A priority Critical patent/JP4974251B2/ja
Priority to US12/449,825 priority patent/US8380456B2/en
Priority to PCT/JP2007/053828 priority patent/WO2008105096A1/ja
Priority to EP07737547.5A priority patent/EP2116808A4/en
Publication of WO2008105096A1 publication Critical patent/WO2008105096A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/14—Templates for checking contours

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

　眼鏡枠形状測定装置の測定誤差の校正を三次元で実施できる眼鏡枠形状測定装置の校正治具を提供すること。 　眼鏡枠等の形状を測定する眼鏡枠形状測定装置の測定誤差を校正するために用いられる校正治具３０であって、眼鏡枠形状測定装置の測定子がトレースするトレース溝が、眼鏡枠のリム２Ａ、２Ｂの内周に形成されて眼鏡レンズのヤゲンを嵌合するための枠溝２０であり、前記リムが、当該リムよりも剛性の高い枠体３１に固定されて構成され、前記枠溝が半径方向の変位ｒ、回転方向の変位θ及び高さ方向の変位ｚを有して構成されたものである。
PCT/JP2007/053828 2007-02-28 2007-02-28 眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム WO2008105096A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009501097A JP4974251B2 (ja) 2007-02-28 2007-02-28 眼鏡枠形状測定装置の校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム
US12/449,825 US8380456B2 (en) 2007-02-28 2007-02-28 Jig, method and data generating apparatus for calibrating spectacle frame shape measuring apparatus, spectacle frame shape measuring apparatus and spectacle frame shape measuring calibrating system
PCT/JP2007/053828 WO2008105096A1 (ja) 2007-02-28 2007-02-28 眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム
EP07737547.5A EP2116808A4 (en) 2007-02-28 2007-02-28 TEMPLATE, METHOD AND APPARATUS FOR GENERATING DATA FOR CALIBRATING MEASURING DEVICE FOR SHAPE MEASURING MOUNT, MEASURING APPARATUS FOR SHAPE MOUNTING SHAPE, AND MEASURING / CALIBRATION SYSTEM FOR SHIELDING SHAPE

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/053828 WO2008105096A1 (ja) 2007-02-28 2007-02-28 眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム

Publications (1)

Publication Number Publication Date
WO2008105096A1 true WO2008105096A1 (ja) 2008-09-04

Family

ID=39720940

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/053828 WO2008105096A1 (ja) 2007-02-28 2007-02-28 眼鏡枠形状測定装置の校正治具、校正方法、校正データ作成装置、眼鏡枠形状測定装置、及び、眼鏡枠形状測定校正システム

Country Status (4)

Country Link
US (1) US8380456B2 (ja)
EP (1) EP2116808A4 (ja)
JP (1) JP4974251B2 (ja)
WO (1) WO2008105096A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020004222A1 (ja) * 2018-06-28 2020-01-02 株式会社浅沼技研 検査マスタ
US11781849B2 (en) 2019-06-25 2023-10-10 Asanuma Giken Co., Ltd. Inspection master

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2910136B1 (fr) * 2006-12-18 2009-02-27 Essilor Int Procede de correction de la geometrie d'une couche palpee approchant un brin longitudinal d'un drageoir de monture de lunettes et procede d'acquisition de la geometrie d'un contour d'un tel drageoir
EP2031434B1 (en) * 2007-12-28 2022-10-19 Essilor International An asynchronous method for obtaining spectacle features to order
JP5500579B2 (ja) * 2009-09-30 2014-05-21 株式会社ニデック 眼鏡レンズ加工装置の較正用センサユニット
USD740949S1 (en) * 2013-09-09 2015-10-13 Essilor International (Compagnie Générale d'Optique) Ophthalmic lens edger

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09105890A (ja) * 1995-06-23 1997-04-22 Essilor Internatl (Cie Gen Opt) 眼鏡フレーム輪郭の読取り装置を校正するための校正ゲージ及びその校正方法
JP2003172906A (ja) * 2001-12-06 2003-06-20 Topcon Corp 型板取付具及び基準型板

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0811351B2 (ja) 1990-04-27 1996-02-07 株式会社トプコン 眼鏡レンズ加工システム
US5450335A (en) * 1992-08-05 1995-09-12 Hoya Corporation Method of processing spectacle frame shape data
US5515612A (en) * 1993-01-08 1996-05-14 Hoya Corporation Apparatus for measuring the shape of a frame of spectacles
FR2717413B1 (fr) * 1994-03-15 1996-05-15 Essilor Int Procédé pour la détermination de l'erreur de restitution d'une machine à déborder à laquelle est associé un appareil de lecture de contour, et application à l'autocalibrage de l'ensemble.
JP4194192B2 (ja) * 1999-10-07 2008-12-10 株式会社ニデック 玉型形状測定装置
JP3548569B2 (ja) * 2003-05-07 2004-07-28 Ｈｏｙａ株式会社 眼鏡レンズの供給システム
EP1967894A4 (en) * 2005-12-26 2010-03-31 Hoya Corp SYSTEM FOR PROVIDING GLASSES OF GOGGLES, CONTROL SYSTEM AND PRODUCTION PROCESS

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09105890A (ja) * 1995-06-23 1997-04-22 Essilor Internatl (Cie Gen Opt) 眼鏡フレーム輪郭の読取り装置を校正するための校正ゲージ及びその校正方法
JP2003172906A (ja) * 2001-12-06 2003-06-20 Topcon Corp 型板取付具及び基準型板

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2116808A4 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020004222A1 (ja) * 2018-06-28 2020-01-02 株式会社浅沼技研 検査マスタ
US11293745B2 (en) 2018-06-28 2022-04-05 Asanuma Giken Co., Ltd. Inspection master
US11781849B2 (en) 2019-06-25 2023-10-10 Asanuma Giken Co., Ltd. Inspection master

Also Published As

Publication number Publication date
EP2116808A4 (en) 2014-09-03
EP2116808A1 (en) 2009-11-11
US20100088056A1 (en) 2010-04-08
JPWO2008105096A1 (ja) 2010-06-03
JP4974251B2 (ja) 2012-07-11
US8380456B2 (en) 2013-02-19

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