WO2008084627A1 - Conductive contact unit - Google Patents

Conductive contact unit Download PDF

Info

Publication number
WO2008084627A1
WO2008084627A1 PCT/JP2007/074148 JP2007074148W WO2008084627A1 WO 2008084627 A1 WO2008084627 A1 WO 2008084627A1 JP 2007074148 W JP2007074148 W JP 2007074148W WO 2008084627 A1 WO2008084627 A1 WO 2008084627A1
Authority
WO
WIPO (PCT)
Prior art keywords
conductive
contact unit
members
conductive contacts
conductive contact
Prior art date
Application number
PCT/JP2007/074148
Other languages
French (fr)
Japanese (ja)
Inventor
Toshio Kazama
Kohei Hironaka
Shigeki Ishikawa
Original Assignee
Nhk Spring Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co., Ltd. filed Critical Nhk Spring Co., Ltd.
Priority to JP2008553036A priority Critical patent/JP5154450B2/en
Priority to TW096148579A priority patent/TW200837356A/en
Publication of WO2008084627A1 publication Critical patent/WO2008084627A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

Provided is a conductive contact unit which can be easily maintained at low cost. The conductive contact unit is provided with a plurality of conductive contacts, each of which has a first member that can extend and retract in the longitudinal direction and a second member which can be brought into contact with the first member, and input and output signals to and from an inspecting object; a holding substrate, which is formed of a conductive material, and has a hole section wherein the first members of the conductive contacts can be stored; and a removal preventing substrate, which holds the second members of the conductive contacts in a state where the second members of the conductive contacts are prevented from removing, and is removably attached on the surface of the holding substrate on the side facing the inspecting object so that an axis line of the first member and the axis line of the second member that corresponds to the first member accord with each other.
PCT/JP2007/074148 2006-12-19 2007-12-14 Conductive contact unit WO2008084627A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008553036A JP5154450B2 (en) 2006-12-19 2007-12-14 Conductive contact unit
TW096148579A TW200837356A (en) 2006-12-19 2007-12-19 Conductive contacting unit

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2006341854 2006-12-19
JP2006-341854 2006-12-19
JP2007044746 2007-02-23
JP2007-044746 2007-02-23

Publications (1)

Publication Number Publication Date
WO2008084627A1 true WO2008084627A1 (en) 2008-07-17

Family

ID=39608526

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074148 WO2008084627A1 (en) 2006-12-19 2007-12-14 Conductive contact unit

Country Status (5)

Country Link
JP (1) JP5154450B2 (en)
KR (1) KR20090094843A (en)
CN (1) CN101563617A (en)
TW (1) TW200837356A (en)
WO (1) WO2008084627A1 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010016608A1 (en) * 2008-08-08 2010-02-11 日本発條株式会社 Electric contact member and contact probe
JP2010048771A (en) * 2008-08-25 2010-03-04 Onishi Denshi Kk Inspection jig for printed circuit board
JP2010204082A (en) * 2009-02-04 2010-09-16 Kasasaku Electronics:Kk Socket for probe pin, and probe unit
JP2011158329A (en) * 2010-01-29 2011-08-18 Citizen Tohoku Kk Contact probe and electronic circuit testing device using it
JP2013546141A (en) * 2010-12-02 2013-12-26 インターコネクト・デバイシーズ・インコーポレイテッド Electrical connector with embedded shell layer
WO2015170601A1 (en) * 2014-05-09 2015-11-12 株式会社ヨコオ Socket
WO2019082259A1 (en) * 2017-10-24 2019-05-02 井上商事株式会社 Inspection jig

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9404941B2 (en) 2010-06-25 2016-08-02 Nhk Spring Co., Ltd. Contact probe and probe unit
JP2012190558A (en) * 2011-03-08 2012-10-04 Fujitsu Ltd Surface-mount connector and substrate unit
JP5901570B2 (en) * 2013-05-08 2016-04-13 本田技研工業株式会社 Current application method and current application apparatus
JP2017142080A (en) * 2016-02-08 2017-08-17 日本電産リード株式会社 Contact terminal, inspection tool, and inspection device
CN110260724A (en) * 2019-07-23 2019-09-20 融硅思创(北京)科技有限公司 Initiator with registration module

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62225961A (en) * 1986-03-26 1987-10-03 Sanko Giken Kogyo Kk Method of erecting contact probe
JPH10239349A (en) * 1996-12-27 1998-09-11 Nhk Spring Co Ltd Conductive contact element
JP2000329790A (en) * 1999-03-12 2000-11-30 Nhk Spring Co Ltd Conductive contact
JP2002048817A (en) * 2000-08-04 2002-02-15 Inoue Shoji Kk Continuity inspection jig for printed-wiring board
JP2002048816A (en) * 2000-08-04 2002-02-15 Inoue Shoji Kk Continuity test fixture for printed-wiring board
JP2002062312A (en) * 2000-08-22 2002-02-28 Toyo Denshi Giken Kk Contact device
JP2003307542A (en) * 2002-02-18 2003-10-31 Tokyo Cosmos Electric Co Ltd Ic socket
JP2005019384A (en) * 2003-05-30 2005-01-20 Fujitsu Ltd Contactor for electronic part, and testing method using the same
JP2005292060A (en) * 2004-04-02 2005-10-20 Totsuka Densi Kk Inspection tool for printed circuit board
JP2007322136A (en) * 2006-05-30 2007-12-13 Inoue Shoji Kk Continuity inspection tool for printed wiring board

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62225961A (en) * 1986-03-26 1987-10-03 Sanko Giken Kogyo Kk Method of erecting contact probe
JPH10239349A (en) * 1996-12-27 1998-09-11 Nhk Spring Co Ltd Conductive contact element
JP2000329790A (en) * 1999-03-12 2000-11-30 Nhk Spring Co Ltd Conductive contact
JP2002048817A (en) * 2000-08-04 2002-02-15 Inoue Shoji Kk Continuity inspection jig for printed-wiring board
JP2002048816A (en) * 2000-08-04 2002-02-15 Inoue Shoji Kk Continuity test fixture for printed-wiring board
JP2002062312A (en) * 2000-08-22 2002-02-28 Toyo Denshi Giken Kk Contact device
JP2003307542A (en) * 2002-02-18 2003-10-31 Tokyo Cosmos Electric Co Ltd Ic socket
JP2005019384A (en) * 2003-05-30 2005-01-20 Fujitsu Ltd Contactor for electronic part, and testing method using the same
JP2005292060A (en) * 2004-04-02 2005-10-20 Totsuka Densi Kk Inspection tool for printed circuit board
JP2007322136A (en) * 2006-05-30 2007-12-13 Inoue Shoji Kk Continuity inspection tool for printed wiring board

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010016608A1 (en) * 2008-08-08 2010-02-11 日本発條株式会社 Electric contact member and contact probe
CN102112885A (en) * 2008-08-08 2011-06-29 日本发条株式会社 Electric contact member and contact probe
JPWO2010016608A1 (en) * 2008-08-08 2012-01-26 日本発條株式会社 Work member, electrical contact member, contact probe, and method of manufacturing electrical contact member
JP2010048771A (en) * 2008-08-25 2010-03-04 Onishi Denshi Kk Inspection jig for printed circuit board
JP2010204082A (en) * 2009-02-04 2010-09-16 Kasasaku Electronics:Kk Socket for probe pin, and probe unit
JP2011158329A (en) * 2010-01-29 2011-08-18 Citizen Tohoku Kk Contact probe and electronic circuit testing device using it
JP2013546141A (en) * 2010-12-02 2013-12-26 インターコネクト・デバイシーズ・インコーポレイテッド Electrical connector with embedded shell layer
WO2015170601A1 (en) * 2014-05-09 2015-11-12 株式会社ヨコオ Socket
JP2015215223A (en) * 2014-05-09 2015-12-03 株式会社ヨコオ socket
WO2019082259A1 (en) * 2017-10-24 2019-05-02 井上商事株式会社 Inspection jig

Also Published As

Publication number Publication date
JP5154450B2 (en) 2013-02-27
JPWO2008084627A1 (en) 2010-04-30
CN101563617A (en) 2009-10-21
TWI378240B (en) 2012-12-01
TW200837356A (en) 2008-09-16
KR20090094843A (en) 2009-09-08

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