WO2008032496A1 - Convertisseur a/n - Google Patents
Convertisseur a/n Download PDFInfo
- Publication number
- WO2008032496A1 WO2008032496A1 PCT/JP2007/064906 JP2007064906W WO2008032496A1 WO 2008032496 A1 WO2008032496 A1 WO 2008032496A1 JP 2007064906 W JP2007064906 W JP 2007064906W WO 2008032496 A1 WO2008032496 A1 WO 2008032496A1
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- WIPO (PCT)
- Prior art keywords
- conversion
- converter
- analog
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- Prior art date
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
- H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
- H03M1/56—Input signal compared with linear ramp
Definitions
- the present invention relates to an A / D converter, and more particularly to an A / D converter that performs A / D conversion of a telecommunication signal.
- ADC A / D converters
- Non-Patent Document 1 Yoshikazu Nitta et al., Riigh—Speed Digital Double Sampling with An alog CDS on Column Parallel ADC Architecture for Low-Noise Active Pixel Sensor, ISSCC 2006 I SESSION 27 I IMAGE SENSORS I 27.5
- column ADCs Due to the peculiarity of signal input, column ADCs are intended for applications such as reading out image signals captured in solid-state image sensors in column units and performing A / D conversion.
- the A / D conversion of the electrical signal to be performed in real time is not suitable for any application.
- column ADCs have high performance, but their application fields are limited to image sensing.
- an object of the present invention is to make it possible to use a column ADC for A / D conversion of a telecommunication signal.
- the means taken by the present invention to solve the above-mentioned problems is that, as an A / D converter, a plurality of A / D conversion circuits and A / D conversion among the plurality of A / D conversion circuits are not being performed.
- An input selection unit that selects one of! /,, And shift and supplies an analog quantity obtained by sample-holding the input signal to the selected A / D conversion circuit, and the plurality of A / D conversion circuits
- An output selection unit that selects one of A, D, and deviation during A / D conversion and outputs a digital amount obtained from the selected A / D conversion circuit.
- Each of the D conversion circuits has a plurality of analog storage elements that store analog quantities, an input storage unit that sequentially stores the given analog quantities in the plurality of analog storage elements, and the plurality of analog storage elements
- Each has multiple A / D converters that convert the stored analog quantities into digital quantities
- a digital amount is obtained from each of the A / D conversion unit and the plurality of A / D conversion elements, and there are a plurality of registers for holding the digital amounts, and the digital amounts held in the plurality of registers are shifted.
- a shift output unit for outputting.
- a / D conversion circuit power capable of column-parallel A / D conversion S Interleave operation, so that the ability to continuously A / D-convert the electric signal that changes every moment without interruption Touch with S.
- the input storage unit is a charge coupled device, or the plurality of analog storage elements are a plurality of capacitive elements, and the input storage unit is the plurality of capacitive elements. One of these is sequentially selected, and the analog amount supplied from the input selection unit is given to the selected capacitive element.
- the AD conversion unit is a column parallel A / D converter.
- the input selection unit is provided corresponding to each of the plurality of A / D conversion circuits, and a plurality of sample and hold circuits that sample and hold a given signal; Or a selector that supplies the input signal to the selected sample-hold circuit, or the input selection unit samples and holds the input signal. And before A selector that selects any one of the plurality of A / D conversion circuits and supplies the analog amount sampled and held by the sample hold circuit to the selected A / D conversion circuit.
- the input selection unit switches a supply destination of the analog amount for each sampling period of the input signal.
- the column ADC can be used for A / D conversion of telecommunication signals, and a high-performance and low power consumption A / D converter is realized.
- the burden on the front end can be reduced in software radio or the like.
- FIG. 1 is a configuration diagram of an A / D converter according to a first embodiment.
- FIG. 2 is a detailed configuration diagram of the A / D conversion circuit shown in FIG.
- FIG. 3 is a diagram showing an interleaving operation of the A / D converter shown in FIG. 1.
- FIG. 4 is a graph showing active / inactive states of various clock signals related to the interleave operation.
- FIG. 5 is a configuration diagram of an A / D converter according to a second embodiment.
- FIG. 6 is a configuration diagram of an input storage unit that can be manufactured by a CMOS process.
- FIG. 1 shows the configuration of the A / D converter according to the first embodiment.
- This A / D converter includes A / D conversion circuits 10a and 10b, an input selection unit 20 and an output selection unit 30, and A / D converts the input signal Sin to output a signal Sout.
- the A / D conversion circuits 10a and 10b include an input storage unit 11, an A / D conversion unit 12, and a shift output unit 13, respectively.
- the input storage unit 11 can be composed of a charge coupled device (CCD) in which thousands of MOS capacitors 111 are arranged adjacent to each other. Each MOS capacitor 111 can store an electric charge as an analog amount and further transfer the electric charge to the adjacent MOS capacitor 111. Therefore, the analog amount input to the MOS capacitor 111 at the first stage (leftmost in FIG. 1) is sequentially transferred to the adjacent MOS capacitor 111, and the input storage unit 11 stores the analog amount corresponding to the number of MOS capacitors 111 in total. be able to.
- CCD charge coupled device
- the A / D conversion unit 12 includes thousands of A / D conversion elements 121 corresponding one-to-one with the MOS capacitor 111, and can be configured with a column ADC. Each A / D conversion element 121 receives the analog quantity stored in the corresponding MOS capacitor 111 and converts it into a digital quantity.
- the shift output unit 13 can be configured by a shift register including thousands of registers 131 that correspond one-to-one with the A / D conversion element 121. Each register 131 receives a digital quantity from the corresponding A / D conversion element 121 and holds it. The shift output unit 13 shifts and outputs the digital quantity held in these registers 131.
- FIG. 2 shows a detailed configuration of the A / D conversion circuit 10a.
- Each MOS capacitor 111 transfers charges to the adjacent MOS capacitor 111 in synchronization with the clock signal CKla.
- Each A / D conversion element 121 includes a sample hold circuit 1211, a comparator 1212, and a counter 1213. It is configured as a sampling ADC.
- the sample hold circuit 1211 samples and holds the analog quantity received from the corresponding MOS capacitor 111.
- the comparator 1 212 compares the analog amount received from the corresponding sample and hold circuit 1211 with the ramp signal Sramp.
- the counter 1213 performs a counting operation in synchronization with the clock signal CK2a until the output of the comparator 2212 changes, that is, until the level of the ramp signal Sramp equals the analog amount that has also received the force of the sample hold circuit 1211.
- the register 131 latches the count value of the counter 1213 in synchronization with the clock signal CK3a, and shifts the digital amount held in synchronization with the clock signal CK4a.
- the digital quantity is sequentially from the register 131 corresponding to the MOS capacitor 111 at the end (right end in FIG. 1) in the input storage unit 11. Is output.
- the A / D conversion circuit 10b has the same configuration as the A / D conversion circuit 10a. However, it operates in synchronization with the clock signals CKlb to CK4b instead of the clock signals CKla to CK4a.
- the input selection unit 20 includes a sample hold circuit 201 and a selector 202.
- the sample hold circuit 201 samples and holds the signal Sin and outputs an analog quantity.
- the selector 202 supplies the analog amount output from the sample and hold circuit 201 to the one of the A / D conversion circuits 10a and 10b that has not performed A / D conversion.
- the output selection unit 30 includes one selector 301.
- the selector 301 obtains a digital quantity from the A / D conversion circuits 10a and 10b that do not execute A / D conversion, and outputs the digital quantity as a signal Sout.
- the A / D conversion circuits 10a and 10b have the following three operations: a plurality of analog amounts stored by the input storage unit 11, a parallel A / D conversion by the A / D conversion unit 12, and a digital amount by the shift output unit 13.
- the shift output unit 13 and the shift output unit 13 can operate independently of each other. That is, the input storage unit 11 can store a new analog amount while the shift output unit 13 shifts and outputs the digital amount held in the register 131. Therefore, one of the A / D conversion circuits 10a and 10b is stored as an input memory.
- FIG. 3 shows the interleaving operation of the A / D converter.
- FIG. 4 is a graph showing active / inactive states of various clock signals related to the interleave operation.
- the clock signals CK2a and CK3a are deactivated and the clock signals CK1a and CK4a are activated, so that the A / D conversion circuit 10a performs A / D conversion.
- the unit 12 pauses, and the input storage unit 11 and the shift output unit 13 operate. As a result, the digital amount is output as the signal Sout from the shift output unit 13, and the sampling result of the signal Sin is newly recorded in the input storage unit 11.
- each A / D conversion element 121 in the A / D conversion unit 12 counts the clock signal CK2b until the analog amount stored in each MOS capacitor 111 in the input storage unit 11 reaches the level of the ramp signal Sramp. Up. The count value of each A / D conversion element 121 is latched in each register 131 in the shift output unit 13 at the rising timing of the clock signal CK3b.
- the signal Sin input during the period from time T1 to time T2 is temporarily stored in the input storage unit 11 of the A / D conversion circuit 10a, and is then temporarily stored from time T2 to time T2.
- a / D conversion is performed by the A / D converter 12 during the period up to 3, and the signal Sout is output from the shift output unit 13 during the period from time T3 to time T4.
- the signal Sin input during the period from time to IJT2 force time to IJ T3 is temporarily stored in the input storage unit 11 of the A / D converter circuit 10b, and the signal Sin from time to IJT3 to time IJT4 A / D conversion is performed by the / D conversion unit 12, and the signal Sout is output from the shift output unit 13 in the period from time IJT4 to time T5.
- the input signal Sin can be continuously A / D converted without interruption.
- the sampling rate of the signal Sin in the input selection unit 20 is sufficient.
- each A / D converter 12 can perform A / D conversion with sufficient time. Therefore, the A / D converter can operate at high speed.
- the column ADC used in the field of image sensing can be used for A / D conversion of an electric signal that changes every moment.
- a / D conversion with high power and high bit resolution can be realized with low power consumption.
- FIG. 5 shows the configuration of the A / D converter according to the second embodiment.
- This A / D converter includes A / D conversion circuits 10a, 10b, 10c and 10d, an input selection unit 20 and an output selection unit 30, and A / D converts the input signal Sin to output the signal Sout.
- the set of A / D conversion circuits 10a and 10b and the set of A / D conversion circuits 10c and 10d perform the above-described interleaving operation to execute A / D conversion.
- two A / D converter circuits in each group An analog amount is input alternately.
- the A / D conversion circuits 10a to 10d are the same as the A / D conversion circuits 10a and 10b according to the first embodiment, and thus the description thereof is omitted.
- the input selection unit 20 includes sample hold circuits 201a, 201b, 201c and 201d, and selectors 202a, 202b and 202c.
- the sampled and held signals are sampled and held and supplied to the A / D conversion circuits 10a to 10d, respectively.
- the selector 202b alternately switches the sample hold circuits 201a and 201b as output destinations at the sampling period of the signal Sin, and outputs the signal received from the selector 202a to the output destination.
- the selector 202c alternately switches the sample and hold circuits 201c and 201d as output destinations at the sampling period of the signal Sin, and outputs the signal received from the selector 202a to the output destination.
- the selector 202a receives the signal Sin, and among the selectors 202b and 202c, the one that does not execute the A / D conversion among the strings of the A / D conversion circuits 10a and 10b and the set of the A / D conversion circuits 10c and 10d. Select the one that supplies the analog quantity to the set of and output the signal Sin to the selected selector.
- the output selection unit 30 includes selectors 301a, 301b, and 301c.
- the selector 301a alternately switches the A / D conversion circuits 10a and 10b as input sources at the sampling period of the signal Sin, and outputs the digital quantity given from the input source to the selector 301c.
- the selector 301b alternately switches the A / D conversion circuits 10c and 10d as input sources at the sampling period of the signal Sin, and outputs the digital amount given from the input source to the selector 301c.
- the selector 301c executes A / D conversion of the set of A / D conversion circuits 10a and 10b and the set of A / D conversion circuits 10c and 10d among the selectors 301a and 301b!
- the supply of the analog amount to each A / D conversion circuit is interleaved, so that higher-speed A / D conversion is realized. It is possible to operate at higher speeds by supplying analog quantities to three or more A / D converter circuits by interleaving.
- the force CCD manufacturing process is based on the premise that the input storage unit 11 in each A / D conversion circuit 10a to 10d is composed of a CCD.
- the A / D conversion unit 12 and the shift output unit Since it is different from the CMOS manufacturing process such as 13, etc., it is necessary to devise such as bonding chips manufactured by each process.
- FIG. 6 shows a configuration of the input storage unit 11 that can be manufactured by a CMOS process.
- the input storage unit 11 includes a 1: 4 selector 112, a plurality of 1:10 selectors 113, and a plurality of capacitive elements 114.
- the selector 112 is the first stage, and the selector 113 has three stages in the subsequent stage, and there are a total of 4,000 capacitors 114. Then, by appropriately controlling each of the selectors 112 and 113, any one of the plurality of capacitive elements 114 can be selected, and an analog amount is stored in the selected capacitive element 114.
- the input storage unit 11 a circuit configuration that can be manufactured by a CMOS manufacturing process, it is possible to manufacture all the components of the A / D converter by the same process.
- a / D converter according to the present invention has high performance and low power consumption, it is particularly useful for software defined radio for mobile applications, multiband receivers, and the like.
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008516652A JP4546564B2 (ja) | 2006-09-14 | 2007-07-30 | A/dコンバータ |
US12/093,252 US7633421B2 (en) | 2006-09-14 | 2007-07-30 | A/D converter |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006249042 | 2006-09-14 | ||
JP2006-249042 | 2006-09-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008032496A1 true WO2008032496A1 (fr) | 2008-03-20 |
Family
ID=39183564
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/064906 WO2008032496A1 (fr) | 2006-09-14 | 2007-07-30 | Convertisseur a/n |
Country Status (3)
Country | Link |
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US (1) | US7633421B2 (ja) |
JP (1) | JP4546564B2 (ja) |
WO (1) | WO2008032496A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009089050A (ja) * | 2007-09-28 | 2009-04-23 | Sony Corp | 固体撮像素子およびカメラシステム |
JP2010109893A (ja) * | 2008-10-31 | 2010-05-13 | Fujitsu Microelectronics Ltd | イメージセンサ |
JP2017108456A (ja) * | 2017-03-02 | 2017-06-15 | キヤノン株式会社 | 撮像装置、撮像システム、撮像装置の駆動方法 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3857714A4 (en) * | 2018-09-28 | 2022-07-06 | INTEL Corporation | ANALOG-DIGITAL CONVERSION |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2002190736A (ja) * | 2000-12-21 | 2002-07-05 | Sharp Corp | サンプルホールド増幅回路およびパラレルパイプライン型データ変換器 |
JP2005347932A (ja) * | 2004-06-01 | 2005-12-15 | Canon Inc | 固体撮像装置および撮像システム |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0628340B2 (ja) * | 1985-12-24 | 1994-04-13 | ソニ−・テクトロニクス株式会社 | アナログ・デジタル変換装置用校正方法 |
JPH05175847A (ja) | 1991-12-19 | 1993-07-13 | G D S:Kk | 並列式ad変換装置 |
JP3563167B2 (ja) * | 1995-08-31 | 2004-09-08 | セイコーインスツルメンツ株式会社 | 磁気軸受装置 |
JP3069637B2 (ja) | 1996-10-16 | 2000-07-24 | 株式会社ジーデイーエス | 電荷信号並列供給装置と、それを用いたフィルタリングadコンバータ |
US6788240B2 (en) * | 2002-05-15 | 2004-09-07 | Justin Reyneri | Single-chip massively parallel analog-to-digital conversion |
-
2007
- 2007-07-30 US US12/093,252 patent/US7633421B2/en not_active Expired - Fee Related
- 2007-07-30 JP JP2008516652A patent/JP4546564B2/ja not_active Expired - Fee Related
- 2007-07-30 WO PCT/JP2007/064906 patent/WO2008032496A1/ja active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002190736A (ja) * | 2000-12-21 | 2002-07-05 | Sharp Corp | サンプルホールド増幅回路およびパラレルパイプライン型データ変換器 |
JP2005347932A (ja) * | 2004-06-01 | 2005-12-15 | Canon Inc | 固体撮像装置および撮像システム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009089050A (ja) * | 2007-09-28 | 2009-04-23 | Sony Corp | 固体撮像素子およびカメラシステム |
JP2010109893A (ja) * | 2008-10-31 | 2010-05-13 | Fujitsu Microelectronics Ltd | イメージセンサ |
JP2017108456A (ja) * | 2017-03-02 | 2017-06-15 | キヤノン株式会社 | 撮像装置、撮像システム、撮像装置の駆動方法 |
Also Published As
Publication number | Publication date |
---|---|
JP4546564B2 (ja) | 2010-09-15 |
US7633421B2 (en) | 2009-12-15 |
JPWO2008032496A1 (ja) | 2010-01-21 |
US20090237281A1 (en) | 2009-09-24 |
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