WO2007135817A1 - マルチフェロイック素子 - Google Patents
マルチフェロイック素子 Download PDFInfo
- Publication number
- WO2007135817A1 WO2007135817A1 PCT/JP2007/058027 JP2007058027W WO2007135817A1 WO 2007135817 A1 WO2007135817 A1 WO 2007135817A1 JP 2007058027 W JP2007058027 W JP 2007058027W WO 2007135817 A1 WO2007135817 A1 WO 2007135817A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- multiferroic
- solid material
- magnetic field
- cone
- spin
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/225—Auxiliary circuits
- G11C11/2275—Writing or programming circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/02—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using ferroelectric record carriers; Record carriers therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
Definitions
- the present invention relates to a multiferroic element.
- the present invention relates to a multiferroic element having both ferroelectricity and ferromagnetism, and is particularly used for a magnetic sensor suitable for reading information stored by a magnetic field. Furthermore, this multiferroic element can be applied to a memory element.
- the present invention relates to a multi-flux element having a new function which has not been conventionally provided.
- This multiferroic element can be applied to a magnetic sensor element. By using this multi-ferroic element function, it is possible to read out information embedded in the direction of magnetization without using a complicated device (for example, a magnetic sensor using a magneto-optical effect or a device such as a large pickup coil). It becomes.
- Non-Patent Document 1 Tsuneyuki Miyake, Nikkei Microdevice, 72 (2003)
- Non-Patent Document 2 K. Tomiyasu et al., Phys. Rev. B 70, 214434 (2004) Disclosure of the Invention
- the present invention provides a multiferroic element that can control the direction of electric polarization or magnetic field of a solid material by applying a magnetic field or electric field, and has a simple configuration. The purpose is to do. In order to achieve the above object, the present invention provides
- Ferroelectricity and spin direction are rotated along the outside of a cone (open angle ⁇ of the cone is 0 degrees and ⁇ 90 degrees), and it has ferromagnetism with a spin structure.
- the present invention provides a multiferroic element that uses an external magnetic field applied to a multiferroic solid material to control the direction of electric polarization substantially orthogonal to the external magnetic field (claim 1).
- the ferroelectricity and the spin direction is such that the spin direction rotates along the outside of the cone (the opening angle ⁇ of the cone apex is 0 ° and ⁇ 90 °) and has a spin structure.
- a multiferroic element that uses an external electric field applied to a multiferroic solid material having magnetism to control the direction of the magnetic field substantially orthogonal to the external electric field (claim 2). .
- It may be a multiferroic device characterized by comprising a chromium oxide which is a (Fe, Co, Ni) compound! / ⁇ (Claim 3).
- It may be a multiferroic element characterized by being a single crystal produced by a single crystal growth method in a high pressure gas atmosphere of 2 atm or more and less than 11 atm (claim 4).
- FIG. 1 is a schematic diagram showing a basic configuration of a multiferroic magnetic sensor element according to the present invention.
- FIG. 2 is a schematic diagram showing a basic configuration of a multiferroic memory element according to the present invention.
- FIG. 3 is a layout view of an experiment confirming the multiferroic magnetic sensor function according to the present invention.
- FIG. 4 is a drawing showing a crystal of CoCr 2 O, which is a multiferroic solid material that is useful in the present invention.
- FIG. 6 Shows the spin structure of CoCr 2 O, a multiferroic solid material that is useful for the present invention. It is a figure.
- the structure of the multiferroic magnetic sensor element (Fig. 1) has a multiferroic solid material force sandwiched between two metal electrodes, and is generated by a magnetic leakage field corresponding to information.
- the voltmeter detects the electric polarization generated in the direction almost perpendicular to the magnetic field.
- the multiferroic memory element (FIG. 2) also has a multiferroic solid material force sandwiched between two metal electrodes. By applying a voltage between a specific selected bit line and a word line, a magnetic field is generated in a specific direction in a single memory element sandwiched between the selected lines. The generated magnetic key has a memory function.
- the memory elements are embedded in a non-magnetic solid material.
- FIG. 1 is a schematic diagram showing a basic configuration of a multiferroic magnetic sensor element according to the present invention.
- 1 is a perpendicular magnetic recording material (perpendicular magnetic recording film)
- 2 is a multi-fiber solid material
- 3 and 4 are electrodes formed so as to sandwich the multi-ferroic solid material
- 5 is It is a voltmeter that is connected to electrodes 3 and 4 and measures charges generated on the surfaces of electrodes 3 and 4 of the multiferroic solid material 2 generated by induced electrical polarization.
- This magnetic sensor element can be simply configured without the magnetic sensor portion and the electric polarization generating portion being made of the same solid material and having a special shape.
- FIG. 2 is a schematic diagram showing a basic configuration of a multiferroic memory element according to the present invention.
- 11 is a multiferroic solid material
- 12 and 13 are electrodes formed so as to sandwich the multiferroic solid material 11.
- a minimum memory cell 10 is configured in this unit.
- the memory cells 10 of the minimum unit may be arranged in a plane.
- a specific bit line 14 and a specific word line 15 are selected and a positive voltage is applied.
- the induced magnetic field M is directed forward. If a negative voltage is applied to the next memory element, a backward magnetic field M is generated and information is stored.
- the MRAM element currently under development is a memory control system using a magnetic field induced by current.
- the multiferroic memory element described above uses reversal of magnetization induced by electric field. Unlike current-induced magnetic fields, it is possible to suppress a large amount of current consumption because it is induced by an electric field. This eliminates the disadvantage of high power consumption, which is a feature of current MRAM devices, and enables low power consumption.
- the read signal is a positive / negative signal
- the MRAM element distinguishes the signal level by the magnitude of the resistance, but it is strong against noise! ⁇ .
- the MFM element becomes a non-volatile memory element like the MRAM element.
- FIG. 3 is a layout view of an experiment confirming the multiferroic magnetic sensor function that is effective in the present invention.
- 21 is a multiferroic solid material
- 22, 23 are upper and lower electrodes sandwiching the multiferroic solid material
- 24 is a magnetic field applied to the multiferroic solid material 21 from the outside
- 25 is a multiphase.
- 26 is the charge generated on the upper and lower electrodes 22 and 23 of the multiferroic solid material 21 generated by the induced electrical polarization. It is a voltmeter.
- 27 shows the arrangement of crystal orientations of the multiferroic solid material 21 (details will be described later).
- a single crystal produced in a high-pressure gas atmosphere of 2 to 11 atmospheres was used in the free melting zone single crystal growth method. Conventionally, such a single crystal could not be obtained with the flux method.
- FIG. 4 is a view showing a crystal of CoCr 2 O, which is a multiferroic solid material useful for the present invention.
- Floating zone single crystal growth method used lamp heating method using confocal ellipsoid.
- the lamp is a xenon lamp.
- an argon gas atmosphere of 10 atm was used.
- the crystal growth rate is 40 mmZ hours. A large [110] surface of 2 X 2 mm 2 was obtained.
- Fig. 5 shows the temperature dependence of the magnetization of CoCr 2 O, which is a multiferroic solid material useful for the present invention.
- Fig. 6 shows the spin structure of CoCr 2 O, which is a multiferroic solid material that helps the present invention.
- FIG. Shows the spin structure at temperatures below 26K.
- a structure rotating so that the spin direction is outside the cone (open angle ⁇ of the apex of the cone is in the range of 0 ° and ⁇ 90 °) has an average magnetic field in the direction [001].
- the tip of each spin rotates counterclockwise about the [001] axis as the central axis, and the arrangement of each spin advances in the [110] direction.
- FIG. 7 shows the temperature of electric polarization of CoCr 2 O, which is a multiferroic solid material useful for the present invention.
- Fig. 8 shows the accompanying magnetization reversal of CoCr 2 O, which is a multiferroic solid material that is useful in the present invention.
- the electric polarization is the same when the direction of the magnetic field parallel to the [001] direction is periodically reversed in amplitude (approximately 0.2 T to 0.2 mm, approximately 0.01 Hz).
- amplitude approximately 0.2 T to 0.2 mm, approximately 0.01 Hz.
- the direction of the electric polarization of CoCr 2 O is controlled by the direction of the external magnetic field.
- the spin direction of the multiferroic material having a spin structure is rotated so that the spin direction is along the outside of the cone (open angle ⁇ of the apex of the cone is 0 ° and ⁇ 90 °).
- the direction of electrical polarization can be controlled by an external magnetic field.
- the present embodiment is a cryogenic region in a temperature range of 26 ° C or less, but the spin structure shown above is rotated so that the spin direction is along the outside of the cone. It is found in materials. By searching for multiferroic materials with this structure, it is possible to develop similar phenomena at room temperature.
- the direction of the magnetic field can be controlled by the electric field which is the reverse process.
- the direction of electrical polarization can be controlled by an electric field. If a reversal of electric polarization occurs at this time, in a multiferroic material having a spin structure in which the spin direction rotates along the outside of the cone, the reversal theorem (principle of reciprocity) ) Is more obvious.
- the structure of the magnetic sensor element is simplified, and the cost can be greatly reduced.
- the magnetic sensor element can be miniaturized, the magnetic sensor can cope with the miniaturization of the magnetic domain that stores information.
- it becomes a memory element by the inversion function of the magnetic field by the electric field.
- the magnetization induced by the electric field has hysteresis, it becomes a nonvolatile memory element. Fewer layer configurations dramatically reduce process costs. New low power consumption, high integration, and low manufacturing cost multiferroic non-volatile memory devices (MFM devices) can be provided.
- MFM devices multiferroic non-volatile memory devices
- the multiferroic element of the present invention provides, for example, a magnetic sensor element having a simple structure.
- the multiferroic element of the present invention provides a low-cost memory element.
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Measuring Magnetic Variables (AREA)
- Soft Magnetic Materials (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008516577A JP4911640B2 (ja) | 2006-05-24 | 2007-04-12 | マルチフェロイック素子 |
US12/299,778 US20090196818A1 (en) | 2006-05-24 | 2007-04-12 | Multiferroic element |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006144309 | 2006-05-24 | ||
JP2006-144309 | 2006-05-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2007135817A1 true WO2007135817A1 (ja) | 2007-11-29 |
Family
ID=38723129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/058027 WO2007135817A1 (ja) | 2006-05-24 | 2007-04-12 | マルチフェロイック素子 |
Country Status (3)
Country | Link |
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US (1) | US20090196818A1 (ja) |
JP (1) | JP4911640B2 (ja) |
WO (1) | WO2007135817A1 (ja) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010109021A (ja) * | 2008-10-29 | 2010-05-13 | Japan Science & Technology Agency | マルチフェロイック電子装置 |
WO2010100678A1 (ja) * | 2009-03-06 | 2010-09-10 | 株式会社日立製作所 | トンネル磁気記録素子、磁気メモリセル及び磁気ランダムアクセスメモリ |
WO2011005737A2 (en) * | 2009-07-07 | 2011-01-13 | Alcatel-Lucent Usa Inc. | Multiferroic materials for tunable permittivity or permeability |
WO2011145146A1 (ja) * | 2010-05-20 | 2011-11-24 | 株式会社日立製作所 | トンネル磁気抵抗効果素子及びそれを用いた磁気メモリセル並びに磁気ランダムアクセスメモリ |
US8891190B1 (en) | 2011-11-18 | 2014-11-18 | Akita University | Electric field writing magnetic storage device |
WO2015025589A1 (ja) * | 2013-08-22 | 2015-02-26 | 株式会社村田製作所 | 酸化物セラミックス、及びセラミック電子部品 |
US9460769B2 (en) | 2011-08-23 | 2016-10-04 | National Institute Of Advanced Industrial Science And Technology | Electric field ferromagnetic resonance excitation method and magnetic function element employing same |
US9950958B2 (en) | 2013-03-14 | 2018-04-24 | Murata Manufacturing Co., Ltd. | Electromagnetic effect material and ceramic electronic component |
CN108735806A (zh) * | 2018-05-30 | 2018-11-02 | 厦门大学 | 一种产生可控极化率的自旋电流的结构与方法 |
US10497499B2 (en) | 2014-05-21 | 2019-12-03 | Murata Manufacturing Co., Ltd. | Oxide ceramic and ceramic electronic component |
Families Citing this family (7)
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US8397580B2 (en) | 2010-09-16 | 2013-03-19 | The Boeing Company | Multi-ferroic structural health monitoring systems and methods |
US9666639B2 (en) | 2010-09-17 | 2017-05-30 | Micron Technology, Inc. | Spin torque transfer memory cell structures and methods |
US8358534B2 (en) * | 2010-09-17 | 2013-01-22 | Micron Technology, Inc. | Spin torque transfer memory cell structures and methods |
US8310868B2 (en) * | 2010-09-17 | 2012-11-13 | Micron Technology, Inc. | Spin torque transfer memory cell structures and methods |
US8300454B2 (en) * | 2010-09-17 | 2012-10-30 | Micron Technology, Inc. | Spin torque transfer memory cell structures and methods |
KR20120124226A (ko) * | 2011-05-03 | 2012-11-13 | 삼성전자주식회사 | 메모리 소자 및 그 제조 방법 |
GB2560936A (en) * | 2017-03-29 | 2018-10-03 | Univ Warwick | Spin electronic device |
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ITFI20020038A1 (it) * | 2002-03-08 | 2003-09-08 | Colorobbia Italia S R L | Coloranti ceramici in forma di sospensioni nanometriche |
US7675129B2 (en) * | 2002-12-13 | 2010-03-09 | Japan Science And Technology Agency | Spin injection device, magnetic device using the same, magnetic thin film used in the same |
WO2006114904A1 (en) * | 2005-04-22 | 2006-11-02 | Matsushita Electric Industrial Co., Ltd. | Non volatile memory cell and semiconductor memory device |
US20070064351A1 (en) * | 2005-09-13 | 2007-03-22 | Wang Shan X | Spin filter junction and method of fabricating the same |
JP4693634B2 (ja) * | 2006-01-17 | 2011-06-01 | 株式会社東芝 | スピンfet |
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2007
- 2007-04-12 US US12/299,778 patent/US20090196818A1/en not_active Abandoned
- 2007-04-12 WO PCT/JP2007/058027 patent/WO2007135817A1/ja active Application Filing
- 2007-04-12 JP JP2008516577A patent/JP4911640B2/ja not_active Expired - Fee Related
Patent Citations (4)
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WO2004023563A1 (ja) * | 2002-09-05 | 2004-03-18 | Japan Science And Technology Agency | 電界効果トランジスタ |
JP2004179219A (ja) * | 2002-11-25 | 2004-06-24 | Matsushita Electric Ind Co Ltd | 磁気デバイスおよびこれを用いた磁気メモリ |
JP2004207707A (ja) * | 2002-12-13 | 2004-07-22 | Japan Science & Technology Agency | スピン注入デバイス及びこれを用いた磁気装置 |
WO2006028005A1 (ja) * | 2004-09-08 | 2006-03-16 | Kyoto University | 強磁性強誘電体及びその製造方法 |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010109021A (ja) * | 2008-10-29 | 2010-05-13 | Japan Science & Technology Agency | マルチフェロイック電子装置 |
WO2010100678A1 (ja) * | 2009-03-06 | 2010-09-10 | 株式会社日立製作所 | トンネル磁気記録素子、磁気メモリセル及び磁気ランダムアクセスメモリ |
JP5166600B2 (ja) * | 2009-03-06 | 2013-03-21 | 株式会社日立製作所 | トンネル磁気記録素子、磁気メモリセル及び磁気ランダムアクセスメモリ |
US8615150B2 (en) | 2009-07-07 | 2013-12-24 | Alcatel Lucent | Method employing multiferroic materials for tunable permittivity or permeability |
WO2011005737A2 (en) * | 2009-07-07 | 2011-01-13 | Alcatel-Lucent Usa Inc. | Multiferroic materials for tunable permittivity or permeability |
WO2011005737A3 (en) * | 2009-07-07 | 2011-03-31 | Alcatel-Lucent Usa Inc. | Multiferroic materials for tunable permittivity or permeability |
US8280210B2 (en) | 2009-07-07 | 2012-10-02 | Alcatel Lucent | Apparatus employing multiferroic materials for tunable permittivity or permeability |
JP5386637B2 (ja) * | 2010-05-20 | 2014-01-15 | 株式会社日立製作所 | トンネル磁気抵抗効果素子及びそれを用いた磁気メモリセル並びに磁気ランダムアクセスメモリ |
WO2011145146A1 (ja) * | 2010-05-20 | 2011-11-24 | 株式会社日立製作所 | トンネル磁気抵抗効果素子及びそれを用いた磁気メモリセル並びに磁気ランダムアクセスメモリ |
US9460769B2 (en) | 2011-08-23 | 2016-10-04 | National Institute Of Advanced Industrial Science And Technology | Electric field ferromagnetic resonance excitation method and magnetic function element employing same |
US8891190B1 (en) | 2011-11-18 | 2014-11-18 | Akita University | Electric field writing magnetic storage device |
US9950958B2 (en) | 2013-03-14 | 2018-04-24 | Murata Manufacturing Co., Ltd. | Electromagnetic effect material and ceramic electronic component |
WO2015025589A1 (ja) * | 2013-08-22 | 2015-02-26 | 株式会社村田製作所 | 酸化物セラミックス、及びセラミック電子部品 |
JP6061111B2 (ja) * | 2013-08-22 | 2017-01-18 | 株式会社村田製作所 | 酸化物セラミックス、及びセラミック電子部品 |
US9947460B2 (en) | 2013-08-22 | 2018-04-17 | Murata Manufacturing Co., Ltd. | Oxide ceramic and ceramic electronic component |
US10497499B2 (en) | 2014-05-21 | 2019-12-03 | Murata Manufacturing Co., Ltd. | Oxide ceramic and ceramic electronic component |
CN108735806A (zh) * | 2018-05-30 | 2018-11-02 | 厦门大学 | 一种产生可控极化率的自旋电流的结构与方法 |
Also Published As
Publication number | Publication date |
---|---|
US20090196818A1 (en) | 2009-08-06 |
JPWO2007135817A1 (ja) | 2009-10-01 |
JP4911640B2 (ja) | 2012-04-04 |
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