WO2007111271A1 - Composition for forming silica coating and silica coating - Google Patents

Composition for forming silica coating and silica coating Download PDF

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Publication number
WO2007111271A1
WO2007111271A1 PCT/JP2007/056091 JP2007056091W WO2007111271A1 WO 2007111271 A1 WO2007111271 A1 WO 2007111271A1 JP 2007056091 W JP2007056091 W JP 2007056091W WO 2007111271 A1 WO2007111271 A1 WO 2007111271A1
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Prior art keywords
silica
composition
forming
based film
acid
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PCT/JP2007/056091
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French (fr)
Japanese (ja)
Inventor
Kiyoshi Ishikawa
Toshiyuki Ogata
Hideo Hada
Shogo Matsumaru
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Tokyo Ohka Kogyo Co., Ltd.
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Publication of WO2007111271A1 publication Critical patent/WO2007111271A1/en

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D1/00Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D183/00Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
    • C09D183/04Polysiloxanes

Definitions

  • the present invention relates to a composition for forming a silica-based film and a silica-based film. More specifically, the present invention relates to a composition for forming a silica-based film capable of forming a film at a low temperature and a silica-based film.
  • a composition for forming a silica-based film is mainly used for reducing a step in a semiconductor wiring or filling a groove between wirings to form a silica-based film. Since the liquid is applied, the pattern recess on the wafer can be easily embedded, and the wiring can be flattened with good reproducibility.
  • This silica-based film is particularly preferably used as an interlayer insulating film.
  • Such a silica-based coating is generally obtained by applying a composition for forming a silica-based coating on a substrate, heating at 80 ° C. to 300 ° C., and baking at a temperature of 350 ° C. or higher. (For example, refer to Patent Document 1).
  • Patent Document 1 Japanese Patent Laid-Open No. 2005-171067
  • the present invention has been made in view of the above-described problems, and provides a composition for forming a silica-based film that can form a silica-based film by heating at a low temperature. With the goal.
  • the present inventors have made extensive studies focusing on the additive agent added to the silica-based film forming composition. As a result, it generates acid or base by the action of heat. It has been found that the above problems can be solved by using a compound, and the present invention has been completed. More specifically, the present invention provides the following.
  • a first invention of the present invention is a composition for forming a silica-based film comprising a siloxane polymer (A) and a compound (B) that generates an acid or a base by the action of heat.
  • the second invention of the present invention is a silica-based coating obtained from the above-mentioned composition for forming a silica-based coating.
  • the composition for forming a silica-based film of the present invention contains a compound that generates an acid or a base by the action of heat. Thereby, a silica-based film can be easily formed at a temperature of less than 350 ° C.
  • FIG. 1 is a diagram showing a FT-IR chart of Example 1.
  • FIG. 2 is a diagram showing an FT-IR chart of Comparative Example 1.
  • FIG. 3 is a diagram showing an FT-IR chart of Example 2.
  • FIG. 4 is a diagram showing an FT-IR chart of Comparative Example 3.
  • FIG. 5 is a graph comparing the BHF resistance of silica-based coatings in Example 2 and Comparative Example 3.
  • composition for forming a silica-based film of the present invention comprises a siloxane polymer (A) and a compound (B) that generates an acid or a base by the action of heat.
  • the siloxane polymer of the present invention (hereinafter also referred to as “component (A)”) is not particularly limited, and is a polymer having a Si 2 O 3 Si bond.
  • hydrolysis-condensation products of alkoxysilanes can be suitably used.
  • Any kind of alkoxysilane can be used as the alkoxysilane.
  • Examples of such alkoxysilane include, for example, the following general formula (a): Mention may be made of the compounds represented.
  • R 1 is hydrogen, an alkyl group having 1 to 20 carbon atoms or an aryl group
  • R 2 is a monovalent organic group
  • n is an integer of 0 to 2.
  • examples of the monovalent organic group include an alkyl group, aryl group, aryl group, and glycidyl group.
  • an alkyl group and an aryl group are preferable.
  • the number of carbon atoms of the alkyl group is preferably 1 to 5, and examples thereof include a methyl group, an ethyl group, a propyl group, and a butyl group.
  • the alkyl group may be linear or branched, and hydrogen may be substituted with fluorine.
  • the aryl group those having 6 to 20 carbon atoms are preferred, and examples thereof include a phenyl group and a naphthyl group.
  • examples include tetramethoxysilane, tetraethoxysilane, tetrapropoxysilane, tetrabutoxysilane,
  • n l
  • monoalkyltrialkoxysilanes such as silane and monopropyltriethoxysilane
  • monophenyltrialkoxysilanes such as monophenyltrimethoxysilane
  • monophenyltriethoxysilane monophenyltriethoxysilane.
  • dialkyl dialkoxysilane diphenyl such as dimethylenoresimethoxysilane, dimethylenoresetoxysilane, dimethylenoresipropoxysilane, getinoresioxymethoxysilane, methinoresoxyoxysilane, methinoresidipropoxysilane, etc.
  • diphenyl dialkoxysilanes such as dimethoxysilane and diphenyljetoxysilane.
  • the weight average of the siloxane polymer (A) is preferably 200 or more and 50000 or less, more preferably 1000 or more and 3000 or less. If it is this range, the applicability
  • Hydrolytic condensation of alkoxysilane is obtained by reacting alkoxysilane as a polymerization monomer in an organic solvent in the presence of an acid catalyst or a base catalyst.
  • the alkoxysilane used as the polymerization monomer may be used alone or may be condensed by combining plural kinds.
  • trialkylalkoxysilanes such as trimethylmethoxysilane, trimethylethoxysilane, trimethylpropoxysilane, triethylmethoxysilane, triethyloxysilane, triethylpropoxysilane, tripylpyroxysilane, tripropylethoxysilane, Triphenylalkoxysilane such as triphenylmethoxysilane and triphenylethoxysilane may be added during hydrolysis.
  • the degree of hydrolysis of alkoxysilane which is a precondition for condensation, can be adjusted by the amount of water to be added.
  • the amount of water added is 1.0 to L: 0.0 times the total number of moles of alkoxysilane represented by the chemical formula (a). More preferably, it is added at a molar ratio of 5 to 8.0.
  • the degree of hydrolysis can be sufficiently increased, and the film formation can be improved.
  • gelling can be prevented and the storage stability can be improved by controlling the molarity to 10.0 mol or less.
  • an acid catalyst in the condensation of the alkoxysilane represented by the chemical formula (a), it is preferable to use an acid catalyst.
  • the acid catalyst that is preferably used is not particularly limited and is conventionally used. Any organic acid or inorganic acid can be used. Examples of the organic acid include organic carboxylic acids such as acetic acid, propionic acid, and butyric acid, and examples of the inorganic acid include hydrochloric acid, nitric acid, sulfuric acid, phosphoric acid, and the like.
  • the acid catalyst may be added directly to the mixture of alkoxysilane and water, or may be added to the alkoxysilane as an acidic aqueous solution together with water.
  • the hydrolysis reaction is usually completed in about 5 to about L00 hours.
  • component (B) As a compound that generates an acid or base by the action of heat (hereinafter also referred to as “component (B)”)
  • the compound that generates an acid or a base is preferably a compound that generates an acid or a base at 100 ° C. or higher and 300 ° C. or lower.
  • the composition for forming a silica-based film can form a silica-based film without firing at a high temperature of, for example, 350 ° C or higher. Thereby, heating (for example, drying and baking) after applying the composition for forming a silica-based film can be simplified.
  • thermal acid generators examples include thermal acid generators and thermal base generators.
  • the thermal acid generator is not particularly limited, but 2, 4, 4, 6-tetrabromocyclohexagenone, benzoin tosylate, 2--trobendiltosylate, and other alkyls of organic sulfonic acid.
  • Esters can be used. Specific examples include sulphonium salts, iodine salts, benzothiazonium salts, ammonium salts, phosphonium salts, and the like. Of these, particularly preferred are ododonium salts, sulfo-salts and benzothiazo-salts.
  • sulfo-um salt and the benzothiazo-um salt include, for example, 4-acetoxyphenol dimethylsulfo-hexafluoroarsenate, benzyl 4-hydroxyphenol methylsulfo-hexafluoro Antimonate, 4-acetoxyphenol pendylmethylsulfo-hexafluoroantimonate, dibenzyl 4-hydroxyphenolsulfo-hexafluoroantimonate, 4-acetoxyphenol pendylsulfo-hexaflux Examples include oloantimonate and 3-benzylbenzothiazolium hexafluoroantimonate.
  • the thermal base generator is not particularly limited, but 1-methyl 1- (4 —Biphenyl-ethyl) ethyl carbamate, forceful rubamate derivatives such as 1,1-dimethyl-2-cyanoethylcarbamate, urea derivatives such as urea and N, N-dimethyl-N'methylurea, 1,4-dihydronicotine Dihydropyridine derivatives such as amides, quaternized ammonium salts of organic silanes and organic boranes, dicyandiamide and the like are used.
  • trichlorodiethyl acetate guanidine trichlorodimethylacetate acetate, potassium trichlorodiacetate
  • phenylsulfonylacetate guanidine p-diphenylsulfolacetate guanidine
  • p-methanesulfursulfate -Lusulfol acetate guanidine phenol-potassium propylpropiolate, guanidine propylpropiolate, cesium ferropropiolate, p-chlorophenol guanidine propylpropiolate, p-phthalene bisphenol
  • examples include guanidine lupropiolic acid, tetramethylammonium phenolsulfol acetate, and tetramethylammonium phenolpropiolate.
  • these compounds generating an acid or a base may be used alone or in combination of two or more.
  • the content of the component (B) is 0.1% by mass or more and 20 quality with respect to the SiO equivalent mass of the component (A).
  • the amount is 0.5% by mass or more and 15% by mass or less.
  • blend surfactant It is preferable to mix
  • the composition for forming a silica-based film of the present invention preferably contains a solvent for the purpose of improving coating properties and film thickness uniformity.
  • a solvent for the purpose of improving coating properties and film thickness uniformity.
  • an organic solvent generally used conventionally can be used.
  • Specific examples include monohydric alcohols such as methyl alcohol, ethyl alcohol, propyl alcohol, butyl alcohol, 3-methoxy-3-methyl-1-butanol, 3-methoxy-1-butanol; methyl 3-methoxypropionate, ethyl 3-ethoxy Alkyl carboxylic acid esters such as propionate; polyhydric alcohols such as ethylene glycol, diethylene glycol, and propylene glycol; ethylene glycol monomethino enoenoate, ethylene glycol monometheno enoenoate, Tylene glycol monopropinoreateol, ethylene glycol monobutinoleatenore, propylene glyconole monomethinoatenor
  • the amount of the solvent is not particularly limited, but it is preferable that the concentration of components (solid content) other than the solvent is 5 to: LOO mass% 20 to 50 mass % Is more preferable. By making it in this range, the coatability can be improved.
  • a composition for forming a silica-based coating is applied on a substrate.
  • a method for applying the composition for forming a silica-based film on the substrate for example, any method such as a spray method, a spin coat method, a dip coat method, a roll coat method can be used. Is used.
  • the silica-based film-forming composition applied on the substrate is heat-treated.
  • the heat treatment is not particularly limited with respect to its means, temperature, time, etc. In general, it may be performed on a hot plate at about 80 to 300 ° C. for about 1 to 6 minutes.
  • composition for forming a silica-based film of the present invention an acid or a base is generated by heating with a heat treatment. Hydrolysis is promoted by the generated acid or base, so that the alkoxy group becomes a hydroxyl group and alcohol is generated. After that, the two molecules of alcohol condense and a Si-O-Si network is formed. A dense silica-based film can be obtained.
  • the heat treatment is preferably performed in three steps or more and in steps. Specifically, after the first heat treatment for about 30 seconds to 2 minutes on a hot plate at about 60 to 150 ° C in the atmosphere or an inert gas atmosphere such as nitrogen, 100 to 220 ° The second heat treatment is performed for about 30 seconds to 2 minutes at about C, and the third heat treatment is performed for about 30 seconds to 2 minutes at about 150 to 300 ° C.
  • stepwise heat treatment of three or more steps preferably about 3 to 6 steps, a silica-based film can be formed at a lower temperature.
  • the above-mentioned compound (b-1) was added so as to be 7.5% by mass with respect to the solid content in the spin-on glass material to produce a composition for forming a silica-based film.
  • a composition for forming a silica-based film was applied on a 6-inch silicon wafer using a coater (SS8261NUU: manufactured by Tokyo Ohka Kogyo Co., Ltd.) at a rotation speed of lOOOOrpm. Next, heating was performed on a hot plate at 80 ° C. for 60 seconds, 150 ° C. for 60 seconds, and 200 ° C. for 60 seconds to form a silica-based film.
  • a silica-based film forming composition was produced by adding 7% by mass with respect to the solid content in the non-on glass material.
  • the composition for forming a silica-based film was applied onto a 6-inch silicon wafer at a rotational speed of lOOOOrpm using a coater (SS8261NUU: manufactured by Tokyo Ohka Kogyo Co., Ltd.). Next, heat on a hot plate at 300 ° C for 60 seconds to form a silica coating. Made.
  • a silica-based film was produced in the same manner as in Example 1 using OCD T-12 1000V.
  • Comparative Example 1 after heating, firing was further performed at 400 ° C. in a nitrogen atmosphere to form a silica-based film.
  • a silica-based film was formed in the same manner as in Example 2 using OCD T-7 7000WK80A.
  • Comparative Example 3 after heating, firing was further performed at 400 ° C. in a nitrogen atmosphere to form a silica-based film.
  • Example 1 and Comparative Examples 1 and 2 were evaluated based on the ratio of the peak area of Si—O bond to the peak area of Si—H bond. Further, Example 2 and Comparative Examples 3 and 4 were evaluated based on the ratio of the peak area of the Si—O bond and the peak area of the Si—C bond.
  • the FT-IR chart of Example 1 is shown in FIG. 1
  • the FT-IR chart of Comparative Example 1 is shown in FIG. 2
  • the FT-IR chart of Example 2 is shown in FIG. 3
  • the FT-IR chart of Comparative Example 3 is shown.
  • Figure 4 shows the IR chart.
  • the second embodiment the silica-based film of Comparative Example 3, 3 parts by mass 0/0 resistance Noffa for one Dofu' (BHF) acid concentration, time after applying the BHF onto the silica-based film It confirmed by measuring the amount of film
  • Example 2 had higher chemical resistance than Comparative Example 3.

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Abstract

Disclosed is a composition for forming a silica coating which enables to form a silica coating by being applied over a substrate and then heated thereon at a low temperature. Also disclosed is a silica coating obtained by using such a composition. Specifically disclosed is a composition for forming a silica coating, which contains a hydrolysis-condensation product (A) of an alkoxysilane and a compound (B) which generates an acid or a base by the action of heat. It is preferable that the compound (B) generates an acid or a base at a temperature of not less than 100˚C but not more than 300˚C.

Description

シリカ系被膜形成用組成物およびシリカ系被膜  Composition for forming silica-based film and silica-based film
技術分野  Technical field
[0001] 本発明は、シリカ系被膜形成用組成物およびシリカ系被膜に関する。より詳しくは、 低温にて被膜を形成することができるシリカ系被膜形成用組成物およびシリカ系被 膜に関する。  [0001] The present invention relates to a composition for forming a silica-based film and a silica-based film. More specifically, the present invention relates to a composition for forming a silica-based film capable of forming a film at a low temperature and a silica-based film.
背景技術  Background art
[0002] シリカ系被膜形成用組成物は、主に半導体の配線等の段差緩和や配線間の溝埋 め込みに用いられ、シリカ系被膜を形成する。液体の塗布であるため、ウェハ上のパ ターン凹みも容易に埋め込むことができるため、再現性良く配線の平坦ィ匕を行うこと ができる。そして、このシリカ系被膜は特に層間絶縁膜として好適に用いられる。  [0002] A composition for forming a silica-based film is mainly used for reducing a step in a semiconductor wiring or filling a groove between wirings to form a silica-based film. Since the liquid is applied, the pattern recess on the wafer can be easily embedded, and the wiring can be flattened with good reproducibility. This silica-based film is particularly preferably used as an interlayer insulating film.
[0003] このようなシリカ系被膜は、一般的にシリカ系被膜形成用組成物を基板上に塗布し 、 80°C〜300°Cでの加熱、および 350°C以上の温度での焼成により形成される(例 えば特許文献 1参照)。  Such a silica-based coating is generally obtained by applying a composition for forming a silica-based coating on a substrate, heating at 80 ° C. to 300 ° C., and baking at a temperature of 350 ° C. or higher. (For example, refer to Patent Document 1).
特許文献 1 :特開 2005— 171067号公報  Patent Document 1: Japanese Patent Laid-Open No. 2005-171067
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0004] 上述したように、 350°C以上の高温での焼成処理を必要とするため、生産性の低下 につながっていた。また、高温で焼成することにより、ケィ素に結合した有機基が分解 するなどし、シリカ系被膜における所望の特性を発揮する上で好ま 、条件ではなか つた o [0004] As described above, a firing process at a high temperature of 350 ° C or higher is required, leading to a decrease in productivity. In addition, firing at a high temperature is preferable for exhibiting the desired characteristics of the silica-based coating because the organic group bonded to the silicon decomposes, etc.
[0005] 本発明は、以上のような課題に鑑みてなされたものであり、低温で加熱することによ り、シリカ系被膜を形成することができるシリカ系被膜形成用組成物を提供することを 目的とする。  [0005] The present invention has been made in view of the above-described problems, and provides a composition for forming a silica-based film that can form a silica-based film by heating at a low temperature. With the goal.
課題を解決するための手段  Means for solving the problem
[0006] 本発明者らは上記課題を解決するため、シリカ系被膜形成用組成物に加える添カロ 剤に着目して鋭意研究を重ねた。その結果、熱の作用により酸又は塩基を発生する 化合物を用いることにより、上記課題を解決できることを見出し、本発明を完成するに 至った。より具体的には、本発明は以下のようなものを提供する。 [0006] In order to solve the above-mentioned problems, the present inventors have made extensive studies focusing on the additive agent added to the silica-based film forming composition. As a result, it generates acid or base by the action of heat. It has been found that the above problems can be solved by using a compound, and the present invention has been completed. More specifically, the present invention provides the following.
[0007] 本発明の第一の発明は、シロキサンポリマー (A)と、熱の作用により酸又は塩基を 発生する化合物 (B)と、を含有してなるシリカ系被膜形成用組成物である。  [0007] A first invention of the present invention is a composition for forming a silica-based film comprising a siloxane polymer (A) and a compound (B) that generates an acid or a base by the action of heat.
[0008] また、本発明の第二の発明は、前記シリカ系被膜形成用組成物より得られるシリカ 系被膜である。  [0008] The second invention of the present invention is a silica-based coating obtained from the above-mentioned composition for forming a silica-based coating.
発明の効果  The invention's effect
[0009] 本発明のシリカ系被膜形成用組成物には、熱の作用により酸又は塩基を発生する 化合物が含まれている。これにより、 350°C未満の温度でシリカ系被膜を容易に形成 することができる。  [0009] The composition for forming a silica-based film of the present invention contains a compound that generates an acid or a base by the action of heat. Thereby, a silica-based film can be easily formed at a temperature of less than 350 ° C.
図面の簡単な説明  Brief Description of Drawings
[0010] [図 1]実施例 1の FT— IRのチャートを示す図である。 FIG. 1 is a diagram showing a FT-IR chart of Example 1.
[図 2]比較例 1の FT— IRのチャートを示す図である。  FIG. 2 is a diagram showing an FT-IR chart of Comparative Example 1.
[図 3]実施例 2の FT— IRのチャートを示す図である。  FIG. 3 is a diagram showing an FT-IR chart of Example 2.
[図 4]比較例 3の FT— IRのチャートを示す図である。  FIG. 4 is a diagram showing an FT-IR chart of Comparative Example 3.
[図 5]実施例 2および比較例 3におけるシリカ系被膜の BHF耐性を比較したグラフで ある。  FIG. 5 is a graph comparing the BHF resistance of silica-based coatings in Example 2 and Comparative Example 3.
発明を実施するための形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0011] 以下、本発明の実施形態について説明する。 [0011] Hereinafter, embodiments of the present invention will be described.
[0012] 《シリカ系被膜形成用組成物〉〉 [0012] <Silica-based film-forming composition>
本発明のシリカ系被膜形成用組成物は、シロキサンポリマー (A)と、熱の作用によ り酸又は塩基を発生する化合物 (B)と、を含有してなる。  The composition for forming a silica-based film of the present invention comprises a siloxane polymer (A) and a compound (B) that generates an acid or a base by the action of heat.
[0013] <シロキサンポリマー(A) > [0013] <Siloxane polymer (A)>
本発明のシロキサンポリマー(以下、「(A)成分」ともいう。)は、特に限定されず、 Si O Si結合を有するポリマーである。  The siloxane polymer of the present invention (hereinafter also referred to as “component (A)”) is not particularly limited, and is a polymer having a Si 2 O 3 Si bond.
このシロキサンポリマーの中でも、アルコキシシランの加水分解縮合物を好適に用 いることができる。上記アルコキシシランとしては、あらゆる種類のアルコキシシランを 用いることができる。このようなアルコキシシランとしては、例えば、下記一般式 (a)で 表される化合物を挙げることができる。 Among these siloxane polymers, hydrolysis-condensation products of alkoxysilanes can be suitably used. Any kind of alkoxysilane can be used as the alkoxysilane. Examples of such alkoxysilane include, for example, the following general formula (a): Mention may be made of the compounds represented.
[0014] [化 1]  [0014] [Chemical 1]
R 1 n - S i ( O R 2 ) 4n · · · ( a ) R 1 n -S i (OR 2 ) 4n · · · (a)
(式中、 R1は、水素、炭素数 1から 20のアルキル基又はァリール基であり、 R2は 1価 の有機基であり、 nは、 0〜2の整数を示す。 ) (In the formula, R 1 is hydrogen, an alkyl group having 1 to 20 carbon atoms or an aryl group, R 2 is a monovalent organic group, and n is an integer of 0 to 2.)
[0015] ここで、 1価の有機基としては、例えば、アルキル基、ァリール基、ァリル基、グリシジ ル基を挙げることができる。これらの中では、アルキル基及びァリール基が好ましい。 アルキル基の炭素数は 1〜5が好ましぐ例えば、メチル基、ェチル基、プロピル基、 ブチル基等を挙げることができる。また、アルキル基は直鎖状であっても分岐状であ つてもよく、水素がフッ素により置換されていてもよい。ァリール基としては、炭素数 6 〜20のものが好ましぐ例えばフエニル基、ナフチル基等を挙げることができる。  Here, examples of the monovalent organic group include an alkyl group, aryl group, aryl group, and glycidyl group. In these, an alkyl group and an aryl group are preferable. The number of carbon atoms of the alkyl group is preferably 1 to 5, and examples thereof include a methyl group, an ethyl group, a propyl group, and a butyl group. The alkyl group may be linear or branched, and hydrogen may be substituted with fluorine. As the aryl group, those having 6 to 20 carbon atoms are preferred, and examples thereof include a phenyl group and a naphthyl group.
[0016] 上記一般式 (a)で表される化合物の具体例としては、  [0016] As specific examples of the compound represented by the general formula (a),
(al) n=0の場合、テトラメトキシシラン、テトラエトキシシラン、テトラプロボキシシラン 、テトラブトキシシラン等を挙げることができ、  (al) When n = 0, examples include tetramethoxysilane, tetraethoxysilane, tetrapropoxysilane, tetrabutoxysilane,
(a2) n= lの場合、モノメチルトリメトキシシラン、モノメチルトリエトキシシラン、モノメチ ルトリプロボキシシラン、モノェチルトリメトキシシラン、モノェチルトリエトキシシラン、モ ノエチルトリプロポキシシラン、モノプロピルトリメトキシシラン、モノプロピルトリエトキシ シランなどのモノアルキルトリアルコキシシラン、モノフエ-ルトリメトキシシラン、モノフ ェ-ルトリエトキシシランなどのモノフエ-ルトリアルコキシシラン等を挙げることができ  (a2) When n = l, monomethyltrimethoxysilane, monomethyltriethoxysilane, monomethyltripropoxysilane, monoethyltrimethoxysilane, monoethyltriethoxysilane, monoethyltripropoxysilane, monopropyltrimethoxy Examples include monoalkyltrialkoxysilanes such as silane and monopropyltriethoxysilane, monophenyltrialkoxysilanes such as monophenyltrimethoxysilane, and monophenyltriethoxysilane.
(a3) n= 2の場合、ジメチノレジメトキシシラン、ジメチノレジェトキシシラン、ジメチノレジ プロポキシシラン、ジェチノレジメトキシシラン、ジェチノレジェトキシシラン、ジェチノレジ ルジプロポキシシランなどのジアルキルジアルコキシシラン、ジフエ二ルジメトキシシラ ン、ジフエ-ルジェトキシシランなどのジフエ-ルジアルコキシシラン等を挙げることが できる。 (a3) When n = 2, dialkyl dialkoxysilane, diphenyl such as dimethylenoresimethoxysilane, dimethylenoresetoxysilane, dimethylenoresipropoxysilane, getinoresioxymethoxysilane, methinoresoxyoxysilane, methinoresidipropoxysilane, etc. Examples include diphenyl dialkoxysilanes such as dimethoxysilane and diphenyljetoxysilane.
[0017] 本発明のシリカ系被膜形成用組成物において、シロキサンポリマー (A)の重量平 均分子量は、 200以上 50000以下であることが好ましぐ 1000以上 3000以下であ ることがより好ましい。この範囲であれば、シリカ系被膜形成用組成物の塗布性を向 上させることができる。 In the composition for forming a silica-based film of the present invention, the weight average of the siloxane polymer (A) The average molecular weight is preferably 200 or more and 50000 or less, more preferably 1000 or more and 3000 or less. If it is this range, the applicability | paintability of the composition for silica-type film formation can be improved.
[0018] アルコキシシランの加水分解縮合は、重合モノマーとなるアルコキシシランを、有機 溶媒中、酸触媒または塩基触媒の存在下で反応させることにより得られる。重合モノ マーとなるアルコキシシランは、 1種のみの使用であっても、また複数種を組み合わ せて縮合してもよい。  [0018] Hydrolytic condensation of alkoxysilane is obtained by reacting alkoxysilane as a polymerization monomer in an organic solvent in the presence of an acid catalyst or a base catalyst. The alkoxysilane used as the polymerization monomer may be used alone or may be condensed by combining plural kinds.
[0019] また、トリメチルメトキシシラン、トリメチルエトキシシラン、トリメチルプロボキシシラン、 トリェチルメトキシシラン、トリェチルエトキシシラン、トリェチルプロポキシシラン、トリプ 口ピルメトキシシラン、トリプロピルエトキシシランなどのトリアルキルアルコキシシラン、 トリフエニルメトキシシラン、トリフエニルエトキシシランなどのトリフエニルアルコキシシ ラン等を加水分解時に添加してもよ 、。  [0019] Further, trialkylalkoxysilanes such as trimethylmethoxysilane, trimethylethoxysilane, trimethylpropoxysilane, triethylmethoxysilane, triethyloxysilane, triethylpropoxysilane, tripylpyroxysilane, tripropylethoxysilane, Triphenylalkoxysilane such as triphenylmethoxysilane and triphenylethoxysilane may be added during hydrolysis.
[0020] 縮合の前提となるアルコキシシランの加水分解の度合いは、添加する水の量により 調整することができる。一般的には、前記化学式 (a)で示されるアルコキシシランの合 計モル数に対して、水の添力卩量を 1. 0〜: L0. 0倍モルにすることが好ましぐ 1. 5〜8 . 0倍モルの割合で添加することがより好ましい。水の添加量を 1. 0倍モル以上にす ることにより加水分解度を十分大きくすることができ、被膜形成を良好にすることがで きる。一方で、 10. 0倍モル以下にすることによりゲルィ匕を防止することができ、保存 安定性を良好にすることができる。 [0020] The degree of hydrolysis of alkoxysilane, which is a precondition for condensation, can be adjusted by the amount of water to be added. In general, it is preferable that the amount of water added is 1.0 to L: 0.0 times the total number of moles of alkoxysilane represented by the chemical formula (a). More preferably, it is added at a molar ratio of 5 to 8.0. By making the addition amount of water 1.0 mol or more, the degree of hydrolysis can be sufficiently increased, and the film formation can be improved. On the other hand, gelling can be prevented and the storage stability can be improved by controlling the molarity to 10.0 mol or less.
[0021] また、化学式 (a)で示されるアルコキシシランの縮合においては、酸触媒を用いるこ とが好ましぐ用いられる酸触媒としては、特に限定されるものではなぐ従来慣用的 に使用されている有機酸、無機酸のいずれも使用することができる。有機酸としては 、酢酸、プロピオン酸、酪酸等の有機カルボン酸を挙げることができ、無機酸としては 、塩酸、硝酸、硫酸、燐酸等が挙げられる。酸触媒は、アルコキシシランと水との混合 物に直接添加するか、又は、水とともに酸性水溶液としてアルコキシシランに添加し てもよい。  [0021] In addition, in the condensation of the alkoxysilane represented by the chemical formula (a), it is preferable to use an acid catalyst. The acid catalyst that is preferably used is not particularly limited and is conventionally used. Any organic acid or inorganic acid can be used. Examples of the organic acid include organic carboxylic acids such as acetic acid, propionic acid, and butyric acid, and examples of the inorganic acid include hydrochloric acid, nitric acid, sulfuric acid, phosphoric acid, and the like. The acid catalyst may be added directly to the mixture of alkoxysilane and water, or may be added to the alkoxysilane as an acidic aqueous solution together with water.
[0022] 加水分解反応は、通常 5〜: L00時間程度で完了する。また、室温から 80°Cを超え な 、加熱温度にぉ 、て、化学式 (a)で示される 1種以上のアルコキシシランを含む有 機溶剤に酸触媒水溶液を滴下して反応させることにより、短い反応時間で反応を完 了させることも可能である。加水分解されたアルコキシシランは、その後、縮合反応を 起こし、その結果、 Si— O Siのネットワークを形成する。 [0022] The hydrolysis reaction is usually completed in about 5 to about L00 hours. In addition, it is possible to contain one or more alkoxysilanes represented by the chemical formula (a) at a heating temperature not exceeding room temperature to 80 ° C. It is also possible to complete the reaction in a short reaction time by dropping the acid catalyst aqueous solution into the organic solvent for reaction. The hydrolyzed alkoxysilane then undergoes a condensation reaction, resulting in the formation of a Si—O Si network.
[0023] <熱の作用により酸又は塩基を発生する化合物 (B) > [0023] <Compound capable of generating acid or base by the action of heat (B)>
熱の作用により酸又は塩基を発生する化合物(以下、「 (B)成分」とも 、う)としては As a compound that generates an acid or base by the action of heat (hereinafter also referred to as “component (B)”)
、加熱することで、酸又は塩基を発生すれば特に限定されず用いることができる。ま た、酸又は塩基を発生する化合物は、 100°C以上 300°C以下で酸又は塩基を発生 する化合物であることが好まし 、。 As long as it generates an acid or a base by heating, it can be used without any particular limitation. In addition, the compound that generates an acid or a base is preferably a compound that generates an acid or a base at 100 ° C. or higher and 300 ° C. or lower.
[0024] シリカ系被膜形成用組成物は、上記 (B)成分を含むことにより、例えば 350°C以上 の高温焼成を行うことなくシリカ系被膜を形成することができる。これにより、シリカ系 被膜形成用組成物を塗布した後の加熱 (例えば、乾燥、焼成)を簡略ィ匕することがで きる。 [0024] By including the component (B), the composition for forming a silica-based film can form a silica-based film without firing at a high temperature of, for example, 350 ° C or higher. Thereby, heating (for example, drying and baking) after applying the composition for forming a silica-based film can be simplified.
[0025] また、上記の(B)成分を含むことにより、フッ酸等に対する耐薬品性を向上させるこ とがでさる。  [0025] Further, by including the component (B), chemical resistance against hydrofluoric acid and the like can be improved.
[0026] このような物質として、熱酸発生剤又は熱塩基発生剤を挙げることができる。熱酸発 生剤としては、特に限定されるものではないが、 2, 4, 4, 6—テトラブロモシクロへキ サジェノン、ベンゾイントシレート、 2— -トロべンジルトシレート、有機スルホン酸の他 のアルキルエステル等を用いることができる。具体的には、スルホ -ゥム塩、ョードニ ゥム塩、ベンゾチアゾニゥム塩、アンモニゥム塩、ホスホニゥム塩等の才ニゥム塩等が 挙げられる。中でも特に、ョードニゥム塩、スルホ -ゥム塩及びべンゾチアゾ-ゥム塩 であることが好まし 、。スルホ -ゥム塩及びべンゾチアゾ-ゥム塩の具体例としては、 例えば、 4ーァセトキシフエ-ルジメチルスルホ -ゥムへキサフルォロアルセネート、 ベンジルー 4ーヒドロキシフエ-ルメチルスルホ -ゥムへキサフルォロアンチモネート、 4ーァセトキシフエ-ルペンジルメチルスルホ -ゥムへキサフルォロアンチモネート、 ジベンジル 4—ヒドロキシフエ-ルスルホ -ゥムへキサフルォロアンチモネート、 4 - ァセトキシフエ-ルペンジルスルホ -ゥムへキサフルォロアンチモネート、 3—べンジ ルベンゾチアゾリゥムへキサフルォロアンチモネート等が挙げられる。  [0026] Examples of such substances include thermal acid generators and thermal base generators. The thermal acid generator is not particularly limited, but 2, 4, 4, 6-tetrabromocyclohexagenone, benzoin tosylate, 2--trobendiltosylate, and other alkyls of organic sulfonic acid. Esters can be used. Specific examples include sulphonium salts, iodine salts, benzothiazonium salts, ammonium salts, phosphonium salts, and the like. Of these, particularly preferred are ododonium salts, sulfo-salts and benzothiazo-salts. Specific examples of the sulfo-um salt and the benzothiazo-um salt include, for example, 4-acetoxyphenol dimethylsulfo-hexafluoroarsenate, benzyl 4-hydroxyphenol methylsulfo-hexafluoro Antimonate, 4-acetoxyphenol pendylmethylsulfo-hexafluoroantimonate, dibenzyl 4-hydroxyphenolsulfo-hexafluoroantimonate, 4-acetoxyphenol pendylsulfo-hexaflux Examples include oloantimonate and 3-benzylbenzothiazolium hexafluoroantimonate.
[0027] また、熱塩基発生剤としては、特に限定されるものではないが、 1—メチル 1— (4 —ビフエ-ルイル)ェチルカルバメート、 1, 1—ジメチルー 2—シァノエチルカルバメ ート等の力ルバメート誘導体、尿素や N, N ジメチルー N' メチル尿素等の尿素 誘導体、 1, 4ージヒドロニコチンアミド等のジヒドロピリジン誘導体、有機シランや有機 ボランの四級化アンモ-ゥム塩、ジシアンジアミド等が用いられる。その他に、トリクロ 口酢酸グァ-ジン、トリクロ口酢酸メチルダァ-ジン、トリクロ口酢酸カリウム、フエ-ルス ルホニル酢酸グァ-ジン、 p クロ口フエ-ルスルホ-ル酢酸グァ-ジン、 p—メタンス ルホ -ルフヱ-ルスルホ-ル酢酸グァ-ジン、フヱ -ルプロピオール酸カリウム、フエ -ルプロピオール酸グァ-ジン、フエ-ルプロピオール酸セシウム、 p—クロ口フエ- ルプロピオール酸グァ-ジン、 p -フエ-レン ビス フエ-ルプロピオール酸グァ- ジン、フエ-ルスルホ-ル酢酸テトラメチルアンモ-ゥム、フエ-ルプロピオール酸テト ラメチルアンモ -ゥム等が挙げられる。 [0027] The thermal base generator is not particularly limited, but 1-methyl 1- (4 —Biphenyl-ethyl) ethyl carbamate, forceful rubamate derivatives such as 1,1-dimethyl-2-cyanoethylcarbamate, urea derivatives such as urea and N, N-dimethyl-N'methylurea, 1,4-dihydronicotine Dihydropyridine derivatives such as amides, quaternized ammonium salts of organic silanes and organic boranes, dicyandiamide and the like are used. In addition, trichlorodiethyl acetate guanidine, trichlorodimethylacetate acetate, potassium trichlorodiacetate, phenylsulfonylacetate guanidine, p-diphenylsulfolacetate guanidine, p-methanesulfursulfate -Lusulfol acetate guanidine, phenol-potassium propylpropiolate, guanidine propylpropiolate, cesium ferropropiolate, p-chlorophenol guanidine propylpropiolate, p-phthalene bisphenol Examples include guanidine lupropiolic acid, tetramethylammonium phenolsulfol acetate, and tetramethylammonium phenolpropiolate.
[0028] これらの中でも、特に、下記化学式 (b— 1)及び下記化学式 (b— 2)で表される化合 物を用いることが好ましい。  Among these, it is particularly preferable to use a compound represented by the following chemical formula (b-1) and the following chemical formula (b-2).
[0029] [化 2]  [0029] [Chemical 2]
Figure imgf000007_0001
Figure imgf000007_0001
[0030] [化 3] [0030] [Chemical 3]
Figure imgf000008_0001
Figure imgf000008_0001
[0031] また、これらの酸又は塩基を発生する化合物は、 1種を単独で用いてもよ!、し、 2種 以上を組み合わせて用いてもょ 、。  [0031] Further, these compounds generating an acid or a base may be used alone or in combination of two or more.
[0032] (B)成分の含有量は、(A)成分の SiO換算質量に対して、 0. 1質量%以上 20質 [0032] The content of the component (B) is 0.1% by mass or more and 20 quality with respect to the SiO equivalent mass of the component (A).
2  2
量%以下であることが好ましぐより好ましくは、 0. 5質量%以上 15質量%以下であ ることが好ましい。(B)成分を上記範囲とすることで、シリカ系被膜形成用組成物の経 時安定性を向上させることができる。  More preferably, the amount is 0.5% by mass or more and 15% by mass or less. By setting the component (B) within the above range, the temporal stability of the composition for forming a silica-based film can be improved.
[0033] <その他成分 > [0033] <Other ingredients>
(界面活性剤)  (Surfactant)
本発明のシリカ系被膜形成用組成物には、界面活性剤を配合することが好ましい。 界面活性剤の存在により、基板に対する塗布性、展開性を向上させることが可能とな る。  It is preferable to mix | blend surfactant with the composition for silica-type film formation of this invention. Due to the presence of the surfactant, it is possible to improve the coatability and spreadability on the substrate.
[0034] (溶剤)  [0034] (Solvent)
本発明のシリカ系被膜形成用組成物は、塗布性および膜厚均一性を向上させる目 的で、溶剤を含むことが好ましい。この溶剤としては、従来より一般的に使用されてい る有機溶剤が使用できる。具体例としては、メチルアルコール、エチルアルコール、 プロピルアルコール、ブチルアルコール、 3—メトキシー 3—メチルー 1ーブタノール、 3ーメトキシ 1 ブタノールのような一価アルコール;メチル 3—メトキシプロビオネ ート、ェチルー 3—エトキシプロピオネートのようなアルキルカルボン酸エステル;ェチ レングリコール、ジエチレングリコール、プロピレングリコールのような多価アルコール ;エチレングリコーノレモノメチノレエーテノレ、エチレングリコーノレモノェチノレエーテノレ、ェ チレングリコーノレモノプロピノレエーテノレ、エチレングリコーノレモノブチノレエーテノレ、プ ロピレングリコーノレモノメチノレエーテノレ、プロピレングリコーノレモノェチノレエーテノレ、プ ロピレングリコーノレモノプロピノレエーテノレ、プロピレングリコーノレモノブチノレエーテノレ、 エチレングリコーノレモノメチノレエーテノレアセテート、エチレングリコーノレモノェチノレエ 一テルアセテート、プロピレングリコールモノメチルエーテルアセテート、プロピレング リコールモノェチルエーテルアセテートのような多価アルコール誘導体;酢酸、プロピ オン酸のような脂肪酸;アセトン、メチルェチルケトン、 2—へプタノンのようなケトンな どを挙げることができる。これらの中でも、アルコール系、グリコール系の溶剤が好まし く用いられる。また、これらの有機溶剤は、単独で用いてもよいし 2種以上組み合わせ て用いてもよい。 The composition for forming a silica-based film of the present invention preferably contains a solvent for the purpose of improving coating properties and film thickness uniformity. As this solvent, an organic solvent generally used conventionally can be used. Specific examples include monohydric alcohols such as methyl alcohol, ethyl alcohol, propyl alcohol, butyl alcohol, 3-methoxy-3-methyl-1-butanol, 3-methoxy-1-butanol; methyl 3-methoxypropionate, ethyl 3-ethoxy Alkyl carboxylic acid esters such as propionate; polyhydric alcohols such as ethylene glycol, diethylene glycol, and propylene glycol; ethylene glycol monomethino enoenoate, ethylene glycol monometheno enoenoate, Tylene glycol monopropinoreateol, ethylene glycol monobutinoleatenore, propylene glyconole monomethinoatenore, propylene glycolenomonotenoleatenore, propylene glycolenomonopropenoatenore, propylene glycol Polyhydric alcohol derivatives such as Noremonobutinoreethenole, Ethylene Glycoleomonomethenoleetenore Acetate, Ethylene Glycoleo Monoethylenoleate Monoteracetate, Propylene Glycol Monomethyl Ether Acetate, Propylene Glycol Monoethyl Ether Acetate; Examples include fatty acids such as acetic acid and propionic acid; ketones such as acetone, methyl ethyl ketone, and 2-heptanone. Of these, alcohol solvents and glycol solvents are preferably used. These organic solvents may be used alone or in combination of two or more.
[0035] この溶剤の量は、特に限定されるものではないが、溶剤以外の成分(固形分)の濃 度が 5〜: LOO質量%になるようにすることが好ましぐ 20〜50質量%になるようにする ことがより好ましい。この範囲にすることにより塗布性を向上させることができる。  [0035] The amount of the solvent is not particularly limited, but it is preferable that the concentration of components (solid content) other than the solvent is 5 to: LOO mass% 20 to 50 mass % Is more preferable. By making it in this range, the coatability can be improved.
[0036] (その他)  [0036] (Other)
また、本発明においては、本発明の効果を損なわない範囲で、その他の榭脂、添 加剤等を配合することが可能である。  Further, in the present invention, other resin, additives, and the like can be blended within a range that does not impair the effects of the present invention.
[0037] 《シリカ系被膜の形成方法〉〉  [0037] << Method for Forming Silica Film >>
シリカ系被膜の形成方法としては、まず、シリカ系被膜形成用組成物を基板上に塗 布する。基板上にシリカ系被膜形成用組成物を塗布する方法としては、例えば、スプ レー法、スピンコート法、ディップコート法、ロールコート法など、任意の方法を用いる ことができるが、通常スピンコート法が用いられる。  As a method for forming a silica-based coating, first, a composition for forming a silica-based coating is applied on a substrate. As a method for applying the composition for forming a silica-based film on the substrate, for example, any method such as a spray method, a spin coat method, a dip coat method, a roll coat method can be used. Is used.
[0038] 次に、基板上に塗布されたシリカ系被膜形成用組成物を加熱処理する。加熱処理 は、その手段、温度、時間などについては特に制限されないが、一般的には、 80〜3 00°C程度のホットプレート上で 1〜6分間程度加熱すればよい。  [0038] Next, the silica-based film-forming composition applied on the substrate is heat-treated. The heat treatment is not particularly limited with respect to its means, temperature, time, etc. In general, it may be performed on a hot plate at about 80 to 300 ° C. for about 1 to 6 minutes.
[0039] 本発明のシリカ系被膜形成用組成物によれば、加熱処理により加熱することで、酸 または塩基が発生する。この発生した酸又は塩基により加水分解が促進されるため、 アルコキシ基が水酸基となり、アルコールが生成する。その後、アルコールの 2分子 が縮合することにより、 Si— O— Siのネットワークが形成されるため、加熱処理により、 緻密なシリカ系被膜を得ることができる。 [0039] According to the composition for forming a silica-based film of the present invention, an acid or a base is generated by heating with a heat treatment. Hydrolysis is promoted by the generated acid or base, so that the alkoxy group becomes a hydroxyl group and alcohol is generated. After that, the two molecules of alcohol condense and a Si-O-Si network is formed. A dense silica-based film can be obtained.
[0040] また、加熱処理は、好ましくは、 3段階以上、段階的に昇温することが好ましい。具 体的には、大気中または窒素などの不活性ガス雰囲気下、 60〜150°C程度のホット プレート上で 30秒〜 2分間程度第 1回目の加熱処理を行ったのち、 100〜220°C程 度で 30秒〜 2分間程度第 2回目の加熱処理を行い、さらに 150〜300°C程度で 30 秒〜 2分間程度第 3回目の加熱処理を行う。このように 3段階以上、好ましくは 3〜6 段階程度の段階的な加熱処理を行うことにより、より低い温度で、シリカ系被膜の形 成をすることができる。  [0040] In addition, the heat treatment is preferably performed in three steps or more and in steps. Specifically, after the first heat treatment for about 30 seconds to 2 minutes on a hot plate at about 60 to 150 ° C in the atmosphere or an inert gas atmosphere such as nitrogen, 100 to 220 ° The second heat treatment is performed for about 30 seconds to 2 minutes at about C, and the third heat treatment is performed for about 30 seconds to 2 minutes at about 150 to 300 ° C. Thus, by performing stepwise heat treatment of three or more steps, preferably about 3 to 6 steps, a silica-based film can be formed at a lower temperature.
実施例  Example
[0041] 次に、本発明を実施例に基づいて更に詳細に説明するが、本発明はこれに限定さ れるものではない。  Next, the present invention will be described in more detail based on examples, but the present invention is not limited thereto.
[0042] <実施例 1 >  [Example 1]
トリアルコキシシランの加水分解生成物を主成分とするスピンオンガラス材料 (OCD T- 12 1000V (商品名):東京応化工業 (株)製、 SiO換算固形分濃度: 7質量  Spin-on glass material based on trialkoxysilane hydrolysis product (OCD T-12 1000V (trade name): Tokyo Ohka Kogyo Co., Ltd., SiO equivalent solid content: 7 mass
2  2
%)に対し、上記化合物 (b— 1)をスピンオンガラス材料中の固形分に対して 7. 5質 量%となるように添加して、シリカ系被膜形成用組成物を製造した。 6インチのシリコ ンウェハ上に、シリカ系被膜形成用組成物をコーター(SS8261NUU :東京応化工 業 (株)製)を用いて回転数 lOOOrpmにて塗布した。次にホットプレート上で、 80°C で 60秒間、 150°Cで 60秒間、 200°Cで 60秒間加熱を行い、シリカ系被膜を形成し た。  %)), The above-mentioned compound (b-1) was added so as to be 7.5% by mass with respect to the solid content in the spin-on glass material to produce a composition for forming a silica-based film. A composition for forming a silica-based film was applied on a 6-inch silicon wafer using a coater (SS8261NUU: manufactured by Tokyo Ohka Kogyo Co., Ltd.) at a rotation speed of lOOOOrpm. Next, heating was performed on a hot plate at 80 ° C. for 60 seconds, 150 ° C. for 60 seconds, and 200 ° C. for 60 seconds to form a silica-based film.
[0043] <実施例 2>  <Example 2>
テトラメトキシシラン Zモノメチルトリメトキシシラン = 1/1 (モル比)の加水分解生成 物を含有するスピンオンガラス材料 (OCD T- 7 7000WK80A (商品名):東京応 化工業 (株)製、 SiO換算固形分濃度: 7質量%)に対し、上記化合物 (b— 1)をスピ  Spin-on glass material containing hydrolysis product of tetramethoxysilane Z monomethyltrimethoxysilane = 1/1 (molar ratio) (OCD T-7 7000WK80A (trade name): manufactured by Tokyo Ohka Kogyo Co., Ltd., SiO converted solid The concentration of the compound (b-1) is
2  2
ンオンガラス材料中の固形分に対して 7質量%となるように添加して、シリカ系被膜形 成用組成物を製造した。 6インチのシリコンウェハ上に、シリカ系被膜形成用組成物 をコーター (SS8261NUU:東京応化工業 (株)製)を用いて回転数 lOOOrpmにて 塗布した。次にホットプレート上で、 300°Cで 60秒間加熱を行い、シリカ系被膜を形 成した。 A silica-based film forming composition was produced by adding 7% by mass with respect to the solid content in the non-on glass material. The composition for forming a silica-based film was applied onto a 6-inch silicon wafer at a rotational speed of lOOOOrpm using a coater (SS8261NUU: manufactured by Tokyo Ohka Kogyo Co., Ltd.). Next, heat on a hot plate at 300 ° C for 60 seconds to form a silica coating. Made.
[0044] <比較例 1 >  [0044] <Comparative Example 1>
OCD T- 12 1000Vを用い、実施例 1と同様の方法によりシリカ系被膜を製造し た。  A silica-based film was produced in the same manner as in Example 1 using OCD T-12 1000V.
[0045] <比較例 2>  [0045] <Comparative Example 2>
比較例 1において、加熱後、更に窒素雰囲気下で 400°Cで焼成を行い、シリカ系 被膜を形成した。  In Comparative Example 1, after heating, firing was further performed at 400 ° C. in a nitrogen atmosphere to form a silica-based film.
[0046] <比較例 3 >  [Comparative Example 3]
OCD T- 7 7000WK80Aを用い、実施例 2と同様の方法によりシリカ系被膜を 形成した。  A silica-based film was formed in the same manner as in Example 2 using OCD T-7 7000WK80A.
[0047] <比較例 4> >  [0047] <Comparative Example 4>>
比較例 3において、加熱後、更に窒素雰囲気下で 400°Cで焼成を行い、シリカ系 被膜を形成した。  In Comparative Example 3, after heating, firing was further performed at 400 ° C. in a nitrogen atmosphere to form a silica-based film.
[0048] <成膜性評価 >  [0048] <Filmability evaluation>
成膜性評価は、 丁—1!^ 丁11^—615 (商品名):日本分光株式会社製)を用いて 行った。実施例 1及び比較例 1、 2は、 Si— O結合のピーク面積と Si— H結合のピー ク面積との比により評価を行った。また、実施例 2及び比較例 3、 4は、 Si— O結合の ピーク面積と Si— C結合のピーク面積との比により評価を行った。なお、 FT— IRのチ ヤートにおいて、 1050cm_1近辺のピークが Si— O結合、 2250cm_1近辺のピーク が Si— H結合、 1275cm_ 1近辺のピークが Si— C結合を示す。結果を表 1及び表 2 に示す。また、実施例 1の FT— IRのチャートを図 1に、比較例 1の FT— IRのチャート を図 2に、実施例 2の FT— IRのチャートを図 3に、比較例 3の FT— IRのチャートを図 4に示す。 The film-formability evaluation was performed using Ding-1! ^ Ding 11 ^ -615 (trade name) manufactured by JASCO Corporation. Example 1 and Comparative Examples 1 and 2 were evaluated based on the ratio of the peak area of Si—O bond to the peak area of Si—H bond. Further, Example 2 and Comparative Examples 3 and 4 were evaluated based on the ratio of the peak area of the Si—O bond and the peak area of the Si—C bond. Incidentally, FT-shows in the IR Ji Yato, peak Si- O bond 1050 cm _1 around, 2250 cm peak near _1 Si- H bond, the peak of 1275 cm _ 1 near the Si- C bond. The results are shown in Tables 1 and 2. Also, the FT-IR chart of Example 1 is shown in FIG. 1, the FT-IR chart of Comparative Example 1 is shown in FIG. 2, the FT-IR chart of Example 2 is shown in FIG. 3, and the FT-IR chart of Comparative Example 3 is shown. Figure 4 shows the IR chart.
[0049] [表 1]  [0049] [Table 1]
Si-O/Si -H Si-O / Si -H
麵列 1 4591 3. 756  Row 1 4591 3.756
幽列 1 4325 2. 364  Ghost 1 4325 2. 364
賺列 2 4221 3. 164 [0050] [表 2] Row 2 4221 3.164 [0050] [Table 2]
Figure imgf000012_0001
Figure imgf000012_0001
[0051] 表 1、表 2より、添加剤 (ィ匕合物 (b— 1) )をカ卩えな力つた比較例 1、比較例 3に比べ 添加剤をカ卩えた実施例 1、 2は、 200°C以下の加熱により、 Si— O— Siのネットワーク が形成されていることが確認できた。また、 400°Cで焼成を行った比較例 2、 4と比べ ても Si— OZSi—Hの比が高ぐ焼成を行った場合と同等以上の Si— O— Siのネット ワークが形成されて ヽることが確認できた。  [0051] From Tables 1 and 2, Examples 1 and 2 in which the additive was added compared to Comparative Example 1 and Comparative Example 3 in which the additive (Compound (b-1)) was used It was confirmed that a Si-O-Si network was formed by heating below 200 ° C. In addition, compared to Comparative Examples 2 and 4, which were fired at 400 ° C, a Si-O-Si network was formed that was equivalent to or better than when fired at a higher Si-OZSi-H ratio. I was able to confirm.
[0052] さらに、上記実施例 2、比較例 3のシリカ系被膜について、 3質量0 /0濃度のノッファ 一ドフッ酸 (BHF)に対する耐性を、上記シリカ系被膜上に BHFを塗布した後の時間 に対する膜べり量を測定することにより確認した。その結果を図 5に示す。 [0052] Furthermore, the second embodiment, the silica-based film of Comparative Example 3, 3 parts by mass 0/0 resistance Noffa for one Dofu' (BHF) acid concentration, time after applying the BHF onto the silica-based film It confirmed by measuring the amount of film | membrane slips with respect to. The results are shown in Fig. 5.
図 5よりわ力るように、比較例 3と比べて実施例 2の被膜は薬品耐性が高いことが確 認できた。  As shown in FIG. 5, it was confirmed that the coating of Example 2 had higher chemical resistance than Comparative Example 3.

Claims

請求の範囲 The scope of the claims
シロキサンポリマー (A)と、熱の作用により酸又は塩基を発生する化合物(B)と、を 含有してなるシリカ系被膜形成用組成物。  A composition for forming a silica-based film, comprising: a siloxane polymer (A); and a compound (B) that generates an acid or a base by the action of heat.
前記酸又は塩基を発生する化合物(B)力 100°C以上 300°C以下で酸または塩 基を発生する化合物である請求項 1記載のシリカ系被膜形成用組成物。  2. The composition for forming a silica-based film according to claim 1, which is a compound capable of generating an acid or a base at a force of 100 ° C. or higher and 300 ° C. or lower.
前記酸又は塩基を発生する化合物 (B)が、下記構造式 (b— 1)、又は (b— 2)で表 される化合物である請求項 1又は 2記載のシリカ系被膜形成用組成物。  The composition for forming a silica-based film according to claim 1 or 2, wherein the compound (B) generating the acid or base is a compound represented by the following structural formula (b-1) or (b-2).
[化 1]  [Chemical 1]
Figure imgf000013_0001
Figure imgf000013_0001
[4] 前記酸又は塩基を発生する化合物 (B)の含有量が、(A)成分の SiO換算質量に  [4] The content of the compound (B) that generates the acid or base is the SiO equivalent mass of the component (A).
2 対して、 0. 1質量%以上 20質量%以下である請求項 1から 3いずれか記載のシリカ 系被膜形成用組成物。  2. The composition for forming a silica-based film according to claim 1, wherein the composition is 0.1% by mass or more and 20% by mass or less.
[5] 前記シロキサンポリマー (A)は、アルコキシシランの加水分解縮合物である請求項 1から 4いずれか記載のシリカ系被膜形成用組成物。 [6] 前記アルコキシシランは、下記一般式 (a)で示される化合物から選択される少なくと も 1種を含む請求項 5記載のシリカ系被膜形成用組成物。 [5] The composition for forming a silica-based film according to any one of [1] to [4], wherein the siloxane polymer (A) is a hydrolysis-condensation product of alkoxysilane. 6. The composition for forming a silica-based film according to claim 5, wherein the alkoxysilane contains at least one selected from compounds represented by the following general formula (a).
[化 3]  [Chemical 3]
R 1 n— S i ( O R 2 ) 4η · · · ( a ) R 1 n — S i (OR 2 ) 4η · · · (a)
(式中、 R1は、水素、炭素数 1から 20のアルキル基又はァリール基であり、 R2は 1価 の有機基であり、 nは、 0〜2の整数を示す。 ) (In the formula, R 1 is hydrogen, an alkyl group having 1 to 20 carbon atoms or an aryl group, R 2 is a monovalent organic group, and n is an integer of 0 to 2.)
[7] 請求項 1から 6 、ずれか記載のシリカ系被膜形成用組成物より得られるシリカ系被 膜。 [7] A silica-based film obtained from the composition for forming a silica-based film according to any one of claims 1 to 6.
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