WO2007099929A1 - Organic thin film depositing method and organic thin film depositing apparatus - Google Patents

Organic thin film depositing method and organic thin film depositing apparatus Download PDF

Info

Publication number
WO2007099929A1
WO2007099929A1 PCT/JP2007/053579 JP2007053579W WO2007099929A1 WO 2007099929 A1 WO2007099929 A1 WO 2007099929A1 JP 2007053579 W JP2007053579 W JP 2007053579W WO 2007099929 A1 WO2007099929 A1 WO 2007099929A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
thin film
organic thin
mask
vapor deposition
Prior art date
Application number
PCT/JP2007/053579
Other languages
French (fr)
Japanese (ja)
Inventor
Toshio Negishi
Koji Hane
Original Assignee
Ulvac, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac, Inc. filed Critical Ulvac, Inc.
Publication of WO2007099929A1 publication Critical patent/WO2007099929A1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • C23C14/566Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material

Definitions

  • the present invention relates to an organic thin film deposition method and an organic thin film deposition apparatus for forming, for example, a light emitting layer of an organic EL element.
  • a vacuum deposition apparatus has been used to form a light emitting layer of an organic EL element.
  • a pallet is used in order to efficiently deposit on many substrates.
  • the substrate and the mask are held on a simple carrier, and the vapor deposition is performed while moving as an integrated assembly.
  • Patent Document 1 JP-A-2005-85605
  • Patent Document 2 JP-A-2005-97655
  • the present invention has been made to solve the above-described problems of the conventional technology, and an object of the present invention is to provide an organic thin film vapor deposition method and an organic thin film vapor deposition apparatus that can reduce the installation area.
  • Another object of the present invention is to provide an organic thin film vapor deposition method and an organic thin film vapor deposition apparatus that can improve the alignment accuracy between the carrier and the substrate. Means for solving the problem
  • the present invention which has been made to achieve the above object, deposits an organic thin film on a substrate while the substrate carried in the vacuum chamber is held by a detachable carrier and sequentially conveyed.
  • the transport body in the vacuum chamber, the transport body is detached from the substrate after the deposition, and the transport body is returned to the deposition start position via the upper part of the deposition region, and the vacuum chamber A process of mounting a new substrate carried into the carrier on the carrier.
  • a light emitting layer for an organic EL element is formed on the substrate.
  • the present invention is an organic thin film vapor deposition apparatus that deposits an organic thin film on a substrate while holding the substrate carried in a vacuum chamber by a removable carrier and sequentially carrying the substrate.
  • a transport return unit that transports the transport body detached from the substrate after the completion of the deposition to the deposition start position via the upper part of the deposition region and the vicinity of the substrate carry-in port.
  • an alignment mechanism that aligns the substrate, a mask for forming a vapor deposition pattern, and the carrier from above and below can be provided.
  • a partition part can also be provided between the said vapor deposition area
  • the mask exchange carry-in port can be arranged in a region where the carrier is raised after the vapor deposition.
  • the carrier separated from the substrate after completion of the vapor deposition is returned to the vapor deposition start position via the upper part of the vapor deposition region.
  • the substrate and the carrier can be aligned from above and below, the alignment accuracy between the substrate and the carrier can be improved.
  • the vapor-deposited product can be obtained.
  • Various deposition patterns can be continuously formed while replacing a mask with a new mask.
  • the mask exchange carry-in port when the mask exchange carry-in port is disposed in a region where the carrier after the deposition is lifted, the substrate and the replacement mask are moved as the carrier is raised. You can put them together and put them together.
  • the structure of the mechanism part including the alignment mechanism can be simplified, and the alignment operation can be performed quickly and the tact time can be reduced.
  • an organic thin film deposition apparatus that has a small installation area and that can improve the alignment accuracy of the carrier and the substrate.
  • FIG. 1 is a schematic configuration diagram of an embodiment of an organic thin film forming apparatus of the present invention.
  • FIG. 2 is an overall operation explanatory diagram showing a method for forming an organic thin film using the same embodiment.
  • FIG. 3 (a) (b): An explanatory view showing the alignment operation of the substrate and the mask in the embodiment.
  • [FIG. 4] (a) (b): The alignment operation of the substrate and the mask in the embodiment.
  • FIG. 5 is an overall operation explanatory diagram showing the procedures for mask replacement and alignment in the same embodiment.
  • [FIG. 6] (a) (b): Operation illustrating mask exchange and alignment procedures in the same embodiment.
  • FIG. 7 (a) (b): Operation illustrating mask replacement and alignment procedures in the same embodiment.
  • FIG. 8 is a schematic configuration diagram of another embodiment of the organic thin film forming apparatus of the present invention.
  • FIG. 9 (a) (b): Explanatory drawing showing the alignment operation of the substrate and the mask in the same embodiment.
  • FIG. 1 is a schematic configuration diagram of an organic thin film forming apparatus according to the present embodiment
  • FIG. 2 is an overall operation explanatory view showing an organic thin film forming method using the same embodiment
  • FIGS. 4 (a) and 4 (b) are explanatory views showing the alignment operation of the substrate and the mask in the same embodiment.
  • an organic thin film forming apparatus 1 is an inline-type long vacuum vapor deposition apparatus, and has a vacuum chamber 2 connected to a vacuum exhaust system (not shown). And speak.
  • the vacuum chamber 2 is connected to the pretreatment chamber 3 at one end of the vacuum chamber 2. Then, the pretreated substrate 4 is loaded into the vacuum chamber 2 from the pretreatment chamber 3 through the substrate carry-in port 5! RU
  • the vacuum chamber 2 is connected to, for example, a sputtering chamber 13 at the other end of the vacuum chamber 2. Then, the vapor-deposited substrate 4 is carried into the processing chamber such as the sputtering chamber 13 from the vacuum chamber 2 through the substrate carry-out port 12.
  • the substrate 4 used in the present embodiment also has a transparent glass substrate force, for example, and a filter and a transparent electrode film (not shown) are laminated on the upper surface thereof.
  • An alignment mechanism 8 is provided at the substrate loading position 2 a in the vicinity of the substrate loading port 5 of the vacuum chamber 2. This alignment mechanism 8 filters the substrate 4 loaded from the substrate loading port 5.
  • the ret (conveyance body) 9 is configured to be mounted and held together with the mask 6 in the vertical (vertical) direction.
  • a mask carry-in port 7 for carrying in an unused replacement mask 6a is provided below the alignment mechanism 8 in the vacuum chamber 2.
  • the replacement mask 6a is carried into the external force vacuum chamber 2 in the horizontal direction (in the direction orthogonal to the paper surface in the figure) from the mask carry-in port 7, and is lifted by the carrying mechanism (not shown) to the alignment mechanism 8. I am starting to hand it over.
  • the pallet 9 is also a frame-shaped member that is larger than the substrate 4, and is provided with an opening (not shown) that is slightly smaller than the substrate 4.
  • the mask 6 has substantially the same size as the substrate 4 and is provided with openings (not shown) corresponding to the vapor deposition pattern. Then, the substrate 4 is mounted and held on the pallet 9 via the mask 6 and is transported as a substrate assembly 20 in one piece! / Speak.
  • a plurality of vapor deposition sources 10a to 10e are disposed in the lower part of the vacuum chamber 2.
  • a predetermined organic material (not shown) for forming the light emitting layer of the organic EL element is accommodated in each of the vapor deposition sources 10 a to 1 Oe.
  • the substrate 4 held on the pallet 9 together with the mask 6, that is, the substrate assembly 20 is provided.
  • the substrate is transported in the horizontal direction toward the substrate unloading port 12 via the deposition start position 2 c by a transport mechanism (not shown), and sequentially deposits the deposition region 11 on the deposition sources 10 a to 10 e. It is configured to pass.
  • a separation mechanism (not shown) for separating the substrate 4 and the vaporized replacement mask 6b from the pallet 9 is provided at the substrate removal position 2b in the vicinity of the substrate carry-out port 12 of the vacuum chamber 2.
  • the substrate 4 detached from the pallet 9 is transferred from the substrate carry-out port 12 to, for example, the sputtering chamber 13! /.
  • a mask carry-out port 14 for carrying out the deposited replacement mask 6b is provided below the substrate take-out position 2b.
  • a transport return unit 15 is provided in the upper part of the vacuum chamber 2.
  • the transport return unit 15 includes a transport mechanism 15a that also has, for example, roller force. And The pallet 9 and the mask 6 from which the substrate 4 has been detached and the mask 6 (only the pallet 9 when replacing the mask 6) are placed above the deposition region 11 (for example, the position immediately above) in the direction opposite to the deposition direction, that is, to the substrate carry-in entrance 5 It is comprised so that it may convey toward.
  • a partition 16 for preventing contamination is provided between the vapor deposition region 11 and the transport return unit 15.
  • a plurality of pallets 9 with masks 6 are arranged in advance on the above-described transport return unit 15.
  • the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in entrance 5 and placed at a position above the pallet 9 with the mask 6 of the alignment mechanism 8.
  • the substrate 4 and the mask 6 are made to face each other.
  • the substrate 4 and the mask 6 are aligned by the alignment mechanism 8, and the pallet 9 is moved upward to attach the substrate 4 and the mask 6 together as shown in FIG. 4 (a).
  • the board assembly 20 is assumed.
  • the substrate assembly 20 is moved to the deposition start position 2c, and a predetermined organic material is deposited on the surface of the substrate 4 through the mask 6.
  • the substrate 4 is detached from the pallet 9 with respect to the substrate assembly 20 that has reached the substrate extraction position 2b after vapor deposition, and this substrate 4 is removed from the substrate carry-out port 12 to the sputtering chamber 13. Transport to.
  • the pallet 9 with the mask 6 is moved above the substrate take-out position 2b, transferred to the carry-back unit 15, and conveyed toward the substrate carry-in position 2a.
  • a new substrate 4 is sequentially carried into the vacuum chamber 2, and the substrate 4 is mounted on the mask 6 on the pallet 9 in the above-described procedure, and the organic material is deposited via the deposition start position 2c.
  • the pallet 9 is transported to the board loading position 2a.
  • the above-described procedure is performed and the mask 6 is used a plurality of times. After that, replace it.
  • FIG. 5, FIG. 6 (a) (b) and FIG. 7 (a) (b) are operation explanatory views showing the procedures of mask replacement and alignment in the present embodiment.
  • the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2b.
  • the deposited replacement mask 6b is detached from the pallet 9 and carried out from the mask carry-out port 14 to the outside of the vacuum chamber 2.
  • the pallet 9 is moved above the substrate take-out position 2b, transferred to the transfer return unit 15, and transferred toward the substrate carry-in position 2a.
  • the pallet 9 positioned above the substrate loading position 2a is lowered and placed at the position below the alignment mechanism 8.
  • the replacement mask 6a is carried in from the mask carry-in port 7 in the horizontal direction, and as shown in FIG. 6 (b), the replacement mask 6a is raised in the vertical direction and then carried in the horizontal direction. Then, place it at a position above the pallet 9 of the alignment mechanism 8.
  • the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in entrance 5, and is disposed at a position above the mask 6 of the alignment mechanism 8, so that the substrate 4 Make mask 6 face each other.
  • the alignment mechanism 8 aligns the substrate 4 and the mask 6, and
  • the substrate assembly 20 is moved to the deposition start position 2c, and a predetermined organic material is deposited on the surface of the substrate 4 through the mask 6 as described above.
  • the pallet 9 (and the mask 6) from which the force of the substrate 4 after the vapor deposition is also released is transferred to the transport return unit above the vapor deposition region 11. Since the substrate 15 is returned to the substrate loading position 2a via 15, the area for returning the pallet 9 does not need to be provided adjacent to the vapor deposition area 11, thereby reducing the installation area of the vacuum chamber 2.
  • the alignment mechanism 8 that aligns the vertical force of the substrate 4, the mask 6, and the pallet 9 is provided, the alignment accuracy of the substrate 4 and the mask 6 is provided. Thus, a high-definition pattern can be formed on the substrate 4.
  • the partitioning portion 16 is provided between the vapor deposition region 11 and the transport return portion 15, the vaporization is performed without causing vapor contamination of the evaporation material. be able to.
  • the mask carry-in port 7 for carrying in the unused replacement mask 6a and the mask carry-out port 14 for carrying out the deposited exchange mask 6b are provided.
  • Various deposition patterns can be continuously formed while carrying in and replacing a new replacement mask 6a in place of the deposited replacement mask 6b.
  • the organic thin film deposition apparatus 1 for an organic EL element capable of continuously and rapidly forming a high-definition pattern with a small installation area of the vacuum chamber 2 is provided. Can be provided.
  • FIG. 8 and FIG. 9 (a) and (b) show other embodiments of the present invention.
  • parts corresponding to those of the above-described embodiments are denoted by the same reference numerals. Detailed description is omitted.
  • the organic thin film deposition apparatus 1 A of the present embodiment is configured by providing an alignment mechanism 8 above the substrate extraction position 2 b in the vacuum chamber 2.
  • a substrate carry-in port 17 for carrying the substrate 4 and a replacement mask 6a A mask inlet 7 is provided for carrying in.
  • the substrate carry-in port 17 is disposed above the mask carry-in port 7 and is configured to carry in the base 4 or the mask 6 in the horizontal direction, respectively.
  • a folded region 2d for lowering the substrate assembly 20 and transporting it to the deposition start position 2c is provided at a portion corresponding to the substrate carry-in position 2a of the above embodiment. ing.
  • the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2b.
  • the pallet 9 with the mask 6 is moved above the substrate take-out position 2b and placed below the alignment mechanism 8.
  • the substrate 4 is horizontally loaded into the vacuum chamber 2 from the upper substrate loading port 17, and Arrange the positioning mechanism 8 above the pallet 9 and make the substrate 4 and the mask 6 face each other.
  • the alignment mechanism 8 aligns the substrate 4 and the mask 6, as shown in Fig. 9 (b). In this way, the pallet 9 with the mask 6 is raised and the substrate 4 and the mask 6 are mounted together.
  • the substrate assembly 20 is moved to the deposition start position 2c via the folded region 18, and as described above, a predetermined organic material is deposited on the surface of the substrate 4 via the mask 6. I do.
  • the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2 b.
  • the deposited replacement mask 6b is detached from the pallet 9 and carried out from the mask outlet 14. Further, the pallet 9 is moved above the substrate take-out position 2b and disposed below the alignment mechanism 8.
  • the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in port 17, and the replacement mask 6 a including the mask carry-in port 7 is carried into the vacuum vessel 2. Then, the substrate 4 and the replacement mask 6a are arranged at a position above the pallet 9 of the alignment mechanism 8 so that the substrate 4 and the replacement mask 6a face each other.
  • the alignment mechanism 8 aligns the substrate 4 and the replacement mask 6a, and raises the pallet 9 to attach the substrate 4 and the replacement mask 6a together. Thereafter, the above-described substrate transfer and mask vapor deposition operations are performed.
  • the present embodiment having such a configuration, in addition to the same effects as those of the above-described embodiment, it is possible to align the substrate 4 and the mask 6 as the pallet 9 is raised.
  • the configuration of the mechanism portion including the alignment mechanism 8 can be simplified.
  • the alignment operation can be performed quickly to shorten the tact time.
  • the present invention can be applied not only to a vacuum vapor deposition apparatus for forming a light emitting layer of an organic EL element but also to various organic thin film forming apparatuses.
  • the present invention is applied to an apparatus for forming a light emitting layer of an organic EL element. Is the most effective.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

Provided is an organic thin film depositing method by which accuracy of aligning a carrier with a substrate can be improved. An organic thin film depositing apparatus is also provided. In the organic thin film forming apparatus, substrates (4) carried into a vacuum chamber (2) are held by removable pallets (9), and while successively transferring the substrates (4), organic thin films are formed by deposition on the substrates. A transferring return section (15) is provided between a substrate taking out position (2b) and a deposition start position (2c) in the vacuum chamber (2), for transferring the pallet (9) separated from the substrate (4) after deposition, to the deposition start position (2c) through an upper section of a deposition area (11). The substrate carry-in position (2a) in the vacuum chamber (2) is provided with the substrate (4), a mask (6) for forming a deposition pattern, and an aligning mechanism (8) for aligning the pallet (9) from the vertical direction.

Description

明 細 書  Specification
有機薄膜蒸着方法及び有機薄膜蒸着装置  Organic thin film deposition method and organic thin film deposition apparatus
技術分野  Technical field
[0001] 本発明は、例えば有機 EL素子の発光層を形成するための有機薄膜蒸着方法及 び有機薄膜蒸着装置に関する。  The present invention relates to an organic thin film deposition method and an organic thin film deposition apparatus for forming, for example, a light emitting layer of an organic EL element.
背景技術  Background art
[0002] 従来より、有機 EL素子の発光層を形成するのには真空蒸着装置が用いられている このような真空蒸着装置においては、多くの基板に対して効率良く蒸着するため、 パレットのような搬送体に基板とマスクを保持させ、一体の組立体として移動させなが ら蒸着を行うようにしている。  Conventionally, a vacuum deposition apparatus has been used to form a light emitting layer of an organic EL element. In such a vacuum deposition apparatus, in order to efficiently deposit on many substrates, a pallet is used. The substrate and the mask are held on a simple carrier, and the vapor deposition is performed while moving as an integrated assembly.
[0003] そして、蒸着が終了した時点で搬送体から基板を離脱させ、搬送体及びマスクを基 板搬入位置まで戻して再度利用することが行われている(例えば、特許文献 1、 2参 照)。 [0003] Then, when vapor deposition is completed, the substrate is detached from the carrier, and the carrier and the mask are returned to the substrate carry-in position and used again (for example, see Patent Documents 1 and 2). ).
[0004] し力しながら、このような従来技術にお!、ては、搬送体を戻す機構が大がかりになり 、その結果、装置の設置面積が大きくなつてしまうという問題がある。  [0004] However, such a conventional technique has a problem that the mechanism for returning the transport body becomes a large scale, and as a result, the installation area of the apparatus increases.
また、従来技術では、搬送体に基板を装着する際に位置合わせを行う必要がある 力 精度良く位置合わせを行うことは困難である。  In addition, in the prior art, it is necessary to perform alignment when mounting the substrate on the carrier. It is difficult to perform alignment with high accuracy.
特許文献 1:特開 2005— 85605  Patent Document 1: JP-A-2005-85605
特許文献 2:特開 2005 - 97655  Patent Document 2: JP-A-2005-97655
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0005] 本発明は、このような従来の技術の課題を解決するためになされたもので、設置面 積が小さくしうる有機薄膜蒸着方法及び有機薄膜蒸着装置を提供することを目的と する。 [0005] The present invention has been made to solve the above-described problems of the conventional technology, and an object of the present invention is to provide an organic thin film vapor deposition method and an organic thin film vapor deposition apparatus that can reduce the installation area.
また、本発明は、搬送体と基板の位置合わせ精度を向上させることが可能な有機 薄膜蒸着方法及び有機薄膜蒸着装置を提供することを目的とする。 課題を解決するための手段 Another object of the present invention is to provide an organic thin film vapor deposition method and an organic thin film vapor deposition apparatus that can improve the alignment accuracy between the carrier and the substrate. Means for solving the problem
[0006] 上記目的を達成するためになされた本発明は、真空槽内において搬入された基板 を着脱自在の搬送体によって保持して順次搬送しつつ当該基板上に有機薄膜の蒸 着形成を行う有機薄膜蒸着方法であって、前記真空槽内において、蒸着終了後の 基板から前記搬送体を離脱させ、当該搬送体を蒸着領域の上方を経由して蒸着開 始位置まで戻しつつ、当該真空槽内に搬入された新たな基板を当該搬送体に装着 する工程を有するものである。  [0006] The present invention, which has been made to achieve the above object, deposits an organic thin film on a substrate while the substrate carried in the vacuum chamber is held by a detachable carrier and sequentially conveyed. In the organic thin film deposition method, in the vacuum chamber, the transport body is detached from the substrate after the deposition, and the transport body is returned to the deposition start position via the upper part of the deposition region, and the vacuum chamber A process of mounting a new substrate carried into the carrier on the carrier.
本発明では、前記発明において、前記基板上に有機 EL素子用の発光層を形成す ることちでさる。  In the present invention, in the above invention, a light emitting layer for an organic EL element is formed on the substrate.
本発明は、真空槽内にお 、て搬入された基板を着脱自在の搬送体によって保持し て順次搬送しつつ当該基板上に有機薄膜の蒸着形成を行う有機薄膜蒸着装置であ つて、前記真空槽内に、蒸着終了後の基板から離脱させた前記搬送体を、蒸着領域 の上方及び基板搬入口近傍を経由して前記蒸着開始位置まで搬送する搬送戻し部 を有するものである。  The present invention is an organic thin film vapor deposition apparatus that deposits an organic thin film on a substrate while holding the substrate carried in a vacuum chamber by a removable carrier and sequentially carrying the substrate. In the tank, there is a transport return unit that transports the transport body detached from the substrate after the completion of the deposition to the deposition start position via the upper part of the deposition region and the vicinity of the substrate carry-in port.
本発明では、前記発明において、前記基板と、蒸着パターンを形成するためのマス クと、前記搬送体とを上下方向から位置合わせする位置合わせ機構を備えることもで きる。  According to the present invention, in the above invention, an alignment mechanism that aligns the substrate, a mask for forming a vapor deposition pattern, and the carrier from above and below can be provided.
本発明では、前記発明において、前記蒸着領域と前記搬送戻し部との間に仕切り 部を設けることもできる。  In this invention, in the said invention, a partition part can also be provided between the said vapor deposition area | region and the said conveyance return part.
本発明では、前記発明において、前記真空槽に、未使用の交換用マスクを当該真 空槽に搬入するためのマスク交換搬入口と、蒸着済の交換用マスクを当該真空槽か ら搬出するためのマスク交換搬出口を設けることもできる。  In the present invention, in the above invention, in order to carry out a mask replacement carry-in port for carrying an unused replacement mask into the vacuum chamber and a deposited replacement mask from the vacuum chamber in the vacuum chamber. It is also possible to provide a mask exchange carry-out port.
この場合、前記発明において、前記マスク交換搬入口を、蒸着終了後の前記搬送 体を上昇させる領域に配設することもできる。  In this case, in the present invention, the mask exchange carry-in port can be arranged in a region where the carrier is raised after the vapor deposition.
[0007] 本発明にあっては、真空槽内において、蒸着終了後の基板から離脱させた搬送体 を蒸着領域の上方を経由して蒸着開始位置まで戻すようにする。その結果、搬送体 を戻す領域を蒸着領域に隣接して設ける必要がなぐこれにより真空槽の設置面積 を小さくすることが可能になる。 [0008] また、本発明によれば、基板と搬送体とを上下方向から位置合わせを行うことがで きるので、基板と搬送体の位置合わせ精度を向上させることが可能になる。 [0007] In the present invention, in the vacuum chamber, the carrier separated from the substrate after completion of the vapor deposition is returned to the vapor deposition start position via the upper part of the vapor deposition region. As a result, it is not necessary to provide a region for returning the carrier adjacent to the vapor deposition region, thereby making it possible to reduce the installation area of the vacuum chamber. [0008] Further, according to the present invention, since the substrate and the carrier can be aligned from above and below, the alignment accuracy between the substrate and the carrier can be improved.
[0009] また、本発明にお 、て、基板と、搬送体と、蒸着パターンを形成するためのマスクと を上下方向から位置合わせする位置合わせ機構を備えた場合には、基板とマスクの 位置合わせ精度を向上させて高精細のパターンを形成することが可能になる。  [0009] In the present invention, in the case where an alignment mechanism for aligning the substrate, the carrier, and the mask for forming the vapor deposition pattern from the vertical direction is provided, the position of the substrate and the mask It is possible to improve the alignment accuracy and form a high-definition pattern.
[0010] さらに、本発明において、蒸着領域と搬送戻し部との間に仕切り部を設ければ、蒸 発材料の蒸気のコンタミネーシヨンを防止することが可能になる。  [0010] Further, in the present invention, if a partition is provided between the vapor deposition region and the transport return portion, it is possible to prevent vapor contamination of the vaporized material.
さらにまた、本発明において、未使用の交換用マスクを搬入するためのマスク交換 搬入口と、蒸着済の交換用マスクを搬出するためのマスク交換搬出口を真空槽に設 ければ、蒸着済のマスクに代えて新たなマスクを交換しつつ種々の蒸着パターンを 連続的に形成することができる。  Furthermore, in the present invention, if a mask exchange carry-in port for carrying in an unused replacement mask and a mask exchange carry-out port for carrying out a vapor-deposited replacement mask are provided in the vacuum chamber, the vapor-deposited product can be obtained. Various deposition patterns can be continuously formed while replacing a mask with a new mask.
さらにまた、本発明において、このマスク交換搬入口が、蒸着終了後の搬送体を上 昇させる領域に配設されている場合には、搬送体の上昇に伴って基板と交換用マス クをそれぞ; 立置合わせして合体装着させることができる。その結果、位置合わせ機 構を含む機構部分の構成を簡素化することができるとともに、位置合わせ動作を迅 速に行 、タクトタイムの短縮ィ匕を図ることができる。  Furthermore, in the present invention, when the mask exchange carry-in port is disposed in a region where the carrier after the deposition is lifted, the substrate and the replacement mask are moved as the carrier is raised. You can put them together and put them together. As a result, the structure of the mechanism part including the alignment mechanism can be simplified, and the alignment operation can be performed quickly and the tact time can be reduced.
このように、本発明によれば、真空槽の設置面積が小さぐ高精細のパターンを連 続的且つ迅速に形成可能な有機 EL素子用蒸着装置を提供することができる。 発明の効果  As described above, according to the present invention, it is possible to provide a vapor deposition apparatus for an organic EL element capable of continuously and rapidly forming a high-definition pattern having a small installation area of a vacuum chamber. The invention's effect
[0011] 本発明によれば、設置面積が小さぐかつ、搬送体と基板の位置合わせ精度を向 上させることが可能な有機薄膜蒸着装置を提供することができる。  [0011] According to the present invention, it is possible to provide an organic thin film deposition apparatus that has a small installation area and that can improve the alignment accuracy of the carrier and the substrate.
図面の簡単な説明  Brief Description of Drawings
[0012] [図 1]本発明の有機薄膜形成装置の実施の形態の概略構成図  FIG. 1 is a schematic configuration diagram of an embodiment of an organic thin film forming apparatus of the present invention.
[図 2]同実施の形態を用いた有機薄膜形成方法を示す全体動作説明図  FIG. 2 is an overall operation explanatory diagram showing a method for forming an organic thin film using the same embodiment.
[図 3] (a) (b):同実施の形態における基板とマスクの位置合わせ動作を示す説明図 [図 4] (a) (b):同実施の形態における基板とマスクの位置合わせ動作を示す説明図 [図 5]同実施の形態におけるマスク交換及び位置合わせの手順を示す全体動作説 明図 [図 6] (a) (b):同実施の形態におけるマスク交換及び位置合わせの手順を示す動作 説明図 [Fig. 3] (a) (b): An explanatory view showing the alignment operation of the substrate and the mask in the embodiment. [FIG. 4] (a) (b): The alignment operation of the substrate and the mask in the embodiment. FIG. 5 is an overall operation explanatory diagram showing the procedures for mask replacement and alignment in the same embodiment. [FIG. 6] (a) (b): Operation illustrating mask exchange and alignment procedures in the same embodiment.
[図 7] (a) (b):同実施の形態におけるマスク交換及び位置合わせの手順を示す動作 説明図  [FIG. 7] (a) (b): Operation illustrating mask replacement and alignment procedures in the same embodiment.
[図 8]本発明の有機薄膜形成装置の他の実施の形態の概略構成図  FIG. 8 is a schematic configuration diagram of another embodiment of the organic thin film forming apparatus of the present invention.
[図 9] (a) (b):同実施の形態における基板とマスクの位置合わせ動作を示す説明図 符号の説明  [FIG. 9] (a) (b): Explanatory drawing showing the alignment operation of the substrate and the mask in the same embodiment.
[0013] 1……有機薄膜形成装置 2……真空槽 2a……基板搬入位置 2b……基板 取出位置 2c……蒸着開始位置 4……基板 5……基板搬入口 6……マスク 8……位置合わせ機構 9……パレット (搬送体) 10a〜10e……蒸着源 11 ……蒸着領域 15……搬送戻し部 16……仕切り部 20……基板組立体 発明を実施するための最良の形態  [0013] 1 …… Organic thin film forming equipment 2 …… Vacuum chamber 2a …… Substrate carry-in position 2b …… Substrate take-out position 2c …… Deposition start position 4 …… Substrate 5 …… Substrate carry-in port 6 …… Mask 8 …… Alignment mechanism 9 …… Pallet (conveyance body) 10a ~ 10e …… Deposition source 11 …… Deposition region 15 …… Conveying return part 16 …… Partition part 20 …… Substrate assembly Best mode for carrying out the invention
[0014] 以下、本発明の実施の形態を図面を参照して詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
図 1は、本実施の形態に係る有機薄膜形成装置の概略構成図、図 2は、同実施の 形態を用いた有機薄膜形成方法を示す全体動作説明図、図 3 (a) (b)及び図 4 (a) ( b)は、同実施の形態における基板とマスクの位置合わせ動作を示す説明図である。  FIG. 1 is a schematic configuration diagram of an organic thin film forming apparatus according to the present embodiment, FIG. 2 is an overall operation explanatory view showing an organic thin film forming method using the same embodiment, and FIGS. 4 (a) and 4 (b) are explanatory views showing the alignment operation of the substrate and the mask in the same embodiment.
[0015] 図 1に示すように、本実施の形態の有機薄膜形成装置 1は、インライン型の長尺の 真空蒸着装置で、図示しな!ヽ真空排気系に接続された真空槽 2を有して ヽる。 As shown in FIG. 1, an organic thin film forming apparatus 1 according to the present embodiment is an inline-type long vacuum vapor deposition apparatus, and has a vacuum chamber 2 connected to a vacuum exhaust system (not shown). And speak.
この真空槽 2は、真空槽 2の一方の端部にお 、て仕込み前処理室 3に接続されて いる。そして、前処理済みの基板 4が、前処理室 3から基板搬入口 5を介して真空槽 2内に搬入されるように構成されて!、る。  The vacuum chamber 2 is connected to the pretreatment chamber 3 at one end of the vacuum chamber 2. Then, the pretreated substrate 4 is loaded into the vacuum chamber 2 from the pretreatment chamber 3 through the substrate carry-in port 5! RU
また、真空槽 2は、真空槽 2の他方の端部において例えばスパッタリング室 13に接 続されている。そして、蒸着済みの基板 4が、真空槽 2から基板搬出口 12を介して例 えばスパッタリング室 13等の処理室内に搬入されるように構成されている。  The vacuum chamber 2 is connected to, for example, a sputtering chamber 13 at the other end of the vacuum chamber 2. Then, the vapor-deposited substrate 4 is carried into the processing chamber such as the sputtering chamber 13 from the vacuum chamber 2 through the substrate carry-out port 12.
なお、本実施の形態に用いる基板 4は例えば透明なガラス基板力もなるもので、そ の上面には図示しないフィルターと透明電極膜が積層形成されている。  Note that the substrate 4 used in the present embodiment also has a transparent glass substrate force, for example, and a filter and a transparent electrode film (not shown) are laminated on the upper surface thereof.
[0016] 真空槽 2の上記基板搬入口 5近傍の基板搬入位置 2aには、位置合わせ機構 8が 設けられている。この位置合わせ機構 8は、基板搬入口 5から搬入された基板 4をパ レット (搬送体) 9にマスク 6とともに上下 (鉛直)方向に位置合わせして装着保持する ように構成されている。 An alignment mechanism 8 is provided at the substrate loading position 2 a in the vicinity of the substrate loading port 5 of the vacuum chamber 2. This alignment mechanism 8 filters the substrate 4 loaded from the substrate loading port 5. The ret (conveyance body) 9 is configured to be mounted and held together with the mask 6 in the vertical (vertical) direction.
[0017] 本実施の形態の場合、真空槽 2内の位置合わせ機構 8の下方には、未使用の交換 用マスク 6aを搬入するためのマスク搬入口 7が設けられて 、る。  In the case of the present embodiment, a mask carry-in port 7 for carrying in an unused replacement mask 6a is provided below the alignment mechanism 8 in the vacuum chamber 2.
ここでは、マスク搬入口 7から水平方向(図中紙面に対して直交する方向)に交換用 マスク 6aを外部力 真空槽 2内に搬入し、図示しない搬送機構によって上昇させて 位置合わせ機構 8に受け渡すようになつている。  Here, the replacement mask 6a is carried into the external force vacuum chamber 2 in the horizontal direction (in the direction orthogonal to the paper surface in the figure) from the mask carry-in port 7, and is lifted by the carrying mechanism (not shown) to the alignment mechanism 8. I am starting to hand it over.
[0018] 本実施の形態の場合、パレット 9は基板 4より大きい枠状の部材カもなり、基板 4より 若干小さな開口部(図示せず)が設けられている。また、マスク 6は基板 4とほぼ同等 の大きさを有し、蒸着パターンに対応する開口部(図示せず)が設けられている。 そして、パレット 9上にマスク 6を介して基板 4を装着保持し、基板組立体 20として一 体的に搬送されるようになって!/ヽる。 In the present embodiment, the pallet 9 is also a frame-shaped member that is larger than the substrate 4, and is provided with an opening (not shown) that is slightly smaller than the substrate 4. The mask 6 has substantially the same size as the substrate 4 and is provided with openings (not shown) corresponding to the vapor deposition pattern. Then, the substrate 4 is mounted and held on the pallet 9 via the mask 6 and is transported as a substrate assembly 20 in one piece! / Speak.
[0019] 真空槽 2内の下部には、複数の蒸着源 10a〜10eが配設されている。各蒸着源 10 a〜 1 Oe内には、有機 EL素子の発光層を形成するための所定の有機材料 (図示せ ず)が収容されている。 A plurality of vapor deposition sources 10a to 10e are disposed in the lower part of the vacuum chamber 2. A predetermined organic material (not shown) for forming the light emitting layer of the organic EL element is accommodated in each of the vapor deposition sources 10 a to 1 Oe.
[0020] そして、マスク 6とともにパレット 9に保持された基板 4、すなわち、基板組立体 20が [0020] Then, the substrate 4 held on the pallet 9 together with the mask 6, that is, the substrate assembly 20 is provided.
、位置合わせ機構 8の位置から、図示しない搬送機構によって蒸着開始位置 2cを介 して基板搬出口 12に向って水平方向に搬送され、順次蒸着源 10a〜10e上の蒸着 領域 11を直線状に通過するように構成されて ヽる。 From the position of the alignment mechanism 8, the substrate is transported in the horizontal direction toward the substrate unloading port 12 via the deposition start position 2 c by a transport mechanism (not shown), and sequentially deposits the deposition region 11 on the deposition sources 10 a to 10 e. It is configured to pass.
[0021] 真空槽 2の基板搬出口 12の近傍の基板取出位置 2bには、パレット 9から基板 4と蒸 着済交換用マスク 6bを離脱させる分離機構 (図示せず)が設けられている。 A separation mechanism (not shown) for separating the substrate 4 and the vaporized replacement mask 6b from the pallet 9 is provided at the substrate removal position 2b in the vicinity of the substrate carry-out port 12 of the vacuum chamber 2.
[0022] ここで、パレット 9から離脱された基板 4は基板搬出口 12から例えばスパッタリング 室 13に移送されるようになって!/、る。 Here, the substrate 4 detached from the pallet 9 is transferred from the substrate carry-out port 12 to, for example, the sputtering chamber 13! /.
また、この基板取出位置 2bの下部には、蒸着済交換用マスク 6bを搬出するための マスク搬出口 14が設けられている。  Further, a mask carry-out port 14 for carrying out the deposited replacement mask 6b is provided below the substrate take-out position 2b.
[0023] 一方、本実施の形態においては、真空槽 2内の上部分に搬送戻し部 15が設けられ ている。 On the other hand, in the present embodiment, a transport return unit 15 is provided in the upper part of the vacuum chamber 2.
この搬送戻し部 15は、例えばローラ等力もなる搬送機構 15aを有している。そして、 基板 4を離脱させたパレット 9とマスク 6 (マスク 6の交換時には、パレット 9のみ)を蒸着 領域 11の上方 (例えば直上の位置)において、蒸着方向とは反対方向へ、即ち基板 搬入口 5に向って搬送するように構成されている。 The transport return unit 15 includes a transport mechanism 15a that also has, for example, roller force. And The pallet 9 and the mask 6 from which the substrate 4 has been detached and the mask 6 (only the pallet 9 when replacing the mask 6) are placed above the deposition region 11 (for example, the position immediately above) in the direction opposite to the deposition direction, that is, to the substrate carry-in entrance 5 It is comprised so that it may convey toward.
また、蒸着領域 11と搬送戻し部 15との間には、コンタミネーシヨンを防止するため の仕切り部 16が設けられている。  In addition, a partition 16 for preventing contamination is provided between the vapor deposition region 11 and the transport return unit 15.
[0024] このような構成を有する本実施の形態において基板 4上に蒸着を行うには、図 2に 示すように、上述した搬送戻し部 15に予め複数のマスク 6付きパレット 9を配置しておIn order to perform vapor deposition on the substrate 4 in the present embodiment having such a configuration, as shown in FIG. 2, a plurality of pallets 9 with masks 6 are arranged in advance on the above-described transport return unit 15. Oh
<o <o
そして、図 3 (a)に示すように、基板搬入位置 2aの上部に位置するマスク 6付きパレ ット 9を下降させ、位置合わせ機構 8の下部の位置にマスク 6付きパレット 9を配置する  Then, as shown in FIG. 3 (a), the pallet 9 with the mask 6 located at the upper part of the substrate loading position 2a is lowered, and the pallet 9 with the mask 6 is arranged at the lower part of the alignment mechanism 8.
[0025] 次いで、図 3 (b)に示すように、基板搬入口 5から真空槽 2内に基板 4を搬入し、位 置合わせ機構 8のマスク 6付きパレット 9の上方の位置に配置して、基板 4とマスク 6を 対向させる。 Next, as shown in FIG. 3 (b), the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in entrance 5 and placed at a position above the pallet 9 with the mask 6 of the alignment mechanism 8. The substrate 4 and the mask 6 are made to face each other.
[0026] そして、位置合わせ機構 8によって基板 4とマスク 6の位置合わせを行うとともに、図 4 (a)に示すように、パレット 9を上方向に移動して基板 4とマスク 6を合体装着させ、 基板組立体 20とする。  [0026] Then, the substrate 4 and the mask 6 are aligned by the alignment mechanism 8, and the pallet 9 is moved upward to attach the substrate 4 and the mask 6 together as shown in FIG. 4 (a). The board assembly 20 is assumed.
[0027] その後、図 4 (b)に示すように、この基板組立体 20を蒸着開始位置 2cに移動させ、 マスク 6を介して基板 4表面上に所定の有機材料の蒸着を行う。  Thereafter, as shown in FIG. 4B, the substrate assembly 20 is moved to the deposition start position 2c, and a predetermined organic material is deposited on the surface of the substrate 4 through the mask 6.
そして、図 5に示すように、蒸着が終了して基板取出位置 2bに到達した基板組立 体 20について、パレット 9から基板 4を離脱させ、この基板 4を基板搬出口 12からス パッタリング室 13に移送する。  Then, as shown in FIG. 5, the substrate 4 is detached from the pallet 9 with respect to the substrate assembly 20 that has reached the substrate extraction position 2b after vapor deposition, and this substrate 4 is removed from the substrate carry-out port 12 to the sputtering chamber 13. Transport to.
[0028] 一方、マスク 6付きパレット 9については、基板取出位置 2bの上方に移動させて搬 送戻し部 15に移送し、基板搬入位置 2aに向って搬送させる。 On the other hand, the pallet 9 with the mask 6 is moved above the substrate take-out position 2b, transferred to the carry-back unit 15, and conveyed toward the substrate carry-in position 2a.
[0029] その後、順次、新たな基板 4を真空槽 2内に搬入し、上述した手順でパレット 9上の マスク 6に基板 4を装着し、蒸着開始位置 2cを経由して有機材料の蒸着を行い、さら に、パレット 9の基板搬入位置 2aへの搬送を行う。 [0029] Thereafter, a new substrate 4 is sequentially carried into the vacuum chamber 2, and the substrate 4 is mounted on the mask 6 on the pallet 9 in the above-described procedure, and the organic material is deposited via the deposition start position 2c. In addition, the pallet 9 is transported to the board loading position 2a.
[0030] ところで、本実施の形態にぉ 、ては、上述した手順を行 、マスク 6を複数回使用し た後、その交換を行う。 By the way, in the present embodiment, the above-described procedure is performed and the mask 6 is used a plurality of times. After that, replace it.
図 5、図 6 (a) (b)及び図 7 (a) (b)は、本実施の形態におけるマスク交換及び位置 合わせの手順を示す動作説明図である。  FIG. 5, FIG. 6 (a) (b) and FIG. 7 (a) (b) are operation explanatory views showing the procedures of mask replacement and alignment in the present embodiment.
[0031] 本実施の形態の場合には、図 5に示すように、蒸着終了後、基板取出位置 2bにお いて、パレット 9から基板 4を離脱させてスパッタリング室 13に移送する。その一方で、 パレット 9から蒸着済交換用マスク 6bを離脱させてマスク搬出口 14から真空槽 2の外 部へ搬出する。 In the case of the present embodiment, as shown in FIG. 5, after deposition is completed, the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2b. On the other hand, the deposited replacement mask 6b is detached from the pallet 9 and carried out from the mask carry-out port 14 to the outside of the vacuum chamber 2.
[0032] そして、パレット 9を基板取出位置 2bの上方に移動させて搬送戻し部 15に移送し、 基板搬入位置 2aに向って搬送させる。  [0032] Then, the pallet 9 is moved above the substrate take-out position 2b, transferred to the transfer return unit 15, and transferred toward the substrate carry-in position 2a.
その後、図 6 (a)に示すように、基板搬入位置 2aの上部に位置するパレット 9を下降 させて位置合わせ機構 8の下部の位置に配置する。  Thereafter, as shown in FIG. 6 (a), the pallet 9 positioned above the substrate loading position 2a is lowered and placed at the position below the alignment mechanism 8.
[0033] 次 、で、マスク搬入口 7から交換用マスク 6aを水平方向に搬入し、図 6 (b)に示すよ うに、この交換用マスク 6aを鉛直方向に上昇させた後に水平方向に搬送して位置合 わせ機構 8のパレット 9の上方の位置に配置する。 Next, in the next step, the replacement mask 6a is carried in from the mask carry-in port 7 in the horizontal direction, and as shown in FIG. 6 (b), the replacement mask 6a is raised in the vertical direction and then carried in the horizontal direction. Then, place it at a position above the pallet 9 of the alignment mechanism 8.
[0034] そして、図 7 (a)に示すように、基板搬入口 5から真空槽 2内に基板 4を搬入し、位置 合わせ機構 8のマスク 6の上方の位置に配置して、基板 4とマスク 6を対向させる。 Then, as shown in FIG. 7 (a), the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in entrance 5, and is disposed at a position above the mask 6 of the alignment mechanism 8, so that the substrate 4 Make mask 6 face each other.
[0035] さらに、位置合わせ機構 8によって基板 4とマスク 6の位置合わせを行うとともに、図[0035] Further, the alignment mechanism 8 aligns the substrate 4 and the mask 6, and
7 (b)に示すように、パレット 9を上昇させて基板 4とマスク 6を合体装着させる。 7 As shown in (b), the pallet 9 is raised and the substrate 4 and the mask 6 are mounted together.
その後、基板組立体 20を蒸着開始位置 2cに移動させ、上述したように、マスク 6を 介して基板 4表面上に所定の有機材料の蒸着を行う。  Thereafter, the substrate assembly 20 is moved to the deposition start position 2c, and a predetermined organic material is deposited on the surface of the substrate 4 through the mask 6 as described above.
[0036] 以上述べたように本実施の形態にあっては、真空槽 2内において、蒸着終了後の 基板 4力も離脱させたパレット 9 (及びマスク 6)を蒸着領域 11の上方の搬送戻し部 15 を経由して基板搬入位置 2aまで戻すようにしたことから、パレット 9を戻す領域を蒸着 領域 11に隣接して設ける必要がなぐこれにより真空槽 2の設置面積を小さくすること ができる。 As described above, in the present embodiment, in the vacuum chamber 2, the pallet 9 (and the mask 6) from which the force of the substrate 4 after the vapor deposition is also released is transferred to the transport return unit above the vapor deposition region 11. Since the substrate 15 is returned to the substrate loading position 2a via 15, the area for returning the pallet 9 does not need to be provided adjacent to the vapor deposition area 11, thereby reducing the installation area of the vacuum chamber 2.
[0037] また、本実施の形態においては、基板 4と、マスク 6と、パレット 9とを上下方向力も位 置合わせする位置合わせ機構 8を備えることから、基板 4とマスク 6の位置合わせ精 度を向上させて基板 4上に高精細のパターンを形成することができる。 [0038] さらに、本実施の形態においては、蒸着領域 11と搬送戻し部 15との間に仕切り部 16が設けられているので、蒸発材料の蒸気のコンタミネーシヨンが生ずることなく蒸 着を行うことができる。 In the present embodiment, since the alignment mechanism 8 that aligns the vertical force of the substrate 4, the mask 6, and the pallet 9 is provided, the alignment accuracy of the substrate 4 and the mask 6 is provided. Thus, a high-definition pattern can be formed on the substrate 4. [0038] Further, in the present embodiment, since the partitioning portion 16 is provided between the vapor deposition region 11 and the transport return portion 15, the vaporization is performed without causing vapor contamination of the evaporation material. be able to.
さらにまた、本実施の形態においては、未使用の交換用マスク 6aを搬入するため のマスク搬入口 7と、蒸着済交換用マスク 6bを搬出するためのマスク搬出口 14が設 けられているので、蒸着済交換用マスク 6bに代えて新たな交換用マスク 6aを搬入交 換しつつ種々の蒸着パターンを連続的に形成することができる。  Furthermore, in the present embodiment, the mask carry-in port 7 for carrying in the unused replacement mask 6a and the mask carry-out port 14 for carrying out the deposited exchange mask 6b are provided. Various deposition patterns can be continuously formed while carrying in and replacing a new replacement mask 6a in place of the deposited replacement mask 6b.
[0039] このように、本実施の形態によれば、真空槽 2の設置面積が小さぐ高精細のバタ ーンを連続的且つ迅速に形成可能な有機 EL素子用の有機薄膜蒸着装置 1を提供 することができる。  As described above, according to the present embodiment, the organic thin film deposition apparatus 1 for an organic EL element capable of continuously and rapidly forming a high-definition pattern with a small installation area of the vacuum chamber 2 is provided. Can be provided.
[0040] 図 8及び図 9 (a) (b)は、本発明の他の実施の形態を示すものであり、以下、上記実 施の形態と対応する部分については同一の符号を付しその詳細な説明を省略する。  FIG. 8 and FIG. 9 (a) and (b) show other embodiments of the present invention. In the following, parts corresponding to those of the above-described embodiments are denoted by the same reference numerals. Detailed description is omitted.
[0041] 図 8に示すように、本実施の形態の有機薄膜蒸着装置 1Aは、真空槽 2内の基板取 出位置 2bの上部に、位置合わせ機構 8が設けられて構成されている。 As shown in FIG. 8, the organic thin film deposition apparatus 1 A of the present embodiment is configured by providing an alignment mechanism 8 above the substrate extraction position 2 b in the vacuum chamber 2.
そして、位置合わせ機構 8の近傍 (例えば図 8に示すように位置合わせ機構 8の中 腹部から上部側の高さ位置)に、基板 4を搬入するための基板搬入口 17と、交換用 マスク 6aを搬入するためのマスク搬入口 7が設けられて 、る。  Then, in the vicinity of the alignment mechanism 8 (for example, as shown in FIG. 8, a height position on the upper side from the middle of the alignment mechanism 8), a substrate carry-in port 17 for carrying the substrate 4 and a replacement mask 6a A mask inlet 7 is provided for carrying in.
[0042] 本実施の形態の場合は、マスク搬入口 7より基板搬入口 17が上方側に位置するよ うに配置され、それぞれ基部 4又はマスク 6を水平方向に搬入するように構成されて いる。 In the case of the present embodiment, the substrate carry-in port 17 is disposed above the mask carry-in port 7 and is configured to carry in the base 4 or the mask 6 in the horizontal direction, respectively.
[0043] なお、本実施の形態の場合、上記実施の形態の基板搬入位置 2aに対応する部分 には、基板組立体 20を下降させて蒸着開始位置 2cに搬送する折り返し領域 2dが設 けられている。  [0043] In the case of the present embodiment, a folded region 2d for lowering the substrate assembly 20 and transporting it to the deposition start position 2c is provided at a portion corresponding to the substrate carry-in position 2a of the above embodiment. ing.
[0044] このような構成を有する本実施の形態においては、図 9 (a)に示すように、蒸着終了 後、基板取出位置 2bにおいて、パレット 9から基板 4を離脱させてスパッタリング室 13 に移送するとともに、マスク 6付きパレット 9を基板取出位置 2bの上方に移動させて位 置合わせ機構 8の下部に配置する。  In the present embodiment having such a configuration, as shown in FIG. 9 (a), after the deposition is completed, the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2b. At the same time, the pallet 9 with the mask 6 is moved above the substrate take-out position 2b and placed below the alignment mechanism 8.
[0045] そして、上方側の基板搬入口 17から基板 4を真空槽 2内に水平方向に搬入し、位 置合わせ機構 8のパレット 9の上方の位置に配置して、基板 4とマスク 6を対向させる その後、位置合わせ機構 8によって基板 4とマスク 6の位置合わせを行うとともに、図 9 (b)に示すように、マスク 6付きパレット 9を上昇させて基板 4とマスク 6を合体装着さ せる。 [0045] Then, the substrate 4 is horizontally loaded into the vacuum chamber 2 from the upper substrate loading port 17, and Arrange the positioning mechanism 8 above the pallet 9 and make the substrate 4 and the mask 6 face each other. After that, the alignment mechanism 8 aligns the substrate 4 and the mask 6, as shown in Fig. 9 (b). In this way, the pallet 9 with the mask 6 is raised and the substrate 4 and the mask 6 are mounted together.
その後、図 8に示すように、基板組立体 20を折り返し領域 18を介して蒸着開始位 置 2cに移動させ、上述したように、マスク 6を介して基板 4表面上に所定の有機材料 の蒸着を行う。  Thereafter, as shown in FIG. 8, the substrate assembly 20 is moved to the deposition start position 2c via the folded region 18, and as described above, a predetermined organic material is deposited on the surface of the substrate 4 via the mask 6. I do.
[0046] なお、マスク 6を交換する際には、蒸着終了後、基板取出位置 2bにおいて、パレツ ト 9から基板 4を離脱させてスパッタリング室 13に移送する。その一方で、パレット 9か ら蒸着済交換用マスク 6bを離脱させてマスク搬出口 14から搬出する。さらに、パレツ ト 9を基板取出位置 2bの上方に移動させて位置合わせ機構 8の下部に配置する。  When exchanging the mask 6, after completion of the vapor deposition, the substrate 4 is detached from the pallet 9 and transferred to the sputtering chamber 13 at the substrate extraction position 2 b. On the other hand, the deposited replacement mask 6b is detached from the pallet 9 and carried out from the mask outlet 14. Further, the pallet 9 is moved above the substrate take-out position 2b and disposed below the alignment mechanism 8.
[0047] そして、基板搬入口 17から基板 4を真空槽 2内に搬入するとともに、マスク搬入口 7 カゝら交換用マスク 6aを真空槽 2内に搬入する。そして、基板 4と交換用マスク 6aを位 置合わせ機構 8のパレット 9の上方の位置に配置して、基板 4と交換用マスク 6aを対 向させる。  Then, the substrate 4 is carried into the vacuum chamber 2 from the substrate carry-in port 17, and the replacement mask 6 a including the mask carry-in port 7 is carried into the vacuum vessel 2. Then, the substrate 4 and the replacement mask 6a are arranged at a position above the pallet 9 of the alignment mechanism 8 so that the substrate 4 and the replacement mask 6a face each other.
[0048] その後、位置合わせ機構 8によって基板 4と交換用マスク 6aの位置合わせを行うと ともに、パレット 9を上昇させて基板 4と交換用マスク 6aをそれぞれ合体装着させる。 その後、以下、上述した基板搬送及びマスク蒸着動作を行う。  [0048] After that, the alignment mechanism 8 aligns the substrate 4 and the replacement mask 6a, and raises the pallet 9 to attach the substrate 4 and the replacement mask 6a together. Thereafter, the above-described substrate transfer and mask vapor deposition operations are performed.
[0049] このような構成を有する本実施の形態によれば、上記実施の形態と同様の効果に 加えて、パレット 9の上昇に伴って基板 4とマスク 6の位置合わせを行うことができるの で、位置合わせ機構 8を含む機構部分の構成を簡素化することができる。また、位置 合わせ動作を迅速に行いタクトタイムの短縮ィ匕を図ることができる。  [0049] According to the present embodiment having such a configuration, in addition to the same effects as those of the above-described embodiment, it is possible to align the substrate 4 and the mask 6 as the pallet 9 is raised. Thus, the configuration of the mechanism portion including the alignment mechanism 8 can be simplified. In addition, the alignment operation can be performed quickly to shorten the tact time.
その他の構成及び作用効果については上述の実施の形態と同一であるのでその 詳細な説明を省略する。  Since other configurations and operational effects are the same as those of the above-described embodiment, detailed description thereof is omitted.
[0050] なお、本発明は、有機 EL素子の発光層を形成するための真空蒸着装置のみなら ず、種々の有機薄膜を形成装置に適用することができる。  [0050] Note that the present invention can be applied not only to a vacuum vapor deposition apparatus for forming a light emitting layer of an organic EL element but also to various organic thin film forming apparatuses.
ただし、本発明は、有機 EL素子の発光層を形成するための装置に適用した場合 に最も有効となるものである。 However, the present invention is applied to an apparatus for forming a light emitting layer of an organic EL element. Is the most effective.

Claims

請求の範囲 The scope of the claims
[1] 真空槽内にお!、て搬入された基板を着脱自在の搬送体によって保持して順次搬 送しつつ当該基板上に有機薄膜の蒸着形成を行う有機薄膜蒸着方法であって、 前記真空槽内において、蒸着終了後の基板から前記搬送体を離脱させ、当該搬 送体を蒸着領域の上方を経由して蒸着開始位置まで戻しつつ、当該真空槽内に搬 入された新たな基板を当該搬送体に装着する工程を有する有機薄膜蒸着方法。  [1] An organic thin film vapor deposition method for depositing an organic thin film on a substrate while holding the substrate carried in a vacuum chamber by a removable carrier and sequentially transporting the substrate. In the vacuum chamber, the transport body is detached from the substrate after the completion of vapor deposition, and the transport body is returned to the vapor deposition start position via the upper part of the vapor deposition region, and a new substrate carried into the vacuum chamber. An organic thin film vapor deposition method comprising a step of attaching the substrate to the carrier.
[2] 前記基板上に有機 EL素子用の発光層を形成する請求項 1記載の有機薄膜蒸着 方法。  2. The organic thin film deposition method according to claim 1, wherein a light emitting layer for an organic EL element is formed on the substrate.
[3] 真空槽内にお!、て搬入された基板を着脱自在の搬送体によって保持して順次搬 送しつつ当該基板上に有機薄膜の蒸着形成を行う有機薄膜蒸着装置であって、 前記真空槽内に、蒸着終了後の基板から離脱させた前記搬送体を、蒸着領域の 上方及び基板搬入口近傍を経由して前記蒸着開始位置まで搬送する搬送戻し部を 有する有機薄膜蒸着装置。  [3] Inside the vacuum chamber! An organic thin film vapor deposition apparatus for performing vapor deposition of an organic thin film on the substrate while sequentially transporting the substrate carried in by being held by a detachable carrier, and in the vacuum chamber, An organic thin film deposition apparatus, comprising: a transport return unit that transports the transport body separated from the substrate to the deposition start position via the upper part of the deposition region and the vicinity of the substrate carry-in entrance.
[4] 前記基板と、蒸着パターンを形成するためのマスクと、前記搬送体とを上下方向か ら位置合わせする位置合わせ機構を備えた請求項 3記載の有機薄膜蒸着装置。 4. The organic thin film deposition apparatus according to claim 3, further comprising an alignment mechanism that aligns the substrate, a mask for forming a deposition pattern, and the carrier from above and below.
[5] 前記蒸着領域と前記搬送戻し部との間に仕切り部が設けられている請求項 3記載 の有機薄膜蒸着装置。 5. The organic thin film vapor deposition apparatus according to claim 3, wherein a partition portion is provided between the vapor deposition region and the transport return portion.
[6] 前記真空槽に、未使用の交換用マスクを当該真空槽に搬入するためのマスク交換 搬入口と、蒸着済の交換用マスクを当該真空槽力 搬出するためのマスク交換搬出 口が設けられて!/ヽる請求項 3記載の有機薄膜蒸着装置。  [6] The vacuum chamber is provided with a mask exchange carry-in port for carrying an unused exchange mask into the vacuum vessel, and a mask exchange carry-out port for carrying out the vapor-deposited exchange mask into the vacuum vessel. 4. The organic thin film deposition apparatus according to claim 3, wherein the organic thin film deposition apparatus is obtained.
[7] 前記マスク交換搬入口が、蒸着終了後の前記搬送体を上昇させる領域に配設され て ヽる請求項 6記載の有機薄膜蒸着装置。  7. The organic thin film vapor deposition apparatus according to claim 6, wherein the mask exchange carry-in port is disposed in a region where the carrier after the vapor deposition is lifted.
PCT/JP2007/053579 2006-02-28 2007-02-27 Organic thin film depositing method and organic thin film depositing apparatus WO2007099929A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006-052961 2006-02-28
JP2006052961 2006-02-28

Publications (1)

Publication Number Publication Date
WO2007099929A1 true WO2007099929A1 (en) 2007-09-07

Family

ID=38459034

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/053579 WO2007099929A1 (en) 2006-02-28 2007-02-27 Organic thin film depositing method and organic thin film depositing apparatus

Country Status (2)

Country Link
TW (1) TW200806805A (en)
WO (1) WO2007099929A1 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010080228A (en) * 2008-09-25 2010-04-08 Hitachi High-Technologies Corp Organic el device manufacturing device, film forming device, and device and method for replacing shadow mask
US20130216709A1 (en) * 2012-02-17 2013-08-22 Semiconductor Energy Laboratory Co., Ltd. Film Formation Apparatus, Method for Forming Film and Method for Cleaning Shadow Mask
JP2014005536A (en) * 2012-06-22 2014-01-16 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display apparatus using the same, and organic light-emitting display apparatus manufactured using the method
JP2014019954A (en) * 2012-07-16 2014-02-03 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display apparatus by using the same, and organic light-emitting display apparatus manufactured by the method
JPWO2012039383A1 (en) * 2010-09-22 2014-02-03 株式会社アルバック Vacuum processing apparatus and organic thin film forming method
JP2014096363A (en) * 2012-11-09 2014-05-22 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display device utilizing the same, and organic light-emitting display device manufactured by that method
JP2014224306A (en) * 2013-05-16 2014-12-04 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Organic layer vapor deposition apparatus, and manufacturing method of organic light-emitting display utilizing the same
WO2015063103A1 (en) * 2013-10-29 2015-05-07 Leybold Optics Gmbh Vacuum chamber and method for operating a vacuum chamber
CN108411249A (en) * 2018-03-28 2018-08-17 江苏集萃有机光电技术研究所有限公司 A kind of substrate sample frame, mask plate and substrate replacing options and evaporated device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09279341A (en) * 1996-04-17 1997-10-28 Anelva Corp Tray transportation type incline film forming device
JP2004292863A (en) * 2003-03-26 2004-10-21 Ulvac Japan Ltd Equipment for mask and vacuum deposition system
JP2005056673A (en) * 2003-08-04 2005-03-03 Nec Plasma Display Corp Film formation device of plasma display panel, manufacturing method of plasma display panel, and manufacturing method of plasma display device
JP2005085605A (en) * 2003-09-09 2005-03-31 Ulvac Japan Ltd Deposition device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09279341A (en) * 1996-04-17 1997-10-28 Anelva Corp Tray transportation type incline film forming device
JP2004292863A (en) * 2003-03-26 2004-10-21 Ulvac Japan Ltd Equipment for mask and vacuum deposition system
JP2005056673A (en) * 2003-08-04 2005-03-03 Nec Plasma Display Corp Film formation device of plasma display panel, manufacturing method of plasma display panel, and manufacturing method of plasma display device
JP2005085605A (en) * 2003-09-09 2005-03-31 Ulvac Japan Ltd Deposition device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010080228A (en) * 2008-09-25 2010-04-08 Hitachi High-Technologies Corp Organic el device manufacturing device, film forming device, and device and method for replacing shadow mask
JP5634522B2 (en) * 2010-09-22 2014-12-03 株式会社アルバック Vacuum processing apparatus and organic thin film forming method
JPWO2012039383A1 (en) * 2010-09-22 2014-02-03 株式会社アルバック Vacuum processing apparatus and organic thin film forming method
US20130216709A1 (en) * 2012-02-17 2013-08-22 Semiconductor Energy Laboratory Co., Ltd. Film Formation Apparatus, Method for Forming Film and Method for Cleaning Shadow Mask
JP2014005536A (en) * 2012-06-22 2014-01-16 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display apparatus using the same, and organic light-emitting display apparatus manufactured using the method
JP2014019954A (en) * 2012-07-16 2014-02-03 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display apparatus by using the same, and organic light-emitting display apparatus manufactured by the method
JP2014096363A (en) * 2012-11-09 2014-05-22 Samsung Display Co Ltd Organic layer deposition apparatus, method of manufacturing organic light-emitting display device utilizing the same, and organic light-emitting display device manufactured by that method
JP2014224306A (en) * 2013-05-16 2014-12-04 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Organic layer vapor deposition apparatus, and manufacturing method of organic light-emitting display utilizing the same
US11335892B2 (en) 2013-05-16 2022-05-17 Samsung Display Co., Ltd. Organic layer deposition apparatus and method of manufacturing organic light-emitting display apparatus using the same
US11778890B2 (en) 2013-05-16 2023-10-03 Samsung Display Co., Ltd. Organic layer deposition apparatus and method of manufacturing organic light-emitting display apparatus using the same
WO2015063103A1 (en) * 2013-10-29 2015-05-07 Leybold Optics Gmbh Vacuum chamber and method for operating a vacuum chamber
CN108411249A (en) * 2018-03-28 2018-08-17 江苏集萃有机光电技术研究所有限公司 A kind of substrate sample frame, mask plate and substrate replacing options and evaporated device
CN108411249B (en) * 2018-03-28 2024-02-09 江苏集萃有机光电技术研究所有限公司 Substrate sample holder, mask plate, substrate replacement method and evaporation equipment

Also Published As

Publication number Publication date
TW200806805A (en) 2008-02-01

Similar Documents

Publication Publication Date Title
WO2007099929A1 (en) Organic thin film depositing method and organic thin film depositing apparatus
JP4934619B2 (en) Organic EL manufacturing apparatus and organic EL manufacturing method
JP5506824B2 (en) Film forming apparatus and film forming method
KR100959009B1 (en) Thin film forming apparatus and method thereof
JP2006031025A (en) System and method for manufacturing flat panel display
JP2005256101A (en) Substrate-mask fixing device
US20120064250A1 (en) Method and apparatus for transporting a print support
JP5634522B2 (en) Vacuum processing apparatus and organic thin film forming method
KR20120046689A (en) Thin-film formation system and organic el device manufacturing system
KR20140145383A (en) Inline Type OLED Face Up Evaporator for large size OLED
WO2016178370A1 (en) Thin-film electronic device manufacturing method
JP5730322B2 (en) Vapor deposition apparatus and vapor deposition method
JP4638755B2 (en) Exposure apparatus and exposure method
KR101764023B1 (en) Substrate transfer system with tray and mask integrated
JP4417019B2 (en) Mask apparatus and vacuum film forming apparatus
US11277930B2 (en) Method of manufacturing display substrate and display substrate motherboard
JP2007211270A (en) Film-forming apparatus
KR20140071039A (en) Substrate treating apparatus
KR101068769B1 (en) Manufacturing apparatus for large-size LCD which exchanges substrate by conveyor, and transferring method for substrate using the same
KR102120265B1 (en) Evaporation Apparatus For Display Device And System Including The Same
KR101229669B1 (en) Apparatus of substrate loading and unloading for large-sized OLED
KR20090131092A (en) Substrate processing system and method for treating subtrate
KR100773450B1 (en) Substrate loading table of vacuum processing apparatus
WO2011040538A1 (en) Substrate processing system
KR20230098110A (en) Evaporation system

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application
NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 07714972

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: JP