WO2006039127A2 - Wafer edge wheel with drying function - Google Patents
Wafer edge wheel with drying function Download PDFInfo
- Publication number
- WO2006039127A2 WO2006039127A2 PCT/US2005/033301 US2005033301W WO2006039127A2 WO 2006039127 A2 WO2006039127 A2 WO 2006039127A2 US 2005033301 W US2005033301 W US 2005033301W WO 2006039127 A2 WO2006039127 A2 WO 2006039127A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- edge
- wheel
- substrate
- wheels
- shaft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B7/00—Drying solid materials or objects by processes using a combination of processes not covered by a single one of groups F26B3/00 and F26B5/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0408—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B13/00—Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
- F26B13/24—Arrangements of devices using drying processes not involving heating
- F26B13/30—Arrangements of devices using drying processes not involving heating for applying suction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B17/00—Machines or apparatus for drying materials in loose, plastic, or fluidised form, e.g. granules, staple fibres, with progressive movement
- F26B17/24—Machines or apparatus for drying materials in loose, plastic, or fluidised form, e.g. granules, staple fibres, with progressive movement with movement performed by shooting or throwing the materials, e.g. after which the materials are subject to impact
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/08—Drying solid materials or objects by processes not involving the application of heat by centrifugal treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
Definitions
- the present invention relates generally an edge wheel for a substrate used in wafer cleaning and other operations.
- CMP chemical- mechanical planarization/polishing
- contaminated substrates are cleaned.
- the surfaces of the substrate are brushed while a cleaning fluid is applied.
- edge wheels At the edges of the wafer and spun.
- Other methods of drying in which the wafer is supported by edge wheels are feasible as well.
- the spinning causes most of the fluid to fly off the substrate.
- due to surface tension some fluid tends to remain at the edges.
- a meniscus can form at the interface of the edge wheels and the substrate.
- some liquid may remain on the edge wheel and re-wet the substrate as it spins around.
- the present invention fills these needs by providing an edge wheel with an integrated fluid suction and fluid supply capability.
- an edge wheel for supporting and rotating a disk-shaped substrate such as a semiconductor substrate, includes a wheel body having a peripheral groove configured to support an edge of a substrate and at least one radial channel extending into said wheel body from said peripheral groove.
- an edge wheel assembly for a substrate processing apparatus includes an edge wheel having a wheel body with a groove formed in an outer periphery of said wheel body.
- the groove is configured to engage an edge of the substrate.
- a through-hole is formed at an axis of the edge wheel to allow the edge wheel to rotate on a shaft.
- a radial channel extends inward from said groove. The radial channel is in at least periodic fluid communication with a stationary port as the edge wheel rotates on said shaft.
- an edge wheel dryer in another embodiment, includes a plurality of edge wheels, each having a groove configured to engage an edge of a substrate. At least one of the edge wheels has a radial channel extending inward from its groove.
- the dryer also includes a vacuum source. The radial channel is in fluid communication with the vacuum source.
- a method for processing a substrate includes rotationally supporting the substrate on a plurality of edge wheels, spinning the substrate, and performing one of a wetting and drying operation at an interface between the substrate and at least one of the edge wheels.
- the substrate is rotationally supported by a plurality of edge wheels each having a groove at its periphery that engages the edge of the substrate.
- Each edge wheel is allowed to rotate on its axis thereby allowing the substrate to rotate on its axis.
- Spinning is achieved by applying a rotational force to at least one of the edge wheels thereby causing the substrate to spin.
- Wetting comprises supplying a liquid to the interface via radial channels formed in the at least one edge wheel.
- Drying comprises supplying a vacuum to the interface via the radial channels
- Figure 1 shows a plan view of an exemplary substrate cleaning system.
- Figure 2 shows a close up view of an interface between a substrate and edge wheel.
- Figure 3 shows a cross section view of an exemplary edge wheel assembly.
- Figure 4 shows a top view of the exemplary edge wheel assembly of Figure 3.
- Figure 5 shows a cross section view of another exemplary edge wheel assembly.
- FIG. 1 shows an exemplary layout of substrate processing device 5.
- Substrate 10 is disk-shaped and is supported by four edge wheels 12, 14, including two fixed edge wheels 12 and two movable edge wheels 14.
- Edge wheels 14 pivot into engagement with substrate 10 by pivot arms 16 when substrate 10 is loaded into the apparatus. Loading may be performed by a robot (not shown) that positions substrate 10 into place before movable edge wheels 14 engages substrate 10.
- Edge wheels 12, 14 allow substrate 10 to rotate on its axis of symmetry which is perpendicular to the flat surfaces of the substrate.
- One or both fixed edge wheels 12 may be provided with some rotational force, e.g., by a friction wheel, belt drive or other drive means (not shown in Figure 1) as would generally occur to those having skill in the art.
- edge wheels 12, 14 maintain the position of substrate 10 while allowing it and/or causing it to rotate on its axis while supporting substrate 10 only by its edges.
- Figure 2 shows a close up of interface 15 formed between substrate 10 and edge wheel 14.
- Edge wheel 14 has a groove 13 formed in its outer circumference configured to engage edge 11 of substrate 10.
- Meniscus 17 formed by liquid is shown by way of example as being located at an interface of substrate 10 and edge wheel 14 wherein both the substrate and edge wheel are hydrophilic. However, it is also possible that only one or neither of substrate 10 and edge wheel 14 is hydrophilic.
- the liquid may be a cleaning solution, rinsing agent, or other cliemical used in processing substrates.
- a plurality of radial channels 18 are formed into edge wheel 14 extending inward from groove 13. Radial channels 18 are in fluid communication with a vacuum source or a fluid supply (not shown in Figure 2). When suction is applied to radial channel 18, any liquid at the interface between wafer 10 and edge wheel 14 will be removed. All four edge wheels 12, 14, may be provided with radial channel 18. Furthermore, edge 11 of wafer 10 maybe wetted by supplying fluid to radial channel 18.
- FIG. 3 shows an exemplary edge wheel assembly 30.
- Edge wheel 14 is mounted to a support arm 16 by a shaft 20 such that the edge wheel is free to rotate.
- Wheel 14 and shaft 20 are shown in cross section so that the internal structure can be seen.
- shaft 20 includes an axial channel extending from a top end 32 to a transverse channel 27.
- Transverse channel 27 periodically aligns with each of radial channels 18 which are formed radially into edge wheel 14. Any number of transverse channels may be formed into edge wheel and shaft 20 so long as the strength is not unduly compromised.
- one transverse channel is formed into shaft 20 and six radial channels are formed in edge wheel 14 as shown in phantom in Figure 4.
- the term, "radial channel” is not intended to be limiting as it requires only that the channels extend into the body of wheel 14 from groove 13.
- Shaft 20 extends axially through edge wheel 14, and bearings 24 permit edge wheel 14 to rotate on shaft 20.
- bearings 24 may be made of some low friction self-lubricating resin such as polytetrafluoroethene (PTFE) or nylon.
- PTFE polytetrafluoroethene
- Composite materials such as that sold under the trademark, RULON by Saint-Gobain Performance Plastics Microelectronics of Garden Grove, California, are also contemplated. Bearings 24 are closely fit to shaft 20 to reduce leakage through the interface of edge wheel 14 and shaft 20.
- Groove 29 extends around the circumference of shaft 20 at the interface between channel 27 and channels 18 so that continuous suction, is drawn from all channels 18.
- a similar groove may be formed on the inner diameter of edge wheel 14.
- a gap (not sho ⁇ vn) between shaft 20 and edge wheel 14 may be large enough so that vacuum may be communicated through the gap formed therebetween.
- it may be desirable to prevent vacuum from being communicated to any channel 18 not in alignment with interface 15.
- no groove 29 is provided, and a single transverse channel 27 may be aligned as shown so that fluid is only drawn from channels 18 when they are aligned with interface 15 between substrate 10 and edge wheel 14.
- a suction line 52 may be coupled at top 32 of shaft 20, e.g., using threads 30 or some other fluid line engaging means such as clamps, friction teeth, nipple, etc., to provide communication between axial channel 26 and a vacuum source 50.
- wafer 10 is dried by spinning it, which draws fluid out from the center toward edge 11. Some fluid may adhere at edge 11. To remove this fluid, suction is applied to suction line 52 which is in at least periodic fluid communication with each radial channel 18 and therefore interface 15 . Suction draws out any fluid at interface 15 while substrate 10 and edge wheel 14 rotate, thereby drying edge wheel 14.
- edge wheels To prevent wafer from being dried by the action of edge wheels.
- a fluid may supplied to wheel assembly 30 for wetting edge 11 of substrate 10. This allows the wafer to be made uniformly wet with the particular fluid being used. In this circumstance, it may not be necessary to provide so much pressure as to generate a spray, but rather enough so the edge of substrate 10 is made uniformly wet.
- FIG. 5 shows an exemplary cross section vie " w of fixed edge wheel 12.
- Fixed edge wheel 12 includes a shaft 40 extending through the body of wheel 12. Shaft 40 rotates with edge wheel 12 on a pin 58 that passes through axial through-hole 46.
- An annular space 54 is formed between a cavity in edge wiieel 12 and a cover 45, which has a T-shaped cross section.
- Retainer 48 retains cover 45 on edge wheel 12, and may be separated therefrom by a low-friction washer (not shown) to allow relative rotation.
- Retainer 48 may be, e.g., a nut.
- Cover 45 is sealed to edge wheel 12 by O-rings 47.
- a belt 44 engages groove 42 formed in a lower portion of shaft 40.
- a drive source (not shown) drives belt 44 which_ engages groove 42 thereby turning shaft 40 on a pin (not shown) that passes through axial through-hole 46.
- Shaft 46 is fixedly attached to edge wheel 12 by mechanical means, adhesive, or other means.
- shaft 46 and edge wheel 12 may be integrally formed of a single material.
- T-shaped cover 50 remains stationary.
- a vacuum is applied at port 56 to place annular space 54 in a partial vacuum.
- a fluid may be supplied to annular space 54 via port 56.
- Annular space 54 is in fluid commu ⁇ ication with radial channels 18 which operate as described above with respect to edge wheel 14 shown in
- Wliat is claimed is:
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Molecular Biology (AREA)
- Textile Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
Abstract
Description
Claims
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020077007691A KR101182618B1 (en) | 2004-09-30 | 2005-09-16 | Wafer edge wheel with drying function |
| JP2007534636A JP5238254B2 (en) | 2004-09-30 | 2005-09-16 | Edge wheel structure |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/957,146 US7089687B2 (en) | 2004-09-30 | 2004-09-30 | Wafer edge wheel with drying function |
| US10/957,146 | 2004-09-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2006039127A2 true WO2006039127A2 (en) | 2006-04-13 |
| WO2006039127A3 WO2006039127A3 (en) | 2007-01-11 |
Family
ID=36097413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2005/033301 Ceased WO2006039127A2 (en) | 2004-09-30 | 2005-09-16 | Wafer edge wheel with drying function |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US7089687B2 (en) |
| JP (2) | JP5238254B2 (en) |
| KR (1) | KR101182618B1 (en) |
| CN (1) | CN100565063C (en) |
| SG (1) | SG141469A1 (en) |
| TW (1) | TWI278905B (en) |
| WO (1) | WO2006039127A2 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040031167A1 (en) | 2002-06-13 | 2004-02-19 | Stein Nathan D. | Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife |
| US7350315B2 (en) | 2003-12-22 | 2008-04-01 | Lam Research Corporation | Edge wheel dry manifold |
| US20060000494A1 (en) * | 2004-06-30 | 2006-01-05 | Lam Research Corporation | Self-draining edge wheel system and method |
| US7089687B2 (en) * | 2004-09-30 | 2006-08-15 | Lam Research Corporation | Wafer edge wheel with drying function |
| US8211242B2 (en) * | 2005-02-07 | 2012-07-03 | Ebara Corporation | Substrate processing method, substrate processing apparatus, and control program |
| DE102005057109A1 (en) * | 2005-11-26 | 2007-05-31 | Kunze-Concewitz, Horst, Dipl.-Phys. | Continuous wet chemical processing, e.g. cleaning, etching, stripping, coating or drying of flat, thin, fragile substrates comprises transporting and processing substrates using absorbent rollers |
| US20110296634A1 (en) * | 2010-06-02 | 2011-12-08 | Jingdong Jia | Wafer side edge cleaning apparatus |
| JP6144531B2 (en) * | 2013-04-23 | 2017-06-07 | 株式会社荏原製作所 | Substrate processing apparatus and manufacturing method of processing substrate |
| WO2015133689A1 (en) * | 2014-03-06 | 2015-09-11 | 주식회사 아이엠티 | Device and method for cleaning backside or edge of wafer |
| US12198944B2 (en) | 2020-11-11 | 2025-01-14 | Applied Materials, Inc. | Substrate handling in a modular polishing system with single substrate cleaning chambers |
| JP2024046219A (en) * | 2022-09-22 | 2024-04-03 | 芝浦メカトロニクス株式会社 | cleaning equipment |
| JP2024107709A (en) * | 2023-01-30 | 2024-08-09 | 株式会社Screenホールディングス | Substrate processing apparatus and chuck pin |
| US20250387806A1 (en) * | 2024-06-21 | 2025-12-25 | Applied Materials, Inc. | Chemical mechanical polisher cleaning unit |
Family Cites Families (53)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4838289A (en) * | 1982-08-03 | 1989-06-13 | Texas Instruments Incorporated | Apparatus and method for edge cleaning |
| IT1226303B (en) * | 1988-07-26 | 1990-12-27 | Montedipe Spa | PROCESS AND APPARATUS FOR DEVOLATILIZATION OF POLYMER SOLUTIONS. |
| JPH02130922A (en) * | 1988-11-11 | 1990-05-18 | Toshiba Corp | Etching equipment for semiconductor substrate |
| JPH0712035B2 (en) | 1989-04-20 | 1995-02-08 | 三菱電機株式会社 | Jet type liquid treatment device |
| JPH02309638A (en) | 1989-05-24 | 1990-12-25 | Fujitsu Ltd | Wafer etching device |
| JPH0693449B2 (en) * | 1989-12-25 | 1994-11-16 | 佳英 柴野 | Drying device for hot water pull-up system |
| US5271774A (en) * | 1990-03-01 | 1993-12-21 | U.S. Philips Corporation | Method for removing in a centrifuge a liquid from a surface of a substrate |
| US5620525A (en) * | 1990-07-16 | 1997-04-15 | Novellus Systems, Inc. | Apparatus for supporting a substrate and introducing gas flow doximate to an edge of the substrate |
| US5088441A (en) * | 1990-08-23 | 1992-02-18 | Belport Co., Inc. | Cord impregnator |
| JP3118737B2 (en) * | 1992-10-23 | 2000-12-18 | 東京エレクトロン株式会社 | Processing method of the object |
| US5705223A (en) * | 1994-07-26 | 1998-01-06 | International Business Machine Corp. | Method and apparatus for coating a semiconductor wafer |
| FR2733036B1 (en) * | 1995-04-14 | 1997-07-04 | Unir | CLOSE-UP ANTI-CONTAMINATION PROTECTION DEVICE |
| US5660642A (en) * | 1995-05-26 | 1997-08-26 | The Regents Of The University Of California | Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor |
| KR0175278B1 (en) * | 1996-02-13 | 1999-04-01 | 김광호 | Wafer Cleaner |
| JPH09270412A (en) * | 1996-04-01 | 1997-10-14 | Canon Inc | Cleaning device and cleaning method |
| DE19622015A1 (en) * | 1996-05-31 | 1997-12-04 | Siemens Ag | Process for etching destruction zones on a semiconductor substrate edge and etching system |
| US5724748A (en) * | 1996-07-24 | 1998-03-10 | Brooks; Ray G. | Apparatus for packaging contaminant-sensitive articles and resulting package |
| TW357406B (en) * | 1996-10-07 | 1999-05-01 | Tokyo Electron Ltd | Method and apparatus for cleaning and drying a substrate |
| US5868857A (en) * | 1996-12-30 | 1999-02-09 | Intel Corporation | Rotating belt wafer edge cleaning apparatus |
| US5967882A (en) * | 1997-03-06 | 1999-10-19 | Keltech Engineering | Lapping apparatus and process with two opposed lapping platens |
| JP3549141B2 (en) * | 1997-04-21 | 2004-08-04 | 大日本スクリーン製造株式会社 | Substrate processing device and substrate holding device |
| JPH1131672A (en) * | 1997-07-10 | 1999-02-02 | Hitachi Ltd | Substrate processing method and substrate processing apparatus |
| EP0905746A1 (en) | 1997-09-24 | 1999-03-31 | Interuniversitair Micro-Elektronica Centrum Vzw | Method of removing a liquid from a surface of a rotating substrate |
| EP0970511B1 (en) | 1997-09-24 | 2005-01-12 | Interuniversitair Micro-Elektronica Centrum Vzw | Method and apparatus for removing a liquid from a surface |
| US6491764B2 (en) * | 1997-09-24 | 2002-12-10 | Interuniversitair Microelektronics Centrum (Imec) | Method and apparatus for removing a liquid from a surface of a rotating substrate |
| US6398975B1 (en) * | 1997-09-24 | 2002-06-04 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for localized liquid treatment of the surface of a substrate |
| US5807439A (en) * | 1997-09-29 | 1998-09-15 | Siemens Aktiengesellschaft | Apparatus and method for improved washing and drying of semiconductor wafers |
| US6102777A (en) | 1998-03-06 | 2000-08-15 | Keltech Engineering | Lapping apparatus and method for high speed lapping with a rotatable abrasive platen |
| JPH11350169A (en) | 1998-06-10 | 1999-12-21 | Chemitoronics Co | Wet etching apparatus and wet etching method |
| DE59900743D1 (en) * | 1999-04-28 | 2002-02-28 | Sez Semiconduct Equip Zubehoer | Device and method for the liquid treatment of disc-shaped objects |
| JP4413383B2 (en) * | 1999-06-30 | 2010-02-10 | Hoya株式会社 | Scrub cleaning apparatus, scrub cleaning method, and information recording medium manufacturing method |
| JP3978296B2 (en) * | 1999-08-05 | 2007-09-19 | 株式会社カイジョー | Substrate end face ultrasonic excitation apparatus and substrate end face ultrasonic cleaning apparatus having the same |
| JP4481394B2 (en) * | 1999-08-13 | 2010-06-16 | 株式会社荏原製作所 | Semiconductor substrate cleaning apparatus and cleaning method thereof |
| US20020121290A1 (en) * | 1999-08-25 | 2002-09-05 | Applied Materials, Inc. | Method and apparatus for cleaning/drying hydrophobic wafers |
| US6622334B1 (en) * | 2000-03-29 | 2003-09-23 | International Business Machines Corporation | Wafer edge cleaning utilizing polish pad material |
| US6186873B1 (en) * | 2000-04-14 | 2001-02-13 | International Business Machines Corporation | Wafer edge cleaning |
| US7000622B2 (en) * | 2002-09-30 | 2006-02-21 | Lam Research Corporation | Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus |
| JP2002110512A (en) * | 2000-09-27 | 2002-04-12 | Toshiba Corp | Film forming method and film forming apparatus |
| US6550091B1 (en) * | 2000-10-04 | 2003-04-22 | Lam Research Corporation | Double-sided wafer edge scrubbing apparatus and method for using the same |
| JP2002124508A (en) * | 2000-10-13 | 2002-04-26 | Nec Corp | Spin treating apparatus for substrates |
| EP1372186B1 (en) | 2000-10-31 | 2008-12-10 | Sez Ag | Apparatus for liquid treatment of wafers |
| WO2002101798A2 (en) | 2001-06-12 | 2002-12-19 | Verteq, Inc. | Method of applying liquid to a megasonic apparatus for improved cleaning control |
| US6907637B1 (en) * | 2001-06-29 | 2005-06-21 | Lam Research Corporation | Edge wheel assembly in a substrate processing brush box |
| JP3944368B2 (en) * | 2001-09-05 | 2007-07-11 | 株式会社荏原製作所 | Substrate processing apparatus and substrate processing method |
| JP3535853B2 (en) * | 2001-09-18 | 2004-06-07 | エム・エフエスアイ株式会社 | Substrate support fixture and method for drying substrate surface using the same |
| JP4231407B2 (en) * | 2001-09-24 | 2009-02-25 | アイエムエックス ラブズ インコーポレイテッド | Apparatus and method for custom cosmetic preparation |
| JP2003151943A (en) * | 2001-11-19 | 2003-05-23 | Speedfam Clean System Co Ltd | Scrub cleaning apparatus |
| JP4026750B2 (en) * | 2002-04-24 | 2007-12-26 | 東京エレクトロン株式会社 | Substrate processing equipment |
| JP2004063796A (en) * | 2002-07-29 | 2004-02-26 | Tatsumo Kk | Backside cleaning equipment for flat rectangular substrates |
| JP2005150468A (en) * | 2003-11-17 | 2005-06-09 | Ebara Corp | Substrate drying apparatus and substrate polishing apparatus |
| US7350315B2 (en) * | 2003-12-22 | 2008-04-01 | Lam Research Corporation | Edge wheel dry manifold |
| US20060000494A1 (en) * | 2004-06-30 | 2006-01-05 | Lam Research Corporation | Self-draining edge wheel system and method |
| US7089687B2 (en) * | 2004-09-30 | 2006-08-15 | Lam Research Corporation | Wafer edge wheel with drying function |
-
2004
- 2004-09-30 US US10/957,146 patent/US7089687B2/en not_active Expired - Lifetime
-
2005
- 2005-09-16 SG SG200802526-4A patent/SG141469A1/en unknown
- 2005-09-16 JP JP2007534636A patent/JP5238254B2/en not_active Expired - Fee Related
- 2005-09-16 CN CNB2005800333969A patent/CN100565063C/en not_active Expired - Fee Related
- 2005-09-16 KR KR1020077007691A patent/KR101182618B1/en not_active Expired - Fee Related
- 2005-09-16 WO PCT/US2005/033301 patent/WO2006039127A2/en not_active Ceased
- 2005-09-21 TW TW094132655A patent/TWI278905B/en not_active IP Right Cessation
-
2006
- 2006-03-31 US US11/395,893 patent/US7254900B2/en not_active Expired - Fee Related
-
2012
- 2012-10-02 JP JP2012220347A patent/JP5579812B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070072513A (en) | 2007-07-04 |
| JP5238254B2 (en) | 2013-07-17 |
| US20060064894A1 (en) | 2006-03-30 |
| CN100565063C (en) | 2009-12-02 |
| US7089687B2 (en) | 2006-08-15 |
| TW200616015A (en) | 2006-05-16 |
| KR101182618B1 (en) | 2012-09-14 |
| JP2008515227A (en) | 2008-05-08 |
| JP5579812B2 (en) | 2014-08-27 |
| JP2013038442A (en) | 2013-02-21 |
| SG141469A1 (en) | 2008-04-28 |
| CN101031765A (en) | 2007-09-05 |
| TWI278905B (en) | 2007-04-11 |
| WO2006039127A3 (en) | 2007-01-11 |
| US20060174510A1 (en) | 2006-08-10 |
| US7254900B2 (en) | 2007-08-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5579812B2 (en) | Edge wheel structure | |
| EP3381608B1 (en) | Vacuum suction pad and substrate holder | |
| KR100286980B1 (en) | Method and apparatus for grinding wafers | |
| US5899801A (en) | Method and apparatus for removing a substrate from a polishing pad in a chemical mechanical polishing system | |
| TWI774776B (en) | Method and apparatus for polishing a substrate, and method for processing a substrate | |
| JP7333715B2 (en) | Substrate processing equipment | |
| US20190184517A1 (en) | Substrate processing apparatus, substrate processing method, and storage medium storing program | |
| JP2000127025A (en) | Polishing apparatus and polishing method | |
| KR20020040529A (en) | Polishing head of a chemical mechanical polishing machine and polishing method using the polishing head | |
| JPH08164370A (en) | Cleaning device and cleaning method for plate material having many fine holes, and cleaning device and cleaning method for chuck plate of vacuum chuck | |
| KR20050042971A (en) | Chemical mechanical polishing apparatus and polishing pad used in the apparatus | |
| KR100219499B1 (en) | C.m.p. device and planarization method | |
| CN116571406A (en) | Wax coating equipment for wafer mounting and related wafer mounting equipment | |
| KR100723435B1 (en) | Polishing heads for chemical mechanical polishing machines | |
| KR20070095096A (en) | Polishing heads for chemical mechanical polishing machines | |
| CN223277759U (en) | Wafer processing equipment | |
| JP7481198B2 (en) | Wafer cleaning device and holding surface cleaning device | |
| US20260114214A1 (en) | Substrate cleaning apparatus and substrate processing apparatus including the same | |
| KR100745482B1 (en) | Substrate backing device | |
| JPH08124844A (en) | Wafer stage | |
| KR100487546B1 (en) | an apparatus for polishing semiconductor wafer | |
| KR20050102879A (en) | Spin coater | |
| KR20040067606A (en) | chemical mechanical polishing apparatus | |
| KR20010056886A (en) | Semiconductor wafer chuck | |
| KR20040047261A (en) | Retainer ring of cmp apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KM KP KR KZ LC LK LR LS LT LU LV LY MA MD MG MK MN MW MX MZ NA NG NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU LV MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
| DPEN | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed from 20040101) | ||
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| WWE | Wipo information: entry into national phase |
Ref document number: 2007534636 Country of ref document: JP |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 200580033396.9 Country of ref document: CN |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 1020077007691 Country of ref document: KR |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 05797603 Country of ref document: EP Kind code of ref document: A2 |