WO2005111597A1 - 磁性微粒子の検出装置 - Google Patents
磁性微粒子の検出装置 Download PDFInfo
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- WO2005111597A1 WO2005111597A1 PCT/JP2005/006010 JP2005006010W WO2005111597A1 WO 2005111597 A1 WO2005111597 A1 WO 2005111597A1 JP 2005006010 W JP2005006010 W JP 2005006010W WO 2005111597 A1 WO2005111597 A1 WO 2005111597A1
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- hall element
- magnetic field
- detection device
- fine particles
- magnetic
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
Definitions
- the present invention relates to an apparatus for detecting magnetic fine particles, and more particularly, to an apparatus for detecting magnetic fine particles using a Hall element as a sensor thereof.
- Magnetic fine particles for example, commercially available superparamagnetic microphone beads used in the field of biotechnology, are made of ⁇ -FeO or FeO dispersed in a polymer substrate having a diameter of a few micrometer.
- the beads are covered with a different chemical coating and are configured to bind to the desired target (cells, nucleic acids, nocteria, etc.)
- bioscreening such as isolation of tumor cells and determination of DNA sequence can be performed.
- bioscreening development of such a bead having a characteristic and high-speed detection is desired.
- a magnetic fine particle detection device may be used for research and measurement of fine particles of a material used for a permanent magnet.
- Such a method for detecting magnetic fine particles is performed by measuring the magnetic porosity.
- a device that attempts to detect magnetic fine particles using a superconducting quantum interference device (SQUID) as a sensor. This involves applying an alternating magnetic field to the magnetic particles.
- SQUID superconducting quantum interference device
- the signal is detected by a SQUID magnetic sensor.
- Non-Patent Document 1 there is a detection method using a Si Hall element as disclosed in Non-Patent Document 1.
- Patent Document 1 JP 2001-133458 A
- Patent Document 2 JP-A-11 101861
- Non-Patent Reference 1 Pierre—A. Besse et al., “Detection of a single magnetic micro bead using a miniaturized silicon Hall sensorj APPLIED PHYSICS LETTERS, Vol. 80, No. 22, June 3, 2002, p. 4199—4201 Disclosure of the invention
- the manufacturing process of the GMR element is complicated, miniaturization of several microns or less is difficult, and there has been a problem that the apparatus becomes expensive.
- the resolution of this sensor was several microns, so it was not possible to detect magnetic fine particles of nanometer size. Further, since the distance between the element and the magnetic fine particles is several microns, the magnetic field of the magnetic fine particles that can be detected at a minimum is considerably limited.
- the DC magnetic field is about 300 Oe when the diameter of the coil is 100 mm. Therefore, it was difficult to detect nanometer-sized magnetic fine particles with a high saturation magnetic flux density using an apparatus using a magnetic coil.
- the present invention has been made in view of the above circumstances, and has as its object to provide a detection device capable of reducing noise sources, detecting magnetic fine particles at low cost, with high accuracy, and at high speed.
- a magnetic fine particle detection device includes a Hall element placed on an XY plane using the Hall effect, a DC power supply for driving the Hall element, and a Hall element.
- a magnet that is provided in the vicinity and applies a DC magnetic field in the Z-axis direction to the Hall element; an alternating magnetic field generating means that is provided in the vicinity of the Hall element and applies an AC magnetic field to the Hall element; and a voltage output of the Hall element
- a lock-in amplifier for detecting the fluctuation of the magnetic component of the Z component of the magnetic fine particles placed on the Hall element.
- the lock-in amplifier may use a frequency that is an integral multiple of the frequency of the AC magnetic field generated by the AC magnetic field generating means as the reference signal frequency.
- the magnet may be made of a permanent magnet and provided so that ONZOFF control of application of a magnetic field onto the Hall element can be performed.
- the magnet may be an electromagnet.
- the AC magnetic field generating means may be provided as long as it is provided on the XY plane and can apply an AC magnetic field in a predetermined direction on the XY plane onto the Hall element. Specifically, it may be in the X-axis direction or the Y-axis direction.
- the AC magnetic field generating means may be provided in the Z-axis direction of the Hall element, and may apply an AC magnetic field in the Z-axis direction to the Hall element.
- the AC magnetic field generating means may include an AC power supply and a coil connected thereto.
- the AC magnetic field generating means may include an AC power supply and an electromagnet connected to the AC power supply.
- the AC magnetic field generating means may include a permanent magnet and a rotation mechanism for rotating the permanent magnet.
- the AC magnetic field generating means may include an AC power supply and a conductor connected thereto, and the conductor may apply a magnetic field generated around the conductor to the Hall element.
- the Hall element may be configured by connecting a plurality of Hall elements in series, and the conducting wire may be provided over the Hall elements connected in series.
- the Hall element is formed on the substrate, and further, an insulating film and the thin film are formed on the Hall element. What is necessary is just to comprise so that it may be provided with the titanium or chromium base layer on an edge film, and the gold thin film on this base layer.
- the insulating film may be a silicon nitride film or an oxidized silicon film formed by a dual target magnetron RF sputtering method.
- the Hall element preferably contains any one of InSb, InAs, AlGaN / GaN, Bi, GaAs / AlGaAs, and Si as a main component.
- the substrate may have a concave portion immediately below the Hall element.
- an insulating film, a base layer, and a gold thin film may be provided also on the substrate side surface of the Hall element.
- a thiol ligated compound may be bonded to a gold thin film.
- the magnetic fine particle detection device of the present invention has an advantage that it is possible to detect magnetic fine particles with high accuracy because the number of coils reduces the number of noise sources.
- a Hall element that can be easily subjected to ultrafine processing, even fine magnetic particles of nanometer size can be detected with high sensitivity.
- the apparatus itself is simplified without using a magnetic coil, and an inexpensive apparatus can be realized. Further, by using a plurality of Hall elements in series, it is possible to measure a plurality of types of magnetic fine particles at once.
- FIG. 1 is a schematic block diagram for explaining a magnetic fine particle detection device according to a first embodiment of the present invention.
- a Hall element 1 using the Hall effect is provided on an XY plane, and a DC power supply 2 for driving the Hall element 1 is connected to the Hall element 1.
- Si or the like as the material of the Hall element.
- a hole such as InSb, Bi, or InAs, which can be easily micro-processed. It is preferable to use an element.
- the Hall element 1 In order to apply a DC magnetic field H in the Z-axis direction onto the Hall element 1, the Hall element 1
- a permanent magnet 3 is provided in the vicinity of the Z axis side.
- the permanent magnet 3 is provided so that the application of a magnetic field onto the Hall element can be controlled ONZOFF.
- the Hall element 1 may be provided so as to be movable so as to keep away the force. Further, ONZOFF control may be performed using a magnetic shield or the like. Then, in order to apply an AC magnetic field H in the X-axis direction onto the Hall element 1, the Hall element
- a coil 4 is provided near the X-axis side of the child 1.
- the AC power supply 5 is connected to the coil 4, and the AC power supply 5 generates an AC magnetic field from the coil 4.
- the AC magnetic field H is provided near the X-axis side of the child 1.
- the magnetic fine particles 50 adsorbed on the Hall element are also subjected to the AC magnetic field H ACx force s.
- a lock-in amplifier 7 is connected to a voltage output terminal of the Hall element 1 via a preamplifier 6 as necessary.
- the lock-in amplifier 7 has a function of detecting only a signal synchronized with the reference signal frequency.
- the frequency of the AC magnetic field generated by the AC power supply 5 and the coil 4 is input to the reference signal input terminal of the lock-in amplifier 7 as the reference signal frequency.
- the frequency of the AC magnetic field itself may be input, or a double or triple frequency may be input. That is, a frequency that is an integral multiple of the frequency of the AC magnetic field may be input as the reference signal frequency.
- FIG. 2 is a cross-sectional view of the Hall element 1 of the magnetic fine particle detection device of the present invention.
- the Hall element 1 is formed on a suitable substrate 8, and an insulating film 9 is formed on the Hall element 1.
- the insulating film 9 has a material strength to absorb a desired target bonded to the magnetic fine particles, and can be formed with a thickness of 200 nm or less. Therefore, the distance between the sensor and the particles can be made very short, and the magnetic fine particles can be detected with high sensitivity.
- the detection device of the present invention is a device for detecting whether or not the magnetic fine particles 50 are attached to the sensor by using the Hall element 1.
- the principle of detecting magnetic fine particles will be described in detail.
- an AC magnetic field H in the X-axis direction is printed on the Hall element 1 by the coil 4.
- a permanent magnet 3 applies a DC magnetic field H in the Z-axis direction.
- the state of the change of the magnetization vector of the magnetic fine particles will be described using DC3.
- the magnetization vector of the magnetic fine particles 50 fluctuates in the X-axis direction.
- H When H is turned ON, the magnetization vector of the magnetic fine particles 50 follows the entire magnetic field. It fluctuates in the XZ plane.
- the Hall element 1 detects only the magnetic field in the Z-axis direction and cannot detect the magnetic field in the X-axis direction, so no magnetic field is detected when H is OFF.
- the output terminal of the Hall element 1 has a DC magnetic field H in the Z-axis direction and a magnetization M of the magnetic fine particles 50.
- Is output This output is appropriately amplified by the preamplifier 6 if necessary, and then input to the lock-in amplifier 7.
- the magnetization of the magnetic fine particles fluctuates at twice the frequency of the AC magnetic field. That is, it is sufficient that the reference signal input terminal of the lock-in amplifier 7 is input with a frequency, for example, twice the frequency of the AC magnetic field H.
- the output of the lock-in amplifier 7 indicates the output V. This indicates that cells, nucleic acids, nocteria, and the like are present.
- the magnetic fine particles 50 are adsorbed on the Hall element 1
- the fluctuation of the magnetization of the Z component does not occur, so that the output of the lock-in amplifier 7 becomes 0, indicating that no magnetic fine particles are present. I understand.
- the magnetic field may be generated in any direction as long as an AC magnetic field in a predetermined direction on the XY plane can be applied to the Hall element 1, so that the AC magnetic field is generated in the Y-axis direction. You may. That is, the AC magnetic field and the DC magnetic field may be applied to the Hall element 1 in such a relation that the lock-in amplifier 7 can detect the fluctuation of the Z component of the magnetic fine particles 50 placed on the Hall element 1. .
- FIG. 4 is a schematic block diagram for explaining a magnetic particle detecting device according to a second embodiment of the present invention.
- the parts denoted by the same reference numerals as those in FIG. 1 represent the same parts, and the basic configuration is the same as that of the first embodiment shown in FIG. Fig. 4 shows the relationship between the AC power supply and coil that generated the AC magnetic field H in the X-axis direction as shown in Fig. 4.
- an AC magnetic field generating mechanism including a permanent magnet and a rotating mechanism for rotating the permanent magnet is used.
- the other components and principles are basically the same as those of the first embodiment, and a detailed description will be omitted.
- the AC magnetic field generating mechanism of the second embodiment for example, has a force with the outer peripheral multipolar permanent magnet 10 and the motor 11 for rotating the same, and the outer peripheral multipolar permanent magnet 10 is provided on the XY plane and rotated by the motor 11. As a result, an AC magnetic field H in the X-axis direction is applied to the Hall element 1. Also Rocky
- the rotation frequency of the motor 11 is used as the reference signal frequency of the amplifier 7.
- the shape of the permanent magnet is not limited to the multi-periphery, and various permanent magnets can be used as long as they can generate an AC magnetic field.
- FIG. 5 is a schematic block diagram for explaining a magnetic fine particle detection device according to a third embodiment of the present invention
- FIG. 6 is a cross-sectional view thereof.
- the parts denoted by the same reference numerals as those in FIG. 1 represent the same objects, and the basic principle of detection is the same as that of the first embodiment shown in FIG.
- Fig. 5 instead of the AC power supply and the coil that generated the AC magnetic field H in the X-axis direction,
- the AC magnetic field generating mechanism of the third embodiment includes an AC power supply 21 and a conductor 22 connected thereto.
- the conductor 22 is provided on the Hall element 1 in parallel. More specifically, an insulating film 23 is formed on the Hall element 1 formed on the substrate 8, and a conductive wire 22 is formed thereon along the X-axis direction. Then, an insulating film 9 having a material strength for adsorbing a desired target bonded to the magnetic fine particles is formed thereon.
- an AC magnetic field is generated around the conductor 22.
- an AC magnetic field H in the Y-axis direction is applied to the Hall element 1.
- the DC magnetic field H in the Z-axis direction becomes OF
- the Hall element 1 detects only the magnetic field in the Z-axis direction and cannot detect the magnetic field in the Y-axis direction.When H is OFF, no magnetic field is detected, but H is ON. When it becomes
- the magnetic field fluctuating on the YZ plane due to the magnetic fine particles 50 can be detected.
- FIG. 7 is a schematic block diagram for explaining a magnetic particle detecting device according to a fourth embodiment of the present invention.
- the parts denoted by the same reference numerals as those in FIG. 6 represent the same objects, and the basic principle of detection is the same as that of the third embodiment shown in FIG.
- the point is that a plurality of Hall elements are connected in series as shown in FIG.
- Other components and principles are basically the same as those of the third embodiment, and thus illustration and detailed description are omitted.
- the fourth embodiment has a configuration in which a plurality of the detection devices of the third embodiment are connected in series. This allows a plurality of sensor portions to be formed at once by a semiconductor processing process.
- a plurality of Hall elements 1 are connected, and a conductive wire 22 is provided thereon in parallel with an insulating film 23 interposed therebetween.
- an AC magnetic field is applied in the Y-axis direction by flowing an AC current through the conducting wire 22.
- an insulating film 9 having a material force for adsorbing a desired target bonded to the magnetic fine particles is provided on the sensor.
- the insulating film 9 on each Hall element is formed of a different material according to the type of the target so that only predetermined magnetic fine particles are absorbed.
- the presence or absence of the predetermined magnetic fine particles can be independently detected at each sensor portion, so that a plurality of targets can be detected at once in a short time. Screening becomes possible.
- FIG. 8 is a schematic cross-sectional view for explaining the surface structure of the Hall element used in the detection device according to the present invention.
- the Hall element 1 according to the present invention is an example For example, an element containing InSb, InAs, AlGaN / GaN, Bi, GaAs / AlGaAs, or Si as a main component is preferable. Such a Hall element 1 is provided on a substrate 8.
- an insulating film 9 is deposited on the Hall element 1 to a thickness of about 200 nm.
- the insulating film 9 is provided for waterproofing the Hall element 1.
- Various methods are available for depositing the insulating film 9 In order to realize a high-sensitivity detection device, it is necessary to form the insulating film as thin and uniform as possible. Sometimes it is preferable to use a method that does not damage the Hall element 1. Specifically, it is preferable to use a dual target magnetron RF sputtering method. What is the dual target magnetron RF sputtering method? "FACING TARGETS TYPE OF SPUTTERING METHOD
- a substrate is arranged, and a gas such as Ar is provided into the reaction chamber to form a silicon nitride film or an oxidized silicon film on the Hall element 1. Thereby, a thin and uniform insulating film is deposited on the hole element 1.
- a base layer 30 made of titanium or chromium is deposited to a thickness of about 10 nm.
- a gold thin film 31 is deposited on the base layer 30 to a thickness of about 100 nm.
- the base layer 30 is provided for firmly attaching the gold thin film 31 to the insulating film 9.
- a Hall element used in a magnetic fine particle detection device is formed. After that, if necessary, the entire portion of the Hall element other than the sensor portion may be subjected to a waterproof treatment with a silicon gel or the like.
- a magnetic fine particle detection device in order to apply the same to a biosensor, the magnetic fine particles must be fixed on a Hall element using a physiologically active substance.
- a physiologically active substance for this purpose, it is possible to utilize a commonly known bond between gold and thiol.
- the thiol compound is chemisorbed on the gold thin film surface, the self-assembled thiol A self-assembled monolayer (SAM) is formed.
- SAM formed by a thiol compound such as DDPA (3, 3'-dithiodipropionic acid) can have various functions by selecting a terminal functional group.
- thiolrich DNA a thiol group-bonded DNA
- DNA is chemically more stable than protein and forms a double strand (hybridization), so sensing is performed using this interaction.
- thiolrich DNA a thiol group-bonded DNA
- DDPA is used as a thiol conjugate
- the single-stranded DNA is immobilized on the surface of the gold thin film by modifying the end thereof, and the complementary single-stranded DNA previously immobilized on magnetic fine particles is used.
- the magnetic fine particles are immobilized on the surface of the gold thin film by hybridization with DNA.
- the Two Step method after thiolyed DNA is bound to the surface of the gold thin film, the thiolated DNA is bound using a 6-hydroxyl hexanethiol, and a large amount of 6-hydroxy-11-hexanethiol is formed around the thiolated DNA molecule. Surround with molecules. Since the hydrophilic thiol DNA molecule surrounded by the hydrophobic chain exists in a certain direction while maintaining a certain distance, it must exist as a single chain and perform double strand formation predominantly. Is possible.
- the single-stranded DNA of the magnetic fine particles and the target DNA are hybridized in advance and then bonded to the surface of the gold thin film.
- the substrate having the surface of the Hall element treated as shown in FIG. 8 is immersed in a dithiodipropionic acid aqueous solution (4 mM) for 30 minutes to 18 hours, and then washed with water (FIG. 9 (A)). Then, EDC (1-ethyl-3- (3-dimethylaminopropyl) carbodiimide hydrochloride) and N-hydroxysuccinimide solution were mixed in equal amounts (100 mgZml) of each solution, and the substrate after the above treatment was added thereto for 20 minutes. Soak and then wash with water (Fig. 9 (B)).
- the detection device subjected to the surface treatment as described above is immersed in a solution containing magnetic fine particles having complementary DNA immobilized on the surface, left for 24 hours while applying vibration, and then washed twice with 2M NaCl. I do. Then, as shown in FIG. 9 (F), the target DNA forms a double strand, and the magnetic fine particles are fixed on the Hall element.
- FIG. 10 (A) shows the output waveform of the lock-in amplifier when the magnetic fine particles are not fixed on the Hall element of the detection device of the present invention
- FIG. 10 (B) shows the lock waveform when the magnetic fine particles are fixed
- 3 shows an output waveform of an in-amplifier.
- the left side of each figure is a top view of the Hall element of the detection device of the present invention, and the right side is an output waveform.
- the lock-in amplifier output was also output in a pulse form. As described above, by observing the output of the lock-in amplifier of the detection device of the present invention, it is possible to detect whether or not the magnetic fine particles to which the target DNA is attached are present.
- a concave portion may be formed on the substrate 8 immediately below the Hall element 1. This is provided to change the flow of the solution around the Hall element so that the magnetic fine particles can be efficiently and better fixed on the Hall element 1.
- the magnetic fine particles can be fixed on the sensor more efficiently because they stay in the concave portion or return to the sensor again than when the magnetic fine particles flow on the sensor having a flat surface. Further, the magnetic fine particles are also placed on the back side of the Hall element, that is, on the surface of the Hall element on the substrate side.
- an insulating film, a base layer, and a gold thin film are formed on the back surface of the Hall element in the same manner as on the front surface.
- the concave provided on the back side Since the magnetic fine particles existing in the portion can also be bonded to the gold thin film and can be measured on the back surface side, there is an advantage that the measurement speed can be extremely short. It is to be noted that, even when the sensor section is provided on the back side, a configuration in which a plurality of detection devices are connected in series as described with reference to FIG. As a result, the magnetic fine particles can be more efficiently detected at high speed.
- the magnetic fine particle detection device of the present invention is not limited to the illustrated example described above, but may be variously modified without departing from the gist of the present invention.
- Electromagnets that need to be considered may be used. With an electromagnet, ONZOFF control of the applied magnetic field by the ONZ OFF operation of the switch is possible.
- FIG. 1 is a schematic block diagram for explaining a magnetic fine particle detection device according to a first embodiment of the present invention.
- FIG. 2 is a cross-sectional view of the Hall element 1 of the magnetic fine particle detection device according to the first embodiment of the present invention.
- FIG. 3 is a diagram illustrating a magnetic particle when a DC magnetic field is applied in the magnetic fine particle detection device of the present invention.
- FIG. 4 is a diagram showing a change of a magnetic particle vector of a conductive fine particle and an output of a lock-in amplifier.
- FIG. 4 is a schematic block diagram for explaining a magnetic fine particle detection device according to a second embodiment of the present invention.
- FIG. 5 is a schematic block diagram for explaining a magnetic fine particle detection device according to a third embodiment of the present invention.
- FIG. 6 is a cross-sectional view of the Hall element 1 of the magnetic fine particle detection device according to the third embodiment of the present invention.
- FIG. 7 is a schematic block diagram for explaining a magnetic fine particle detection device according to a fourth embodiment of the present invention.
- FIG. 8 is a cross-sectional view for explaining a surface treatment of a Hall element that is applied to the magnetic fine particle detection device of the present invention.
- FIG. 9 is a cross-sectional view for more specifically explaining the surface treatment of a Hall element applied to the magnetic fine particle detection device of the present invention.
- FIG. 10 is a view showing output signals of a lock-in amplifier in a state where the magnetic fine particles are fixed and a state where the magnetic fine particles are not fixed in the magnetic fine particle detection device of the present invention.
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2007212233A (ja) * | 2006-02-08 | 2007-08-23 | Asahi Kasei Corp | バイオセンサ |
JP2014224741A (ja) * | 2013-05-16 | 2014-12-04 | 国立大学法人豊橋技術科学大学 | 磁性微粒子検出装置及び磁性微粒子検出方法 |
CN110880927A (zh) * | 2019-11-04 | 2020-03-13 | 中国科学院西安光学精密机械研究所 | 一种集成式接近开关、接近开关系统及接近开关制造方法 |
JP2020109409A (ja) * | 2015-10-14 | 2020-07-16 | インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation | ナノスケール・レベルにおける流体流解析のためのグラフェンベースの磁気ホール・センサ |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007212233A (ja) * | 2006-02-08 | 2007-08-23 | Asahi Kasei Corp | バイオセンサ |
JP2014224741A (ja) * | 2013-05-16 | 2014-12-04 | 国立大学法人豊橋技術科学大学 | 磁性微粒子検出装置及び磁性微粒子検出方法 |
JP2020109409A (ja) * | 2015-10-14 | 2020-07-16 | インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation | ナノスケール・レベルにおける流体流解析のためのグラフェンベースの磁気ホール・センサ |
DE112016003356B4 (de) | 2015-10-14 | 2021-07-08 | International Business Machines Corporation | Magnetischer Hall-Sensor auf der Grundlage von Graphen für eine Fluidströmungs-Analyse auf Nanomaßstabs-Ebene |
CN110880927A (zh) * | 2019-11-04 | 2020-03-13 | 中国科学院西安光学精密机械研究所 | 一种集成式接近开关、接近开关系统及接近开关制造方法 |
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