WO2005078428A1 - キズ検査用基準ゲージの製造方法 - Google Patents
キズ検査用基準ゲージの製造方法 Download PDFInfo
- Publication number
- WO2005078428A1 WO2005078428A1 PCT/JP2005/002832 JP2005002832W WO2005078428A1 WO 2005078428 A1 WO2005078428 A1 WO 2005078428A1 JP 2005002832 W JP2005002832 W JP 2005002832W WO 2005078428 A1 WO2005078428 A1 WO 2005078428A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- piece
- reference gauge
- flaw
- manufacturing
- inspection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
Definitions
- the present invention relates to nuclear power, rockets, aircraft, ships, vehicles, motorcycles, locomotives, machineries, tanks, plants, bridges, bridges, buildings, keys, objects, etc.
- the present invention relates to a method of manufacturing a reference gauge used to determine whether or not the inspection method is correct when measuring a flaw in a flaw inspection object, and particularly to a maintenance standard determined for flaw evaluation.
- the present invention relates to a method for manufacturing a reference gauge for flaw inspection, which can correctly judge whether the inspection object is acceptable or not.
- VT visual inspection
- UT ultrasonic inspection
- ET eddy current inspection
- a test piece reference gauge
- EDM electric discharge machining
- a material having a processing accuracy of 1 Z17 at least about 30 ⁇ m is required.
- the reference flaw is about 500 m due to electric discharge machining. Yes, and does not satisfy the above conditions.
- existing electric discharge machines and electronic beam machines cannot process flaws narrower than 500 ⁇ m.
- RT, ET, VT various test methods
- An object of the present invention is to provide a method for manufacturing a standard gauge for flaw inspection which has a simple structure, which can be processed even if it is flawless, and which can accurately perform flaw inspection of flaw detection objects of various materials.
- the present invention is directed to the first and second pieces made of the same or different materials such as metals, nonmetals, noble metals, alloys, ceramics, and composite materials.
- Grooves, thin wires, and thin strips (hereinafter referred to as concave grooves) corresponding to the maintenance standards for scratches on the inspection object on the joining surface and end face of a single row, parallel, multiple layers parallel, stacked, multiple layers
- a method of manufacturing a reference gauge for flaw inspection formed by laminating comprising: a first step of finishing a joint surface of the first piece and the second piece to a predetermined roughness; A second step of forming the concave groove or the like in a part of a joint surface or an end surface of one or both of the first piece and the second piece; and performing a process of preventing the concave groove or the like from being diffusely bonded.
- the invention according to claim 4 is characterized in that the formation of the concave groove or the like is performed by laser, electron beam, discharge heating, water jet, etching, or arc machining.
- the invention according to claim 5 is characterized in that the first piece and the second piece are made of the same material as the configuration of the inspection object and a combination thereof.
- the invention according to claim 6 is characterized in that the connection between the first piece and the second piece is formed by welding, and the groove or the like is formed on a welding joint surface, a boundary surface thereof, and a base material. It is characterized by being formed.
- a groove or the like formed in the first piece and / or the second piece can be formed into a form corresponding to the maintenance standard.
- the reference gauge for flaw inspection can accurately hold the groove and the like integrally in the structure, and can manufacture a high-quality reference gauge.
- the method of manufacturing the reference gauge for flaw detection according to claim 2 by performing the oxidation treatment, it is possible to prevent a groove or the like from being lost at the time of diffusion bonding, and to form a reference groove having a desired form. .
- the means of the oxidation treatment is specifically shown, and the nickel and the like do not disappear by diffusion bonding.
- the method of manufacturing a reference gauge for detecting a flaw according to claim 4 since the concave groove or the like is formed by laser processing or the like, it is possible to form the concave groove or the like in an extremely fine shape and accurately. it can. Also, it can be applied to pieces of any material for laser processing and the like. According to the method for manufacturing a reference gauge for a flaw inspection according to claim 5, since the reference gauge pieces are formed of the same material and material combination as the inspection object, accurate flaw determination is performed. Can be.
- FIG. 1 is a perspective view showing the overall schematic structure of a flaw inspection reference gauge according to the present invention.
- FIG. 2 is a sectional view taken along line A—A in FIG.
- FIG. 3 is a schematic perspective view for explaining the first step of the method of manufacturing the reference gauge for flaw inspection according to the present invention.
- FIG. 4 is a schematic perspective view for explaining a second step of the method for manufacturing a reference gauge for scratch inspection according to the present invention.
- FIG. 5 illustrates the third step of the method for manufacturing a reference gauge for scratch inspection according to the present invention.
- FIG. 6 is a schematic configuration diagram for explaining a fourth step of the method of manufacturing the reference gauge for flaw detection according to the present invention.
- FIG. 7 is a flowchart for explaining a method of manufacturing the reference gauge for flaw detection according to the present invention.
- FIG. 8 Perspective view (a) and cross-sectional views (b), (c), (d) showing a reference gauge for flaw inspection when the joint surface is a welded joint.
- BEST MODE FOR CARRYING OUT THE INVENTION an embodiment of a method of manufacturing a reference gauge for flaw inspection according to the present invention will be described in detail with reference to the drawings.
- Fig. 1 (a), Fig. 1 (b) and Fig. 2 show the schematic structure of the reference gauge for flaw detection.
- the reference gauge for flaw inspection 1 is formed by combining a first piece 2 and a second piece 3, and a groove 4 or the like is formed at the joint surfaces 2a and 3a.
- the shape and shape of the concave groove 4 correspond to the shape and shape of the flaw as a maintenance standard.
- the material of the first piece 2 and the second piece 3 is the same as the material composition of the inspection object. That is, it is widely applied not only to the same material but also to different materials.
- the concave groove 4 and the like are formed inside, they cannot be confirmed by ordinary visual inspection, but can be easily confirmed by a test device that can see through the interior. Since the concave groove 4 is formed by, for example, laser processing, the material of the first piece 2 and the second piece 3 is not only steel but also stainless steel, copper, aluminum, titanium, tantalum, Tungsten, molybdenum, magnesium, ceramics gold, silver, and composite materials are used.
- This manufacturing method generally includes first to fourth steps.
- First, the first step will be described. After forming the first piece 2 and the second piece 3 as a block having a predetermined shape, as shown in FIG. 3, the joining surfaces 2a and 3a of the first piece 2 and the second piece 3 are formed. Finish processing. In order to integrally join the first piece 2 and the second piece 3 by diffusion joining described later, it is necessary that both joining surfaces 2a and 3a be finished with high precision. is there. For example, it is desirable to finish it below ILS. Various methods are used as the finishing method, and known techniques can be applied to these methods.
- a groove 4 or the like is formed on the joining surface 2a of the first piece 2 by laser processing or the like.
- the concave grooves 4 correspond to the maintenance standard as described above.
- square grooves 4 and the like 4 are formed.
- the present invention is not limited to this, and is not limited to various shapes and single rows, but may be a parallel, multi-layer, or stacked shape.
- the concave groove 4 is formed only on the first piece 2 side, but may be formed on the second piece 3 side, or formed on both the first piece 2 and the second piece 3. May be done.
- the concave groove 4 and the like are formed in a form corresponding to the maintenance standard.
- the third step will be described.
- the main purpose of diffusion bonding is to integrate the bonding surfaces tightly without gaps, so that the concave grooves 4 and the like may be deformed or completely absent during diffusion bonding.
- a third step is performed in order to substantially maintain the concave groove 4 or the like in a state of being laser-processed. This step is to prevent deformation of the groove 4 and the like at the time of diffusion bonding, that is, to prevent the influence of diffusion bonding.
- the oxidation treatment may be automatically performed during the processing of the concave groove 4 in the second step.
- fine particles of carbon 5 are introduced into the groove 4 or the like (FIG. 5 a), or a portion of the groove 4 is oxidized (FIG. 5 (6)). Then, an oxide layer 6 is formed. Thereby, the form of the concave groove 4 can be maintained.
- the fourth step will be described with reference to FIG. This step is a diffusion bonding process.
- Diffusion bonding is performed by a HIP (Hot I sostatie Pressing) apparatus and is a known technique. Specifically, the first piece 2 and the second piece 3 are joined together, sealed in a vacuum with a capsule 7, and put into an HIP device to perform HIP processing. Specifically, it is performed by pressing by vacuum heating or high-frequency heating. The first piece 2 and the second piece 3 are integrated by diffusion bonding by performing the HIP process appropriate for the piece shape. Here, the capsule 7 is removed and finishing processing is performed to produce a desired flaw inspection reference gauge 1.
- the reference gauge 1 for flaw inspection is manufactured through the above steps, there is know-how that does not disclose the manufacturing process, thereby making it possible to form the reference gauge 1 for flaw inspection with any shape and high accuracy. it can.
- FIG. 8 shows a reference gauge la ((a)) for flaw detection when the first piece 2 and the second piece 3 are welded together.
- the reference gauge 1a for the flaw detection uses the same welded test piece as the object to be inspected as a welded portion 8 (cross section B—B (b)) and its boundary surface (cross section C—C (cross section)). c)) and the base material (cross section D-D (d)), and each cut surface is formed by performing the process shown in the flowchart of FIG. 7 described above.
- the reference gouge for flaw inspection manufactured according to the present invention is used as a reference gauge for flaw inspection of all structures and buildings, and its use range is extremely wide. In particular, it is extremely effective for safety management of nuclear power and space development equipment, etc., which need to maintain high precision and high quality. It is widely used and is extremely useful as a tool for ensuring safety. Shall be used.
- the reference gauge for flaw detection according to the present invention is sold to users and used, it is necessary to perform sales management on the manufacturing side. Therefore, the mark required for management of the material, serial number, etc., is displayed on the reference gauge for flaw detection by engraving, etching, etc., and is managed by the manufacturer using IT methods based on this.
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- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005518075A JPWO2005078428A1 (ja) | 2004-02-17 | 2005-02-16 | キズ検査用基準ゲージの製造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-39473 | 2004-02-17 | ||
JP2004039473A JP2007078350A (ja) | 2004-02-17 | 2004-02-17 | キズ検査用基準ゲージの製造方法 |
Publications (2)
Publication Number | Publication Date |
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WO2005078428A1 true WO2005078428A1 (ja) | 2005-08-25 |
WO2005078428A8 WO2005078428A8 (ja) | 2006-02-16 |
Family
ID=34857845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/002832 WO2005078428A1 (ja) | 2004-02-17 | 2005-02-16 | キズ検査用基準ゲージの製造方法 |
Country Status (2)
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JP (2) | JP2007078350A (ja) |
WO (1) | WO2005078428A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7592191B2 (en) | 2001-08-11 | 2009-09-22 | The University Court Of The University Of Dundee | Field emission backplate |
JP2012237640A (ja) * | 2011-05-11 | 2012-12-06 | Nippon Steel Corp | 人工空間を有する鋼板とその製造方法並びにこれを用いた漏洩磁束探傷装置の評価方法 |
CN103048171A (zh) * | 2011-10-12 | 2013-04-17 | 高雄应用科技大学 | 金属压合测试治具结构 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6104636B2 (ja) | 2013-02-27 | 2017-03-29 | 三菱重工業株式会社 | 検査方法および検査装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5855752A (ja) * | 1981-09-28 | 1983-04-02 | Kawasaki Heavy Ind Ltd | 非破壊検査用模擬欠陥標準試験片の製造方法 |
JPS6214370U (ja) * | 1985-07-11 | 1987-01-28 | ||
JPH03293558A (ja) * | 1990-04-11 | 1991-12-25 | Mitsubishi Heavy Ind Ltd | 拡散接合法による超音波探傷用標準試験片の作製方法 |
JPH0961313A (ja) * | 1995-08-25 | 1997-03-07 | Ishikawajima Harima Heavy Ind Co Ltd | 非破壊検査用標準試験体およびその製造方法 |
-
2004
- 2004-02-17 JP JP2004039473A patent/JP2007078350A/ja active Pending
-
2005
- 2005-02-16 JP JP2005518075A patent/JPWO2005078428A1/ja active Pending
- 2005-02-16 WO PCT/JP2005/002832 patent/WO2005078428A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5855752A (ja) * | 1981-09-28 | 1983-04-02 | Kawasaki Heavy Ind Ltd | 非破壊検査用模擬欠陥標準試験片の製造方法 |
JPS6214370U (ja) * | 1985-07-11 | 1987-01-28 | ||
JPH03293558A (ja) * | 1990-04-11 | 1991-12-25 | Mitsubishi Heavy Ind Ltd | 拡散接合法による超音波探傷用標準試験片の作製方法 |
JPH0961313A (ja) * | 1995-08-25 | 1997-03-07 | Ishikawajima Harima Heavy Ind Co Ltd | 非破壊検査用標準試験体およびその製造方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7592191B2 (en) | 2001-08-11 | 2009-09-22 | The University Court Of The University Of Dundee | Field emission backplate |
JP2012237640A (ja) * | 2011-05-11 | 2012-12-06 | Nippon Steel Corp | 人工空間を有する鋼板とその製造方法並びにこれを用いた漏洩磁束探傷装置の評価方法 |
CN103048171A (zh) * | 2011-10-12 | 2013-04-17 | 高雄应用科技大学 | 金属压合测试治具结构 |
Also Published As
Publication number | Publication date |
---|---|
WO2005078428A8 (ja) | 2006-02-16 |
JPWO2005078428A1 (ja) | 2008-01-10 |
JP2007078350A (ja) | 2007-03-29 |
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