WO2005064280A2 - Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure - Google Patents

Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure Download PDF

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Publication number
WO2005064280A2
WO2005064280A2 PCT/EP2004/014701 EP2004014701W WO2005064280A2 WO 2005064280 A2 WO2005064280 A2 WO 2005064280A2 EP 2004014701 W EP2004014701 W EP 2004014701W WO 2005064280 A2 WO2005064280 A2 WO 2005064280A2
Authority
WO
WIPO (PCT)
Prior art keywords
ofthe
measurement
set forth
error
value
Prior art date
Application number
PCT/EP2004/014701
Other languages
English (en)
Other versions
WO2005064280A3 (fr
Inventor
Alexander V. Lopatin
Sergey Ermishin
Original Assignee
Madison Technologies Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from RU2003137664/28A external-priority patent/RU2003137664A/ru
Priority claimed from RU2003137663/28A external-priority patent/RU2003137663A/ru
Application filed by Madison Technologies Limited filed Critical Madison Technologies Limited
Publication of WO2005064280A2 publication Critical patent/WO2005064280A2/fr
Publication of WO2005064280A3 publication Critical patent/WO2005064280A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing

Abstract

L'invention concerne un procédé, un appareil et un programme de traitement de mesures. Cet appareil comprend une interface électronique possédant une entrée au niveau de laquelle sont appliqués au moins deux signaux non compensés qui représentent respectivement une mesure d'une quantité physique prédéterminée, ladite interface électronique présentant aussi une sortie. Un module de calcul de l'appareil est couplé à la sortie. Ce module de calcul permet de déterminer une erreur dans au moins un des signaux non compensés en fonction de ces signaux non compensés. L'erreur déterminée comporte au moins des composantes d'erreur aléatoire et systématique ?syst et ?rand. Ce module de calcul permet également de compenser une erreur dans au moins un signal non compensé afin de produire un signal compensé, à partir de l'erreur déterminée. Ledit signal compensé représente pratiquement une valeur réelle de la quantité physique prédéterminée soumise à l'origine à une mesure.
PCT/EP2004/014701 2003-12-29 2004-12-23 Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure WO2005064280A2 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
RU2003137664 2003-12-29
RU2003137664/28A RU2003137664A (ru) 2003-12-29 2003-12-29 Способ повышения точности измерений
RU2003137663 2003-12-29
RU2003137663/28A RU2003137663A (ru) 2003-12-29 2003-12-29 Устройство обработки данных результатов измерений

Publications (2)

Publication Number Publication Date
WO2005064280A2 true WO2005064280A2 (fr) 2005-07-14
WO2005064280A3 WO2005064280A3 (fr) 2005-11-03

Family

ID=34742253

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/014701 WO2005064280A2 (fr) 2003-12-29 2004-12-23 Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure

Country Status (1)

Country Link
WO (1) WO2005064280A2 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105203148B (zh) * 2015-09-30 2018-03-23 湖北工业大学 一种汽车组合仪表的视觉检测方法
CN114137905A (zh) * 2021-11-18 2022-03-04 合肥欣奕华智能机器有限公司 一种误差补偿方法、装置及存储介质

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2646927A1 (de) * 1976-10-18 1978-04-20 Bieler & Lang Ohg Verfahren und vorrichtung zur temperaturkompensation
SU1649460A1 (ru) * 1988-09-19 1991-05-15 Институт Автоматики Ан Киргсср Способ измерени электрических и неэлектрических параметров
US5642301A (en) * 1994-01-25 1997-06-24 Rosemount Inc. Transmitter with improved compensation
US5777468A (en) * 1996-12-19 1998-07-07 Texas Instruments Incorporated Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus
DE19715590A1 (de) * 1997-04-15 1998-11-05 Bosch Gmbh Robert Sensormodul
DE19747510A1 (de) * 1997-10-28 1999-05-06 Sican F & E Gmbh Sibet Meßsystem und Verfahren zur Auswertung von Sensorsignalen
EP1045226A1 (fr) * 1999-04-15 2000-10-18 Matsushita Electric Industrial Co., Ltd. Appareil et procédé de correction de signaux
US6140824A (en) * 1996-01-17 2000-10-31 Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen Circuit arrangement for the metrological determination of diameters of metal bodies
US6198275B1 (en) * 1995-06-07 2001-03-06 American Electronic Components Electronic circuit for automatic DC offset compensation for a linear displacement sensor
EP1108986A1 (fr) * 1999-12-16 2001-06-20 Denso Corporation Méthode et dispositif pour le réglage à compensation thermique de la position d'une soupape à papillon
US20010051857A1 (en) * 2000-06-13 2001-12-13 Mitutoyo Corporation Surface texture measuring machine and method of correcting a measured value for the machine
US20020066312A1 (en) * 2000-12-01 2002-06-06 Lebrun Ivan P. Self-compensating position sensor

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2646927A1 (de) * 1976-10-18 1978-04-20 Bieler & Lang Ohg Verfahren und vorrichtung zur temperaturkompensation
SU1649460A1 (ru) * 1988-09-19 1991-05-15 Институт Автоматики Ан Киргсср Способ измерени электрических и неэлектрических параметров
US5642301A (en) * 1994-01-25 1997-06-24 Rosemount Inc. Transmitter with improved compensation
US6198275B1 (en) * 1995-06-07 2001-03-06 American Electronic Components Electronic circuit for automatic DC offset compensation for a linear displacement sensor
US6140824A (en) * 1996-01-17 2000-10-31 Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen Circuit arrangement for the metrological determination of diameters of metal bodies
US5777468A (en) * 1996-12-19 1998-07-07 Texas Instruments Incorporated Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus
DE19715590A1 (de) * 1997-04-15 1998-11-05 Bosch Gmbh Robert Sensormodul
DE19747510A1 (de) * 1997-10-28 1999-05-06 Sican F & E Gmbh Sibet Meßsystem und Verfahren zur Auswertung von Sensorsignalen
EP1045226A1 (fr) * 1999-04-15 2000-10-18 Matsushita Electric Industrial Co., Ltd. Appareil et procédé de correction de signaux
EP1108986A1 (fr) * 1999-12-16 2001-06-20 Denso Corporation Méthode et dispositif pour le réglage à compensation thermique de la position d'une soupape à papillon
US20010051857A1 (en) * 2000-06-13 2001-12-13 Mitutoyo Corporation Surface texture measuring machine and method of correcting a measured value for the machine
US20020066312A1 (en) * 2000-12-01 2002-06-06 Lebrun Ivan P. Self-compensating position sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105203148B (zh) * 2015-09-30 2018-03-23 湖北工业大学 一种汽车组合仪表的视觉检测方法
CN114137905A (zh) * 2021-11-18 2022-03-04 合肥欣奕华智能机器有限公司 一种误差补偿方法、装置及存储介质
CN114137905B (zh) * 2021-11-18 2023-10-03 合肥欣奕华智能机器股份有限公司 一种误差补偿方法、装置及存储介质

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Publication number Publication date
WO2005064280A3 (fr) 2005-11-03

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