WO2005064280A3 - Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure - Google Patents
Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure Download PDFInfo
- Publication number
- WO2005064280A3 WO2005064280A3 PCT/EP2004/014701 EP2004014701W WO2005064280A3 WO 2005064280 A3 WO2005064280 A3 WO 2005064280A3 EP 2004014701 W EP2004014701 W EP 2004014701W WO 2005064280 A3 WO2005064280 A3 WO 2005064280A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- error
- program
- uncompensated
- calculation module
- processing apparatus
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
- G06F2218/02—Preprocessing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Abstract
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU2003137663/28A RU2003137663A (ru) | 2003-12-29 | 2003-12-29 | Устройство обработки данных результатов измерений |
RU2003137663 | 2003-12-29 | ||
RU2003137664/28A RU2003137664A (ru) | 2003-12-29 | 2003-12-29 | Способ повышения точности измерений |
RU2003137664 | 2003-12-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005064280A2 WO2005064280A2 (fr) | 2005-07-14 |
WO2005064280A3 true WO2005064280A3 (fr) | 2005-11-03 |
Family
ID=34742253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/014701 WO2005064280A2 (fr) | 2003-12-29 | 2004-12-23 | Appareil, systeme, procede et programme de traitement de donnees de resultats de mesure |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2005064280A2 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105203148B (zh) * | 2015-09-30 | 2018-03-23 | 湖北工业大学 | 一种汽车组合仪表的视觉检测方法 |
CN114137905B (zh) * | 2021-11-18 | 2023-10-03 | 合肥欣奕华智能机器股份有限公司 | 一种误差补偿方法、装置及存储介质 |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2646927A1 (de) * | 1976-10-18 | 1978-04-20 | Bieler & Lang Ohg | Verfahren und vorrichtung zur temperaturkompensation |
SU1649460A1 (ru) * | 1988-09-19 | 1991-05-15 | Институт Автоматики Ан Киргсср | Способ измерени электрических и неэлектрических параметров |
US5642301A (en) * | 1994-01-25 | 1997-06-24 | Rosemount Inc. | Transmitter with improved compensation |
US5777468A (en) * | 1996-12-19 | 1998-07-07 | Texas Instruments Incorporated | Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus |
DE19715590A1 (de) * | 1997-04-15 | 1998-11-05 | Bosch Gmbh Robert | Sensormodul |
DE19747510A1 (de) * | 1997-10-28 | 1999-05-06 | Sican F & E Gmbh Sibet | Meßsystem und Verfahren zur Auswertung von Sensorsignalen |
EP1045226A1 (fr) * | 1999-04-15 | 2000-10-18 | Matsushita Electric Industrial Co., Ltd. | Appareil et procédé de correction de signaux |
US6140824A (en) * | 1996-01-17 | 2000-10-31 | Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen | Circuit arrangement for the metrological determination of diameters of metal bodies |
US6198275B1 (en) * | 1995-06-07 | 2001-03-06 | American Electronic Components | Electronic circuit for automatic DC offset compensation for a linear displacement sensor |
EP1108986A1 (fr) * | 1999-12-16 | 2001-06-20 | Denso Corporation | Méthode et dispositif pour le réglage à compensation thermique de la position d'une soupape à papillon |
US20010051857A1 (en) * | 2000-06-13 | 2001-12-13 | Mitutoyo Corporation | Surface texture measuring machine and method of correcting a measured value for the machine |
US20020066312A1 (en) * | 2000-12-01 | 2002-06-06 | Lebrun Ivan P. | Self-compensating position sensor |
-
2004
- 2004-12-23 WO PCT/EP2004/014701 patent/WO2005064280A2/fr active Application Filing
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2646927A1 (de) * | 1976-10-18 | 1978-04-20 | Bieler & Lang Ohg | Verfahren und vorrichtung zur temperaturkompensation |
SU1649460A1 (ru) * | 1988-09-19 | 1991-05-15 | Институт Автоматики Ан Киргсср | Способ измерени электрических и неэлектрических параметров |
US5642301A (en) * | 1994-01-25 | 1997-06-24 | Rosemount Inc. | Transmitter with improved compensation |
US6198275B1 (en) * | 1995-06-07 | 2001-03-06 | American Electronic Components | Electronic circuit for automatic DC offset compensation for a linear displacement sensor |
US6140824A (en) * | 1996-01-17 | 2000-10-31 | Patent-Treuhand-Gesellschaft Fuer Elektrishe Gluehlampen | Circuit arrangement for the metrological determination of diameters of metal bodies |
US5777468A (en) * | 1996-12-19 | 1998-07-07 | Texas Instruments Incorporated | Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus |
DE19715590A1 (de) * | 1997-04-15 | 1998-11-05 | Bosch Gmbh Robert | Sensormodul |
DE19747510A1 (de) * | 1997-10-28 | 1999-05-06 | Sican F & E Gmbh Sibet | Meßsystem und Verfahren zur Auswertung von Sensorsignalen |
EP1045226A1 (fr) * | 1999-04-15 | 2000-10-18 | Matsushita Electric Industrial Co., Ltd. | Appareil et procédé de correction de signaux |
EP1108986A1 (fr) * | 1999-12-16 | 2001-06-20 | Denso Corporation | Méthode et dispositif pour le réglage à compensation thermique de la position d'une soupape à papillon |
US20010051857A1 (en) * | 2000-06-13 | 2001-12-13 | Mitutoyo Corporation | Surface texture measuring machine and method of correcting a measured value for the machine |
US20020066312A1 (en) * | 2000-12-01 | 2002-06-06 | Lebrun Ivan P. | Self-compensating position sensor |
Also Published As
Publication number | Publication date |
---|---|
WO2005064280A2 (fr) | 2005-07-14 |
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