WO2005061132A1 - Verfahren und vorrichtung zum reinigen wenigstens einer prozesskammer zum beschichten wenigstens eines substrats - Google Patents
Verfahren und vorrichtung zum reinigen wenigstens einer prozesskammer zum beschichten wenigstens eines substrats Download PDFInfo
- Publication number
- WO2005061132A1 WO2005061132A1 PCT/EP2004/000250 EP2004000250W WO2005061132A1 WO 2005061132 A1 WO2005061132 A1 WO 2005061132A1 EP 2004000250 W EP2004000250 W EP 2004000250W WO 2005061132 A1 WO2005061132 A1 WO 2005061132A1
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- WO
- WIPO (PCT)
- Prior art keywords
- process chamber
- purge gas
- gas
- coating
- substrate
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/001—General methods for coating; Devices therefor
- C03C17/002—General methods for coating; Devices therefor for flat glass, e.g. float glass
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4407—Cleaning of reactor or reactor parts by using wet or mechanical methods
Definitions
- the invention relates to a device and a method for cleaning at least one process chamber for coating at least one substrate, in particular made of glass.
- hollow glass or flat glass by applying layers, in particular metallic, polymer or hard material layers, can be used to produce glasses for optical applications, mirror glasses or heat and sun protection glasses, for example for window panes, as facade cladding or for displays.
- a layer can be applied in different ways from a solution or from the gas phase.
- the deposition of coating materials from the gas phase makes it possible, in particular, to produce very uniform and, if desired, very thin layers on the glass. In this way, multilayered layers made of different materials can also be obtained particularly advantageously.
- vapor deposition in particular high vacuum evaporation
- precisely calculated amounts of the respective evaporable coating material, in particular metal are completely evaporated in a process chamber at pressures between 10 "8 and 10 " 9 bar.
- the coating material is heated in a crucible in a high vacuum, for example by resistive or inductive heating.
- the vaporous coating material is then deposited very evenly on the comparatively cold substrate, the glass.
- Sputtering or sputtering can be used, for example, to apply metal layers or metal oxide layers to the substrate.
- the coating material in particular metal
- the coating material is switched in the form of a plate (target) as a cathode in a closed system.
- the substrate in particular glass, and a positively charged anode are attached to it.
- BEST ⁇ TIGU ⁇ GSKOPIE Gas is preferably located in a process chamber evacuated to a pressure of 10 "4 to 10 " 6 bar, for example argon (a reaction gas can also be introduced for reactive sputtering).
- a voltage is applied between the anode and the cathode. Electrons are accelerated towards the anode and thereby ionize argon atoms located between them. The positively charged argon atoms are accelerated towards the cathode in the electric field.
- the mechanical impulse transfer of the ions to the target leads to dusting of the target atoms, which are deposited on the opposite substrate, for example a glass pane, and form a film. In addition to neutral atoms of the target, this process also releases electrons.
- a reaction usually first takes place between two educts in the gas space, the reaction product then being deposited on the substrate.
- the process chamber is preferably evacuated before the gaseous starting materials are introduced in order to remove interfering foreign substances; the process itself can take place at normal pressure or at a pressure which is reduced from ambient pressure (10 "5 to 10 " 2 bar).
- a work process or coating process comprises at least the setting of the desired process parameters, which may include the evacuation of the process chamber or coating chamber, as well as the introduction of at least one substrate to be coated into the coating chamber, the coating process from the gas phase, which is preferably carried out under negative pressure or Partial vacuum takes place, as well as the removal of the substrate from the coating chamber.
- the coating process can also be carried out continuously or discontinuously.
- the coating system is evacuated to remove interfering compounds such as water, hydrogen, nitrogen, oxygen or to remove further compounds or gases, for example used in a previous process, from the process chamber.
- the coating system may be advantageous to open the coating system between the individual batches of a discontinuous coating system or for substrate or product change in a continuous coating system as well as for cleaning or maintenance.
- At least ambient air can get into the process chamber, through which in turn disruptive gases, water vapor, water or other compounds are introduced into the process chamber.
- the respective process conditions must then be set again.
- the process chamber is first emptied or evacuated over a predetermined period of time, for example via a suction pump, in order to remove the interfering foreign substances.
- the evacuation of the process chamber usually does not remove all foreign substances.
- substances that have been adsorbed or condensed or trapped gases in particular water or water vapor, but also various other substances or gases, can be converted into the gas phase of the process chamber, which is separated from the suction pump do not completely remove the specified pumping time.
- These substances can then contaminate the process chamber or the substrate introduced into it and thus negatively influence the subsequent coating process.
- the quality of at least the first coated substrates deteriorates.
- these substrates, which are not optimally coated are disposed of as rejects.
- solid components of the coating material can also settle on the inner walls and internals of the process chamber, which, if they fall on the substrate, also cause a certain amount of rejects.
- This object is achieved with regard to the method with the features of patent claim 1 and with regard to the device with the features of patent claim 21.
- the at least one process chamber is flushed with a conditioned purge gas before a coating process.
- the device according to claim 21 is suitable for cleaning at least one process chamber for coating at least one substrate, in particular made of glass, and in particular for use in the method according to claim 1 or one or more of the claims dependent on claim 1 and comprises at least one rinsing device for Introducing a conditioned purge gas into the at least one process chamber and / or for passing a conditioned purge gas through the at least one process chamber before a coating process.
- the substrate is preferably a glass object, in particular a flat glass or a hollow glass.
- the application of layers, in particular metallic layers, polymer layers or hard material layers in one coating process generally gives the glass a certain property or function.
- the coating process includes setting the process parameters, for example pressure and temperature, introducing the substrate into the process chamber and coating the substrate, and removing the coated substrate from the process chamber.
- the coating process preferably takes place at very low pressures, but can also be carried out at any other pressures, for example ambient pressure or normal pressure.
- Chemical and physical methods for deposition from the gas phase are preferably used for coating the substrates, for example CVD methods or PVD methods such as vapor deposition or cathode sputtering.
- the coating can be carried out in only one process chamber, but it is also possible for the substrate to pass through several process chambers, the same coating material or different coating materials being applied to the substrate in each case. If the coating takes place at very low pressure (vacuum), pressure locks are located at the entrance and exit of the process chambers, so that the process conditions in the process chambers remain unchanged when a substrate is inserted and removed.
- the process chamber is purged with conditioned purge gas before the coating process, ie before the process parameters are set and before the substrate is introduced.
- the process chamber is preferably flushed at ambient pressure or normal pressure in order to discharge contaminants such as water, water vapor or other liquids and gases, so that they cannot desorb, evaporate or escape into the process chamber when evacuated.
- the purge gas can be conditioned with regard to the moisture and / or the temperature and / or the pressure and / or the gas composition as a conditioning variable (s) and should preferably be free of other impurities.
- the purge gas can originate from a process preceding the coating or from a separate source. After the purge gas has passed the process chamber (s), it can either be reprocessed or disposed of.
- One idea on which the invention is based is therefore to rinse the process chamber before the start of a coating process to remove as many impurities or foreign substances as possible from the process chamber in order to enable an optimal coating process with reduced, preferably no, reject production. It is generally not possible to intervene in the coating process itself in order to reduce such an impairment of the coating process by foreign substances, since predetermined process parameters must be adhered to for the desired coating result or the desired layer.
- solid particles for example particles of the coating material loosely deposited on the inner walls or internals of the process chamber, can also be at least partially discharged, depending on the respective flow conditions and the particle size.
- Another advantage of the method and the device according to the invention is that the cleaning process, that is to say the purging of the process chamber with purging gas, is possible without intervention in the coating process or in the coating system and its control, since the cleaning process or purging process is independent from the coating process before the start of the coating process and the devices and means for supplying the purge gas into the at least one process chamber of the coating system and / or for passing the purge gas through the at least one process chamber need not be integrated into the coating system.
- Existing openings and locks can be used for the supply or supply of the purge gas, depending on the requirements.
- the means for supplying and removing and conditioning the purge gas are independent of the coating system and can also be controlled and regulated independently.
- the device according to the invention can therefore be easily retrofitted to existing coating systems.
- the coating can also be used to reduce the water content in the
- Base layer a lowering of the red haze in thermal insulation panes, achieve a minimization of PIN holes for discs with low transmission, an improvement in silver crystallinity and an improvement in layer hardness and layer quality.
- the purge gas is conditioned with regard to the moisture.
- the relative humidity of the purge gas before entering the at least one process chamber is set to at most 30%, in particular at most 25%, preferably at most 10% or in special cases even at most 5%. It is particularly advantageous if water or water vapor adsorbed, condensed or trapped in or on the inner walls or internals of the process chamber is advantageous if the purge gas is low in moisture or is dried before being fed into the process chamber. Drying can be carried out by any suitable gas drying process known from the prior art. The moisture can be reduced, for example, by adsorption on a suitable medium or by cooling the gas stream and condensing out the moisture. The humidity of the purge gas, however, can also be increased by suitable methods, should this prove to be advantageous.
- the purging gas is cleaned of foreign substances, in particular filtered, before entering the at least one process chamber. In this way it is prevented that the purge gas carries further impurities into the process chamber.
- All suitable gas cleaning processes known from the prior art can be used for cleaning the purge gas.
- the purge gas can be cleaned using appropriate filter elements such as coarse filters, fine filters or suspended matter filters.
- the temperature of the purge gas is set before entering the at least one process chamber in a predetermined temperature range, preferably at least one predetermined temperature value, in particular in a temperature range between 20 ° C. and 90 ° C., preferably in a temperature range between 60 ° C and 80 ° C.
- the heated purging gas makes it easier to transfer condensed or adsorbed impurities into the gas phase. The higher the temperature of the purge gas is, the more moisture the purging gas can also absorb (for water see Mollier diagram).
- the pressure of the purge gas is set to a predetermined pressure value before entering the at least one process chamber, preferably in a pressure range from 0.8 bar to 1.5 bar.
- the flow rate in the process chamber can then be set via the pressure. Since the purge gas generally flows through the process chamber against ambient pressure or negative pressure, it is advantageous if the purge gas flows out of a conditioning device at an increased pressure with respect to the ambient pressure, so that a relatively high flow rate and a large volume flow through the process chamber are achieved. Furthermore, however, it can also be advantageous to pass the purge gas through the process chamber at a pressure which is reduced with respect to the ambient pressure or to generate a reduced pressure in the process chamber during the cleaning process in order to facilitate the transition of the contaminants into the gas phase.
- Air in particular ambient air, and / or an inert gas is preferably used as the purge gas in the method according to the invention. Flushing with air, especially ambient air, is preferred because it is relatively inexpensive, large quantities are available and, if necessary, conditioned air from a process air circuit can be used. Inert gas is preferably used for purging when, for example, no oxygen or other disruptive gases should be present in the coating process. However, the use of inert gas is usually more expensive than that of air, especially ambient air. In addition, it is possible to use further gases or gas mixtures as the purge gas, which preferably have one or more constituents of the ambient air in any suitable concentration.
- the conditioned purging gas flows through the conditioned purging gas, preferably continuously, in an advantageous embodiment during a cleaning process or purging process.
- at least one cleaning step with flooding of the process chamber with conditioned rinsing gas and subsequent removal of the purge gas is carried out, which can also be carried out in combination with the aforementioned embodiment of the flow, for example subsequent flow through the process chamber.
- a negative pressure can easily be generated when pumping out the purge gas, which facilitates the transition of contaminants into the gas phase.
- the purging gas flows into the process chamber directly after a coating process, as a result of which, when coating in a vacuum, the pressure in the process chamber is increased by the purging gas after the coating process has ended. In this way, depending on the respective coating process, the entry of contaminants into the process chamber when substrate or product change is reduced.
- the coating takes place at very low pressure (vacuum)
- pressure locks at the entrance and / or exit of the process chambers, through which the at least one substrate is led into and out of the process chamber.
- the pressure locks prevent the process conditions in the process chambers, in particular the pressure, from changing when a substrate is introduced and removed. If several process chambers are connected in series, there is usually also at least one pressure lock between these process chambers. This is particularly necessary when different pressures prevail in the different process chambers of a coating device, which is very often the case.
- the pressure locks then prevent gas exchange between the process chambers.
- the pressure locks can be designed such that the substrate is fed into the pressure lock e at the respective ambient pressure, that is to say in particular when it is introduced into a first process chamber at approximately normal pressure and when it is introduced into a further process chamber at the respective pressure in the previous one process chamber.
- the pressure lock is then closed and adjusted to the respective pressure of the following process chamber by evacuation or by adding gas.
- the pressure chamber is then opened to the following process chamber, the substrate in the process chamber.
- the respective pressure equalization is generally carried out by adding ambient air. However, foreign substances can get into the pressure lock via the ambient air, which are carried over into the system during the process and can influence the coating process.
- a pressure lock arranged at an inlet and / or an outlet of the at least one process chamber is therefore purged, preferably by the conditioned purge gas, during the cleaning process flows continuously.
- contaminants can also be removed in the pressure lock which, when the pressure lock is evacuated, pass into the gas phase and, for example, can contaminate the substrate.
- flushing gas conditioned for pressure equalization in the pressure lock flows into the pressure lock and / or if the pressure lock before the at least one substrate reaches the pressure lock and / or while the at least one substrate is in the pressure lock, is flushed with conditioned purge gas.
- this can prevent foreign matter from entering the pressure lock, and on the other hand foreign matter already in the pressure lock or foreign matter introduced through the substrate can be removed.
- the pressure equalization in the pressure chamber is first carried out with purge gas, the purge gas also flows through the pressure lock for a short time, for example to remove foreign substances from the gas phase or from an already introduced substrate, and the pressure chamber is then evacuated.
- the purge gas discharged from the pressure lock can either be discharged into the environment or fed into the purge gas circuit and conditioned again. It can be particularly expedient if the purge gas is mixed from different gas streams. For example, a gas stream from a process preceding the coating can be mixed with a flushing gas stream from conditioned ambient air or conditioned gas, preferably inert gas, in order to reduce the costs for the cleaning process in this way.
- the purge gas is conducted in a circuit.
- the purge gas emerging from the at least one process chamber is conditioned again with regard to the moisture and / or the loading with foreign substances and / or the temperature and / or the pressure and / or the gas composition and again the at least one process chamber or another from the coating independent process.
- the at least one substrate is generally pretreated in a substrate treatment process upstream of the coating process, in particular cleaned in a substrate washing process, preferably with water or another suitable liquid, and a subsequent substrate drying process. It is particularly advantageous if at least part of a conditioned drying gas is used to dry the at least one substrate in the substrate drying process and / or at least part of a drying gas output from the substrate drying process is used at least in part as a purge gas.
- the at least one process chamber is also at least partially heated before and / or during the cleaning process, in particular at least a part of at least one process chamber wall.
- the heat is preferably supplied from the outside via a heating device arranged outside the process chamber.
- the at least one process chamber is then heated, for example inductively or by radiation or by heat conduction, at least in part to a temperature which is generally between 20 ° C. and 60 ° C., in particular between 40 ° C. and 60 ° C.
- the process chamber or the process chamber wall can also be heated to higher temperatures if the chamber, in particular for internals and seals arranged on the process chamber wall, materials used allow this.
- the process chamber can be heated continuously before and / or during the entire cleaning process or only for certain time intervals to temporarily support a cleaning process.
- coating material is generally deposited not only on the substrate, but also on the inner walls and / or internals of the process chamber. If several substrates are coated one after the other, these deposits can accumulate or accumulate on the walls or internals until so-called deposits form. In this case, there is a risk that parts will detach from the depots even with slight vibrations or due to gravity and contaminate the substrate or the product. These products are then disposed of in practice as rejects.
- At least one pulse generator emits at least one mechanical pulse onto a process chamber wall, in particular an outer wall, of the at least one process chamber before and / or during a coating process. This makes it possible to achieve a targeted depot discount, i.e. knocking off coating material particles or depots deposited or deposited on the inner walls and internals of the process chamber.
- Method for cleaning at least one process chamber for coating at least one substrate, in particular made of glass in which at least one pulse generator device generates at least one mechanical pulse before and / or during a coating process a process chamber wall, in particular an outer wall, which gives at least one process chamber, or device for cleaning at least one process chamber for coating at least one substrate, in particular made of glass, which has a pulse generator for generating a pulse on a process chamber wall, in particular an outer wall, of the at least one Process chamber includes.
- these depots can be knocked off at regular intervals or as required, preferably at a time when there is no substrate in the process chamber, ie before a coating process or between the coating processes of several substrates.
- At least one hammer and / or at least one compressed air nozzle and / or at least one vibration unit and / or at least one ultrasonic transmitter are preferably used as the mechanical pulse transmitter device.
- the at least one pulse generator device of the device according to the invention can comprise at least one control unit.
- the mechanical pulse is preferably triggered automatically as a function of at least one process variable. It is particularly advantageous if the strength of the mechanical impulse can also be set as a function of a degree of contamination. In this case, suitable sensors must be provided in the process chamber.
- a process variable which triggers the mechanical impulse or the knocking off is preferably a variable which indicates that there is no substrate in the process chamber at the respective time.
- the control unit can be used to control and regulate the point in time at which the pulse is triggered, the strength of the pulse and the duration over which mechanical pulses are given.
- means for determining process variables, in particular for detecting a degree of contamination in the process chamber are provided.
- these can be optical sensors introduced into the process chamber.
- Other process variables such as the transport speed of the substrates or the temperature or the pressure in the process chamber can possibly also be taken from the control device of the coating system if the control unit of the pulse generator device can be coupled to it in an advantageous embodiment.
- At least part of the purge gas emerging from the at least one process chamber may be used to generate the mechanical pulse, for example to generate an impulse. pulses by flowing out of a compressed air nozzle or by operating a pneumatic hammer.
- the at least one purging device for introducing a conditioned purge gas into the at least one process chamber and / or for passing a conditioned purge gas through the at least one process chamber preferably comprises at least one purge gas supply line and at least one purge gas delivery unit, in particular a pump and / or a fan, which are arranged in a flow direction before and / or after the at least one process chamber.
- the direction of flow is the direction in which the purge gas flows through the process chambers of the coating system.
- At least one conditioning device for conditioning the purge gas is provided before entering the process chamber.
- At least one conditioning device for setting a humidity of the purge gas can preferably be provided, in particular an adsorption unit or a cooling unit, preferably an absorption refrigerator, and / or at least one conditioning device for setting a temperature of the purge gas, in particular a heating device, and / or at least one Conditioning device for setting a pressure of the purge gas may be provided, in particular a compressor, and / or at least one conditioning device for separating foreign substances from the purge gas may be provided, in particular a filter unit.
- all suitable devices known from the prior art can be used for this.
- Several properties or conditioning parameters of the purge gas can also be set in a combined conditioning device.
- the device claimed in the optionally independent claim 25 at least one feed device for introducing the conditioned purge gas in at least one at an entrance of the process chamber and / or at an exit of the process Chamber arranged pressure lock and / or for passing the conditioned purge gas through the at least one pressure lock and / or at least one discharge device for the purge gas from the at least one pressure lock.
- the at least one feed device for example at least one feed line and at least one feed unit such as one
- the purge gas discharged from the pressure lock by means of the at least one discharge device can for example comprise at least one discharge line and at least one discharge unit such as a fan and / or a pump, can be fed again to the at least one conditioning device.
- the device preferably comprises at least one heating device for heating at least a part of at least one process chamber before and / or during a cleaning process, which is preferably arranged outside the process chamber.
- the heating device heats the process chamber in particular inductively, by radiation or by heat conduction.
- the substrate Before the coating process, the substrate must be treated in a substrate treatment device so that an optimal coating result can be achieved.
- the substrate or the substrate surface must be cleaned in a substrate washing device and then dried in a substrate drying device.
- a conditioned gas preferably air, in particular ambient air, is also required for drying the substrate.
- the at least one conditioning device corresponds to at least one conditioning device to a substrate treatment device connected upstream of the at least one process chamber, in particular a substrate washing device with a subsequent substrate drying device.
- a substrate treatment device connected upstream of the at least one process chamber
- both energy consumption and costs can be reduced.
- at least one means is provided for introducing at least part of a drying gas emerging from the substrate drying device and / or at least part of a drying gas processed in the at least one conditioning device of the substrate drying device into the process chamber.
- conditioned gas can be mixed with exhaust gas from the substrate drying device, so that a purge gas with a sufficiently low moisture content is obtained for the purge purposes, or a part of the drying gas prepared for the substrate drying is simply branched off and used as purge gas in the at least one Process chamber of the coating system directed. If the drying gas discharged from the substrate drying device and the purge gas discharged from the at least one process chamber are brought together again and fed back to the at least one common conditioning device for processing, a very economical cycle can be achieved.
- the process chamber is cleaned before a coating process by a method according to one or more of claims 1 to 20 and / or using a device according to one or more of claims 21 to 31. It is particularly advantageous if, after a cleaning process, the pressure in the process chamber is reduced compared to the ambient pressure, preferably to 10 "7 bar to 10 " 3 bar and then a coating process is started, in particular a coating process from the Gas phase, preferably a PVD or a CVD process.
- the device according to claim 34 for coating at least one substrate, in particular made of glass, in a process chamber, in particular for performing the method according to claim 32 or claim 33 comprises a separate device for cleaning the process chamber before a coating process by purging with a conditioned purging gas, in particular a device according to one or more of claims 21 to 31.
- FIG. 2 shows a process flow diagram of an advantageous embodiment of the method according to the invention for a coating device according to FIG. 1,
- FIG. 3 shows a process flow diagram of a further advantageous embodiment of the method according to the invention for a coating device according to FIG. 1,
- FIG. 4 shows an advantageous embodiment of a mechanical pulse generator device of a device according to the invention.
- the glass washing device 22 shows a glass washing device 22, a glass drying device 1 and a coating device 2, as can be used in a glass processing process according to the prior art.
- the glass washing device 22 previously produced glass substrates 3 are washed, preferably with water or another suitable liquid, and then dried in the glass drying device 1, so that they put as little moisture as possible into the coating device 2, in the present case a magneton coating system , which can negatively influence the coating process.
- the glass substrates 3 are transported on a conveyor belt 4 through a drying chamber 6 of the glass drying device 1 and subjected to conditioned drying gas 5.
- the conditioned drying gas 5 is blown into the drying chamber 6 at several points and flows over the glass substrates 3, the moisture from the surface of the glass substrates 3 being absorbed by the conditioned drying gas 5.
- the drying gas loaded with moisture is then discharged from the drying chamber 6.
- the dried glass substrates 3 then pass into the coating device 2, in which they pass through several process chambers 7.
- one or more layers of one or more substances are applied to the glass substrate 3 using the magnetron sputtering method.
- the sputtering process is preferably performed at a vacuum of up to 10 "6 bar.
- the negative pressure in the individual process chambers 7 while performing the glass substrates 3 can be maintained, at least in between the glass drying apparatus 1 and a process chamber 7 and zwis chen the individual Process chambers 7 and after the last process chamber 7 pressure locks (not shown here) are provided, through which the glass substrates 3 are guided and in which pressure equalization takes place.
- Magnetron sputtering is a variant of DC or HF sputtering, in which a transverse magnetic field is superimposed on the electric field of the glow discharge.
- an arrangement of permanent magnets is usually installed behind the target acting as the cathode, the magnetic field of which extends through the target into the plasma space.
- the plasma in front of the target is enclosed in a kind of magnetic bottle and the electrons are forced into circular or spiral paths in front of the target.
- This causes a considerable increase in the degree of ionization of the plasma and thus an increase in the atomization and coating rate.
- the bombardment of the substrate with electrons is reduced, which reduces the thermal load on the substrate.
- magnetron sputtering Frequently used variants of magnetron sputtering are reactive magnetron sputtering and bias-assisted magnetron sputtering (see Internet presence of the INO information system for the effective use of surface technology, www. harshtechnik.net) through magnetron sputtering in particular different metals (eg silver) and metal oxides (eg zinc oxide) are deposited, which in a suitable composition or layer structure serve in particular as sun protection and thermal insulation layers.
- metals eg silver
- metal oxides eg zinc oxide
- the reject production can be reduced or even avoided entirely.
- FIG. 2 shows in a process flow diagram an advantageous embodiment of the method according to the invention.
- the figure shows schematically the coating device 2 which comprises at least one process chamber 7 in its interior (not shown in FIG. 2).
- ambient air 8 is drawn in and cleaned of foreign matter 10 in a filter 9.
- the foreign substances 10 are removed from the filter 9 at regular intervals or continuously.
- the cleaned ambient air reaches a conditioning device for setting the moisture content, in this case a refrigeration machine 11, which can be designed as an absorption refrigeration machine or as a compression refrigeration machine, as are known from the prior art.
- a refrigeration machine 11 which can be designed as an absorption refrigeration machine or as a compression refrigeration machine, as are known from the prior art.
- the ambient air is cooled to a predetermined temperature, with water condensing out.
- the condensate 12 is continuously removed.
- the ambient air 8 dried in this way is then reheated in a heating device, preferably to a temperature between 60 ° C. and 80 ° C., in order to accelerate the evaporation and / or desorption process in the coating device 2.
- the warm and dry ambient air 8 now has a relative humidity of preferably ⁇ 25% and can absorb a relatively large amount of water until it is saturated.
- the ambient air 8 is compressed to a predetermined pressure and blown into the coating device 2.
- the flow rate of the conditioned purge gas 15 can also be set in this way.
- a fan 17, which draws in the loaded purge gas 16 on the outlet side of the coating device 2, can also support the flow through the process chambers 7.
- both the at least one process chamber 7 and the pressure locks are purged in the coating device 2 before and after and between individual process chambers in order to remove impurities.
- the loaded purge gas 16 is then completely released into the environment in the simplest case.
- the conditioned purging gas 15 continues to be fed into the pressure locks, preferably for pressure equalization in the pressure locks and / or for purging the pressure locks and the glass substrate 3 possibly located therein.
- FIG. 3 shows a further advantageous embodiment of the method according to the invention.
- the figure also schematically shows the coating device 2 which has at least one process chamber 7 in its interior
- ambient air 8 is conditioned accordingly in the conditioning devices 9 (filter), 11 (refrigerator), 13 (heating device), 14 (compressor).
- the conditioning devices 9, 11, 13, 14 are designed in the embodiment shown in FIG. 3 for the preparation of purging gas for the coating device 2 and drying gas for the glass drying device 1.
- a portion of the ambient air 8 conditioned as described above is introduced into the coating device 2 as conditioned purge gas 15.
- the fan 17 supports the flow through the coating device 2 and the loaded purging gas 16 is discharged in part or in whole or in part or in total via a purge gas recirculation 18 to the filter 9 again.
- Ambient air 8 can in turn be added to the loaded purge gas 16.
- conditioned purging gas 15 is in turn fed into the pressure locks for pressure equalization in the pressure locks and / or for purging the pressure locks and the glass substrate 3 which may be located therein.
- the remaining conditioned ambient air 8 is fed as conditioned drying gas 5 into the glass drying device 1.
- the loaded drying gas 19 is discharged from the glass drying device 1 and released in part or in whole into the ambient air.
- part of the loaded drying gas 19 can be added to the already conditioned ambient air 8 via a drying gas return 20 and the conditioned purge gas 15 can be generated in this way.
- FIG. 4 shows an advantageous embodiment of a mechanical pulse generator device of a device according to the invention for the removal of solid
- FIG. 4 schematically shows a process chamber 7 in section.
- a mechanical pulse generator 23 is provided, in this case a type of hammer, which can be guided along the process chamber 7 on a guide rail 24 (cf. arrow direction along the process chamber).
- a guide rail 24 cf. arrow direction along the process chamber.
- the mechanical pulse generator 23 can also extend over the entire length of the process chamber 7, so that it is only moved in a direction transverse to its longitudinal extent over the process chamber 7, in particular the process chamber outer wall 28 thereof.
- the mechanical pulse generator 23 can be moved in the direction of the arrow perpendicular to the outer wall 28 of the process chamber until it hits the outer wall 28 of the process chamber.
- the Impulse from the impact is transmitted through the process chamber outer wall 28 to the process chamber inner wall 26 and / or to the internals 27 and the deposit 25 of coating material deposited thereon.
- the depot 25 is at least partially detached and falls down due to the action of gravity. The particles can then be led out of the process chamber 7.
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Cleaning In General (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/596,406 US20070254096A1 (en) | 2003-12-11 | 2004-01-15 | Apparatus and Method for Cleaning at Least One Process Chamber for Coating at Least One Substrate |
JP2006543370A JP2007513754A (ja) | 2003-12-11 | 2004-01-15 | プロセスチャンバーのクリーニング方法およびクリーニング装置 |
EP04702310A EP1691939A1 (de) | 2003-12-11 | 2004-01-15 | Verfahren und vorrichtung zum reinigen wenigstens einer prozesskammer zum beschichten wenigstens eines substrats |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10358275A DE10358275A1 (de) | 2003-12-11 | 2003-12-11 | Vorrichtung und Verfahren zum Reinigen wenigstens einer Prozesskammer zum Beschichten wenigstens eines Substrats |
DE10358275.4 | 2003-12-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005061132A1 true WO2005061132A1 (de) | 2005-07-07 |
Family
ID=34683333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/000250 WO2005061132A1 (de) | 2003-12-11 | 2004-01-15 | Verfahren und vorrichtung zum reinigen wenigstens einer prozesskammer zum beschichten wenigstens eines substrats |
Country Status (5)
Country | Link |
---|---|
US (1) | US20070254096A1 (de) |
EP (1) | EP1691939A1 (de) |
JP (1) | JP2007513754A (de) |
DE (2) | DE20321795U1 (de) |
WO (1) | WO2005061132A1 (de) |
Cited By (2)
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WO2006127472A1 (en) * | 2005-05-20 | 2006-11-30 | Cardinal Cg Company | Deposition chamber desiccation systems and methods of use thereof |
JP2008282780A (ja) * | 2007-05-14 | 2008-11-20 | Shibaura Mechatronics Corp | 気体置換装置及び気体置換方法 |
Families Citing this family (14)
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CN102046833B (zh) * | 2008-05-30 | 2013-03-27 | 应用材料公司 | 用于从真空镀膜室移除碱金属或碱土金属的装置及方法 |
US8083859B2 (en) * | 2008-05-30 | 2011-12-27 | Applied Materials, Inc. | Arrangement and method for removing alkali- or alkaline earth-metals from a vacuum coating chamber |
JP4862903B2 (ja) * | 2009-03-06 | 2012-01-25 | 東京エレクトロン株式会社 | 基板処理装置、濾材の再生方法及び記憶媒体 |
US8225927B2 (en) | 2009-11-13 | 2012-07-24 | Applied Materials, Inc. | Method to substantially enhance shelf life of hygroscopic components and to improve nano-manufacturing process tool availablity |
US8956704B2 (en) * | 2012-05-21 | 2015-02-17 | Novellus Systems, Inc. | Methods for modulating step coverage during conformal film deposition |
JP2017183558A (ja) * | 2016-03-31 | 2017-10-05 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法およびドライエッチング装置のメンテナンス方法 |
FR3053126B1 (fr) * | 2016-06-27 | 2019-07-26 | Saint-Gobain Glass France | Procede et dispositif de localisation de l'origine d'un defaut affectant un empilement de couches minces deposees sur un substrat |
DE102016114292A1 (de) * | 2016-08-02 | 2018-02-08 | Khs Corpoplast Gmbh | Verfahren zum Beschichten von Kunststoffbehältern |
WO2019057310A1 (en) * | 2017-09-25 | 2019-03-28 | Applied Materials, Inc. | SYSTEM FOR CLEANING A VACUUM CHAMBER, METHOD FOR CLEANING A VACUUM CHAMBER, AND USE OF A COMPRESSOR FOR CLEANING A VACUUM CHAMBER |
CN109078941B (zh) * | 2018-08-01 | 2020-12-29 | 合肥中科离子医学技术装备有限公司 | 一种超导回旋加速器真空室清洗设备与清洗方法 |
CN111896285B (zh) * | 2020-08-05 | 2022-08-30 | 合肥中科离子医学技术装备有限公司 | 一种超导回旋加速器真空室石英灯辐射烘烤方法 |
EP4053304A1 (de) | 2021-03-01 | 2022-09-07 | Bühler Alzenau GmbH | Beschichter-konditionierungsmodus |
DE102021202169A1 (de) | 2021-03-05 | 2022-09-08 | centrotherm international AG | Verfahren zum Betrieb einer Substrat-Behandlungsvorrichtung und Substrat-Behandlungsvorrichtung |
DE102022102292A1 (de) | 2022-02-01 | 2023-05-04 | Asml Netherlands B.V. | Verfahren zum betrieb einer vakuumkammer und vakuumkammer hierfür |
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- 2003-12-11 DE DE20321795U patent/DE20321795U1/de not_active Expired - Lifetime
- 2003-12-11 DE DE10358275A patent/DE10358275A1/de not_active Withdrawn
-
2004
- 2004-01-15 JP JP2006543370A patent/JP2007513754A/ja active Pending
- 2004-01-15 WO PCT/EP2004/000250 patent/WO2005061132A1/de active Application Filing
- 2004-01-15 US US10/596,406 patent/US20070254096A1/en not_active Abandoned
- 2004-01-15 EP EP04702310A patent/EP1691939A1/de not_active Withdrawn
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US5391275A (en) * | 1990-03-02 | 1995-02-21 | Applied Materials, Inc. | Method for preparing a shield to reduce particles in a physical vapor deposition chamber |
US5378283A (en) * | 1992-12-04 | 1995-01-03 | Tokyo Electron Kabushiki Kaisha | Treating device |
US5536320A (en) * | 1993-03-10 | 1996-07-16 | Tokyo Electron Kabushiki Kaisha | Processing apparatus |
US5924447A (en) * | 1996-02-21 | 1999-07-20 | Aeroquip Corporation | Ultra high purity gas distribution component with integral valved coupling and methods for its use |
US6596091B1 (en) * | 1998-04-29 | 2003-07-22 | Applied Materials, Inc. | Method for sweeping contaminants from a process chamber |
US20010000759A1 (en) * | 1998-07-10 | 2001-05-03 | Allan Doley | Substrate handling chamber |
US6461437B1 (en) * | 2000-01-26 | 2002-10-08 | Mitsubishi Denki Kabushiki Kaisha | Apparatus used for fabricating liquid crystal device and method of fabricating the same |
US20020045966A1 (en) * | 2000-10-18 | 2002-04-18 | Hee-Tae Lee | Chemical vapor deposition process and apparatus for performing the same |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2006127472A1 (en) * | 2005-05-20 | 2006-11-30 | Cardinal Cg Company | Deposition chamber desiccation systems and methods of use thereof |
JP2008282780A (ja) * | 2007-05-14 | 2008-11-20 | Shibaura Mechatronics Corp | 気体置換装置及び気体置換方法 |
Also Published As
Publication number | Publication date |
---|---|
US20070254096A1 (en) | 2007-11-01 |
EP1691939A1 (de) | 2006-08-23 |
DE20321795U1 (de) | 2010-03-04 |
DE10358275A1 (de) | 2005-07-21 |
JP2007513754A (ja) | 2007-05-31 |
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