WO2005042426A3 - Anodisch mit silizium bondbare glas-keramik (ltcc) - Google Patents
Anodisch mit silizium bondbare glas-keramik (ltcc) Download PDFInfo
- Publication number
- WO2005042426A3 WO2005042426A3 PCT/DE2004/002414 DE2004002414W WO2005042426A3 WO 2005042426 A3 WO2005042426 A3 WO 2005042426A3 DE 2004002414 W DE2004002414 W DE 2004002414W WO 2005042426 A3 WO2005042426 A3 WO 2005042426A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- glass
- ceramic
- silicon
- ltcc
- anodic bonding
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C14/00—Glass compositions containing a non-glass component, e.g. compositions containing fibres, filaments, whiskers, platelets, or the like, dispersed in a glass matrix
- C03C14/004—Glass compositions containing a non-glass component, e.g. compositions containing fibres, filaments, whiskers, platelets, or the like, dispersed in a glass matrix the non-glass component being in the form of particles or flakes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/15—Ceramic or glass substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83893—Anodic bonding, i.e. bonding by applying a voltage across the interface in order to induce ions migration leading to an irreversible chemical bond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Ceramic Engineering (AREA)
- Power Engineering (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Geochemistry & Mineralogy (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Dispersion Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Glass Compositions (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10351196.2A DE10351196B4 (de) | 2003-10-28 | 2003-10-28 | Verwendung einer anodisch mit Silizium bondbaren Glas-Keramik (LTCC) |
DE10351196.2 | 2003-10-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005042426A2 WO2005042426A2 (de) | 2005-05-12 |
WO2005042426A3 true WO2005042426A3 (de) | 2005-06-09 |
Family
ID=34530047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2004/002414 WO2005042426A2 (de) | 2003-10-28 | 2004-10-28 | Anodisch mit silizium bondbare glas-keramik (ltcc) |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE10351196B4 (de) |
WO (1) | WO2005042426A2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101395881B1 (ko) | 2005-12-19 | 2014-05-21 | 시코르, 인크. | 브롬화 티오트로피움의 신규한 형태 및 이의 제조 방법 |
US9108962B2 (en) | 2005-12-19 | 2015-08-18 | Sicor, Inc. | Forms of tiotropium bromide and processes for preparation thereof |
JP2009280417A (ja) * | 2008-05-19 | 2009-12-03 | Nikko Co | 陽極接合可能な低温焼結用磁器組成物 |
JP5175650B2 (ja) | 2008-08-06 | 2013-04-03 | ニッコー株式会社 | 陽極接合可能な磁器及び前記磁器用組成物 |
DE102009000058A1 (de) | 2009-01-07 | 2010-07-08 | Robert Bosch Gmbh | Sensoranordnung und Verfahren zur Herstellung einer Sensoranordnung |
DE102011003481A1 (de) * | 2011-02-02 | 2012-08-02 | Robert Bosch Gmbh | Elektronisches Bauteil umfassend einen keramischen träger und Verwendung eines keramischen Trägers |
DE102013101731A1 (de) | 2013-02-21 | 2014-09-04 | Epcos Ag | Drucksensorsystem |
DE102013101732A1 (de) * | 2013-02-21 | 2014-08-21 | Epcos Ag | Sensorsystem |
CN108529885B (zh) * | 2017-03-06 | 2019-10-15 | 中国科学院上海硅酸盐研究所 | 一种可阳极键合ltcc材料及其制备方法和应用 |
CN108996902B (zh) * | 2018-09-19 | 2021-10-26 | 深圳市晶特智造科技有限公司 | 一种低温共烧陶瓷材料及其制备方法 |
DE102020103487B4 (de) | 2020-02-11 | 2022-05-12 | Koa Corporation | Verfahren zur Herstellung eines Glas-Keramik-Verbundsubstrates |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58151345A (ja) * | 1982-02-26 | 1983-09-08 | Asahi Glass Co Ltd | 低誘電率ガラス組成物 |
JPS6374957A (ja) * | 1986-09-16 | 1988-04-05 | 日本電気株式会社 | 低温焼結性低誘電率無機組成物 |
JPH0360443A (ja) * | 1989-07-28 | 1991-03-15 | Kyocera Corp | 低温焼成ガラスセラミック体 |
EP0480468A1 (de) * | 1990-10-11 | 1992-04-15 | Aluminum Company Of America | Anorganische Glaszusammensetzung mit niedrige Dielektrizität |
JPH04238837A (ja) * | 1990-12-28 | 1992-08-26 | Nippon Electric Glass Co Ltd | ガラスセラミック複合材 |
JPH04238838A (ja) * | 1991-01-09 | 1992-08-26 | Nippon Electric Glass Co Ltd | ガラスセラミック複合材 |
JPH0590446A (ja) * | 1991-09-30 | 1993-04-09 | Nec Corp | 多層ガラスセラミツク基板とその製造方法 |
EP0575813A2 (de) * | 1992-06-08 | 1993-12-29 | Nec Corporation | Glaskeramisches Mehrschichtsubstrat und Verfahren zur seiner Herstellung |
US5283210A (en) * | 1991-07-31 | 1994-02-01 | Nec Corporation | Low temperature sintering low dielectric inorganic composition |
US5316985A (en) * | 1991-12-09 | 1994-05-31 | Aluminum Company Of America | Suppression of crystal growth in low dielectric inorganic composition using ultrafine alumina |
US5324370A (en) * | 1992-02-27 | 1994-06-28 | Fujitsu Limited | Method of manufacturing a multi-layered ceramic circuit board containing layers of reduced dielectric constant |
US5342674A (en) * | 1992-03-10 | 1994-08-30 | Hitachi, Ltd. | Ceramic composition and ceramic circuit board |
EP0621245A1 (de) * | 1993-04-22 | 1994-10-26 | Nec Corporation | Gestapeltes glaskeramisches Mehrschichtsubstrat und Verfahren zur Herstellung |
JPH07118035A (ja) * | 1993-10-18 | 1995-05-09 | Sumitomo Metal Ind Ltd | セラミックス基板およびその製造方法 |
KR20030094774A (ko) * | 2002-06-07 | 2003-12-18 | 한국과학기술연구원 | 유전체 세라믹 조성물 및 이를 이용한 저온 소성 유전체세라믹의 제조방법 |
-
2003
- 2003-10-28 DE DE10351196.2A patent/DE10351196B4/de not_active Expired - Fee Related
-
2004
- 2004-10-28 WO PCT/DE2004/002414 patent/WO2005042426A2/de active Application Filing
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58151345A (ja) * | 1982-02-26 | 1983-09-08 | Asahi Glass Co Ltd | 低誘電率ガラス組成物 |
JPS6374957A (ja) * | 1986-09-16 | 1988-04-05 | 日本電気株式会社 | 低温焼結性低誘電率無機組成物 |
JPH0360443A (ja) * | 1989-07-28 | 1991-03-15 | Kyocera Corp | 低温焼成ガラスセラミック体 |
EP0480468A1 (de) * | 1990-10-11 | 1992-04-15 | Aluminum Company Of America | Anorganische Glaszusammensetzung mit niedrige Dielektrizität |
JPH04238837A (ja) * | 1990-12-28 | 1992-08-26 | Nippon Electric Glass Co Ltd | ガラスセラミック複合材 |
JPH04238838A (ja) * | 1991-01-09 | 1992-08-26 | Nippon Electric Glass Co Ltd | ガラスセラミック複合材 |
US5283210A (en) * | 1991-07-31 | 1994-02-01 | Nec Corporation | Low temperature sintering low dielectric inorganic composition |
JPH0590446A (ja) * | 1991-09-30 | 1993-04-09 | Nec Corp | 多層ガラスセラミツク基板とその製造方法 |
US5316985A (en) * | 1991-12-09 | 1994-05-31 | Aluminum Company Of America | Suppression of crystal growth in low dielectric inorganic composition using ultrafine alumina |
US5324370A (en) * | 1992-02-27 | 1994-06-28 | Fujitsu Limited | Method of manufacturing a multi-layered ceramic circuit board containing layers of reduced dielectric constant |
US5342674A (en) * | 1992-03-10 | 1994-08-30 | Hitachi, Ltd. | Ceramic composition and ceramic circuit board |
EP0575813A2 (de) * | 1992-06-08 | 1993-12-29 | Nec Corporation | Glaskeramisches Mehrschichtsubstrat und Verfahren zur seiner Herstellung |
EP0621245A1 (de) * | 1993-04-22 | 1994-10-26 | Nec Corporation | Gestapeltes glaskeramisches Mehrschichtsubstrat und Verfahren zur Herstellung |
JPH07118035A (ja) * | 1993-10-18 | 1995-05-09 | Sumitomo Metal Ind Ltd | セラミックス基板およびその製造方法 |
KR20030094774A (ko) * | 2002-06-07 | 2003-12-18 | 한국과학기술연구원 | 유전체 세라믹 조성물 및 이를 이용한 저온 소성 유전체세라믹의 제조방법 |
Non-Patent Citations (7)
Title |
---|
DATABASE WPI Section Ch Week 198819, Derwent World Patents Index; Class L03, AN 1988-130584, XP002323717 * |
DATABASE WPI Section Ch Week 200429, Derwent World Patents Index; Class L02, AN 2004-312201, XP002323716 * |
PATENT ABSTRACTS OF JAPAN vol. 007, no. 273 (C - 198) 6 December 1983 (1983-12-06) * |
PATENT ABSTRACTS OF JAPAN vol. 015, no. 211 (C - 0836) 29 May 1991 (1991-05-29) * |
PATENT ABSTRACTS OF JAPAN vol. 017, no. 001 (C - 1014) 5 January 1993 (1993-01-05) * |
PATENT ABSTRACTS OF JAPAN vol. 017, no. 431 (E - 1411) 10 August 1993 (1993-08-10) * |
PATENT ABSTRACTS OF JAPAN vol. 1995, no. 08 29 September 1995 (1995-09-29) * |
Also Published As
Publication number | Publication date |
---|---|
DE10351196B4 (de) | 2016-08-04 |
DE10351196A1 (de) | 2005-06-02 |
WO2005042426A2 (de) | 2005-05-12 |
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