WO2005001467A8 - Procede et dispositif d'imagerie magneto-optique - Google Patents

Procede et dispositif d'imagerie magneto-optique

Info

Publication number
WO2005001467A8
WO2005001467A8 PCT/FR2004/001602 FR2004001602W WO2005001467A8 WO 2005001467 A8 WO2005001467 A8 WO 2005001467A8 FR 2004001602 W FR2004001602 W FR 2004001602W WO 2005001467 A8 WO2005001467 A8 WO 2005001467A8
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic field
magneto
optical imaging
active material
imaging method
Prior art date
Application number
PCT/FR2004/001602
Other languages
English (en)
Other versions
WO2005001467A1 (fr
Inventor
Jean-Marc Decitre
Michel Lemistre
Youssef Jamal Ben
Francois Lepoutre
Dominique Placko
Pierre-Yves Joubert
Original Assignee
Centre Nat Recherche
Jean-Marc Decitre
Michel Lemistre
Youssef Jamal Ben
Francois Lepoutre
Dominique Placko
Pierre-Yves Joubert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Nat Recherche, Jean-Marc Decitre, Michel Lemistre, Youssef Jamal Ben, Francois Lepoutre, Dominique Placko, Pierre-Yves Joubert filed Critical Centre Nat Recherche
Priority to EP04767451A priority Critical patent/EP1639359A1/fr
Priority to CA2530197A priority patent/CA2530197C/fr
Priority to US10/562,560 priority patent/US7271900B2/en
Publication of WO2005001467A1 publication Critical patent/WO2005001467A1/fr
Publication of WO2005001467A8 publication Critical patent/WO2005001467A8/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G01R33/0322—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect using the Faraday or Voigt effect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

Procédé et dispositif d'imagerie magnéto-optique quantitative, pour former une image d'un matériau cible (2). Un matériau actif (15) est utilisé pour engendrer une rotation Faraday dans un faisceau lumineux polarisé. Ce matériau est placé à proximité du matériau cible (2) à imager. La rotation Faraday de ce matériau actif (15) est sensiblement proportionnelle à l'aimantation magnétique lorsqu'il est soumis à un champ magnétique d'excitation. Des moyens photo-détecteurs (7), détectent le faisceau réfléchi après traversée du matériau actif. En analysant la lumière du faisceau réfléchi, on en déduit l'amplitude et la phase d'un champ magnétique de perturbation créé par un défaut dans le matériau cible (2), soumis au champ magnétique d'excitation.
PCT/FR2004/001602 2003-06-27 2004-06-24 Procede et dispositif d'imagerie magneto-optique WO2005001467A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP04767451A EP1639359A1 (fr) 2003-06-27 2004-06-24 Procede et dispositif d imagerie magneto-optique
CA2530197A CA2530197C (fr) 2003-06-27 2004-06-24 Procede et dispositif d'imagerie magneto-optique
US10/562,560 US7271900B2 (en) 2003-06-27 2004-06-24 Magneto-optical imaging method and device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR03/07850 2003-06-27
FR0307850A FR2856791B1 (fr) 2003-06-27 2003-06-27 Procede et dispositif d'imagerie magneto-optique

Publications (2)

Publication Number Publication Date
WO2005001467A1 WO2005001467A1 (fr) 2005-01-06
WO2005001467A8 true WO2005001467A8 (fr) 2005-05-06

Family

ID=33515498

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2004/001602 WO2005001467A1 (fr) 2003-06-27 2004-06-24 Procede et dispositif d'imagerie magneto-optique

Country Status (5)

Country Link
US (1) US7271900B2 (fr)
EP (1) EP1639359A1 (fr)
CA (1) CA2530197C (fr)
FR (1) FR2856791B1 (fr)
WO (1) WO2005001467A1 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2901025B1 (fr) 2006-05-12 2008-12-26 Centre Nat Rech Scient Procede et dispositif d'imagerie a courant de foucault pour la detection et la caracterisation de defauts enfouis dans des structures complexes.
US8659291B2 (en) * 2008-12-31 2014-02-25 Infinitum Solutions, Inc. Magneto-optical detection of a field produced by a sub-resolution magnetic structure
US8289818B2 (en) 2008-12-31 2012-10-16 Infinitum Solutions, Inc. Magneto-optic write-head characterization using the recording medium as a transducer layer
FR2955666B1 (fr) * 2010-01-26 2012-04-13 Centre Nat Rech Scient Procede d'estimation de defauts dans un objet et dispositif de mise en oeuvre
US8427929B2 (en) 2010-09-08 2013-04-23 Infinitum Solutions, Inc. Sub-optical-resolution kerr signal detection for perpendicular write-head characterization
KR101442055B1 (ko) * 2010-10-12 2014-09-18 인디안 인스티튜트 오브 테크놀로지 칸푸르 샘플의 특징을 이미징하고 샘플 내 손상 영역을 식별하기 위한 시스템 및 방법
JP6037386B2 (ja) * 2013-02-13 2016-12-07 株式会社日立製作所 検査装置および検査方法
JP6484051B2 (ja) * 2015-02-10 2019-03-13 浜松ホトニクス株式会社 検査方法及び検査装置
JP6632327B2 (ja) 2015-10-30 2020-01-22 浜松ホトニクス株式会社 画像生成方法、画像生成装置、画像生成プログラム及び記録媒体
EP3290997B1 (fr) * 2016-09-02 2020-07-01 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Modulateur de lumiere magneto-optique
US20240027546A1 (en) * 2022-07-20 2024-01-25 General Electric Company Magneto-Optic Defect Visualization System

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410277A (en) * 1978-11-01 1983-10-18 Hitachi, Ltd. Apparatus for detecting magneto-optical anisotropy
US4625167A (en) * 1983-07-05 1986-11-25 Sigma Research, Inc. Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization
US4755752A (en) * 1983-07-05 1988-07-05 Gerald L. Fitzpatrick Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization
JPH0766044B2 (ja) * 1985-06-29 1995-07-19 株式会社東芝 磁界センサ
JPH01209356A (ja) * 1988-02-18 1989-08-23 Maakutetsuku Kk 長尺鋼材の磁気探傷装置
JPH0670651B2 (ja) * 1988-07-09 1994-09-07 日本碍子株式会社 光による電・磁気量測定方法及び装置
US5053704A (en) * 1990-01-11 1991-10-01 Pri Instrumentation, Inc. Flow imager for conductive materials
DE4021359A1 (de) * 1990-07-05 1992-01-09 Siemens Ag Verfahren zur detektion von in einem koerper verdeckt verlaufenden strompfaden sowie vorrichtung zur durchfuehrung dieses verfahrens
JPH0782164B2 (ja) * 1991-04-25 1995-09-06 松下電器産業株式会社 磁気光学素子及び磁界測定装置
US5446378A (en) * 1993-12-15 1995-08-29 Grumman Aerospace Corporation Magneto-optic eddy current imaging apparatus and method including dithering the image relative to the sensor

Also Published As

Publication number Publication date
US20060146328A1 (en) 2006-07-06
WO2005001467A1 (fr) 2005-01-06
US7271900B2 (en) 2007-09-18
CA2530197A1 (fr) 2005-01-16
EP1639359A1 (fr) 2006-03-29
FR2856791B1 (fr) 2005-11-04
CA2530197C (fr) 2014-04-22
FR2856791A1 (fr) 2004-12-31

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