WO2004093190A3 - Multichipmodul mit mehreren halbleiterchips sowie leiterplatte mit mehreren komponenten - Google Patents
Multichipmodul mit mehreren halbleiterchips sowie leiterplatte mit mehreren komponenten Download PDFInfo
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- WO2004093190A3 WO2004093190A3 PCT/DE2004/000750 DE2004000750W WO2004093190A3 WO 2004093190 A3 WO2004093190 A3 WO 2004093190A3 DE 2004000750 W DE2004000750 W DE 2004000750W WO 2004093190 A3 WO2004093190 A3 WO 2004093190A3
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- semiconductor chip
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- semiconductor chips
- multichip module
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- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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EP04726437A EP1614158A2 (de) | 2003-04-11 | 2004-04-08 | Multichipmodul mit mehreren halbleiterchips sowie leiterplatte mit mehreren komponenten |
US11/246,563 US7317251B2 (en) | 2003-04-11 | 2005-10-11 | Multichip module including a plurality of semiconductor chips, and printed circuit board including a plurality of components |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10317018.9 | 2003-04-11 | ||
DE2003117018 DE10317018A1 (de) | 2003-04-11 | 2003-04-11 | Multichipmodul mit mehreren Halbleiterchips sowie Leiterplatte mit mehreren Komponenten |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/246,563 Continuation US7317251B2 (en) | 2003-04-11 | 2005-10-11 | Multichip module including a plurality of semiconductor chips, and printed circuit board including a plurality of components |
Publications (2)
Publication Number | Publication Date |
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WO2004093190A2 WO2004093190A2 (de) | 2004-10-28 |
WO2004093190A3 true WO2004093190A3 (de) | 2005-03-24 |
Family
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PCT/DE2004/000750 WO2004093190A2 (de) | 2003-04-11 | 2004-04-08 | Multichipmodul mit mehreren halbleiterchips sowie leiterplatte mit mehreren komponenten |
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US (1) | US7317251B2 (de) |
EP (1) | EP1614158A2 (de) |
DE (1) | DE10317018A1 (de) |
WO (1) | WO2004093190A2 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005022017B3 (de) * | 2005-05-12 | 2006-10-26 | Infineon Technologies Ag | Verfahren zur Herstellung von Chip-Stapeln sowie zugehörige Chip-Stapel |
DE102006001767B4 (de) * | 2006-01-12 | 2009-04-30 | Infineon Technologies Ag | Halbleitermodul mit Halbleiterchips und Verfahren zur Herstellung desselben |
DE102006009723A1 (de) * | 2006-03-02 | 2007-09-06 | Siemens Ag | Verfahren zum Herstellen und planaren Kontaktieren einer elektronischen Vorrichtung und entsprechend hergestellte Vorrichtung |
FR2903811B1 (fr) * | 2006-07-12 | 2008-08-29 | Commissariat Energie Atomique | Dispositif electronique comprenant des composants electroniques relies a un substrat et mutuellement connectes et procede de fabrication d'un tel dispositif |
TW200836315A (en) * | 2007-02-16 | 2008-09-01 | Richtek Techohnology Corp | Electronic package structure and method thereof |
US8237271B2 (en) | 2007-06-19 | 2012-08-07 | International Business Machines Corporation | Direct edge connection for multi-chip integrated circuits |
US8264085B2 (en) | 2008-05-05 | 2012-09-11 | Infineon Technologies Ag | Semiconductor device package interconnections |
US8183677B2 (en) * | 2008-11-26 | 2012-05-22 | Infineon Technologies Ag | Device including a semiconductor chip |
US8236610B2 (en) | 2009-05-26 | 2012-08-07 | International Business Machines Corporation | Forming semiconductor chip connections |
US8319334B2 (en) | 2009-08-10 | 2012-11-27 | Infineon Technologies Ag | Embedded laminated device |
US20110084406A1 (en) * | 2009-10-13 | 2011-04-14 | Sony Corporation | Device and interconnect in flip chip architecture |
KR101901324B1 (ko) * | 2011-10-25 | 2018-09-27 | 삼성전자주식회사 | 네 개의 채널들을 가진 반도체 패키지 |
US9164155B2 (en) | 2013-01-29 | 2015-10-20 | Infineon Technologies Ag | Systems and methods for offset reduction in sensor devices and systems |
US9312198B2 (en) * | 2013-03-15 | 2016-04-12 | Intel Deutschland Gmbh | Chip package-in-package and method thereof |
US9312231B2 (en) * | 2013-10-31 | 2016-04-12 | Freescale Semiconductor, Inc. | Method and apparatus for high temperature semiconductor device packages and structures using a low temperature process |
US9605983B2 (en) | 2014-06-09 | 2017-03-28 | Infineon Technologies Ag | Sensor device and sensor arrangement |
US9823168B2 (en) | 2014-06-27 | 2017-11-21 | Infineon Technologies Ag | Auto tire localization systems and methods utilizing a TPMS angular position index |
US10079192B2 (en) * | 2015-05-05 | 2018-09-18 | Mediatek Inc. | Semiconductor chip package assembly with improved heat dissipation performance |
WO2017153339A1 (en) | 2016-03-09 | 2017-09-14 | Telefonaktiebolaget Lm Ericsson (Publ) | Systems and methods of interconnecting electrical devices |
WO2022193844A1 (zh) * | 2021-03-15 | 2022-09-22 | 华为技术有限公司 | 集成电路、芯片和电子设备 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5784159A (en) * | 1980-11-14 | 1982-05-26 | Mitsubishi Electric Corp | Mounting method of semiconductor integrated circuit |
EP0110285A2 (de) * | 1982-11-27 | 1984-06-13 | Prutec Limited | Verbindung integrierter Schaltungen |
US5492586A (en) * | 1993-10-29 | 1996-02-20 | Martin Marietta Corporation | Method for fabricating encased molded multi-chip module substrate |
US5723906A (en) * | 1996-06-07 | 1998-03-03 | Hewlett-Packard Company | High-density wirebond chip interconnect for multi-chip modules |
EP0954028A1 (de) * | 1996-11-12 | 1999-11-03 | T.I.F. Co., Ltd. | Speichermodul |
US5994739A (en) * | 1990-07-02 | 1999-11-30 | Kabushiki Kaisha Toshiba | Integrated circuit device |
US6159767A (en) * | 1996-05-20 | 2000-12-12 | Epic Technologies, Inc. | Single chip modules, repairable multichip modules, and methods of fabrication thereof |
US20020031856A1 (en) * | 2000-08-11 | 2002-03-14 | Samsung Electronics Co., Ltd. | Repairable multi-chip package and high-density memory card having the package |
US20020044476A1 (en) * | 1999-09-02 | 2002-04-18 | Nuxoll James P. | Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices |
US20020094701A1 (en) * | 2000-11-29 | 2002-07-18 | Biegelsen David Kalman | Stretchable interconnects using stress gradient films |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49131863U (de) * | 1973-03-10 | 1974-11-13 | ||
CA1024661A (en) | 1974-06-26 | 1978-01-17 | International Business Machines Corporation | Wireable planar integrated circuit chip structure |
US4208698A (en) * | 1977-10-26 | 1980-06-17 | Ilc Data Device Corporation | Novel hybrid packaging scheme for high density component circuits |
JPS5784759A (en) | 1980-11-12 | 1982-05-27 | Bunri Kogyo Kk | Magnetic filter apparatus |
JPS5896760A (ja) * | 1981-12-04 | 1983-06-08 | Clarion Co Ltd | 半導体装置の製法 |
JPS6281745A (ja) * | 1985-10-05 | 1987-04-15 | Fujitsu Ltd | ウエハ−規模のlsi半導体装置とその製造方法 |
US4821282A (en) | 1985-12-27 | 1989-04-11 | Honeywell Inc. | Mirror assembly for lasers |
EP0294459B1 (de) | 1986-12-22 | 1992-03-25 | Honeywell Inc. | Spiegelmontage für lasers |
JP2659430B2 (ja) | 1989-03-28 | 1997-09-30 | シャープ株式会社 | 波長安定型半導体レーザの製造方法 |
US5422513A (en) * | 1992-10-16 | 1995-06-06 | Martin Marietta Corporation | Integrated circuit chip placement in a high density interconnect structure |
US5592188A (en) | 1995-01-04 | 1997-01-07 | Texas Instruments Incorporated | Method and system for accentuating intense white display areas in sequential DMD video systems |
US5625235A (en) * | 1995-06-15 | 1997-04-29 | National Semiconductor Corporation | Multichip integrated circuit module with crossed bonding wires |
DE19608632B4 (de) | 1996-03-06 | 2005-12-29 | Scaps Gmbh | Vorrichtung zur Bestimmung der Topographie einer Oberfläche und Verfahren zu Bestimmen der Topographie einer Oberfläche |
JP3638173B2 (ja) * | 1996-03-27 | 2005-04-13 | 本田技研工業株式会社 | マイクロ波回路用パッケージ |
US6229203B1 (en) * | 1997-03-12 | 2001-05-08 | General Electric Company | Semiconductor interconnect structure for high temperature applications |
US6418490B1 (en) | 1998-12-30 | 2002-07-09 | International Business Machines Corporation | Electronic circuit interconnection system using a virtual mirror cross over package |
JP3423261B2 (ja) * | 1999-09-29 | 2003-07-07 | 三洋電機株式会社 | 表示装置 |
JP2001250914A (ja) | 2000-03-03 | 2001-09-14 | Miyota Kk | ガルバノミラーチップおよびその製造方法 |
DE10011633A1 (de) | 2000-03-10 | 2001-09-20 | Eupec Gmbh & Co Kg | Anordnung zur Verschaltung von Leistungshalbleiterchips in Modulen |
JP3650001B2 (ja) * | 2000-07-05 | 2005-05-18 | 三洋電機株式会社 | 半導体装置およびその製造方法 |
JP3839267B2 (ja) * | 2001-03-08 | 2006-11-01 | 株式会社ルネサステクノロジ | 半導体装置及びそれを用いた通信端末装置 |
US6521994B1 (en) * | 2001-03-22 | 2003-02-18 | Netlogic Microsystems, Inc. | Multi-chip module having content addressable memory |
WO2002078139A1 (en) | 2001-03-22 | 2002-10-03 | Infinite Photonics, Inc. | Ion implanted grating |
KR100378285B1 (en) * | 2001-06-15 | 2003-03-29 | Dongbu Electronics Co Ltd | Semiconductor package and fabricating method thereof |
JP4659488B2 (ja) * | 2005-03-02 | 2011-03-30 | Okiセミコンダクタ株式会社 | 半導体装置及びその製造方法 |
-
2003
- 2003-04-11 DE DE2003117018 patent/DE10317018A1/de not_active Withdrawn
-
2004
- 2004-04-08 WO PCT/DE2004/000750 patent/WO2004093190A2/de active Search and Examination
- 2004-04-08 EP EP04726437A patent/EP1614158A2/de not_active Withdrawn
-
2005
- 2005-10-11 US US11/246,563 patent/US7317251B2/en not_active Expired - Fee Related
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5784159A (en) * | 1980-11-14 | 1982-05-26 | Mitsubishi Electric Corp | Mounting method of semiconductor integrated circuit |
EP0110285A2 (de) * | 1982-11-27 | 1984-06-13 | Prutec Limited | Verbindung integrierter Schaltungen |
US5994739A (en) * | 1990-07-02 | 1999-11-30 | Kabushiki Kaisha Toshiba | Integrated circuit device |
US5492586A (en) * | 1993-10-29 | 1996-02-20 | Martin Marietta Corporation | Method for fabricating encased molded multi-chip module substrate |
US6159767A (en) * | 1996-05-20 | 2000-12-12 | Epic Technologies, Inc. | Single chip modules, repairable multichip modules, and methods of fabrication thereof |
US5723906A (en) * | 1996-06-07 | 1998-03-03 | Hewlett-Packard Company | High-density wirebond chip interconnect for multi-chip modules |
EP0954028A1 (de) * | 1996-11-12 | 1999-11-03 | T.I.F. Co., Ltd. | Speichermodul |
US20020044476A1 (en) * | 1999-09-02 | 2002-04-18 | Nuxoll James P. | Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices |
US20020031856A1 (en) * | 2000-08-11 | 2002-03-14 | Samsung Electronics Co., Ltd. | Repairable multi-chip package and high-density memory card having the package |
US20020094701A1 (en) * | 2000-11-29 | 2002-07-18 | Biegelsen David Kalman | Stretchable interconnects using stress gradient films |
Non-Patent Citations (2)
Title |
---|
LASKAR A S ET AL: "EPOXY MULTICHIP MODULES: A SOLUTION TO THE PROBLEM OF PACKAGING AND INTERCONNECTION OF SENSORS AND SIGNAL-PROCESSING CHIPS", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. A36, no. 1, 1 March 1993 (1993-03-01), pages 1 - 27, XP000368512, ISSN: 0924-4247 * |
PATENT ABSTRACTS OF JAPAN vol. 0061, no. 64 (E - 127) 27 August 1982 (1982-08-27) * |
Also Published As
Publication number | Publication date |
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US20060060954A1 (en) | 2006-03-23 |
US7317251B2 (en) | 2008-01-08 |
EP1614158A2 (de) | 2006-01-11 |
DE10317018A1 (de) | 2004-11-18 |
WO2004093190A2 (de) | 2004-10-28 |
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