WO2004012249A1 - 研磨装置 - Google Patents
研磨装置 Download PDFInfo
- Publication number
- WO2004012249A1 WO2004012249A1 PCT/JP2003/009431 JP0309431W WO2004012249A1 WO 2004012249 A1 WO2004012249 A1 WO 2004012249A1 JP 0309431 W JP0309431 W JP 0309431W WO 2004012249 A1 WO2004012249 A1 WO 2004012249A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- polishing
- electric signal
- polishing pad
- polished
- relationship
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
Definitions
- the present invention relates to a polishing apparatus (CMP apparatus) used for polishing a wafer having a semiconductor integrated circuit formed therein.
- CMP apparatus polishing apparatus
- the wavelength of the light source of a semiconductor exposure apparatus used for optical lithography becomes shorter, and the numerical aperture of a projection lens of the semiconductor exposure apparatus, so-called NA, becomes larger.
- NA numerical aperture of a projection lens of the semiconductor exposure apparatus
- CMP chemical mechanical polishing
- FIG. 4 11 is a polishing pad
- 12 is a polishing pad holding section (polishing head)
- 13 is a wafer to be polished
- 14 is a polishing platen
- 15 is a polishing liquid.
- 16 is a polishing liquid supply unit.
- the wafer 13 is fixed on the polishing platen 14 and rotates together with the polishing platen 14.
- the polishing pad 11 is fixed to the polishing head 12 and is rotated and oscillated along with the rotation of the polishing head 12. Then, the wafer 13 is pressed against the wafer 13 with a predetermined pressure.
- the polishing liquid 15 is supplied onto the wafer 13 from the polishing liquid supply section 16.
- the polishing liquid 16 diffuses on the wafer 13 and enters between the polishing pad 11 and the wafer 13 with the relative movement of the polishing pad 11 and the wafer 13 to cover the wafer 13. Polish the polished surface. That is, the mechanical polishing by the relative motion of the polishing pad 11 and the wafer 13 and the chemical action of the polishing liquid 15 act synergistically to perform good polishing.
- the polishing pad 11 is larger than the polishing pad 11, and the polishing pad 11 is on the upper side and the wafer 13 is on the lower side. In some cases, the wafer 13 is smaller than 11 and the polishing pad 11 is on the lower side and the wafer 13 is on the upper side.
- the polishing liquid 15 is supplied directly to the surface of the wafer 13. However, as will be described later, a passage for the polishing liquid is provided in the polishing head 12, and the polishing head 1 is provided. In some cases, the polishing liquid 15 is supplied via the polishing pad 2 and the polishing pad 11.
- Figure 5 shows an example of such a polished head structure.
- An upper plate 22 is fixed to the rotating shaft 21, an upper flange portion 23 is bolted to the upper plate 22 via a packing 24, and a cylindrical body 25 is bolted to the upper plate 22. It has been stopped.
- a base plate retainer 26 is bolted to the cylindrical body 25, and a circumferential end of a donut-shaped panel panel 27 is provided between the cylindrical body 25 and the base plate retainer 26. It is sandwiched and fixed.
- a leaf spring 29 is screwed to the base plate 28.
- the polishing pad attaching plate 30 is mounted on the support pad 29.
- the base plate 28 and the polishing pad attaching plate 30 are fixed by dowels so as not to rotate relative to each other.
- the lower flange 31 is bolted to the base plate 28, and the inner peripheral end of the leaf spring 27 is sandwiched and fixed between the base plate 28 and the lower flange 31. ing.
- a plug provided in the center of the polishing pad attaching plate 30 is fitted into a hole provided in the center of the base plate 28.
- the space 36 formed by the upper plate 22, the upper flange 23, the cylindrical body 25, the panel panel 27, and the lower flange 31 provides air supplied in the hollow part of the rotating shaft 21. Air is supplied from the port 37, and the pressure causes the panel panel 27 to deform downward. Therefore, when the polishing pad 33 is pressed against the surface of the wafer 35 during polishing, the plate panel 27 serves as a cushioning material, which helps the polishing pad 33 to follow the surface of the wafer 35. As a result, a slight parallelism error between the pad surface and the chuck surface due to processing and assembling, and undulation of the wafer surface can be absorbed.
- the polishing liquid supplied from the polishing liquid supply pipe 38 is provided to the lower flange 31, the base plate 28, the stopper 32, and the polishing pad mounting plate 30 via the screw joint 39. Through the holes to the polishing surface.
- the polishing liquid supply pipe 38 has a helical shape in order to absorb the stress caused by the vertical movement of the base plate 28.
- the pressure at which the polishing pad 33 presses the wafer 35 is determined by the pressure of the air supplied from the air supply port 37 provided in the hollow portion of the rotating shaft 21. .
- the pressure of this air is determined by an electropneumatic converter provided in the control device. Normally, air having a pressure proportional to the voltage supplied from the control device is supplied to the electropneumatic converter from the air supply port 37, and therefore, the polishing pump is driven by the pressure proportional to the voltage supplied from the control device.
- conditioning it is common practice to polish the polishing pad itself after polishing a predetermined number of times to eliminate irregularities on the polishing pad.
- This work is called conditioning.
- a polishing head with a polishing pad is faced to a polishing machine called a conditioner, and the polishing head and a grindstone attached to the conditioner are moved relative to each other. The surface is polished.
- Figure 6 shows an overview of the conditioner.
- the grindstone 41 is attached to a grindstone holder 42, and the grindstone holder 42 is connected to a load 44 via a gimbal mechanism 43.
- a load 46 is connected to a piston 46 in an air cylinder 45, and against the pressure of the air supplied from the air supply pipe 47, against the urging force of the spring 48. It is designed to move up and down.
- a gear 49 is coupled to the load 44, and the gear 49 is a motor.
- the pressure for pressing the whetstone 41 against the polishing pad is determined by the pressure of the air supplied from the air supply pipe 47.
- the pressure of this air is also adjusted by giving an electric signal from the controller to the electropneumatic converter.
- the supply amount of the polishing liquid is determined by a control valve provided in the control device. Normally, there is a fixed relationship between the voltage supplied from the control device and the degree of control valve control.When the opening degree of the control valve is determined, the supply amount of the polishing liquid is determined. The polishing liquid is supplied in an amount having a certain relationship with the polishing liquid.
- the pressure of the supplied air is increased via the mechanical components of the leaf spring 27, the base plate 28, and the polishing pad mounting plate 30. It is transmitted to the polishing pad 33. Therefore, the force transmitted to the polishing pad 33 may change due to the mechanical friction during this time even at the same air supply pressure. Also, the polishing pad 33 has elasticity, but the elastic modulus changes depending on the abrasion condition. This also means that the pressure applied between the polishing pad 33 and the wafer 35 at the same air supply pressure. It causes change.
- the passage of the polishing liquid such as the polishing liquid supply pipe may be narrowed in some cases because the polishing liquid adheres to the inside. In such a case, there is a problem that even if the voltage applied from the control device to the control valve is set to the target value, the amount of the polishing liquid actually supplied does not reach the target value. Disclosure of the invention
- the present invention has been made in view of such circumstances, and stabilizes the pressure between the polishing pad and the object to be polished, the pressure during conditioning, and the supply amount of the polishing liquid even when used for a long time. It is an object of the present invention to provide a polishing apparatus that can maintain the value.
- a polishing liquid is interposed between a polishing object attached to a polishing platen and a polishing pad attached to a polishing head.
- the polishing head is relatively moved to polish the object to be polished by the polishing pad, and the pressure between the polishing pad and the object to be polished during polishing is adjusted according to an electric signal.
- a load measuring device detachable between the polishing head and the table during non-polishing; a means for changing the electric signal; a means for detecting the electric signal; and the detected electric power.
- Means for determining the magnitude of the electric signal to be output based on the relationship of the applied pressure When the target pressure applied between the object is given, or between the size and the fact the polishing pad and the polishing object of the calculated et al electrical signal Means for determining the magnitude of the electric signal to be output based on the relationship of the applied pressure.
- a load measuring device is arranged between the polishing head and the table (a polishing pad or wafer may or may not be present) during polishing, and The pressure between the polishing head and the table is changed by changing an electric signal for adjusting the pressure between the polishing pad and the object to be polished. Then, the applied voltage and the output of the load measuring device are taken in, and the relationship between the magnitude of the electric signal and the pressure actually applied between the polishing pad and the object to be polished is obtained. This relationship is obtained by, for example, regression calculation. Then, when actually performing the polishing, the magnitude of the electric signal to be output is determined based on the relational expression so that the target pressure between the polishing pad and the object to be polished is obtained. .
- the value of the electric signal to be output is determined based on the actually measured load. Therefore, in the actual polishing state, even if there is a mechanical change in friction or abrasion of the polishing pad, etc. Polishing can be performed at a target pressure.
- the “means for detecting an electric signal” may be a device such as an ammeter or a voltmeter. However, if the relationship between the command value and the actual electric signal accurately corresponds to each other, Command value can be regarded as the value of the electrical signal without detecting the signal. In such a case, the command value of the means for issuing the command value can be regarded as the detected value of the electric signal as it is. "Can be regarded as having. This is the same in the section of the disclosure of the invention and in the claims.
- a second invention for achieving the above object is the first invention, wherein the table is the polishing platen. If the polishing platen itself is used as the table, there is no need to provide a special table, and the possibility of increasing the size of the equipment can be reduced.
- a third invention for achieving the above object is the first invention, characterized in that the table is a table used for polishing pad exchange (a table used for polishing pad exchange). Even if the polishing table is used as the table, there is no need to provide a special table, and the possibility of increasing the size of the equipment can be reduced. Since there are other mechanical parts, there is a possibility that there is not enough room to attach the load measuring device, but in that regard, the table used to replace the polishing pad is Less interference with
- a fourth invention for achieving the above object is any one of the first invention to the third invention, wherein the means for changing the electric signal changes the electric signal within a predetermined range. It is characterized by being a thing.
- a fifth invention for achieving the object is the fourth invention, wherein the means for detecting the electric signal receives two or more different electric signals within the predetermined range, and detects the electric signal. From the relationship between the two or more different electric signals and the output of the load measuring device corresponding to the two or more different electric signals, the magnitude of the output electric signal and the actual polishing pad It is characterized by having a function to determine the relationship between the pressure applied to the object to be polished.
- a sixth invention for achieving the above object is the fifth invention, wherein the two or more different electrical signals detected and the load measuring device corresponding to the two or more different electrical signals are detected. It has a function of obtaining the relationship between the magnitude of the electric signal and the pressure actually applied between the polishing pad and the object to be polished from the output by regression calculation.
- a seventh aspect of the present invention for achieving the above object is to provide a polishing object, wherein a polishing liquid is interposed between a polishing object attached to a polishing platen and a polishing pad attached to a polishing head. And the polishing head are relatively moved to polish the object to be polished by the polishing pad, and the pressure between the polishing pad and the conditioner during conditioning is adjusted according to an electric signal.
- a load measuring device detachable between the polishing head and the conditioner during non-conditioning; a means for changing the electric signal; a means for detecting the electric signal; and From the relationship between the electric signal and the output of the load measuring device, the magnitude of the output electric signal is actually applied between the polishing pad and the conditioner.
- a load measuring device is arranged between the polishing head and the conditioner (the polishing pad may or may not be present) during the conditioning, and during the conditioning,
- the electrical signal that regulates the pressure between the polishing pad and the conditioner is changed to change the pressure between the polishing head and the conditioner.
- the applied electric signal and the output of the load measuring device are taken in, and the relationship between the magnitude of the electric signal and the pressure actually applied between the polishing pad and the conditioner is obtained. This relationship is obtained by, for example, regression calculation.
- the output is set so that the target pressure between the polishing pad and the conditioner is obtained.
- the magnitude of the electrical signal to be determined is determined.
- the value of the electric signal to be output is determined based on the actually measured load. Therefore, in actual conditioning, even if there is a mechanical change in friction or abrasion of the polishing pad, etc. Conditioning can be performed with the pressure as follows.
- An eighth invention for achieving the above object is characterized in that a polishing liquid is interposed between a polishing object attached to a polishing platen and a polishing pad attached to a polishing head.
- a polishing apparatus that moves the polishing head relative to the polishing head to polish the object to be polished with the polishing pad, and adjusts a supply amount of the polishing liquid during polishing in accordance with an electric signal;
- a flow measuring device for measuring an amount; a means for changing the electric signal; a means for detecting the electric signal; and the electric signal output from a relationship between the detected electric signal and an output of the flow measuring device.
- the target flow rate of the polishing liquid is When it is obtained, the magnitude of the electric signal to be output is based on the relationship between the magnitude of the obtained electric signal and the amount of the polishing liquid actually supplied between the polishing pad and the object to be polished.
- the electric signal and the actual flow rate of the polishing liquid are measured by changing the electric signal to change the flow rate of the polishing liquid and measuring the actual flow rate with a flow rate measuring device. Then, a relational expression between the magnitude of the electric signal and the actual flow rate is obtained from these measured values. This relationship is obtained by, for example, regression calculation. Then, when actually performing polishing, the magnitude of the electric signal to be output is determined based on this relational expression so that the target supply amount of the polishing liquid is obtained. In the present invention, the value of the electric signal to be output is determined based on the actually measured flow rate. Can be supplied.
- the flow rate measuring device may be capable of measuring the flow rate during polishing, but may be attached only during non-polishing and measure the output.
- a polishing liquid is interposed between a polishing object attached to a polishing platen and a polishing pad attached to a polishing head, and the polishing object is A polishing apparatus that moves the polishing head relative to the polishing head to polish the object to be polished with the polishing pad and adjusts a supply amount of the polishing liquid during polishing according to an electric signal; Means for changing the electrical signal, means for detecting the electric signal, means for inputting the measured flow rate of the polishing liquid, and the electric power output from the relationship between the detected electric signal and the flow rate of the input polishing liquid.
- the target flow rate of the polishing liquid When obtained, the magnitude of the electric signal to be output based on the relationship between the magnitude of the determined electric signal and the amount of the polishing liquid actually supplied between the polishing pad and the object to be polished. And a means for determining the polishing rate.
- the polishing liquid flow rate measuring device of the eighth invention is not used as a component of the polishing apparatus, and the flow rate of the polishing liquid is measured by manual measurement. Only the difference from the eighth aspect is that the input is made from the means for inputting the other, and the other effects are the same.
- FIG. 1 is a schematic diagram showing a first example of an embodiment of the present invention.
- FIG. 2 is a schematic diagram showing a second example of the embodiment of the present invention.
- FIG. 3 is a schematic diagram showing a third example of the embodiment of the present invention.
- FIG. 4 is a diagram showing an outline of the CMP device.
- FIG. 5 is a diagram showing an example of the structure of the polishing head.
- Figure 6 is a diagram showing the outline of the conditioner. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 is a schematic diagram showing a first example of an embodiment of the present invention, wherein 1 is a polishing head as shown in FIG. 5, 2 is a polishing platen, and 3 is a load cell as a load measuring device. .
- 1 is a polishing head as shown in FIG. 5
- 2 is a polishing platen
- 3 is a load cell as a load measuring device.
- a command is issued from the calculating means 4 to the control device 5 so that a predetermined voltage is supplied to the electropneumatic converter 6.
- the actual voltage is measured and input to the calculating means, but if the relationship between the command voltage and the actual voltage is stable, the actual voltage may not be measured and the command voltage may be substituted. Further, the air pressure output from the electropneumatic converter 6 may be negative with respect to the atmospheric pressure.
- the load applied between the polishing head 1 and the polishing platen 2 at that time is measured by the input cell 3 and input to the calculating means 4.
- the calculating means changes the commanded voltage and sequentially inputs the load corresponding to the actual voltage value at that time. At this time, when the measurement is performed with the polishing pad attached to the polishing head 1, a result closer to the actual polishing state can be obtained.
- the relational expression between the loads applied between 2 is obtained by regression calculation or the like, and stored in the relational expression storage device 7. Thus, the preparatory action is completed.
- the control device 5 obtains a load corresponding to this pressure, reads out the output voltage that gives the load from the relational expression storage device 7, and outputs the read output voltage to the electropneumatic converter 6. I do. In this way, a voltage based on the actual output voltage of the control device 5 and the pressure measurement value between the polishing head 1 and the polishing platen 2 is output, so that the polishing head 1 and the polishing platen are output.
- the pressure between 2 and can be set to the desired value.
- FIG. 2 is a diagram showing an example of the second embodiment of the present invention.
- the conditioner is as shown in Fig. 6, and the pressure during conditioning changes according to the supplied air pressure.
- the polishing head 1 faces the grinding wheel 8 of the conditioner, and the opening cell 3 is inserted between them.
- a command is issued from the calculating means 4 to the control device 5 so that a predetermined voltage is supplied to the electropneumatic converter 6.
- the actual voltage is measured and input to the calculation means. If the relationship between the command voltage and the actual voltage is stable, the actual voltage is measured. Instead, the command voltage may be used instead.
- the load applied between the polishing head 1 and the grindstone 8 at that time is measured by the load cell 3 and input to the calculating means 4.
- the calculating means changes the commanded voltage and sequentially inputs the load corresponding to the actual voltage value at that time. At this time, when the measurement is performed with the polishing pad mounted on the polishing head 1, a result closer to the actual conditioning state can be obtained.
- the control device 5 When performing conditioning, it is necessary to determine the pressure between the polishing head 1 and the grinding wheel 8 as one of the parameters for determining the conditioning conditions. At this time, the control device 5 obtains a load corresponding to this pressure, reads out the output voltage that gives the load from the relational expression storage device 7, and outputs the read output voltage to the electropneumatic converter 6. To do. In this way, a voltage based on the actual output voltage of the control device 5 and the pressure measurement value between the polishing head 1 and the grinding wheel 8 is output. The pressure between them can be set to a desired value.
- FIG. 3 is a diagram showing an example of the third embodiment of the present invention.
- a command is issued from the calculating means 4 to the control device 5 so that a predetermined voltage is supplied to the control valve 10.
- the actual voltage is measured and input to the calculating means, but if the relationship between the command voltage and the actual voltage is stable, the actual voltage may not be measured and the command voltage may be substituted.
- the flow rate of the polishing liquid flowing at that time is measured by the flow meter 9 and input to the calculation means 4.
- the calculating means changes the commanded voltage, and sequentially inputs the flow rate of the polishing liquid corresponding to the actual voltage value at that time.
- a relational expression between the voltage output from the control device and the supply amount of the polishing liquid is obtained by regression calculation or the like, and stored in the relational expression storage device 7. This completes the preparatory action.
- the control device 5 When performing polishing, it is necessary to determine the supply amount of the polishing liquid as one of the parameters for determining the polishing conditions. At this time, the control device 5 reads the output voltage corresponding to the supply amount from the relational expression storage device 7 and outputs the read output voltage to the control valve 10. In this way, a voltage based on the actual output voltage of the control device 5 and the measured value of the supply amount of the polishing liquid is output, so that the supply amount of the polishing liquid during actual polishing is set to a target value. Can be.
- the flow meter 9 is installed in the pipe, and the measured value is read by the calculating means 4.
- the measurement may be performed manually with a measuring device, and the result may be input to the calculating means 4.
- the present invention can be used for a polishing apparatus having a polishing pad having a smaller diameter than a wafer to be polished, and a polishing apparatus having a polishing pad having a larger diameter.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
Claims
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2003252687A AU2003252687A1 (en) | 2002-07-26 | 2003-07-25 | Polishing device |
| JP2004524143A JPWO2004012249A1 (ja) | 2002-07-26 | 2003-07-25 | 研磨装置 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002218646 | 2002-07-26 | ||
| JP2002-218646 | 2002-07-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2004012249A1 true WO2004012249A1 (ja) | 2004-02-05 |
Family
ID=31184687
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2003/009431 Ceased WO2004012249A1 (ja) | 2002-07-26 | 2003-07-25 | 研磨装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPWO2004012249A1 (ja) |
| AU (1) | AU2003252687A1 (ja) |
| TW (1) | TW200401687A (ja) |
| WO (1) | WO2004012249A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020185638A (ja) * | 2019-05-14 | 2020-11-19 | 株式会社ディスコ | 荷重センサの電圧調整方法 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103586772B (zh) * | 2012-08-16 | 2016-01-06 | 鸿富锦精密工业(深圳)有限公司 | 压力检测装置 |
| JP5569828B2 (ja) * | 2013-03-11 | 2014-08-13 | 株式会社ニコン | 研磨装置 |
| US9662761B2 (en) * | 2013-12-02 | 2017-05-30 | Ebara Corporation | Polishing apparatus |
| CN120551949B (zh) * | 2025-08-01 | 2025-09-30 | 苏州博宏源设备股份有限公司 | 一种抛光压力检测调节装置以及方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0936072A (ja) * | 1995-07-24 | 1997-02-07 | Toshiba Corp | 半導体装置の製造方法および製造装置 |
| JPH11863A (ja) * | 1997-06-12 | 1999-01-06 | Hitachi Metals Ltd | 磁気ヘッドの加工制御方法 |
| JPH11126765A (ja) * | 1997-10-22 | 1999-05-11 | Toshiba Corp | 研磨シミュレーション方法および研磨シミュレーション方法を記録した記録媒体および研磨方法 |
| JP2000117615A (ja) * | 1998-10-15 | 2000-04-25 | Nec Corp | 化学機械研磨装置 |
| EP1063056A2 (en) * | 1999-06-22 | 2000-12-27 | Applied Materials, Inc. | Method and apparatus for measuring a pad profile and closed loop control of a pad conditioning process |
-
2003
- 2003-07-25 TW TW92120382A patent/TW200401687A/zh unknown
- 2003-07-25 WO PCT/JP2003/009431 patent/WO2004012249A1/ja not_active Ceased
- 2003-07-25 AU AU2003252687A patent/AU2003252687A1/en not_active Abandoned
- 2003-07-25 JP JP2004524143A patent/JPWO2004012249A1/ja active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0936072A (ja) * | 1995-07-24 | 1997-02-07 | Toshiba Corp | 半導体装置の製造方法および製造装置 |
| JPH11863A (ja) * | 1997-06-12 | 1999-01-06 | Hitachi Metals Ltd | 磁気ヘッドの加工制御方法 |
| JPH11126765A (ja) * | 1997-10-22 | 1999-05-11 | Toshiba Corp | 研磨シミュレーション方法および研磨シミュレーション方法を記録した記録媒体および研磨方法 |
| JP2000117615A (ja) * | 1998-10-15 | 2000-04-25 | Nec Corp | 化学機械研磨装置 |
| EP1063056A2 (en) * | 1999-06-22 | 2000-12-27 | Applied Materials, Inc. | Method and apparatus for measuring a pad profile and closed loop control of a pad conditioning process |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020185638A (ja) * | 2019-05-14 | 2020-11-19 | 株式会社ディスコ | 荷重センサの電圧調整方法 |
| JP7235587B2 (ja) | 2019-05-14 | 2023-03-08 | 株式会社ディスコ | 荷重センサの電圧調整方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2004012249A1 (ja) | 2005-11-24 |
| AU2003252687A1 (en) | 2004-02-16 |
| TW200401687A (en) | 2004-02-01 |
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