WO2003102603A2 - Modular vacuum test adapter - Google Patents
Modular vacuum test adapter Download PDFInfo
- Publication number
- WO2003102603A2 WO2003102603A2 PCT/DE2003/001782 DE0301782W WO03102603A2 WO 2003102603 A2 WO2003102603 A2 WO 2003102603A2 DE 0301782 W DE0301782 W DE 0301782W WO 03102603 A2 WO03102603 A2 WO 03102603A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plate
- vacuum
- test
- holding
- hold
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Definitions
- Modular vacuum test adapter with a vacuum chamber and a wiring chamber, for testing electronic switching groups
- Modular, hoodless, self-adjusting height test adapter which can also be precisely contacted from above, for testing electronic circuit groups with integrated holding plate using the ball joint guide pins with snap-in.
- test specimen is tightened under vacuum as follows:
- the invention specified in claim 1 has the problem of avoiding expensive specimen-specific seals such as vacuum seals and vacuum hoods. Realizing the adaptation accuracy (by guiding the hold-down plate over guide pins) from above and significantly reducing the manufacturing time of a vacuum test adapter. The new process also allows small adapter sizes such as Double Europe format without realizing a huge mechanical structure.
- Figure 1 Design Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 1, DUT is inserted, adapter is not tightened. The sectional view is shown in Figure 6.
- Figure 2 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Cut, test specimen is inserted, adapter is tightened. The sectional view is shown in Figure 6.
- Figure 3 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 2, test specimen is inserted, adapter is not tightened. The sectional view is shown in Figure 6.
- Figure 4 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 2, test specimen is inserted, adapter is tightened. The sectional view is shown in Figure 6.
- FIG. 6 Top view Modular, hoodless vacuum test adapter with integrated hold-down plate with specification of cut and cut2.
- Figure 1 shows the structure: Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Test specimen is inserted, adapter is not tightened.
- the vacuum test adapter is made up of various plates (l-11). If the specimen height is very high, the inner vacuum chamber height (25) can be adjusted very simply by inserting additional Plate7 (7).
- the upper structure rising from Plate 8 (8), Plate9 (9), Plate 10 (10), Plate 11 (11), seal made of Naftoflex (19), Hold-down device (22), ball joint guide pin (17, 18),
- Knurled screw ⁇ 16), screw M4 (28), DU bushing (29), spring housing (23), spring with adjustable height (24) is always the same and moves upwards when another Plate7 (7) is inserted. There is no need to fine-tune the hold-down device (22).
- the test specimen (21) is placed under the hold-down plate (l 1) and pressed down over hold-down device (22) during suction.
- Two ball joint guide pins (17, 18) in the rear area ( Figure 1: cut) and two guide pins (Figure 3: (30)) in the front area ( Figure 3: Cut 2) allow the hold-down plate to be folded up ( Figure 6: (11) and insert the specimen (21), the pivot point of Plate 11 (Figure 6: (11) is on the rear part of the Naftoflex seal ( Figure 6: (19), ie Plate 11 ( Figure 6: (11)) lies fully on the Naftoflex seal ( Figure 6: (19)) and uses this as a support surface to fold up plate 11 ( Figure 6: (11).)
- the hold-down plate (l 1) with hold-down (22) moves the test specimen (21 ) when the vacuum is sucked in until the test specimen (21) reaches the lower spacers (20).
- the active working area of the hold-down plate (l 1) is inside the seal (19) ), Figure 3: (30) sliding in the DU sockets (29), Figure 3 (29) is an exact contact of the P rüflings (21) also given from above.
- the springs (24) with adjustable height ensure that the hold-down plate (l 1) moves up again when the vacuum in the seal is switched off and the hold-down plate (l 1) can be folded up again.
- the springs (24) with adjustable height allow the optimum opening position of the hold-down plate (l 1) to be set exactly. When the vacuum is switched on, the guide pins (17, 18) move down.
- Figure 2 shows the structure: Modular, hoodless vacuum test adapter with integrated
- test specimen (21) is pressed down over the hold-down device (22) to the spacers (20). This ensures that there is contact from the test object to the test system.
- Figure 3 shows the structure: Modular, hoodless vacuum test adapter with integrated
- the hold-down plate (l 1) can be tilted upwards by the shape of the guide pins (30).
- the DU bushings (29) in the hold-down plate (l 1) are used to slide the guide pins (30).
- Figure 4 shows the structure: Modular, hoodless vacuum test adapter with integrated
- test specimen (21) is pressed down over the hold-down device (22) to the spacers (20). This ensures that there is contact from the test object to the test system.
- the guide pins (30) ensure precise guidance of the hold-down plate (l 1).
- the DU bushings (29) in the hold-down plate (l 1) are used to slide the
- Figure 5 shows the structure: Modular, hoodless vacuum test adapter:
- CEM1 single panels which are placed on top of one another according to their arrangement.
- the hold-down plate (l 1) lies fully on the vacuum seal (19).
- This vacuum seal (19) also forms the fulcrum of the hold-down plate (l 1).
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10393299T DE10393299D2 (en) | 2002-06-06 | 2003-05-31 | Modular vacuum test adapter |
AU2003249843A AU2003249843A1 (en) | 2002-06-04 | 2003-05-31 | Modular vacuum test adapter |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10225028.6 | 2002-06-04 | ||
DE2002125028 DE10225028B3 (en) | 2002-06-06 | 2002-06-06 | Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003102603A2 true WO2003102603A2 (en) | 2003-12-11 |
WO2003102603A3 WO2003102603A3 (en) | 2004-02-12 |
Family
ID=29594292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2003/001782 WO2003102603A2 (en) | 2002-06-04 | 2003-05-31 | Modular vacuum test adapter |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003249843A1 (en) |
DE (2) | DE10225028B3 (en) |
WO (1) | WO2003102603A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202013101614U1 (en) | 2013-04-16 | 2014-07-18 | Atx Hardware Gmbh | Holder for holding down or placing a board to be tested in a test arrangement |
DE102015215634A1 (en) | 2015-08-17 | 2017-02-23 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE202015104330U1 (en) | 2015-08-17 | 2016-08-19 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE202018104826U1 (en) * | 2018-08-22 | 2019-08-22 | Ingun Prüfmittelbau Gmbh | Down element |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912400A (en) * | 1988-09-13 | 1990-03-27 | Design And Manufacturing Specialties, Inc. | Apparatus for testing circuit boards |
US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
US5450017A (en) * | 1993-12-03 | 1995-09-12 | Everett Charles Technologies, Inc. | Test fixture having translator for grid interface |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
US20020000820A1 (en) * | 2000-05-18 | 2002-01-03 | Qa Technology Company, Inc. | Test probe and connector |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3637406C1 (en) * | 1986-11-03 | 1988-05-05 | Genrad Gmbh | Test device for circuit boards |
JPH07146336A (en) * | 1993-11-19 | 1995-06-06 | Cosmo Tec Kk | Inspecting jig for in-circuit tester |
-
2002
- 2002-06-06 DE DE2002125028 patent/DE10225028B3/en not_active Expired - Fee Related
-
2003
- 2003-05-31 DE DE10393299T patent/DE10393299D2/en not_active Expired - Fee Related
- 2003-05-31 WO PCT/DE2003/001782 patent/WO2003102603A2/en not_active Application Discontinuation
- 2003-05-31 AU AU2003249843A patent/AU2003249843A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912400A (en) * | 1988-09-13 | 1990-03-27 | Design And Manufacturing Specialties, Inc. | Apparatus for testing circuit boards |
US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
US5450017A (en) * | 1993-12-03 | 1995-09-12 | Everett Charles Technologies, Inc. | Test fixture having translator for grid interface |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
US20020000820A1 (en) * | 2000-05-18 | 2002-01-03 | Qa Technology Company, Inc. | Test probe and connector |
Also Published As
Publication number | Publication date |
---|---|
DE10225028B3 (en) | 2004-01-15 |
DE10393299D2 (en) | 2005-06-23 |
AU2003249843A1 (en) | 2003-12-19 |
WO2003102603A3 (en) | 2004-02-12 |
AU2003249843A8 (en) | 2003-12-19 |
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