WO2003102603A2

WO2003102603A2 - Modular vacuum test adapter

Info

Publication number: WO2003102603A2
Application number: PCT/DE2003/001782
Authority: WO
Inventors: Christian Ratzky
Original assignee: Ratzky, Bruno
Priority date: 2002-06-04
Filing date: 2003-05-31
Publication date: 2003-12-11
Also published as: DE10225028B3; DE10393299D2; AU2003249843A1; WO2003102603A3; AU2003249843A8

Abstract

The invention relates to a modular vacuum test adapter comprising a vacuum chamber and a wiring chamber. Said modular vacuum test adapter has no covering, is self-adjusting in terms of height, can be precisely contacted from above, and is used to test electronic switching groups. The inventive test adapter also comprises an integrated holding-down plate which uses ball-jointed guiding pins with a locking capacity. Vacuum test adapters use a seal or a vacuum covering to seal the test specimen. The aim of the novel method is to replace the use of an extra seal or extra covering entailing complex manual work and fine adjustment of holding-down clamps, and also to enable precise contacting from above. To this end, the test specimen (21) is positioned below the holding-down plate (11) and is pressed downwards by means of holding-down clamps (22) during the suction process. Two ball-jointed guiding pins (17,18) in the rear region and two guiding pins in the front region enable the holding-down plate (11) to be tilted upwards and the test specimen (21) to be inserted. The holding-down plate (11) operates inside the seal (19). The test specimen (21) can be precisely contacted from above by means of guiding pins (17). The holding-down plate (11) comprising holding-down clamps (22) pushes the test specimen (21) downwards during the suction process, until the test specimen (21) reaches the lower spacers (20). The modularity is achieved by inserting a plurality of plates (7). The invention further relates to the production of one such test adapter.

Description

1. Modular vacuum test adapter with a vacuum chamber and a wiring chamber, for testing electronic switching groups

1. Modular, hoodless, self-adjusting height test adapter, which can also be precisely contacted from above, for testing electronic circuit groups with integrated holding plate using the ball joint guide pins with snap-in.

It is not known to us that the test specimen with the use of an integrated holding plate (Figure 1: (11) in the vacuum test adapter, which runs directly in the seal (Figure 1: (19)) is pressed down when sucking in. It is also us It is not known that an adapter can be easily adapted to the specimen height by inserting additional Plate7 (Figure: (7)) and that the height adjustment of the hold-down device is not necessary.

In the cases known by us, the test specimen is tightened under vacuum as follows:

- Using a vacuum seal (seal is made for this test-specimen and applied vacuum-tight to the pressure plate)

- Via vacuum hood with hold-down, which must be set exactly according to the specimen height (disadvantage: large mechanical structure) due to mechanically complex lever devices, the size of the mechanics is correspondingly large here and the number of possible pins is approximately due to the back pressure of the test spring contact 300 pins limited

- i.a.

All of the above methods do not include the simple adjustment of the specimen height and the adaptation accuracy from above and do not allow a small adapter size of e.g. Double Eurocard format.

The invention specified in claim 1 has the problem of avoiding expensive specimen-specific seals such as vacuum seals and vacuum hoods. Realizing the adaptation accuracy (by guiding the hold-down plate over guide pins) from above and significantly reducing the manufacturing time of a vacuum test adapter. The new process also allows small adapter sizes such as Double Europe format without realizing a huge mechanical structure.

The advantages achieved with the invention are, in particular, that only after the spacers have been set (FIG. 22) or. by inserting further Plate7 (Figure: (7)) the vacuum tightness and thus the tightening of the test object is achieved. Exact contacts from above can now be easily implemented.

Feature: This new procedure for the test adapter construction to achieve the vacuum tightness and thus the tightening of the test piece only exists by setting the spacers or by inserting additional Plate7 (Figure: (7)). The application «fc claim 2 makes it possible to fold the Ni deϊnÄEi'platte '(Figure 6: (11)) to the front with the vacuum not switched on and to insert the test specimen.

An embodiment of the invention is shown in the drawing and will be described in more detail below.

They show: Figure 1 Design Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 1, DUT is inserted, adapter is not tightened. The sectional view is shown in Figure 6.

Figure 2 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Cut, test specimen is inserted, adapter is tightened. The sectional view is shown in Figure 6.

Figure 3 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 2, test specimen is inserted, adapter is not tightened. The sectional view is shown in Figure 6.

Figure 4 Construction Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Section 2, test specimen is inserted, adapter is tightened. The sectional view is shown in Figure 6.

Figure 5 Modular, hoodless vacuum test adapter:

Overview of Plate 1 -Plate 11, top view.

Figure 6 Top view Modular, hoodless vacuum test adapter with integrated hold-down plate with specification of cut and cut2.

Figure 7 Ball joint guide pin with snap

Please note: The same item names have been used in Figure 1-7. The exact course of Schnittl andSchnitt2 can be seen in Figure 6.

Explanation of Figure 1:

Figure 1 shows the structure: Modular, hoodless vacuum test adapter with integrated hold-down plate. View: Test specimen is inserted, adapter is not tightened.

As can be seen in Figure 1, the vacuum test adapter is made up of various plates (l-11). If the specimen height is very high, the inner vacuum chamber height (25) can be adjusted very simply by inserting additional Plate7 (7). The upper structure, rising from Plate 8 (8), Plate9 (9), Plate 10 (10), Plate 11 (11), seal made of Naftoflex (19), Hold-down device (22), ball joint guide pin (17, 18),

Knurled screw ^ 16), screw M4 (28), DU bushing (29), spring housing (23), spring with adjustable height (24) is always the same and moves upwards when another Plate7 (7) is inserted. There is no need to fine-tune the hold-down device (22). The test specimen (21) is placed under the hold-down plate (l 1) and pressed down over hold-down device (22) during suction. Two ball joint guide pins (17, 18) in the rear area (Figure 1: cut) and two guide pins (Figure 3: (30)) in the front area (Figure 3: Cut 2) allow the hold-down plate to be folded up (Figure 6: (11) and insert the specimen (21), the pivot point of Plate 11 (Figure 6: (11) is on the rear part of the Naftoflex seal (Figure 6: (19), ie Plate 11 (Figure 6: (11)) lies fully on the Naftoflex seal (Figure 6: (19)) and uses this as a support surface to fold up plate 11 (Figure 6: (11).) The hold-down plate (l 1) with hold-down (22) moves the test specimen (21 ) when the vacuum is sucked in until the test specimen (21) reaches the lower spacers (20). This ensures optimal adaptation. The active working area of the hold-down plate (l 1) is inside the seal (19) ), Figure 3: (30) sliding in the DU sockets (29), Figure 3 (29) is an exact contact of the P rüflings (21) also given from above. The springs (24) with adjustable height ensure that the hold-down plate (l 1) moves up again when the vacuum in the seal is switched off and the hold-down plate (l 1) can be folded up again. The springs (24) with adjustable height allow the optimum opening position of the hold-down plate (l 1) to be set exactly. When the vacuum is switched on, the guide pins (17, 18) move down. For this, due to the length of the guide pins (17, 18), which is required to fold up the hold-down plate (l 1), a hole is required in Plate5 (5), which is made vacuum-tight again using a vacuum sealing cap (15) , The guide pins Figure 3 (30) remain firmly in their position on plate 8 (Figure 3: (8)) The knurled screw (lό) ensures that when the hold-down plate (ll) is folded upwards, the hold-down plate (ll) in the rear Area (Figure 1: Schnittl) is not lifted out of the DU bushing guide (29). The vacuum of the test system is fed into the vacuum chamber via vacuum connectors ^). The wire connections (13) from the contact part (12) to the sleeve (14) are realized in the vacuum-free wiring chamber (27).

Explanation of Figure 2:

Figure 2 shows the structure: Modular, hoodless vacuum test adapter with integrated

Hold-down plate visible.

View: Cut, test specimen is inserted, adapter is tightened. As can be seen at

Switch on the vacuum, the hold-down plate (Figure 2: (11)), which is in the area of

Seal (19) works, the test specimen (21) is pressed down over the hold-down device (22) to the spacers (20). This ensures that there is contact from the test object to the test system.

Explanation of Figure 3:

Figure 3 shows the structure: Modular, hoodless vacuum test adapter with integrated

Hold-down plate visible.

View: Section 2, test specimen is inserted, adapter is not tightened.

As can be seen, the hold-down plate (l 1) can be tilted upwards by the shape of the guide pins (30). The DU bushings (29) in the hold-down plate (l 1) are used to slide the guide pins (30). Explanation of Figure 4:

Figure 4 shows the structure: Modular, hoodless vacuum test adapter with integrated

Hold-down plate visible.

View: Section 2, test specimen is inserted, adapter is tightened. As can be seen at

Switch on the vacuum, the hold-down plate (Figure 4: (11)) in the area of

Seal (19) works, the test specimen (21) is pressed down over the hold-down device (22) to the spacers (20). This ensures that there is contact from the test object to the test system. The guide pins (30) ensure precise guidance of the hold-down plate (l 1).

The DU bushings (29) in the hold-down plate (l 1) are used to slide the

Guide pins (30).

Explanation of Figure 5:

Figure 5 shows the structure: Modular, hoodless vacuum test adapter:

Overview of Plate 1 -Plate 11, top view.

These are mass-produced, appropriately processed

CEM1 single panels, which are placed on top of one another according to their arrangement.

Explanation of Figure 6:

In Figure 6: Top view Modular, hoodless vacuum test adapter with integrated

Hold-down plate with specification of cut and cut 2.

As can be seen, the hold-down plate (l 1) lies fully on the vacuum seal (19).

This vacuum seal (19) also forms the fulcrum of the hold-down plate (l 1).

The various plates Plate 1-Plate 10 (Figure 5) of the modular test adapter are included

Dowel pins (33) d = 3.00 assembled and fixed with M3 screws (34).

Explanation of Figure 7:

In Figure 7: View of the ball joint guide pin with latching: The ball joint guide pins (17, 18) with latching consist of guide pins that can be tilted by 85 degrees by means of a ball joint. This click will keep the hold-down plate open (Figure 6 (11). The manual hold down will release the lock and the hold-down plate (Figure 6 (11) will move towards the seal (Figure 6 (11).

Claims

claims

1. Modular vacuum test adapter with a vacuum chamber and a wiring chamber, for testing electronic switching groups, characterized in that the wiring chamber (27) and the vacuum chamber (25) are arranged one above the other, the wiring chamber (27) from a first Plate (1) with contact parts (12) to a test system and a second plate (5) with test spring contacts (14) and third plates (2-4) lying between the first and the second plate, through the vacuum chamber (25) the second plate (5) and an upper structure (8-11, 16-19, 22-24, 28, 29). and from fourth plates (6, 7) lying between the second plate (5) and the upper structure for adjusting the chamber height, and wherein only the hold-down plate is inserted in the upper structure for inserting and removing the electronic switching group (21) to be tested (11) is foldable.

2. Vacuum test adapter according to claim 1, characterized in that in the upper structure in addition to the hold-down plate (11) a fifth plate (8) with DU bushings (29) and height-adjustable springs (24) in spring housings (23) and a sixth (9) and a seventh (10) plate and a seal (19) are included.

3. Vacuum test adapter according to claim 2, characterized in that in the upper structure the folding and positioning of the hold-down plate (11) is made possible by guide pins (30) which are fastened to the fifth plate (8), and by articulated guide pins ( 17, 18), which are fastened to the hold-down plate (11), the guide pins (30) in DU bushings (29) in the hold-down plate (11) and the articulated guide pins (17, 18) in DU bushes (29 ) slide in the fifth plate (8) and thereby an exact guidance of the hold-down plate (11) is achieved.

Bruno Ratz