DE10225028B3 - Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above - Google Patents
Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above Download PDFInfo
- Publication number
- DE10225028B3 DE10225028B3 DE2002125028 DE10225028A DE10225028B3 DE 10225028 B3 DE10225028 B3 DE 10225028B3 DE 2002125028 DE2002125028 DE 2002125028 DE 10225028 A DE10225028 A DE 10225028A DE 10225028 B3 DE10225028 B3 DE 10225028B3
- Authority
- DE
- Germany
- Prior art keywords
- hold
- plate
- guide pins
- down plate
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Modularer, haubenloser, höhenselbsteinstellender, zusätzlich von oben genau kontaktierbarer Vakuum-Prüfadapter zum Testen von elektronischen Schaltgruppen mit integrierter Niederhalterplatte unter Anwendung der Kugelgelenk-Führungsstifte mit Einrastung. DOLLAR A Der Prüfling (21) wird unter die Niederhalterplatte (11) gelegt und über Niederhalter (22) beim Ansaugen nach unten gedrückt. Zwei Kugelgelenk-Führungsstifte (17, 18) im hinteren Bereich sowie zwei Führungsstifte im vorderen Bereich erlauben das Hochklappen der Niederhalterplatte (11) und Einlegen des Prüflings (21). Die Niederhalterplatte (11) arbeitet innerhalb der Dichtung (19). Durch Führungsstifte (17) ist eine genaue Kontaktierung des Prüflings (21) von oben gegeben. Die Niederhalterplatte (11) mit Niederhalter (22) fährt den Prüfling (21) beim Ansaugen soweit herunter, bis der Prüfling (21) die unteren Distanzstücke (20) erreicht. Die Modularität wird durch Einlegen von mehreren Plate7 (7) realisiert.Modular, hoodless, self-adjusting vacuum test adapter, which can also be precisely contacted from above, for testing electronic switching groups with integrated hold-down plate using the ball joint guide pins with snap-in. DOLLAR A The test specimen (21) is placed under the hold-down plate (11) and pressed down over hold-down device (22) during suction. Two ball joint guide pins (17, 18) in the rear area and two guide pins in the front area allow the hold-down plate (11) to be folded up and the test specimen (21) to be inserted. The hold-down plate (11) works within the seal (19). Precise contacting of the test specimen (21) from above is provided by guide pins (17). The hold-down plate (11) with hold-down (22) lowers the test specimen (21) during suction until the test specimen (21) reaches the lower spacers (20). The modularity is realized by inserting several Plate7 (7).
Description
Modularer, haubenloser, höhenselbsteinstellender, zusätzlich von oben genau kontaktierbarer Vakuum-Prüfadapter zum Testen von elektronischen Schaltgruppen mit integrierter Niederhalterplatte unter Anwendung der Kugelgelenk-Führungsstifte mit Einrastung.Modular, hoodless, self-adjusting, additionally Vacuum test adapter that can be precisely contacted from above for testing electronic switching groups with integrated hold-down plate using the ball joint guide pins with snap.
Aus dem Stand der Technik ist nicht
bekannt, dass der Prüfling
mit dem Einsatz einer integrierten Niederhalterplatte (
Im Stand der Technik, insbesondere
in den Druckschriften
- – über Vakuum-Dichtung (Dichtung wird hierfür prüflingsspezifisch angefertigt und auf die Druckplatte (Pressure-Plate) vakuumdicht aufgebracht- via vacuum seal (For this purpose, the seal becomes specific to the test object made and vacuum-tight on the pressure plate upset
- – über Vakuum-Haube mit Niederhalter, die entsprechend der Prüflingshöhe genau eingestellt werden müssen (Nachteil: grosser mechanischer Aufbau)- via vacuum hood with hold-down device, which can be set exactly according to the specimen height have to (Disadvantage: large mechanical structure)
- – durch mechanische aufwendige Hebelvorrichtungen, die Grösse der Mechanik ist hier entsprechend groß und die Anzahl der möglichen Pins ist durch den Gegendruck der Prüffederkontakt auf ungefähr 300 Pins limitiert- by mechanically complex lever devices, the size of the Mechanics are correspondingly large here and the number of possible ones Pins is the test spring contact to about 300 pins due to the counter pressure limited
Alle oben genannten Methoden beinhalten nicht die einfache Anpassung der Prüflingshöhe und die Adaptiergenauigkeit von oben und erlauben keine kleine Adaptergrösse von z.B. Doppel-Europa-Format.All of the above methods do not include the simple adjustment of the specimen height and the Adaptation accuracy from above and do not allow a small adapter size of e.g. Double Eurocard format.
Die Aufgabe der Erfindung besteht darin teure prüflingsspezifische Abdichtungen wie Vakuum-Dichtung, Vakuum-Haube zu vermeiden, die Adaptiergenauigkeit (durch Führung der Niederhalterplatte über Führungsstifte) von oben zu verbessern und die Herstellungszeit eines Vakuum-Prüfadapters erheblich zu reduzieren.The object of the invention is in it expensive specimen-specific Seals like vacuum seals, vacuum hoods to avoid that Adaptation accuracy (through guidance the hold-down plate over Guide pins) improve from above and the manufacturing time of a vacuum test adapter significantly to reduce.
Diese Aufgabe wird mit einem Vakuum-Prüfadapter nach Anspruch 1 gelöst. Die Unteransprüche geben vorteilhafte Ausführungsformen an.This task is done with a vacuum test adapter solved according to claim 1. The subclaims indicate advantageous embodiments.
Die mit der Erfindung erzielten Vorteile
bestehen insbesondere darin, dass nur nach dem Setzen der Abstandshalter
(
Dieses neue Verfahren für den Prüfadapterbau
zur Erzielung der Vakuumdichtigkeit und somit das Anziehen des Prüflings besteht
also nur noch durch Setzen der Abstandshalter, bzw. durch Einlegen
von weiteren Plate 7 (
Ein Ausführungsbeispiel der Erfindung ist in der Zeichnung dargestellt und wird im folgenden näher beschrieben.An embodiment of the invention is shown in the drawing and is described in more detail below.
Es zeigen:
Bitte beachtenPlease note
In
Erklärung zu
In
Wie aus
Die Federn (
Erklärung zu
In
Ansicht: Schnitt 1, Prüfling ist
eingelegt, Adapter ist angezogen. Wie ersichtlich hat beim Einschalten
des Vakuums, die Niederhalterplatte (
Erklärung zu
In
Ansicht: Schnitt 2, Prüfling ist eingelegt, Adapter ist nicht angezogen.View: Section 2, DUT is inserted, adapter is not tightened.
Wie ersichtlich kann durch die Form
der Führungsstifte
(
Erklärung zu
In
Ansicht: Schnitt 2, Prüfling ist
eingelegt, Adapter ist angezogen. Wie ersichtlich hat beim Einschalten
des Vakuums, die Niederhalterplatte (
Erklärung zu
In
Hierbei handelt es sich um massenvorgefertigte, entsprechend bearbeitete CEM1-Einzelplatten, die entsprechend Ihrer Anordnung aufeinander gesetzt werden.These are mass-produced, correspondingly machined CEM1 single plates, according to your Arrangement can be placed on top of each other.
Erklärung zu
In
Wie ersichtlich liegt die Niederhalterplatte (
Erklärung zu
In
Claims (3)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2002125028 DE10225028B3 (en) | 2002-06-06 | 2002-06-06 | Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above |
PCT/DE2003/001782 WO2003102603A2 (en) | 2002-06-04 | 2003-05-31 | Modular vacuum test adapter |
DE10393299T DE10393299D2 (en) | 2002-06-06 | 2003-05-31 | Modular vacuum test adapter |
AU2003249843A AU2003249843A1 (en) | 2002-06-04 | 2003-05-31 | Modular vacuum test adapter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2002125028 DE10225028B3 (en) | 2002-06-06 | 2002-06-06 | Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10225028B3 true DE10225028B3 (en) | 2004-01-15 |
Family
ID=29594292
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE2002125028 Expired - Fee Related DE10225028B3 (en) | 2002-06-04 | 2002-06-06 | Ball joint guide pins with snap-in modular, hoodless, self-adjusting, self-adjusting vacuum test adapter that can be contacted from above |
DE10393299T Expired - Fee Related DE10393299D2 (en) | 2002-06-06 | 2003-05-31 | Modular vacuum test adapter |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10393299T Expired - Fee Related DE10393299D2 (en) | 2002-06-06 | 2003-05-31 | Modular vacuum test adapter |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003249843A1 (en) |
DE (2) | DE10225028B3 (en) |
WO (1) | WO2003102603A2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202013101614U1 (en) | 2013-04-16 | 2014-07-18 | Atx Hardware Gmbh | Holder for holding down or placing a board to be tested in a test arrangement |
DE202015104330U1 (en) | 2015-08-17 | 2016-08-19 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE102015215634A1 (en) | 2015-08-17 | 2017-02-23 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE202018104826U1 (en) * | 2018-08-22 | 2019-08-22 | Ingun Prüfmittelbau Gmbh | Down element |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3637406C1 (en) * | 1986-11-03 | 1988-05-05 | Genrad Gmbh | Test device for circuit boards |
JPH07146336A (en) * | 1993-11-19 | 1995-06-06 | Cosmo Tec Kk | Inspecting jig for in-circuit tester |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912400A (en) * | 1988-09-13 | 1990-03-27 | Design And Manufacturing Specialties, Inc. | Apparatus for testing circuit boards |
US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
US5450017A (en) * | 1993-12-03 | 1995-09-12 | Everett Charles Technologies, Inc. | Test fixture having translator for grid interface |
US6570399B2 (en) * | 2000-05-18 | 2003-05-27 | Qa Technology Company, Inc. | Test probe and separable mating connector assembly |
-
2002
- 2002-06-06 DE DE2002125028 patent/DE10225028B3/en not_active Expired - Fee Related
-
2003
- 2003-05-31 WO PCT/DE2003/001782 patent/WO2003102603A2/en not_active Application Discontinuation
- 2003-05-31 AU AU2003249843A patent/AU2003249843A1/en not_active Abandoned
- 2003-05-31 DE DE10393299T patent/DE10393299D2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3637406C1 (en) * | 1986-11-03 | 1988-05-05 | Genrad Gmbh | Test device for circuit boards |
JPH07146336A (en) * | 1993-11-19 | 1995-06-06 | Cosmo Tec Kk | Inspecting jig for in-circuit tester |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202013101614U1 (en) | 2013-04-16 | 2014-07-18 | Atx Hardware Gmbh | Holder for holding down or placing a board to be tested in a test arrangement |
DE202015104330U1 (en) | 2015-08-17 | 2016-08-19 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE102015215634A1 (en) | 2015-08-17 | 2017-02-23 | Atx Hardware Gmbh | Holder for holding down a board to be tested on a test adapter in a test arrangement |
DE202018104826U1 (en) * | 2018-08-22 | 2019-08-22 | Ingun Prüfmittelbau Gmbh | Down element |
Also Published As
Publication number | Publication date |
---|---|
AU2003249843A1 (en) | 2003-12-19 |
DE10393299D2 (en) | 2005-06-23 |
AU2003249843A8 (en) | 2003-12-19 |
WO2003102603A3 (en) | 2004-02-12 |
WO2003102603A2 (en) | 2003-12-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8100 | Publication of the examined application without publication of unexamined application | ||
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: RATZKY, CHRISTIAN, 76139 KARLSRUHE, DE |
|
8339 | Ceased/non-payment of the annual fee |