JPH07146336A - Inspecting jig for in-circuit tester - Google Patents

Abstract

PURPOSE:To secure contact pins for inspection in contact state with high accuracy without receiving any influence from a damper pressure by fitting a mobile base board on which the contact pins for inspection, etc., are mounted at the inside of a fixing frame with a buffer space in between. CONSTITUTION:A mobile base board 6 is mounted between an upper stopper 7 and lower stopper 8 in a fixing frame 5 and forcible pushed upward by a spring 18. Therefore, a buffer space 17 is provided between the frame 5 and board 6. After completing preparatory work for tests, an upper-surface unit 2 is turned toward a lower-surface unit 1. As a result, a positioning post 4 is aligned with a positioning hole and contact pins 9 are positioned above contact points. In addition, the board 6 is lowered by vacuum suction from the unit 1 side and the pins 9 are brought into contact with the contract points on a mounting board 12 supported by the unit 1. Under such a condition, tests are performed. Because of the buffer space 17, the board 6 is not affected by a damper pressure received by the fixing frame 5.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is for an in-circuit tester including an upper surface unit (a unit on the side that contacts a test target component) and a lower surface unit (a unit on a side supporting a board on which the test target component is mounted). The present invention relates to the improvement of the upper surface unit mechanism in the inspection jig.

[0002]

2. Description of the Related Art An in-circuit tester is a machine for electrically testing a printed circuit board (hereinafter referred to as a mounting board) on which electronic parts are mounted, for each mounting part. The upper unit is a unit, and the lower unit is a mounting board supporting unit.

Conventionally, the upper surface unit is called a pin board, and a contact pin is provided on a fixed plate, and the fixed plate itself is rotatably mounted on the lower surface unit and used as an opening / closing mechanism. Further, since a damper (for example, a gas damper) is used between the lower surface unit and the upper surface unit to control the operation of the opening / closing mechanism, the damper pressure during opening / closing affects the contact pin driven into the fixing plate via the fixing plate. The contact pin interferes with the contact of the contact pin with the electronic component, causing a contact failure and degrading the accuracy of the in-circuit tester.

[0004]

In order to solve this problem, according to the present invention, the opening / closing portion and the contact pin fixing plate which serve as the opening / closing mechanism of the upper surface unit are separate members, and the opening / closing portion and the contact pin fixing plate are used. By providing a buffer space between the movable base boards, an in-circuit tester inspection jig that can ensure accurate contact of the contact pins on the movable base board on which the contact pins are mounted without being affected by the damper pressure. The purpose is to provide.

[0005]

In order to solve the above-mentioned problems, the present invention provides an in-circuit tester inspection jig in which an upper surface unit is rotatably mounted on a lower surface unit via a damper. An in-circuit characterized in that a movable base board on which a contact pin for inspection and the like is mounted is attached to a hollow fixed frame which is an opening and closing part to which a damper is attached, by providing a buffer space inside the fixed frame. An inspection jig for a tester is provided.

[0006]

Embodiments will be described in detail below with reference to the illustrated embodiments. FIG. 1 is a perspective view showing an embodiment of an inspection jig for an in-circuit tester according to the present invention, and FIGS. 2 and 3 are sectional views for explaining the same. As shown in FIG. 1, the in-circuit inspection jig can be opened and closed by rotating the lower surface unit 1 and the upper surface unit 2 with the double-sided jig 16 as a fulcrum.

A load is applied to the rotation of the upper unit 2 by a damper 3 provided between the upper unit 2 and the lower unit 1. A gas damper is used as the damper 3 in the embodiment. The lower surface unit 1 in the present invention is a unit that is connected to an interface (not shown) or a vacuum pump and has a role of supporting a mounting board. Since this is a configuration, detailed description is omitted.

The lower surface unit 1 is mounted by a double-sided jig 16 so that the upper surface unit 2 can be opened and closed by rotating like a lid through a damper 3. The upper surface unit 2 includes a fixed frame 5 and a movable base board 6.
The damper 3 is attached to the outer side surface of the fixed frame 5. An upper stopper 7 and a lower stopper 8 for holding the movable base board 6 are formed at several positions inside the fixed frame 5 at intervals apart from the thickness of the movable base board 6 as shown in FIGS. ing.

The movable base board 6, which is exaggeratedly shown in FIGS. 2 and 3, is slightly smaller than the inner dimension of the fixed frame 5, and has an upper stopper 7 and a lower portion in the fixed frame 5. It is installed between the stopper 8 and
A spring 18 biases the lower stopper 8 side toward the upper stopper 7 side by a suction force of a vacuum pump.

Therefore, a small amount of buffer space 17 is provided between the fixed frame 5 and the movable base board 6 in the front, rear, left, right, up and down directions. The front, rear, left and right buffer spaces 17 in the embodiment are about 1 mm even when the length of the movable base board 6 is 260 mm.

The movable base board 6 has a function as a pin board in a conventional upper surface unit, and a large number of contact pins 9 necessary for inspection are driven in and a positioning hole 10 corresponding to the positioning post 4 is bored. Has been done. The movable base board 6 is formed with a receiving groove and a cutout window according to the height of the mounting components 13 and 14. Needless to say, the air leakage prevention cap 15 must be provided in order to maintain the vacuum effect when the cutout window is opened.

Next, the operation of this embodiment will be described.
After the test preparation is completed, the in-circuit tester grips the handle 11 of the upper unit 2 and rotates the upper unit 2 toward the lower unit 1. The positioning post 4 of the lower surface unit 1 and the positioning hole 10 of the upper surface unit 2 are aligned with each other, and the contact pin 9 is located above the contact point. FIG. 2 shows this state.

Further, since vacuum suction is performed from the lower surface unit 1 side by a vacuum pump, the movable base board 6 of the upper surface unit 2 is lowered and moved when the vacuum suction force increases due to the bias of the spring 18. The contact pins 9 mounted on the base board 6 come into contact with the contact points of the mounting board 12 supported by the lower surface unit 1, and the upper surface unit 2 is set on the lower surface unit 1 to be tested.

[0014]

At this time, the upper unit 2 receives the damper pressure, but the pressure of the damper 3 is received by the fixed frame 5 of the upper unit 2. Therefore, there is a risk that the fixed frame 5 itself shifts due to the pressure of the damper 3. However, the fixed frame 5 and the movable base board 6 on which the contact pins 9 are driven are not fixed, but the movable base board 6 is smaller than the inner dimension of the fixed frame 5, and a buffer is provided between them. Since the space 17 exists, the movable base board 6 is not affected by the pressure of the damper 3 received by the fixed frame 5. Therefore, the contact pin 9 driven into the movable base board 6 is not affected.

According to the present invention, as described above, the fixed frame 5 which plays a role of the opening / closing mechanism of the upper surface unit 2 and the movable base board 6 which plays a role of the fixing plate of the contact pin 9 are provided as separate members, and the fixed frame 5 and By providing the buffer space 17 between the movable base board 6 which becomes the contact pin 9 fixing plate,
The movable base board 6 on which the contact pins 9 are mounted is an in-circuit tester inspection jig capable of ensuring highly accurate contact of the contact pins 9 without being affected by the pressure of the damper 3.

[Brief description of drawings]

FIG. 1 is a perspective view of an inspection jig for an in-circuit tester according to the present invention.

FIG. 2 is a cross-sectional explanatory view of an embodiment showing the upper surface unit before suctioning.

FIG. 3 is an explanatory cross-sectional view showing the upper surface unit after suctioning.

[Explanation of symbols]

1. ． ． ． ． Bottom unit 2. ． ． ． ． Top unit 3. ． ． ． ． Damper 4. ． ． ． ． Positioning post 5. ． ． ． ． Fixed frame 6. ． ． ． ． Movable base board 7. ． ． ． ． Upper stopper 8. ． ． ． ． Lower stopper 9. ． ． ． ． Contact pin 10. ． ． ． Positioning hole 1
1. ． ． ． Handle 12. ． ． ． Mounting board 13, 14.
Mounted component 15. ． ． ． Cover 16. ． ． ． Double-sided jig 1
7. ． ． ． Buffer space 18. ． ． ． spring

Claims (1)

[Claims] 1. An in-circuit tester inspection jig in which an upper surface unit is rotatably mounted on a lower surface unit via a damper, wherein the upper surface unit is fixed to an inner hollow fixed frame to which the damper is attached and which serves as an opening / closing section. An inspection jig for an in-circuit tester, characterized in that a movable base board to which inspection contact pins and the like are attached is attached with a buffer space provided inside the fixed frame.