WO2003095144A1 - Lapping device and lapping work method - Google Patents

Lapping device and lapping work method Download PDF

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Publication number
WO2003095144A1
WO2003095144A1 PCT/JP2003/005843 JP0305843W WO03095144A1 WO 2003095144 A1 WO2003095144 A1 WO 2003095144A1 JP 0305843 W JP0305843 W JP 0305843W WO 03095144 A1 WO03095144 A1 WO 03095144A1
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WO
WIPO (PCT)
Prior art keywords
lapping machine
ultrasonic vibration
lapping
polished
polishing
Prior art date
Application number
PCT/JP2003/005843
Other languages
French (fr)
Japanese (ja)
Inventor
Kazumasa Ohnishi
Original Assignee
Kazumasa Ohnishi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kazumasa Ohnishi filed Critical Kazumasa Ohnishi
Priority to AU2003235919A priority Critical patent/AU2003235919A1/en
Priority to JP2004503207A priority patent/JPWO2003095144A1/en
Publication of WO2003095144A1 publication Critical patent/WO2003095144A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B1/00Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
    • B24B1/04Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes subjecting the grinding or polishing tools, the abrading or polishing medium or work to vibration, e.g. grinding with ultrasonic frequency

Definitions

  • the present invention relates to a lap apparatus and a lap processing method used for high-precision polishing.
  • a lapping device is a device that polishes the surface of an object to be polished, such as a substrate used for forming an integrated circuit, with high precision.
  • FIG. 1 is a front view showing a configuration example of a conventional lapping device
  • FIG. 2 is a plan view of the lapping device of FIG.
  • the lapping apparatus shown in FIGS. 1 and 2 includes a lapping machine 4 fixed to a rotating shaft 2 of a motor 1 via a support 3, and a slurry supply device 1 for supplying abrasive slurry 11 to the surface of the lapping machine 4. 0, and a disk-shaped polishing object holder 5 that rotatably holds the polishing object 6 while bringing the polishing object 6 into contact with the surface of the lapping machine 4 through an abrasive slurry.
  • the polishing object 6 is held (temporarily fixed) on the disk-shaped polishing object holder 5 using wax or the like.
  • the disc-shaped polishing object holder 5 is supported by a pair of rollers 7a and 7b on its side surface. Each of the rollers 7a and 7b is rotatably supported by a roller support member 8 provided at an upper end of a support 9 erected on a base (not shown).
  • the disk-shaped polishing object holder 5 rotates while being supported by the pair of rollers 7a and 7b as the lapping machine 4 rotates.
  • a slurry 14 containing abrasive grains is dripped from the slurry supply means 10 on the surface of the lapping machine 4. Is done.
  • the abrasive slurry 11 is moved toward the object 6 to be polished with the rotation of the lapping machine 4, and is supplied between the lapping machine and the object to be polished.
  • the lapping machine 4 functions to temporarily hold the abrasive grains contained in the abrasive slurry 11 between the lapping machine 4 and the object 6 to be polished.
  • the lapping machine 4 is made of a metal material (eg, tin) that is softer than the abrasive grains.
  • a lapping machine made of tin has its surface slightly depressed by the pressing of the abrasive grains, and temporarily holds the abrasive grains.
  • lapping force polishing using such an abrasive slurry is called lapping force.
  • the type of the abrasive slurry is appropriately selected depending on the type of the object to be polished.
  • abrasive particles contained in the abrasive slurry alumina particles, silica particles, iron oxide particles, chromium oxide particles, diamond particles, and the like are used.
  • a solvent for the abrasive slurry water or oil is used. It is also known that an acidic or alkaline solvent is used as a solvent for the abrasive slurry to chemically erode the surface of the object to be polished to assist polishing by the abrasive.
  • the polishing accuracy of a conventional lapping device differs depending on the configuration of the device and the type of abrasive slurry solvent, but is mainly determined by the size of the abrasive particles contained in the slurry. This is similar to the fact that when the object to be polished is polished with a sandpaper, the polishing accuracy is determined by the roughness of the sandpaper.
  • a processing method for drilling or cutting a workpiece using ultrasonic waves is known.
  • a tool that ultrasonically vibrates in a direction perpendicular to the surface of the processing object is pressed against the surface of the processing object via a solution containing abrasive grains.
  • the energy of the ultrasonic vibration of the tool is applied to the abrasive grains.
  • the workpiece is drilled or cut as the surface continues to be crushed by the impact of abrasive grains.
  • a processing method in which a tool that ultrasonically vibrates in a direction parallel to the surface of the object to be processed is pressed against the surface of the object through a solution containing abrasive grains to polish the surface of the object.
  • the surface of the workpiece contains abrasive grains
  • a processing method of punching, cutting, or polishing an object to be processed by pressing a tool that vibrates ultrasonically through a solution is generally called an ultrasonic abrasive processing method. It is known that the surface roughness of an object after machining is mainly determined by the size of the abrasive grains in the ultrasonic abrasive grain machining method.
  • the polishing accuracy of the conventional lapping device is determined mainly by the size of the abrasive grains contained in the abrasive slurry. That is, in order to increase the polishing accuracy, it is necessary to use abrasive grains of smaller size. Generally, the smaller the size of the abrasive grains, the more expensive they are, and the higher the polishing accuracy, the higher the cost required for polishing.
  • An object of the present invention is to reduce the amount of abrasive slurry used, and to achieve polishing with higher precision than before when using a slurry containing abrasive grains of the same size. It is to provide a device.
  • the present invention relates to a lapping machine, a slurry supply device for supplying abrasive slurry to the surface of the lapping machine, a polishing object holder for holding an object to be polished while contacting the surface of the lapping machine with the abrasive slurry, And a linear motion drive device attached to the lapping machine and / or the object holder for polishing, which linearly moves the lapping machine and / or the object holder to be polished in a direction along the surface of the lapping machine, With the ultrasonic vibration for applying ultrasonic vibration vibrating in a direction perpendicular to the surface of the lapping machine to the lapping machine and / or the object holder to be polished. And a means for supplying electric energy to the ultrasonic vibration applying means.
  • Preferred embodiments of the wrapping device of the present invention are as follows.
  • a linear drive device is attached to each of the lapping machine and the workpiece holder.
  • the moving direction of the lapping machine and the moving direction of the object holder are perpendicular to each other.
  • the ultrasonic vibration applying means of the lapping device of the above (2) is provided with another ultrasonic vibration applying means for applying ultrasonic vibration oscillating in the direction parallel to the surface of the lapping machine.
  • the vibration applying means is also provided with a means for supplying electric energy.
  • a linear drive is attached to the holder for the object to be polished, and a rotary drive is attached to the lapping machine to rotate the lapping machine around a direction perpendicular to the surface as a center axis.
  • Each of the lapping machine and the object holder of the above (4) is provided with an ultrasonic vibration applying means for applying ultrasonic vibration oscillating in a direction perpendicular to the lapping machine surface.
  • the electric energy supply means of the ultrasonic vibration applying means has a mechanism for adjusting the voltage value or frequency value of the electric energy.
  • the present invention also provides a method for adjusting a voltage value or a frequency value of electric energy applied to an ultrasonic vibration applying means in accordance with the progress of polishing of a polishing object polished on a lapping machine surface using the lapping device. There is also a featured lapping method.
  • FIG. 1 is a front view showing a configuration example of a conventional wrap device.
  • FIG. 2 is a plan view of the wrap device of FIG.
  • FIG. 3 is a perspective view showing a configuration example of the wrap device according to the present invention.
  • FIG. 4 is a cross-sectional view illustrating a polishing process using the lap device of FIG.
  • FIG. 5 is a perspective view showing another configuration example of the wrapping device according to the present invention.
  • FIG. 6 is a diagram for explaining the configuration of the ultrasonic vibration applying means of the lap device of FIG.
  • FIG. 7 is a diagram showing still another configuration example of the wrapping device according to the present invention.
  • FIG. 8 is a diagram showing still another configuration example of the wrapping device according to the present invention.
  • FIG. 3 is a perspective view showing a configuration example of the wrapping device according to the present invention.
  • the lapping machine shown in Fig. 3 is a lapping machine 4, a slurry supply device 10a for supplying abrasive slurry 11 to the surface of the lapping machine 4, a 10b, 10c, and a polishing object 6 for the lapping machine 4.
  • the polishing object holder 2 2 b which is held while being in contact with the surface of the workpiece via an abrasive slurry, and the lapping machine 4 and the polishing object holder, which are attached to the lapping machine 4 and the polishing object holder 22 b It is composed of linear drive devices 101 a, 101 b, etc.
  • the polishing object holder 2 2b of the lapping apparatus shown in FIG. 3 is provided with ultrasonic vibration applying means 12 for applying ultrasonic vibration oscillating in the direction perpendicular to the surface of the lapping machine.
  • the sonic vibration applying means 12 is provided with an electric energy supplying means 14.
  • the lapping machine 4 is joined to the base 20 via two linear guides 17a and 17b. With these two linear guides 17a and 17b, the lapping machine 4 can move in a one-dimensional direction (the length direction of the linear guide) along its surface.
  • Slurry supply device 10a , 10b, and 10c are fixed to, for example, the end of the lapping machine 4 by a fixture (not shown). In Fig. 3, the illustration of piping and pumps connected to the slurry supply device is omitted.
  • the linear drive device 101a includes a rotary drive device 1a and a ball screw connected to a rotation shaft of the rotary drive device 1a.
  • the ball screw is composed of a screw shaft 15a and a nut 16a.
  • the ball screw converts the rotary motion of the rotary shaft of the rotary drive 1a into a linear motion of the nut 16a along the length of the screw shaft 15a.
  • the rotation drive device la is fixed to the base 20 by a fixture (not shown). For example, a stepping motor is used as the rotation drive device 1a. Luck
  • the linear drive device 101 a attached to the lapping board 4 moves the lapping board 4 one-dimensionally in a direction along the surface of the lapping board 4.
  • the configuration of the linear drive device 101b is the same as that of the linear drive device 101a.
  • the rotary drive device lb is fixed to the base 20 by a fixture (not shown).
  • a linear driving device 10 lb attached to the polishing object holder 2 2 b via the ultrasonic vibration applying means 12, the polishing object holder 2 2 b is moved along the surface of the lapping machine 4. Move one-dimensionally in the direction.
  • the linear drive device may be attached to at least one of the lapping machine and the holder for the object to be polished.
  • the entire surface of the lapping machine can be used for polishing. That is, in the lapping machine of the present invention, the entire surface of the lapping machine can be used for polishing, so that the surface area of the lapping machine can be set small. Therefore, the amount of slurry supplied for polishing (lapping) can be reduced.
  • the linear drive device is attached to each of the lapping machine 4 and the workpiece holder 22b. Further, it is preferable that the moving direction of the lapping machine 4 and the moving direction of the object holder 22 b are perpendicular to each other. As described above, by attaching the linear drive device to each of the lapping machine 4 and the object holder 22b to be polished, it is not necessary to attach a rotary driving device to the lower side of the lapping machine as in the related art. The height of the wrapping device can be reduced. That is, the lapping device shown in FIG. 3 can be set to have a small surface area of the lapping machine as in the previous IH, and can be downsized because the height of the device is also small.
  • the ultrasonic vibration applying means 12 includes a piezoelectric vibrator having a configuration in which electrode plates 24 g and 24 h are attached to each surface of a disk-shaped piezoelectric ceramic 23 e, a support plate 25, and a disk.
  • a piezoelectric vibrator having a configuration in which electrode plates 24 i and 24 j are attached to each surface of a piezoelectric ceramic 23 f is formed by an upper metal member 22 a and a lower metal member (the polishing object described above).
  • a Langevin type vibrator composed of bolts sandwiched between 22b) is used.
  • Each of the piezoceramics 23e and 23f is polarized in its thickness direction .
  • Each of the piezoelectric ceramics and the electrode plates attached to both sides thereof constitute a piezoelectric vibrator in a longitudinal vibration mode.
  • These longitudinal mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in the direction perpendicular to the surface of the lapping machine.
  • Each of the piezoelectric ceramics 23 e and 23 f is formed of, for example, a lead zirconate titanate-based ceramic material.
  • Each of the electrode plates 24 g, 24 h, and 24 j is formed of, for example, phosphor bronze.
  • Each of the upper metal member 22a, the support plate 25, and the lower metal member is formed of a metal material such as aluminum, for example.
  • the electric energy supply means 14 for example, an AC power supply is used.
  • an AC voltage is supplied to the electrode plate of each piezoelectric vibrator by the electric energy supply means 14
  • each of the piezoelectric ceramics 23e and 23f is moved in a direction perpendicular to its surface, that is, a lapping machine. 4.
  • the ultrasonic vibration applying means 12 applies the ultrasonic vibration vibrating in the direction perpendicular to the lapping machine 4 to the polishing object holder 22b.
  • the ultrasonic vibration applying means may be attached to at least one of the lapping machine and the holder for the object to be polished.
  • Examples of the ultrasonic vibration applying means include an electrostrictive vibrator and a magnetostrictive vibrator.
  • Examples of the electrostrictive vibrator include a piezoelectric vibrator in which electrodes are provided on each surface of a piezoelectric ceramic, and the Langevin type vibrator.
  • Examples of the magnetostrictive vibrator include a metal magnetostrictive vibrator and a fly vibrator.
  • the ultrasonic vibration applying means is attached to the lapping machine (or the holder for the object to be polished) through a couplant such as grease or vaseline so as to efficiently transmit the ultrasonic wave to the lapping machine (or the holder for the object to be polished). It is preferable.
  • the polishing target 6 is held (temporarily fixed) in the polishing target holder 22b using wax or the like. Then, the rotary drive devices la and lb of the linear motion drive devices 101a and 101b are driven, and the lapping machine 4 and the polishing object holder 22b are respectively driven. Is moved one-dimensionally (reciprocating motion) in the direction along the surface of the lapping machine 4. At the same time, the abrasive slurry 11 is supplied to the surface of the lapping machine 4 from each of the slurry supply devices 10a, 10b, and 10c.
  • the lapping machine is attached to the object holder 22 for polishing. Ultrasonic vibration oscillating in the direction perpendicular to the surface of the object.
  • the abrasive slurry 11 is supplied between the polishing object 6 and the lapping machine 4.
  • the surface of the polishing target 6 is polished by the one-dimensional movement of the lapping machine 4 and the polishing target 6 held by the polishing target holder 2 2 b via the abrasive slurry. .
  • the surface of the polishing target 6 is polished with high accuracy by the ultrasonic vibration applied to the polishing object holder 22 b in a direction perpendicular to the surface of the lapping machine 4.
  • FIG. 4 is a cross-sectional view illustrating a polishing process by the lapping device of FIG.
  • the abrasive grains 21 are described in a size larger than the actual size. The description of the abrasive slurry dissolution is omitted.
  • FIG. 4 (A) shows a state in which the surface of the object 6 is polished by the abrasive grains 21 when no ultrasonic vibration is applied to the object holder 22 b.
  • Each of the lapping machine 4 and the polishing object 6 held by the polishing object holder 2 2 b is placed on the surface of the lapping machine 4 with a part of the abrasive grains 21 pressed into each surface. It is moving (reciprocating) one-dimensionally along it. Therefore, the surface of the polishing target 6 is polished by the abrasive grains 21. Since no ultrasonic vibration is applied to the object holder 2 2 b, the surface accuracy of the object 6 after polishing shows the same level of accuracy as when polishing using a conventional lapping device. .
  • FIG. 5B shows a state in which the surface of the object 6 is polished by the abrasive grains 21 when ultrasonic vibration is applied to the object holder 22b. Since the object to be polished 2 2 b is subjected to ultrasonic vibration, Ultrasonic vibration in the direction perpendicular to the plane. This ultrasonic vibration is transmitted to the polishing object 6, and the polishing object also ultrasonically vibrates in a direction perpendicular to the surface of the lapping machine 4. When the object 6 to be polished vibrates ultrasonically, the sound pressure of the ultrasonic wave emitted from the surface of the object 6 causes the gap between the lapping machine 4 and the object 6 to be slightly widened. Guessed. As shown in FIG.
  • the contact area between the polishing target 6 and the abrasive grains 21 is as shown in FIG. 5 (A). Will be smaller than. Therefore, the object to be polished 6 can be polished with high accuracy by the application of the ultrasonic vibration, similarly to the case where the object 6 to be polished is polished with the abrasive grains smaller in size than the abrasive grains 21.
  • FIG. 5 (C) shows that when the object to be polished 22 b is applied with an ultrasonic vibration larger than the ultrasonic vibration given in FIG. 6 shows a state in which the surface is polished. Since greater ultrasonic vibration is applied to the workpiece holder 22, the distance between the lapping machine 4 and the workpiece 6 is further increased, and the workpiece 6 contacts the abrasive grains 21. The area is smaller than in Fig. 5 (B). Therefore, the object 6 can be polished with higher accuracy.
  • the lapping device of the present invention can realize polishing with higher accuracy than that of the conventional lapping device when using a slurry containing abrasive grains of the same size. That is, when the surface of the object to be polished is polished with predetermined accuracy, abrasive grains having a size larger than that of the conventional lapping device can be used. As mentioned above, abrasives become more expensive as their size decreases. Therefore, by using the lapping device of the present invention, the cost required for polishing can be reduced.
  • the polishing accuracy of the conventional lapping device is mainly based on the abrasive grain. Determined by the size of the rally. Therefore, when the surface of the object to be polished is roughly polished and then polished using a conventional lapping device, it is necessary to replace the abrasive slurry.
  • the lapping device of the present invention is capable of polishing objects to be polished with different precisions when polishing is performed without applying ultrasonic vibration to the object holder (or lapping machine), and when polishing is performed by applying ultrasonic waves. can do.
  • the polishing object is roughly polished without applying ultrasonic vibration to the object holder, and then the ultrasonic vibration is applied to the object holder to obtain the abrasive grains to be used.
  • the object to be polished can be finish-polished without replacing the slurry.
  • the electric energy supply means 14 provided in the ultrasonic vibration applying means of the lap device of the present invention includes a mechanism for adjusting the voltage value or the frequency value of the electric energy supplied to the ultrasonic vibration applying means 12. Preferably, it is provided.
  • the ultrasonic vibration applying means By adjusting the voltage value or frequency value of the electric energy supplied to the ultrasonic vibration applying means 12, it is possible to adjust the magnitude of the ultrasonic vibration generated by the ultrasonic vibration applying means, that is, the precision of polishing. it can.
  • the ultrasonic vibration applying means generates the largest ultrasonic vibration when the frequency value of the supplied electric energy (eg, AC voltage) matches the resonance frequency value of the ultrasonic vibration applying means. When the value is higher or lower than the resonance frequency, an ultrasonic vibration smaller than the above value is generated. Therefore, the polishing accuracy can also be adjusted by adjusting the frequency value of the electric energy.
  • the voltage value of the electric energy applied to the ultrasonic vibration applying means in accordance with the progress of the polishing of the object to be polished on the lapping machine surface using the lapping device provided with such electric energy supplying means.
  • the object to be polished is polished without applying ultrasonic vibration to the lapping machine, and as the polishing progresses, gradually larger ultrasonic vibration is applied to make the object to be polished more accurate. By polishing with, the object to be polished can be polished efficiently.
  • the progress of the polishing can be detected, for example, from the magnitude of the friction between the lapping machine being polished and the object to be polished.
  • the ultrasonic vibration transducer support plate As shown in Fig. 3, the ultrasonic vibration transducer support plate
  • a stress sensor for detecting the magnitude of the friction 18 and a stress measuring device 19 for converting an electric signal output from the stress sensor into a stress value (corresponding to the magnitude of the friction).
  • FIG. 5 is a perspective view showing another configuration example of the wrap device according to the present invention.
  • FIG. 6 is a view for explaining the configuration of the ultrasonic vibration applying means of the wrapping device of FIG.
  • the configuration of the lapping device of FIG. 5 is the same as that of FIG. 3 except that the configuration of the ultrasonic vibration applying means 12 is different.
  • the ultrasonic vibration applying means includes an electrode plate 24a, a piezoelectric ceramic 23a, an electrode plate 24b, a piezoelectric ceramic 23b, an electrode plate 24c, and a support.
  • the plate 25, the electrode plate 24d, the piezoelectric ceramic 23c, the electrode plate 24e, the piezoelectric ceramic 23d, and the electrode plate 24f are connected to the upper metal member 22a and the lower metal member (as described above).
  • a Langevin-type vibrator is used which is clamped between the object holder 22 and the object to be polished and bolted.
  • FIG. 6 (C) shows the configuration of each of the piezoelectric ceramics 23c and 23d and the polarization direction thereof.
  • a disc-shaped piezoelectric ceramic is used for each of the piezoelectric ceramics 23c and 23d.
  • the arrows in Fig. 6 (C) indicate the polarization direction of the piezoelectric ceramic.
  • Each of the piezoelectric ceramics 23c and 23d and the electrode plates attached to both sides thereof constitute a piezoelectric vibrator in a longitudinal vibration mode.
  • These longitudinal vibration mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in a direction perpendicular to the surface of the lapping machine.
  • These piezoelectric vibrators are provided with an AC power supply as electric energy supply means (Fig.
  • Each of the piezoelectric ceramics 23c and 23d vibrates in the thickness direction when an AC voltage (electric energy) is supplied through electrode plates attached to both surfaces thereof. Therefore, when the piezoelectric ceramics 23 c and 23 d vibrate, the ultrasonic vibration applying means 12 generates ultrasonic vibration vibrating in a direction perpendicular to the lapping machine surface, and this ultrasonic vibration is polished. Applied to the object holder 2 2 b. When the object to be polished 22 b is ultrasonically oscillated in a direction perpendicular to the surface of the lapping machine 4 by the application of the ultrasonic vibration, the surface of the object to be polished 6 is polished with high accuracy.
  • FIG. 6B shows the configuration of each of the piezoelectric ceramics 23a and 23b and the polarization direction thereof.
  • Each of the piezoelectric ceramics 23a and 23b has four piezoelectric ceramics. Disc-shaped piezoelectric ceramics are used, which are bonded to each other with epoxy resin. The arrows in FIG. 6 (B) indicate the polarization direction of the piezoelectric ceramic.
  • Each of the piezoelectric ceramics 23a and 23b and the electrode plates attached to both sides thereof constitute a torsional vibration mode piezoelectric vibrator.
  • These torsional vibration mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in a direction parallel to the surface of the lapping machine.
  • These piezoelectric vibrators are provided with an AC power supply as an electric energy supply means (Fig. 5: 14b).
  • each of the piezoelectric ceramics 23a and 23b vibrates in the circumferential direction when an AC voltage is supplied through electrode plates attached to both surfaces thereof. Therefore, when the piezoelectric ceramics 23a and 23b vibrate, the ultrasonic vibration applying means 12 generates ultrasonic vibrations vibrating in a direction parallel to the surface of the lapping board 4, and the ultrasonic vibrations Is attached to the polishing object holder 2 2 b.
  • the ultrasonic vibration applying means 12 is provided with another ultrasonic vibration applying means (piezoelectric vibrator in the above-described torsional vibration mode) which vibrates in a direction parallel to the surface of the lapping machine 4. It is also preferred.
  • a bending vibration mode piezoelectric vibrator or a slip vibration mode A piezoelectric vibrator can be used.
  • FIG. 7 is a diagram showing still another configuration example of the wrapping device according to the present invention.
  • the lapping machine 4 of the lapping machine shown in FIG. 7 is provided with a rotation drive device 1a for rotating the lapping machine 4 around a direction perpendicular to the surface as a center axis.
  • the lapping machine 4 is connected to the rotating shaft 2 of the rotary drive.
  • an AC servomotor is used as the rotation driving device la.
  • the linear drive device 101b of the wrapping device shown in FIG. 7 includes a rotary drive device 1b and a ball screw connected to a rotation shaft of the rotary drive device 1b.
  • the ball screw is composed of a screw shaft 15b and a nut 16b.
  • the nut 16 b of the ball screw is connected to the support plate 25 of the ultrasonic vibration applying means 12.
  • the rotary drive lb is fixed to a support standing upright on the base where the rotary drive 1a is installed ( The illustration is omitted).
  • a stepping motor is used as the rotary driving device 1b.
  • the linear drive device 101 b attached to the workpiece holder 5 via the ultrasonic vibration applying means 1 2 moves the workpiece holder 5 one-dimensionally in a direction along the surface of the lapping machine 4. Move.
  • the polishing apparatus has not been used for polishing by moving the holder 5 only one-dimensionally in the direction along the surface of the lapping machine.
  • the vicinity of the center of rotation of the lapping machine on the surface of the lapping machine can be used for polishing. That is, since the entire surface of the lapping machine can be used for polishing, the area of the lapping machine surface (the diameter of the lapping machine) can be set small. Therefore, the amount of slurry supplied to the surface of the lapping machine can be reduced.
  • the polishing object holder 5 of the lapping apparatus shown in FIG. 7 is provided with ultrasonic vibration applying means 12 for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine.
  • the ultrasonic vibration applying means 12 is provided with an electric energy supply means 14b.
  • the lapping machine 4 is provided with ultrasonic vibration applying means 12a and 12b for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine.
  • the ultrasonic vibration applying means 12a and 12b are provided with electric energy supply means 14a.
  • Each of the ultrasonic vibration applying means 12 a and 12 b and the electric energy supply means 14 a are electrically connected via a slip ring 13.
  • an ultrasonic vibration applying means can be added to each of the lapping machine and the holder for the object to be polished.
  • FIG. 8 is a diagram showing still another configuration example of the wrap device according to the present invention.
  • the configuration of the lapping device shown in FIG. 8 is such that ultrasonic vibration applying means 12 c is attached to the side surface of the polishing object holder 5, and the polishing object holding tool 5 is connected to the polishing object holder 5 via the ultrasonic vibration applying means 12 c.
  • a linear drive device 101 b is additionally provided.
  • a linear motor is used as the linear drive device 101b.
  • the linear drive device 101b is fixed to a support erected on a base on which the rotary drive device 1a is installed (not shown).
  • the ultrasonic vibration applying means 12c is configured to connect the support plate 25 and the ultrasonic vibrators arranged on each surface of the support plate 25 to the upper metal member 22a and the lower metal member.
  • Member 2 2 A Langevin type vibrator is used, which is constructed by tightening bolts while sandwiched between C and C.
  • Another support plate 25c is fixed to the support plate 25 of the ultrasonic vibration applying means 12c via a support 25b.
  • the linear drive device 101b is connected to the ultrasonic vibration applying means 12c via the support plate 25c.
  • each of the ultrasonic vibration applying means 12a and 12b applies an ultrasonic vibration to the lapping machine 4 in a direction perpendicular to the surface of the lapping machine.
  • the lapping machine 4 ultrasonically vibrates in a direction perpendicular to its surface, whereby the surface of the object 6 is polished with high accuracy.
  • the ultrasonic vibration applying means 12 c applies ultrasonic vibration to the polishing object holder 5 in a direction parallel to the surface of the lapping machine.
  • the object to be polished 5 is ultrasonically vibrated in a direction parallel to the surface of the lapping board 4 by the application of the ultrasonic vibration, the surface of the object to be polished 6 is polished at a high speed.
  • the configuration of the ultrasonic vibration applying means 12c of the wrapping device of FIG. 8 is the same as that of the ultrasonic vibration applying means 12 of FIG. That is, a piezoelectric vibrator in the longitudinal vibration mode is used as the ultrasonic vibrator included in the ultrasonic vibration applying means 12c.
  • the ultrasonic vibration applying means 12c provided with the piezoelectric vibrator in the longitudinal vibration mode applies ultrasonic vibration vibrating in the direction parallel to the surface of the lapping machine to the workpiece holder 5 to be polished.
  • a piezoelectric vibrator in a longitudinal vibration mode can be used as the ultrasonic vibration applying means for applying the ultrasonic vibration oscillating in the direction parallel to the surface of the lapping machine.
  • the lapping device of the present invention can realize polishing with higher precision than a conventional device when using a slurry containing abrasive grains of the same size by using ultrasonic vibration. Therefore, when polishing the surface of an object to be polished with a predetermined accuracy, the lapping device of the present invention uses a slurry containing abrasive grains having a larger size than that of the conventional device (a more inexpensive abrasive slurry). The polishing used can be performed. Further, in the lapping machine of the present invention, the entire surface of the lapping machine is used for polishing, so that the area of the lapping machine surface can be set small. Therefore, the amount of abrasive slurry supplied to the lapping machine surface of the lapping machine can be reduced. Therefore, using the wrapping device of the present invention By doing so, the cost required for polishing can be reduced.

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

A lapping device characterized in that it includes a lapping machine (4), a slurry supplying device (10) for supplying abrasive slurry (11) to the surface of the lapping machine (4), a holder (22b) for an object to be lapped for holding an object (6) to be lapped while the object is brought into contact with the surface of the lapping machine (4) through the abrasive slurry (11), and linear movement drive devices (101a, 101b) attached to the lapping machine (4) and/or the holder (22b) for an object to be lapped. The lapping device is further characterized in that ultrasonic vibration applying means (12) for applying ultrasonic vibration vibrating in a direction perpendicular to the surface of the lapping machine (4) is attached to the lapping machine (4) and/or the holder (22b) for an object to be lapped, and the ultrasonic vibration applying means (12) is provided with electric energy supplying means (14). Using the lapping device reduces the consumption amount of abrasive, and enables lapping with higher accuracy than conventionally possible when slurry that contains abrasive having the same size as that of conventionally used abrasive is used.

Description

明 細 書 ラップ装置及びラップ加工方法  Description Wrapping apparatus and lapping processing method
[技術分野] [Technical field]
本発明は、 高精度の研磨加工に用いられるラップ装置及びラップ加工方法に関 する。  The present invention relates to a lap apparatus and a lap processing method used for high-precision polishing.
[背景技術] [Background technology]
半導体メモリに代表される集積回路の集積密度が高くなるにつれ、 集積回路の 形成に用いられる基板表面の高低差、 あるいは集積回路を構成する薄膜素子や薄 膜配線などの高低差を小さくするための平坦化技術が必要となっている。 高低差 が大きいと、 集積回路の製造工程で行なわれるパターユングの精度が低下して、 集積回路の集積密度を高くすることが難しくなるからである。 ラップ装置は、 集 積回路の形成に用いられる基板など、 研磨対象物の表面を高精度に研磨する装置 である。  As the integration density of integrated circuits typified by semiconductor memories increases, the height difference between the surface of the substrate used to form the integrated circuit and the height difference between the thin film elements and thin film wiring that constitute the integrated circuit must be reduced. A planarization technique is needed. If the height difference is large, the accuracy of the pattern jung performed in the manufacturing process of the integrated circuit decreases, and it becomes difficult to increase the integration density of the integrated circuit. A lapping device is a device that polishes the surface of an object to be polished, such as a substrate used for forming an integrated circuit, with high precision.
図 1は、 従来のラップ装置の構成例を示す正面図であり、 図 2は、 図 1のラッ プ装置の平面図である。 図 1と図 2に示すラップ装置は、 モータ 1の回転軸 2に 、 支持具 3を介して固定されたラップ盤 4、 ラップ盤 4の表面に砥粒スラリ 1 1 を供給するスラリ供給装置 1 0、 そして研磨対象物 6をラップ盤 4の表面に砥粒 スラリを介して接触させながら回転可能に保持する円盤状の研磨対象物保持具 5 などから構成されている。  FIG. 1 is a front view showing a configuration example of a conventional lapping device, and FIG. 2 is a plan view of the lapping device of FIG. The lapping apparatus shown in FIGS. 1 and 2 includes a lapping machine 4 fixed to a rotating shaft 2 of a motor 1 via a support 3, and a slurry supply device 1 for supplying abrasive slurry 11 to the surface of the lapping machine 4. 0, and a disk-shaped polishing object holder 5 that rotatably holds the polishing object 6 while bringing the polishing object 6 into contact with the surface of the lapping machine 4 through an abrasive slurry.
研磨対象物 6は、 ワックスなどを用いて、 円盤状の研磨対象物保持具 5に保持 (仮固定) される。 円盤状の研磨対象物保持具 5は、 その側面にて一対のローラ 7 a、 7 bにより支持されている。 ローラ 7 a、 7 bのそれぞれは、 基台 (図示 は略する) に立設された支柱 9の上端に備えられたローラ支持部材 8により、 回 転自在に支持されている。 円盤状の研磨対象物保持具 5は、 ラップ盤 4の回転に 伴い、 一対のローラ 7 a、 7 bに支持された状態で回転する。  The polishing object 6 is held (temporarily fixed) on the disk-shaped polishing object holder 5 using wax or the like. The disc-shaped polishing object holder 5 is supported by a pair of rollers 7a and 7b on its side surface. Each of the rollers 7a and 7b is rotatably supported by a roller support member 8 provided at an upper end of a support 9 erected on a base (not shown). The disk-shaped polishing object holder 5 rotates while being supported by the pair of rollers 7a and 7b as the lapping machine 4 rotates.
ラップ盤 4の表面には、 スラリ供給手段 1 0から砥粒を含むスラリ 1 4が滴下 される。 砥粒スラリ 1 1は、 ラップ盤 4の回転に伴って研磨対象物 6の側に移動 され、 ラップ盤と研磨対象物との間に供給される。 A slurry 14 containing abrasive grains is dripped from the slurry supply means 10 on the surface of the lapping machine 4. Is done. The abrasive slurry 11 is moved toward the object 6 to be polished with the rotation of the lapping machine 4, and is supplied between the lapping machine and the object to be polished.
ラップ盤 4は、 砥粒スラリ 1 1に含まれる砥粒を、 ラップ盤 4と研磨対象物 6 との間に一時的に保持する働きをする。 ラップ盤 4は、 砥粒よりも柔らかい金属 材料 (例、 錫) などから構成される。 例えば、 錫製のラップ盤は、 その表面が砥 粒が押し付けられることにより極僅かに凹み、 砥粒を一時的に保持する。 同様に 砥粒を一時的に保持するために、 ラップ盤を、 発泡樹脂もしくは不織布から形成 することも知られている。  The lapping machine 4 functions to temporarily hold the abrasive grains contained in the abrasive slurry 11 between the lapping machine 4 and the object 6 to be polished. The lapping machine 4 is made of a metal material (eg, tin) that is softer than the abrasive grains. For example, a lapping machine made of tin has its surface slightly depressed by the pressing of the abrasive grains, and temporarily holds the abrasive grains. Similarly, it is known to form the lapping machine from foamed resin or nonwoven fabric to temporarily hold the abrasive grains.
ラップ盤 4と研磨対象物 6とのそれぞれが、 これらの間に砥粒を含むスラリが 供給された状態で回転すると、 研磨対象物の表面が研磨される。 このような砥粒 スラリを用いた研磨加工は、 ラップ力卩ェと呼ばれている。  When each of the lapping machine 4 and the object 6 to be polished is rotated while a slurry containing abrasive grains is supplied between them, the surface of the object to be polished is polished. Polishing using such an abrasive slurry is called lapping force.
砥粒スラリの種類は、 研磨対象物の種類によって適宜選定される。 砥粒スラリ に含まれる砥粒としては、 アルミナ粒子、 シリカ粒子、 酸化鉄粒子、 酸化クロム 粒子、 あるいはダイヤモンド粒子などが用いられる。 砥粒スラリの溶媒としては 、 水もしくは油などが用いられる。 砥粒スラリの溶媒として、 酸性あるいはアル カリ性の溶媒を用いて、 研磨対象物の表面を化学的に浸食させ、 砥粒による研磨 を補助することも知られている。  The type of the abrasive slurry is appropriately selected depending on the type of the object to be polished. As the abrasive particles contained in the abrasive slurry, alumina particles, silica particles, iron oxide particles, chromium oxide particles, diamond particles, and the like are used. As a solvent for the abrasive slurry, water or oil is used. It is also known that an acidic or alkaline solvent is used as a solvent for the abrasive slurry to chemically erode the surface of the object to be polished to assist polishing by the abrasive.
従来のラップ装置の研磨精度は、 装置の構成や、 砥粒スラリの溶媒の種類によ つても異なるが、 主としてスラリに含まれる砥粒のサイズにより定まる。 これは 、 研磨対象物をサンドぺーパにより研磨する場合に、 サンドぺーパの粗さによつ て研磨の精度が定まることと同様である。  The polishing accuracy of a conventional lapping device differs depending on the configuration of the device and the type of abrasive slurry solvent, but is mainly determined by the size of the abrasive particles contained in the slurry. This is similar to the fact that when the object to be polished is polished with a sandpaper, the polishing accuracy is determined by the roughness of the sandpaper.
このようなラップ装置とは別に、 超音波を利用して加工対象物を穴あけ、 ある いは切削する加工方法が知られている。 この加工方法においては、 加工対象物の 表面に、 砥粒を含む溶液を介して、 加工対象物の表面に垂直な方向に超音波振動 する工具が押し付けられる。 工具の超音波振動のエネルギーは砥粒に付与される 。 加工対象物は、 砥粒の衝突による表面の破砕が続けられて、 穴あけ、 あるいは 切削される。 また、 加工対象物の表面に、 砥粒を含む溶液を介して、 加工対象物 の表面に平行な方向に超音波振動する工具を押しつけて、 加工対象物の表面を研 磨する加工方法も知られている。 このように、 加工対象物の表面に、 砥粒を含む 溶液を介して超音波振動する工具を押し付けて、 加工対象物の穴あけ、 切削、 あ るいは研磨などを行なう加工方法は、 一般に、 超音波砥粒加工方法と呼ばれてい る。 超音波砥粒加工方法においても、 加工後の加工対象物の表面の粗さは、 主と して砥粒のサイズにより定まることが知られている。 In addition to such a lapping device, a processing method for drilling or cutting a workpiece using ultrasonic waves is known. In this processing method, a tool that ultrasonically vibrates in a direction perpendicular to the surface of the processing object is pressed against the surface of the processing object via a solution containing abrasive grains. The energy of the ultrasonic vibration of the tool is applied to the abrasive grains. The workpiece is drilled or cut as the surface continues to be crushed by the impact of abrasive grains. There is also known a processing method in which a tool that ultrasonically vibrates in a direction parallel to the surface of the object to be processed is pressed against the surface of the object through a solution containing abrasive grains to polish the surface of the object. Have been. In this way, the surface of the workpiece contains abrasive grains A processing method of punching, cutting, or polishing an object to be processed by pressing a tool that vibrates ultrasonically through a solution is generally called an ultrasonic abrasive processing method. It is known that the surface roughness of an object after machining is mainly determined by the size of the abrasive grains in the ultrasonic abrasive grain machining method.
上記のように、 従来のラップ装置の研磨精度は、 主として砥粒スラリに含まれ る砥粒のサイズにより定まる。 すなわち、 研磨の精度を高くするためには、 より 小さなサイズの砥粒を用いる必要がある。 通常、 砥粒は、 そのサイズが小さくな るほど高価であり、 研磨の精度を高くするほど、 研磨加工に要する費用が高くな る。  As described above, the polishing accuracy of the conventional lapping device is determined mainly by the size of the abrasive grains contained in the abrasive slurry. That is, in order to increase the polishing accuracy, it is necessary to use abrasive grains of smaller size. Generally, the smaller the size of the abrasive grains, the more expensive they are, and the higher the polishing accuracy, the higher the cost required for polishing.
その上、 従来のラップ装置では、 ラップ盤表面のラップ盤の回転中心近傍にお いては、 研磨対象物の研磨は行われていないという問題がある。 これは、 前記の 回転中心近傍においては、 ラップ盤の表面の移動速度が低い、 すなわち研磨の速 度が低いからである。 従来のラップ装置においては、 ラップ盤表面のラップ盤の 回転中心近傍、 すなわち、 ラップ盤表面の研磨に用いられない領域にまで砥粒ス ラリを供給する必要がある。 このような領域にまで、 研磨に用いられない砥粒ス ラリを供給することは、 従来のラップ装置の砥粒スラリの使用量が多い原因の一 つである。 砥粒スラリの使用量が多いと、 同様に研磨加工に要する費用が高くな る。  In addition, in the conventional lapping machine, there is a problem that the object to be polished is not polished near the center of rotation of the lapping machine on the lapping machine surface. This is because the moving speed of the surface of the lapping machine is low near the rotation center, that is, the polishing speed is low. In a conventional lapping machine, it is necessary to supply abrasive slurry to the lapping machine surface near the center of rotation of the lapping machine, that is, to a region of the lapping machine surface that is not used for polishing. Supplying the abrasive slurry that is not used for polishing to such a region is one of the causes of the large use of the abrasive slurry in the conventional lapping device. The higher the amount of abrasive slurry used, the higher the cost of polishing.
本発明の目的は、 砥粒スラリの使用量を低減することができ、 そして同じサイ ズの砥粒を含むスラリを用いた場合に、 従来よりも精度が高い研磨を実現するこ とができるラップ装置を提供することにある。  An object of the present invention is to reduce the amount of abrasive slurry used, and to achieve polishing with higher precision than before when using a slurry containing abrasive grains of the same size. It is to provide a device.
[発明の開示] [Disclosure of the Invention]
本発明は、 ラップ盤、 ラップ盤の表面に砥粒スラリを供給するスラリ供給装置 、 研磨対象物を前記ラップ盤の表面に砥粒スラリを介して接触させながら保持す る研磨対象物保持具、 および前記ラップ盤及び/又は研磨対象物保持具に付設さ れ、 ラップ盤及び/又は研磨対象物保持具をラップ盤の表面に沿った方向に一次 元的に移動させる直動駆動装置を含み、 前記ラップ盤及び 又は研磨対象物保持 具に、 ラップ盤の表面に垂直な方向に振動する超音波振動を与える超音波振動付 与手段が付設され、 そしてこの超音波振動付与手段に電気エネルギーの供給手段 が備えられていることを特徴とするラップ装置にある。 The present invention relates to a lapping machine, a slurry supply device for supplying abrasive slurry to the surface of the lapping machine, a polishing object holder for holding an object to be polished while contacting the surface of the lapping machine with the abrasive slurry, And a linear motion drive device attached to the lapping machine and / or the object holder for polishing, which linearly moves the lapping machine and / or the object holder to be polished in a direction along the surface of the lapping machine, With the ultrasonic vibration for applying ultrasonic vibration vibrating in a direction perpendicular to the surface of the lapping machine to the lapping machine and / or the object holder to be polished. And a means for supplying electric energy to the ultrasonic vibration applying means.
本発明のラップ装置の好ましい態様は、 下記の通りである。  Preferred embodiments of the wrapping device of the present invention are as follows.
( 1 ) ラップ盤および研磨対象物保持具のそれぞれに直動駆動装置が付設され (1) A linear drive device is attached to each of the lapping machine and the workpiece holder.
、 前記ラップ盤の移動方向と研磨対象物保持具の移動方向とが互いに直交する。 The moving direction of the lapping machine and the moving direction of the object holder are perpendicular to each other.
( 2 ) 上記 (1 ) のラップ装置の研磨対象物保持具のみに、 上記のラップ盤表 面に垂直な方向に振動する超音波振動を与える超音波振動付与手段が付設されて いる。  (2) Only the holder for the object to be polished of the lapping device of (1) is provided with an ultrasonic vibration applying means for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine.
( 3 ) 上記 (2 ) のラップ装置の超音波振動付与手段に、 ラップ盤の表面に平 行な方向に振動する超音波振動を与える別の超音波振動付与手段が付設され、 こ の超音波振動付与手段にも電気エネルギーの供給手段が備えられている。  (3) The ultrasonic vibration applying means of the lapping device of the above (2) is provided with another ultrasonic vibration applying means for applying ultrasonic vibration oscillating in the direction parallel to the surface of the lapping machine. The vibration applying means is also provided with a means for supplying electric energy.
( 4 ) 研磨対象物保持具に直動駆動装置が付設され、 そしてラップ盤に、 該ラ ップ盤をその表面に垂直な方向を中心軸として回転させる回転駆動装置が付設さ れている。  (4) A linear drive is attached to the holder for the object to be polished, and a rotary drive is attached to the lapping machine to rotate the lapping machine around a direction perpendicular to the surface as a center axis.
( 5 ) 上記 (4 ) のラップ盤および研磨対象物保持具のそれぞれに、 上記のラ ップ盤表面に垂直な方向に振動する超音波振動を与える超音波振動付与手段が付 o & l^Xいる。  (5) Each of the lapping machine and the object holder of the above (4) is provided with an ultrasonic vibration applying means for applying ultrasonic vibration oscillating in a direction perpendicular to the lapping machine surface. X
( 6 ) 超音波振動付与手段の電気エネルギー供給手段に、 電気エネルギーの電 圧値もしくは周波数値を調節する機構が備えられている。  (6) The electric energy supply means of the ultrasonic vibration applying means has a mechanism for adjusting the voltage value or frequency value of the electric energy.
本発明はまた、 上記のラップ装置を用い、 ラップ盤表面で研磨されている研磨 対象物の研磨の進行に応じて超音波振動付与手段に与える電気エネルギーの電圧 値もしくは周波数値を調節することを特徴とするラップ加工方法にもある。  The present invention also provides a method for adjusting a voltage value or a frequency value of electric energy applied to an ultrasonic vibration applying means in accordance with the progress of polishing of a polishing object polished on a lapping machine surface using the lapping device. There is also a featured lapping method.
[図面の簡単な説明] [Brief description of drawings]
図 1は、 従来のラップ装置の構成例を示す正面図である。  FIG. 1 is a front view showing a configuration example of a conventional wrap device.
図 2は、 図 1のラップ装置の平面図である。  FIG. 2 is a plan view of the wrap device of FIG.
図 3は、 本発明に従うラップ装置の構成例を示す斜視図である。  FIG. 3 is a perspective view showing a configuration example of the wrap device according to the present invention.
図 4は、 図 3のラップ装置を用いた研磨加工について説明する断面図である。 図 5は、 本発明に従うラップ装置の別の構成例を示す斜視図である。 図 6は、 図 5のラップ装置の超音波振動付与手段の構成を説明する図である。 図 7は、 本発明に従うラップ装置のさらに別の構成例を示す図である。 FIG. 4 is a cross-sectional view illustrating a polishing process using the lap device of FIG. FIG. 5 is a perspective view showing another configuration example of the wrapping device according to the present invention. FIG. 6 is a diagram for explaining the configuration of the ultrasonic vibration applying means of the lap device of FIG. FIG. 7 is a diagram showing still another configuration example of the wrapping device according to the present invention.
図 8は、 本発明に従ぅラップ装置のさらに別の構成例を示す図である。  FIG. 8 is a diagram showing still another configuration example of the wrapping device according to the present invention.
[発明の詳細な説明] [Detailed description of the invention]
本発明を、 添付の図面を用いて説明する。 図 3は、 本発明に従うラップ装置の 構成例を示す斜視図である。 図 3のラップ装置は、 ラップ盤 4、 ラップ盤 4の表 面に砥粒スラリ 1 1を供給するスラリ供給装置 1 0 a、 1 0 b、 1 0 c、 研磨対 象物 6をラップ盤 4の表面に砥粒スラリを介して接触させながら保持する研磨対 象物保持具 2 2 b、 およびラップ盤 4および研磨対象物保持具 2 2 bに付設され 、 ラップ盤 4および研磨対象物保持具 2 2 bをラップ盤 4の表面に沿った方向に 一次元的に移動させる直動駆動装置 1 0 1 a、 1 0 1 bなどから構成されている 。 そして図 3のラップ装置の研磨対象物保持具 2 2 bには、 ラップ盤の表面に垂 直な方向に振動する超音波振動を与える超音波振動付与手段 1 2が付設され、 そ して超音波振動付与手段 1 2には、 電気エネルギーの供給手段 1 4が備えられて いる。  The present invention will be described with reference to the accompanying drawings. FIG. 3 is a perspective view showing a configuration example of the wrapping device according to the present invention. The lapping machine shown in Fig. 3 is a lapping machine 4, a slurry supply device 10a for supplying abrasive slurry 11 to the surface of the lapping machine 4, a 10b, 10c, and a polishing object 6 for the lapping machine 4. The polishing object holder 2 2 b, which is held while being in contact with the surface of the workpiece via an abrasive slurry, and the lapping machine 4 and the polishing object holder, which are attached to the lapping machine 4 and the polishing object holder 22 b It is composed of linear drive devices 101 a, 101 b, etc. for moving 22 b one-dimensionally in the direction along the surface of the lapping machine 4. And, the polishing object holder 2 2b of the lapping apparatus shown in FIG. 3 is provided with ultrasonic vibration applying means 12 for applying ultrasonic vibration oscillating in the direction perpendicular to the surface of the lapping machine. The sonic vibration applying means 12 is provided with an electric energy supplying means 14.
ラップ盤 4は、 二本のリニアガイド 1 7 a、 1 7 bを介して、 基台 2 0に接合 されている。 この二本のリニアガイド 1 7 a、 1 7 bにより、 ラップ盤 4は、 そ の表面に沿った一次元方向 (リニアガイドの長さ方向) に移動可能とされている スラリ供給装置 1 0 a、 1 0 b、 1 0 cのそれぞれは、 図示しない固定具によ り、 例えば、 ラップ盤 4の端部に固定される。 図 3において、 スラリ供給装置に 接続される配管やポンプなどの記載は省略した。  The lapping machine 4 is joined to the base 20 via two linear guides 17a and 17b. With these two linear guides 17a and 17b, the lapping machine 4 can move in a one-dimensional direction (the length direction of the linear guide) along its surface. Slurry supply device 10a , 10b, and 10c are fixed to, for example, the end of the lapping machine 4 by a fixture (not shown). In Fig. 3, the illustration of piping and pumps connected to the slurry supply device is omitted.
直動駆動装置 1 0 1 aは、 回転駆動装置 1 a、 および回転駆動装置 1 aの回転 軸に接続されたボールねじから構成されている。 ボールねじは、 ねじ軸 1 5 aと ナット 1 6 aとから構成されている。 ボールねじは、 回転駆動装置 1 aの回転軸 の回転運動を、 ねじ軸 1 5 aの長さ方向に沿ったナツト 1 6 aの直線運動に変換 する。 回転駆動装置 l aは、 図示しない固定具により基台 2 0に固定されている 。 回転駆動装置 1 aとしては、 例えば、 ステッピングモータが用いられる。 ラッ プ盤 4に付設された直動駆動装置 1 0 1 aは、 ラップ盤 4を、 ラップ盤 4の表面 に沿った方向に一次元的に移動させる。 The linear drive device 101a includes a rotary drive device 1a and a ball screw connected to a rotation shaft of the rotary drive device 1a. The ball screw is composed of a screw shaft 15a and a nut 16a. The ball screw converts the rotary motion of the rotary shaft of the rotary drive 1a into a linear motion of the nut 16a along the length of the screw shaft 15a. The rotation drive device la is fixed to the base 20 by a fixture (not shown). For example, a stepping motor is used as the rotation drive device 1a. Luck The linear drive device 101 a attached to the lapping board 4 moves the lapping board 4 one-dimensionally in a direction along the surface of the lapping board 4.
直動駆動装置 1 0 1 bの構成は、 直動駆動装置 1 0 1 aと同様である。 回転駆 動装置 l bは、 図示しない固定具により基台 2 0に固定されている。 研磨対象物 保持具 2 2 bに、 超音波振動付与手段 1 2を介して付設された直動駆動装置 1 0 l bは、 研磨対象物保持具 2 2 bを、 ラップ盤 4の表面に沿った方向に一次元的 に移動させる。  The configuration of the linear drive device 101b is the same as that of the linear drive device 101a. The rotary drive device lb is fixed to the base 20 by a fixture (not shown). A linear driving device 10 lb attached to the polishing object holder 2 2 b via the ultrasonic vibration applying means 12, the polishing object holder 2 2 b is moved along the surface of the lapping machine 4. Move one-dimensionally in the direction.
直動駆動装置は、 ラップ盤及び研磨対象物保持具のうちの少なくとも一つに付 設されていればよい。 直動駆動装置により、 ラップ盤及び研磨対象物保持具のう ちの少なくとも一つを一次元的に移動させることにより、 ラップ盤の表面の全体 を研磨に用いることができる。 すなわち、 本発明のラップ装置においては、 ラッ プ盤の表面全体を研磨に用いることができるために、 ラップ盤の表面の面積を小 さく設定することができる。 従って、 研磨加工 (ラップ加工) のために供給する スラリの量を低減することができる。  The linear drive device may be attached to at least one of the lapping machine and the holder for the object to be polished. By moving at least one of the lapping machine and the holder for the object to be polished one-dimensionally by the linear drive device, the entire surface of the lapping machine can be used for polishing. That is, in the lapping machine of the present invention, the entire surface of the lapping machine can be used for polishing, so that the surface area of the lapping machine can be set small. Therefore, the amount of slurry supplied for polishing (lapping) can be reduced.
図 3に示すように、 直動駆動装置は、 ラップ盤 4および研磨対象物保持具 2 2 bのそれぞれに付設されていることが好ましい。 さらに、 ラップ盤 4の移動方向 と研磨対象物保持具 2 2 bの移動方向は、 互いに直交することが好ましい。 この ように、 直動駆動装置をラップ盤 4および研磨対象物保持具 2 2 bのそれぞれに 付設することにより、 従来のようにラップ盤の下側に回転駆動装置を付設する必 要がなくなり、 ラップ装置の高さを小さくすることができる。 すなわち、 図 3の ラップ装置は、 前 IHのようにラップ盤の表面の面積を小さく設定することができ 、 そして装置の高さも小さいために、 小型化が可能である。  As shown in FIG. 3, it is preferable that the linear drive device is attached to each of the lapping machine 4 and the workpiece holder 22b. Further, it is preferable that the moving direction of the lapping machine 4 and the moving direction of the object holder 22 b are perpendicular to each other. As described above, by attaching the linear drive device to each of the lapping machine 4 and the object holder 22b to be polished, it is not necessary to attach a rotary driving device to the lower side of the lapping machine as in the related art. The height of the wrapping device can be reduced. That is, the lapping device shown in FIG. 3 can be set to have a small surface area of the lapping machine as in the previous IH, and can be downsized because the height of the device is also small.
超音波振動付与手段 1 2としては、 円盤状の圧電セラミック 2 3 eの各々の面 に電極板 2 4 g、 2 4 hが付設された構成の圧電振動子、 支持板 2 5、 および円 盤状の圧電セラミック 2 3 f の各々の面に電極板 2 4 i、 2 4 jが付設された構 成の圧電振動子を、 上側金属部材 2 2 aと下側金属部材 (前記の研磨対象物 2 2 b ) とで挟んだ状態でボルト締めして構成されるランジュバン型振動子が用いら れている。  The ultrasonic vibration applying means 12 includes a piezoelectric vibrator having a configuration in which electrode plates 24 g and 24 h are attached to each surface of a disk-shaped piezoelectric ceramic 23 e, a support plate 25, and a disk. A piezoelectric vibrator having a configuration in which electrode plates 24 i and 24 j are attached to each surface of a piezoelectric ceramic 23 f is formed by an upper metal member 22 a and a lower metal member (the polishing object described above). A Langevin type vibrator composed of bolts sandwiched between 22b) is used.
圧電セラミック 2 3 e、 2 3 f のそれぞれは、 その厚み方向に分極されている 。 各々の圧電セラミックと、 その両面に付設されている電極板とにより、 縦振動 モードの圧電振動子が構成されている。 これらの縦振動モードの圧電振動子が、 ラップ盤の表面に垂直な方向に振動する超音波を付与する超音波振動付与手段と して機能する。 Each of the piezoceramics 23e and 23f is polarized in its thickness direction . Each of the piezoelectric ceramics and the electrode plates attached to both sides thereof constitute a piezoelectric vibrator in a longitudinal vibration mode. These longitudinal mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in the direction perpendicular to the surface of the lapping machine.
圧電セラミック 2 3 e、 2 3 f のそれぞれは、 例えば、 ジルコン酸チタン酸鉛 系のセラミック材料から形成される。 電極板 2 4 g、 2 4 h、 2 4 jのそれぞれ は、 例えば、 リン青銅から形成される。 上側金属部材 2 2 a、 支持板 2 5、 およ び下側金属部材のそれぞれは、 例えば、 アルミニウムなどの金属材料から形成さ れる。  Each of the piezoelectric ceramics 23 e and 23 f is formed of, for example, a lead zirconate titanate-based ceramic material. Each of the electrode plates 24 g, 24 h, and 24 j is formed of, for example, phosphor bronze. Each of the upper metal member 22a, the support plate 25, and the lower metal member is formed of a metal material such as aluminum, for example.
電気エネルギー供給手段 1 4としては、 例えば、 交流電源が用いられる。 電気 エネルギー供給手段 1 4により、 各々の圧電振動子の電極板に交流電圧が供給さ れると、 圧電セラミック 2 3 e、 2 3 f のそれぞれは、 その面に垂直な方向、 す なわちラップ盤 4の表面に垂直な方向に振動する超音波振動を発生する。 これに より、 超音波振動付与手段 1 2は、 ラップ盤 4に垂直な方向に振動する超音波振 動を、 研磨対象物保持具 2 2 bに付与する。  As the electric energy supply means 14, for example, an AC power supply is used. When an AC voltage is supplied to the electrode plate of each piezoelectric vibrator by the electric energy supply means 14, each of the piezoelectric ceramics 23e and 23f is moved in a direction perpendicular to its surface, that is, a lapping machine. 4. Generates ultrasonic vibration that vibrates in the direction perpendicular to the surface. Thereby, the ultrasonic vibration applying means 12 applies the ultrasonic vibration vibrating in the direction perpendicular to the lapping machine 4 to the polishing object holder 22b.
超音波振動付与手段は、 ラップ盤および研磨対象物保持具のうちの少なくとも 一つに付設されていればよい。 超音波振動付与手段の例としては、 電歪振動子及 び磁歪振動子が挙げられる。 電歪振動子の例としては、 圧電セラミックの各々の 面に電極が付設された構成の圧電振動子、 および前記ランジュバン型振動子が挙 げられる。 磁歪振動子の例としては、 金属磁歪振動子、 およびフ ライト振動子 が挙げられる。 超音波振動付与手段としては、 その構成が簡単であることから電 歪振動子を用いることが好ましい。 超音波振動付与手段は、 ラップ盤 (もしくは 研磨対象物保持具) に効率良く超音波を伝えるために、 グリースやワセリンなど の接触媒質を介してラップ盤 (もしくは研磨対象物保持具) に付設することが好 ましい。  The ultrasonic vibration applying means may be attached to at least one of the lapping machine and the holder for the object to be polished. Examples of the ultrasonic vibration applying means include an electrostrictive vibrator and a magnetostrictive vibrator. Examples of the electrostrictive vibrator include a piezoelectric vibrator in which electrodes are provided on each surface of a piezoelectric ceramic, and the Langevin type vibrator. Examples of the magnetostrictive vibrator include a metal magnetostrictive vibrator and a fly vibrator. As the ultrasonic vibration applying means, it is preferable to use an electrostrictive vibrator because of its simple structure. The ultrasonic vibration applying means is attached to the lapping machine (or the holder for the object to be polished) through a couplant such as grease or vaseline so as to efficiently transmit the ultrasonic wave to the lapping machine (or the holder for the object to be polished). It is preferable.
次に、 図 3のラップ装置を用いて、 研磨対象物を研磨する手順について説明す る。 まず研磨対象物 6を、 ワックスなどを用いて、 研磨対象物保持具 2 2 bに保 持 (仮固定) する。 そして直動駆動装置 1 0 1 a、 1 0 1 bの各々の回転駆動装 置 l a、 l bを駆動させて、 ラップ盤 4及び研磨対象物保持具 2 2 bのそれぞれ を、 ラップ盤 4の表面に沿った方向に一次元的に移動 (往復運動) させる。 同時 に、 スラリ供給装置 1 0 a、 1 0 b、 1 0 cのそれぞれから、 ラップ盤 4の表面 に砥粒スラリ 1 1を供給する。 そして同時に、 超音波振動付与手段 1 2の各々の 圧電振動子に、 電気エネルギー付与手段 1 4を用いて交流電圧 (電気エネルギー ) を供給することにより、 研磨対象物保持具 2 2 に、 ラップ盤の表面に垂直な 方向に振動する超音波振動を付与する。 Next, a procedure for polishing an object to be polished using the lapping apparatus shown in FIG. 3 will be described. First, the polishing target 6 is held (temporarily fixed) in the polishing target holder 22b using wax or the like. Then, the rotary drive devices la and lb of the linear motion drive devices 101a and 101b are driven, and the lapping machine 4 and the polishing object holder 22b are respectively driven. Is moved one-dimensionally (reciprocating motion) in the direction along the surface of the lapping machine 4. At the same time, the abrasive slurry 11 is supplied to the surface of the lapping machine 4 from each of the slurry supply devices 10a, 10b, and 10c. At the same time, by applying an AC voltage (electric energy) to each of the piezoelectric vibrators of the ultrasonic vibration applying means 12 using the electric energy applying means 14, the lapping machine is attached to the object holder 22 for polishing. Ultrasonic vibration oscillating in the direction perpendicular to the surface of the object.
ラップ盤 4と研磨対象物保持具 2 2 bの移動に伴い、 砥粒スラリ 1 1は、 研磨 対象物 6とラップ盤 4との間に供給される。 ラップ盤 4と、 研磨対象物保持具 2 2 bに保持された研磨対象物 6とが、 砥粒スラリを介して一次元的に移動するこ とにより、 研磨対象物 6の表面が研磨される。 この研磨加工において、 研磨対象 物保持具 2 2 bに付与された、 ラップ盤 4の表面に垂直な方向に振動する超音波 振動によって、 研磨対象物 6の表面が高い精度で研磨される。  Along with the movement of the lapping machine 4 and the polishing object holder 2 2 b, the abrasive slurry 11 is supplied between the polishing object 6 and the lapping machine 4. The surface of the polishing target 6 is polished by the one-dimensional movement of the lapping machine 4 and the polishing target 6 held by the polishing target holder 2 2 b via the abrasive slurry. . In this polishing process, the surface of the polishing target 6 is polished with high accuracy by the ultrasonic vibration applied to the polishing object holder 22 b in a direction perpendicular to the surface of the lapping machine 4.
次に、 図 3のラップ装置を用いた研磨加工 (ラップ加工) と、 超音波振動付与 手段 1 2により研磨対象物保持具 2 2 bに付与される超音波振動との関係につい て説明する。 図 4は、 図 3のラップ装置による研磨加工について説明する断面図 である。 図 4においては、 研磨対象物 6の表面がスラリの砥粒により研磨されて いる状態を説明するために、 砥粒 2 1を実際よりも大きなサイズで記載する。 ま た、 砥粒スラリの溶^は、 記載を省略する。  Next, the relationship between the polishing (lapping) using the lapping apparatus shown in FIG. 3 and the ultrasonic vibration applied to the object holder 22 b by the ultrasonic vibration applying means 12 will be described. FIG. 4 is a cross-sectional view illustrating a polishing process by the lapping device of FIG. In FIG. 4, in order to explain a state where the surface of the polishing target 6 is polished by the abrasive grains of the slurry, the abrasive grains 21 are described in a size larger than the actual size. The description of the abrasive slurry dissolution is omitted.
図 4 (A) は、 研磨対象物保持具 2 2 bに超音波振動が付与されていない場合 に、 砥粒 2 1によって研磨対象物 6の表面が研磨されている状態を示している。 ラップ盤 4と、 研磨対象物保持具 2 2 bに保持された研磨対象物 6とのそれぞれ は、 各々の表面に砥粒 2 1の一部が押し込まれた状態で、 ラップ盤 4の表面に沿 つて一次元的に移動 (往復運動) している。 このため、 研磨対象物 6の表面が、 砥粒 2 1によって研磨される。 研磨対象物保持具 2 2 bに超音波振動が付与され ていないために、 研磨後の研磨対象物 6の表面の精度は、 従来のラップ装置を用 いて研磨した場合と同程度の精度を示す。  FIG. 4 (A) shows a state in which the surface of the object 6 is polished by the abrasive grains 21 when no ultrasonic vibration is applied to the object holder 22 b. Each of the lapping machine 4 and the polishing object 6 held by the polishing object holder 2 2 b is placed on the surface of the lapping machine 4 with a part of the abrasive grains 21 pressed into each surface. It is moving (reciprocating) one-dimensionally along it. Therefore, the surface of the polishing target 6 is polished by the abrasive grains 21. Since no ultrasonic vibration is applied to the object holder 2 2 b, the surface accuracy of the object 6 after polishing shows the same level of accuracy as when polishing using a conventional lapping device. .
図 5 ( B ) は、 研磨対象物保持具 2 2 bに超音波振動が付与されている場合に 、 砥粒 2 1によって研磨対象物 6の表面が研磨されている状態を示している。 研 磨対象物保持具 2 2 bは、 超音波振動が付与されているために、 ラップ盤 4の表 面に垂直な方向に超音波振動する。 この超音波振動は研磨対象物 6に伝わり、 研 磨対象物もラップ盤 4の表面に垂直な方向に超音波振動する。 このように研磨対 象物 6が超音波振動すると、 研磨対象物 6の表面から発せれらた超音波の音圧に よって、 ラップ盤 4と研磨対象物 6との間隔が極僅かに広がると推測される。 図 5 ( B ) に示すように、 ラップ盤 4と研磨対象物 6との間隔が極僅かに広がると 、 研磨対象物 6と砥粒 2 1との接触面積は、 図 5 (A) の場合よりも小さくなる 。 このため、 超音波振動の付与によって、 研磨対象物 6を、 砥粒 2 1よりも小さ なサイズの砥粒によつて研磨した場合と同様に、 高い精度で研磨することができ る。 FIG. 5B shows a state in which the surface of the object 6 is polished by the abrasive grains 21 when ultrasonic vibration is applied to the object holder 22b. Since the object to be polished 2 2 b is subjected to ultrasonic vibration, Ultrasonic vibration in the direction perpendicular to the plane. This ultrasonic vibration is transmitted to the polishing object 6, and the polishing object also ultrasonically vibrates in a direction perpendicular to the surface of the lapping machine 4. When the object 6 to be polished vibrates ultrasonically, the sound pressure of the ultrasonic wave emitted from the surface of the object 6 causes the gap between the lapping machine 4 and the object 6 to be slightly widened. Guessed. As shown in FIG. 5 (B), when the gap between the lapping machine 4 and the polishing target 6 is extremely slightly increased, the contact area between the polishing target 6 and the abrasive grains 21 is as shown in FIG. 5 (A). Will be smaller than. Therefore, the object to be polished 6 can be polished with high accuracy by the application of the ultrasonic vibration, similarly to the case where the object 6 to be polished is polished with the abrasive grains smaller in size than the abrasive grains 21.
図 5 ( C ) は、 研磨対象物保持具 2 2 bに、 図 5 ( B ) で付与した超音波振動 よりも大きな超音波振動が付与されている場合に、 砥粒 2 1によって研磨対象物 6の表面が研磨されている状態を示している。 研磨対象物保持具 2 2 に、 より 大きな超音波振動が付与されているために、 ラップ盤 4と研磨対象物 6との間隔 がさらに広がって、 研磨対象物 6と砥粒 2 1との接触面積は、 図 5 ( B ) の場合 よりも小さくなる。 従って、 研磨対象物 6を、 さらに高い精度で研磨することが できる。  FIG. 5 (C) shows that when the object to be polished 22 b is applied with an ultrasonic vibration larger than the ultrasonic vibration given in FIG. 6 shows a state in which the surface is polished. Since greater ultrasonic vibration is applied to the workpiece holder 22, the distance between the lapping machine 4 and the workpiece 6 is further increased, and the workpiece 6 contacts the abrasive grains 21. The area is smaller than in Fig. 5 (B). Therefore, the object 6 can be polished with higher accuracy.
このように、 本発明のラップ装置は、 同じサイズの砥粒が含まれるスラリを用 いた場合に、 従来のラップ装置の場合よりも精度が高い研磨を実現することがで きる。 即ち、 研磨対象物の表面を所定の精度で研磨する場合に、 従来のラップ装 置よりも大きなサイズの砥粒を用いることができる。 前述のように、 砥粒は、 そ のサイズが小さくなるほど高価となる。 従って、 本発明のラップ装置を用いるこ とにより、 研磨加工に要する費用を低減することができる。  As described above, the lapping device of the present invention can realize polishing with higher accuracy than that of the conventional lapping device when using a slurry containing abrasive grains of the same size. That is, when the surface of the object to be polished is polished with predetermined accuracy, abrasive grains having a size larger than that of the conventional lapping device can be used. As mentioned above, abrasives become more expensive as their size decreases. Therefore, by using the lapping device of the present invention, the cost required for polishing can be reduced.
また、 従来のラップ装置を用いた研磨加工においては、 研磨の途中で砥粒スラ リの溶媒が乾燥した場合に研磨対象物表面にスクラッチが発生し易い問題があつ た。 本発明のラップ装置を用いた研磨加工においては、 研磨対象物保持具に超音 波振動を付与することによって、 研磨対象物と砥粒との接触面積、 すなわち互い の摩擦が低減されている。 従って、 研磨の途中で砥粒スラリの溶媒が乾燥した場 合の研磨対象物表面のスクラツチの発生を低減することもできる。  Further, in the polishing using a conventional lapping device, there is a problem that when the solvent of the abrasive slurry is dried during the polishing, scratches are easily generated on the surface of the object to be polished. In the polishing process using the lapping device of the present invention, the contact area between the polishing object and the abrasive grains, that is, the friction between the polishing particles, is reduced by applying ultrasonic vibration to the polishing object holder. Therefore, it is also possible to reduce the occurrence of scratches on the surface of the object to be polished when the solvent of the abrasive slurry is dried during polishing.
また、 前記のように、 従来のラップ装置の研磨加工の精度は、 主として砥粒ス ラリのサイズにより定まる。 このため、 従来のラップ装置を用いて、 研磨対象物 の表面を、 粗研磨、 そして仕上げ研磨するような場合には、 砥粒スラリの交換が 必要であった。 本発明のラップ装置は、 研磨対象物保持具 (もしくはラップ盤) に超音波振動を付与しないで研磨した場合と、 超音波を付与して研磨した場合と で、 研磨対象物を異なる精度で研磨することができる。 このような特徴を生かし て、 まず、 研磨対象物保持具に超音波振動を付与しないで研磨対象物を粗研磨し 、 次いで研磨対象物保持具に超音波振動を付与することにより、 用いる砥粒スラ リを交換することなく、 この研磨対象物を仕上げ研磨することができる。 In addition, as described above, the polishing accuracy of the conventional lapping device is mainly based on the abrasive grain. Determined by the size of the rally. Therefore, when the surface of the object to be polished is roughly polished and then polished using a conventional lapping device, it is necessary to replace the abrasive slurry. The lapping device of the present invention is capable of polishing objects to be polished with different precisions when polishing is performed without applying ultrasonic vibration to the object holder (or lapping machine), and when polishing is performed by applying ultrasonic waves. can do. By taking advantage of such features, first, the polishing object is roughly polished without applying ultrasonic vibration to the object holder, and then the ultrasonic vibration is applied to the object holder to obtain the abrasive grains to be used. The object to be polished can be finish-polished without replacing the slurry.
本発明のラップ装置の超音波振動付与手段に備えられた電気エネルギー供給手 段 1 4には、 超音波振動付与手段 1 2に供給する電気エネルギーの電圧値もしく は周波数値を調節する機構が備えられていることが好ましい。  The electric energy supply means 14 provided in the ultrasonic vibration applying means of the lap device of the present invention includes a mechanism for adjusting the voltage value or the frequency value of the electric energy supplied to the ultrasonic vibration applying means 12. Preferably, it is provided.
超音波振動付与手段 1 2に供給する電気エネルギーの電圧値もしくは周波数値 を調節することにより、 超音波振動付与手段の発生する超音波振動の大きさ、 す なわち研磨の精度を調節することができる。 なお、 超音波振動付与手段は、 供給 された電気エネルギー (例、 交流電圧) の周波数値が、 超音波振動付与手段の共 振周波数値と一致するときに最も大きな超音波振動を発生し、 周波数値が共振周 波数値より高い値又は低い値であるときには、 前記よりも小さな超音波振動を発 生する。 従って、 電気エネルギーの周波数値を調節することによつても、 研磨の 精度を調節することができる。  By adjusting the voltage value or frequency value of the electric energy supplied to the ultrasonic vibration applying means 12, it is possible to adjust the magnitude of the ultrasonic vibration generated by the ultrasonic vibration applying means, that is, the precision of polishing. it can. The ultrasonic vibration applying means generates the largest ultrasonic vibration when the frequency value of the supplied electric energy (eg, AC voltage) matches the resonance frequency value of the ultrasonic vibration applying means. When the value is higher or lower than the resonance frequency, an ultrasonic vibration smaller than the above value is generated. Therefore, the polishing accuracy can also be adjusted by adjusting the frequency value of the electric energy.
そして、 このような電気エネルギー供給手段が備えられたラップ装置を用いて 、 ラップ盤表面で研磨されている研磨対象物の研磨の進行に応じて超音波振動付 与手段に与える電気エネルギーの電圧値もしくは周波数を調節しながら、 研磨対 象物を研磨することが好ましい。 すなわち、 粗加工の段階では、 ラップ盤に超音 波振動を付与せずに研磨対象物を研磨し、 研磨の進行に応じて、 次第に大きな超 音波振動を付与して研磨対象物をより高い精度で研磨していくことにより、 研磨 対象物を効率良く研磨することができる。  The voltage value of the electric energy applied to the ultrasonic vibration applying means in accordance with the progress of the polishing of the object to be polished on the lapping machine surface using the lapping device provided with such electric energy supplying means. Alternatively, it is preferable to polish the object to be polished while adjusting the frequency. In other words, in the roughing stage, the object to be polished is polished without applying ultrasonic vibration to the lapping machine, and as the polishing progresses, gradually larger ultrasonic vibration is applied to make the object to be polished more accurate. By polishing with, the object to be polished can be polished efficiently.
研磨の進行具合は、 例えば、 研磨中のラップ盤と研磨対象物との摩擦の大きさ から検出することができる。 図 3のラップ装置の超音波振動子の支持板 2 5と直  The progress of the polishing can be detected, for example, from the magnitude of the friction between the lapping machine being polished and the object to be polished. As shown in Fig. 3, the ultrasonic vibration transducer support plate
0 1 bとの間には、 前記摩擦の大きさを検出するための応力センサ 1 8、 そして応力センサの出力する電気信号を応力値 (前記の摩擦の大きさに対 応する) に変換する応力測定装置 1 9が備えられている。 0 1 b, a stress sensor for detecting the magnitude of the friction 18 and a stress measuring device 19 for converting an electric signal output from the stress sensor into a stress value (corresponding to the magnitude of the friction).
図 5は、 本発明に従うラップ装置の別の構成例を示す斜視図であ。 そして図 6 は、 図 5のラップ装置の超音波振動付与手段の構成を説明する図である。 図 5の ラップ装置の構成は、 その超音波振動付与手段 1 2の構成がことなること以外は 、 図 3のラップ装置と同様である。  FIG. 5 is a perspective view showing another configuration example of the wrap device according to the present invention. FIG. 6 is a view for explaining the configuration of the ultrasonic vibration applying means of the wrapping device of FIG. The configuration of the lapping device of FIG. 5 is the same as that of FIG. 3 except that the configuration of the ultrasonic vibration applying means 12 is different.
図 6 (A) に示すように、 超音波振動付与手段は、 電極板 2 4 a、 圧電セヲミ ック 2 3 a、 電極板 2 4 b、 圧電セラミック 2 3 b、 電極板 2 4 c、 支持板 2 5 、 電極板 2 4 d、 圧電セラミック 2 3 c、 電極板 2 4 e、 圧電セラミック 2 3 d 、 および電極板 2 4 f を、 上側金属部材 2 2 aと下側金属部材 (前記の研磨対象 物保持具 2 2 b ) とで挟んだ状態でボルト締めして構成されるランジュバン型振 動子が用いられている。  As shown in FIG. 6 (A), the ultrasonic vibration applying means includes an electrode plate 24a, a piezoelectric ceramic 23a, an electrode plate 24b, a piezoelectric ceramic 23b, an electrode plate 24c, and a support. The plate 25, the electrode plate 24d, the piezoelectric ceramic 23c, the electrode plate 24e, the piezoelectric ceramic 23d, and the electrode plate 24f are connected to the upper metal member 22a and the lower metal member (as described above). A Langevin-type vibrator is used which is clamped between the object holder 22 and the object to be polished and bolted.
図 6 ( C ) は、 圧電セラミック 2 3 c、 2 3 dの各々の構成と、 その分極方向 を示している。 圧電セラミック 2 3 c、 2 3 dの各々には、 円盤状の圧電セラミ ックが用いられている。 図 6 ( C ) に記入した矢印は、 圧電セラミックの分極方 向を示している。 圧電セラミック 2 3 c、 2 3 dのそれぞれと、 その両面に付設 された電極板とにより、 縦振動モードの圧電振動子が構成されている。 これらの 縦振動モードの圧電振動子が、 ラップ盤の表面に垂直な方向に振動する超音波を 付与する超音波振動付与手段として機能する。 そしてこれらの圧電振動子には、 電気エネルギー供給手段 (図 5 : 1 4 a ) として、 交流電源が備えられている。 圧電セラミック 2 3 c、 2 3 dのそれぞれは、 その両面に付設された電極板を 介して交流電圧 (電気エネルギー) が供給されると、 その厚み方向に振動する。 従って、 圧電セラミック 2 3 c、 2 3 dが振動することにより、 超音波振動付与 手段 1 2は、 ラップ盤表面に垂直な方向に振動する超音波振動を発生し、 この超 音波振動を研磨対象物保持具 2 2 bに付与する。 この超音波振動の付与により、 研磨対象物保持具 2 2 bが、 ラップ盤 4の表面に垂直な方向に超音波振動すると 、 研磨対象物 6の表面が高い精度で研磨される。  FIG. 6 (C) shows the configuration of each of the piezoelectric ceramics 23c and 23d and the polarization direction thereof. A disc-shaped piezoelectric ceramic is used for each of the piezoelectric ceramics 23c and 23d. The arrows in Fig. 6 (C) indicate the polarization direction of the piezoelectric ceramic. Each of the piezoelectric ceramics 23c and 23d and the electrode plates attached to both sides thereof constitute a piezoelectric vibrator in a longitudinal vibration mode. These longitudinal vibration mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in a direction perpendicular to the surface of the lapping machine. These piezoelectric vibrators are provided with an AC power supply as electric energy supply means (Fig. 5: 14a). Each of the piezoelectric ceramics 23c and 23d vibrates in the thickness direction when an AC voltage (electric energy) is supplied through electrode plates attached to both surfaces thereof. Therefore, when the piezoelectric ceramics 23 c and 23 d vibrate, the ultrasonic vibration applying means 12 generates ultrasonic vibration vibrating in a direction perpendicular to the lapping machine surface, and this ultrasonic vibration is polished. Applied to the object holder 2 2 b. When the object to be polished 22 b is ultrasonically oscillated in a direction perpendicular to the surface of the lapping machine 4 by the application of the ultrasonic vibration, the surface of the object to be polished 6 is polished with high accuracy.
図 6 ( B ) は、 圧電セラミック 2 3 a、 2 3 bの各々の構成と、 その分極方向 を示している。 圧電セラミック 2 3 a、 2 3 bの各々には、 四個の圧電セラミツ クがエポキシ樹脂で互いに接合された構成の円盤状の圧電セラミックが用いられ ている。 図 6 ( B ) に記入した矢印は、 圧電セラミックの分極方向を示している 。 圧電セラミック 2 3 a、 2 3 bのそれぞれと、 その両面に付設された電極板と により、 ねじれ振動モードの圧電振動子が構成されている。 これらのねじれ振動 モードの圧電振動子が、 ラップ盤の表面に平行な方向に振動する超音波を付与す る超音波振動付与手段として機能する。 そしてこれらの圧電振動子には、 電気工 ネルギー供給手段 (図 5 : 1 4 b ) として、 交流電源が備えられている。 FIG. 6B shows the configuration of each of the piezoelectric ceramics 23a and 23b and the polarization direction thereof. Each of the piezoelectric ceramics 23a and 23b has four piezoelectric ceramics. Disc-shaped piezoelectric ceramics are used, which are bonded to each other with epoxy resin. The arrows in FIG. 6 (B) indicate the polarization direction of the piezoelectric ceramic. Each of the piezoelectric ceramics 23a and 23b and the electrode plates attached to both sides thereof constitute a torsional vibration mode piezoelectric vibrator. These torsional vibration mode piezoelectric vibrators function as ultrasonic vibration applying means for applying ultrasonic waves vibrating in a direction parallel to the surface of the lapping machine. These piezoelectric vibrators are provided with an AC power supply as an electric energy supply means (Fig. 5: 14b).
圧電セラミック 2 3 a、 2 3 bのそれぞれは、 その両面に付設された電極板を 介して交流電圧が供給されると、 その周方向に沿って振動する。 従って、 圧電セ ラミック 2 3 a、 2 3 bが振動することにより、 超音波振動付与手段 1 2はラッ プ盤 4の表面に平行な方向に振動する超音波振動を発生し、 この超音波振動を研 磨対処物保持具 2 2 bに付与する。 この超音波振動の付与により、 研磨対象物保 持具 2 2 bが、 ラップ盤 4の表面に平行な方向に超音波振動すると、 研磨対象物 6の表面が高い速度で研磨される。 このように、 超音波振動付与手段 1 2には、 ラップ盤 4の表面に平行な方向に振動する別の超音波振動付与手段 (上記のねじ れ振動モードの圧電振動子) が付設されていることも好ましい。  Each of the piezoelectric ceramics 23a and 23b vibrates in the circumferential direction when an AC voltage is supplied through electrode plates attached to both surfaces thereof. Therefore, when the piezoelectric ceramics 23a and 23b vibrate, the ultrasonic vibration applying means 12 generates ultrasonic vibrations vibrating in a direction parallel to the surface of the lapping board 4, and the ultrasonic vibrations Is attached to the polishing object holder 2 2 b. When the object holder 22 b is ultrasonically vibrated in a direction parallel to the surface of the lapping machine 4 by the application of the ultrasonic vibration, the surface of the object 6 is polished at a high speed. As described above, the ultrasonic vibration applying means 12 is provided with another ultrasonic vibration applying means (piezoelectric vibrator in the above-described torsional vibration mode) which vibrates in a direction parallel to the surface of the lapping machine 4. It is also preferred.
また、 ラップ盤の表面に水平な方向に振動する超音波振動付与手段としては、 上記のねじれ振動モードの圧電振動子の他に、 例えば、 曲げ振動モードの圧電振 動子、 あるいはすべり振動モードの圧電振動子を用いることができる。  In addition to the above-described torsional vibration mode piezoelectric vibrator, for example, a bending vibration mode piezoelectric vibrator or a slip vibration mode A piezoelectric vibrator can be used.
図 7は、 本発明に従うラップ装置のさらに別の構成例を示す図である。 図 7の ラップ装置のラップ盤 4には、 ラップ盤 4をその表面に垂直な方向を中心軸とし て回転させる回転駆動装置 1 aが付設されている。 ラップ盤 4は、 回転駆動装置 の回転軸 2に接続されている。 図 7のラップ装置の場合、 回転駆動装置 l aとし ては、 A Cサーボモータが用いられている。  FIG. 7 is a diagram showing still another configuration example of the wrapping device according to the present invention. The lapping machine 4 of the lapping machine shown in FIG. 7 is provided with a rotation drive device 1a for rotating the lapping machine 4 around a direction perpendicular to the surface as a center axis. The lapping machine 4 is connected to the rotating shaft 2 of the rotary drive. In the case of the lapping device shown in FIG. 7, an AC servomotor is used as the rotation driving device la.
図 7のラップ装置の直動駆動装置 1 0 1 bは、 回転駆動装置 1 b、 回転駆動装 置 1 bの回転軸に接続されたボールねじから構成されている。 ボールねじは、 ね じ軸 1 5 bとナット 1 6 bとから構成されている。 ボールねじのナツト 1 6 bは 、 超音波振動付与手段 1 2の支持板 2 5に接続されている。 回転駆動装置 l bは 、 回転駆動装置 1 aが設置されている基台に立設された支柱に固定されている ( 図示は略する) 。 図 7のラップ装置の場合、 回転駆動装置 1 bとしては、 ステツ ビングモータが用いられている。 研磨対象物保持具 5に超音波振動付与手段 1 2 を介して付設された直動駆動装置 1 0 1 bは、 研磨対象物保持具 5を、 ラップ盤 4の表面に沿った方向に一次元的に移動させる。 The linear drive device 101b of the wrapping device shown in FIG. 7 includes a rotary drive device 1b and a ball screw connected to a rotation shaft of the rotary drive device 1b. The ball screw is composed of a screw shaft 15b and a nut 16b. The nut 16 b of the ball screw is connected to the support plate 25 of the ultrasonic vibration applying means 12. The rotary drive lb is fixed to a support standing upright on the base where the rotary drive 1a is installed ( The illustration is omitted). In the case of the lapping device shown in FIG. 7, a stepping motor is used as the rotary driving device 1b. The linear drive device 101 b attached to the workpiece holder 5 via the ultrasonic vibration applying means 1 2 moves the workpiece holder 5 one-dimensionally in a direction along the surface of the lapping machine 4. Move.
図 7のラップ装置のように、 研磨対象物保持具 5のみをラップ盤の表面に沿つ た方向に一次元的に移動させることによつても、 これまで研磨に用いられていな かった、 ラップ盤の表面のラップ盤の回転中心近傍を研磨に用いることができる 。 すなわち、 ラップ盤の表面全体を研磨に用いることができるために、 ラップ盤 の表面の面積 (ラップ盤の直径) を小さく設定することができる。 従って、 ラッ プ盤の表面に供給するスラリの量を低減することができる。  As in the case of the lapping apparatus shown in FIG. 7, the polishing apparatus has not been used for polishing by moving the holder 5 only one-dimensionally in the direction along the surface of the lapping machine. The vicinity of the center of rotation of the lapping machine on the surface of the lapping machine can be used for polishing. That is, since the entire surface of the lapping machine can be used for polishing, the area of the lapping machine surface (the diameter of the lapping machine) can be set small. Therefore, the amount of slurry supplied to the surface of the lapping machine can be reduced.
図 7のラップ装置の研磨対象物保持具 5には、 ラップ盤の表面に垂直な方向に 振動する超音波振動を付与する超音波振動付与手段 1 2が付設されている。 超音 波振動付与手段 1 2には、 電気エネルギー供給手段 1 4 bが備えられている。 同 様に、 ラップ盤 4には、 ラップ盤の表面に垂直な方向に振動する超音波振動を付 与する超音波振動付与手段 1 2 a、 1 2 bが付設されている。 そして超音波振動 付与手段 1 2 a、 1 2 bには、 電気エネルギー供給手段 1 4 aが備えられている 。 超音波振動付与手段 1 2 a、 1 2 bのそれぞれと、 電気エネルギー供給手段 1 4 aとは、 スリップリング 1 3を介して電気的に接続されている。 本発明のラッ プ装置においては、 図 7に示すように、 ラップ盤及び研磨対象物保持具のそれぞ れに超音波振動付与手段を付設することもできる。  The polishing object holder 5 of the lapping apparatus shown in FIG. 7 is provided with ultrasonic vibration applying means 12 for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine. The ultrasonic vibration applying means 12 is provided with an electric energy supply means 14b. Similarly, the lapping machine 4 is provided with ultrasonic vibration applying means 12a and 12b for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine. The ultrasonic vibration applying means 12a and 12b are provided with electric energy supply means 14a. Each of the ultrasonic vibration applying means 12 a and 12 b and the electric energy supply means 14 a are electrically connected via a slip ring 13. In the lapping device of the present invention, as shown in FIG. 7, an ultrasonic vibration applying means can be added to each of the lapping machine and the holder for the object to be polished.
図 8は、 本発明に従うラップ装置のさらに別の構成例を示す図である。 図 8の ラップ装置の構成は、 研磨対象物保持具 5の側面に超音波振動付与手段 1 2 cが 付設され、 そして研磨対象物保持具 5に、 前記超音波振動付与手段 1 2 cを介し て直動駆動装置 1 0 1 bが付設されていること以外は、 図 7のラップ装置と同様 である。 直動駆動装置 1 0 1 bとしては、 リニアモータが用いられている。 直動 駆動装置 1 0 1 bは、 回転駆動装置 1 aが設置されている基台に立設された支柱 に固定されている (図示は略する) 。  FIG. 8 is a diagram showing still another configuration example of the wrap device according to the present invention. The configuration of the lapping device shown in FIG. 8 is such that ultrasonic vibration applying means 12 c is attached to the side surface of the polishing object holder 5, and the polishing object holding tool 5 is connected to the polishing object holder 5 via the ultrasonic vibration applying means 12 c. It is the same as the wrap device of FIG. 7 except that a linear drive device 101 b is additionally provided. As the linear drive device 101b, a linear motor is used. The linear drive device 101b is fixed to a support erected on a base on which the rotary drive device 1a is installed (not shown).
超音波振動付与手段 1 2 cは、 前記と同様に、 支持板 2 5及び支持板 2 5の各 々の面に配置された超音波振動子とを、 上側金属部材 2 2 aと下側金属部材 2 2 Cとで挟んだ状態でボルト締めして構成されるランジュバン型振動子が用いられ ている。 超音波振動付与手段 1 2 cの支持板 2 5には、 支柱 2 5 bを介して別の 支持板 2 5 cが固定されている。 直動駆動装置 1 0 1 bは、 前記支持板 2 5 cを 介して、 超音波振動付与手段 1 2 cに接続されている。 Similarly to the above, the ultrasonic vibration applying means 12c is configured to connect the support plate 25 and the ultrasonic vibrators arranged on each surface of the support plate 25 to the upper metal member 22a and the lower metal member. Member 2 2 A Langevin type vibrator is used, which is constructed by tightening bolts while sandwiched between C and C. Another support plate 25c is fixed to the support plate 25 of the ultrasonic vibration applying means 12c via a support 25b. The linear drive device 101b is connected to the ultrasonic vibration applying means 12c via the support plate 25c.
図 8のラップ装置において、 超音波振動付与手段 1 2 a、 1 2 bの各々が、 ラ ップ盤 4に、 ラップ盤の表面に垂直な方向に振動する超音波振動を付与する。 こ の超音波振動の付与により、 ラップ盤 4力 その表面に垂直な方向に超音波振動 すると、 研磨対象物 6の表面が高い精度で研磨される。 そして超音波振動付与手 段 1 2 c 、 研磨対象物保持具 5に、 ラップ盤の表面に平行な方向に振動する超 音波振動を付与する。 この超音波振動の付与により、 研磨対象物保持具 5が、 ラ ップ盤 4の表面に平行な方向に超音波振動すると、 研磨対象物 6の表面が高い速 度で研磨される。  In the lapping apparatus shown in FIG. 8, each of the ultrasonic vibration applying means 12a and 12b applies an ultrasonic vibration to the lapping machine 4 in a direction perpendicular to the surface of the lapping machine. By applying the ultrasonic vibration, the lapping machine 4 ultrasonically vibrates in a direction perpendicular to its surface, whereby the surface of the object 6 is polished with high accuracy. Then, the ultrasonic vibration applying means 12 c applies ultrasonic vibration to the polishing object holder 5 in a direction parallel to the surface of the lapping machine. When the object to be polished 5 is ultrasonically vibrated in a direction parallel to the surface of the lapping board 4 by the application of the ultrasonic vibration, the surface of the object to be polished 6 is polished at a high speed.
図 8のラップ装置の超音波振動付与手段 1 2 cの構成は、 図 7の超音波振動付 与手段 1 2と同様である。 すなわち、 超音波振動付与手段 1 2 cが備える超音波 振動子としては、 縦振動モードの圧電振動子が用いられている。 図 8に示すよう に、 縦振動モードの圧電振動子を備えた超音波振動付与手段 1 2 cは、 研磨対象 物保持具 5に、 ラップ盤の表面に平行な方向に振動する超音波振動を付与する。 このように、 ラップ盤の表面に平行な方向に振動する超音波振動を付与する超音 波振動付与手段としては、 縦振動モードの圧電振動子を用いることもできる。  The configuration of the ultrasonic vibration applying means 12c of the wrapping device of FIG. 8 is the same as that of the ultrasonic vibration applying means 12 of FIG. That is, a piezoelectric vibrator in the longitudinal vibration mode is used as the ultrasonic vibrator included in the ultrasonic vibration applying means 12c. As shown in FIG. 8, the ultrasonic vibration applying means 12c provided with the piezoelectric vibrator in the longitudinal vibration mode applies ultrasonic vibration vibrating in the direction parallel to the surface of the lapping machine to the workpiece holder 5 to be polished. Give. As described above, a piezoelectric vibrator in a longitudinal vibration mode can be used as the ultrasonic vibration applying means for applying the ultrasonic vibration oscillating in the direction parallel to the surface of the lapping machine.
[産業上の利用可能性] [Industrial applicability]
本発明のラップ装置は、 超音波振動を利用することにより、 同じサイズの砥粒 を含むスラリを用いた場合に、 従来の装置よりも精度が高い研磨を実現すること ができる。 従って、 研磨対象物の表面を所定の精度で研磨する場合、 本発明のラ ップ装置は、 従来の装置の場合よりも大きなサイズの砥粒を含むスラリ (より安 価な砥粒スラリ) を用いた研磨を可能とする。 さらに本発明のラップ装置におい ては、 ラップ盤の表面全体が研磨に用いられるために、 ラップ盤表面の面積を小 さく設定することができる。 このため、 ラップ装置のラップ盤表面に供給する砥 粒スラリの使用量を低減することができる。 従って、 本発明のラップ装置を用い ることにより、 研磨加工に必要な費用を低減することができる。 The lapping device of the present invention can realize polishing with higher precision than a conventional device when using a slurry containing abrasive grains of the same size by using ultrasonic vibration. Therefore, when polishing the surface of an object to be polished with a predetermined accuracy, the lapping device of the present invention uses a slurry containing abrasive grains having a larger size than that of the conventional device (a more inexpensive abrasive slurry). The polishing used can be performed. Further, in the lapping machine of the present invention, the entire surface of the lapping machine is used for polishing, so that the area of the lapping machine surface can be set small. Therefore, the amount of abrasive slurry supplied to the lapping machine surface of the lapping machine can be reduced. Therefore, using the wrapping device of the present invention By doing so, the cost required for polishing can be reduced.

Claims

請 求 の 範 囲 The scope of the claims
1 . ラップ盤、 該ラップ盤の表面に砥粒スラリを供給するスラリ供給装置、 研 磨対象物を該ラップ盤の表面に砥粒スラリを介して接触させながら保持する研磨 対象物保持具、 および前記ラップ盤及び Z又は研磨対象物保持具に付設され、 該 ラップ盤及び/又は研磨対象物保持具を該ラップ盤の表面に沿った方向に一次元 的に移動させる直動駆動装置を含み、 前記ラップ盤及び/又は研磨対象物保持具 に、 該ラップ盤の表面に垂直な方向に振動する超音波振動を与える超音波振動付 与手段が付設され、 そして該超音波振動付与手段に電気エネルギーの供給手段が 備えられていることを特徴とするラップ装置。 1. A lapping machine, a slurry supply device for supplying an abrasive slurry to the surface of the lapping machine, a polishing object holder for holding an object to be polished while making contact with the surface of the lapping machine via the abrasive slurry, and A linear drive device attached to the lapping machine and the Z or the object holder to be polished, which linearly moves the lapping machine and / or the object holder to be polished one-dimensionally in a direction along the surface of the lapping machine; The lapping machine and / or the object holder to be polished are provided with ultrasonic vibration applying means for applying ultrasonic vibration oscillating in a direction perpendicular to the surface of the lapping machine. A wrapping device comprising:
2 . ラップ盤および研磨対象物保持具のそれぞれに直動駆動装置が付設され、 該ラップ盤の移動方向と研磨対象物保持具の移動方向とが互いに直交する請求の 範囲 1に記載のラップ装置。 2. The lapping device according to claim 1, wherein a linear drive device is attached to each of the lapping machine and the object holder, and a moving direction of the lapping machine and a moving direction of the object holder are orthogonal to each other. .
3 . 研磨対象物保持具のみに上記の超音波振動付与手段が付設されている請求 の範囲 2に記載のラップ装置。 3. The lap apparatus according to claim 2, wherein the ultrasonic vibration applying means is provided only on the object holder to be polished.
4 . 超音波振動付与手段に、 ラップ盤の表面に平行な方向に振動する超音波振 動を与える別の超音波振動付与手段が付設され、 この超音波振動付与手段にも電 気エネルギーの供給手段が備えられている請求の範囲 3に記載のラップ装置。 4. The ultrasonic vibration applying means is provided with another ultrasonic vibration applying means for applying ultrasonic vibration vibrating in a direction parallel to the surface of the lapping machine, and the ultrasonic vibration applying means is also supplied with electric energy. 4. The wrapping device according to claim 3, wherein the wrapping device is provided.
5 . 研磨対象物保持具に直動駆動装置が付設され、 そしてラップ盤に、 該ラッ プ盤をその表面に垂直な方向を中心軸として回転させる回転駆動装置が付設され ている請求の範囲 1に記載のラップ装置。 5. A linear drive device is attached to the holder for the object to be polished, and a rotary drive device is attached to the lapping machine to rotate the lapping machine around a direction perpendicular to the surface as a center axis. A wrapping device according to claim 1.
6 . ラップ盤および研磨対象物保持具のそれぞれに上記の超音波振動付与手段 が付設されている請求の範囲 5に記載のラップ装置。 6. The lap apparatus according to claim 5, wherein the ultrasonic vibration applying means is attached to each of the lapping machine and the holder for the object to be polished.
7 . 超音波振動付与手段の電気エネルギー供給手段に、 電気エネルギーの電圧 値もしくは周波数値を調節する機構が備えられている請求の範囲 1乃至 6のうち のいずれかの項に記載のラップ装置。 7. The wrapping device according to any one of claims 1 to 6, wherein the electric energy supply means of the ultrasonic vibration applying means has a mechanism for adjusting a voltage value or a frequency value of the electric energy.
8 . 請求の範囲 7に記載されたラップ装置を用い、 ラップ盤表面で研磨されて いる研磨対象物の研磨の進行に応じて超音波振動付与手段に与える電気工ネルギ —の電圧値もしくは周波数値を調節することを特徴とするラップ加工方法。 8. The voltage value or frequency value of the electric energy applied to the ultrasonic vibration applying means in accordance with the progress of the polishing of the object to be polished on the lapping machine surface using the lapping device described in claim 7. Lap processing method, characterized in that the lap is adjusted.
PCT/JP2003/005843 2002-05-09 2003-05-09 Lapping device and lapping work method WO2003095144A1 (en)

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KR102116510B1 (en) * 2019-03-08 2020-05-28 에스케이실트론 주식회사 Wafer Lapping Apparatus
WO2021208283A1 (en) * 2020-04-15 2021-10-21 南京航空航天大学 Ultrasonic vibration platform for processing large part, and operating process therefor

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Publication number Priority date Publication date Assignee Title
CN102211297A (en) * 2011-05-31 2011-10-12 北京航空航天大学 Method and device for composite vibration grinding based on ultrasonic high frequency and pneumatic low frequency
CN102211297B (en) * 2011-05-31 2013-12-25 北京航空航天大学 Method and device for composite vibration grinding based on ultrasonic high frequency and pneumatic low frequency
KR102116510B1 (en) * 2019-03-08 2020-05-28 에스케이실트론 주식회사 Wafer Lapping Apparatus
WO2021208283A1 (en) * 2020-04-15 2021-10-21 南京航空航天大学 Ultrasonic vibration platform for processing large part, and operating process therefor

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