WO2003041115A1 - Spectrometre de masse - Google Patents

Spectrometre de masse Download PDF

Info

Publication number
WO2003041115A1
WO2003041115A1 PCT/JP2001/009729 JP0109729W WO03041115A1 WO 2003041115 A1 WO2003041115 A1 WO 2003041115A1 JP 0109729 W JP0109729 W JP 0109729W WO 03041115 A1 WO03041115 A1 WO 03041115A1
Authority
WO
WIPO (PCT)
Prior art keywords
section
hole electrode
thin hole
intermediate pressure
electrode side
Prior art date
Application number
PCT/JP2001/009729
Other languages
English (en)
French (fr)
Inventor
Tomoyuki Tobita
Toshihiro Ishizuka
Masaru Tomioka
Kiyomi Yoshinari
Masami Sakamoto
Original Assignee
Hitachi High-Technologies Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High-Technologies Corporation filed Critical Hitachi High-Technologies Corporation
Priority to PCT/JP2001/009729 priority Critical patent/WO2003041115A1/ja
Priority to JP2003543061A priority patent/JP4178110B2/ja
Priority to US10/494,335 priority patent/US7053367B2/en
Publication of WO2003041115A1 publication Critical patent/WO2003041115A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
PCT/JP2001/009729 2001-11-07 2001-11-07 Spectrometre de masse WO2003041115A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PCT/JP2001/009729 WO2003041115A1 (fr) 2001-11-07 2001-11-07 Spectrometre de masse
JP2003543061A JP4178110B2 (ja) 2001-11-07 2001-11-07 質量分析装置
US10/494,335 US7053367B2 (en) 2001-11-07 2001-11-07 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2001/009729 WO2003041115A1 (fr) 2001-11-07 2001-11-07 Spectrometre de masse

Publications (1)

Publication Number Publication Date
WO2003041115A1 true WO2003041115A1 (fr) 2003-05-15

Family

ID=11737913

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/009729 WO2003041115A1 (fr) 2001-11-07 2001-11-07 Spectrometre de masse

Country Status (3)

Country Link
US (1) US7053367B2 (ja)
JP (1) JP4178110B2 (ja)
WO (1) WO2003041115A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005519450A (ja) * 2002-03-08 2005-06-30 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
JP2008527653A (ja) * 2005-01-10 2008-07-24 アプレラ コーポレイション 質量分析器における改良された感度のための方法および装置
JP2009222660A (ja) * 2008-03-18 2009-10-01 Central Res Inst Of Electric Power Ind ナノ粒子成分計測装置
JP2011228071A (ja) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp 質量分析装置

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
DE602004024286D1 (de) * 2003-02-14 2010-01-07 Mds Sciex Atmosphärendruck-diskriminator für geladene teilchen für massenspektrometrie
CA2976507C (en) * 2003-06-09 2020-05-12 Perkinelmer Health Sciences Canada, Inc. Mass spectrometer interface
JP4162138B2 (ja) * 2003-10-27 2008-10-08 株式会社リガク 昇温脱離ガス分析装置
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
US8426807B2 (en) 2008-08-01 2013-04-23 Brown University System and methods for determining molecules using mass spectrometry and related techniques
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
GB2472638B (en) * 2009-08-14 2014-03-19 Edwards Ltd Vacuum system
US9105457B2 (en) * 2010-02-24 2015-08-11 Perkinelmer Health Sciences, Inc. Cone-shaped orifice arrangement for inductively coupled plasma sample introduction system
EP2587521B1 (en) * 2010-06-24 2019-06-19 Shimadzu Corporation Atmospheric-pressure ionization mass-spectrometer
US8373118B2 (en) 2010-10-21 2013-02-12 Advion, Inc. Atmospheric pressure ionization inlet for mass spectrometers
GB2498173C (en) 2011-12-12 2018-06-27 Thermo Fisher Scient Bremen Gmbh Mass spectrometer vacuum interface method and apparatus
JP5802566B2 (ja) * 2012-01-23 2015-10-28 株式会社日立ハイテクノロジーズ 質量分析装置
GB201409604D0 (en) * 2014-05-30 2014-07-16 Shimadzu Corp Improvements in or relating to mass spectrometry
JP6295150B2 (ja) * 2014-07-07 2018-03-14 株式会社日立ハイテクノロジーズ 質量分析装置
WO2017022125A1 (ja) * 2015-08-06 2017-02-09 株式会社島津製作所 質量分析装置
US10770279B2 (en) 2015-11-27 2020-09-08 Shimadzu Corporation Ion transfer apparatus
CN107221488A (zh) * 2016-03-22 2017-09-29 四川大学 一种用于传输质子转移反应离子源中离子的传输装置
CN110958914A (zh) 2017-08-10 2020-04-03 拉皮斯坎系统股份有限公司 使用热稳定收集装置的物质检测的系统和方法
US11609214B2 (en) 2019-07-31 2023-03-21 Rapiscan Systems, Inc. Systems and methods for improving detection accuracy in electronic trace detectors

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203637A (ja) * 1992-01-28 1993-08-10 Hitachi Ltd 質量分析計
JPH06331616A (ja) * 1993-05-07 1994-12-02 Waters Investments Ltd 電気噴霧をイオン流に変換するためのハウジング
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3274302B2 (ja) * 1994-11-28 2002-04-15 株式会社日立製作所 質量分析計
WO1998011428A1 (en) * 1996-09-13 1998-03-19 Hitachi, Ltd. Mass spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203637A (ja) * 1992-01-28 1993-08-10 Hitachi Ltd 質量分析計
JPH06331616A (ja) * 1993-05-07 1994-12-02 Waters Investments Ltd 電気噴霧をイオン流に変換するためのハウジング
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005519450A (ja) * 2002-03-08 2005-06-30 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
JP2008527653A (ja) * 2005-01-10 2008-07-24 アプレラ コーポレイション 質量分析器における改良された感度のための方法および装置
JP2009222660A (ja) * 2008-03-18 2009-10-01 Central Res Inst Of Electric Power Ind ナノ粒子成分計測装置
JP2011228071A (ja) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp 質量分析装置

Also Published As

Publication number Publication date
JPWO2003041115A1 (ja) 2005-03-03
US7053367B2 (en) 2006-05-30
JP4178110B2 (ja) 2008-11-12
US20040262512A1 (en) 2004-12-30

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