WO2003023430A1 - Dispositif de test de composant - Google Patents

Dispositif de test de composant Download PDF

Info

Publication number
WO2003023430A1
WO2003023430A1 PCT/JP2002/009042 JP0209042W WO03023430A1 WO 2003023430 A1 WO2003023430 A1 WO 2003023430A1 JP 0209042 W JP0209042 W JP 0209042W WO 03023430 A1 WO03023430 A1 WO 03023430A1
Authority
WO
WIPO (PCT)
Prior art keywords
component
test head
testing device
head
transfer position
Prior art date
Application number
PCT/JP2002/009042
Other languages
English (en)
French (fr)
Inventor
Yoshiaki Fukukawa
Original Assignee
Yamaha Motor Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaha Motor Co., Ltd. filed Critical Yamaha Motor Co., Ltd.
Priority to JP2003527440A priority Critical patent/JPWO2003023430A1/ja
Publication of WO2003023430A1 publication Critical patent/WO2003023430A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
PCT/JP2002/009042 2001-09-10 2002-09-05 Dispositif de test de composant WO2003023430A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003527440A JPWO2003023430A1 (ja) 2001-09-10 2002-09-05 部品試験装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001-273646 2001-09-10
JP2001273646 2001-09-10

Publications (1)

Publication Number Publication Date
WO2003023430A1 true WO2003023430A1 (fr) 2003-03-20

Family

ID=19098834

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/009042 WO2003023430A1 (fr) 2001-09-10 2002-09-05 Dispositif de test de composant

Country Status (2)

Country Link
JP (1) JPWO2003023430A1 (ja)
WO (1) WO2003023430A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019066218A (ja) * 2017-09-29 2019-04-25 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP7386725B2 (ja) 2020-02-25 2023-11-27 株式会社Ｎｓテクノロジーズ 電子部品搬送装置、電子部品検査装置および電子部品搬送装置の状態確認方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06309436A (ja) * 1993-04-23 1994-11-04 Ando Electric Co Ltd Ｑｆｐ型ｉｃ用ｉｃソケットの位置検出方法
JPH10123207A (ja) * 1996-10-16 1998-05-15 Nec Corp Ｌｓｉハンドラ
JP2000089918A (ja) * 1998-09-11 2000-03-31 Ricoh Co Ltd チャネル装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06309436A (ja) * 1993-04-23 1994-11-04 Ando Electric Co Ltd Ｑｆｐ型ｉｃ用ｉｃソケットの位置検出方法
JPH10123207A (ja) * 1996-10-16 1998-05-15 Nec Corp Ｌｓｉハンドラ
JP2000089918A (ja) * 1998-09-11 2000-03-31 Ricoh Co Ltd チャネル装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019066218A (ja) * 2017-09-29 2019-04-25 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP6994338B2 (ja) 2017-09-29 2022-01-14 藤倉コンポジット株式会社 電子部品搬送装置および電子部品検査装置
JP7386725B2 (ja) 2020-02-25 2023-11-27 株式会社Ｎｓテクノロジーズ 電子部品搬送装置、電子部品検査装置および電子部品搬送装置の状態確認方法

Also Published As

Publication number Publication date
JPWO2003023430A1 (ja) 2004-12-24

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