WO2002086419A1 - Procede et dispositif servant a determiner le rayon, la nettete ou la forme d'aretes - Google Patents

Procede et dispositif servant a determiner le rayon, la nettete ou la forme d'aretes Download PDF

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Publication number
WO2002086419A1
WO2002086419A1 PCT/EP2002/004368 EP0204368W WO02086419A1 WO 2002086419 A1 WO2002086419 A1 WO 2002086419A1 EP 0204368 W EP0204368 W EP 0204368W WO 02086419 A1 WO02086419 A1 WO 02086419A1
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WIPO (PCT)
Prior art keywords
edge
detector
module
light
light source
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Application number
PCT/EP2002/004368
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German (de)
English (en)
Inventor
Gunther Röder
Original Assignee
Roeder Gunther
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by Roeder Gunther filed Critical Roeder Gunther
Priority to EP02732643A priority Critical patent/EP1423657A1/fr
Publication of WO2002086419A1 publication Critical patent/WO2002086419A1/fr

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature

Definitions

  • edge sharpness of cutting, punching, cutting or cutting tools determines the minimum cutting thickness and the cutting forces, especially the passive force, as well as the surface quality of the workpiece. Cut-outs in the cutting edge are particularly important for the surface quality of workpieces during machining. This also applies to shear cutting and cutting tools. In the case of cutting punch knives, the cut quality, the complete punching and the punching force depend on the edge sharpness, i.e. above all on the edge radius and the cutting edge angle.
  • Edges with optical properties are often not allowed to have cutouts.
  • the wiping or sealing function also depends on the edge sharpness and its freedom from breakouts or irregularities.
  • the present invention has for its object to provide a simple and reliable way to determine the properties of edges, in particular cutting edges.
  • the object is achieved by a method for determining the radius, the sharpness or the shape of edges, in particular cutting edges, or the presence of cutouts or the like, which is characterized in that an illuminating beam is directed onto the edge and the radiation power reflected by it measured and from this the radius, the sharpness, the shape of the edge or the presence or size of breakouts or wear marks is determined. If the edge is dull, ie has a large radius, the light striking the edge is strongly scattered, that is to say the radiation power reflected by the edge is high. So the lower the reflected radiation power, the sharper the edge must be. Outbreaks in the edge also cause changes in the scattering of the illumination beam. Such outbreaks can also be detected by measuring the radiation power reflected by the edge.
  • the radiation power reflected back from the edge in the direction of irradiation and at a certain angle around this direction can preferably be measured.
  • the reflected scattered light can be removed from the beam path illuminating the edge by means of a beam splitter couple out.
  • the illumination beam can be directed onto the edge by means of a focusing device.
  • the reflected scattered light can then be picked up and reproduced again by the same focusing device through which the illuminating beam also passes.
  • the reflected scattered light can also be picked up by a separate imaging device.
  • the determination of the edge sharpness or edge shape at individual selected measuring points of the cutting edge, which are exposed to special stresses, is sufficient to be able to conclude the shape and sharpness of the entire edge.
  • the entire course of the edge must be examined for its sharpness and shape or for breakouts.
  • the illuminating beam can be moved relative to the edge in such a way that it sweeps the length.
  • the intensity of the illuminating beam is not constant over its entire diameter. For a high accuracy of the measurement, it is therefore advantageous to direct the beam onto the edge in such a way that the intensity maximum lies on the cutting edge and the scattered light reflected back from the intensity maximum of the illuminating beam is evaluated.
  • the intensity maximum is usually in the center of the beam.
  • the device for carrying out a method according to the invention for determining the radius, sharpness or shape of edges is characterized by a light source, a detector for recording the proportion of light reflected by the edge and measuring its radiation power, and by a Evaluation.
  • it can have a focusing device for focusing the illuminating beam onto the edge and / or for receiving the scattered light, and a beam splitter.
  • the detector can also be designed in various ways. For example, it can have one or more photodiodes.
  • it can have a four-quadrant photodiode, a secondary electron multiplier, an avalanche photodiode, a pin diode or a row of diodes. It is also possible to equip the detector with a CCD chip or another pixel matrix photo detector.
  • the detector can preferably be arranged in an adjustable manner in the device.
  • a laser or another, approximately punctiform light source can be used as the light source.
  • the light source and / or the edge can be arranged to be movable and / or rotatable and / or pivotable.
  • the device can then be used, for example, to monitor the edge sharpness of circular knives or linear cutting edges. Monitoring can take place while circular knives or rotating forming tools are in operation. The monitoring of saw bands, circular saws, planing and milling tools is also possible with a device according to the invention.
  • the diameter of the illuminating beam or of the focus spot in the beam path can be varied after the focusing device. This allows the measurement conditions to be optimally adapted to the shape of the edge.
  • the evaluation device can also control the relative movement of the light source and edge and / or the distance between the light source and edge and / or the adjustment of the beam diameter. This enables fully automatic tracking of the device parameters, in particular when scanning an edge over its entire length.
  • a further detector for regulating the radiation power of the light source can be provided at a suitable point. It is then mainly illuminated by the light emanating from the light source and not at all or only slightly by the stray light from the edge.
  • an aperture can be arranged in front of the detector for the radiation power reflected by the edge, which shield fades out light that does not come from the cutting edge.
  • the device For the manufacture of the device, it is also advantageous if it has a modular structure and has at least one laser module, one objective module and one detector module.
  • a beam splitter module and an intensity module for regulating the intensity of the laser diode can also be provided.
  • a microscope objective or another corrected system for producing very small focal spots and good imaging of the cutting edge can preferably be arranged in the objective module.
  • One or more aspherical lenses can also be used.
  • the detection module preferably contains a focusing device, an aperture and at least one photo detector.
  • a correction cylinder lens or an arrangement of one or more prisms can be connected downstream of the laser diode in the laser module in order to correct the mostly slightly elliptical diameter of the laser diode beam again in a circular shape.
  • a beam splitter module can have, for example, a beam splitter cube, a beam splitter plate or a beam splitter film.
  • the beam splitter module represents the central module to which the other modules are preferably attached.
  • FIG. 1 shows a schematic view of a device according to the invention for measuring the sharpness of a cutting edge
  • FIG. 2 shows a schematic representation of a four-quadrant photodiode for detecting a vertical edge
  • FIG. 3 shows a representation corresponding to FIG. 2 of a four-quadrant photodiode for the detection of a horizontal edge
  • FIG. 4 shows a representation corresponding to FIG. 2 of a four-quadrant photodiode for the detection of an edge running obliquely to the detector.
  • the edge radius which can be associated with the edge sharpness, bevels, breakouts and wear marks can also be identified. This creates a measurement result that does not explicitly describe the geometric relationships, but that maps the geometric relationships into a one-dimensional measurement result, so that this represents a process-specific value for the edge shape. Its interpretation is possible by calibration with workpieces with known properties or by theoretical calculation of the arrangement.
  • the arrangement has at least one light source 4 with a collimator or a laser or a beam focusing, a beam splitter mirror 7, a lens or another focusing arrangement 8, for example Fresnel lenses, concave mirrors or holographic lenses, which also changes the beam direction can be, as well as a light-sensitive transducer 11.
  • the converter 11 can, for example, have a simple photodiode, a four-quadrant photodiode or a photodiode with more than four mutually independent light-sensitive measuring surfaces or a CCD chip. These components can also be designed as a photo transistor or photo resistor. A secondary electron multiplier or other highly sensitive photon detector can also be used.
  • the light emerging from the light source 4 is collimated. Due to the subsequent focusing, the beam can pass through a focus point 12 before reaching the beam splitter 7.
  • a pinhole 6 can optionally be introduced into this focal point 12, which eliminates the insufficiently collimated parts from the beam.
  • the aperture can be reduced independently of this with an aperture 5 that can be optionally attached.
  • the beam then falls on the beam splitter 7.
  • the beam strikes the lens 8 or another focusing device, while the portion 13 deflected by the beam splitter mirror 7 is directed onto an absorbent, black surface 18 or is coupled out of the measuring apparatus. If a separate detector is used to regulate the radiation power of the light source, it is preferably illuminated by this beam.
  • the beam focused by the lens 8 then falls on the edge 9 to be measured.
  • the angle of incidence of the beam does not necessarily have to lie in the bisecting plane of the planes forming the edge.
  • the illuminated spot emits scattered light, which is collected by the lens 8 or another focusing device and directed onto the beam splitter 7. It is advantageous if the edge 9 is located behind the focal point of the focusing device 8 in the direction of illumination, since no real image of the edge is produced here. However, a measurement is also possible if the focus is moderate. Part of the reflected light passes through the beam splitter 7 without reflection on it and is lost for the measurement. If the edge 9 is arranged in front of the focal point of the focusing device 8, an additional focusing device 14 can be placed in the beam path after the beam splitter 7 and thus ensure an image on the detector 11.
  • the deflected part of the beam falls on an optionally attached bandpass filter 10 which is tuned to the wavelength of the light source.
  • the detector 11 can be constructed as a single photodiode or as a receiver with laterally separated photosensitive surfaces.
  • the receiver is located in or near the image plane of the image of the illuminated location of the edge 9, so that the more or less sharp image of the edge 9 comes to rest on the photosensitive surface (s).
  • the effect that is used for the process-specific measurement of the edge shape is that a blunt edge 9, a chamfer or a breakout reflects more scattered light than from a sharp edge.
  • a blunt edge has a larger edge radius than a sharp edge.
  • the area of the edge that opposes the incident light vertically or inclined at a slight angle is larger with a larger edge radius, which is why a larger luminous flux is reflected.
  • Wear marks usually differ in their angle from the angle of the surface on which they are located.
  • the measuring device can be arranged such that essentially only the reflection from the wear mark is picked up again by the measuring device. Then the incident radiation power is determined by the size of the wear mark.
  • the radiation power incident on the detector 11 is therefore used as a measure of the edge sharpness or the presence of a chamfer, rounding, a breakout or a wear mark.
  • One way of achieving the tracking is to image the edge 9 on a four-quadrant diode 100 (FIGS. 2 to 4) or another detector 11 with a plurality of mutually independent photosensitive measuring surfaces. If the optical measuring arrangement is now shifted, the image 9 'of the edge 9 on the detector 11 also shifts. A prerequisite for the measurability of this process is that the image of the relevant part of the edge 9 of the detector 11 is maximal fully illuminated. Then, when the edge 9 is displaced relative to the measuring unit by the detector 11, a displacement of the image 9 'of the edge 9 can be measured.
  • the reaction of the individual photosensitive surfaces 101, 102, 103 and 104 can be used to determine the direction in which the cutting edge 9 extends with respect to the direction of movement of the optical measuring head.
  • the movement can take place along or across the edge 9 (FIG. 2, FIG. 3) or a combination of these two cases (FIG. 4).
  • the size of the illuminated spot on and around the edge 9 is adjusted by the diaphragm 5 or by changing the distance from the lens 8 so that the edge 9 on this piece can be regarded as approximately straight.
  • the assignment between the direction of movement of FIG. 9 'of the edge 9 on the detector 11, 100 and the quadrants 101, 102, 103 and 104 results from their lateral orientation and the relative direction of movement of the measuring head with respect to the edge 9.
  • the image 9 'of the edge 9 lies on the photodiode 100 and the relative movement of the measuring head takes place transversely to the edge 9, the image moves from the quadrants 102 and 103 to the quadrants 101 and 104 and vice versa, if the Direction of movement is opposite. If the edge 9 is rotated by 90 ° with respect to the measuring head, the image 9 'on the four-quadrant photodiode 100 also rotates by 90 ° (FIG. 3). The image then moves from quadrants 101 and 102 to quadrants 103 and 104 or vice versa with the opposite direction of movement.
  • the image 9 'of the edge is oriented obliquely to the quadrants 101, 102, 103 and 104, this means a combination of the two cases described above, the image of the edge 9' obliquely over the quadrants 101, 102, 103, 104 lies (Fig. 4).
  • the shape of the photo-sensitive sensitive areas A circular overall shape of the arrangement of the surfaces is particularly advantageous because the length of an imaged edge 9 'is approximately independent of its angular position relative to the detector, as long as it runs near the center of the four quadrants 101, 102, 103, 104.
  • the angular position of the image of the edge 9 'then does not have to be compensated for. This is necessary, for example, for square areas.
  • the movement of the image of the edge 9 ' can be recognized by adding the measured values of two adjacent quadrants 101, 102, 103, 104 and subtracting these two sums from one another. This represents a value for the displacement transverse to the quadrants 101, 102, 103, 104, the measurement results of which have been added.
  • any lateral transverse movement of the edge 9 in the main directions of the quadrants 101 can be carried out , 102, 103, 104 are split. It is also particularly advantageous to divide this value by the sum of all four measured values, since the size calculated in this way for the deviation is independent of the intensity of FIG. 9 '.
  • the detection of the transverse movement is therefore identical for sharp and blunt edges.
  • edge 9 In the case of movement along the edge 9, no change in the measured values of the quadrants 101, 102, 103, 104 is to be expected as long as the edge 9 is imaged as a homogeneous light band 9 '. In practice, however, the edge 9 often has breakouts or other imperfections which lead to points of higher or lower intensity in FIG. 9 '. When these points pass from one quadrant 101, 102, 103, 104 to the next, this is initially just as much as a transverse movement of an edge that is oriented transversely to the really existing edge 9.
  • the difference is, however, that in the case of breakouts during continuous displacement, only single jumps occur which are positive on one or two quadrants 101, 102, 103, 104 and negative on one or two others, while in the case of a true transverse displacement over one compared to the width a continuous change in intensity takes place over the larger distance.
  • the location and size of outbreaks can be determined by appropriate evaluation of the measurement results, for example with electronic data processing.
  • the software recognizes the discontinuity of the change in the incident luminous flux when moving, for example by forming the quotient from the changes in the measured radiation power and the displacement path.
  • the desired result of the measurement is generally the maximum radiation power reflected as scattered light, which occurs when the measuring device is moved across the edge 9. It is determined by summing the measurement results of the individual quadrants 101, 102, 103, 104. For a complete measurement of the edge 9, the measuring device must therefore be tracked in such a way that the measured points on the edge 9 form a complete row. A non-continuous measurement at individual points or sections of the edge 9 is also possible and can have advantages in the measurement have speed.
  • the measuring head is roughly pre-positioned on the edge 9 or in its vicinity.
  • the positioning device By moving the positioning device and evaluating the sum of the measurement results of the quadrants 101, 102, 103, 104, it can be determined whether a maximum measurement value is reached which indicates that the center of the edge 9 has been reached.
  • the edge direction is determined.
  • a step defined in direction and size is carried out in the direction of each movement axis and the resulting transverse movement of the edge 9 is measured in two directions. From the size of the two measurement results, using the formula:
  • the measuring device must be in its Position after the step still measure the maximum stray light flux. For this purpose, the measuring head is moved transversely to the previously calculated edge direction and the maximum of the radiation power of the scattered light is sought again. Then it can be decided whether the direction has been calculated correctly or a correction is necessary.
  • the measuring device In order to obtain further measurement results along the edge 9, the measuring device is shifted further in the calculated direction.
  • the sum of the measurement results of the quadrants 101, 102, 103, 104 is used as the measurement result and it is checked whether the edge 9 has moved transversely to the direction of movement. This is possible with the procedure described above for determining the transverse movement of the edge 9. If a discrepancy is found, the direction must be determined again using the procedure described above. In addition, it must be checked every now and then whether the control keeps the measuring device on the center of the edge 9 or at the maximum of the radiation intensity of the scattered light.
  • the interval between these tests is primarily related to the required measurement accuracy.
  • the test is carried out after each step for maximum measurement accuracy. This corresponds to a complete scanning of the scattered light profile of the edge 9 when the measured points lie on the edge 9 without gaps.
  • An electronic control in the form of a microcontroller can advantageously be implemented for the operations described.
  • Another way of determining the position of the edge 9 is to use a CCD chip on which the edge 9 is imaged. For example, an algorithm can be used to investigate whether a pixel is in the neighborhood is further illuminated. This allows the image of the edge 9 'to be digitized into its lateral positions.
  • the edge direction can be determined from this data using linear regression, for example. When the edge 9 or the measuring device moves and the algorithm is executed repeatedly, the direction of movement can be determined. Other methods are conceivable.
  • Another possibility for tracking the edge 9 is to use a beam with a non-uniform, for example Gaussian intensity distribution for illumination. If the illumination is directed towards the edge 9 and the optical measuring device is moved, the reflected radiation power will decrease in the direction transverse to the edge 9, since only a weaker intensity occurs at the point with the highest reflection component. In the longitudinal direction, the difference in the process is generally smaller. On this basis, the direction of the edge can be determined by trial and error in relation to the axes of the moving device and the edge can be scanned in this direction.
  • a beam with a non-uniform for example Gaussian intensity distribution for illumination.
  • a trial-and-error procedure of the optical measuring device transversely to the edge direction is generally required again in order to compensate for bends and errors in the direction determination as well as errors in the traversing device, for example step size errors, deviation from the ideal, for example rotationally symmetrical, intensity distribution of the beam.
  • the process is also possible with a beam with a uniform intensity and a round beam profile.
  • the maximum reflection arises from the effect that the edge is illuminated on a longer piece when the beam center is on the middle of the edge.
  • a combination of round, elliptical or oval beam shape and uneven intensity distribution with a maximum is also possible.
  • Another possibility of scanning an edge is that the illuminating spot sweeps across the edge transversely or obliquely, while the edge and illuminating spot perform a relative movement in the edge direction.
  • the movements can be carried out simultaneously or one after the other.
  • the maximum values are determined as the measurement result from the data obtained in this way. These are assigned to the location of the maximum intensity of the lighting spot on the center of the cutting edge.
  • This procedure can be used, for example, when scanning wobbling or circular or crescent-shaped knives that are wavy in the axial direction or bent or wavy edges that are transverse to the edge or that are at an angle to the direction of advance of the illumination spot.
  • the amplitude of the sweep is preferably so large that the point of maximum intensity of the illumination spot can reach all points on the edge.
  • the measuring head can be attached movably.
  • the knife can be fixed movably across the cutting edge.
  • the measuring head can be tilted so that the edge of the illumination spot is swept across when tilted.
  • the tilt angles are preferably so small that the measurement errors due to the changed angle are negligible.
  • Tumbling circular or crescent-shaped knives or wavy, curved or sloping edges can also be measured by the lighting spot and the area from which the stray light shines the detector or detectors is steered so large that the edge does not leave the illuminated and imaged area during a relative movement between the edge and the illumination spot.
  • Another possibility is to deflect the light used to illuminate the edge and / or the light reflected from the edge into the measuring device by means of one or more tiltable or displaceable deflecting mirrors, thus allowing the edge to be swept over.
  • the simplest variant is a single tiltable deflecting mirror that is positioned in front of a measuring head in which the illuminating beam passes through the same lens through which the reflected light is picked up again.
  • the transverse movement of the illumination spot over the edge can take place, for example, by means of vibrations at the resonance frequency, forced vibrations and / or along a guide.
  • the drive or the vibration excitation can, for. B. by a linear electric motor or a rotating electric motor with a translation of the rotation into a longitudinal movement, for. B. by means of a spindle, a backdrop on or in a cylinder, an eccentric or a swash plate, or by electromagnetic, electrostatic or piezoelectric forces.
  • the frequency of the transverse movement is preferably selected with respect to the feed rate in such a way that the edge is advanced between two vibrations by the size of the illumination spot. Other frequencies that result in a complete or partial measurement of the edge can also be useful.
  • the frequency can e.g. B. in circular knives so that the next time the edge was swept one revolution and the width of the spot was advanced. This allows the frequency of the be lowered.
  • the frequency may vary if e.g. B. individual areas of the edge require more accurate scanning.
  • Another possibility of scanning circular knives is to shift the illumination spot during the rotation in the axial direction with a maximum of the size of the illumination spot in the axial direction per revolution of the circular knife. Then the parts of the z. B. added wobbling edge, which are in the respective position of the measuring head in front of the measuring head. By sweeping over the entire area of the occurring positions of the edge, the edge can be measured completely.
  • the lighting spot can be guided several times along a wavy or inclined edge, the lighting spot being moved transversely to the cutting edge between the passages. In this way, the cutting edge can be completely grasped.
  • a further movement axis can be used, which moves the optical measuring device in the beam direction.
  • a focus detector is also required which detects when the image on the detector 11 becomes out of focus.
  • part of the reflected scattered light is coupled out, for example, with a beam splitter 15 (FIG. 1) and directed onto the focus detector 17.
  • the focus axis is regulated on the basis of the signal from the focus detector 17 such that the image comes to lie on the detector 11 or in its vicinity. This enables three-dimensional tracking and measurement of an edge 9 to be carried out.
  • the focus detector 17 can be, for example, with an inclined astigmatic lens 16 and a four-quadrant diode, on which each time the focus is shifted directionally there is an oval distortion of the incident beam in the sagittal or meridional direction.
  • the focus deviation can be determined by the difference in the sum of the radiation powers on the diagonally opposite quadrants. This is a common method in CD player technology.
  • Another focus detection method that can be used here is the use of two prisms that refract the incident light depending on the angle of incidence. The light beam split in this way is directed onto two position-sensitive detectors (PSDs). Since the angle of the incident light is accompanied by changes in focus, their measurement results are used as a measure of the focus deviation.
  • the output signals of the focus detector serve as a controlled variable for focus position control using the focus axis.
  • the regulation can, for example, be carried out electronically as an analog or digital regulation.
  • the actuator is the drive of the focus axis, which can be implemented, for example, with stepper or servo motors and a threaded spindle or with linear motors.
  • the series of positions of the focus spot can be used to determine the three-dimensional shape of the edge course.
  • a further possibility of regulating the position of the focus and / or of the area which is imaged on the detector in the direction of the illumination and / or in the direction of the optical axis of the recording optics for the reflected light consists in measuring the position of the edge in the direction of the lighting and / or in the direction of the optical axis of the recording optics with other means and to regulate the relative position of the edge to the measuring device on the basis of these measurement results.
  • the direction of the optical axis of the recording optics is particularly relevant.
  • the edge or the measuring device can preferably be moved by means of an electric motor.
  • a light barrier that is mechanically connected to the measuring device and that is more or less severely interrupted by the edge depending on its position can be used, for example, as the measuring means for determining the relative edge position.
  • a diode laser is used as the light source 4 and a lens 8 is used as the focusing device.
  • An aperture 5 is used to adjust the size of the lighting spot.
  • a circular four-quadrant photodiode 100 is used as the detector. Edge tracking is controlled by a microcontroller.
  • the entire device shown in FIG. 1 can be constructed modularly.
  • the devices 4, 5 and 6 can be combined in a laser module, the focusing device 8 in a focusing module and the devices 10, 11 and 14 in a detection module.
  • the focus detector 17 with the further devices 15 and 16 can also be integrated into the detection module.
  • a separate intensity module can also be provided, which for example evaluates the beams 13 deflected by the beam splitter 7.
  • the beam splitter 7 is part of a central beam splitter module.

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  • General Physics & Mathematics (AREA)
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Abstract

La présente invention concerne un procédé et un dispositif servant à déterminer le rayon, la netteté ou la forme d'arêtes (9) notamment d'arêtes coupantes, la présence d'interruptions ou analogue, un faisceau lumineux étant dirigé sur l'arête (9) et la puissance lumineuse réfléchie par celle-ci étant mesurée pour en déduire le rayon, la netteté, la forme ou la présence ou la taille d'interruptions ou de marques d'usure.
PCT/EP2002/004368 2001-04-22 2002-04-20 Procede et dispositif servant a determiner le rayon, la nettete ou la forme d'aretes WO2002086419A1 (fr)

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EP02732643A EP1423657A1 (fr) 2001-04-22 2002-04-20 Procede et dispositif servant a determiner le rayon, la nettete ou la forme d'aretes

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11772223B2 (en) 2019-05-17 2023-10-03 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
US11904428B2 (en) 2019-10-25 2024-02-20 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
CN117681079A (zh) * 2024-02-02 2024-03-12 江苏金穗能源设备制造有限公司 一种防泄漏gis开关壳体用表面处理装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3695771A (en) * 1970-08-06 1972-10-03 Andras M Bardos Method and apparatus for inspecting surfaces
JPH11153414A (ja) * 1997-11-21 1999-06-08 Aisin Takaoka Ltd 成形品のバリ高さ及び型ずれ量の測定方法
DE19909518A1 (de) * 1998-03-23 1999-10-07 Heidelberger Druckmasch Ag Verfahren und Vorrichtung zur Erfassung der Lage von gestapeltem Material
EP1041393A2 (fr) * 1999-04-01 2000-10-04 Leuze electronic GmbH + Co. Dispositif optoélectronique

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3405711A1 (de) * 1984-02-17 1985-08-22 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren und vorrichtung zum herstellen einer endflaeche an einer optischen glasfaser
DE4213909A1 (de) * 1992-04-28 1993-11-04 Mtu Muenchen Gmbh Vorrichtung zur vermessung von kruemmungsprofilen von kanten
CN1081249A (zh) * 1992-07-07 1994-01-26 哈尔滨工业大学 刀具锋利度的光学测量方法及装置
DE4412722A1 (de) * 1994-04-13 1994-12-08 Ruediger Prof Dr Ing Haberland Schneidkantenschärfe-Meßgerät
US5926558A (en) * 1996-01-05 1999-07-20 Asko, Inc. Method and apparatus for monitoring and inspecting rotary knives
AT1797U1 (de) * 1996-07-23 1997-11-25 Mte Messgeraete Entwicklungs U Optoelektronisches messsystem zur vermessung und identifikation von flachglasprodukten
DE19903486C2 (de) * 1999-01-29 2003-03-06 Leica Microsystems Verfahren und Vorrichtung zur optischen Untersuchung von strukturierten Oberflächen von Objekten

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3695771A (en) * 1970-08-06 1972-10-03 Andras M Bardos Method and apparatus for inspecting surfaces
JPH11153414A (ja) * 1997-11-21 1999-06-08 Aisin Takaoka Ltd 成形品のバリ高さ及び型ずれ量の測定方法
DE19909518A1 (de) * 1998-03-23 1999-10-07 Heidelberger Druckmasch Ag Verfahren und Vorrichtung zur Erfassung der Lage von gestapeltem Material
EP1041393A2 (fr) * 1999-04-01 2000-10-04 Leuze electronic GmbH + Co. Dispositif optoélectronique

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN *
See also references of EP1423657A1 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11772223B2 (en) 2019-05-17 2023-10-03 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
US11904428B2 (en) 2019-10-25 2024-02-20 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
CN117681079A (zh) * 2024-02-02 2024-03-12 江苏金穗能源设备制造有限公司 一种防泄漏gis开关壳体用表面处理装置
CN117681079B (zh) * 2024-02-02 2024-05-14 江苏金穗能源设备制造有限公司 一种防泄漏gis开关壳体用表面处理装置

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