WO2002082060A1 - Dispositif optique terahertz et procede de reglage associe - Google Patents
Dispositif optique terahertz et procede de reglage associe Download PDFInfo
- Publication number
- WO2002082060A1 WO2002082060A1 PCT/JP2002/003342 JP0203342W WO02082060A1 WO 2002082060 A1 WO2002082060 A1 WO 2002082060A1 JP 0203342 W JP0203342 W JP 0203342W WO 02082060 A1 WO02082060 A1 WO 02082060A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- terahertz
- generator
- detector
- rotation position
- light
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 239000000523 sample Substances 0.000 abstract 4
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Toxicology (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001-105395 | 2001-04-04 | ||
JP2001105395A JP2002303574A (ja) | 2001-04-04 | 2001-04-04 | テラヘルツ光装置及びこれの調整方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002082060A1 true WO2002082060A1 (fr) | 2002-10-17 |
Family
ID=18958095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2002/003342 WO2002082060A1 (fr) | 2001-04-04 | 2002-04-03 | Dispositif optique terahertz et procede de reglage associe |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2002303574A (fr) |
WO (1) | WO2002082060A1 (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4183546B2 (ja) | 2003-04-11 | 2008-11-19 | 独立行政法人理化学研究所 | テラヘルツ波光学系 |
JP4963640B2 (ja) * | 2006-10-10 | 2012-06-27 | キヤノン株式会社 | 物体情報取得装置及び方法 |
WO2009050993A1 (fr) * | 2007-10-16 | 2009-04-23 | Aisin Seiki Kabushiki Kaisha | Procédé et dispositif de mesure de l'épaisseur d'un film sans contact |
FR2925685B1 (fr) * | 2007-12-21 | 2010-02-05 | Centre Nat Rech Scient | Procede et dispositif de mesure monocoup de la birefringence transitoire induite par une perturbation appartenant au domaine des frequences terahertz |
JP4729603B2 (ja) * | 2008-07-09 | 2011-07-20 | 独立行政法人理化学研究所 | テラヘルツ帯波処理装置および同方法 |
JP5240858B2 (ja) * | 2009-09-03 | 2013-07-17 | 独立行政法人理化学研究所 | 単色波長可変型テラヘルツ波発生/検出システム及び方法 |
JP2012108117A (ja) * | 2010-10-25 | 2012-06-07 | Olympus Corp | イメージング装置 |
FR2970090B1 (fr) * | 2011-01-04 | 2013-02-15 | Centre Nat Rech Scient | Dispositif de formation d'un reseau d'interferences sur un echantillon |
CN106644083B (zh) * | 2017-02-23 | 2018-05-29 | 深圳大学 | 太赫兹材料的偏振光谱特性测量装置及系统 |
CN111337430A (zh) * | 2020-03-13 | 2020-06-26 | 华太极光光电技术有限公司 | 透射式太赫兹探头调节装置及定位方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11242164A (ja) * | 1998-02-24 | 1999-09-07 | Nikon Corp | レーザ走査型顕微鏡及びレーザ走査光学系の調整方法 |
JP2001050908A (ja) * | 1999-08-13 | 2001-02-23 | Nippon Telegr & Teleph Corp <Ntt> | ミリ波イメージングシステム |
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2001
- 2001-04-04 JP JP2001105395A patent/JP2002303574A/ja active Pending
-
2002
- 2002-04-03 WO PCT/JP2002/003342 patent/WO2002082060A1/fr active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11242164A (ja) * | 1998-02-24 | 1999-09-07 | Nikon Corp | レーザ走査型顕微鏡及びレーザ走査光学系の調整方法 |
JP2001050908A (ja) * | 1999-08-13 | 2001-02-23 | Nippon Telegr & Teleph Corp <Ntt> | ミリ波イメージングシステム |
Non-Patent Citations (3)
Title |
---|
Q. WU ET AL.: "Two-dimensional electro-optic imaging of THz beams", APPL. PHYS. LETT., vol. 69, no. 8, 19 August 1996 (1996-08-19), pages 1026 - 1028, XP000626128 * |
Y. CAI ET AL.: "Coherent terahertz radiation detection: Direct comparison between free-space electro-optic sampling and antenna detection", APPL. PHYS. LETT., vol. 73, no. 4, 27 July 1998 (1998-07-27), pages 444 - 446, XP000774906 * |
Z. JIANG AND X.-C. ZHANG: "Terahertz imaging via electrooptic effect", IEEE TRANSACTIONS ON MICROWEVA THEORY AND TECHNIQUES, vol. 47, no. 12, 1999, pages 2644 - 2650, XP002951533 * |
Also Published As
Publication number | Publication date |
---|---|
JP2002303574A (ja) | 2002-10-18 |
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