WO2002012907A3 - System, method, and apparatus for electromagnetic compatibility-driven product design - Google Patents

System, method, and apparatus for electromagnetic compatibility-driven product design Download PDF

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Publication number
WO2002012907A3
WO2002012907A3 PCT/US2001/024594 US0124594W WO0212907A3 WO 2002012907 A3 WO2002012907 A3 WO 2002012907A3 US 0124594 W US0124594 W US 0124594W WO 0212907 A3 WO0212907 A3 WO 0212907A3
Authority
WO
WIPO (PCT)
Prior art keywords
design
electromagnetic compatibility
driven product
emissions
electronic devices
Prior art date
Application number
PCT/US2001/024594
Other languages
French (fr)
Other versions
WO2002012907A2 (en
Inventor
Mehyar Khazei
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Priority to KR10-2003-7001565A priority Critical patent/KR20030020964A/en
Priority to JP2002517540A priority patent/JP2004522934A/en
Priority to AU2001281101A priority patent/AU2001281101A1/en
Priority to EP01959558A priority patent/EP1307752A2/en
Publication of WO2002012907A2 publication Critical patent/WO2002012907A2/en
Publication of WO2002012907A3 publication Critical patent/WO2002012907A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells

Abstract

A system, method, and apparatus for electromagnetic compatibility-driven design of electronic devices and systems according to one embodiment of the invention performs measurement of emissions from electronic devices and accounts for electromagnetic interactions among the functional blocks of an electronic system during the design phase. In an exemplary application, a characterization of near-field emissions is used to calculate radiation intensity in near- and/or far-field regions.
PCT/US2001/024594 2000-08-03 2001-08-03 System, method, and apparatus for electromagnetic compatibility-driven product design WO2002012907A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR10-2003-7001565A KR20030020964A (en) 2000-08-03 2001-08-03 System, method, and apparatus for electromagnetic compatibility-driven product design
JP2002517540A JP2004522934A (en) 2000-08-03 2001-08-03 Systems, methods, and apparatus for applications related to product design for electromagnetic compatibility
AU2001281101A AU2001281101A1 (en) 2000-08-03 2001-08-03 System, method, and apparatus for electromagnetic compatibility-driven product design
EP01959558A EP1307752A2 (en) 2000-08-03 2001-08-03 System, method, and apparatus for electromagnetic compatibility-driven product design

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US22290600P 2000-08-03 2000-08-03
US60/222,906 2000-08-03
US30447001P 2001-07-17 2001-07-17
US60/304,470 2001-07-17

Publications (2)

Publication Number Publication Date
WO2002012907A2 WO2002012907A2 (en) 2002-02-14
WO2002012907A3 true WO2002012907A3 (en) 2002-05-02

Family

ID=26917266

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/024594 WO2002012907A2 (en) 2000-08-03 2001-08-03 System, method, and apparatus for electromagnetic compatibility-driven product design

Country Status (5)

Country Link
JP (1) JP2004522934A (en)
KR (1) KR20030020964A (en)
CN (1) CN1454318A (en)
AU (1) AU2001281101A1 (en)
WO (1) WO2002012907A2 (en)

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CN106019023A (en) * 2016-07-05 2016-10-12 广东中认华南检测技术有限公司 Electromagnetic oven electromagnetic compatible optimization method

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JP4574529B2 (en) * 2004-12-22 2010-11-04 パナソニック株式会社 Electromagnetic wave analysis device, design support device, electromagnetic wave analysis program, and design support program
CN100392414C (en) * 2005-04-15 2008-06-04 中兴通讯股份有限公司 Method and device for measuring electromagnetic radiation source in electronic device
KR100693315B1 (en) * 2005-12-26 2007-03-13 한국항공우주연구원 Multipactor testing system using phase detecting system for continuous wave mode and method thereof
US7685549B2 (en) * 2007-09-14 2010-03-23 International Business Machines Corporation Method of constrained aggressor set selection for crosstalk induced noise
CN101231319B (en) * 2008-02-21 2010-06-23 中兴通讯股份有限公司 Electromagnetic interference scanning device and method
TWI391684B (en) 2009-03-20 2013-04-01 King Yuan Electronics Co Ltd Method and apparatus for improving yield ratio of testing
WO2011113044A2 (en) * 2010-03-12 2011-09-15 Sunrise R&D Holdings, Llc System and method for product identification
CN102386949B (en) * 2010-09-06 2015-01-07 罗晓晖 Mutually-aiming and confidence breach preventing magnetic communication system
KR101156569B1 (en) * 2010-12-09 2012-06-20 국방과학연구소 Muti donut type wideband small e-field probe for analyzing target iemi
JP5921169B2 (en) * 2010-12-13 2016-05-24 三菱電機株式会社 Electromagnetic noise distribution detector
CN102162828A (en) * 2010-12-28 2011-08-24 哈尔滨工业大学 Device and method for qualitatively detecting PCB (printed circuit board) board electromagnetic interference radiation performance
TWI443360B (en) 2011-02-22 2014-07-01 Voltafield Technology Corp Magnetic sensor and fabricating method thereof
FR2970783B1 (en) 2011-01-26 2014-04-11 Thales Sa METHOD FOR PREDICTIVE MONITORING OF OPERATION OF ELECTRONIC EQUIPMENT, ELECTRONIC EQUIPMENT AND CONTROL DEVICE
US9244145B2 (en) * 2011-06-30 2016-01-26 Amber Precision Instruments, Inc. System and method for measuring near field information of device under test
TWI482361B (en) * 2012-01-18 2015-04-21 Cirocomm Technology Corp Automatic testing and trimming method for planar antenna and system for the same
CN102628899A (en) * 2012-03-22 2012-08-08 哈尔滨工程大学 Three-degree-of-freedom electromagnetic interference automatic test device and method
KR101378837B1 (en) * 2013-01-22 2014-03-27 (주)시스다인 Broadband electromagnetic field area monitoring device and monitoring method thereof
KR101537870B1 (en) * 2013-12-19 2015-07-21 한국산업기술대학교산학협력단 Broadband power amplification module matching circuit of High frequency
CN104759736B (en) * 2014-01-07 2018-05-22 深圳中集智能科技有限公司 Container corrugated plate welding robot and its Visual servoing control system
CN104111383A (en) * 2014-06-16 2014-10-22 国家电网公司 Three-dimensional field intensity detector and method with range finding function
CN105785165B (en) * 2016-03-02 2017-07-04 北京盈想东方科技股份有限公司 A kind of Portable electromagnetic compatibility testing equipment and detection method
CN105856605B (en) * 2016-06-08 2017-06-23 南京埃斯顿自动化股份有限公司 A kind of drive system of punching machine
US10110336B2 (en) 2016-07-22 2018-10-23 The Directv Group, Inc. Determining ambient noise in a device under test electromagnetic compatibility test environment
CN106872925B (en) * 2017-02-15 2019-05-17 北京航空航天大学 A kind of near field probes spatial resolution standing wave calibration method based on transmission line
CN108039929A (en) * 2017-12-04 2018-05-15 深圳市共进电子股份有限公司 Noise detection system and noise detecting method
US10707050B2 (en) * 2018-07-26 2020-07-07 Varian Semiconductor Equipment Associates, Inc. System and method to detect glitches
JP7099236B2 (en) * 2018-10-05 2022-07-12 富士通株式会社 Estimator program, estimator and estimation method
TWI675209B (en) * 2018-11-15 2019-10-21 銓鼎塑膠股份有限公司 A system for measuring and adjusting an antenna radiation pattern
RU2710604C1 (en) * 2019-01-10 2019-12-30 федеральное государственное казенное военное образовательное учреждение высшего образования "Военная академия связи имени Маршала Советского Союза С.М. Буденного" Министерства обороны Российской Федерации Method of providing electromagnetic compatibility of radioelectronic equipment mounted on a mobile object
US11125815B2 (en) * 2019-09-27 2021-09-21 Advanced Micro Devices, Inc. Electro-optic waveform analysis process
CN112649681A (en) * 2020-08-18 2021-04-13 合肥恒烁半导体有限公司 MCU chip electromagnetic compatibility test circuit
CN112346026B (en) * 2020-10-21 2022-11-25 中国辐射防护研究院 System and method for testing total dose radiation resistance of distance measuring sensor
CN112379204B (en) * 2020-11-18 2024-03-29 苏州美思迪赛半导体技术有限公司 Driving port state detection circuit and method of driving circuit
CN112415280B (en) * 2020-11-26 2022-08-12 上海卫星装备研究所 Spacecraft radiation emission test system and method based on electric wave reverberation chamber
TWI776669B (en) * 2021-09-07 2022-09-01 川升股份有限公司 Phantom modeling system for evaluating antenna radiation efficiency after being affected by the human body
US11901931B2 (en) * 2021-09-09 2024-02-13 Qualcomm Incorporated Transmit diversity power leakage detection and filtering in antenna compensator power detector
CN114076888A (en) * 2021-11-17 2022-02-22 北京芯同汇科技有限公司 Circuit board radiation field frequency spectrum component measuring device and circuit board operation detection method

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Publication number Priority date Publication date Assignee Title
CN106019023A (en) * 2016-07-05 2016-10-12 广东中认华南检测技术有限公司 Electromagnetic oven electromagnetic compatible optimization method

Also Published As

Publication number Publication date
CN1454318A (en) 2003-11-05
AU2001281101A1 (en) 2002-02-18
KR20030020964A (en) 2003-03-10
WO2002012907A2 (en) 2002-02-14
JP2004522934A (en) 2004-07-29

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