WO2002008768A1 - Instrument de mesure, support de reactif destine a celui-ci, support d'informations enregistrees, procede de correction de donnees de mesure, et support de programme enregistre - Google Patents

Instrument de mesure, support de reactif destine a celui-ci, support d'informations enregistrees, procede de correction de donnees de mesure, et support de programme enregistre Download PDF

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Publication number
WO2002008768A1
WO2002008768A1 PCT/JP2001/004515 JP0104515W WO0208768A1 WO 2002008768 A1 WO2002008768 A1 WO 2002008768A1 JP 0104515 W JP0104515 W JP 0104515W WO 0208768 A1 WO0208768 A1 WO 0208768A1
Authority
WO
WIPO (PCT)
Prior art keywords
reagent
measurement
recorded medium
deterioration
lot
Prior art date
Application number
PCT/JP2001/004515
Other languages
English (en)
French (fr)
Inventor
Hisao Hiramatsu
Hironobu Oota
Original Assignee
Arkray, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arkray, Inc. filed Critical Arkray, Inc.
Priority to EP01934396.1A priority Critical patent/EP1312924B1/en
Priority to US10/333,811 priority patent/US7150857B2/en
Priority to JP2002514411A priority patent/JP3793782B2/ja
Publication of WO2002008768A1 publication Critical patent/WO2002008768A1/ja
Priority to US11/524,984 priority patent/US7267802B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
PCT/JP2001/004515 2000-07-24 2001-05-29 Instrument de mesure, support de reactif destine a celui-ci, support d'informations enregistrees, procede de correction de donnees de mesure, et support de programme enregistre WO2002008768A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP01934396.1A EP1312924B1 (en) 2000-07-24 2001-05-29 Measurement instrument, measurement data correcting method, and program recorded medium
US10/333,811 US7150857B2 (en) 2000-07-24 2001-05-29 Measurement instrument, reagent carrier used for the same, information recorded medium, measurement data correcting method, and program recorded medium
JP2002514411A JP3793782B2 (ja) 2000-07-24 2001-05-29 測定装置並びにこれに用いられる試薬担持体および情報記録媒体、測定データ補正方法、およびプログラム記録媒体
US11/524,984 US7267802B2 (en) 2000-07-24 2006-09-21 Measurement instrument, reagent carrier used for the same, information recorded medium, measurement data correcting method, and program recorded medium

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000222801 2000-07-24
JP2000-222801 2000-07-24

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10333811 A-371-Of-International 2001-05-29
US11/524,984 Division US7267802B2 (en) 2000-07-24 2006-09-21 Measurement instrument, reagent carrier used for the same, information recorded medium, measurement data correcting method, and program recorded medium

Publications (1)

Publication Number Publication Date
WO2002008768A1 true WO2002008768A1 (fr) 2002-01-31

Family

ID=18716999

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/004515 WO2002008768A1 (fr) 2000-07-24 2001-05-29 Instrument de mesure, support de reactif destine a celui-ci, support d'informations enregistrees, procede de correction de donnees de mesure, et support de programme enregistre

Country Status (4)

Country Link
US (2) US7150857B2 (ja)
EP (1) EP1312924B1 (ja)
JP (1) JP3793782B2 (ja)
WO (1) WO2002008768A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005121492A (ja) * 2003-10-17 2005-05-12 Hitachi High-Technologies Corp 試薬カセット及びそれを用いる自動分析装置
JPWO2005008255A1 (ja) * 2003-07-17 2006-11-24 株式会社三菱化学ヤトロン 自動測定用カートリッジおよびそれを用いる測定装置
JP2013210320A (ja) * 2012-03-30 2013-10-10 Sysmex Corp 血液分析装置用の洗浄液入り容器
JP2016176718A (ja) * 2015-03-18 2016-10-06 株式会社コンソナルバイオテクノロジーズ 試薬カートリッジ
WO2021161723A1 (ja) * 2020-02-14 2021-08-19 株式会社日立ハイテク 自動分析装置
JP2023001580A (ja) * 2021-06-21 2023-01-06 東亜ディーケーケー株式会社 発光分析装置及び発光分析装置の感度調整方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1653235A1 (en) * 2004-10-27 2006-05-03 The Automation Partnership (Cambridge) Limited Method and unit for controlling reservoirs containing reagents
JP4789518B2 (ja) * 2005-06-30 2011-10-12 キヤノン株式会社 製造条件付きプローブ固定担体を用いた標的物質の検出方法ならびにそのための装置、キット及びシステム
JP2007121060A (ja) * 2005-10-27 2007-05-17 Sumitomo Electric Ind Ltd センサチップおよびセンサシステム
JP5134931B2 (ja) * 2007-12-03 2013-01-30 株式会社日立ハイテクノロジーズ 自動分析装置
KR101770679B1 (ko) * 2013-11-18 2017-08-23 바디텍메드(주) 체외 자동 진단 방법
JP2022021863A (ja) * 2020-07-22 2022-02-03 キヤノンメディカルシステムズ株式会社 自動分析装置
JP7488728B2 (ja) * 2020-08-31 2024-05-22 シスメックス株式会社 検量線設定方法、検量線設定プログラムおよび検体分析装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0562425A1 (en) 1992-03-19 1993-09-29 Fuji Photo Film Co., Ltd. Assay system for analysis slide, information recorded magnetic card, and assaying apparatus therefor
DE4312093A1 (de) 1992-04-13 1993-10-14 Hitachi Ltd Automatisches Analysensystem
JPH07127122A (ja) * 1993-11-08 1995-05-16 Sekisui Chem Co Ltd 排水枡
JPH09325150A (ja) 1996-06-04 1997-12-16 Hitachi Ltd 自動分析方法及び装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2865838B2 (ja) * 1990-09-19 1999-03-08 株式会社日立製作所 分析システム
JPH06249857A (ja) * 1993-02-26 1994-09-09 Hitachi Ltd 自動分析装置
JPH0815265A (ja) * 1994-06-30 1996-01-19 Shimadzu Corp 自動化学分析装置
US5786223A (en) * 1995-05-19 1998-07-28 Fuji Photo Film Co., Ltd. Two-step calibration method for dry chemical analysis element
JP3156550B2 (ja) * 1995-07-11 2001-04-16 株式会社日立製作所 試薬管理の方法および装置
JP3647105B2 (ja) * 1995-10-26 2005-05-11 アークレイ株式会社 分析方法及び分析装置
JPH10213546A (ja) * 1997-01-27 1998-08-11 Shimadzu Corp 酵素活性測定用自動分析装置
JP3848993B2 (ja) * 1998-01-06 2006-11-22 アークレイ株式会社 共存物質の存在下における成分量の測定方法及び測定装置
JP3638503B2 (ja) * 2000-06-12 2005-04-13 アークレイ株式会社 カートリッジ式容器を用いる測定装置および測定方法並びに記録媒体

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0562425A1 (en) 1992-03-19 1993-09-29 Fuji Photo Film Co., Ltd. Assay system for analysis slide, information recorded magnetic card, and assaying apparatus therefor
JPH05264535A (ja) * 1992-03-19 1993-10-12 Fuji Photo Film Co Ltd 分析スライド用測定システム、情報記録磁気カード及び分析装置
DE4312093A1 (de) 1992-04-13 1993-10-14 Hitachi Ltd Automatisches Analysensystem
JPH07127122A (ja) * 1993-11-08 1995-05-16 Sekisui Chem Co Ltd 排水枡
JPH09325150A (ja) 1996-06-04 1997-12-16 Hitachi Ltd 自動分析方法及び装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1312924A4 *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2005008255A1 (ja) * 2003-07-17 2006-11-24 株式会社三菱化学ヤトロン 自動測定用カートリッジおよびそれを用いる測定装置
US8383421B2 (en) 2003-07-17 2013-02-26 Mitsubishi Chemical Medience Corporation Cartridge for automatic measurement and measuring device using the same
JP2005121492A (ja) * 2003-10-17 2005-05-12 Hitachi High-Technologies Corp 試薬カセット及びそれを用いる自動分析装置
JP2013210320A (ja) * 2012-03-30 2013-10-10 Sysmex Corp 血液分析装置用の洗浄液入り容器
JP2016176718A (ja) * 2015-03-18 2016-10-06 株式会社コンソナルバイオテクノロジーズ 試薬カートリッジ
WO2021161723A1 (ja) * 2020-02-14 2021-08-19 株式会社日立ハイテク 自動分析装置
JP2023001580A (ja) * 2021-06-21 2023-01-06 東亜ディーケーケー株式会社 発光分析装置及び発光分析装置の感度調整方法
JP7417117B2 (ja) 2021-06-21 2024-01-18 東亜ディーケーケー株式会社 発光分析装置及び発光分析装置の感度調整方法

Also Published As

Publication number Publication date
EP1312924A1 (en) 2003-05-21
EP1312924A4 (en) 2007-04-11
US20070014700A1 (en) 2007-01-18
US20040086429A1 (en) 2004-05-06
JP3793782B2 (ja) 2006-07-05
US7150857B2 (en) 2006-12-19
US7267802B2 (en) 2007-09-11
EP1312924B1 (en) 2014-06-25

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