WO2000004579A9 - Process for mapping metal contaminant concentration on a silicon wafer surface - Google Patents
Process for mapping metal contaminant concentration on a silicon wafer surface Download PDFInfo
- Publication number
- WO2000004579A9 WO2000004579A9 PCT/US1999/016109 US9916109W WO0004579A9 WO 2000004579 A9 WO2000004579 A9 WO 2000004579A9 US 9916109 W US9916109 W US 9916109W WO 0004579 A9 WO0004579 A9 WO 0004579A9
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- wafer
- calibration
- treatment solution
- solution
- organic solvent
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Automation & Control Theory (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020007014851A KR20010071617A (en) | 1998-07-17 | 1999-07-16 | Process for mapping metal contaminant concentration on a silicon wafer surface |
EP99937277A EP1105921A1 (en) | 1998-07-17 | 1999-07-16 | Process for mapping metal contaminant concentration on a silicon wafer surface |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10203230A JP2000035410A (en) | 1998-07-17 | 1998-07-17 | Measuring method of metal deposit quantity on wafer |
JP10/203230 | 1998-07-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000004579A1 WO2000004579A1 (en) | 2000-01-27 |
WO2000004579A9 true WO2000004579A9 (en) | 2001-07-05 |
Family
ID=16470614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/016109 WO2000004579A1 (en) | 1998-07-17 | 1999-07-16 | Process for mapping metal contaminant concentration on a silicon wafer surface |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1105921A1 (en) |
JP (1) | JP2000035410A (en) |
KR (1) | KR20010071617A (en) |
CN (1) | CN1350700A (en) |
TW (1) | TW416116B (en) |
WO (1) | WO2000004579A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102062733B (en) * | 2010-12-09 | 2012-05-23 | 浙江昱辉阳光能源有限公司 | Method for detecting surface residues of solar silicon wafer after cleaning |
KR101312545B1 (en) | 2012-01-04 | 2013-09-30 | 주식회사 엘지실트론 | Standard wafer and method for manufacturing the same |
CN104165922B (en) * | 2013-05-17 | 2016-09-28 | 无锡华润上华半导体有限公司 | The measuring method of silicon chip surface metallic element |
CN108735575A (en) * | 2017-04-18 | 2018-11-02 | 上海新昇半导体科技有限公司 | Wafer processing method |
CN111670359B (en) * | 2018-01-31 | 2023-10-10 | 富士胶片株式会社 | Analytical method, medicinal liquid, and method for producing medicinal liquid |
CN109632855B (en) * | 2018-11-15 | 2020-05-05 | 北京大学 | Method for detecting impurity defect concentration substituting for cation position in compound semiconductor |
CN112539982B (en) * | 2020-12-03 | 2023-11-03 | 西安奕斯伟材料科技股份有限公司 | Manufacturing method of silicon wafer sample and silicon wafer sample |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04144151A (en) * | 1990-09-21 | 1992-05-18 | Mitsubishi Materials Corp | Measurement of wafer surface impurity concentration |
US5418172A (en) * | 1993-06-29 | 1995-05-23 | Memc Electronic Materials S.P.A. | Method for detecting sources of contamination in silicon using a contamination monitor wafer |
JPH1164180A (en) * | 1997-08-27 | 1999-03-05 | Shin Etsu Handotai Co Ltd | Method and equipment for producing silicon wafer quantitatively contaminated sample |
-
1998
- 1998-07-17 JP JP10203230A patent/JP2000035410A/en active Pending
-
1999
- 1999-07-16 WO PCT/US1999/016109 patent/WO2000004579A1/en not_active Application Discontinuation
- 1999-07-16 CN CN99808750A patent/CN1350700A/en active Pending
- 1999-07-16 KR KR1020007014851A patent/KR20010071617A/en not_active Application Discontinuation
- 1999-07-16 EP EP99937277A patent/EP1105921A1/en not_active Withdrawn
- 1999-08-05 TW TW088112167A patent/TW416116B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW416116B (en) | 2000-12-21 |
CN1350700A (en) | 2002-05-22 |
JP2000035410A (en) | 2000-02-02 |
WO2000004579A1 (en) | 2000-01-27 |
KR20010071617A (en) | 2001-07-28 |
EP1105921A1 (en) | 2001-06-13 |
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